CN203942514U - Synthetic local oscillation device in TD-LTE-Advanced comprehensive test instrument - Google Patents

Synthetic local oscillation device in TD-LTE-Advanced comprehensive test instrument Download PDF

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CN203942514U
CN203942514U CN201320733279.5U CN201320733279U CN203942514U CN 203942514 U CN203942514 U CN 203942514U CN 201320733279 U CN201320733279 U CN 201320733279U CN 203942514 U CN203942514 U CN 203942514U
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frequency
module
local oscillator
sampler
sampling
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黄武
陶长亚
周建烨
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CETC 41 Institute
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CETC 41 Institute
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Abstract

The utility model discloses synthetic local oscillation device in a kind of TD-LTE-Advanced comprehensive test instrument.Comprising: sampling ring, sampler module, Direct Digital synthesis module, local oscillator generation module, with reference to distributor circuit; Wherein, sampling ring, is used to sampler that the sampling local oscillation signal of 207MHz~236MHz is provided, and input radio frequency frequency is sampled; Sampler module, for the middle junction compound module of sampling ring and local oscillator generation module, for carrying out frequency sample, frequency spectrum shift; Direct Digital synthesis module, for realizing the frequency resolution of whole local oscillator, carries out fractional frequency division; Local oscillator generation module, selects economical broadband VCO, covers 5.0GHz~10.0GHz frequency range; With reference to distributor circuit, for by various frequency divisions and frequency multiplier circuit, frequency reference is provided to the modules of frequency synthesis.Solve frequency range, resolution and the lower problem of frequency synthesis output frequency of comprehensive test instrument in correlation technique.

Description

Synthetic local oscillation device in TD-LTE-Advanced comprehensive test instrument
Technical field
The utility model relates to TD-LTE-Advanced terminal radio frequency consistency Test Application field, particularly relates to synthetic local oscillation device in a kind of TD-LTE-Advanced comprehensive test instrument.
Background technology
The TD-LTE-A (Time Division-Long Term Evolution Advanced) with independent intellectual property right, become one of IMT-A (International Mobile Telecommunications) international standard, compare with TD-LTE, it has more technical advantage.In to the various detections of mobile communication terminal product and checking, to the radio frequency of terminal and RF consistency test, be the key link, to check end product whether to meet the requirement of radio frequency testing standard.
3GPP TS36.521 has defined the whole test cases of terminal of TD-LTE-A, with TD-LTE, compare, TD-LTE-A is except requiring terminal radio frequency consistency testing equipment output frequency resolution rate 1Hz, and output EVM is less than outside 3%, frequency range expands to 4GHz, and radio frequency is until intermediate-frequency bandwidth is extended to 100MHz.From superhet theory, high intermediate frequency scheme is taked in the large bandwidth requirement mixing of intermediate frequency, be the highest frequency of local oscillator output after deducting rf frequency still higher than radio frequency, this just requires synthetic local oscillation device guaranteeing the high-resolution while of 1Hz, also will carry out the expansion of upper limiting frequency.
The phase noise of local oscillator is the critical index of restriction TD-LTE-A transmitter and receiver, and in TD-LTE-A comprehensive test instrument, the phase noise index of local oscillator directly affects the test results such as EVM, the error rate.The resolution of local oscillator has determined that signal receives and the frequency resolution of transmitting.
Frequency range, resolution and the lower problem of frequency synthesis output frequency for comprehensive test instrument in correlation technique, not yet propose effective solution at present.
Utility model content
For frequency range, resolution and the lower problem of frequency synthesis output frequency of comprehensive test instrument in correlation technique, the utility model provides synthetic local oscillation device in a kind of TD-LTE-Advanced comprehensive test instrument, in order to solve the problems of the technologies described above.
