CN116881063A - Test system and test method for storage unit of electronic product - Google Patents
Test system and test method for storage unit of electronic product Download PDFInfo
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- CN116881063A CN116881063A CN202311140061.3A CN202311140061A CN116881063A CN 116881063 A CN116881063 A CN 116881063A CN 202311140061 A CN202311140061 A CN 202311140061A CN 116881063 A CN116881063 A CN 116881063A
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- 238000012360 testing method Methods 0.000 title claims abstract description 279
- 238000010998 test method Methods 0.000 title abstract description 8
- 238000004891 communication Methods 0.000 claims abstract description 54
- 238000000034 method Methods 0.000 claims abstract description 23
- 230000015654 memory Effects 0.000 claims description 37
- 230000008569 process Effects 0.000 claims description 11
- 238000012545 processing Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000007619 statistical method Methods 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Abstract
The invention provides a test system and a test method for a storage unit of an electronic product, comprising the following steps: at least one integrated sub-board for communication connection with different electronic products to be tested; the server is used for being in communication connection with the integrated daughter board so as to supply power to the electronic product to be tested, and building a corresponding test environment according to the type of the electronic product to be tested; the server is further configured to select a corresponding system image file to burn according to the test environment, generate a test file, and send the test file to the corresponding electronic product to be tested for testing, so as to generate a test result. According to the system and the method for testing the storage unit of the electronic product, provided by the invention, the testing efficiency can be improved.
Description
Technical Field
The present invention relates to the field of storage, and in particular, to a system and a method for testing a storage unit of an electronic product.
Background
Embedded memory (Embedded Multi Media Card, eMMC) and universal flash memory (Universal Flash Storage, UFS) are widely used in electronic products such as televisions, set-top boxes, tablet computers, and cell phones. eMMC is composed of an ARM CPU as a controller plus a Flash memory block (NAND Flash), where the ARM CPU runs controller software, commonly referred to as Firmware (Firmware).
Different embedded memories or general flash memories need to be adapted due to different types of processors corresponding to different electronic products. The existing test system has lower test efficiency when carrying out compatibility test on electronic products. Therefore, there is a need for improvement.
Disclosure of Invention
The invention aims to provide a test system and a test method for a storage unit of an electronic product, so as to improve test efficiency.
In order to solve the technical problems, the invention is realized by the following technical scheme:
the invention provides a test system of a storage unit of an electronic product, which comprises:
at least one integrated sub-board for communication connection with different electronic products to be tested; and
the server is used for being in communication connection with the integrated daughter board so as to supply power to the electronic product to be tested, and building a corresponding test environment according to the type of the electronic product to be tested;
the server is further configured to select a corresponding system image file to burn according to the test environment, generate a test file, and send the test file to the corresponding electronic product to be tested for testing, so as to generate a test result.
In an embodiment of the present invention, the server is configured to select a compatibility test type of a corresponding configuration test according to a type of the electronic product to be tested, and build a corresponding test environment.
In an embodiment of the present invention, the server is further configured to connect to different electronic products to be tested in a communication manner through the integrated daughter board, and send different test files to the corresponding electronic products to be tested.
In an embodiment of the present invention, the server is further configured to test the electronic product to be tested according to the type and the test item of the electronic product to be tested.
In an embodiment of the present invention, the server is further configured to store the test result in a database, and display the test result.
The invention also provides a method for testing the storage unit of the electronic product, which comprises the following steps:
according to the type of the electronic product to be tested, the server builds a corresponding test environment;
the server side supplies power to the electronic product to be tested, and selects a corresponding system image file to burn according to the test environment to generate a test file;
the server side sends different test files to the corresponding electronic products to be tested;
and the electronic product to be tested is tested according to the corresponding test file so as to generate a corresponding test result.
In an embodiment of the present invention, the step of the server building a corresponding test environment according to the type of the electronic product to be tested includes:
according to the type of the electronic product to be tested, the server selects the compatibility test type of the corresponding configuration test;
and connecting the electronic product to be tested to the server in a communication way so as to build a corresponding test environment.
In an embodiment of the present invention, the step of sending, by the server, different test files to the corresponding electronic products to be tested includes:
responding to the communication instruction of the server side, and judging whether the electronic product to be tested is in communication connection with the server side or not;
when the electronic product to be tested is in communication connection with the server, the server sends different test files to the corresponding electronic product to be tested;
when the electronic product to be tested is not in communication connection with the server, the server repeatedly sends out a communication instruction until the connection times reach the preset times, and when the electronic product to be tested is still not in communication connection with the server, the server sends out a connection failure warning.
