CN205594131U - General switching tool - Google Patents
General switching tool Download PDFInfo
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- CN205594131U CN205594131U CN201620066606.XU CN201620066606U CN205594131U CN 205594131 U CN205594131 U CN 205594131U CN 201620066606 U CN201620066606 U CN 201620066606U CN 205594131 U CN205594131 U CN 205594131U
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- circuit board
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Abstract
The utility model relates to a general switching tool, general switching tool includes first testing component, switching subassembly and second testing component, first testing component includes first dial and first probe, first probe passes first dial, and sliding connection in first dial, the second testing component includes second dial and second probe, the second dial is fixed in first dial one side, second probe one end is fixed in between first dial and the second dial, the other end passes the second dial, the switching subassembly is including electrically conductive elastic component, electrically conductive elastic component is connected between first probe and second probe, be used for providing the restoring force that first probe kept away from the second probe. Elastic reaction power is applyed to first probe to electrically conductive elastic component to messenger's circuit board that the probe can the multiple surface treatment type of adaptation of winning, the electrical test efficiency of improved circuit board, the production efficiency of improved circuit board.
Description
Technical field
This utility model and electronic device field, particularly relate to a kind of general adapting fixture.
Background technology
nullWhat at present circuit board all can carry out batch before coming into operation carries out testing electrical property to properties，Circuit board properties is tested by most of circuit board detection equipments mainly by universal testing machine，Although universal testing machine has fixing power of test、The fixing advantage such as test area and depreciation time length，But board design updating decision causes the use changes in demand to universal testing machine fast at present，Cause test machine can not meet the circuit board to various structures form to test，Specifically，The inner body of universal testing machine is difficult to change at present，Make universal testing machine that the active force of circuit board be difficult to regulation，But active force that at present circuit board of different model can bear is the most different，So that the circuit board that test machine mates less model is tested，When the active force that circuit board active force be can bear by test machine more than circuit board，It is typically easy to cause the tested test-run a machine of circuit board to be stabbed or weigh wounded，Thus cause circuit board damage，The most current universal testing machine is only capable of mating the circuit board of less model and tests.Therefore currently without a kind of general adapting fixture that universal testing machine can be assisted to test the circuit board of Multiple Type, thus causing circuit board testing inefficient, the production efficiency of circuit board reduces.
Utility model content
This utility model provides a kind of by reducing probe slope to improve circuit board testing efficiency, the general adapting fixture of raising board production efficiency.
The general adapting fixture of one provided by the utility model, wherein, described general adapting fixture includes the first test suite, adapter assembly and the second test suite, described first test suite includes the first dials and the first probe, described first probe passes described first dials, and it is slidably connected to described first dials, described second test suite includes the second dials and the second probe, described second dials is fixed on described first dials side, described second probe one end is fixed between described first dials and described second dials, the other end includes conductive resilient element through adapter assembly described in described second dials, described conductive resilient element is connected between described first probe and described second probe, in order to provide described first probe away from the restoring force of described second probe.
Wherein, described adapter assembly also includes dials of transferring, described switching dials includes the first fixed plate, the second fixed plate and fixed support, described first fixed plate is fixing connects described first dials, described second fixed plate is fixed on described first fixed plate and deviates from described first dials side, described fixed support is fixed between described first fixed plate and described second fixed plate, so that described first fixed plate is mutually isolated with described second fixed plate, described elastic component passes described switching dials.
Wherein, described adapter assembly also includes that described conductive resilient element is fixed in described sleeve through described first fixed plate and the sleeve of described second fixed plate.
Wherein, the normal direction of the most described first dials of the length direction of described first probe tilts.
Wherein, the normal direction of the most described second dials of the length direction of described second probe tilts.
Wherein, described first dials is provided with the first via of multiple array, and the number of described first probe is multiple, and multiple described first probes are slidably connected in described first via respectively.
Wherein, described second multiple second via of dials array, the number of described second probe is multiple, multiple described second probes are each passed through multiple described second via, the number of described conductive resilient element is multiple, and each described conductive resilient element is correspondingly connected between each described first probe and each described second probe.
Wherein, described conductive resilient element is metal rectangular spring.
Wherein, described first dials includes that the first stacking plate of multiple stacking, multiple described first stacking plates mutually completely cut off, and multiple described first stacking plates are jointly interspersed with first and fix post.
