CN213094182U - Data acquisition equipment with self calibration function - Google Patents
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- CN213094182U CN213094182U CN202021973575.9U CN202021973575U CN213094182U CN 213094182 U CN213094182 U CN 213094182U CN 202021973575 U CN202021973575 U CN 202021973575U CN 213094182 U CN213094182 U CN 213094182U
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Abstract
The utility model provides a data acquisition equipment with self calibration function, include: the device comprises a power supply, a calibration voltage source, a grounding terminal, an analog signal input terminal, a multiplexer, an amplifier, an analog-digital converter, a processor and a memory; the processor is respectively electrically connected with the power supply, the memory, the analog-digital converter and the multiplexer and is used for controlling the multiplexer to be respectively switched to the second group of input ends and the third group of input ends in the calibration process, acquiring a first voltage measurement value and a second voltage measurement value of the amplified digital signal and determining a calibration coefficient according to the first voltage measurement value and the second voltage measurement value of the amplified digital signal; the device can automatically and efficiently self-calibrate the data acquisition device to reduce temperature drift and time drift.
Description
Technical Field
The utility model relates to a data acquisition card and data acquisition equipment, especially can reduce temperature drift and time drift, have the data acquisition equipment of self calibration function.
Background
At present, in a data acquisition card, an amplifier and an analog-digital converter have certain temperature drift and time drift, so that the error of a data acquisition result is large after a long time or large temperature fluctuation exists.
In the case of the amplifier PGA117 having a high gain, the error due to temperature drift is generally 6 ppm/deg.c; the temperature drift of the ADS7181 analog-to-digital converter is about 20 ppm/DEG C. In the range of 0-70 deg.c of the full operating temperature range of the data acquisition card device, there will be a maximum temperature drift of (6+20) × 70-1820 ppm-0.128%.
The time drift of the reference voltage source is only 19ppm within 250 hours, but reaches 51ppm after 4500 hours, and the data is further increased with the increase of time.
In the process of implementing the present invention, the inventor finds that there are at least the following problems in the prior art:
in the prior art, the current temperature is read by a temperature sensor of an analog-digital converter, the temperature drift characteristics of a batch of sample devices are analyzed to obtain an offset coefficient, and then drift is compensated by a formula.
This prior art only compensates for the temperature drift associated with the ADC. Since the device lots are different, coefficient sampling is performed for each lot. Even if the devices in the same batch have different temperature coefficients, the compensation by the formula has limited effect. In addition, the prior art cannot automatically calibrate the drift of the analog-digital converter and the amplifier efficiently and conveniently.
SUMMERY OF THE UTILITY MODEL
An embodiment of the utility model provides a data acquisition equipment with self calibration function to the temperature drift and the time drift that exist the data acquisition equipment carry out automatic or efficient calibration.
To achieve the above object, in a first aspect, an embodiment of the present invention provides a data acquisition device with a self calibration function, which includes: the device comprises a power supply, a calibration voltage source, a multiplexer, an amplifier, an analog-digital converter, a processor and a memory;
the power supply is respectively electrically connected with the processor and the calibration voltage source and is used for starting according to a control signal of the processor and supplying power to the calibration voltage source;
the calibration voltage source is respectively electrically connected with the power supply and the third group of input ends of the multiplexer and is used for outputting one or more stable voltage references to the multiplexer;
the multiplexer comprises three groups of input ends, one group of output ends and a control end, wherein the first group of input ends are electrically connected with an input analog signal to be tested, the second group of input ends are grounded, one end of the third group of input ends is electrically connected with the calibration voltage source, and the other end of the third group of input ends is grounded; the control end of the multiplexer is electrically connected with the processor, and one group of output ends of the multiplexer are electrically connected with the amplifier; the multiplexer is used for switching and gating one group of the three groups of input ends to be output from the output end according to a control signal sent by the processor; when calibration is carried out, the calibration voltage is switched to the second group of input ends and the third group of input ends respectively under the control of the processor, and a first voltage measurement value corresponding to the second group of input ends and a second voltage measurement value output by the calibration voltage source are obtained;
the amplifier is used for amplifying the first voltage measurement value corresponding to the second group of input ends and the second voltage measurement value output by the calibration voltage source and then sending the amplified first voltage measurement value and the amplified second voltage measurement value to the analog-digital converter;
the analog-digital converter is respectively electrically connected with the amplifier and the processor, and is used for completing analog-digital conversion under the control of the processor, converting the amplified first voltage measurement value and the amplified second voltage measurement value into digital signals and sending the digital signals to the processor;
the processor is respectively electrically connected with the power supply, the memory, the analog-digital converter and the multiplexer, and is used for controlling the multiplexer to be respectively switched to the second group of input ends and the third group of input ends in the calibration process, acquiring a first voltage measurement value and a second voltage measurement value of the amplified digital signal, and determining a calibration coefficient according to the first voltage measurement value and the second voltage measurement value of the amplified digital signal;
the memory is used for storing the calibration coefficient.
