CN117517783A - Single-port impedance detection device and method and electronic equipment - Google Patents
Single-port impedance detection device and method and electronic equipment Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
- G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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Abstract
The invention discloses a single-port impedance detection device and method and electronic equipment, and belongs to the technical field of impedance detection. The invention adopts the same pulse to send out the sampling and DAC output command to realize synchronization, thereby realizing synchronous sampling and ensuring that the measurement result is not influenced by the cut-off error in the asynchronous process. Meanwhile, the frequency stability is high; the invention has wide working frequency range and can cover the frequency range from direct current to tens of GHz, so that the impedance measurement can be very convenient on the actual working frequency.
Description
Technical Field
The invention belongs to the technical field of impedance detection, and particularly relates to a single-port impedance detection device and method and electronic equipment.
Background
Impedance is important to circuit performance. Impedance is defined as the phenomenon of obstruction of signal current by an electronic circuit or element for a particular frequency signal, and may be represented by Z, which is typically a complex number. The impedance Z comprises a real part and an imaginary part, and is generally described by R+jX, wherein R represents impedance and X represents reactance.
The existing impedance detection methods include a balanced bridge method, a resonance method and a voltammetry.
The balance bridge method is an analog measurement mode, and the commonly used bridge is divided into a direct current bridge and an alternating current bridge, wherein the direct current bridge is mainly applied to the aspect of measuring pure resistance and is further divided into two single-arm and double-arm bridges according to different circuit structures. Single arm or double arm bridges are typically used to measure resistance values, but only over a range of values that are good at measuring resistance. The balanced bridge method has the advantages of high measurement accuracy, low cost and capability of expanding measurement bandwidth by adding bridges in different frequency ranges; disadvantages are that the operation is very cumbersome, repeated manual adjustment is required, and the measurement frequency band is narrow.
Resonance is also a way to measure impedance by analog, which is calculated from the high or low resistance characteristics exhibited by LC circuits when they resonate. The circuit is simple and convenient to realize, the technical difficulty is slightly smaller than that of the high-frequency bridge, the circuit element can be used as the element of a tuning loop, and the impedance can be measured by adopting a resonance method. The resonance method has the advantages that the Q value of the measuring circuit can be very high, and the resonance method has the defects that the measuring precision is lower than that of the bridge method and the measurable frequency band is narrower because of the need of re-tuning each time of measurement. In addition, the resonance method requires excitation signals with higher frequency, is generally not easy to meet the requirement of high-precision measurement, and the test speed is difficult to improve because the test frequency is not fixed.
The voltammetric impedance measurement is to calculate impedance by using the relation between voltage and current of the load to be measured and the relation between voltage and current of the reference load. The voltammetry utilizes a digital processing method, is quick and convenient, avoids adopting a complicated analog circuit, improves the anti-interference performance, and generally, the working bandwidth is mainly limited by a transformer at the probe end under the scene of measurement by using the probe. Voltammetry is mainly used in the low frequency range and in grounded devices.
In summary, the existing impedance detection technology is difficult to realize online measurement of a test piece, and is difficult to realize wide-band, high-test speed and high-precision measurement.
Disclosure of Invention
The invention provides a single-port impedance detection device, a single-port impedance detection method and electronic equipment, which are used for solving the problems that the existing impedance detection technology is difficult to realize the on-line measurement of a test piece and is difficult to realize the measurement with wide frequency band, high test speed and high precision.
The technical scheme of the invention is as follows: the single-port impedance detection device comprises a signal source, a signal separator, a transmission signal acquisition module, a transmission signal processing module and a data processing module;
the signal input end of the signal separator is connected with the output end of the signal source; the test piece test port of the signal separator is connected with the test piece; the transmitting signal acquisition port of the signal separator is connected with the input end of the transmitting signal acquisition module; the reflected signal acquisition port of the signal separator is connected with the input end of the reflected signal acquisition module; the signal output end of the transmitting signal acquisition module and the signal output end of the reflecting signal acquisition module are respectively connected with the first input end and the second input end of the data processing module.
Further, the lower limit value of the operating frequency range of the signal source is smaller than the lower limit value of the operating frequency range of the single-port impedance detection device, and the upper limit value of the operating frequency range of the signal source is larger than the upper limit value of the operating frequency range of the single-port impedance detection device.
