CN218629927U - Fixing device for oscilloscope probe - Google Patents

Abstract

The utility model discloses a fixing device for oscilloprobe, including the probe upper and lower position control device of placing on the desktop, swing joint is at the probe angle adjusting device on the probe upper and lower position control device. In the utility model, the movable iron block moves up and down in the inner cavity of the hollow frame by pushing the probe angle adjusting device up and down, and the magnetism of the movable iron block and the magnetism of the magnet block attract each other, so that the movable iron block and the probe angle adjusting device are stabilized at the current position, thereby facilitating different positions on the oscilloscope probe test circuit; the oscilloscope probe is clamped into the buckle and simultaneously rotates along the axis of the damping rotating shaft, the oscilloscope probe on the buckle rotates to a proper position, and then the oscilloscope probe is suspended at the current position by utilizing the damping property of the damping rotating shaft, so that the position of the oscilloscope probe is adjusted, and a probe of the oscilloscope probe is conveniently contacted with a circuit to be detected.

Description

Fixing device for oscilloscope probe

Technical Field

The utility model relates to a position fixing equipment technical field, concretely relates to a fixing device for oscilloprobe.

Background

The oscilloscope probe is an electronic component for connecting a tested circuit and the input end of the oscilloscope, the simplest probe is a conducting wire for connecting the tested circuit and the input end of the electronic oscilloscope, the complex probe consists of a resistance-capacitance element and an active device, most probes consist of probe heads, probe cables, compensation equipment or other signal regulating networks and probe connectors, in order to carry out measurement of the oscilloscope, the probes must be physically connected to test points, and in order to realize the measurement, most probes have at least one or two meters of related cables.

According to observation, in the use process of the probe, an oscilloscope operator needs to hold the probe by an inertial hand and rotate a knob on the oscilloscope by the other hand of the operator to control the screen display wavelength and the width of the wave under the condition that the tip of the probe is kept in contact with a tested circuit at the moment, the arm of the operator becomes acid and swells and the condition that the arm is shaken gradually occurs under the long-time holding action, and in order to enable the oscilloscope probe to be kept in contact with the tested circuit at the moment and avoid the situation that the oscilloscope probe is held for a long time during operation, the fixing device for the oscilloscope probe is provided.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a fixing device for oscilloscope probe to solve the above-mentioned weak point in the technique.

In order to achieve the above object, the present invention provides the following technical solutions: the device comprises a probe up-down position adjusting device arranged on a table top, a probe angle adjusting device movably connected to the probe up-down position adjusting device, and an oscilloscope probe clamped on the probe angle adjusting device; wherein, including the base in the position control device about the probe, fix the hollow frame on base top surface, and fix the fixed plate on the hollow frame back through the screw, equidistant being fixed with a plurality of magnet piece on the front of fixed plate, and the middle distance of hollow frame's inner chamber is fixed with a plurality of plastic block, and the plastic block forms each other and lets magnet piece male breach, and the positive one side of magnet piece has movable iron plate through magnetic adsorption, the another side of activity iron plate and the probe angle adjusting device fixed connection that extends to the hollow frame outside.

As an optimal scheme of the utility model, contain among the probe angle adjusting device and keep away from the L shaped plate that the one end of magnet piece is connected, fix two fixed blocks on L shaped plate top surface with the activity iron plate.

As an optimized scheme, the fixed block rotates on the lateral wall of one side that is close to each other and is connected with the damping pivot, two connection pieces of fixedly connected with on the outer lane of damping pivot, and the one end that the damping pivot was kept away from to the connection piece is fixed with the buckle, and the joint has oscilloscope probe on the bayonet socket of buckle.

As an optimal scheme of the utility model, the buckle is whole to be the plastics material, and the buckle has the toughness that can block oscilloscope probe.

As an optimized proposal, one end of the oscilloscope probe is a probe, and the other end of the oscilloscope probe is connected with the port of the oscilloscope through a wire.

As an optimized proposal of the utility model, the magnet block and the movable iron block have magnetism and attract each other.

As an optimized proposal of the utility model, the four corners of the base are all provided with screws connected with the desktop on the surface.