In an embodiment of the present invention, the step of testing the electronic product to be tested according to the corresponding test file to generate a corresponding test result includes:
the server side sends a corresponding test instruction to the electronic product to be tested according to the type and the test item of the electronic product to be tested;
and responding to the test instruction, testing the electronic product to be tested according to the test file, and generating a corresponding test result in real time.
In an embodiment of the present invention, the server determines whether the test procedure is successfully completed;
when the test flow is successfully finished, the test result is stored in a database of the server;
stopping testing when the testing process has problems, and sending an early warning notice by the server;
analyzing the early warning notice, generating a test failure record, and storing the test failure record in a database of the server.
As described above, the system and the method for testing the storage unit of the electronic product can test the compatibility of different types of electronic products at the same time, and can effectively improve the testing efficiency. Meanwhile, in the testing process, the testing progress can be displayed in real time, and further the testing result can be conveniently analyzed.
Of course, it is not necessary for any one product to practice the invention to achieve all of the advantages set forth above at the same time.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a testing system for a memory cell of an electronic product according to an embodiment of the invention;
FIG. 2 is a schematic diagram of an integrated daughter board according to an embodiment of the invention;
FIG. 3 is a diagram of a user interface according to an embodiment of the invention;
FIG. 4 is a flowchart of a method for testing a memory cell of an electronic product according to an embodiment of the invention;
FIG. 5 is a flowchart of step S10 in FIG. 4;
FIG. 6 is a flowchart of step S30 in FIG. 4;
FIG. 7 is a flowchart of step S40 in FIG. 4;
fig. 8 is a flowchart of step S42 in fig. 7.
In the figure: 10. an electronic product to be tested; 20. an integrated sub-board; 21. an integrated circuit board; 22. a central processing unit; 23. a memory; 24. a communication interface; 25. a relay; 26. a control switch; 30. a server; 40. a user interface.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1, the present invention provides a system for testing a memory unit of an electronic product, which can be used for testing different electronic products. For example, a cell Phone (Phone), a Television (TV), a set top box (OTT), a tablet computer (PAD), etc. may be tested. When testing an electronic product, the test items may include a storage test and a memory test. The storage test may be a test of flash memory such as embedded memory (Embedded Multi Media Card, EMMC) and universal flash memory (Universal Flash Storage, UFS) in an electronic product. The memory test may be to test a Double Data Rate synchronous dynamic random access memory (DDR SDRAM) in an electronic product, a low power consumption dual Data Rate synchronous dynamic random access memory (Low Power Double Data Rate SDRAM, LPDDR SDRAM), and other random access memories. The test system may include an integrated daughter board 20 and a server 30.
In one embodiment of the present invention, the electronic product 10 to be tested may be an electronic product to be tested. The types of the electronic products 10 to be tested may be plural, and the number of the electronic products 10 to be tested of the same type may be plural. Since different types of electronic products 10 to be tested need to be connected to different integrated daughter boards 20. Thus, the number of integrated sub-boards 20 may be at least one. A single integrated daughter board 20 may have multiple electronic products 10 of the same type attached thereto. For example, when 8 handsets, 6 televisions, 4 set-top boxes, and 10 tablet computers need to be tested simultaneously by the test system, the number of integrated sub-boards 20 may be set to 4. The handset may be connected to a first integrated daughter board 20. The television may be connected to a second integrated daughter board 20. The set-top box may be connected to a third integrated daughter board 20. The tablet computer may be connected to the fourth integrated sub-board 20. The electronic products 10 to be tested of different types are connected through the different integrated sub-boards 20, so that the subsequent test can be conveniently finished.
