CN211236058U

CN211236058U - Novel quartz crystal oscillator testing device

Info

Publication number: CN211236058U
Application number: CN201921795760.0U
Authority: CN
Inventors: 黄先日; 崔保春
Original assignee: Qingdao Chrystar Electronic Technology Co ltd
Current assignee: Qingdao Chrystar Electronic Technology Co ltd
Priority date: 2019-10-24
Filing date: 2019-10-24
Publication date: 2020-08-11
Anticipated expiration: 2029-10-24

Abstract

The utility model relates to a novel quartz crystal oscillator testing device, which comprises a testing box body, an upper cover fixedly connected with the testing box body and a clamp mechanism used for fixing a quartz crystal oscillator to be tested; the inside of the side wall of the test box body is provided with a heat insulation layer, and a gas circulation pipeline penetrates from the bottom of the test box body to the inside of the test box body; the bottom of the gas circulation pipeline is tightly matched with the heat-insulating layer, and a gap is reserved between the middle upper part of the gas circulation pipeline and the heat-insulating layer; and through holes are arranged on the side surface of the test box body and the heat insulation layer and are communicated with the gaps. The beneficial effects of the utility model are that solve the test problem of quartz crystal syntonizer in ambient temperature rapid change in-process, provide the testing arrangement who is suitable for miniature electronic components such as test quartz crystal syntonizer, the temperature field direction of change that makes the quartz crystal syntonizer that is surveyed receive is controllable.

Description

Novel quartz crystal oscillator testing device

Technical Field

The utility model belongs to the technical field of the electron device testing arrangement, especially, relate to a novel quartz crystal oscillator testing arrangement.

Background

At present, most of electronic products or electronic component manufacturers use testing/detecting devices which heat or cool the testing/detecting products in one direction, but in the normal working process of some electronic equipment or electronic components, the heated state is that the internal temperature of the electronic components is raised by the heat radiation of a bottom or surrounding heating component.

The test/detection equipment used by domestic related electronic product manufacturers is mainly imported equipment, and the equipment is mainly static test, while the temperature field change in the working process of the electronic product is a dynamic process, and the temperature change of the electronic product needs to be dynamically tested. The dynamic test is provided with a TA-5000 series temperature test system produced by Taiwan Wang Si company, the system can dynamically test the electronic equipment, the test cavity does not have any fixing device, the tested equipment or element is arranged in the test cavity, the test cavity does not have any fixing device inside, the quartz crystal oscillator has small size, and the position can move or roll under the action of air flow in the test process, so the equipment is only suitable for elements or equipment with large volume and mass, and the test requirements cannot be met for some electronic components or electronic parts with small weight and volume. Some patents and related technical data indicate that the test devices are implemented as temperature variation test chambers; the testing/detecting device makes the heating direction of the tested component single, and is not suitable for the requirement of the use environment of the current electronic products.

SUMMERY OF THE UTILITY MODEL

In order to solve the technical problem, the utility model provides a novel quartz crystal oscillator testing arrangement, the purpose is solved the test problem of quartz crystal syntonizer in ambient temperature rapid change in-process, provides the testing arrangement who is suitable for miniature electronic components such as test quartz crystal syntonizer, makes the temperature field change direction controllable that the quartz crystal syntonizer that is surveyed receives.

The technical scheme of the utility model is that:

a novel test device for a quartz crystal oscillator comprises a test box body, an upper cover fixedly connected with the test box body, and a clamp mechanism used for fixing the quartz crystal oscillator to be tested; the inside of the side wall of the test box body is provided with a heat insulation layer, and a gas circulation pipeline penetrates from the bottom of the test box body to the inside of the test box body; the bottom of the gas circulation pipeline is tightly matched with the heat-insulating layer, and a gap is reserved between the middle upper part of the gas circulation pipeline and the heat-insulating layer; and through holes are arranged on the side surface of the test box body and the heat insulation layer and are communicated with the gaps.

Compared with the prior art, this scheme can enough realize the test environment promptly quick simulation of temperature through having designed the test cavity in a non-airtight space, and when the quick change in-process of electronic product operating temperature, can realize the radiation or the heat transfer of a plurality of directions.

Based on the above scheme, the utility model discloses following improvement has still been made:

further, a clamp mechanism of the quartz crystal oscillator is fixed on the upper cover through a bolt; the fixture mechanism comprises a test slot cover plate, an insulating thermal insulation layer arranged on the test slot cover plate, and a PCB arranged on the insulating thermal insulation layer, wherein the PCB is provided with an installation clamp, and a power supply and a signal wire for supplying power to the PCB and outputting signals. In the technical improvement, the clamp is fixed on the PCB, so that the quartz crystal oscillator can be conveniently and rapidly mounted and taken out, and the quartz crystal oscillator is not damaged.