Wherein, described second dials includes that the second stacking plate of multiple stacking, multiple described second stacking plates mutually completely cut off, and multiple described second stacking plates are jointly interspersed with second and fix post.
nullGeneral adapting fixture provided by the utility model，Be slidably connected in the first via by described first dials described first probe，Described conductive resilient element provides elastic acting force for described first probe，And the elastic force adjustable of described elastic component，Described general adapting fixture is that circuit board is when testing，Described first probe contacts on circuit board，Elastic acting force is acted on circuit board by described first probe，The active force that i.e. circuit board is born is identical with the elastic acting force of described conductive resilient element，The conductive resilient element utilizing described general adapting fixture is convertible，So that described general adapting fixture adaptive kinds of surface can process the circuit board of type，The surface stacking gold plate of the most described circuit board、Spray sheet tin or antioxidation plate etc.，Thus realize the testing electrical property of circuit board，Thus realize the coupling of multiple circuit board，Improve the testing electrical property efficiency of circuit board，Improve the production efficiency of circuit board.
Accompanying drawing explanation
In order to be illustrated more clearly that the technical solution of the utility model, the accompanying drawing used required in embodiment will be briefly described below, apparently, accompanying drawing in describing below is embodiments more of the present utility model, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
The structural representation of the general adapting fixture that Fig. 1 provides for this utility model.
Detailed description of the invention
Below in conjunction with the accompanying drawing in this utility model embodiment, the technical scheme in this utility model embodiment is clearly and completely described.
Referring to Fig. 1, the general adapting fixture of one 100 that this utility model provides, described general adapting fixture 100 includes the first test suite 10, adapter assembly 20 and the second test suite 30.Described first test suite 10 includes the first dials 11 and multiple first probe 12, multiple first via 111 of array on described first dials 11, and be slidably connected in described first via 111 described first probe 12.Described first via 111 is exposed in described first probe 12 one end.Described adapter assembly 20 includes transfer dials 21 and multiple conductive resilient element 22, described switching dials 21 is fixed on described first dials 11 to deviate from described first probe 12 and exposes described first via 111 side, and corresponding multiple described first via 111 multiple transfer hole of array 211.Described conductive resilient element 22 includes the first end 221 and the second end 222 being oppositely arranged, described first end 221 is fixing connects described first probe 12 one end, described second end 222 is fixed in described transfer hole 211, and one end that described conductive resilient element 22 exposes described first via 111 in order to provide described first probe 12 is away from the restoring force of described first via 111.Described second test suite 30 includes the second dials 31 and multiple second probe 32, described second dials 31 is fixed on described switching dials 21 and deviates from described first dials 11 side, described second multiple second via 311 of dials 31 array, interspersed described second probe 32 in described second via 111.Described second probe 32 one end is fixing connects described conductive resilient element 22, and the other end exposes described second via 311.
nullBe slidably connected in the first via 111 by described first dials 11 described first probe 12，Described conductive resilient element 22 is set in the switching via 211 of described switching dials 21，Described conductive resilient element 22 provides elastic acting force for described first probe 12，And the elastic force scalable of described conductive resilient element 22，When described general adapting fixture 100 is tested for circuit board，Described first probe 12 contacts on circuit board，Elastic acting force is acted on circuit board by described first probe 12，The active force that i.e. circuit board is born is identical with the elastic acting force of described conductive resilient element 22，The conductive resilient element 22 utilizing described general adapting fixture 100 is convertible，So that described general adapting fixture 100 adaptive kinds of surface can process the circuit board of type，The surface stacking gold plate of the most described circuit board、Spray sheet tin or antioxidation plate etc.，Thus realize the testing electrical property of circuit board，Thus realize the coupling of multiple circuit board，Improve the testing electrical property efficiency of circuit board，Improve the production efficiency of circuit board..