Referring to fig. 2, in one embodiment of the present invention, the integrated sub-board 20 may include an integrated circuit board 21, a Central Processing Unit (CPU) 22, a memory (DRAM) 23, a communication interface 24, a relay 25, a control switch 26, and the like. The integrated daughter board 20 may be communicatively connected to the electronic product 10 to be tested through a certain communication interface 24. The integrated sub-board 20 may be communicatively coupled to the server 30 via another communication interface 24. The server 30 may be a server, a host, etc., and a database may be configured in the server 30. The central processing unit 22 can realize the real-time and effective information transfer station function, namely, receives the instruction sent by the server 30 through the communication interface 24 for the uplink, decodes the received instruction for the downlink and distributes the decoded instruction to the corresponding electronic product 10 to be tested. The communication interface 24 may include, but is not limited to, a universal serial bus interface (Universal Serial Bus, USB), a universal asynchronous receiver/Transmitter interface (Universal Asynchronous Receiver/Transmitter, UART), and the like. A relay 25 can be further connected between the integrated daughter board 20 and the electronic product 10 to be tested, and the central processing unit 22 on the integrated circuit board 21 can control the power supply of the electronic product 10 to be tested by controlling the on and off of the control switch 26. Specifically, the integrated daughter board 20 may be configured to respond to the test instruction of the server 30 to control the on/off of the control switch 26, and further control the power supply of the electronic product 10 to be tested, so as to realize the test of the power-down requirement of the electronic product 10 to be tested. When different electronic products 10 to be tested are required to be tested, the different electronic products 10 to be tested can be connected to the corresponding integrated sub-boards 20 in a communication manner, and all the integrated sub-boards 20 are connected to the server 30 in a communication manner. At this time, the server 30 may control the power supply of the electronic product 10 to be tested by controlling the on/off of the control switch 26 in the integrated sub-board 20.
Referring to fig. 3, in an embodiment of the present invention, the server 30 may build a corresponding testing environment according to the type of the electronic product 10 to be tested. Further, the server 30 may select a compatibility test type of the corresponding configuration test according to the type of the electronic product to be tested. Meanwhile, the electronic product 10 to be tested is connected to the server 30 through the corresponding integrated sub-board 20 in a communication manner, so as to build a corresponding test environment. Specifically, the server 30 may be configured with a User Interface 40 (UI), and the compatibility test type of the corresponding configuration test may be selected through the User Interface 40. For example, when a storage test is required for a portion of the electronic products 10 to be tested, a storage-related test type (eMMC/UFS, etc.) may be selected on the user interface 40. When it is desired to perform a memory test on another portion of the electronic products 10 under test, a memory-related test type (DDR/LPDDR, etc.) may be selected on the user interface 40. After the user interface 40 is configured with the compatibility test type, the electronic product 10 to be tested can be communicatively connected to the integrated sub-board 20 through one communication interface 24, and the integrated sub-board 20 can be communicatively connected to the server 30 through another communication interface 24. At this time, the server 30 can be connected with different electronic products 10 to be tested in a communication manner, so as to build corresponding testing environments. The user interface 40 may display different test progress and test status of the electronic product 10 to be tested. For example, DUT-UI-1 may be represented as electronic product under test 10 numbered 1 on first integrated daughter board 20.
In one embodiment of the present invention, the server 30 is configured to select a corresponding system image file for burning according to the test environment, so as to generate a test file. Specifically, after the test environment is built, the server 30 may select a corresponding system Image file (SOC Image) in the integrated sub-board 20 for burning according to the above-mentioned compatibility test type, so as to generate a test file. The test files may include a memory test file and a storage test file. The memory test file may be used to test the electronic product 10 to be tested that needs to be tested for memory. The storage test file may be used to test the electronic product under test 10 that requires storage testing.
In one embodiment of the present invention, after the test file is generated, the server 30 needs to determine whether the electronic product 10 to be tested is in communication with the server 30. Specifically, after the test file is generated, the server 30 may issue a communication command. After receiving the communication command, the different integrated sub-boards 20 need to determine whether the electronic product 10 to be tested is successfully connected with the server 30. When the electronic product 10 to be tested is in communication connection with the server 30, the server 30 can control different integrated sub-boards 20 to send the test file to the corresponding electronic product 10 to be tested to complete the test. When a connection between a certain electronic product 10 to be tested and the server 30 fails, the server 30 can repeatedly send a communication command to the corresponding integrated sub-board 20 and control the integrated sub-board 20 to connect with the electronic product 10 to be tested with failed connection again. When the number of reconnections between the integrated sub-board 20 and the electronic product 10 to be tested that fails in connection reaches the preset number, the server 30 may issue a connection failure warning when the electronic product 10 to be tested fails in connection with the server 30. The preset times can be set according to actual requirements, for example, 3 times, 4 times, 5 times, and the like. When the server 30 sends out a connection failure warning, specific information of the electronic product 10 to be tested with the connection failure can be displayed on the user interface 40 of the server 30, so that the circuit and the like can be checked and repaired later.