According to an aspect of the present utility model, the utility model provides in a kind of TD-LTE-Advanced comprehensive test instrument synthetic local oscillation device, and this device comprises: sampling ring, sampler module, Direct Digital synthesis module, local oscillator generation module, with reference to distributor circuit; Wherein, described sampling ring, its signal input part is connected with reference to distributor circuit with described, and its signal output part is connected with described sampler module, be used to sampler in described sampler module that the sampling local oscillation signal of 207MHz~236MHz is provided, input radio frequency frequency is sampled; Described sampler module, the middle junction compound module for described sampling ring and described local oscillator generation module, comprises sampler, amplifier, radio-frequency (RF) switch, frequency divider, filter, radio-frequency (RF) switch, for carrying out frequency sample, frequency spectrum shift; Wherein, the signal of described local oscillator generation module inputs to described amplifier, after described radio-frequency (RF) switch, signal is divided into two-way, one tunnel is sent to another radio-frequency (RF) switch via described frequency divider, and the signal of another road and the output of described sampling ring merges at sampler place, exports another amplifier to, via filter, transfer to described another radio-frequency (RF) switch; Described Direct Digital synthesis module, its signal input part is connected with reference to distributor circuit with described, and its signal output part is connected with described local oscillator generation module, for realizing the frequency resolution of whole local oscillator, carries out fractional frequency division; Described local oscillator generation module, its signal input part is connected with described sampler module, described Direct Digital synthesis module respectively, and its signal output part is connected with described sampler module, selects broadband VCO, covers 5.0GHz~10.0GHz frequency range; Described with reference to distributor circuit, be connected with described sampling ring, described Direct Digital synthesis module, for by various frequency divisions and frequency multiplier circuit, frequency reference is provided to the modules of frequency synthesis.
Preferably, above-mentioned local oscillator generation module comprises: phase discriminator, for receiving the two paths of signals of synthetic (DDS) circuit of sampling intermediate frequency and Direct Digital, carry out than phase, and utilize Optimal Fitting and the bandwidth selection of multistage loop parameter, control broadband VCO, debugging output spuious with the index performance of making an uproar mutually.
Preferably, said apparatus also comprises: FPGA control circuit, and for carrying out the logic control of said apparatus modules.
Preferably, the bandwidth of above-mentioned sampling ring is 100~300Hz.
Preferably, above-mentioned local oscillator generation module is carried out main phase-locked loop debugging operations, and the output of main phase-locked loop is the output frequency of said apparatus, scope 5.0GHz~10.5GHz, VCO output amplitude-6dBm, output amplitude-12dBm after coupler, after amplifier, output amplitude is 5dBm.
Preferably, above-mentionedly with reference to distributor circuit, by different frequency dividers and frequency multiplier, combined, for each frequency synthesis unit of said apparatus provides required reference signal.
Preferably, in scanning process, do not change the frequency of sampling oscillator, frequency scanning operation is completed by above-mentioned Direct Digital synthesis module; On all frequencies, the consistent direction of integration maintenance of main VCO ring.
Pass through the utility model, synthetic local oscillation device in a kind of TD-LTE-Advanced comprehensive test instrument is provided, this device comprises: sampling ring, sampler module, Direct Digital synthesis module, local oscillator generation module, with reference to distributor circuit, by the co-operation of above modules, solved the frequency range of comprehensive test instrument in correlation technique, resolution and the lower problem of frequency synthesis output frequency, the technical solution of the utility model adopts Eco-power VCO to replace expensive YTO, with Eco-power paster sampler, replace valuable microwave sampler, design economic and practical and there is high band, highly purified many ring local oscillation devices, frequency range reaches 5~10GHz, frequency resolution reaches 1Hz, for TD-LTE-A comprehensive test instrument, make the frequency range of reception and transmitter itself, EVM and the error rate are far above 3GPP requirement.
Above-mentioned explanation is only the general introduction of technical solutions of the utility model, in order to better understand technological means of the present utility model, and can be implemented according to the content of specification, and for above-mentioned and other objects, features and advantages of the present utility model can be become apparent, below especially exemplified by embodiment of the present utility model.
