CN117194693A - Photoelectric plate defect map preview display method, device, equipment and storage medium - Google Patents
Photoelectric plate defect map preview display method, device, equipment and storage medium Download PDFInfo
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Abstract
The application discloses a method, a device, equipment and a storage medium for previewing and displaying a defect map of a photoelectric plate, which relate to the field of image display, wherein the equipment displays a defect previewing interface and comprises a panoramic display area and a previewing display area; the panorama display area displays the mother layout of the photoelectric plate, and the preview display area displays the defect map of the photoelectric plate; when a preview instruction of the defect map is received, determining a preview mode and a target mother map, acquiring a defect set from a database, and displaying the defect map of target quantity and target size in a preview display area according to the preview mode; and when receiving the selection operation of the target defect map in the preview display area, displaying the original defect map corresponding to the target defect map in the preview display area. According to the scheme, the number of defect images and the image size of the preview display can be freely selected according to the number of defects of the photoelectric plate, the original defect image display can be called, the image scaling effect can be achieved, the detail information of defect points is directly known from the original defect image, and the false detection rate is greatly reduced.
Description
Technical Field
The present application relates to the field of image display, and in particular, to a method, an apparatus, a device, and a storage medium for previewing and displaying a defect map of a photovoltaic panel.
Background
Optoelectronic boards play an important role in the integrated circuit industry, and for the produced optoelectronic boards, it is necessary to use machine equipment to perform optical detection and defect detection analysis. The defect detection mainly scans the image of the photoelectric plate through a line scanning camera above the machine table, and then the computer equipment performs image analysis to determine defect points. In actual industrial production, in order to maintain a certain yield, the screened defective photovoltaic panel must be checked again manually, and finally, rejection or secondary processing is determined.
The computer equipment or the machine equipment for the recheck needs to check and recheck all the detected defect points one by one, and the step is manually operated, and the traditional operation is that a rechecker refers to the defect graphs intercepted by scanning one by one, so that the recheck efficiency is seriously dragged, and the scheme for displaying the defect graphs in a grid mode is not beneficial to zooming and checking of images, and influences the recheck precision.
Disclosure of Invention
The application provides a method, a device, equipment and a storage medium for previewing and displaying a defect map of a photoelectric plate, which solve the problem that a large number of defect maps needing rechecking influence rechecking efficiency.
In one aspect, the present application provides a method for previewing and displaying a defect map of an optical panel, where the method includes:
displaying a defect preview interface, wherein the defect preview interface comprises a panoramic display area and a preview display area; displaying a photoelectric plate master plate image in the panoramic display area, and displaying defect images of a plurality of photoelectric plates in the preview display area;
responding to a preview instruction of a received defect map, determining a preview mode corresponding to the preview instruction and a target mother layout to obtain a defect set from a database, and displaying defect maps of target quantity and target size in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantity and sizes;
in response to receiving a selection operation of a target defect map in the preview display area, displaying an original defect map corresponding to the target defect map in the preview display area; the original defect map is an original image identified and intercepted from the photoelectric plate mother layout, and the target defect map is a preview map subjected to size scaling according to a target preview mode.
In another aspect, the present application provides an apparatus for previewing and displaying a defect map of an electro-optical panel, the apparatus comprising:
the first display module is used for displaying a defect preview interface, wherein the defect preview interface comprises a panoramic display area and a preview display area; displaying a photoelectric plate master plate image in the panoramic display area, and displaying defect images of a plurality of photoelectric plates in the preview display area;
the second display module is used for responding to the received preview instruction of the defect map, determining a preview mode corresponding to the preview instruction and a target mother domain to obtain a defect set from a database, and displaying defect maps of target quantity and target size in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantity and sizes;
the third display module is used for responding to the receiving of the selection operation of the target defect map in the preview display area and displaying an original defect map corresponding to the target defect map in the preview display area; the original defect map is an original image identified and intercepted from the photoelectric plate mother layout, and the target defect map is a preview map subjected to size scaling according to a target preview mode.