Further, the data processing module is used for respectively carrying out data processing on the emission signal data acquired by the emission signal acquisition module and the reflection signal data acquired by the reflection signal acquisition module to acquire corresponding IQ signals, acquiring the amplitude and the phase of the emission signals and the amplitude and the phase of the reflection signals according to the IQ signals, and determining the complex impedance value of the test piece according to the amplitude and the phase of the emission signals, the amplitude and the phase of the reflection signals and the pre-calibration coefficient.
Further, the data processing module comprises a transmitting signal processing module, a reflecting signal processing module, an impedance resolving module and a result reporting module;
the output end of the emission signal acquisition module is connected with the input end of the emission signal processing module; the output end of the reflected signal acquisition module is connected with the input end of the reflected signal processing module; the output end of the transmitting signal processing module is connected with the first input end of the impedance resolving module; the output end of the reflection signal processing module is connected with the second input end of the impedance resolving module; the output end of the impedance resolving module is connected with the result reporting module.
Further, the transmitting signal processing module is used for converting the first digital signal output by the transmitting signal acquisition module into a first IQ signal and determining the amplitude and the phase of the transmitting signal according to the first IQ signal;
the reflected signal processing module is used for converting the second digital signal output by the reflected signal acquisition module into a second IQ signal and determining the amplitude and the phase of the reflected signal according to the second IQ signal;
the impedance resolving module is used for determining the complex impedance value of the test piece according to the amplitude and the phase of the transmitting signal, the amplitude and the phase of the reflecting signal and the pre-calibration coefficient.
The beneficial effects of the invention are as follows:
(1) The invention adopts the same pulse to send out the sampling and DAC output command to realize synchronization, thereby realizing synchronous sampling and ensuring that the measurement result is not influenced by the cut-off error in the asynchronous process. Meanwhile, the frequency stability is high;
(2) The invention has a wide working frequency range and can cover the frequency range from direct current to tens of GHz, so that the impedance measurement can be very convenient on the actual working frequency;
(3) In the existing two-port or multi-port impedance detection design, an electrical device in operation is to be detected, and is usually detached after the electrical device stops working so as to be convenient for measurement.
Based on the device, the invention also provides a single-port impedance detection method, which comprises the following steps:
s1, collecting a transmitting signal sent by a signal source, and converting the transmitting signal into a first digital signal; collecting a reflected signal reflected by a test piece, and converting the reflected signal into a second digital signal;
s2, acquiring a first IQ signal according to the first digital signal, and determining the amplitude and the phase of a transmitting signal according to the first IQ signal; acquiring a second IQ signal according to the second digital signal, and determining the amplitude and the phase of the reflected signal according to the second IQ signal;
s3, determining the transmitting signal and the reflecting signal according to the amplitude and the phase of the transmitting signal and the amplitude and the phase of the reflecting signal; calculating the reflection coefficient of the test piece according to the emission signal and the reflection signal;
s4, calculating the complex impedance value of the test piece according to the reflection coefficient and the pre-calibration coefficient of the test piece.
Further, in S4, the complex impedance value of the test pieceThe calculation formula of (2) is as follows:
；
；
in the method, in the process of the invention,representing the characteristic impedance of a standard matched load,representing the reflection coefficient after the error correction,indicating the reflectance of the test piece,a first pre-calibration coefficient is indicated,representing the second pre-calibration coefficient of the device,representing a third pre-calibration factor. The reflectance of the test piece is the ratio of the reflected signal to the transmitted signal.
Further, the pre-calibration coefficients include a first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficient；
First pre-calibration coefficientThe calculation formula of (2) is as follows:
；
second pre-calibration coefficientThe calculation formula is as follows:
；
third pre-calibration coefficientThe calculation formula of (2) is as follows:
；
in the method, in the process of the invention,representing the reference plane reflection coefficient corresponding to the standard open circuit load,representing the reference plane reflection coefficient corresponding to the standard short circuit load,representing the reflection coefficient of the reference surface corresponding to the standard matching load.
Further, the pre-calibration coefficients include a first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficient；
First pre-calibration coefficientThe calculation formula of (2) is as follows:
；
second pre-calibration coefficientThe calculation formula is as follows:
；
third pre-calibration coefficientThe calculation formula of (2) is as follows:
；
in the method, in the process of the invention,representing the reference plane reflection coefficient corresponding to the standard open circuit load,representing the reference plane reflection coefficient corresponding to the standard short circuit load,representing the reflection coefficient of the reference surface corresponding to the standard matching load.
The beneficial effects of the invention are as follows:
(1) The impedance detection error correction model established by the invention is concise and high in precision, the calibration process takes short time, and once the impedance detection device is calibrated, long-time automatic online high-precision work can be realized.
