CN218895752U - Micro deformation comprehensive test bed - Google Patents
Micro deformation comprehensive test bed Download PDFInfo
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- CN218895752U CN218895752U CN202223092409.XU CN202223092409U CN218895752U CN 218895752 U CN218895752 U CN 218895752U CN 202223092409 U CN202223092409 U CN 202223092409U CN 218895752 U CN218895752 U CN 218895752U
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Abstract
The application provides a micro deformation comprehensive test bed, which comprises a supporting device for supporting a metal sample, a pressure head device for compressing the metal sample to deform the metal sample, a contact type measuring device and a non-contact type measuring device for measuring the deformation of the metal sample, and a data acquisition device for receiving deformation measurement data and recording and analyzing the deformation measurement data; the contact type measuring device and the non-contact type measuring device are connected to the data acquisition device. The method integrates various micro deformation testing means, can measure the same micro deformation by various different methods, compares test errors of different equipment, compares precision of different measuring methods and the like, and has potential application in the fields of experiment teaching, training practice, equipment calibration and the like.
Description
Technical Field
The application belongs to the technical field of deformation measurement, relates to a comprehensive test bed, and particularly relates to a micro deformation comprehensive test bed.
Background
In the development and production of aircraft and automobiles, both structural strength analysis and assembly design are indispensable for the measurement and control of minute deformations. Micro deformation refers to some micro changes (such as elastic modulus, thermal expansion, elastic deformation, etc.) of the material itself, which occur when the surface characteristics of the material are affected by external factors (pressure, temperature, humidity, etc.). It is difficult for the naked eye to detect these small changes, or to detect the changes and to quantitatively measure them.
Currently, there are many measuring methods for micro deformation, such as a non-contact laser reflection method, a contact grating method, a strain gauge method, and the like. However, the existing methods for measuring the micro deformation are all carried out independently, and it is difficult to carry out contrast measurement on different micro deformation measuring means, and test errors, precision and the like of different methods are compared.
Disclosure of Invention
The utility model aims at providing a little deformation comprehensive test platform for solve and be difficult to carry out contrast measurement to the little deformation measuring means of difference, compare the test error of different equipment, problem such as precision.
In a first aspect, the present application provides a micro deformation comprehensive test stand, including a support device for supporting a metal sample, a pressure head device for compressing the metal sample to deform the metal sample, a contact measurement device and a non-contact measurement device for measuring deformation of the metal sample, and a data acquisition device for receiving deformation measurement data and recording and analyzing the deformation measurement data; the contact type measuring device and the non-contact type measuring device are connected to the data acquisition device.
In this application, the metal sample that is measured can be placed on the test bench through strutting arrangement level, slowly compresses the metal sample downwards through the pressure head device to make the metal sample that waits to measure can produce little deformation. In the process of deformation of the metal sample, the contact type measuring device and the non-contact type measuring device which are adhered to the surface of the metal sample can be used for carrying out the strain generated by the collected sample, and the data is recorded and compared by connecting the data collecting device.
In one implementation of the first aspect, the support device includes at least two columns that are separately placed and used to support a bottom surface of the metal sample that is horizontally supported above the columns.
In this implementation mode, strutting arrangement can support the metal sample that is measured, makes its level place on the test bench, conveniently carries out accurate measurement to the deformation of metal sample.
In one implementation of the first aspect, the support device includes at least two columns that are separately placed and used to support a bottom surface of the metal sample that is horizontally supported above the columns.
In this implementation mode, strutting arrangement can support the metal sample that is measured, makes its level place on the test bench, conveniently carries out accurate measurement to the deformation of metal sample.
In one implementation manner of the first aspect, the indenter device includes an indenter and a controller that controls the indenter to move along a direction perpendicular to the surface of the metal sample, and the indenter is connected to the controller.
In the implementation mode, the pressure head device is controlled by the controller to move along the direction perpendicular to the surface of the metal sample, so that the metal sample to be measured can generate micro deformation. The controller can control the compression distance and force value of the pressure head device, so that the change control of deformation is effectively realized, and the measurement and comparison are convenient.
In one implementation of the first aspect, the ram comprises a metal ram.
In the implementation mode, the pressure head device is made of metal materials, so that good stability can be obtained.
In one implementation manner of the first aspect, the contact measurement device includes a strain gauge sensor and a contact grating micrometer, where the strain gauge sensor is adhered to the metal sample surface, and a measurement head of the contact grating micrometer is perpendicular to the metal sample surface and forms a point contact with the metal sample surface.