In yet another aspect, the present application provides a computer device, where the computer device includes a processor and a memory, where at least one instruction, at least one section of program, a code set, or an instruction set is stored in the memory, and the at least one instruction, the at least one section of program, the code set, or the instruction set is loaded and executed by the processor to implement the method for previewing and displaying an electro-optical plate defect map according to the above aspect.
In yet another aspect, the present application provides a computer readable storage medium, where at least one instruction, at least one program, a code set, or an instruction set is stored, where the at least one instruction, the at least one program, the code set, or the instruction set is loaded and executed by a processor to implement the method for previewing a defective map of an electro-optical panel according to the above aspect.
The technical scheme provided by the embodiment of the application has the beneficial effects that at least: and setting a defect preview interface aiming at the photoelectric plate review, dividing the defect preview interface into a panoramic display area and a preview display area, displaying a panoramic mother layout of the photoelectric plate in the panoramic display area, displaying a defect map identified and scratched in the mother layout in the preview display area, and marking defects in the defect map, so that review by a review worker is facilitated. In order to improve the rechecking efficiency, by selecting different preview modes, defect graphs with different numbers and sizes can be displayed in the preview display area, so that the rechecking is convenient for a rechecker to recheck quickly. And for the fine defects, according to the target defect map selected by the rechecker, the original defect map is called in the preview display area to be displayed, so that the display effect of image amplification is realized, and the detail information of the defect points is directly read through the original defect map, so that the false detection rate can be greatly reduced.
Drawings
FIG. 1 is a schematic diagram of a system for providing a preview display method of a defect map of an electro-optical panel according to the present application;
FIG. 2 is a flowchart of a method for previewing and displaying a defect map of an optical panel according to an embodiment of the present application;
FIG. 3 is a schematic diagram of a defect preview interface provided by an embodiment of the present application;
FIG. 4 is a schematic diagram showing an original defect map at a defect preview interface;
FIG. 5 is a schematic diagram of an interface for creating defect filtering rules at the defect setup interface;
FIG. 6 is a schematic interface diagram of generating hints and outline annotations in a preview presentation area;
FIG. 7 is a schematic diagram of an interface for displaying an image control and zooming in on an image in a preview presentation area;
fig. 8 is a schematic structural diagram of a preview display device for a defect map of an optical panel according to an embodiment of the present application;
fig. 9 is a block diagram of a computer device according to an exemplary embodiment of the present application.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present application more apparent, the embodiments of the present application will be described in further detail with reference to the accompanying drawings.
References herein to "a plurality" means two or more. "and/or", describes an association relationship of an association object, and indicates that there may be three relationships, for example, a and/or B, and may indicate: a exists alone, A and B exist together, and B exists alone. The character "/" generally indicates that the context-dependent object is an "or" relationship.
FIG. 1 is a schematic diagram of a detection and display system for providing a preview display method of an electro-optical panel defect map, the system comprising a computer device and an optical detection machine with a line scanning camera. The photoelectric board passes through an optical detection machine table, the scanned image is transmitted to computer equipment after being scanned by a line scanning camera, and the computer equipment implants the scanned image into the mother layout of the photoelectric board for defect detection. The application mainly aims at the preview display stage of the defect detection result.
Fig. 2 is a flowchart of a method for previewing and displaying a defect map of a photovoltaic panel according to an embodiment of the present application, including the following steps:
step 101, displaying a defect preview interface, wherein the defect preview interface comprises a panoramic display area and a preview display area; the panoramic display area displays the mother board of the photoelectric board, and the preview display area displays the defect pictures of a plurality of photoelectric boards.
Referring to fig. 3, the defect preview interface 300 is a screen displayed on a computer interface, and the panorama display area 310 and the preview display area 320 are located at two areas of the interface, such as left and right sides or upper and lower sides. The panorama display area 310 shows a photo-plate master pattern 311 formed by a computer receiving a scanned image and implanting it into a master for inputting a defect detection model to identify defect points on the photo-plate.