In present embodiment, the described first rectangular tabular of dials 11, multiple described first via 111 rectangular array distributions.Described first probe 12 includes that the first contact jaw 121 and first being oppositely arranged connects end 122.Described first contact jaw 121 exposes described first via 111, and described first connects fixing the first end 221 connecting described conductive resilient element 22 of end 122.Described first probe 12 is metallic conduction part, when multiple described first probes 12 contact at the circuit structure on circuit board, circuit structure according to circuit board can select the first probe 12 described in any two to be connected, thus tests the micro-resistance between two described first probes 12.And utilize described first probe 12 to slide in described first via 111, and then described first probe 12 is flexible in described first via 111, make multiple described first probe 12 can be with rugged circuit structure multiple on match circuit plate, thus mate the circuit board of various ways, increase the compactness of described first probe 12 and circuit board, and along with described first probe 12 exposes the length difference of described first via 111, make described first probe 12 the most different to the active force of circuit board, thus improve measuring stability, meet the circuit board testing of plurality of specifications simultaneously, improve testing efficiency.In other embodiments, multiple described first vias 111 can also is that the structure according to circuit board carries out array.
In present embodiment, the described rectangular tabular of switching dials 21.Described switching dials 21 includes that the first side 21a and the second side 21b being oppositely arranged, described first side 21a are fixed on described first dials 11, and away from the first contact jaw 121 of described first probe 12.Described second side 21b is away from described first dials 11.Described switching via 211 is circular port, and described switching via 211 is corresponding with described first via 111, and described switching via 211 diameter is more than described first via 111.Described switching via 211 includes that the first opening 211a and the second opening 211b being oppositely arranged, described first opening 211a are opened on described first side 21a, and described second opening 211b is opened in described second side 21b.First end 221 of described conductive resilient element 22 can slide by the most described first opening 211b under the effect of described first probe 12, and described second end 222 is fixed on described second opening 211b.In other embodiments, described switching via 21 can also is that rectangular opening.
In present embodiment, the described second rectangular tabular of dials 31, multiple described second via 311 rectangular array distributions.Described second probe 32 includes that the second contact jaw 321 and second being oppositely arranged connects end 322.Described second contact jaw 321 exposes described second via 311, and described second connects fixing the second end 222 connecting described conductive resilient element 22 of end 122.Described second probe 32 is metallic conduction part, multiple described second probes 32 contact on the circuit of test module, such that it is able to the second probe 32 is connected described in selection any two, thus by the micro-resistance between two described first probes 12 of the micro-resistance test circuit ON between two described second probes 32, thus realize micro-resistance multiple on circuit board are tested.In other embodiments, multiple described second vias 311 can also is that the circuit structure according to resistance test module carries out array.
Further, described switching dials 21 includes the first fixed plate the 23, second fixed plate 24 and fixed support 25, described first fixed plate 23 is fixing connects described first dials 11, described second fixed plate 24 is fixed on described first fixed plate 23 and deviates from described first dials 11 side, described fixed support 25 is fixed between described first fixed plate 23 and described second fixed plate 24, so that described first fixed plate 23 is mutually isolated with described second fixed plate 24, described first via 111 is through described first fixed plate 23 and described second fixed plate 24.Utilize described first fixed plate 23 and described second fixed plate 24 mutually isolated, thus increase the thermal diffusivity of described switching dials 21, thus improve testing efficiency.
Further, the normal direction of the most described first dials 11 of the length direction of described first probe 12 tilts.In present embodiment, multiple described first probe 12 opposed vertical directions tilt, and the normal direction of the most described first dials 11 is vertical direction.When testing circuit board, the normal direction of this circuit board is also vertically arranged.nullOwing to described first probe 12 opposed vertical direction tilts，The most described first probe 12 can also slide setting in described first via 111，So that the length that described first probe 12 exposes described first via 111 is different，According to SIN function relation，It is can to expose the length of described first via 111 different and change along with described first probe 12 in the orthographic projection distance of circuit board that described first probe 12 contacts at circuit board one end to described first via 111，The most described first probe 12 exposes the length of described first via 111 and increases，Described first contact jaw 121 increases to described first via 111 the most therewith in the orthographic projection distance of circuit board，On the contrary，Described first probe 12 exposes the length of described first via 111 and diminishes，Described first contact jaw 121 reduces to described first via 111 the most therewith in the orthographic projection distance of circuit board.Thus when the test point on circuit board offsets bigger relative to the orthographic projection of described first via 111, the length that can expose described first via 111 by increasing described first probe 12 increases described first contact jaw 121 the most described first via 111 distance in circuit board orthographic projection, so that described first contact jaw 121 can contact in the test point of circuit board accurately.When the test point of circuit board offsets less relative to the orthographic projection of described first via 111, described first probe 12 can be reduced and expose the length of described first via 111 to reduce the described first contact jaw 121 the most described first via 111 orthographic projection distance at circuit board, equally make described first contact jaw 121 can contact at accurately in the test point of circuit board, so that the test accuracy of described general adapting fixture 100 improves, thus improve test yield.Compared in prior art, the most described first dials of described first probe maintains static, need to change different measurement jigs, to regulate first probe angle relative to the first dials, thus meet the first contact jaw apart from described first via in the orthographic projection distance of circuit board, the circuit board test point skew relative to described first via is compensated with this, i.e. prior art need the described first probe guarantee test using slope less accurate, and the first probe test deviation of using slope bigger is bigger, the most described general adapting fixture 100 is high compared to prior art test accuracy, and can the circuit board of adaptive various structures, testing efficiency is high.