In some exemplary embodiments, the power supply includes: the programmable low dropout regulator LDO power supply.
In some exemplary embodiments, the data acquisition device with self-calibration function further includes: the timer is electrically connected with the processor and used for starting timing after the last calibration is finished and feeding back timing duration to the processor; the processor is further configured to obtain a timing duration from the timer, and start calibration of the data acquisition device if the timing duration reaches a preset calibration period.
In some exemplary embodiments, the data acquisition device with self-calibration function further includes: one or more temperature sensors arranged around the analog-digital converter and the amplifier, wherein the temperature sensors are electrically connected with the processor and used for acquiring current temperature values of the amplifier and the analog-digital converter in the data acquisition equipment; the processor is further configured to obtain a current temperature value of the amplifier and the analog-to-digital converter inside the data acquisition device from the temperature sensor, and start calibration of the data acquisition device if an absolute value of a variation of the current temperature value exceeds a set temperature variation threshold.
In some exemplary embodiments, the memory comprises: u disk, portable hard drive and memory card.
In some exemplary embodiments, the amplifier includes: a differential amplifier; the processor further comprises: the operation memory is used for storing the temperature values of the amplifier and the analog-digital converter, which are acquired by the temperature sensor; or storing the timing duration of the timer.
In some exemplary embodiments, the processor comprises: a digital signal processor DSP with an SPI interface or an IIC interface, a programmable logic controller FPGA or a singlechip.
In some exemplary embodiments, the analog-to-digital converter has an SPI interface or an IIC interface and is electrically connected to the processor through an SPI bus or an IIC bus.
In some exemplary embodiments, the data acquisition device with self-calibration function further includes: and the low-pass filter circuit is electrically connected between the analog signal input end and the first group of input ends of the multiplexer and is used for filtering high-frequency noise in the input analog signal.
In some exemplary embodiments, the memory comprises: non-volatile memory including phase change random access memory, antifuse memory, magnetoresistive random access memory, or resistive random access memory.
The technical scheme has the following beneficial effects:
in this embodiment, the processor is electrically connected to the power supply, the control terminal of the multiplexer, and the analog-to-digital converter, and is configured to control the power supply to be turned on and off, and control the multiplexer to gate the second group of input terminals or the third group of input terminals in the calibration process, so that the calibration coefficient can be efficiently determined according to the amplified voltage measurement value of the ground terminal and the amplified voltage measurement value of the output voltage of the calibration voltage source, the calibration process is more efficient, and resource consumption of the processor is more favorably reduced.
In this embodiment, the data acquisition device includes: the device comprises a programmable LDO power supply, a high-precision calibration voltage source, a grounding terminal, an analog signal input terminal, a multiplexer, a programmable amplifier, an analog-digital converter, a processor, a timer, a temperature sensor and a memory. Therefore, automatic and efficient self-calibration of the data acquisition device according to the calibration period and/or the temperature exceeding the threshold can be achieved to reduce temperature drift and time drift.
