CN203479770U - Digital and analogue dual-purpose ultrasonic fault detector - Google Patents
Digital and analogue dual-purpose ultrasonic fault detector Download PDFInfo
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- CN203479770U CN203479770U CN201320474251.4U CN201320474251U CN203479770U CN 203479770 U CN203479770 U CN 203479770U CN 201320474251 U CN201320474251 U CN 201320474251U CN 203479770 U CN203479770 U CN 203479770U
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Abstract
The utility model relates to a digital and analogue dual-purpose ultrasonic fault detector which comprises a signal detection unit and a digital processing unit, wherein the signal detection unit is in communication connection with the digital processing unit through a field-programmable gate array chip, and an analogue processing unit comprises an exciting and receiving circuit of an ultrasonic transducer, a multiplexing switch, a pre-gain amplifier, a variable gain amplifier, a detection filter circuit and a high speed AD (Analogue to Digital) chip. The exciting and receiving circuit of the ultrasonic transducer, the multiplexing switch, the pre-gain amplifier, the variable gain amplifier, the detection filter circuit and the high speed AD chip are in communication connection sequentially. The digital processing unit comprises a microprocessor, a display driving circuit, an SDRAM (Synchronous Dynamic random access memory) and a keyboard, wherein the display driving circuit, the SDRAM and the keyboard are respectively in communication connection with the microprocessor. The utility model has the beneficial effects that the digital and analogue dual-purpose ultrasonic fault detector has both a digital instrument operating mode and an analogue instrument operating mode, and has the characteristics of high detection speed, high detection precision and reliability and the like of a digital instrument.
Description
Technical field
The utility model relates to industrial Ultrasonic Nondestructive, relates in particular to a kind of digital-to-analogue dual-purpose ultrasonic wave inspection instrument.
Background technology
Current industrial reflectoscope can be divided into analog meter and digital implementation by signal processing mode.
First analog meter amplifies then decay by the ultrasound echo signal detecting, and modulates on the sweep circuit that is loaded into oscillatron and shows.Echo waveform, not through processing, has directly reflected the actual conditions that detect inside workpiece defect, and echo waveform is undistorted.The guidance panel of analog meter only has several mechanical knob to regulate the parameters such as gains, zero point, sound path and time delay, and flexible operation, is easy to learn and use, deeply detected a flaw personnel's the favor of the mode of operation of analog meter.
But what show due to analog meter is undressed echoed signal, and the interference of industry spot such as frequency converter etc. easily exerts an influence to the differentiation of result of detection.Analog meter cannot be preserved parameters, and the Premium Features such as multi-channel detection for a plurality of operating personnel can not be provided.Analog meter cannot generate the DAC curve that defect estimation is used, and can only use home built panel curve.In addition, the monochromatic fluorescence display of analog meter, dull coloring, instrument volume is larger, and execute-in-place carries inconvenience.
The later stage eighties starts to have digital implementation to occur, digital implementation is to develop on the basis of analog meter, and simulating signal is converted to digital signal by AD, by showing on digital display screen after digital processing.Can carry out to the echo data after digitizing the correlation analyses such as time domain, frequency domain or image, storage playback and generate report etc. simultaneously.Digital implementation can arrange a plurality of independent flaw detection passages, can Freely input and store the non-destructive testing standard of any industry, the convenient interpretation to defect.
Compare analog meter, digital implementation mainly has the following advantages:
1) detection speed is fast.Digital implementation generally all can detect automatically, calculating, record, and some can also carry out depth compensation and Lookup protocol sensitivity automatically, so detection speed is fast, efficiency is high.
2) accuracy of detection is high.Digital implementation carries out high-speed data acquisition, quantification, calculating and differentiation to simulating signal, and its accuracy of detection can be higher than analog meter testing result.