The computer is responsible for carrying out data processing on the master pattern, carrying out defect detection analysis on the master pattern, and intercepting and obtaining a defect pattern. For example, when a photovoltaic panel includes a plurality of defect points, a corresponding screenshot is obtained to obtain a corresponding number of defect maps, and the defect maps are transmitted to (a database of) a computer for temporary storage. The preview display area 320 is used for displaying the defect map 321 for review by a review operator.
Step 102, in response to receiving a preview instruction of the defect map, determining a preview mode corresponding to the preview instruction and a target mother layout, acquiring a defect set from a database, and displaying defect maps of target quantity and target size in a preview display area according to the preview mode.
Because the line scanning camera continuously scans and transmits to the computer equipment, a retest selects a target mother layout from a plurality of photoelectric plate mother board drawings according to requirements during operation, and displays a defect diagram according to a set preview mode. The preview mode is to fully consider the display quantity problem because the size of the photo panel is large, and the line scan camera is 1:1 scanning and inputting, the defect points may be more, and the palace lattice display is needed through the preview image, so that the review by a retest is facilitated.
In consideration of the difference of the number of the defect graphs of different photoelectric plates, the application sets the number and the size of the preview graphs displayed in different preview modes, thereby facilitating the retest to select the preview mode according to the number of the actual defect points and improving the retest efficiency. In particular, in order to improve the visual effect, the size of the defect map in the preview mode should be uniform, and the target size and the display number of the defect map in the target preview mode are inversely related. The size of the display interface is fixed, and when the number of defect maps displayed in this mode is large, the size of the defect map is relatively small, and vice versa.
When the retest selects the target preview mode, a plurality of previewed defect maps are displayed in the preview display area 320. Each defect map is a defect point or flaw on the target mother layout. And when the number of the actual defect graphs exceeds the number of the interface displays, setting a multi-page display, namely setting a selection control 330 at the bottom of the preview display area 320, and skipping to the corresponding page to refer to all the defect graphs through the selection control 330.
And step 103, in response to receiving the selection operation of the target defect map in the preview display area, displaying the original defect map corresponding to the target defect map in the preview display area.
The previewed defect map can improve the retest efficiency of the retest to a certain extent, but is inconvenient for the retest to directly check when the defect points are fine or the displayed defect map is relatively small in size. Based on the above, the application also provides a directional picture amplifying operation, the computer receives the selection operation of the retest on the target defect picture in the preview display area, and the original defect picture corresponding to the selected target defect picture is continuously superimposed on the page on the basis of displaying the preview picture in the preview display area. The original defect map is 1 obtained by matting from the target mother layout: 1, and the target defect map is actually a preview map formed after size scaling according to the selected target preview mode. Particularly, when the preview image is smaller in size and the defect point content is inconvenient to display, the original defect image can be popped up through the method, the detail information of the defect point is obtained, and the false detection rate is reduced.
As shown in fig. 4, when the rechecker selects one of the target defect maps, a mask layer 430 is generated in the preview display area 420, and an original defect map 440 corresponding to the target defect map is displayed on the mask layer 430, and details of the photovoltaic panel and the marked defect point information are displayed in the original defect map 440.
In summary, the defect preview interface is set for the photoelectric plate review, and is divided into two columns of the panoramic display area and the preview display area, the panoramic mother layout of the photoelectric plate is displayed in the panoramic display area, the defect map identified and scratched in the mother layout is displayed in the preview display area, and defect labeling is carried out in the defect map, so that review by a review worker is facilitated. In order to improve the rechecking efficiency, by selecting different preview modes, defect graphs with different numbers and sizes can be displayed in the preview display area, so that the rechecking is convenient for a rechecker to recheck quickly. And for the fine defects, according to the target defect map selected by the rechecker, the original defect map is called in the preview display area to be displayed, so that the display effect of image amplification is realized, and the detail information of the defect points is directly read through the original defect map, so that the false detection rate can be greatly reduced.