(2) The invention realizes the impedance detection which takes the wide frequency band, the high test speed, the high measurement precision and the real-time online into consideration from the multi-angle consideration of the working parameter range of the device, the algorithm and the like.
In order to achieve the above object, the present invention further provides an electronic device, which includes a memory, a processor, and a single-port impedance detection program stored in the memory and capable of running on the processor, wherein the single-port impedance detection program implements part or all of the steps of the single-port impedance detection method when executed by the processor.
Drawings
FIG. 1 is a schematic diagram of a single port impedance detection device;
FIG. 2 is a schematic diagram of a data processing module;
FIG. 3 is a schematic diagram of a four port signal splitter constructed of discrete devices;
FIG. 4 is a schematic diagram of a transmit signal processing module;
FIG. 5 is a flow chart of a single port impedance detection method;
fig. 6 is a schematic structural diagram of an electronic device.
Detailed Description
Embodiments of the present invention are further described below with reference to the accompanying drawings.
Embodiment one:
as shown in fig. 1, the invention provides a single-port impedance detection device, which comprises a signal source, a signal separator, a transmission signal acquisition module, a transmission signal processing module and a data processing module;
the signal input end of the signal separator is connected with the output end of the signal source; the test piece test port of the signal separator is connected with the test piece; the transmitting signal acquisition port of the signal separator is connected with the input end of the transmitting signal acquisition module; the reflected signal acquisition port of the signal separator is connected with the input end of the reflected signal acquisition module; the signal output end of the transmitting signal acquisition module and the signal output end of the reflecting signal acquisition module are respectively connected with the first input end and the second input end of the data processing module.
The signal source can provide a sweep frequency signal with controllable frequency and duration, and the single-port impedance detection device can work in a sweep frequency state as required, and can also work in a single-frequency point state without specific limitation.
The lower limit of the output frequency range of the signal source is smaller than the lower limit of the actual working frequency range of the single-port impedance detection device, and the upper limit of the output frequency range of the signal source is larger than the upper limit of the actual working frequency range of the single-port impedance detection device; in other words, the signal source has a wider output frequency range that can completely cover the actual operating frequency range of the single-port impedance detection device. Those skilled in the art may select an appropriate signal source output frequency range according to the actual application scenario, which is not specifically limited herein. For example, the actual working frequency range of the single-port impedance detection device is 2MHz-20GHz, the output frequency of the signal source is 1MHz-20.1GHz, and the arrangement can reduce the algorithm design difficulty, the program development and debugging difficulty and the program running time while the hardware cost is not increased, so that the testing speed and the testing precision of the impedance detection device are improved.
Specifically, the impedance detection device generally needs to calibrate each operating frequency point in an actual operating frequency range, and when the impedance detection device is actually calibrated, a certain number of operating frequency points are usually selected selectively, and the remaining operating frequency points acquire their pre-calibration coefficients by adopting an interpolation mode, generally speaking, the interpolation accuracy is higher than the extrapolation, and the design complexity of the extrapolation algorithm is higher than the interpolation. Therefore, if the working frequency range of the signal source is consistent with the actual working frequency range of the single-port impedance detection device, an interpolation method can be selected within 2MHz-20GHz (without end point values), and at two end point frequency points of 2MHz and 20GHz, an extrapolation method is needed, the precision of a pre-calibration coefficient is reduced, the precision of a final impedance solution value is influenced, and in the process of algorithm design and program development and debugging, the action time judgment of interpolation and extrapolation is needed, the algorithm design and program development and debugging difficulty is increased, the program running time is also increased, and the total time spent is difficult to tolerate by knowing that interpolation and extrapolation judgment is carried out before each working frequency point is called for the working frequency range of tens of GHz and the frequency resolution of 100 Hz; if the working frequency range of the signal source has a wider working frequency range which can completely cover the actual working frequency range of the single-port impedance detection device, the calibration frequency range can be widened to 1MHz-20.1GHz, then an interpolation method can be adopted in the 2MHz-20GHz of the calibration frequency range, and the endpoint frequency judgment is not needed, so that the algorithm design is optimized, the program development and debugging difficulty is reduced, the program running time is shortened, and the testing speed and the testing precision of the impedance detection device are further improved.