Accompanying drawing explanation
Fig. 1 is according to the structured flowchart of synthetic local oscillation device in the TD-LTE-Advanced comprehensive test instrument of the utility model embodiment;
Fig. 2 is according to the operating principle schematic diagram of synthetic local oscillation device in the TD-LTE-Advanced comprehensive test instrument of the utility model embodiment;
Fig. 3 is according to synthesizing local oscillation device in the TD-LTE-Advanced comprehensive test instrument of the utility model embodiment at carrier wave 10GHz, the schematic diagram of phase noise measurement result during offset carrier 1kHz;
Fig. 4 is according to synthesizing local oscillation device in the TD-LTE-Advanced comprehensive test instrument of the utility model embodiment at carrier wave 10GHz, the schematic diagram of phase noise measurement result during offset carrier 10kHz;
Fig. 5 is according to synthesizing local oscillation device in the TD-LTE-Advanced comprehensive test instrument of the utility model embodiment at carrier wave 10GHz, the schematic diagram of phase noise measurement result during offset carrier 100kHz.
Embodiment
In order to solve frequency range, resolution and the lower problem of frequency synthesis output frequency of comprehensive test instrument in correlation technique, the utility model provides synthetic local oscillation device in a kind of TD-LTE-Advanced comprehensive test instrument, below in conjunction with accompanying drawing and embodiment, the utility model is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the utility model, does not limit the utility model.
The present embodiment provides synthetic local oscillation device in a kind of TD-LTE-Advanced comprehensive test instrument, Fig. 1 is according to the structured flowchart of synthetic local oscillation device in the TD-LTE-Advanced comprehensive test instrument of the utility model embodiment, as shown in Figure 1, this device comprises: sampling ring 10, sampler module 20, Direct Digital synthesis module 30, local oscillator generation module 40 and with reference to distributor circuit 50.Below this structure is described in detail.
Sampling ring 10, is used to sampler that the sampling local oscillation signal of 207MHz~236MHz is provided, and input radio frequency frequency is sampled;
Sampler module 20, for the middle junction compound module of sampling ring and local oscillator generation module, for carrying out frequency sample, frequency spectrum shift;
Direct Digital synthesis module 30, for realizing the frequency resolution of whole local oscillator, carries out fractional frequency division;
Local oscillator generation module 40, selects economical broadband VCO, covers 5.0GHz~10.0GHz frequency range; Wherein, the Index Establishment of local oscillator generation module output frequency is on the basis of many rings matching, the index of making an uproar mutually between its 100Hz~1kHz is guaranteed by reference crystal, the index of making an uproar mutually between 1kHz~3kHz is guaranteed by Direct Digital synthesis module, the index of making an uproar mutually between 3kHz~10kHz is demonstrate,proved by sampling environmental protection, and 100kHz is guaranteed by VCO far-end with the far away index of making an uproar mutually;
With reference to distributor circuit 50, for by various frequency divisions and frequency multiplier circuit, frequency reference is provided to the modules of frequency synthesis.
Pass through said apparatus, synthetic local oscillation device in a kind of TD-LTE-Advanced comprehensive test instrument is provided, this device comprises: sampling ring, sampler module, Direct Digital synthesis module, local oscillator generation module, with reference to distributor circuit, by the co-operation of above modules, solved the frequency range of comprehensive test instrument in correlation technique, resolution and the lower problem of frequency synthesis output frequency, the technical solution of the utility model is designed economic and practical and is had a high band, highly purified many ring local oscillation devices, produced high band, high-resolution, highly purified local oscillator composite signal, frequency range reaches 5~10GHz, frequency resolution reaches 1Hz, for TD-LTE-A comprehensive test instrument, make the frequency range of reception and transmitter itself, EVM and the error rate are far above 3GPP requirement.