3) detecting reliability is high.Digital implementation can be processed or aftertreatment in real time to the echo data collecting, signal is carried out to the analysis of time domain and frequency domain, also can to workpiece quality, carry out classification by pattern-recognition, reduce the impact of human factor, improve the reliability and stability that detect.
Though digital implementation has lot of advantages, through the development of 20 years, digital implementation still failed to replace completely analog meter.Its reason is digital implementation complex operation, and the technical merit of having relatively high expectations is difficult for grasping, not as analog meter is easy to learn and use, and flexible adjustment.
Summary of the invention
The utility model object is to overcome the deficiency of above prior art, and a kind of digital-to-analogue dual-purpose ultrasonic wave inspection instrument is provided, and specifically has following technical scheme to realize:
Described digital-to-analogue dual-purpose ultrasonic wave inspection instrument, comprise detecting signal unit and digital processing element, described detecting signal unit communicates to connect by field programmable gate array chip and digital processing element, described analog processing unit comprises ultrasonic transducer excitation receiving circuit, multiplexer switch, preamplifier gain amplifier, variable gain amplifier, detection filter circuit and high-speed AD chip, described ultrasonic transducer excitation receiving circuit, multiplexer switch, preamplifier gain amplifier, variable gain amplifier, detection filter circuit and high-speed AD chip communicate to connect successively, described digital processing element comprises microprocessor, display driver circuit, SDRAM and keyboard, and described display driver circuit, SDRAM and keyboard are connected with microprocessor communication respectively.
The further design of described digital-to-analogue dual-purpose ultrasonic wave inspection instrument is, described microprocessor is provided with GPIO port, and described GPIO port is connected with keyboard scan coding chip, and described keyboard is connected with described extended keyboard scanning encoding chip.
The further design of described digital-to-analogue dual-purpose ultrasonic wave inspection instrument is, described keyboard is 4*4 matrix keyboard.
The further design of described digital-to-analogue dual-purpose ultrasonic wave inspection instrument is, described field programmable gate array chip is connected with multiplexer switch, preamplifier gain amplifier, variable gain amplifier, detection filter circuit, high-speed AD chip and microprocessor communication respectively.
The further design of described digital-to-analogue dual-purpose ultrasonic wave inspection instrument is, also comprise EPSON printer, described microprocessor is provided with EPP printing interface, and described EPSON printer is connected with microprocessor by described EPP printing interface.
The further design of described digital-to-analogue dual-purpose ultrasonic wave inspection instrument is, described microprocessor is AT91R40008 chip.
The further design of described digital-to-analogue dual-purpose ultrasonic wave inspection instrument is, described multi-way switch employing DG641 type switch.
The further design of described digital-to-analogue dual-purpose ultrasonic wave inspection instrument is, described variable gain amplifier employing AD600.
The further design of described digital-to-analogue dual-purpose ultrasonic wave inspection instrument is, described high-speed AD chip is AD9215.
Advantage of the present utility model is as follows:
1) Highgrade integration
Adopt current international advanced and ripe integrated circuit technique, as technology such as field programmable gate array chip and CPLD, not only the large technical feature that improves instrument, operating rate and reliability, also reduced power consumption, reduced volume and weight.
2) high-speed sampling
Application high-speed sampling device and interlock circuit, guarantee that integrality and the peak value of echo waveform do not lost.
3) Design and manufacture modularization
Adopt modular design, the upgrading of instrument and convenient for production, reliable.
Accompanying drawing explanation
Fig. 1 is the circuit diagram of described digital-to-analogue dual-purpose ultrasonic wave inspection instrument.
Fig. 2 is the connection diagram of described keyboard and extended keyboard scanning encoding chip.
Embodiment
Below in conjunction with accompanying drawing, the utility model scheme is elaborated.