The data processing module is used for respectively carrying out data processing on the emission signal data acquired by the emission signal acquisition module and the reflection signal data acquired by the reflection signal acquisition module to acquire corresponding IQ signals, acquiring the amplitude and the phase of the emission signals and the amplitude and the phase of the reflection signals according to the IQ signals, and determining the complex impedance value of the test piece according to the amplitude and the phase of the emission signals, the amplitude and the phase of the reflection signals and the pre-calibration coefficient.
In the IQ signal, I (In-phase) represents an In-phase signal, and Q (Quadrature) represents a Quadrature signal, i.e., 90 ° out of phase with the I signal.
The single port means that the impedance detecting device is electrically connected to the test piece through only one port, and the transmission signal transmitted from the impedance detecting device to the test piece and the reflection signal transmitted from the test piece to the impedance detecting device are transmitted through the ports.
The working flow of the impedance detection device is as follows, the initialization is carried out firstly after the power-on, the initialization process comprises conventional operations such as parameter configuration, self-checking and the like, after the initialization is finished, the pre-calibration coefficients are obtained, the pre-calibration coefficients comprise pre-calibration coefficients which are necessary for resolving the impedance and are obtained under various conditions that a calibration surface is respectively connected with an open-circuit load, a short-circuit load and a matched load, after the pre-calibration coefficients are obtained, an external port of the impedance detection device is connected with a test piece, meanwhile, emission signal data and reflection signal test data of the test piece are collected, then data processing is carried out on the emission signal data and the reflection signal data respectively, corresponding IQ signals are obtained, and the amplitude and the phase of the emission signal are obtained according to the IQ signals; then according to the amplitude and phase of the reflected signal and the transmitted signal and combining the pre-calibration coefficient, calculating the complex impedance value of the test piece; and finally reporting the complex impedance value to the back end for use.
Embodiment two:
on the basis of the first embodiment, as shown in fig. 2, the data processing module includes a transmit signal processing module, a reflected signal processing module, an impedance resolving module, and a result reporting module;
the output end of the emission signal acquisition module is connected with the input end of the emission signal processing module; the output end of the reflected signal acquisition module is connected with the input end of the reflected signal processing module; the output end of the transmitting signal processing module is connected with the first input end of the impedance resolving module; the output end of the reflection signal processing module is connected with the second input end of the impedance resolving module; the output end of the impedance resolving module is connected with the result reporting module.
The working flow of the impedance detection device is as follows, the initialization is carried out firstly after the power-on, the initialization process comprises conventional operations such as parameter configuration, self-checking and the like, after the initialization is finished, the pre-calibration coefficients are obtained, the pre-calibration coefficients comprise pre-calibration coefficients which are necessary for resolving the impedance and are obtained under various conditions that a calibration surface is respectively connected with an open-circuit load, a short-circuit load and a matched load, after the pre-calibration coefficients are obtained, an external port of the impedance detection device is connected with a test piece, meanwhile, emission signal data and reflection signal test data of the test piece are collected, then data processing is carried out on the emission signal data and the reflection signal data respectively, corresponding IQ signals are obtained, and the amplitude and the phase of the emission signal are obtained according to the IQ signals; and the impedance calculating module calculates the complex impedance value of the test piece according to the amplitude and the phase of the reflected signal and the transmitted signal and the pre-calibration coefficient.
The pre-calibration coefficients comprise a first pre-calibration coefficient, a second pre-calibration coefficient and a third pre-calibration coefficient, and the first pre-calibration coefficient, the second pre-calibration coefficient and the third pre-calibration coefficient can be obtained by respectively connecting a standard open circuit load, a standard short circuit load and a standard matching load at a reference surface of the single-port impedance detection device.
In the IQ signal, I (In-phase) represents an In-phase signal, and Q (Quadrature) represents a Quadrature signal, i.e., 90 ° out of phase with the I signal.
The single port means that the impedance detecting device is electrically connected to the test piece through only one port, and the transmission signal transmitted from the impedance detecting device to the test piece and the reflection signal transmitted from the test piece to the impedance detecting device are transmitted through the ports.
As shown in fig. 3, the signal splitter may be a four-port directional coupler, or may be a four-port signal splitter formed from discrete devices, such as a 3dB splitter combined with a three-port directional coupler. The input end of the 3dB splitter is connected with the output end of the signal source, one output end of the 3dB splitter is connected with the emission signal acquisition module, the other output end of the 3dB splitter is connected with the three-port directional coupler, the port I of the directional coupler is connected with one output end of the 3dB splitter, the port II serves as an external port of the whole impedance detection device, the port II is connected with the test piece, the port III is connected with the reflection signal acquisition module, and the reflection signal of the test piece is transmitted to the reflection signal acquisition module.