In the implementation mode, the two contact type measuring devices, namely the strain type sensor and the contact type grating micrometer, are contacted with the measured metal sample, so that the micro deformation of the same position or different positions of the metal sample can be collected simultaneously through different contact type measuring devices, and the comparison measurement analysis can be performed.
In one implementation of the first aspect, the strain gauge sensor includes a plurality of strain gauge sensors and is affixed to different locations of the surface of the metal sample.
In the implementation mode, the strain sensors adhered to different positions of the metal sample can collect and compare deformation effects generated by different positions of the metal sample under the same pressure, for example, signal differences of the two strain gauge sensors are compared with theoretical calculation values, errors are conveniently found, and experimental teaching and training practices are facilitated.
In one implementation manner of the first aspect, the contact grating micrometer is fixed by a first fixture, and a measurement position of the contact grating micrometer is adjustable.
In the implementation mode, the contact type grating micrometer is fixed through the first clamp, and the position of a contact point between the contact type grating micrometer and the metal sample can be adjusted through the first clamp, so that the deformation of different positions of the metal sample can be measured.
In an implementation manner of the first aspect, the non-contact measurement device is fixed by a second fixture, and a measurement position of the non-contact measurement device is adjustable.
In the implementation mode, the deformation is measured by using the non-contact measuring device, so that different measuring methods can be better measured and compared. Simultaneously, the non-contact measuring device is fixed through the second clamp, and the deformation of different positions of the metal sample can be measured through the second clamp by adjusting the non-contact measuring device.
In one implementation of the first aspect, the non-contact measurement device includes a non-contact laser displacement ranging sensor that is aligned with the metal sample surface.
In the implementation mode, the non-contact laser displacement distance measuring sensor is aligned to the surface of the metal sample, and the deformation degree of the metal sample can be judged through the change of the distance between the non-contact laser displacement distance measuring sensor and the metal sample when the metal sample deforms.
In an implementation manner of the first aspect, measurement action points of the contact measurement device and the non-contact measurement device are respectively located on an upper surface and a lower surface of the metal sample, and do not interfere with each other.
In the implementation mode, the measuring action points of the contact type measuring device and the non-contact type measuring device on the metal sample are respectively located on the upper surface and the lower surface of the metal sample, deformation of the metal sample is measured under the condition of no interference, the behavior of the same position can be collected simultaneously, deformation of different positions of the metal sample can be collected, and comparison of measuring methods can be better realized.
Drawings
Fig. 1 is a schematic structural diagram of a micro-deformation comprehensive test stand according to an embodiment of the present application.
Fig. 2 is a schematic structural diagram of a ram device according to an embodiment of the present application.
Fig. 3 is a schematic structural diagram of a contact measurement device according to an embodiment of the present application.
Fig. 4 is a schematic structural diagram of a non-contact measurement device according to an embodiment of the present application.
Description of element reference numerals
10. Supporting device
20. Pressure head device
201. Pressure head
202. Controller for controlling a power supply
30. Contact type measuring device
301. Chip-on-chip sensor
302. Contact grating micrometer
40. Non-contact measuring device
401. Non-contact laser displacement distance measuring sensor
50. Data acquisition device
60. Metal sample
Detailed Description
Other advantages and effects of the present application will become apparent to those skilled in the art from the present disclosure, when the following description of the embodiments is taken in conjunction with the accompanying drawings. The present application may be embodied or carried out in other specific embodiments, and the details of the present application may be modified or changed from various points of view and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments may be combined with each other without conflict.
It should be noted that, the illustrations provided in the following embodiments merely illustrate the basic concepts of the application by way of illustration, and only the components related to the application are shown in the drawings and are not drawn according to the number, shape and size of the components in actual implementation, and the form, number and proportion of the components in actual implementation may be arbitrarily changed, and the layout of the components may be more complex.
The embodiment below provides a micro deformation comprehensive test bed, solves the problems that different micro deformation measuring means are difficult to carry out contrast measurement, and test errors, precision and the like of different devices are compared.
The principle and implementation of the micro-deformation comprehensive test-bed according to the present embodiment will be described in detail below with reference to the accompanying drawings, so that those skilled in the art can understand the micro-deformation comprehensive test-bed according to the present embodiment without creative labor.
As shown in fig. 1, this embodiment provides a micro-deformation comprehensive test stand, including: a support means 10 for supporting a metal sample 60, a indenter means 20 for compressing the metal sample to deform the metal sample, a contact measuring means 30 and a non-contact measuring means 40 for measuring deformation of the metal sample, and a data acquisition means 50 for receiving deformation measurement data and recording and analyzing the same; the contact measuring device 30 and the non-contact measuring device 40 are both connected to the data acquisition device 50.