As Fig. 1, the digital-to-analogue dual-purpose ultrasonic wave inspection instrument that the present embodiment provides, comprises detecting signal unit and digital processing element.Detecting signal unit communicates to connect by field programmable gate array chip and digital processing element, analog processing unit comprises ultrasonic transducer excitation receiving circuit, multiplexer switch, preamplifier gain amplifier, variable gain amplifier, detection filter circuit and high-speed AD chip, and ultrasonic transducer excitation receiving circuit, multiplexer switch, preamplifier gain amplifier, variable gain amplifier, detection filter circuit and high-speed AD chip communicate to connect successively; Digital processing element comprises microprocessor, display driver circuit, SDRAM and keyboard, and display driver circuit, SDRAM and keyboard are connected with microprocessor communication respectively.Field programmable gate array chip is connected with multiplexer switch, preamplifier gain amplifier, variable gain amplifier, detection filter circuit, high-speed AD chip and microprocessor communication respectively.The field programmable gate array chip that the present embodiment adopts is XC3S500E.Microprocessor is provided with GPIO port.
As Fig. 2, for supporting the switching of analog meter and digital implementation, on the GPIO of microprocessor port, be connected with keyboard scan coding chip MM74C922.Keyboard is connected with extended keyboard scanning encoding chip MM74C922.The action of MM74C922 scanning user key-press, the GPIO mouth of coding notice CPU, CPU interrupts by processing GPIO, reads GPIO and obtains current key value.Can reduce the expense of CPU timing scan button like this, improve cpu busy percentage.The keyboard that the present embodiment provides is 4*4 matrix keyboard.
The digital-to-analogue dual-purpose ultrasonic wave inspection instrument that the present embodiment provides also comprises EPSON printer.Microprocessor is provided with EPP printing interface, and EPSON printer is connected with microprocessor by EPP printing interface.EPSON printer is used for supporting user to print examining report or form.This EPP printing interface is obtained by the simulation of GPIO mouth.
The selection of the present embodiment element is specific as follows:
Microprocessor is AT91R40008 chip, and multi-way switch adopts DG641 type switch, and variable gain amplifier adopts AD600, and high-speed AD chip is AD9215.
The ultra-sonic defect detector that the present embodiment provides is under analog meter working method, and instrument is copied the working method of analog meter completely.Keyboard interface only has " zero point ", " sound path " and " gain " three parameters are adjustable, and other buttons are locked can not be used, and it is flexible, convenient to use, and makes custom use the user of traditional analog instrument to need hardly training, just left-hand seat use fast.By digital implementation method, provide the DAC panel curve that in analog meter, defect estimation is used simultaneously, facilitated the judgement of flaw detection personnel to workpiece, defect grade.
When selecting digital implementation working method, instrument, by adopting embedded microprocessor and ultra-large field programmable gate array, can regulate multinomial parameter by keyboard, possesses powerful digital signal processing capability and practical flaw detection measurement capability.Adopting multichannel technology, is the different running parameter of each channel setting, can allow a plurality of operating personnel work in separately different passages.Peak value that software provides keeps, waveform freezes, echo envelope, afferent echo door and lose the functions such as ripple door regulates, DAC curve generates, data storage, the demonstration in real time of flaw echo parameter and facilitated the judgement of operating personnel to defect.By various communication interfaces, can realize the real-time communication with computing machine, Large Volume Data library storage, the data that make to detect a flaw can be managed, and result of detection can be recalled.
Digital-to-analogue dual-purpose ultrasonic wave inspection instrument had both had that digital implementation detection speed is fast, accuracy of detection and reliability high, took into account analog meter operation push-button few, easy to operate feature simultaneously.Can dual-use, look after the needs of different defectoscope operating personnel levels, also contribute to defectoscope applying unit to save instrument purchase cost.