Below synthetic local oscillation device in TD-LTE-Advanced comprehensive test instrument is described in detail.
In TD-LTE-Advanced comprehensive test instrument, the local oscillator module of synthetic local oscillation device design produces 5.0GHz~10.0GHz, the local oscillation signal output of 0dBm, be the nucleus module in TD-LTE-A comprehensive test instrument, its functional block comprises: sampling ring, sampler module, Direct Digital synthesize (DDS) module, local oscillator generation module, with reference to distributor circuit etc.Concrete function is described below:
(1) sampling encircles the sampling local oscillation signal that 207MHz~236MHz is provided for sampler, and input radio frequency frequency is sampled, and sampling ring plays vital effect to improving making an uproar mutually of whole local oscillator.The index of sampling ring depends on the three aspect factors such as high reference, integral frequency divisioil, high-performance arrowband VCO and guarantees.
(2) sampler module is the binding site of local oscillator generation module and sampling ring, realizes frequency sample, completes frequency spectrum shift, and because the sampling ring index of making an uproar is mutually high, thereby making an uproar mutually of having avoided that general frequency multiplication brings significantly worsens.Intermediate frequency amplifies and filter circuit amplifies intermediate-freuqncy signal, radio frequency and local frequency that filtering front end is revealed.
(3) synthetic (DDS) circuit of Direct Digital is realized the meticulous frequency resolution of whole local oscillator, plays the effect of fractional frequency division, guarantees to realize higher frequency resolution (1Hz).FPGA control circuit completes the logic control of whole module.
(4) local oscillator generation module is selected economical broadband VCO, cover 5.0GHz~10.0GHz frequency range, the index of local oscillator generation module output frequency is to be based upon on the basis of many rings matching, the index of making an uproar mutually between its 100Hz~1kHz is guaranteed by reference crystal, the index of making an uproar mutually between 1kHz~3kHz is guaranteed by synthetic (DDS) circuit of Direct Digital, the index sampling environmental protection card of making an uproar mutually between 3kHz~10kHz, 100kHz is guaranteed by VCO far-end with the far away index of making an uproar mutually.
The two paths of signals that phase discriminator in local oscillator generation module receives sampling intermediate frequency and synthetic (DDS) circuit of Direct Digital carries out than phase, utilize Optimal Fitting and the bandwidth selection of multistage loop parameter, control broadband VCO, debug out desirable output spuious with the index performance of making an uproar mutually.
(5) with reference to distributor circuit, pass through various frequency divisions and frequency multiplier circuit, the frequency reference of high stable is provided to the modules of frequency synthesis.
Frequency synthesis technique is one of key technology of radio frequency design aspect all the time, and high band, high-resolution, highly purified frequency synthesis are to realize TD-LTE-A terminal comprehensive test instrument to high band more, the key of high bandwidth development more.The utility model embodiment is according to the requirement of TD-LTE-A terminal radio frequency consistency testing equipment, utilize a kind of high band, high-resolution, the highly purified TD-LTE-A signal of multiring structure design to occur and receiver in local oscillation device.The input/output frequency scope and the radio frequency bandwidth index that have guaranteed TD-LTE-A comprehensive test instrument meet 3GPP requirement, and in like manner, this device also can be used for other frequency synthesis occasion, has stronger versatility.
Below in conjunction with drawings and Examples, the utility model is described in detail.Fig. 2 is according to the operating principle schematic diagram of synthetic local oscillation device in the TD-LTE-Advanced comprehensive test instrument of the utility model embodiment, as shown in Figure 2, specifically carries out as follows:
(1) sampling loop circuit unit: sampling encircles the sampling local oscillation signal that 207MHz~236MHz is provided for sampler, the frequency bolster structure that sampling ring is controlled for integrated phase discriminator, according to the adjustment method of phase-locked loop, under the prerequisite of existence of guaranteeing 200MHz, 400MHz reference, by debugging routine, with FPGA, integrated phase discriminator is carried out to numerical control system (sending the truth table of number referring to ADF4002), with radio frequency point, survey cable and measure the output of sampling ring in conjunction with frequency spectrograph, its frequency values should meet corresponding frequency dividing ratio: F vCO=200MHz+ (400MHz/N).Change frequency dividing ratio, within the scope of 207MHz~236MHz, checking sampling ring, can infer that the value of N is between 11~57 thus.Only in whole band limits, lock.Sampling ring has been debugged.Sample very narrow (100~300Hz) of the bandwidth Design of ring, guarantee the spuious and noise objective of loop.
