CN205484607U - Electron product aging automatic testing platform - Google Patents
Electron product aging automatic testing platform Download PDFInfo
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- CN205484607U CN205484607U CN201620211064.0U CN201620211064U CN205484607U CN 205484607 U CN205484607 U CN 205484607U CN 201620211064 U CN201620211064 U CN 201620211064U CN 205484607 U CN205484607 U CN 205484607U
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Abstract
The utility model provides an electron product aging automatic testing platform which includes: the host computer, the main control unit is connected with this host communication, relay channel selection unit is controlled by this main control unit for establish this host computer and awaiting measuring being connected between the electronic product of choosing, electrical unit able to programme is controlled by this main control unit for provide the required voltage of electronic product that awaits measuring via this relay channel selection unit, electronic noise disturbs and keeps apart the unit, and it sets up between this host computer and this relay channel selection unit for realize the isolation between inside ground and the outside ground, and test jig unit for load a plurality of electronic products that await measuring. The utility model discloses can compromise the ageing of electronic product and functional test well.
Description
Technical field
This utility model relates to the test device of electronic product, particularly relates to the test device of a kind of PCBA.
Background technology
At present, the PCBA(Printed Circuit Board Assembly used on production line, be mounted with the circuit board of electronic devices and components) weatherometer mainly have two ways, a kind of is that aging product is in the case of not charged work, put into and in ageing oven, carry out high/low-temperature impact or constant temperature and humidity reliability testing, the most only do burn-in test, do not do concrete functional test analysis, function singleness.Another is to do concrete various functional tests, does not do burn-in test, it is impossible to meet the aging needs adding functional test of actual product.
Utility model content
Technical problem to be solved in the utility model is to overcome the deficiency existing for above-mentioned prior art, and proposes a kind of aging automatically testing platform of electronic product, it is possible to take into account the aging of electronic product and functional test well.
This utility model proposes a kind of aging automatically testing platform of electronic product for above-mentioned technical problem, comprising: main frame；Main control unit, is connected with this host communication；Relay channel selection unit, is controlled by this main control unit, for setting up the connection between this main frame and the electronic product to be measured chosen；Programmable power supply unit, is controlled by this main control unit, for providing the voltage of required by electronic product to be measured via this relay channel selection unit；Electronic noise interference and insulation unit, it is arranged between this main frame and this relay channel selection unit, for realize internally and externally between isolation；And testing jig unit, it is used for loading multiple electronic product to be measured.
In certain embodiments, this programmable power supply unit is controlled can to export at least two voltage.
In certain embodiments, this electronic noise interference and insulation unit uses optocoupler to realize.
In certain embodiments, this relay channel selection unit uses the cooperation of latch and shift register to control the break-make of relay.
In certain embodiments, this main control unit includes: microprocessor module；Current sample module, coordinates with this microprocessor module, for detecting the consumption electric current of electronic product to be measured；Voltage monitoring module, coordinates with this microprocessor module, for detecting the service voltage of this programmable power supply unit；Temperature test module, coordinates with this microprocessor module, for detecting the temperature of electronic product to be measured；And output voltage arranges module, coordinate with this microprocessor module, for controlling the service voltage of this programmable power supply unit.
In certain embodiments, this current sample module uses current sense amplifier part and differential amplifier part to realize.
In certain embodiments, this voltage monitoring module uses operational amplifier to realize.
In certain embodiments, this temperature test module uses analog switch and temperature sensor to realize.
In certain embodiments, this output voltage arranges module and uses digital to analog converter and operational amplifier realization.
In this utility model, described electronic product to be measured is PCBA.
Compared with prior art, the aging automatically testing platform of electronic product of the present utility model, by arranging main frame, main control unit, relay channel selection unit, programmable power supply unit, electronic noise interference and insulation unit and the testing jig unit cooperated dexterously, it is possible to take into account the aging of electronic product and functional test well.
Accompanying drawing explanation
Fig. 1 is the block diagram of the aging automatically testing platform of electronic product of the present utility model.
Fig. 2 is the block diagram of main control unit in the aging automatically testing platform of electronic product of the present utility model.
Wherein, description of reference numerals is as follows: 10 test platform 1 main frame 2 main control unit 3 relay channel selection unit 4 programmable power supply unit 5 electronic noise interference and insulation unit 6 testing jig unit 21 microprocessor module 22 current sample module 23 voltage monitoring module 24 temperature test module 25 output voltages arrange module 26 power module.
