CN211741501U - Image sensor circuit board testing arrangement - Google Patents

Image sensor circuit board testing arrangement Download PDF

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Publication number
CN211741501U
CN211741501U CN202020224651.XU CN202020224651U CN211741501U CN 211741501 U CN211741501 U CN 211741501U CN 202020224651 U CN202020224651 U CN 202020224651U CN 211741501 U CN211741501 U CN 211741501U
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Prior art keywords
image sensor
sensor circuit
circuit board
control
test
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CN202020224651.XU
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Chinese (zh)
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董怀锁
林东东
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Chongqing Unisinsight Technology Co Ltd
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Chongqing Unisinsight Technology Co Ltd
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Abstract

The utility model provides an image sensor circuit board testing arrangement, this testing arrangement includes: the image sensor comprises a control end, a test board end and a plurality of image sensor circuit boards, wherein the test board end is provided with an input end and a plurality of output ends, the input end of the test board end is connected with the output end of the control end, and each output end of the test board end is connected with one of the image sensor circuit boards; and the test board end sequentially receives the parameters uploaded by each image sensor circuit board at a certain time interval under the control of the control end and processes the parameters. The utility model discloses an image sensor circuit board testing arrangement can be when the image sensor circuit board test for the frock board under the electricity change by image sensor circuit board, reach and reduce frock start-up time, improve efficiency of software testing's purpose.