As a preferred embodiment, the signal source comprises a digital-to-analog conversion unit, a first operational amplifier and a first filter which are sequentially connected; the signal source may be any other structure capable of realizing the function thereof, and the structure is not limited herein.
As a preferred embodiment, the emission signal acquisition module comprises a second filter, a second operational amplifier and a first analog-to-digital conversion unit which are sequentially connected; it should be noted that the emission signal acquisition module may be any other structure capable of implementing the function thereof, and the structure thereof should not be construed as being limited herein.
As a preferred embodiment, the reflected signal acquisition module includes a third filter, a third operational amplifier, and a second analog-to-digital conversion unit that are sequentially connected. It should be noted that the reflected signal collecting module may be any other structure capable of achieving the function thereof, and the structure is not limited herein.
The signal source is used for outputting a sweep frequency signal;
the transmitting signal processing module is used for converting the first digital signal output by the transmitting signal acquisition module into a first IQ signal and determining the amplitude and the phase of the transmitting signal according to the first IQ signal;
the reflected signal processing module is used for converting the second digital signal output by the reflected signal acquisition module into a second IQ signal and determining the amplitude and the phase of the reflected signal according to the second IQ signal;
the impedance resolving module is used for determining the complex impedance value of the test piece according to the amplitude and the phase of the transmitting signal, the amplitude and the phase of the reflecting signal and the pre-calibration coefficient.
As a preferred embodiment, as shown in fig. 4, the transmit signal processing module includes a local vibration source, a mixer, a low-pass filter, and a plurality of first downsamplers; the reflected signal processing module comprises a local vibration source, a mixer, a low-pass filter and a plurality of downsamplers.
The local oscillation source is used for generating two paths of orthogonal signals with equal amplitude; the downsampler is used to decimate the low pass filtered signal several times to reduce the sampling rate. In an ideal situation, as long as the local oscillation source can generate two paths of orthogonal signals with equal amplitude, the two paths of signals generated after the local oscillation can be ideal two paths of signals with the same amplitude and orthogonal phase.
In other preferred embodiments, the data processing module further includes a result reporting module, and the signal output end of the impedance resolving module is connected with the result reporting module; the result reporting module is used for reporting the complex impedance value provided by the impedance resolving module to a user or superior equipment.
In other preferred embodiments, the single port impedance detection apparatus further comprises a clock module; the clock module is used for providing a clock reference for the signal source, the emission signal acquisition module, the reflection signal acquisition module, the emission signal processing module, the reflection signal processing module, the impedance resolving module and the result reporting module. The same pulse provided by the clock module is adopted to send out the sampling and DAC output command to realize synchronization, so that synchronous sampling is realized, and the measurement result is not influenced by the truncation error in asynchronous state. While having high frequency stability.
Embodiment III:
based on the single-port impedance detection device of the first embodiment or the second embodiment, the invention further provides a single-port impedance detection method, as shown in fig. 5, comprising the following steps:
s1, collecting a transmitting signal sent by a signal source, and converting the transmitting signal into a first digital signal; collecting a reflected signal reflected by a test piece, and converting the reflected signal into a second digital signal;
s2, acquiring a first IQ signal according to the first digital signal, and determining the amplitude and the phase of a transmitting signal according to the first IQ signal; acquiring a second IQ signal according to the second digital signal, and determining the amplitude and the phase of the reflected signal according to the second IQ signal;
s3, determining the transmitting signal and the reflecting signal according to the amplitude and the phase of the transmitting signal and the amplitude and the phase of the reflecting signal; calculating the reflection coefficient of the test piece according to the emission signal and the reflection signal;
s4, calculating the complex impedance value of the test piece according to the reflection coefficient and the pre-calibration coefficient of the test piece.
In a preferred embodiment, in S3, a signal is transmittedThe expression of (2) is:
；
in the method, in the process of the invention,representing the amplitude of the transmitted signal,representing the phase of the transmitted signal,representing an index the function of the function is that,representing an imaginary number.
In a preferred embodiment, in S3, the signal is reflectedThe expression of (2) is:
；
in the method, in the process of the invention,representing the amplitude of the reflected signal,indicating the phase of the reflected signal,representing an index the function of the function is that,representing an imaginary number.
In a preferred embodiment, S3, the reflectance of the test pieceThe calculation formula of (2) is as follows:
；
in the method, in the process of the invention,representing the reflected signal(s),representing the reflected signals, both being complex functions of frequency.