Based on above-mentioned introduction, the present embodiment provides a kind of preferred implementation, sampling ring comprises: sampling loop circuit unit, be used for according to the adjustment method of phase-locked loop, guaranteeing under the prerequisite that 200MHz, 400MHz exist, by debugging routine, with FPGA, to integrated phase discriminator, send numerical control system, with radio frequency point, survey cable and measure the output of sampling ring in conjunction with frequency spectrograph; Wherein, frequency values should meet corresponding frequency dividing ratio: F vCO=200MHz+ (400MHz/N); Change frequency dividing ratio, within the scope of 207MHz~236MHz, checking sampling ring locks in whole band limits, carries out sampling ring debugging operations.The bandwidth of described sampling ring is 100~300Hz.
(2) sampler circuit unit: after sampling ring has been debugged, can coordinate external signal source debugging sampler circuit, radio frequency termination signal source input at sampler, signalization source amplitude is 0dBm, the amplitude of the sampling local oscillation signal encircling from sampling should, higher than 17dBm, be exported with the intermediate frequency that some survey cable is observed sampler in conjunction with frequency spectrograph.
Based on above-mentioned introduction, the present embodiment provides a kind of preferred implementation, be that sampler module comprises: sampler circuit unit, after complete for the debugging operations at described sampling ring, coordinate external signal source debugging sampler circuit, in the radio frequency termination signal source input of sampler, signalization source amplitude is 0dBm, the amplitude of the sampling local oscillation signal that setting encircles from sampling, higher than 17dBm, is exported with the intermediate frequency that some survey cable is observed sampler in conjunction with frequency spectrograph.
First the choosing method of relevant sampling frequency and sampling output intermediate frequency (being also the output of direct digital synthesis circuit DDS) frequency is discussed: below in the main VCO output frequency situation of agreement, need to carry out suitable choosing to sampling local oscillator and sampling intermediate frequency (being also DDS output frequency), to obtain best main VCO output performance.Different designs, has different selection standards and method.In this programme, have following principle to need to consider:
1) while having a plurality of sampling local oscillators available, choose low sampling frequency, can obtain good phase noise performance.(due to the frequency division effect in sampling ring, worsened the phase noise of sampling oscillator, reduced frequency dividing ratio M and can reduce phase noise).
2) while choosing sampling intermediate frequency, should avoid the spuious larger frequency of output of direct digital synthesis circuit DDS, more this need to do and test the output of direct digital synthesis circuit DDS.
3) because this programme is only applied in the situation of sweeping the wide 10MHz of being less than, therefore, in scanning process, should not change as far as possible the frequency of sampling oscillator, frequency scanning is completed by direct digital synthesis circuit.
4), on all frequencies, the integration of the main VCO ring consistent direction of should trying one's best, such as selecting F lO-N*F sAMP=F iF.Certainly, on some frequency, may not cover completely, at this moment need to choose N*F sAMP-F lO=F iF, but need to consider whether to exist wrong possibility of locking.