Description

Image sensor circuit board testing arrangement
Technical Field
The utility model relates to a circuit board testing arrangement, concretely relates to image sensor circuit board testing arrangement.
Background
1. The production test is carried out by using the product board of the image sensor circuit board as a tooling environment, so that two problems exist, namely, all product boards of all products to which the product board belongs need to be used, the test environment is complex, and stations are messy; secondly, when the tested plate is replaced, the tooling plate needs to be powered off, and then the testing device is started after the replacement is completed, the product plate is started slowly, generally 60-80 seconds are needed, the time accounts for more than 70% of the whole testing period, and the testing efficiency is low.
2. A quick starting system is developed aiming at a production tool, the tool is powered off when an image sensor circuit board is plugged and pulled out, and the tool is powered on during testing. The whole power-on and power-off process is about 10-20 seconds, the test process of the image sensor circuit board is about 20 seconds totally, the power-on and power-off time of the tool is over 50% of the test process, a special person is needed to maintain the test system, and the development cost of adding a new tested object is high.
SUMMERY OF THE UTILITY MODEL
In view of this, the present invention provides an image sensor circuit board testing device to solve at least one of the defects in the prior art.
In order to achieve the above objects and other related objects, the present invention provides an image sensor circuit board testing apparatus for testing a plurality of image sensor circuit boards, the testing apparatus comprising:
a control end, a control end and a control end,
the test board end is provided with an input end and a plurality of output ends, the input end of the test board end is connected with the output end of the control end, and each output end of the test board end is connected with one of the image sensor circuit boards;
and the test board end sequentially receives the parameters uploaded by each image sensor circuit board at a certain time interval under the control of the control end and processes the parameters.
Optionally, the test plate end comprises:
the constant voltage source unit P1 is used for supplying power to the power utilization module;
a plurality of image sensor circuit board interfaces, each image sensor circuit board interface connected to an image sensor circuit board;
the first control module is used for receiving a first control instruction of the control end and generating a second control instruction according to the first control instruction;
and the second control module is connected with the first control module and used for receiving the second control instruction and sequentially receiving the parameters uploaded by each image sensor circuit board at a certain time interval through an image sensor circuit board interface according to the second control instruction.
Optionally, the second control module comprises:
the video signal switching unit is used for sequentially sending video switching signals to each image sensor circuit board interface at a certain time interval according to the second control instruction;
the control signal switching unit is used for sequentially sending control switching signals to each image sensor circuit board interface at a certain time interval according to the second control instruction;
and the power supply control unit controls the constant voltage source unit to sequentially supply power to each image sensor circuit board at a certain time interval according to the second control instruction.
Optionally, the test board end further comprises:
and the logic module is connected between the first control module and the second control module.
Optionally, the control end is connected to the test board end through a network cable, a PCIE bus, or a USB interface.
Optionally, the image sensor circuit board interface is connected with the image sensor circuit board through an FPC connector.
Optionally, the first control module is an MCU.
Optionally, the logic module is a programmable logic device.
Optionally, the programmable logic device is a CPLD or an FPGA.
Optionally, the control end is an industrial personal computer or a PC.
As described above, the utility model discloses an image sensor circuit board testing arrangement has following beneficial effect:
the utility model discloses an image sensor circuit board testing arrangement can be when the image sensor circuit board test for the frock board under the electricity change by image sensor circuit board, reach and reduce frock start-up time, improve efficiency of software testing's purpose.
Drawings
Fig. 1 is a schematic view of an image sensor circuit board testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic diagram of a video signal switching unit according to an embodiment of the present invention;
fig. 3 is a schematic diagram of a current control unit according to an embodiment of the present invention;
fig. 4 is a circuit diagram of a video signal switching unit according to an embodiment of the present invention;
fig. 5 is a circuit diagram of a power control unit according to an embodiment of the present invention;
fig. 6 is a circuit diagram of a control signal switching unit according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention is provided for illustrative purposes, and other advantages and effects of the present invention will be readily apparent to those skilled in the art from the disclosure herein. The present invention can also be implemented or applied through other different specific embodiments, and various details in the present specification can be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention. It is to be noted that the features in the following embodiments and examples may be combined with each other without conflict.
It should be noted that the drawings provided in the following embodiments are only for illustrating the basic concept of the present invention, and the components related to the present invention are only shown in the drawings rather than drawn according to the number, shape and size of the components in actual implementation, and the form, amount and ratio of the components in actual implementation may be changed at will, and the layout of the components may be more complicated.
As shown in fig. 1, an image sensor circuit board testing apparatus for testing a plurality of image sensor circuit boards includes:
the control terminal M1 is connected to the control terminal M,
a test board terminal B1 having an input terminal and a plurality of output terminals, the input terminal of the test board terminal being connected to the output terminal of the control terminal, each of the output terminals of the test board terminal being connected to one of the plurality of image sensor circuit boards;
and the test board end sequentially receives the parameters uploaded by each image sensor circuit board at a certain time interval under the control of the control end and processes the parameters.
The parameter is a video stream uploaded by the image sensor circuit board, and the time interval refers to the time from the test beginning to the test ending.
The control end M1 may be connected to the test board end through a network port, a USB interface, a PCIE interface, etc., to implement high-speed transmission of commands and data.
The control end is generally a main control device commonly used in a production line, such as a PC (Personal Computer) or an Industrial Personal Computer (IPC). The control end controls the whole production test process, and is generally connected with the test board end through a network cable, a pcie (peripheral component interconnect express) bus, a usb (universal Serial bus) bus and the like.
The control end comprises a production test flow control module and a decoding module; the production test flow control module controls the current interface test, power state and the like of the test board end through instructions. The decoding module decodes the compressed image uploaded through the test board end for subsequent operation.
The functions of the test end plate include three, one is under the control of the control end M1, and the test interface is selected, that is, one is selected from the current n image sensor interfaces; secondly, configuring the image sensor, including initialization, stream fetching and other operations; and thirdly, encoding the image to improve the bandwidth utilization rate, and outputting the original value of the image sensor under the condition of no encoding.
In one embodiment, the test board end B1 includes:
a constant voltage source unit P1 for supplying power to the power consuming unit;