Further, the most described first probe 12 of described second probe 32 tilts, the most described second dials 31 of length direction of the most described second probe 32 tilts, i.e. facilitate described second probe 32 build-out resistor test module, make the conflict circuit of resistance test module of described second probe 32 more tight, improve testing efficiency.
Further, arranging sleeve 26 in described switching via 211, described conductive resilient element 22 is fixed in described sleeve 26.Described sleeve 26 is through described first fixed plate 23 and described second fixed plate 24; described conductive resilient element 22 is protected by described sleeve 26; prevent described first fixed plate 23 and described second fixed plate 24 and conductive resilient element 22 described in the friction damage of described conductive resilient element 22, be also prevented from described first fixed plate 23 simultaneously and described second fixed plate 24 is damaged.
Further, described conductive resilient element 22 is metal rectangular spring, and described conductive resilient element 22 provides elastic-restoring force for described first probe 12, can also be described first probe 12 transmission test signal simultaneously, so that described general adapting fixture 100 simple in construction, reduce cost.Utilize described conductive resilient element 22 to be removably connected to described switching dials 21, thus facilitate the replacing to described conductive resilient element 22, thus realize the elastic force size scalable of described conductive resilient element 22.
Further, described first dials 11 includes that the first stacking plate 13 of multiple stacking, multiple described first stacking plates 13 mutually completely cut off, and multiple described first stacking plates 13 are jointly interspersed with first and fix post 14.Multiple described first stacking plates 13 are fixed post 14 by described first and are interfixed, and utilize the gap between multiple described first stacking plate 13 to increase the thermal diffusivity of described general adapting fixture 100.
Further, described second dials 31 includes that the second stacking plate 33 of multiple stacking, multiple described second stacking plates 33 mutually completely cut off, and multiple described second stacking plates 33 are jointly interspersed with second and fix post 34.Multiple described second stacking plates 33 are fixed post 34 by described second and are interfixed, and utilize the gap between multiple described second stacking plate 33 to increase the thermal diffusivity of described general adapting fixture 100.
Further, described first dials 11 deviates from described switching dials 21 side and arranges the first locating dowel 15.Utilize described first locating dowel 35 to position with circuit board, thus improve the degree of accuracy of micro-resistance test.
Further, described second dials 31 deviates from described switching dials 21 side and arranges the second locating dowel 35, utilizes described second locating dowel 35 to position with resistance test module, thus improves the degree of accuracy of micro-resistance test.
nullGeneral adapting fixture provided by the utility model，Be slidably connected in the first via by described first dials described first probe，In the switching via of described switching dials, described conductive resilient element is set，Described conductive resilient element provides elastic acting force for described first probe，And the elastic force scalable of described elastic component，Described general adapting fixture is that circuit board is when testing，Described first probe contacts on circuit board，Elastic acting force is acted on circuit board by described first probe，The active force that i.e. circuit board is born is identical with the elastic acting force of described conductive resilient element，The conductive resilient element utilizing described general adapting fixture is convertible，So that described general adapting fixture can the circuit board of adaptive Multiple Type，Thus realize the testing electrical property of circuit board，Thus realize the coupling of multiple circuit board，Improve the testing electrical property efficiency of circuit board，Improve the production efficiency of circuit board.
The above is preferred implementation of the present utility model; it should be pointed out that, for those skilled in the art, on the premise of without departing from this utility model principle; can also make some improvements and modifications, these improvements and modifications are also considered as protection domain of the present utility model.