In an ideal case, as long as the local oscillation source can generate two paths of orthogonal signals with equal amplitude, the two paths of signals generated after the local oscillation can be ideal two paths of signals with the same amplitude and orthogonal phase, and the standard signal formula is that,Wherein, I and Q are respectively an I signal and a Q signal generated after mixing, A is the signal amplitude,is the signal phase. Since the I and Q signals are standard quadrature signals, the use is made ofAndto represent. Thus, the signal amplitude A and phase can be obtained according to the above formula：,。
As a preferred embodiment, the specific method for obtaining the first pre-calibration coefficient, the second pre-calibration coefficient and the third pre-calibration coefficient is as follows: and respectively connecting the single-port impedance detection device with the standard open-circuit load, the standard short-circuit load and the standard matching load to obtain a reference surface reflection coefficient corresponding to the standard open-circuit load, a reference surface reflection coefficient corresponding to the standard short-circuit load and a reference surface reflection coefficient corresponding to the standard matching load, and calculating a first pre-calibration coefficient, a second pre-calibration coefficient and a third pre-calibration coefficient according to the reference surface reflection coefficient corresponding to the standard open-circuit load, the reference surface reflection coefficient corresponding to the standard short-circuit load and the reference surface reflection coefficient corresponding to the standard matching load.
In a preferred embodiment, S4, the complex impedance value of the test pieceThe calculation formula of (2) is as follows:
；
；
in the method, in the process of the invention,representing the characteristic impedance of a standard matched load,representing the reflection coefficient after the error correction,indicating the reflectance of the test piece,a first pre-calibration coefficient is indicated,representing the second pre-calibration coefficient of the device,representing a third pre-calibration factor. The reflectance of the test piece is the ratio of the reflected signal to the transmitted signal.
As a preferred embodiment, the pre-calibration coefficients comprise a first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficient；
First pre-calibration coefficientThe calculation formula of (2) is as follows:
；
second pre-calibration coefficientThe calculation formula is as follows:
；
third pre-calibration coefficientThe calculation formula of (2) is as follows:
；
in the method, in the process of the invention,representing the reference plane reflection coefficient corresponding to the standard open circuit load,representing the reference plane reflection coefficient corresponding to the standard short circuit load,representing the reflection coefficient of the reference surface corresponding to the standard matching load.
As a preferred embodiment, the pre-calibration coefficients comprise a first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficient；
First pre-calibration coefficientThe calculation formula of (2) is as follows:
；
second pre-calibration coefficientThe calculation formula is as follows:
；
third pre-calibration coefficientThe calculation formula of (2) is as follows:
；
in the method, in the process of the invention,representing standard open circuit load correspondenceIs used to determine the reference plane reflectance of the lens,representing the reference plane reflection coefficient corresponding to the standard short circuit load,representing the reflection coefficient of the reference surface corresponding to the standard matching load.
、Andis three pre-calibration coefficients, and can be obtained by replacing the test piece with a standard open-circuit load, a standard short-circuit load and a standard matched load for three times of calibration.
The error correction model and the acquisition method of the three pre-calibration coefficients are described below.
Any test system has a lot of test errors, and good hardware design and device selection can reduce the test errors to a certain extent and improve the detection accuracy, but cannot eliminate the errors, so in order to further improve the detection accuracy of the test system, the test errors of the impedance detection device need to be corrected.
The specific error correction process is as follows: firstly, respectively measuring an open circuit, a short circuit and a matched load, and calculating a pre-calibration coefficient according to an error correction model of the impedance detection device; and then testing the tested piece, wherein the impedance detection device can automatically correct the impedance error of the tested piece, eliminate the error part and obtain the impedance true value of the tested piece.
First pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficientThis can be achieved by performing three calibrations on the external port of the impedance detection device, namely, respectively connecting the standard open-circuit load, the standard short-circuit load and the standard matched load to the external port of the impedance detection device. It should be noted that, the appropriate calibration reference surface needs to be determined according to the electrical path between the test piece and the external port of the impedance detection device, and the reference surface may be an interface bonding surface where the external port of the impedance detection device is located, or an interface bonding surface after the external port of the impedance detection device is connected to the extension cable, which is not specifically limited herein.