In the embodiment, the power supply is started according to the control signal of the processor to supply power to the calibration voltage source, so that the power supply to the calibration voltage source is started only when the calibration is needed, and the power supply is in a closed state when the calibration is not needed, thereby achieving the purposes of saving electric energy and reducing power consumption.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a functional block diagram of a first data acquisition device with self-calibration functionality according to an embodiment of the present invention;
fig. 2 is a functional block diagram of a second data acquisition device with self-calibration functionality according to an embodiment of the present invention;
fig. 3 is a functional block diagram of a third data acquisition device with self-calibration functionality according to an embodiment of the present invention;
fig. 4 is a schematic diagram of the input, output and control terminals of a multiplexer according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
It should be noted that the detailed description set forth in connection with the appended drawings is intended as a description of various configurations and is not intended to represent the only configurations in which the concepts described herein may be practiced. Embodiments of the apparatus described herein are described in the following detailed description and illustrated in the accompanying drawings by various blocks, modules, units, components, circuits. The terms first, second, etc. in the description and claims of the present application and in the drawings of the specification, if used to describe various elements, are used to distinguish one element from another, and are not used to describe a particular sequence.
An embodiment of the utility model provides a can reduce data acquisition equipment that has self calibration function of temperature drift and time drift. Fig. 1 is a functional block diagram of a first data acquisition device with a self-calibration function according to an embodiment of the present invention. As shown in fig. 1, the data acquisition device with self calibration function according to the embodiment of the present invention includes: the device comprises a power supply, a calibration voltage source, a multiplexer, an amplifier, an analog-digital converter, a processor and a memory;
the power supply is respectively and electrically connected with the processor and the calibration voltage source and is used for starting according to the control signal of the processor and supplying power to the calibration voltage source; the power supply is shown in fig. 1 as a programmable LDO power supply for example;
a calibration voltage source electrically connected to the power supply and the third set of inputs of the multiplexer, respectively, for outputting one or more stable voltage references to the multiplexer;
the multiplexer comprises three groups of input ends, one group of output ends and a control end, wherein the first group of input ends are electrically connected with an input analog signal to be tested, the second group of input ends are grounded, one end of the third group of input ends is electrically connected with a calibration voltage source, and the other end of the third group of input ends is grounded; the control end of the multiplexer is electrically connected with the processor, and one group of output ends of the multiplexer are electrically connected with the amplifier; the multiplexer is used for switching and gating one group of input ends from the three groups of input ends to output from the output end according to a control signal sent by the processor; when calibration is carried out, the calibration voltage is respectively switched to the second group of input ends and the third group of input ends under the control of the processor, and a first voltage measurement value corresponding to the second group of input ends and a second voltage measurement value output by the calibration voltage source are obtained;
the amplifier is used for amplifying the first voltage measured value corresponding to the second group of input ends and the second voltage measured value output by the calibration voltage source and then sending the amplified first voltage measured value and the second voltage measured value to the analog-digital converter;
the analog-digital converter is respectively electrically connected with the amplifier and the processor, is used for completing analog-digital conversion under the control of the processor, converting the first voltage measurement value and the second voltage measurement value which are subjected to amplification processing into digital signals and sending the digital signals to the processor;
the processor is respectively electrically connected with the power supply, the memory, the analog-digital converter and the multiplexer, and is used for controlling the multiplexer to be respectively switched to the second group of input ends and the third group of input ends in the calibration process, acquiring a first voltage measurement value and a second voltage measurement value of the amplified digital signal, and determining a calibration coefficient according to the first voltage measurement value and the second voltage measurement value of the amplified digital signal;
and the memory is used for storing the calibration coefficient. The processor compares the digital quantity signal with stored digital quantity information to obtain a corresponding linear calibration parameter, and then calibrates the data using the linear calibration parameter while sampling the input voltage signal.