The sheet metal sample 60 is placed horizontally on the test stand by the supporting means 10 on both sides, and the indenter device 20 slowly compresses the sheet metal sample downward in a direction perpendicular to the surface of the metal sample 60 so as to slightly deform the metal sample 60. In the process of deforming the metal sample 60, the contact type measuring device 30 and the non-contact type measuring device 40 collect and measure the deformation of the same position of the metal sample 60, and record and compare the data of the measured deformation by the data collecting device 50.
It should be noted that the contact and non-contact measuring devices can also measure deformations at different locations of the comparative metal sample 60.
Wherein, as shown in fig. 1, the supporting device 10 comprises at least two columns, preferably two columns in the present embodiment. The columns are separately placed and used for supporting the bottom surface of the metal sample 60, and the metal sample 60 is horizontally supported above the columns. The metal sample 60 is placed on a separate cylinder so that it can be deformed downward.
Wherein, as shown in fig. 2, the indenter device 20 comprises an indenter 201 and a controller 202 for controlling the movement of the indenter in a direction perpendicular to the surface of the metal sample 60. The pressure head 201 is connected to the controller 202, so that the controller 202 can control the pressure head to generate pressure on the metal sample 60 along the direction perpendicular to the surface of the metal sample 60, and meanwhile, the controller 202 can control the compression distance and force value of the pressure head 201 to deform the pressure head to different degrees.
Further, ram 201 comprises a metal ram.
In a preferred embodiment, the supporting device 10 and the pressure head device 20 can adopt the existing tooling of the material testing machine or slightly improve, and can realize the supporting and compressing functions, and simultaneously, the compressing distance and force value are controllable, so that the realization is convenient and the cost is low. As shown in fig. 3, the contact measurement device 30 includes a strain gauge sensor 301 and a contact grating micrometer 302, where the strain gauge sensor 301 is adhered to the surface of the metal sample, and a measurement head of the contact grating micrometer 302 is perpendicular to the surface of the metal sample 60 and forms a point contact with the surface of the metal sample 60. In this way, both can be made to measure the deformation of the metal sample 60.
Further, the strain gauge sensor 301 includes a plurality of strain gauge sensors and is adhered to the surface of the metal sample 60 at different positions. The strain sensors adhered to different positions of the metal sample 60 can collect and compare deformation effects generated by different positions of the metal sample 60 under the same pressure, signal gaps among the strain gauge sensors 301 can be known, and compared with theoretical deformation calculated values, errors can be found conveniently, and experiments, teaching and training practices can be conducted.
Further, the contact grating micrometer 302 is fixed by a first clamp, and a measurement position of the contact grating micrometer is adjustable. The position of the contact type grating micrometer 302 is fixed through the clamp, and the measuring position of the contact type grating micrometer 302 can be adjusted along with the change of the deformation position of the sample, so that the contact type grating micrometer 302 can accurately aim at the deformation position of the metal sample 60 to measure, and the deformation of different positions is measured.
As shown in fig. 4, the non-contact measuring device 40 is fixed by a second clamp, and the measuring position of the non-contact measuring device is adjustable.
The position of the non-contact measuring device 40 is fixed through the clamp, and the measuring position of the non-contact measuring device 40 can be adjusted along with the change of the deformation position of the sample, so that the non-contact measuring device 40 can accurately align to the deformation position of the metal sample 60 for measurement, and the deformation of different positions is measured.
Further, the non-contact measuring device 40 includes a non-contact laser displacement ranging sensor 401, and the non-contact laser displacement ranging sensor 401 is aligned with the surface of the metal sample 60.
The non-contact laser displacement distance measuring sensor 401 is aligned with the surface of the metal sample, and thus, the non-contact laser displacement distance measuring sensor 401 can determine the degree of deformation of the metal sample 60 by the change of the distance between the non-contact laser displacement distance measuring sensor and the metal sample 60 generated when the metal sample 60 is deformed.
As shown in fig. 1, the measuring points of the contact measuring device 30 and the non-contact measuring device 40 are located on the upper surface and the lower surface of the metal sample 60, respectively, and do not interfere with each other.
The contact type measuring device 30 and the non-contact type measuring device 40 are respectively positioned on the upper surface and the lower surface of the metal sample 60 at the measuring action points of the metal sample, and the deformation of the metal sample 60 is measured without interference. As shown in fig. 1, the contact grating micrometer 302 collects data from the upper part of the metal sample 60 in real time, and the non-contact laser displacement ranging sensor 401 collects data from the lower part of the metal sample 60 in real time, so that the behavior of collecting the same position can be ensured, and the deformation of different positions of the metal sample 60 can be collected.