In an embodiment of the present invention, after the electronic product 10 to be tested is communicatively connected to the server 30, the server 30 may control the integrated sub-board 20 to send the test file to the corresponding electronic product 10 to be tested for testing, so as to generate a test result. Specifically, the server 30 may send a corresponding test instruction to the electronic product 10 to be tested according to the type and the test item of the electronic product 10 to be tested. The electronic product 10 to be tested can respond to the test instruction, test according to the test file, and generate a corresponding test result in real time. Wherein the types and test items of different electronic products 10 to be tested may be different. For example, for a cell phone, it only needs to perform a storage test. For televisions, it is only necessary to perform a memory test. For tablet computers, it is necessary to perform storage test and memory test simultaneously. Therefore, the different electronic products 10 to be tested can be arranged in the test priority order according to the type and test items of the electronic products 10 to be tested, so as to improve the test efficiency. In this embodiment, the electronic product 10 to be tested that needs to be tested for the memory may be tested first, and then the electronic product 10 to be tested that needs to be tested for the storage may be tested. During the testing process, the electronic product 10 to be tested can feed back the testing result in real time. The test result can be transmitted to the server 30 through the integrated sub-board 20 in real time, and displayed on the user interface 40 of the server 30 in real time, so as to monitor the test progress and the test state of the electronic product 10 to be tested in real time.
In one embodiment of the present invention, during the testing process of the electronic product 10 to be tested, problems may occur in the corresponding testing process due to problems in the embedded memory and/or the general flash memory in the electronic product 10 to be tested. Therefore, the server 30 can monitor all the electronic products 10 to be tested in real time to determine whether the testing process of the electronic products 10 to be tested is successfully finished. When the test flow is successfully finished, the test result can be transmitted to the server 30 through the integrated sub-board 20, and stored in the database of the server 30. When a problem occurs in the testing process of a certain electronic product 10 to be tested, the electronic product 10 to be tested can stop testing, and at this time, the server 30 can send out a corresponding early warning notification to display specific information of the electronic product 10 to be tested with the problem on the user interface 40. Meanwhile, the early warning notification may be analyzed to generate a test failure record, and the test failure record may be stored in the database of the server 30. The test result and the test failure record may be stored in a database of the server 30, so that the following traceability, statistical analysis, etc. can be performed.
Referring to fig. 4, the present invention further provides a method for testing a storage unit of an electronic product, where the method can be applied to the above-mentioned testing system to test different electronic products. The test method corresponds to the test system in the embodiment one by one, and the test method can comprise the following steps:
step S10, building a corresponding test environment by a server according to the type of the electronic product to be tested;
step S20, the server supplies power to the electronic product to be tested, and according to the test environment, the corresponding system image file is selected for burning, and a test file is generated;
step S30, the server sends different test files to the corresponding electronic products to be tested;
and S40, testing the electronic product to be tested according to the corresponding test file to generate a corresponding test result.
Referring to fig. 5, in one embodiment of the present invention, when step S10 is performed, specifically, step S10 may include the following steps:
step S11, selecting a compatibility test type of a corresponding configuration test according to the type of the electronic product to be tested;
step S12, the electronic product to be tested is connected to the server in a communication mode so as to build a corresponding testing environment.
In one embodiment of the present invention, when executing step S11 and step S12, specifically, the server 30 may be configured with a User Interface 40 (UI), and the compatibility test type of the corresponding configuration test may be selected through the User Interface 40. For example, when a storage test is required for a portion of the electronic products 10 to be tested, a storage-related test type (eMMC/UFS, etc.) may be selected on the user interface 40. When it is desired to perform a memory test on another portion of the electronic products 10 under test, a memory-related test type (DDR/LPDDR, etc.) may be selected on the user interface 40. After the user interface 40 selects the compatibility test type, the electronic product 10 to be tested can be communicatively connected to the integrated sub-board 20 through one communication interface 24, and the integrated sub-board 20 can be communicatively connected to the server 30 through another communication interface 24. At this time, the server 30 can be connected with different electronic products 10 to be tested in a communication manner, so as to build corresponding testing environments.
In an embodiment of the present invention, when step S20 is executed, specifically, after the test environment is built, the server 30 may select, according to the above-mentioned compatibility test type, a corresponding system Image file (SOC Image) in the integrated sub-board 20 for burning, so as to generate a test file. The test files may include a memory test file and a storage test file. The memory test file may be used to test the electronic product 10 to be tested that needs to be tested for memory. The storage test file may be used to test the electronic product under test 10 that requires storage testing.
Referring to fig. 6, in one embodiment of the present invention, when step S30 is performed, specifically, step S30 may include the following steps:
step S31, responding to a communication instruction of the server, and judging whether the server is in communication connection with the electronic product to be tested;
step S32, when the electronic product to be tested is in communication connection with the server, the server sends different test files to the corresponding electronic product to be tested;
step S33, when the electronic product to be tested is not in communication connection with the server, the server repeatedly sends a communication instruction to the electronic product to be tested until the connection times reach the preset times, and when the electronic product to be tested is still not in communication connection with the server, the server sends out a connection failure warning.