Furthermore, the test box body is of a square structure, a plurality of through holes are formed in four side walls of the test box body, and the through holes penetrate through the heat insulation layer and are communicated with gaps in the test box body.

The technical scheme has the advantages that the rapid simulation of the test environment, namely the air temperature, can be realized, and in the rapid change process of the working temperature of the electronic product, the radiation or heat transfer in multiple directions can be realized, so that the change direction of the temperature field received by the quartz crystal resonator to be tested is controllable.

Drawings

FIG. 1 is a schematic sectional view of the present invention;

FIG. 2 is a schematic structural view of the clamping mechanism of the present invention;

fig. 3 is a schematic side view of the present invention.

In the figure, 1, a test box body; 2. an upper cover; 3. a clamp mechanism; 4. a heat-insulating layer; 5. a gas flow conduit; 31. a test slot cover plate; 32. an insulating and heat-insulating layer; 33. a PCB board; 34. a clamp mechanism of the quartz crystal oscillator; 11. a through hole; 12. a gap.

Detailed Description

As shown in fig. 1-2, a novel quartz crystal oscillator testing device comprises a testing box body 1, an upper cover 2 connected with the testing box body through bolts, and a clamp mechanism 3 fixed between the testing box body 1 and the upper cover 2 through bolts and used for fixing a quartz crystal oscillator to be tested; the inside of the side wall of the test box body is provided with a heat-insulating layer 4, a gas circulation pipeline 5 penetrates from the bottom of the test box body to the inside of the test box body, and the heat-insulating layer 4, the gas circulation pipeline 5 and the clamp mechanism 3 enclose a test cavity; the bottom of the gas circulation pipeline 5 is tightly matched with the heat-insulating layer 4, and a gap 12 is reserved between the middle upper part of the gas circulation pipeline 5 and the heat-insulating layer 4; through holes 11 are formed in the test box body 1 and the heat preservation layer 4, the through holes 11 are communicated with the gaps 12, and gas in the test box body 1 can be discharged through the gaps 11 and the through holes 12.

The fixture mechanism comprises a test slot cover plate 31, an insulating thermal insulating layer 32 arranged on the test slot cover plate 31, and a PCB 33 arranged on the insulating thermal insulating layer 32, wherein the PCB 33 is provided with an installation clamp 34 and a power supply and a signal wire for supplying power to the PCB 33 and outputting signals, the power supply and the signal wire are not marked in the implementation, a conventional wire is adopted, the PCB can be used for testing the test plate, and the technology is not repeated in the technical scheme.

The test box is the square body structure, all is equipped with the several through-hole on four lateral walls of test box, in this embodiment, is equipped with three through-hole on every lateral wall, and the through-hole runs through the heat preservation and communicates with each other with the internal clearance of test box. In this embodiment, the test box body adopts a square structure, but this scheme is not limited to the square structure, for the cylinder structure can, only need guarantee evenly distributed have the gas outgoing through-hole on the box can.

The above description of the embodiments is only intended to facilitate the understanding of the method and the central idea of the invention. It should be noted that, for those skilled in the art, without departing from the principle of the present invention, the present invention can be subject to several improvements and modifications, which also fall within the scope of the claims of the present invention.

Claims

1. A novel test device for a quartz crystal oscillator comprises a test box body, an upper cover fixedly connected with the test box body, and a clamp mechanism used for fixing the quartz crystal oscillator to be tested; the method is characterized in that: the inside of the side wall of the test box body is provided with a heat insulation layer, and a gas circulation pipeline penetrates from the bottom of the test box body to the inside of the test box body; the bottom of the gas circulation pipeline is tightly matched with the heat-insulating layer, and a gap is reserved between the middle upper part of the gas circulation pipeline and the heat-insulating layer; and through holes are arranged on the side surface of the test box body and the heat insulation layer and are communicated with the gaps.

2. The novel quartz crystal oscillator test device of claim 1, wherein: the clamp mechanism is fixed on the upper cover through a bolt; the fixture mechanism comprises a test slot cover plate, an insulating thermal insulation layer arranged on the test slot cover plate, and a PCB arranged on the insulating thermal insulation layer, wherein the PCB is provided with an installation clamp, and a power supply and a signal wire for supplying power to the PCB and outputting signals.

3. The novel quartz crystal oscillator test device of claim 1, wherein: the test box body is of a square structure, a plurality of through holes are formed in four side walls of the test box body, and the through holes penetrate through the heat insulation layer and are communicated with gaps in the test box body.