ADC: i.e. an analog-to-digital converter, also called a/D converter, usually refers to an electronic component that converts an analog signal into a digital signal. An analog-to-digital converter converts an input voltage signal into an output digital signal. Since digital signals do not have practical significance per se, only one relative magnitude is represented. Therefore, any analog-to-digital converter needs a reference analog quantity as a conversion standard, and a common reference standard is the maximum convertible signal size. And the output digital quantity represents the magnitude of the input signal relative to the reference signal. The a/D conversion functions to convert analog quantity continuous in time and continuous in amplitude into digital signal discrete in time and discrete in amplitude, and therefore, the a/D conversion generally includes 4 processes of sampling, holding, quantizing and encoding. In practical circuits, some of these processes are combined, for example, sampling and holding, quantization and coding are often implemented simultaneously in the conversion process.
In some exemplary embodiments, the power supply includes: the programmable low dropout regulator LDO power supply. The LDO is a low dropout regulator with low power consumption, has extremely low noise and high Power Supply Rejection Ratio (PSRR), and provides stable voltage and current for the subsequent stage circuit.
Fig. 2 is a functional block diagram of a second data acquisition device with self-calibration functionality according to an embodiment of the present invention. As shown in fig. 2, optionally, the second data acquisition device with a self-calibration function may further include: one or more temperature sensors arranged around the analog-digital converter and the amplifier, wherein the temperature sensors are electrically connected with the processor and used for acquiring the current temperature values of the amplifier and the analog-digital converter in the data acquisition equipment; the processor is further configured to obtain a current temperature value of an amplifier and an analog-digital converter inside the data acquisition device from the temperature sensor, and start calibration of the data acquisition device if an absolute value of a variation of the current temperature value (relative to an initial temperature value or a startup temperature value) exceeds a set temperature variation threshold. As an example, for example, when the data acquisition device is powered on at 25 degrees, the set temperature change threshold is 3 degrees, and then both below 22 degrees and above 28 degrees, recalibration is required. Optionally, in some exemplary embodiments, the second data acquisition device with self-calibration function may further include: and the low-pass filter circuit is electrically connected between the analog signal input end and the first group of input ends of the multiplexer and is used for filtering high-frequency noise in the input analog signal. Specifically, the number of the temperature sensors may be plural, arranged in different positions, respectively, and when the data collecting apparatus has plural amplifiers, one temperature sensor is provided or disposed in the vicinity of each amplifier. When a certain temperature changes greatly, the way is calibrated independently. Preferably, the temperature sensor is disposed around the analog-to-digital converter and the amplifier, and obtains a temperature value around the two devices.
Fig. 3 is a functional block diagram of a third data acquisition device with self-calibration functionality according to an embodiment of the present invention. In a further embodiment, as shown in fig. 3, based on the structure of fig. 2, the third data acquisition device with self-calibration function may further include: the timer is electrically connected with the processor and used for starting timing after the last calibration is finished and feeding back timing duration to the processor; and the processor is also used for acquiring the timing duration from the timer, and starting the calibration of the data acquisition equipment if the timing duration reaches a preset calibration period.
Fig. 4 is a schematic diagram of the input, output and control terminals of a multiplexer according to an embodiment of the present invention. As shown IN FIG. 4, the multiplexer's input pins IN2+ and IN 2-are both connected to GND, forming a set of inputs to the multiplexer U1; the high-precision low-temperature-drift calibration voltage source outputs a stable voltage reference to an IN3+ pin of the multiplexer, and a pin IN 3-of the multiplexer is connected with GND to form a group of inputs of a multiplexer U1; the multiplexer can simultaneously switch two channels IN the same group from OUT + and OUT-outputs, positive and negative input and output are IN one-to-one correspondence from a plurality of groups of data sources (IN1+ and IN 1-are one group, IN2+ and IN 2-are one group, and IN3+ and IN 3-are one group) of two channels IN each group, a control pin EN of the multiplexer is a multiplexer enabling pin, A0, A1 and A2 are pins for controlling channel switching, and the 4 pins are connected with GPIO (General-purpose input/output) pins of the processor; the processor controls the enabling and channel switching of the multiplexer through the GPIO pin; the output pins OUT + and OUT-of the multiplexer are connected with the input pins IN + and IN-of the differential amplifier, the positive pins and the negative pins correspond to each other one by one, and the differential amplifier amplifies the input voltage signal and converts the differential voltage signal into a single-ended voltage signal.