In some embodiments, because the rechecking inspection of the photovoltaic panel requires database storage, the database of the present application stores the photovoltaic panel mother layout and defect map in association, and one photovoltaic panel corresponds to one defect set, each defect set storing all defect maps identified and intercepted in the mother layout. Correspondingly, displaying the photoelectric plate batch type corresponding to the target master pattern in the panoramic display area. And when the computer equipment receives the preview instruction, selecting a target defect set from the database according to the batch type of the photoelectric plate.
Although each defect map is marked with a defect point, the machine-identified defect type is required to be rechecked, so that text display is also required for recheck checking. For this function, in the image recognition stage, for a defect map in which defects have been recognized, a corresponding defect label is generated and implanted therein. The defect label at least comprises a photoelectric plate number, a defect number and a defect type. Wherein the defect labels and defect points are in one-to-one correspondence. And synchronously displaying the text contents of the labels when the preview image is generated.
The application divides the preview display into n-level preview modes, namely a first-level preview mode and a second-level preview mode from the first level preview mode to the nth level preview mode. In the first-stage preview mode, the higher the preview level, the more defect maps are displayed, and the smaller the image size.
In one possible implementation manner, the preview display area displays defect preview images in a grid, wherein the defect preview images comprise n-level preview modes, the number of defect images displayed in the grid in the i+1th level preview mode is larger than the number of defect images displayed in the grid in the i-level preview mode, and the image size of the defect images is smaller than the image size in the i-1th level preview mode; where i is a positive integer not exceeding n.
The application is illustrated with a 4-level preview mode, and the defect map is displayed in a grid mode. In fig. 3, a photoelectric board selection control 310 is disposed in the panoramic display area, and in response to receiving a trigger operation on the photoelectric board selection control 312, a photoelectric board mother layout with a corresponding number is selected from the database, and corresponding photoelectric board information is displayed. The target photoelectric plate mother layout corresponds to the target defect set one by one. A mode preview control 322 is arranged in the preview display area, and a defect map is displayed according to a corresponding target preview mode and a corresponding target mother layout after receiving the triggering operation of the mode preview control 322.
When the retest selects the first-stage preview mode, displaying the defect map in a two-grid mode, namely displaying the defect map in a one-row two-column mode in a preview display area;
when the retest selects the second-stage preview mode, displaying the defect map in a three-grid mode, namely displaying the defect map in a one-row two-column mode in a preview display area;
when the retest selects the third-level preview mode, displaying the defect map in a six-grid mode, namely displaying the defect map in a form of two rows and three columns in a preview display area;
when the retest selects the fourth-level preview mode, the defect map is displayed in eight-grid form, namely the preview display area displays the defect map in two rows and four columns.
Referring to fig. 5 and 6, there are shown interface diagrams showing defect maps in two boxes and eight boxes, respectively, in which specific defects and text contents of defect labels are displayed. Two defects in fig. 5 are "ink foreign matter white", and two defects in fig. 6 are "ink foreign matter white" and "gold surface contamination". In consideration of the effect of amplifying the selected target defect map, the image size of the target defect map selected and displayed in the i+1st-stage preview mode is the same as the image size of the defect map displayed in the grid in the i-th-stage preview mode. That is, in the 3 rd level preview mode, the popup window displays the selected defect original image in accordance with the defect image in the 2 nd level mode after the picture is selected, and other levels are similar.
In addition, in order to make the graphic display equal in scale and avoid the illusion from influencing the judgment, when the original image is displayed in the preview display area, an image control is also displayed, and as shown in fig. 7, in response to receiving a selection operation of the image control 710, the original image is scaled or rotated. When the zoom-in operation is clicked, the image is zoomed in to the size of the defect map of the previous stage, that is, after the original defect map (the size is consistent with the size of the defect map in the 2 nd stage) is displayed in the 3 rd stage preview mode, the size of the defect map in the 1 st stage mode is consistent with the size of the defect map in the 1 st stage.
It should be noted that the original defect map is not necessarily larger than the corresponding defect preview map in size, because it is 1:1, the preview image in the two-grid mode may be the effect of the original defect image after being amplified, and the actual effect depends on the size of the defect point.