Claims (9)
1. a digital-to-analogue dual-purpose ultrasonic wave inspection instrument, it is characterized in that, comprise detecting signal unit and digital processing element, described detecting signal unit communicates to connect by field programmable gate array chip and digital processing element, described detecting signal unit comprises ultrasonic transducer excitation receiving circuit, multiplexer switch, preamplifier gain amplifier, variable gain amplifier, detection filter circuit and high-speed AD chip, described ultrasonic transducer excitation receiving circuit, multiplexer switch, preamplifier gain amplifier, variable gain amplifier, detection filter circuit and high-speed AD chip communicate to connect successively, described digital processing element comprises microprocessor, display driver circuit, SDRAM and keyboard, and described display driver circuit, SDRAM and keyboard are connected with microprocessor communication respectively.
2. digital-to-analogue dual-purpose ultrasonic wave inspection instrument according to claim 1, is characterized in that, described microprocessor is provided with GPIO port, and described GPIO port is connected with keyboard scan coding chip, and described keyboard is connected with described keyboard scan coding chip.
3. digital-to-analogue dual-purpose ultrasonic wave inspection instrument according to claim 2, is characterized in that, described keyboard is 4*4 matrix keyboard.
4. digital-to-analogue dual-purpose ultrasonic wave inspection instrument according to claim 1, it is characterized in that, described field programmable gate array chip is connected with multiplexer switch, preamplifier gain amplifier, variable gain amplifier, detection filter circuit, high-speed AD chip and microprocessor communication respectively.
5. digital-to-analogue dual-purpose ultrasonic wave inspection instrument according to claim 1, is characterized in that, also comprise EPSON printer, described microprocessor is provided with EPP printing interface, and described EPSON printer is connected with microprocessor by described EPP printing interface.
6. digital-to-analogue dual-purpose ultrasonic wave inspection instrument according to claim 2, is characterized in that, described microprocessor is AT91R40008 chip.
7. digital-to-analogue dual-purpose ultrasonic wave inspection instrument according to claim 5, is characterized in that, described multi-way switch adopts DG641 type switch.
8. digital-to-analogue dual-purpose ultrasonic wave inspection instrument according to claim 5, is characterized in that, described variable gain amplifier adopts AD600.
9. digital-to-analogue dual-purpose ultrasonic wave inspection instrument according to claim 5, is characterized in that, described high-speed AD chip is AD9215.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320474251.4U CN203479770U (en) | 2013-08-06 | 2013-08-06 | Digital and analogue dual-purpose ultrasonic fault detector |
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| CN201320474251.4U CN203479770U (en) | 2013-08-06 | 2013-08-06 | Digital and analogue dual-purpose ultrasonic fault detector |
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| CN203479770U true CN203479770U (en) | 2014-03-12 |
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| CN201320474251.4U Expired - Lifetime CN203479770U (en) | 2013-08-06 | 2013-08-06 | Digital and analogue dual-purpose ultrasonic fault detector |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105954354A (en) * | 2016-04-28 | 2016-09-21 | 中国石油化工股份有限公司 | Ultrasonic non-destructive detection device for detecting defect of thin plate |
| CN106918643A (en) * | 2017-04-18 | 2017-07-04 | 南通友联数码技术开发有限公司 | A kind of portable general multichannel ultrasonic detection module |
| CN108318588A (en) * | 2018-02-01 | 2018-07-24 | 株洲时代电子技术有限公司 | A kind of rail examination verification method |
-
2013
- 2013-08-06 CN CN201320474251.4U patent/CN203479770U/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105954354A (en) * | 2016-04-28 | 2016-09-21 | 中国石油化工股份有限公司 | Ultrasonic non-destructive detection device for detecting defect of thin plate |
| CN105954354B (en) * | 2016-04-28 | 2018-08-28 | 中国石油化工股份有限公司 | A kind of device carrying out Ultrasonic Nondestructive to thin plate defect |
| CN106918643A (en) * | 2017-04-18 | 2017-07-04 | 南通友联数码技术开发有限公司 | A kind of portable general multichannel ultrasonic detection module |
| CN108318588A (en) * | 2018-02-01 | 2018-07-24 | 株洲时代电子技术有限公司 | A kind of rail examination verification method |
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Granted publication date: 20140312 |