In some exemplary embodiments, the memory may include: u disk, portable hard drive and memory card. The amplifier may include: a differential amplifier. The processor further comprises: the operation memory is used for storing the temperature values of the amplifier and the analog-digital converter, which are acquired by the temperature sensor; or storing the timing duration of the timer. In an alternative embodiment, the temperature sensor collects temperature values of the amplifier and the analog-to-digital converter; alternatively, the length of the timer may be stored in a memory for storing the calibration coefficient.
In some exemplary embodiments, the processor may include: a digital signal processor DSP with an SPI interface or an IIC interface, a programmable logic controller FPGA or a singlechip. In some embodiments, the processor may employ an MCU: a Micro Control Unit (MCU), also called a single chip Microcomputer (single chip Microcomputer) or a single chip Microcomputer (MCU), is a chip-level computer formed by appropriately reducing the frequency and specification of a Central Processing Unit (CPU) and integrating peripheral interfaces such as a memory, a counter (Timer), a USB, an a/D converter, a UART, a PLC, a DMA, etc., and even an LCD driving circuit on a single chip, and performing different combination control for different applications.
In some exemplary embodiments, the analog-to-digital converter has an SPI (Serial Peripheral Interface) Interface or an IIC Interface, and is electrically connected to the processor through an SPI bus or an IIC bus (IIC or I2C, Inter Integrated-Circuit bus is a two-wire Serial bus). In other embodiments, AD-customized communication protocols may also be employed. The SPI is a synchronous peripheral interface that enables the single-chip microcomputer to communicate with various peripheral devices in a serial manner to exchange information.
In some exemplary embodiments, the memory may include: non-volatile memory, including phase change random access memory, antifuse memory, magnetoresistive random access memory, or resistive random access memory.
When data acquisition is carried out, the multiplexer is used for switching the input of multi-channel analog signals, the input analog signals are connected into the amplifier, the amplifier conditions the signals and then sends the conditioned signals into the analog-digital converter, and the analog-digital converter converts the analog signals into digital signals and sends the digital signals into the processor. The multiplexer switches input channels under the control of the processor or outputs channel gating signals to gate one input source for output.
The embodiment of the utility model discloses an outside can realizing data acquisition card and data acquisition equipment automatic calibration's function, the automatic calibration after can also realizing regularly or the temperature fluctuation through the data that timer and temperature sensor provided to reduce time drift and temperature drift.
The following describes the working process of the automatic calibration of the data acquisition card or the data acquisition device according to the embodiment of the present invention:
in order to solve the problem of temperature drift, the temperature condition inside the data acquisition equipment needs to be known firstly, the processor monitors the temperature inside the data acquisition equipment through the temperature sensor all the time, and when the temperature exceeds a set range, the data acquisition equipment enters an automatic calibration process. As an example, for example, when the data acquisition device is powered on at 25 degrees, the set temperature change threshold is 3 degrees, and then both below 22 degrees and above 28 degrees, recalibration is required.