After the impedance detection device is connected with the test piece, the signal output by the transmitting signal processing module in the impedance detection device is a, and the signal output by the reflecting signal processing module is b, which are complex functions of frequency. From this, it can be seen that the reflection coefficient Γ at the reference plane is:。
to obtain a first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficientThe reference surface can be respectively connected with a standard open-circuit load, a standard short-circuit load and a standard matching load, and the reflection coefficients of the reference surface under three conditions can be respectively obtained、、Then a first pre-calibration coefficient can be obtainedSecond pre-calibration coefficientAnd a third pre-calibration coefficient：，，. At the time of obtaining the first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficientWhen the test piece is a tested element, the reflection coefficient before error correction can be obtained according to the tested elementAnd the first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficientTo obtain the reflection coefficient after error correctionThe method comprises the following steps:。
embodiment four:
the present embodiment is a replacement of the error correction model based on the third embodiment.
First pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficientThis can be achieved by performing three calibrations on the external port of the impedance detection device, namely, respectively connecting the standard open-circuit load, the standard short-circuit load and the standard matched load to the external port of the impedance detection device. It should be noted that, the appropriate calibration reference surface needs to be determined according to the electrical path between the test piece and the external port of the impedance detection device, and the reference surface may be an interface bonding surface where the external port of the impedance detection device is located, or an interface bonding surface after the external port of the impedance detection device is connected to the extension cable, which is not specifically limited herein.
After the impedance detection device is connected with the test piece, the signal output by the transmitting signal processing module in the impedance detection device is a, and the signal output by the reflecting signal processing module is b, which are complex functions of frequency.
From this, it can be seen that the reflection coefficient Γ at the reference plane is:。
to obtain a first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficientThe reference surface can be respectively connected with a standard open-circuit load, a standard short-circuit load and a standard matching load, and the reflection coefficients of the reference surface under three conditions can be respectively obtained、、Then the pre-calibration coefficient can be obtained、、：，，。
At the time of obtaining the first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficientWhen the test piece is a tested element, the reflection coefficient before error correction can be obtained according to the tested elementAnd the first pre-calibration coefficientSecond pre-calibration coefficientAnd a third pre-calibration coefficientTo obtain the reflection coefficient after error correctionThe method comprises the following steps:。
the main difference between the fourth embodiment and the third embodiment is the third pre-calibration coefficientThe reason for this is that the error correction model established in the fourth embodiment is slightly different from that established in the third embodiment, and the third embodiment considers the error correction caused by the directivity of the directional coupler in the signal separator, and the fourth embodiment comprehensively considers the directivity error and the mismatch error in the signal separator. Both error correction models can achieve the same detection accuracy.
Fifth embodiment:
the embodiment of the application also provides electronic equipment, which can be a server, and the internal structure of the electronic equipment can be shown in fig. 6. The computer device includes a processor, a memory, a network interface, and a database connected by a system bus. Wherein the computer is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The database of the computer device is used for medication prompt program. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program when executed by a processor implements a single port impedance detection method. The system bus includes a data bus, an address bus, and a control bus. The internal memory may include volatile memory such as Random Access Memory (RAM) and/or cache memory, and may further include Read Only Memory (ROM).
It should also be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element. Furthermore, it should be noted that the scope of the methods and apparatus in the embodiments of the present application is not limited to performing the functions in the order shown or discussed, but may also include performing the functions in a substantially simultaneous manner or in an opposite order depending on the functions involved, e.g., the described methods may be performed in an order different from that described, and various steps may also be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.
From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solutions of the present application may be embodied essentially or in a part contributing to the prior art in the form of a computer software product stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk), comprising several instructions for causing a terminal (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the methods described in the embodiments of the present application.
The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those of ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are also within the protection of the present application.
Claims (10)
1. The single-port impedance detection device is characterized by comprising a signal source, a signal separator, a transmission signal acquisition module, a transmission signal processing module and a data processing module;
the signal input end of the signal separator is connected with the output end of the signal source; the test piece test port of the signal separator is connected with the test piece; the transmitting signal acquisition port of the signal separator is connected with the input end of the transmitting signal acquisition module; the reflected signal acquisition port of the signal separator is connected with the input end of the reflected signal acquisition module; the signal output end of the transmitting signal acquisition module and the signal output end of the reflecting signal acquisition module are respectively connected with the first input end and the second input end of the data processing module.
2. The single port impedance detecting apparatus according to claim 1, wherein a lower limit value of an operating frequency range of the signal source is smaller than a lower limit value of an operating frequency range of the single port impedance detecting apparatus, and an upper limit value of the operating frequency range of the signal source is larger than an upper limit value of the operating frequency range of the single port impedance detecting apparatus.