In the technical scheme, the utility model provides a technological effect and advantage:

in the utility model, the movable iron block moves up and down in the inner cavity of the hollow frame by pushing the probe angle adjusting device up and down, when the movable iron block moves to the position where one magnet block extends out from the plastic block, the magnetism of the movable iron block and the magnet block attract each other, so that the movable iron block and the probe angle adjusting device are stabilized at the current position, thereby realizing the position adjustment of the probe angle adjusting device and facilitating different positions of the oscilloscope probe test circuit; after the height position of the probe angle adjusting device is adjusted, the oscilloscope probe is clamped into the buckle and simultaneously rotates along the axis of the damping rotating shaft, the oscilloscope probe on the buckle rotates to a proper position, and then the oscilloscope probe is suspended at the current position by utilizing the damping property of the damping rotating shaft, so that the position of the oscilloscope probe is adjusted, and the probe of the oscilloscope probe is convenient to contact with a circuit to be detected.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments described in the present invention, and other drawings can be obtained by those skilled in the art according to these drawings.

Fig. 1 is a schematic view of a three-dimensional structure of a fixing device for an oscilloscope probe according to the present invention;

fig. 2 is a schematic view of a probe up-down position adjusting device in a fixing device for an oscilloscope probe according to the present invention;

fig. 3 is a schematic partial sectional view of a probe up-down position adjusting device of a fixing device for an oscilloscope probe according to the present invention;

fig. 4 is the utility model provides a probe angle adjusting device for fixing device of oscilloscope probe schematic diagram.

Description of the reference numerals:

1. a probe up-down position adjusting device; 11. a base; 12. a magnet block; 13. a fixing plate; 14. a hollow frame; 15. a movable iron block; 16. a notch; 17. a plastic block; 2. a probe angle adjusting device; 21. an L-shaped plate; 22. a fixed block; 23. a damping rotating shaft; 24. connecting sheets; 25. buckling; 3. an oscilloscope probe.

Detailed Description

In order to make the technical solutions and implementations of the present invention more clearly explained and illustrated, several preferred embodiments for implementing the technical solutions of the present invention are introduced below.

The following description is merely exemplary in nature and is not intended to limit the present disclosure, application, or uses. It should be understood that throughout the drawings, identical or similar reference numerals indicate identical or similar parts and features. The drawings are only schematic representations of the concepts and principles of the embodiments of the disclosure, and do not necessarily show specific dimensions or proportions of the various embodiments of the disclosure. While the various publications, patents and published patent specifications cited herein, the disclosures of which are incorporated herein by reference in their entirety, may be referred to in the specification in an exaggerated manner to illustrate details or structures related to the embodiments of the present disclosure, it being understood that the illustrated embodiments are only some of the examples of the present disclosure and that the claims are to be considered illustrative and not restrictive.

In the description of the present invention, unless explicitly stated or limited otherwise, the terms "first", "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; the term "plurality" means two or more unless specified or indicated otherwise; the terms "connected" and "fixed" are used broadly, and for example, "connected" may be a fixed connection or a detachable connection; may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the present invention can be understood according to specific situations by those of ordinary skill in the art.

In the description of the present application, it should be understood that the terms "upper", "lower", "left", "right", and the like used in the embodiments of the present application are described with reference to the angles shown in the drawings, and should not be construed as limiting the embodiments of the present application. In addition, in this context, it will also be understood that when an element is referred to as being "on" or "under" another element, it can be directly on "or" under "the other element or be indirectly on" or "under" the other element via an intermediate element.

Example one

Referring to the accompanying drawings 1 to 4 of the specification, a fixture for an oscilloscope probe:

the device comprises a probe up-down position adjusting device 1 placed on a table top, a probe angle adjusting device 2 movably connected to the probe up-down position adjusting device 1, and an oscilloscope probe 3 clamped on the probe angle adjusting device 2; wherein, position control device 1 is including base 11 about the probe, fix the hollow frame 14 on base 11 top surface, and fix the fixed plate 13 on the back of hollow frame 14 through the fix with screw, the equidistance is fixed with a plurality of magnet piece 12 on the front of fixed plate 13, and the equidistance is fixed with a plurality of plastic block 17 in the inner chamber of hollow frame 14, and plastic block 17 forms each other and lets magnet piece 12 male breach 16, and magnetic adsorption has movable iron plate 15 on one side of the front of magnet piece 12, movable iron plate 15's the another side and the probe angle adjusting device 2 fixed connection that extends to the hollow frame 14 outside.