a plurality of image sensor circuit board interfaces, for example, an image sensor circuit board interface 1, an image sensor circuit board interface 2, through an image sensor circuit board interface n, each image sensor circuit board interface connecting to an image sensor circuit board; the image sensor circuit board and the image sensor circuit board interface are generally connected by an fpc (flexible printed circuit connector) connector.
The first control module M2 is configured to receive a first control instruction of the control end, and generate a second control instruction according to the first control instruction; typically, the first control module is an MCU (micro controller Unit).
And the second control module M4 is connected with the first control module and used for receiving the second control instruction and sequentially acquiring and processing parameters uploaded by each image sensor circuit board at a certain time interval through an image sensor circuit board interface according to the second control instruction. The processing described here is compression of the parameters.
In particular, the second control module M4 comprises:
the video signal switching unit C1 is used for sequentially sending the video switching signals to each image sensor circuit board interface at a certain time interval according to the second control instruction; a schematic diagram of the video signal switching unit C1 is shown in fig. 2.
The control signal switching unit C2 is used for sequentially sending control switching signals to each image sensor circuit board interface at a certain time interval according to the second control instruction;
and the power supply control unit C3 controls the constant voltage source unit P1 to sequentially supply power to each image sensor circuit board at certain time intervals according to the second control instruction. Here, the signals sent by the video signal switching unit C1 and the control signal switching unit C2 are received by the same image sensor circuit board interface at the same time, and the power control unit controls the image sensor circuit board connected with the image sensor circuit board interface.
The power supply control unit comprises a current limiting unit, a current measuring unit and a switch unit, wherein the current limiting unit plays a role in limiting current, the current measuring unit plays a role in measuring the current, and the switch unit plays a role in switching and is switched on or off under the action of an external control command.
Specifically, the video signal switching unit C1 transmits the video switching signal to the image sensor circuit board interface 1, the control signal switching unit C2 transmits the control switching signal to the image sensor circuit board interface S1, and the power supply control unit C3 controls the constant voltage power supply unit P1 to supply power to the image sensor circuit board U1. And after the test of the image sensor electric appliance circuit board U1 is finished, testing the image sensor electric appliance circuit board U2. The test of the image sensor electric circuit board U2 is that the video signal switching unit C1 sends a video switching signal to the image sensor circuit board interface S2, the control signal switching unit C2 sends a control switching signal to the image sensor circuit board interface S2, and the power control unit C3 controls the constant voltage source unit P1 to supply power to the image sensor circuit board U2. And thus, the test work on all the image sensor circuit boards is completed in a circulating way.
In one embodiment, the test board end further comprises: and a logic module M3 connected between the first control module and the second control module.
The logic module typically uses programmable logic devices. When the module exists, all signals of the first control module are firstly connected to the logic module and then connected to the second control module M4 through the logic module, and when the module does not exist, all signals of the first control module are directly connected to the second control module M4; after the module is added, the control relationship between the first control module and the second control module can be flexibly configured, so that the universality is stronger.
Fig. 2 is a schematic diagram of a video signal switching unit, wherein the video signal switching unit uses MIPI signals.
The MIPI signal, control signal, etc. of the first control module M2 are connected with the logic module M3. Preferably, M3 uses a CPLD (Complex Programmable Logic Device) or an fpga (field Programmable Gate array) to realize flexible pin configuration between the first control module M2 and the image sensor circuit board U1 or U2.
As shown in fig. 4, the logic module M3 is directly connected to a5, a6, B5, B6 through F5, F6 of the MIPI video signal switching unit C1, wherein a5, a6 are enable signals and channel selection signals, and the other signals are MIPI signals.
Fig. 4 is a circuit diagram of the video signal switching unit (optional chip TS5MP645), and fig. 6 is a circuit diagram of the control signal switching unit (optional chip ADG 734). As shown in fig. 4 and 6, pins 1, 10, 11 and 20 are channel selection pins, and pins 3, 8, 13 and 18 are signal output pins. The control pin of the main control relay UD2_12NUN _ L is connected to the power supply section, and the circuit diagram of the power supply control unit is shown in fig. 5.
The embodiment is explained by detecting two image sensor circuit boards, and the test implementation process using the image sensor circuit board interface S1 is as follows:
the control end sends a command to the first control module M2, and the first control module M2 disconnects the power supply control unit C3 circuit through the logic unit, so that no electric signal exists on the image sensor circuit board interface S1;
the MIPI video signal switching unit C1 and the control signal switching unit C2 switch signals to the image sensor circuit board interface S2.
The image sensor circuit board U1 is connected to the image sensor circuit board interface S1.
The MIPIP video signal switching unit C1 and the control signal switching unit C2 are switched to an image sensor circuit board interface S1;
the power control unit C3 is turned on to supply power to the image sensor circuit board U1.
The first control module M2 initializes the Sensor on the image Sensor board U1 by the IIC bus send configuration.
The first control module M2 reads the video stream of the image sensor circuit board U1 through MIPI signals and correspondingly encodes the video stream; the encoded video stream is transmitted to the control terminal M1 for decoding operation, so as to complete the testing operation of the image sensor circuit board U1.
After the test is completed, the power control unit is disconnected, and the power of the image sensor circuit board U1 is connected to the ground to discharge the image sensor circuit board U1.
The MIPI video signal switching unit C1 and the control signal switching unit C2 are switched to an image sensor circuit board interface S2;
and taking down the tested image sensor circuit board, then installing a new image sensor circuit board, and repeating the test process.
The utility model discloses in whole test procedure, the MCU chip does not cut off the power supply, changes the MCU chip after UUT (the examination image sensor circuit board that awaits measuring) and does not need restart, practices thrift test time and reaches more than 70%, realizes high-efficient quick test.
It is understood that the present invention is not described in detail in the following description, and the present invention relates to the encoding, decoding, and image sensor configuration of a video stream.
It will be understood by those skilled in the art that the related modules and the functions implemented by the related modules in the present invention are implemented by carrying computer software programs or related protocols which are conventional in the art on the modified hardware and the apparatuses, devices or systems formed by the hardware and the devices, devices or systems, and are not modified in the prior art. For example, the improved computer hardware system can still realize the specific functions of the hardware system by loading the existing software operating system. Therefore, it can be understood that the innovation of the present invention lies in the connection combination relationship of the hardware modules/units in the prior art, not only the specific structure of the hardware modules/units, but also the improvement of the software or protocol installed in the hardware modules for realizing the related functions.
The above embodiments are merely illustrative of the principles and effects of the present invention, and are not to be construed as limiting the invention. Modifications and variations can be made to the above-described embodiments by those skilled in the art without departing from the spirit and scope of the present invention. Accordingly, it is intended that all equivalent modifications or changes which may be made by those skilled in the art without departing from the spirit and technical spirit of the present invention be covered by the claims of the present invention.