Under the step of concrete selection sampling local oscillator and sampling intermediate frequency is shown in:
1) first determine that VCO output frequency is F lO, according to following formula, determine all possible sampling multiple
N 1 = INT ( F LO - F HIF F HSAMP ) , For minimum value
N 2 = INT ( F LO + F HIF F LSAMP ) + 1 , For maximum
For example: 2500; 5250
N1=INT[(2500-50)]/236=10,N2=INT[(2500+50)]/207+1=13
N1=INT[(5250-50)]/236=22,N2=INT[(2500+50)]/207+1=26
2) between from N1 to N2, search for all possible sampling frequency, to each sampling multiple, sampling frequency press 5MHz stepping from 207~236, finds out and samples N and fs the list of IF-FRE in selected scope.From table, by principle recited above, select suitable sampling local frequency Fs, sampling multiple N and sampling intermediate frequency F iF, sampling intermediate frequency F iFalso be the frequency of synthetic (DDS) circuit (being equivalent to traditional little ring of numbers) needs output of Direct Digital.
Medium-frequency signal amplification circuit is amplified to sampling intermediate frequency the amplitude range that is suitable for phase demodulation, and its amplitude should reach 0dBm.
In sampler circuit, another path is integral frequency divisioil, do not need sampling, the situation (bandwidth > 10MHz) during for the scanning of the large bandwidth of local oscillator, is sweeping greatly when wide, do not need to sample ring work, by synthetic (DDS) circuit of Direct Digital, complete scanning.
(3) synthetic (DDS) unit of Direct Digital: export formula in conjunction with DDS: fout=(N/2 32) * f ref, by debugging software, to DDS, send several N, with radio frequency point, survey cable and in conjunction with frequency spectrograph, measure the output frequency of DDS.The scope that changes frequency control word N, makes the frequency coverage of DDS from 18MHz~50MHz, and power output should 0dBm even variation.
The quality of Direct Digital synthesized output signal index is directly connected to the quality of main signal, and their transitive relation of making an uproar is mutually a kind of translation relation.Note the reliable and good ground connection of centre-point earth point of DDS chip, and reasonable distribution digitally and in analog etc.
(4) local oscillator generation module: after above each modular unit has been debugged, enter the i.e. main phase-locked loop debugging of local oscillator generation module, the output of main phase-locked loop is the output frequency of this device, scope 5.0GHz~10.5GHz, VCO output amplitude-6dBm, output amplitude-12dBm after coupler, after amplifier, output amplitude is 5dBm.
With debugging routine, send number, control respectively the output frequency of sampling ring and synthetic (DDS) unit of Direct Digital, carry out like this to determine sampling times N, can determine main VCO ring frequency F vCO,
Be F vCO=N*F sAMP+ F iF
Every setting after a class frequency value, surveys cable with radio frequency point and in conjunction with frequency spectrograph, measures the output frequency of checking VCO.Available radio frequencies point is surveyed cable and in conjunction with frequency spectrograph, is measured the output frequency of checking sampling ring output frequency and synthetic (DDS) unit of Direct Digital simultaneously.Should meet the requirement of setting.
Within the scope of 5GHz~10.5GHz, verify main phase-locked loop, only in whole band limits, lock.Main phase-locked loop has been debugged.
Based on above-mentioned introduction, the present embodiment provides a kind of preferred implementation, be that local oscillator generation module is carried out main phase-locked loop debugging operations, the output of main phase-locked loop is the output frequency of described device, scope 5.0GHz~10.5GHz, VCO output amplitude-6dBm, output amplitude-12dBm after coupler, after amplifier, output amplitude is 5dBm.
(5) with reference to distributor circuit, by different frequency dividers and frequency multiplier, combined, for each frequency synthesis unit of this device provides required reference signal.
Based on above-mentioned introduction, the present embodiment provides a kind of preferred implementation, with reference to distributor circuit, by different frequency dividers and frequency multiplier, is combined, for each frequency synthesis unit of described device provides required reference signal.
In the scanning process of the present embodiment, do not change the frequency of sampling oscillator, frequency scanning operation is completed by described Direct Digital synthesis module; On all frequencies, the consistent direction of integration maintenance of main VCO ring.