Example two

On the basis of the first embodiment, referring to the attached drawings 1 to 4 in the specification, a fixing device for an oscilloscope probe comprises:

the probe angle adjusting device 2 comprises an L-shaped plate 21 connected with one end, far away from the magnet block 12, of the movable iron block 15, two fixing blocks 22 fixed on the top surface of the L-shaped plate 21, a damping rotating shaft 23 is rotatably connected onto one side wall, close to each other, of the fixing blocks 22, two connecting pieces 24 are fixedly connected onto the outer ring of the damping rotating shaft 23, a buckle 25 is fixed onto one end, far away from the damping rotating shaft 23, of the connecting piece 24, the oscilloscope probe 3 is clamped onto a bayonet of the buckle 25, the buckle 25 is integrally made of plastic, the buckle 25 has toughness capable of clamping the oscilloscope probe 3, one end of the oscilloscope probe 3 is a probe, the other end of the oscilloscope probe is connected with an oscilloscope port through a wire, magnetism exists between the magnet block 12 and the movable iron block 15, the probe and the magnet block are mutually attracted, and screws connected with a desktop are arranged on the surfaces of four corners of the base 11.

Referring to the attached drawings 1 to 4 of the specification, the working principle of the utility model is as follows:

for the explanation of the use of the probe up-down position adjusting apparatus 1: the base 11 is fixed on a proper position of a table top through screws, when the probe angle adjusting device 2 needs to adjust the height, the probe angle adjusting device 2 is pushed up and down, the movable iron block 15 moves up and down in the inner cavity of the hollow frame 14, when the movable iron block 15 moves to a position where one magnet block 12 extends out of the plastic block 17, the magnetism of the movable iron block 15 and the magnet block 12 are mutually attracted, so that the movable iron block 15 and the probe angle adjusting device 2 are stabilized on the current position, the position adjustment of the probe angle adjusting device 2 is realized, and different positions of a test circuit of the oscilloscope probe 3 are convenient;

for the explanation of the use of the probe angle adjustment device 2: after the height position of the probe angle adjusting device 2 is adjusted, the oscilloscope probe 3 is clamped into the buckle 25 and simultaneously rotates along the axis of the damping rotating shaft 23, the oscilloscope probe 3 on the buckle 25 rotates to a proper position, and the oscilloscope probe 3 is suspended at the current position by utilizing the damping property of the damping rotating shaft 23, so that the position adjustment of the oscilloscope probe 3 is realized, and the probe of the oscilloscope probe 3 is convenient to contact with a circuit to be detected.

While certain exemplary embodiments of the present invention have been described above by way of illustration only, it will be apparent to those of ordinary skill in the art that the described embodiments may be modified in various different ways without departing from the spirit and scope of the present invention. Accordingly, the drawings and description are illustrative in nature and should not be construed as limiting the scope of the invention.

Claims (7)

1. A fixing device for an oscilloscope probe is characterized in that: comprises a probe up-down position adjusting device (1) arranged on a table top, a probe angle adjusting device (2) movably connected on the probe up-down position adjusting device (1), and an oscilloscope probe (3) clamped on the probe angle adjusting device (2); wherein, including base (11) in probe upper and lower position control device (1), fix hollow frame (14) on base (11) top surface, and fixed plate (13) on hollow frame (14) back through the fix with screw, equidistant being fixed with a plurality of magnet piece (12) on the front of fixed plate (13), and the inner chamber medium distance of hollow frame (14) is fixed with a plurality of plastic block (17), and plastic block (17) form each other and let magnet piece (12) male breach (16), and the positive one side of magnet piece (12) has movable iron plate (15) through magnetic adsorption, the another side of activity iron plate (15) and the probe angle adjusting device (2) fixed connection that extends to hollow frame (14) outside.

2. A fixture for an oscilloscope probe according to claim 1, wherein: the probe angle adjusting device (2) comprises an L-shaped plate (21) connected with one end, far away from the magnet block (12), of the movable iron block (15) and two fixing blocks (22) fixed on the top surface of the L-shaped plate (21).

3. A fixture for an oscilloscope probe according to claim 2, wherein: the fixed block (22) rotates on the lateral wall of one side that is close to each other and is connected with damping pivot (23), two connection pieces (24) of fixedly connected with on the outer lane of damping pivot (23), and the one end that damping pivot (23) were kept away from in connection piece (24) is fixed with buckle (25), and the joint has oscilloscope probe (3) on the bayonet socket of buckle (25).

4. A fixture for an oscilloscope probe according to claim 3, wherein: the whole buckle (25) is made of plastic materials, and the buckle (25) has toughness capable of clamping the oscilloscope probe (3).

5. A fixture for an oscilloscope probe according to claim 1, wherein: one end of the oscilloscope probe (3) is a probe, and the other end of the oscilloscope probe is connected with an oscilloscope port through a lead.

6. A fixture for an oscilloscope probe according to claim 1, wherein: the magnet block (12) and the movable iron block (15) are magnetic and mutually attracted.

7. A fixture for an oscilloscope probe according to claim 1, wherein: the four corners of the base (11) are provided with screws connected with the desktop.

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