Detailed description of the invention
Below in conjunction with the accompanying drawing of this specification, preferred embodiment of the present utility model is given elaboration further.
See the block diagram that Fig. 1 and Fig. 2, Fig. 1 are the aging automatically testing platforms of electronic product of the present utility model.Fig. 2 is the block diagram of main control unit in the aging automatically testing platform of electronic product of the present utility model.The utility model proposes a kind of aging automatically testing platform of electronic product 10, comprising: main frame 1；Main control unit 2, is connected with this main frame 1 communication；Relay channel selection unit 3, is controlled by this main control unit 2, for setting up the connection between this main frame 1 and the electronic product to be measured chosen；Programmable power supply unit 4, is controlled by this main control unit 2, for providing the voltage of required by electronic product to be measured via this relay channel selection unit 3；Electronic noise interference and insulation unit 5, it is arranged between this main frame 1 and this relay channel selection unit 3, for realize internally and externally between isolation；And testing jig unit 6, it is used for loading multiple electronic product to be measured.In the present embodiment, described electronic product to be measured is PCBA.
This main frame 1 uses computer to realize.This computer is provided with serial port expanding module, is connected for carrying out communication with this main control unit 2 via serial ports.This computer is provided with input-output card, for being connected with electronic product to be measured with this relay channel selection unit 3 via this electronic noise interference and insulation unit 5.This computer runs to have tests software accordingly, it is provided that cross stream, overvoltage and overtemperature alarm and protection, can be according to the real-time statistical report of the requirement output different-format of reality application.
This main control unit 2 includes: microprocessor module 21；Current sample module 22, coordinates with this microprocessor module 21, for detecting the consumption electric current of electronic product to be measured；Voltage monitoring module 23, coordinates with this microprocessor module 21, for detecting the service voltage of this programmable power supply unit 4；Temperature test module 24, coordinates with this microprocessor module 21, for detecting the temperature of electronic product to be measured；Output voltage arranges module 25, coordinates with this microprocessor module 21, for controlling the service voltage of this programmable power supply unit 4；And power module 26, for providing working power for other module.In the present embodiment, the microprocessor that this microprocessor module 21 uses model to be STC12C5412 realizes.This current sample module 22 uses current sense amplifier part and differential amplifier part to realize, and wherein, current sense amplifier part selects MAX9920, and differential amplifier part selects AD629.This voltage monitoring module 23 uses operational amplifier to realize, and wherein, operational amplifier selects LM324.This temperature test module 24 uses analog switch and temperature sensor to realize, and wherein, CD4067 selected by analog switch, and LM75 is selected in temperature sensor.This output voltage arranges module 25 and uses digital to analog converter and operational amplifier to realize, and wherein, DAC0832 selected by digital to analog converter, and operational amplifier selects LM324.
This relay channel selection unit 3 uses the cooperation of latch and shift register to control the break-make of relay, selects to test which electronic product.Wherein, SN74HC373DW selected by latch, and STPIC6D595 selected by shift register.
This programmable power supply unit 4 is controlled can to export at least two voltage.For example, this programmable power supply unit 4 can provide+24V output and+14.4V to export to electronic product to be measured.
This electronic noise interference and insulation unit 5 uses optocoupler to realize.Wherein, optocoupler selects TPL521-4.
This testing jig unit 6 includes multiple support plate, is used for carrying electronic product to be measured.This testing jig unit 6 can design different support plate circuits and machinery according to the requirement of different electronic products.
Compared with prior art, the aging automatically testing platform of electronic product of the present utility model 10, by arranging main frame 1, main control unit 2, relay channel selection unit 3, programmable power supply unit 4, electronic noise interference and insulation unit 5 and the testing jig unit 6 cooperated dexterously, the aging of electronic product and functional test can be taken into account well, and can bring following beneficial effect: expansible configuration, increase power supply and master control borad and relay board and load board；Load output voltage is adjustable, can require to be configured according to the supply voltage of actual electronic product；Different support plates can be used according to different electronic products, place different product types；Whole-process automatic control, intelligence over-voltage and over-current overtemperature alarm and protection, test function can be freely set, precision is high, adapt to the electronic product of variety classes and power, and it also has measurement data real-time storage function.