In the automatic calibration process, the data acquisition card first controls a programmable LDO (low dropout regulator) power supply to be powered on, so that the high-precision calibration voltage source is in a working state, and a standard calibration signal is output. The multiplexer is then switched to GND and the high precision calibration voltage source, respectively, and the analog to digital converter reads two sets of values, i.e., voltage readings Y1 and Y2 for calibration, respectively. The actual values of GND and the high-precision calibration voltage source are known to be stored in memory, X1 and X2, respectively. At this time, by solving the system of linear equations in the prior art:
k*X1+b＝Y1；
k*X2+b＝Y2；
new calibration coefficients can be obtained:
k＝(Y2-Y1)/(X2-X1)；
b＝Y2–X2*(Y2-Y1)/(X2-X1)。
the new calibration coefficients are saved in memory.
The calibration is now performed under new temperature conditions, so that temperature drift due to the amplifier and the analog-to-digital converter is eliminated. The temperature drift of the high-precision calibration voltage source is only 1 ppm/DEG C, so that the system temperature drift of the data acquisition equipment is reduced to 1 ppm/DEG C from 26 ppm/DEG C.
The internal reference voltage of the analog-digital converter cannot be ignored due to the time drift caused by the working time of the internal reference voltage because the internal reference voltage is always in a working state. And after the last calibration of the data acquisition equipment is finished, the timer starts to time, and when the time reaches a set value, the data acquisition card enters an automatic calibration process. The auto-calibration procedure is as above.
The high-precision calibration voltage source is controlled by the processor and is in a non-working state in the time of a non-calibration process. And the calibration process time is short, so the calibration process is in a low-time drift working state in the whole life cycle of the data acquisition equipment. The time drift of the entire system can thereby be controlled to a relatively low range.
The above-mentioned embodiments, further detailed description of the objects, technical solutions and advantages of the present invention, it should be understood that the above description is only the embodiments of the present invention, and is not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A data acquisition device having a self-calibration function, comprising: the device comprises a power supply, a calibration voltage source, a multiplexer, an amplifier, an analog-digital converter, a processor and a memory;
the power supply is respectively electrically connected with the processor and the calibration voltage source and is used for starting according to a control signal of the processor and supplying power to the calibration voltage source;
the calibration voltage source is respectively electrically connected with the power supply and the third group of input ends of the multiplexer and is used for outputting one or more stable voltage references to the multiplexer;
the multiplexer comprises three groups of input ends, one group of output ends and a control end, wherein the first group of input ends are electrically connected with an input analog signal to be tested, the second group of input ends are grounded, one end of the third group of input ends is electrically connected with the calibration voltage source, and the other end of the third group of input ends is grounded; the control end of the multiplexer is electrically connected with the processor, and one group of output ends of the multiplexer are electrically connected with the amplifier; the multiplexer is used for switching and gating one group of the three groups of input ends to be output from the output end according to a control signal sent by the processor; when calibration is carried out, the calibration voltage is switched to the second group of input ends and the third group of input ends respectively under the control of the processor, and a first voltage measurement value corresponding to the second group of input ends and a second voltage measurement value output by the calibration voltage source are obtained;
the amplifier is used for amplifying the first voltage measurement value corresponding to the second group of input ends and the second voltage measurement value output by the calibration voltage source and then sending the amplified first voltage measurement value and the amplified second voltage measurement value to the analog-digital converter;
the analog-digital converter is respectively electrically connected with the amplifier and the processor, and is used for completing analog-digital conversion under the control of the processor, converting the amplified first voltage measurement value and the amplified second voltage measurement value into digital signals and sending the digital signals to the processor;
the processor is respectively electrically connected with the power supply, the memory, the analog-digital converter and the multiplexer, and is used for controlling the multiplexer to be respectively switched to the second group of input ends and the third group of input ends in the calibration process, acquiring a first voltage measurement value and a second voltage measurement value of the amplified digital signal, and determining a calibration coefficient according to the first voltage measurement value and the second voltage measurement value of the amplified digital signal;
the memory is used for storing the calibration coefficient.
2. The data acquisition device with self-calibration function according to claim 1, wherein said power supply comprises: the programmable low dropout regulator LDO power supply.