In general, the two-stage reference mode can greatly improve the working efficiency of a rechecker, can directly confirm the rechecker under the condition that the defect points can be clearly referred to, can acquire an original defect map when the content cannot be directly seen, gradually enlarges or reduces the size of the defect image through a control, acquires defect detail information from the defect image, and reduces the error rate to the minimum while improving the efficiency.
Fig. 8 is a schematic structural diagram of a preview display device for a defect map of an optical panel according to an embodiment of the present application, where the device includes:
a first display module 810, configured to display a defect preview interface, where the defect preview interface includes a panoramic display area and a preview display area; displaying a photoelectric plate master plate image in the panoramic display area, and displaying defect images of a plurality of photoelectric plates in the preview display area;
a second display module 820, configured to determine, in response to receiving a preview instruction of a defect map, a preview mode corresponding to the preview instruction and a target mother layout, obtain a defect set from a database, and display defect maps of a target number and a target size in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantity and sizes;
a third display module 830, configured to display, in response to receiving a selection operation of a target defect map in the preview display area, an original defect map corresponding to the target defect map in the preview display area; the original defect map is an original image identified and intercepted from the photoelectric plate mother layout, and the target defect map is a preview map subjected to size scaling according to a target preview mode.
In addition, the application also provides a computer device, which comprises a processor and a memory, wherein at least one instruction, at least one section of program, code set or instruction set is stored in the memory, and the at least one instruction, the at least one section of program, the code set or instruction set is loaded and executed by the processor to realize the electro-optical plate defect map preview display method in the aspect.
In addition, the application also provides a computer readable storage medium, wherein at least one instruction, at least one section of program, code set or instruction set is stored in the readable storage medium, and the at least one instruction, the at least one section of program, the code set or instruction set is loaded and executed by a processor to realize the photovoltaic panel defect map preview display method in the aspect.
The device for previewing and displaying the defect map of the photovoltaic panel provided by the embodiment of the application can be applied to the method for previewing and displaying the defect map of the photovoltaic panel provided by the embodiment of the application, and related details refer to the embodiment of the method, so that the implementation principle and the technical effect are similar, and are not repeated herein.
It should be noted that, when the electro-optical panel defect map preview display apparatus provided in the embodiment of the present application performs the caliper operation, only the division of the above functional modules/functional units is used as an example, and in practical application, the above functional allocation may be performed by different functional modules/functional units according to needs, that is, the internal structure of the electro-optical panel defect map preview display apparatus is divided into different functional modules/functional units, so as to complete all or part of the functions described above. In addition, the implementation manners of the method for previewing and displaying the photovoltaic panel defect map provided by the above-mentioned method embodiment and the implementation manner of the photovoltaic panel defect map previewing and displaying device provided by the present embodiment belong to the same concept, and the specific implementation process of the photovoltaic panel defect map previewing and displaying device provided by the present embodiment is detailed in the above-mentioned method embodiment, and will not be repeated here.
Fig. 9 shows a block diagram of a computer device according to an exemplary embodiment of the present application. Is a computer device such as a desktop computer, a notebook computer, a palm computer, a cloud server, and the like. The computer device may include, but is not limited to, a processor and a memory. Wherein the processor and the memory may be connected by a bus or other means. The processor may be a central processing unit (Central Processing Unit, CPU). The processor may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), field programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, graphics processors (Graphics Processing Unit, GPU), embedded Neural network processors (Neural-network Processing Unit, NPU) or other specialized deep learning coprocessors, discrete gate or transistor logic devices, discrete hardware components, or a combination of the above.
The processor may include one or more processing cores, such as a 4-core processor, an 8-core processor, and the like. The processor may be implemented in at least one hardware form of DSP (Digital Signal Processing ), FPGA (Field-Programmable Gate Array, field programmable gate array), PLA (Programmable Logic Array ). The processor 1701 may also include a main processor and a coprocessor, the main processor being a processor for processing data in an awake state, also referred to as a CPU (Central Processing Unit ); a coprocessor is a low-power processor for processing data in a standby state. In some embodiments, the processor may be integrated with a GPU (Graphics Processing Unit, image processor) for taking care of rendering and rendering of the content that the display screen is required to display. In some embodiments, the processor may also include an AI (Artificial Intelligence ) processor for processing computing operations related to machine learning.