Claims (10)
1. a general adapting fixture, it is characterized in that, described general adapting fixture includes the first test suite, adapter assembly and the second test suite, described first test suite includes the first dials and the first probe, described first probe passes described first dials, and it is slidably connected to described first dials, described second test suite includes the second dials and the second probe, described second dials is fixed on described first dials side, described second probe one end is fixed between described first dials and described second dials, the other end includes conductive resilient element through adapter assembly described in described second dials, described conductive resilient element is connected between described first probe and described second probe, in order to provide described first probe away from the restoring force of described second probe.
General adapting fixture the most according to claim 1, it is characterized in that, described adapter assembly also includes dials of transferring, described switching dials includes the first fixed plate, the second fixed plate and fixed support, described first fixed plate is fixing connects described first dials, described second fixed plate is fixed on described first fixed plate and deviates from described first dials side, described fixed support is fixed between described first fixed plate and described second fixed plate, so that described first fixed plate is mutually isolated with described second fixed plate, described elastic component passes described switching dials.
General adapting fixture the most according to claim 2, it is characterised in that described adapter assembly also includes that described conductive resilient element is fixed in described sleeve through described first fixed plate and the sleeve of described second fixed plate.
General adapting fixture the most according to claim 1, it is characterised in that the normal direction of the most described first dials of length direction of described first probe tilts.
General adapting fixture the most according to claim 4, it is characterised in that the normal direction of the most described second dials of length direction of described second probe tilts.
General adapting fixture the most according to claim 5, it is characterised in that described first dials is provided with the first via of multiple array, the number of described first probe is multiple, and multiple described first probes are slidably connected in described first via respectively.
General adapting fixture the most according to claim 6, it is characterized in that, described second multiple second via of dials array, the number of described second probe is multiple, multiple described second probes are each passed through multiple described second via, the number of described conductive resilient element is multiple, and each described conductive resilient element is correspondingly connected between each described first probe and each described second probe.
General adapting fixture the most according to claim 1, it is characterised in that described conductive resilient element is metal rectangular spring.
General adapting fixture the most according to claim 1, it is characterised in that described first dials includes that the first stacking plate of multiple stacking, multiple described first stacking plates mutually completely cut off, and multiple described first stacking plates are jointly interspersed with first and fix post.
General adapting fixture the most according to claim 1, it is characterised in that described second dials includes that the second stacking plate of multiple stacking, multiple described second stacking plates mutually completely cut off, and multiple described second stacking plates are jointly interspersed with second and fix post.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620066606.XU CN205594131U (en) | 2016-01-23 | 2016-01-23 | General switching tool |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620066606.XU CN205594131U (en) | 2016-01-23 | 2016-01-23 | General switching tool |
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| CN205594131U true CN205594131U (en) | 2016-09-21 |
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| CN201620066606.XU Active CN205594131U (en) | 2016-01-23 | 2016-01-23 | General switching tool |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109471014A (en) * | 2018-10-30 | 2019-03-15 | 江苏赛诺格兰医疗科技有限公司 | A kind of detectable signal simulation forming circuit and detector board test platform |
| CN109470896A (en) * | 2018-10-30 | 2019-03-15 | 江苏赛诺格兰医疗科技有限公司 | Detector board test platform |
| CN111684289A (en) * | 2018-02-09 | 2020-09-18 | 周星工程股份有限公司 | Power interface |
| CN112034327A (en) * | 2020-08-29 | 2020-12-04 | 捷映凯电子（昆山）有限公司 | Flexible circuit board test switching device for electric connector |
-
2016
- 2016-01-23 CN CN201620066606.XU patent/CN205594131U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111684289A (en) * | 2018-02-09 | 2020-09-18 | 周星工程股份有限公司 | Power interface |
| CN111684289B (en) * | 2018-02-09 | 2023-03-31 | 周星工程股份有限公司 | Power interface |
| CN109471014A (en) * | 2018-10-30 | 2019-03-15 | 江苏赛诺格兰医疗科技有限公司 | A kind of detectable signal simulation forming circuit and detector board test platform |
| CN109470896A (en) * | 2018-10-30 | 2019-03-15 | 江苏赛诺格兰医疗科技有限公司 | Detector board test platform |
| CN109471014B (en) * | 2018-10-30 | 2021-01-19 | 江苏赛诺格兰医疗科技有限公司 | Detection signal simulation forming circuit and detector board card test platform |
| CN112034327A (en) * | 2020-08-29 | 2020-12-04 | 捷映凯电子（昆山）有限公司 | Flexible circuit board test switching device for electric connector |
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