The application provides a little deformation comprehensive test bed supports metal sample 60 through strutting arrangement 10 on both sides, realizes placing this metal sample 60 level on the test bed, and pressure head device 20 slowly compresses metal sample 60 downwards along the direction of perpendicular to metal sample 60 surface to make this metal sample 60 produce little deformation. In the process of deforming the metal sample 60, the contact type measuring device 30 and the non-contact type measuring device 40 collect and measure the deformation of the same position of the metal sample 60, and record and compare the data of the measured deformation by the data collecting device 50. The micro deformation comprehensive test bed provided by the application integrates various micro deformation test means, can realize measurement and comparison of the same deformation by different methods, can be used for comparing different equipment test errors, different measurement method precision and the like, and has potential application in the fields of experiment teaching, training practice, equipment calibration and the like.
The descriptions of the processes or structures corresponding to the drawings have emphasis, and the descriptions of other processes or structures may be referred to for the parts of a certain process or structure that are not described in detail.
The foregoing embodiments are merely illustrative of the principles of the present application and their effectiveness, and are not intended to limit the application. Modifications and variations may be made to the above-described embodiments by those of ordinary skill in the art without departing from the spirit and scope of the present application. Accordingly, it is intended that all equivalent modifications and variations which may be accomplished by persons skilled in the art without departing from the spirit and technical spirit of the disclosure be covered by the claims of this application.
Claims (10)
1. The micro deformation comprehensive test bed is characterized by comprising a supporting device for supporting a metal sample, a pressure head device for compressing the metal sample to deform the metal sample, a contact type measuring device and a non-contact type measuring device for measuring the deformation of the metal sample, and a data acquisition device for receiving deformation measurement data and recording and analyzing the deformation measurement data;
the contact type measuring device and the non-contact type measuring device are connected to the data acquisition device.
2. The micro-deformation comprehensive test bed according to claim 1, wherein the supporting device comprises at least two columns, the columns are separately placed and used for supporting the bottom surface of the metal sample, and the metal sample is horizontally supported above the columns.
3. The micro deformation comprehensive test stand according to claim 1, wherein the pressure head device comprises a pressure head and a controller for controlling the pressure head to move along the direction perpendicular to the surface of the metal sample, and the pressure head is connected with the controller.
4. A micro-deformation comprehensive test bed according to claim 3, wherein the indenter comprises a metal indenter.
5. The micro deformation comprehensive test stand according to claim 1, wherein the contact type measuring device comprises a strain gauge type sensor and a contact type grating micrometer, the strain gauge type sensor is adhered to the surface of the metal sample, and a measuring head of the contact type grating micrometer is perpendicular to the surface of the metal sample and forms point contact with the surface of the metal sample.
6. The micro-deformation comprehensive test bed according to claim 5, wherein the strain gauge type sensor comprises a plurality of strain gauge type sensors and is adhered to different positions of the surface of the metal sample.
7. The micro-deformation comprehensive test bed according to claim 5, wherein the contact type grating micrometer is fixed through a first clamp, and the measuring position of the contact type grating micrometer is adjustable.
8. The micro-deformation comprehensive test bed according to claim 1, wherein the non-contact measuring device is fixed by a second clamp, and the measuring position of the non-contact measuring device is adjustable.
9. The micro-deformation comprehensive test bed according to claim 1, wherein the non-contact measuring device comprises a non-contact laser displacement distance measuring sensor, and the non-contact laser displacement distance measuring sensor is aligned with the surface of the metal sample.
10. The micro deformation comprehensive test bed according to claim 1, wherein the measuring action points of the contact type measuring device and the non-contact type measuring device are respectively positioned on the upper surface and the lower surface of the metal sample, and do not interfere with each other.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202223092409.XU CN218895752U (en) | 2022-11-21 | 2022-11-21 | Micro deformation comprehensive test bed |
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| CN202223092409.XU CN218895752U (en) | 2022-11-21 | 2022-11-21 | Micro deformation comprehensive test bed |
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| CN218895752U true CN218895752U (en) | 2023-04-21 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117491004A (en) * | 2023-12-29 | 2024-02-02 | 三河市皓智精密机械制造有限公司 | High-precision spindle performance test method and system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117491004A (en) * | 2023-12-29 | 2024-02-02 | 三河市皓智精密机械制造有限公司 | High-precision spindle performance test method and system |
| CN117491004B (en) * | 2023-12-29 | 2024-03-29 | 三河市皓智精密机械制造有限公司 | High-precision spindle performance test method and system |
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