Preferably, local oscillator generation module comprises: phase discriminator, for receiving the two paths of signals of synthetic (DDS) circuit of sampling intermediate frequency and Direct Digital, carry out than phase, and utilize Optimal Fitting and the bandwidth selection of multistage loop parameter, control broadband VCO, debugging output spuious with the index performance of making an uproar mutually.Device also comprises: FPGA control circuit, and for carrying out the logic control of described device modules.
Below by preferred embodiment, the technical solution of the utility model is described in detail.
The index that can weigh an apparatus for frequency synthesizing level is single-side belt phase noise.Utilize high performance spectrum analyzer to carry out the test of single-side belt phase noise to the output frequency of this device, the output frequency of selecting this device is 10GHz, because this point is the most significant end of this device, output-index is the poorest index of this device, represent the design level of this device, if select the output frequency point of low side, test index can be better.
Fig. 3 is the carrier wave 10GHz according to the utility model embodiment, the schematic diagram of phase noise measurement result during offset carrier 1kHz, as shown in Figure 3, making an uproar mutually when measurement departs from 10GHz carrier wave 1kHz, the scanning span SPAN of frequency spectrograph is set to 5kHz, value of making an uproar mutually while selecting frequency spectrograph directly to read offset carrier 1kHz, sees that the measured value that the frequency spectrograph upper right corner shows is offset carrier (X) 1kHz, and the measured value (Y) of making an uproar is mutually-107.34dBc/Hz.
Fig. 4 is the carrier wave 10GHz according to the utility model embodiment, the schematic diagram of phase noise measurement result during offset carrier 10kHz, as shown in Figure 4, making an uproar mutually when measurement departs from 10GHz carrier wave 10kHz, the scanning span SPAN of frequency spectrograph is set to 50kHz, value of making an uproar mutually while selecting frequency spectrograph directly to read offset carrier 10kHz, sees that the measured value that the frequency spectrograph upper right corner shows is offset carrier (X) 10kHz, and the measured value (Y) of making an uproar is mutually-104.53dBc/Hz.
Fig. 5 is the carrier wave 10GHz according to the utility model embodiment, the schematic diagram of phase noise measurement result during offset carrier 100kHz, as shown in Figure 5, making an uproar mutually when measurement departs from 10GHz carrier wave 100kHz, the scanning span SPAN of frequency spectrograph is set to 500kHz, value of making an uproar mutually while selecting frequency spectrograph directly to read offset carrier 100kHz, sees that the measured value that the frequency spectrograph upper right corner shows is offset carrier (X) 100kHz, and the measured value (Y) of making an uproar is mutually-110.57dBc/Hz.From test result shown in Fig. 3, Fig. 4, Fig. 5, this device meets the index request of TD-LTE-Advanced tester local oscillator.
As can be seen from the above description, a kind of TD-LTE-Advanced tester medium-high frequency section, high-resolution, highly purified radio-frequency (RF) local oscillator loop and device of being applied to of the utility model design.The technical solution of the utility model is designed economic and practical and is had high band, highly purified many ring local oscillation devices, high band, high-resolution, highly purified local oscillator composite signal have been produced, frequency range reaches 5~10GHz, frequency resolution reaches 1Hz, for TD-LTE-A comprehensive test instrument, make frequency range, EVM and the error rate of reception and transmitter itself far above 3GPP requirement.
Although be example object, preferred embodiment of the present utility model is disclosed, it is also possible those skilled in the art will recognize various improvement, increase and replacement, therefore, scope of the present utility model should be not limited to above-described embodiment.