The memory is used as a non-transitory computer readable storage medium for storing non-transitory software programs, non-transitory computer executable programs, and modules, such as program instructions/modules corresponding to the methods in the above embodiments of the present application. The processor executes various functional applications of the processor and data processing, i.e., implements the methods of the method embodiments described above, by running non-transitory software programs, instructions, and modules stored in memory. The memory may include a memory program area and a memory data area, wherein the memory program area may store an operating system, at least one application program required for a function; the storage data area may store data created by the processor, etc. In addition, the memory may include high-speed random access memory, and may also include non-transitory memory, such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid state storage device. In some implementations, the memory optionally includes memory remotely located relative to the processor, the remote memory being connectable to the processor through a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
In some embodiments, the computer device may further optionally include: a peripheral interface and at least one peripheral. The processor, memory, and peripheral interfaces may be connected by buses or signal lines. The individual peripheral devices may be connected to the peripheral device interface via buses, signal lines or circuit boards. Specifically, the peripheral device includes: at least one of a radio frequency circuit, a display screen and a keyboard.
The peripheral interface may be used to connect at least one Input/Output (I/O) related peripheral to the processor and the memory. In some embodiments, the processor, memory, and peripheral interfaces are integrated on the same chip or circuit board; in some other embodiments, either or both of the processor, memory, and peripheral interface may be implemented on separate chips or circuit boards, which is not limiting in this embodiment.
The display screen is used to display a UI (User Interface). The UI may include graphics, text, icons, video, and any combination thereof. When the display is a touch display, the display also has the ability to collect touch signals at or above the surface of the display. The touch signal may be input to the processor for processing as a control signal. At this time, the display screen may also be used to provide virtual buttons and/or virtual keyboards, also referred to as soft buttons and/or soft keyboards. In some embodiments, the display screen may be one, disposed on the front panel of the computer device; in other embodiments, the display screen may be at least two, respectively disposed on different surfaces of the computer device or in a folded design; in other embodiments, the display may be a flexible display disposed on a curved surface or a folded surface of the computer device. Even more, the display screen may be arranged in a non-rectangular irregular pattern, i.e. a shaped screen. The display screen may be made of LCD (Liquid Crystal Display ), OLED (Organic Light-Emitting Diode) or other materials.
The power supply is used to power the various components in the computer device. The power source may be alternating current, direct current, disposable or rechargeable. When the power source comprises a rechargeable battery, the rechargeable battery may be a wired rechargeable battery or a wireless rechargeable battery. The wired rechargeable battery is a battery charged through a wired line, and the wireless rechargeable battery is a battery charged through a wireless coil. The rechargeable battery may also be used to support fast charge technology.
Those skilled in the art will appreciate that the architecture shown in fig. 9 is not limiting of the computer device and may include more or fewer components than shown, or may combine certain components, or employ a different arrangement of components.
The embodiment of the application also discloses a computer readable storage medium. In particular, a computer readable storage medium is used for storing a computer program which, when executed by a processor, implements the method of the above-described method embodiments. It will be appreciated by those skilled in the art that implementing all or part of the above-described methods according to the present application may be implemented by a computer program for instructing relevant hardware, and the program may be stored in a computer readable storage medium, and the program may include the steps of the above-described embodiments of the methods when executed. Wherein the storage medium may be a magnetic Disk, an optical Disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a Flash Memory (Flash Memory), a Hard Disk (HDD), or a Solid State Drive (SSD); the storage medium may also comprise a combination of memories of the kind described above.
The present embodiment is only for explanation of the present application and is not to be construed as limiting the present application, and modifications to the present embodiment, which may not creatively contribute to the present application as required by those skilled in the art after reading the present specification, are all protected by patent laws within the scope of claims of the present application.