3. The data acquisition device with self-calibration function according to claim 1, further comprising: one or more temperature sensors arranged around the analog-digital converter and the amplifier, wherein the temperature sensors are electrically connected with the processor and used for acquiring current temperature values of the amplifier and the analog-digital converter in the data acquisition equipment; the processor is further configured to obtain a current temperature value of the amplifier and the analog-to-digital converter inside the data acquisition device from the temperature sensor, and start calibration of the data acquisition device if an absolute value of a variation of the current temperature value exceeds a set temperature variation threshold.
4. The data acquisition device with self-calibration function according to claim 3, further comprising: the timer is electrically connected with the processor and used for starting timing after the last calibration is finished and feeding back timing duration to the processor; the processor is further configured to obtain a timing duration from the timer, and start calibration of the data acquisition device if the timing duration reaches a preset calibration period.
5. The data acquisition device with self-calibration function according to claim 1, wherein said memory comprises: u disk, portable hard drive and memory card.
6. The data acquisition device with self-calibration function according to claim 4, wherein said amplifier comprises: a differential amplifier; the processor further comprises: the operation memory is used for storing the temperature values of the amplifier and the analog-digital converter, which are acquired by the temperature sensor; or storing the timing duration of the timer.
7. The data acquisition device with self-calibration function according to claim 1, wherein the processor comprises: a digital signal processor DSP with an SPI interface or an IIC interface, a programmable logic controller FPGA or a singlechip.
8. The data acquisition device with self-calibration function according to claim 1, wherein the analog-to-digital converter has an SPI interface or an IIC interface and is electrically connected with the processor through an SPI bus or an IIC bus.
9. The data acquisition device with self-calibration function according to claim 1, further comprising: and the low-pass filter circuit is electrically connected between the analog signal input end and the first group of input ends of the multiplexer and is used for filtering high-frequency noise in the input analog signal.
10. The data acquisition device with self-calibration function according to claim 1, wherein said memory comprises: non-volatile memory including phase change random access memory, antifuse memory, magnetoresistive random access memory, or resistive random access memory.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114485764A (en) * | 2022-02-16 | 2022-05-13 | 中国核动力研究设计院 | Self-calibration and anti-drift device for weak signal measurement |
| CN115390614A (en) * | 2022-08-02 | 2022-11-25 | 重庆鲲量科技有限公司 | High-precision AC/DC dual-purpose constant-voltage source circuit and temperature output double-feedback compensation method thereof |
| CN115420307A (en) * | 2022-11-04 | 2022-12-02 | 四川凌翔科技发展有限公司 | Real-time self-calibration self-diagnosis low-temperature drift data acquisition system |
| CN117234193A (en) * | 2023-11-10 | 2023-12-15 | 浙江国利信安科技有限公司 | Calibration device for a control system |
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2020
- 2020-09-10 CN CN202021973575.9U patent/CN213094182U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114485764A (en) * | 2022-02-16 | 2022-05-13 | 中国核动力研究设计院 | Self-calibration and anti-drift device for weak signal measurement |
| CN114485764B (en) * | 2022-02-16 | 2023-08-01 | 中国核动力研究设计院 | Self-calibration and anti-drift device for weak signal measurement |
| CN115390614A (en) * | 2022-08-02 | 2022-11-25 | 重庆鲲量科技有限公司 | High-precision AC/DC dual-purpose constant-voltage source circuit and temperature output double-feedback compensation method thereof |
| CN115420307A (en) * | 2022-11-04 | 2022-12-02 | 四川凌翔科技发展有限公司 | Real-time self-calibration self-diagnosis low-temperature drift data acquisition system |
| CN117234193A (en) * | 2023-11-10 | 2023-12-15 | 浙江国利信安科技有限公司 | Calibration device for a control system |
| CN117234193B (en) * | 2023-11-10 | 2024-03-01 | 浙江国利信安科技有限公司 | Calibration device for a control system |
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