Claims (6)

1. a synthetic local oscillation device in TD-LTE-Advanced comprehensive test instrument, is characterized in that, described device comprises: sampling ring, sampler module, Direct Digital synthesis module, local oscillator generation module, with reference to distributor circuit; Wherein,
Described sampling ring, its signal input part is connected with reference to distributor circuit with described, its signal output part is connected with described sampler module, is used to sampler in described sampler module that the sampling local oscillation signal of 207MHz~236MHz is provided, and input radio frequency frequency is sampled;
Described sampler module, the middle junction compound module for described sampling ring and described local oscillator generation module, comprises sampler, amplifier, radio-frequency (RF) switch, frequency divider, filter, radio-frequency (RF) switch, for carrying out frequency sample, frequency spectrum shift; Wherein, the signal of described local oscillator generation module inputs to described amplifier, after described radio-frequency (RF) switch, signal is divided into two-way, one tunnel is sent to another radio-frequency (RF) switch via described frequency divider, and the signal of another road and the output of described sampling ring merges at sampler place, exports another amplifier to, via filter, transfer to described another radio-frequency (RF) switch;
Described Direct Digital synthesis module, its signal input part is connected with reference to distributor circuit with described, and its signal output part is connected with described local oscillator generation module, for realizing the frequency resolution of whole local oscillator, carries out fractional frequency division;
Described local oscillator generation module, its signal input part is connected with described sampler module, described Direct Digital synthesis module respectively, and its signal output part is connected with described sampler module, selects broadband VCO, covers 5.0GHz~10.0GHz frequency range;
Described with reference to distributor circuit, be connected with described sampling ring, described Direct Digital synthesis module, for by various frequency divisions and frequency multiplier circuit, frequency reference is provided to the modules of frequency synthesis.
2. device as claimed in claim 1, is characterized in that, described local oscillator generation module comprises:
Phase discriminator, carries out than phase for receiving the two paths of signals of synthetic (DDS) circuit of sampling intermediate frequency and Direct Digital, utilizes Optimal Fitting and the bandwidth selection of multistage loop parameter, controls broadband VCO, debugging output spuious with the index performance of making an uproar mutually.
3. device as claimed in claim 1, is characterized in that, described device also comprises:
FPGA control circuit, for carrying out the logic control of described device modules.
4. the method for claim 1, is characterized in that, the bandwidth of described sampling ring is 100~300Hz.
5. device as claimed in claim 1, is characterized in that,
Described local oscillator generation module is carried out main phase-locked loop debugging operations, and the output of main phase-locked loop is the output frequency of described device, scope 5.0GHz~10.5GHz, and VCO output amplitude-6dBm, output amplitude-12dBm after coupler, after amplifier, output amplitude is 5dBm.
6. device as claimed in claim 1, is characterized in that, describedly with reference to distributor circuit, by different frequency dividers and frequency multiplier, is combined, for each frequency synthesis unit of described device provides required reference signal.
CN201320733279.5U 2013-11-18 2013-11-18 Synthetic local oscillation device in TD-LTE-Advanced comprehensive test instrument Expired - Fee Related CN203942514U (en)

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CN103633997A (en) * 2013-11-18 2014-03-12 中国电子科技集团公司第四十一研究所 Synchronizing and local oscillating device in TD-LTE-A (time-division long term evolution advanced) integrated tester
CN105577184A (en) * 2015-12-17 2016-05-11 中国电子科技集团公司第四十一研究所 Frequency synthesis device for LTE-Advanced signal analyzer
EP3206301A3 (en) * 2016-02-10 2017-10-18 Rohm Co., Ltd. Oscillation circuit
CN110537351A (en) * 2017-04-28 2019-12-03 松下电器(美国)知识产权公司 Measuring device and measurement method

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CN103633997B (en) * 2013-11-18 2016-08-17 中国电子科技集团公司第四十一研究所 TD-LTE-Advanced comprehensive test instrument synthesizes local oscillation device
CN105577184A (en) * 2015-12-17 2016-05-11 中国电子科技集团公司第四十一研究所 Frequency synthesis device for LTE-Advanced signal analyzer
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CN110537351A (en) * 2017-04-28 2019-12-03 松下电器(美国)知识产权公司 Measuring device and measurement method

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