Foregoing is only preferred embodiment of the present utility model; it is not intended to limit embodiment of the present utility model; those of ordinary skill in the art are according to central scope of the present utility model and spirit; corresponding flexible or amendment can be carried out very easily, therefore protection domain of the present utility model should be as the criterion with the protection domain required by claims.
Claims (10)
1. the aging automatically testing platform of electronic product, it is characterised in that including: main frame；Main control unit, is connected with this host communication；Relay channel selection unit, is controlled by this main control unit, for setting up the connection between this main frame and the electronic product to be measured chosen；Programmable power supply unit, is controlled by this main control unit, for providing the voltage of required by electronic product to be measured via this relay channel selection unit；Electronic noise interference and insulation unit, it is arranged between this main frame and this relay channel selection unit, for realize internally and externally between isolation；And testing jig unit, it is used for loading multiple electronic product to be measured.
2. according to the aging automatically testing platform of electronic product described in claim 1, it is characterised in that this programmable power supply unit is controlled can to export at least two voltage.
3. according to the aging automatically testing platform of electronic product described in claim 1, it is characterised in that this electronic noise interference and insulation unit uses optocoupler to realize.
4. according to the aging automatically testing platform of electronic product described in claim 1, it is characterised in that this relay channel selection unit uses the cooperation of latch and shift register to control the break-make of relay.
5. according to the aging automatically testing platform of electronic product described in claim 1, it is characterised in that this main control unit includes: microprocessor module；Current sample module, coordinates with this microprocessor module, for detecting the consumption electric current of electronic product to be measured；Voltage monitoring module, coordinates with this microprocessor module, for detecting the service voltage of this programmable power supply unit；Temperature test module, coordinates with this microprocessor module, for detecting the temperature of electronic product to be measured；And output voltage arranges module, coordinate with this microprocessor module, for controlling the service voltage of this programmable power supply unit.
6. according to the aging automatically testing platform of electronic product described in claim 5, it is characterised in that this current sample module uses current sense amplifier part and differential amplifier part to realize.
7. according to the aging automatically testing platform of electronic product described in claim 5, it is characterised in that this voltage monitoring module uses operational amplifier to realize.
8. according to the aging automatically testing platform of electronic product described in claim 5, it is characterised in that this temperature test module uses analog switch and temperature sensor to realize.
9. according to the aging automatically testing platform of electronic product described in claim 5, it is characterised in that this output voltage arranges module and uses digital to analog converter and operational amplifier to realize.
10. according to the aging automatically testing platform of electronic product described in any one of claim 1 to 9, it is characterised in that described electronic product to be measured is PCBA.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620211064.0U CN205484607U (en) | 2016-03-18 | 2016-03-18 | Electron product aging automatic testing platform |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201620211064.0U CN205484607U (en) | 2016-03-18 | 2016-03-18 | Electron product aging automatic testing platform |
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| CN205484607U true CN205484607U (en) | 2016-08-17 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107884705A (en) * | 2017-12-13 | 2018-04-06 | 镭神技术（深圳）有限公司 | A kind of high-power chip ageing machine |
| CN109765452A (en) * | 2018-12-29 | 2019-05-17 | 兰溪铂蓝智能科技有限公司 | Single line communication automatic aging tester |
| WO2021082114A1 (en) * | 2019-10-31 | 2021-05-06 | 江苏华存电子科技有限公司 | Microprocessor platform-oriented memory verification system |
| CN113030697A (en) * | 2021-02-25 | 2021-06-25 | 长鑫存储技术有限公司 | Composite testing machine and using method thereof |
-
2016
- 2016-03-18 CN CN201620211064.0U patent/CN205484607U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107884705A (en) * | 2017-12-13 | 2018-04-06 | 镭神技术（深圳）有限公司 | A kind of high-power chip ageing machine |
| CN109765452A (en) * | 2018-12-29 | 2019-05-17 | 兰溪铂蓝智能科技有限公司 | Single line communication automatic aging tester |
| CN109765452B (en) * | 2018-12-29 | 2022-05-24 | 兰溪铂蓝智能科技有限公司 | Single-wire communication automatic aging tester |
| WO2021082114A1 (en) * | 2019-10-31 | 2021-05-06 | 江苏华存电子科技有限公司 | Microprocessor platform-oriented memory verification system |
| CN113030697A (en) * | 2021-02-25 | 2021-06-25 | 长鑫存储技术有限公司 | Composite testing machine and using method thereof |
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