Claims (10)

1. An image sensor circuit board testing apparatus for testing a plurality of image sensor circuit boards, the testing apparatus comprising:
a control end, a control end and a control end,
the test board end is provided with an input end and a plurality of output ends, the input end of the test board end is connected with the output end of the control end, and each output end of the test board end is connected with one of the image sensor circuit boards;
and the test board end sequentially receives the parameters uploaded by each image sensor circuit board at a certain time interval under the control of the control end and processes the parameters.
2. The image sensor circuit board testing device of claim 1, wherein the test board end comprises:
the constant voltage source unit P1 is used for supplying power to the power utilization module;
a plurality of image sensor circuit board interfaces, each image sensor circuit board interface connected to an image sensor circuit board;
the first control module is used for receiving a first control instruction of the control end and generating a second control instruction according to the first control instruction;
and the second control module is connected with the first control module and used for receiving the second control instruction and sequentially receiving a plurality of parameters uploaded by the image sensor circuit board at certain time intervals through an image sensor circuit board interface according to the second control instruction.
3. The image sensor circuit board testing device of claim 2, wherein the second control module comprises:
the video signal switching unit is used for sequentially sending video switching signals to each image sensor circuit board interface at a certain time interval according to the second control instruction;
the control signal switching unit is used for sequentially sending control switching signals to each image sensor circuit board interface at a certain time interval according to the second control instruction;
and the power supply control unit controls the constant voltage source unit to sequentially supply power to each image sensor circuit board interface at a certain time interval according to the second control instruction.
4. The image sensor circuit board testing apparatus of claim 2, wherein said test board end further comprises: and the logic module is connected between the first control module and the second control module.
5. The device for testing the circuit board of the image sensor as claimed in claim 1, wherein the control terminal is connected to the test board terminal through a network cable, a PCIE bus or a USB interface.
6. The image sensor circuit board testing device according to claim 1, wherein the image sensor circuit board interface and the image sensor circuit board are connected by an FPC connector.
7. The image sensor circuit board testing device of claim 2, wherein the first control module is an MCU.
8. The image sensor circuit board testing device of claim 4, wherein the logic module is a programmable logic device.
9. The image sensor circuit board testing device of claim 8, wherein the programmable logic device is a CPLD or an FPGA.
10. The device for testing the circuit board of the image sensor as claimed in claim 1, wherein the control terminal is an industrial personal computer or a PC.
CN202020224651.XU 2020-02-28 2020-02-28 Image sensor circuit board testing arrangement Active CN211741501U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202020224651.XU CN211741501U (en) 2020-02-28 2020-02-28 Image sensor circuit board testing arrangement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202020224651.XU CN211741501U (en) 2020-02-28 2020-02-28 Image sensor circuit board testing arrangement

Publications (1)

Publication Number Publication Date
CN211741501U true CN211741501U (en) 2020-10-23

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Application Number Title Priority Date Filing Date
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CN (1) CN211741501U (en)

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