3. The single-port impedance detecting apparatus according to claim 1, wherein the data processing module is configured to perform data processing on the emission signal data collected by the emission signal collecting module and the reflection signal data collected by the reflection signal collecting module, respectively, to obtain corresponding IQ signals, obtain an amplitude and a phase of the emission signal and an amplitude and a phase of the reflection signal according to the IQ signals, and determine a complex impedance value of the test piece according to the amplitude and the phase of the emission signal, the amplitude and the phase of the reflection signal, and the pre-calibration coefficient.
4. The single-port impedance detection device of claim 1 wherein the data processing module comprises a transmit signal processing module, a reflected signal processing module, an impedance resolving module, and a result reporting module;
the output end of the emission signal acquisition module is connected with the input end of the emission signal processing module; the output end of the reflected signal acquisition module is connected with the input end of the reflected signal processing module; the output end of the transmitting signal processing module is connected with the first input end of the impedance resolving module; the output end of the reflected signal processing module is connected with the second input end of the impedance resolving module; the output end of the impedance resolving module is connected with the result reporting module.
5. The single-port impedance detecting apparatus according to claim 4, wherein the transmit signal processing module is configured to convert the first digital signal output by the transmit signal acquisition module into a first IQ signal, and determine the amplitude and phase of the transmit signal according to the first IQ signal;
the reflected signal processing module is used for converting the second digital signal output by the reflected signal acquisition module into a second IQ signal and determining the amplitude and the phase of the reflected signal according to the second IQ signal;
the impedance calculation module is used for determining the complex impedance value of the test piece according to the amplitude and the phase of the transmitting signal, the amplitude and the phase of the reflecting signal and the pre-calibration coefficient.
6. A single port impedance detection method comprising the steps of:
s1, collecting a transmitting signal sent by a signal source, and converting the transmitting signal into a first digital signal; collecting a reflected signal reflected by a test piece, and converting the reflected signal into a second digital signal;
s2, acquiring a first IQ signal according to the first digital signal, and determining the amplitude and the phase of a transmitting signal according to the first IQ signal; acquiring a second IQ signal according to the second digital signal, and determining the amplitude and the phase of the reflected signal according to the second IQ signal;
s3, determining the transmitting signal and the reflecting signal according to the amplitude and the phase of the transmitting signal and the amplitude and the phase of the reflecting signal; calculating the reflection coefficient of the test piece according to the emission signal and the reflection signal;
s4, calculating the complex impedance value of the test piece according to the reflection coefficient and the pre-calibration coefficient of the test piece.
7. The method according to claim 6, wherein in S4, the complex impedance value of the test piece isThe calculation formula of (2) is as follows:
；
；
in the method, in the process of the invention,characteristic impedance representing a standard matched load, +.>Representing the reflection coefficient after error correction, +.>Representing the reflectance of the test piece, < >>Representing a first pre-calibration factor, +.>Representing a second pre-calibration factor, +.>Representing a third pre-calibration factor.
8. The method of single port impedance detection according to claim 6, wherein the pre-calibration factor comprises a first pre-calibration factorSecond pre-calibration coefficient->And a third pre-calibration coefficient->；
The first pre-calibration coefficientThe calculation formula of (2) is as follows:
；
the second pre-calibration coefficientThe calculation formula is as follows:
；
the third pre-calibration coefficientThe calculation formula of (2) is as follows:
；
in the method, in the process of the invention,reference plane reflection coefficient corresponding to standard open circuit load, < ->Indicating the reflection coefficient of the reference plane corresponding to the standard short-circuit load, < ->Representing the reflection coefficient of the reference surface corresponding to the standard matching load.
9. The method of single port impedance detection according to claim 6, wherein the pre-calibration factor comprises a first pre-calibration factorSecond pre-calibration coefficient->And a third pre-calibration coefficient->；
The first pre-calibration coefficientThe calculation formula of (2) is as follows:
；
the second pre-calibration coefficientThe calculation formula is as follows:
；
the third pre-calibration coefficientThe calculation formula of (2) is as follows:
；
in the method, in the process of the invention,reference plane reflection coefficient corresponding to standard open circuit load, < ->Indicating the reflection coefficient of the reference plane corresponding to the standard short-circuit load, < ->Representing the reflection coefficient of the reference surface corresponding to the standard matching load.
10. An electronic device comprising a memory, a processor and a single port impedance detection program stored on the memory and operable on the processor, the single port impedance detection program when executed by the processor implementing the steps of the single port impedance detection method of any of claims 6 to 9.
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