Claims (10)
1. The method for previewing and displaying the defect map of the photoelectric plate is characterized by comprising the following steps of:
displaying a defect preview interface, wherein the defect preview interface comprises a panoramic display area and a preview display area; displaying a photoelectric plate master plate image in the panoramic display area, and displaying defect images of a plurality of photoelectric plates in the preview display area;
responding to a preview instruction of a received defect map, determining a preview mode corresponding to the preview instruction and a target mother layout to obtain a defect set from a database, and displaying defect maps of target quantity and target size in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantity and sizes;
in response to receiving a selection operation of a target defect map in the preview display area, displaying an original defect map corresponding to the target defect map in the preview display area; the original defect map is an original image identified and intercepted from the photoelectric plate mother layout, and the target defect map is a preview map subjected to size scaling according to a target preview mode.
2. The method of claim 1, wherein the panoramic display area further displays a photovoltaic panel lot model corresponding to the target mother layout; responding to the receiving of the preview instruction, and selecting a target defect set from the database according to the batch type of the photoelectric plate; and the target defect set comprises all defect graphs identified and intercepted in the target mother layout.
3. The method according to claim 2, wherein a defect label is built in the defect map, and the defect label at least comprises an electro-optical plate number, a defect number and a defect type; the defect labels are in one-to-one correspondence with the defect points.
4. A method according to claim 3, wherein the preview display area displays defect preview images in a grid, including an n-level preview mode, the number of defect images displayed in the grid in the i+1th level preview mode being greater than the number of defect images displayed in the grid in the i-level preview mode, and the image size of the defect images being smaller than the image size in the i-1 th level preview mode; where i is a positive integer not exceeding n.
5. The method of claim 4, wherein a mode preview control is provided in the preview display area, and in response to receiving a trigger operation for the mode preview control, a defect map is displayed according to a corresponding target preview mode and a target mother layout;
the panorama display area is provided with a photoelectric board selection control, and a photoelectric board mother layout with a corresponding number is selected from the database in response to receiving triggering operation of the photoelectric board selection control; the target photoelectric plate mother layout corresponds to the target defect set one by one.
6. The method according to claim 4, wherein the image size after the target defect map is selected and the original image is displayed in the i+1th-stage preview mode is the same as the image size of the defect map displayed in the grid in the i-stage preview mode;
and when the original image is displayed in the preview display area, an image control is also displayed, and the original image is scaled or rotationally adjusted in response to receiving a selection operation of the image control.
7. A method according to claim 3, wherein defect areas are marked in the defect map and when the defect map is displayed in the preview display area, defect labels in the defect map are read and displayed in boxes.
8. An electro-optical panel defect map preview display apparatus, the apparatus comprising:
the first display module is used for displaying a defect preview interface, wherein the defect preview interface comprises a panoramic display area and a preview display area; displaying a photoelectric plate master plate image in the panoramic display area, and displaying defect images of a plurality of photoelectric plates in the preview display area;
the second display module is used for responding to the received preview instruction of the defect map, determining a preview mode corresponding to the preview instruction and a target mother domain to obtain a defect set from a database, and displaying defect maps of target quantity and target size in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantity and sizes;
the third display module is used for responding to the receiving of the selection operation of the target defect map in the preview display area and displaying an original defect map corresponding to the target defect map in the preview display area; the original defect map is an original image identified and intercepted from the photoelectric plate mother layout, and the target defect map is a preview map subjected to size scaling according to a target preview mode.
9. A computer device, characterized in that it comprises a processor and a memory, in which at least one instruction, at least one program, a set of codes or a set of instructions is stored, which is loaded and executed by the processor to implement the electro-optical plate defect map preview display method according to any one of claims 1 to 7.
10. A computer readable storage medium having stored therein at least one instruction, at least one program, a set of codes, or a set of instructions, the at least one instruction, the at least one program, the set of codes, or the set of instructions being loaded and executed by a processor to implement the electro-optic plate defect map preview display method of any one of claims 1 to 7.
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