In one embodiment of the present invention, when executing step S31, step S32 and step S33, specifically, after generating the test file, the server 30 may issue a communication command. After receiving the communication command, the different integrated sub-boards 20 need to determine whether the electronic product 10 to be tested is successfully connected with the server 30. When the electronic product 10 to be tested is in communication connection with the server 30, the server 30 can control different integrated sub-boards 20 to send the test file to the corresponding electronic product 10 to be tested to complete the test. When a certain electronic product 10 to be tested is not in communication with the server 30, the server 30 can repeatedly send a communication command to the corresponding integrated sub-board 20 and control the integrated sub-board 20 to connect with the electronic product 10 to be tested with failed connection again. When the number of reconnections between the integrated sub-board 20 and the electronic product 10 to be tested that fails in connection reaches the preset number, the server 30 may issue a connection failure warning when the electronic product 10 to be tested fails in connection with the server 30.
Referring to fig. 7, in one embodiment of the present invention, when step S40 is performed, specifically, step S40 may include the following steps:
step S41, the server sends a corresponding test instruction to the electronic product to be tested according to the type and the test item of the electronic product to be tested;
and step S42, responding to the test instruction, testing the electronic product to be tested according to the test file, and generating a corresponding test result in real time.
In one embodiment of the present invention, when step S41 is performed, specifically, the types and test items of different electronic products 10 to be tested may be different. For example, for a cell phone, it only needs to perform a storage test. For televisions, it is only necessary to perform a memory test. For tablet computers, it is necessary to perform storage test and memory test simultaneously. Therefore, the different electronic products 10 to be tested can be arranged in the test priority order according to the type and test items of the electronic products 10 to be tested, so as to improve the test efficiency.
Referring to fig. 8, in one embodiment of the present invention, when step S42 is performed, specifically, step S42 may include the following steps:
step S421, responding to the test instruction, testing the electronic product to be tested according to the test file, and judging whether the test flow is finished smoothly by the server side;
step S422, when the test flow is successfully finished, the test result is stored in a database of the server;
step S423, stopping the test when the test flow has a problem, and sending an early warning notice by the server;
and step 424, analyzing the early warning notice, generating a test failure record, and storing the test failure record in a database of the server.
In one embodiment of the present invention, when executing step S421, step S422, step S423 and step S424, specifically, problems may occur in the embedded memory and/or the general flash memory in the electronic product 10 to be tested, resulting in problems in the corresponding test procedure. Therefore, the server 30 can monitor all the electronic products 10 to be tested in real time to determine whether the testing process of the electronic products 10 to be tested is successfully finished. When the test flow is successfully finished, the test result can be transmitted to the server 30 through the integrated sub-board 20, and stored in the database of the server 30. When a problem occurs in the testing process of a certain electronic product 10 to be tested, the electronic product 10 to be tested can stop testing, and at this time, the server 30 can send out a corresponding early warning notification to display specific information of the electronic product 10 to be tested with the problem on the user interface 40. Meanwhile, the early warning notification may be analyzed to generate a test failure record, and the test failure record may be stored in the database of the server 30. The test result and the test failure record may be stored in a database of the server 30, so that the following traceability, statistical analysis, etc. can be performed.
Therefore, in the scheme, compatibility tests can be carried out on different types of electronic products at the same time, and the test efficiency can be effectively improved. Meanwhile, in the testing process, the testing progress can be displayed in real time, and further the testing result can be conveniently analyzed.
The embodiments of the invention disclosed above are intended only to help illustrate the invention. The examples are not intended to be exhaustive or to limit the invention to the precise forms disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best understand and utilize the invention. The invention is limited only by the claims and the full scope and equivalents thereof.
Claims (10)
1. A system for testing a memory cell of an electronic product, comprising:
at least one integrated sub-board for communication connection with different electronic products to be tested; and
the server is used for being in communication connection with the integrated daughter board so as to supply power to the electronic product to be tested, and building a corresponding test environment according to the type of the electronic product to be tested;
the server is further configured to select a corresponding system image file to burn according to the test environment, generate a test file, and send the test file to the corresponding electronic product to be tested for testing, so as to generate a test result.
2. The system according to claim 1, wherein the server is configured to select a compatibility test type of a corresponding configuration test according to a type of the electronic product to be tested, and build the corresponding test environment.
3. The system according to claim 1, wherein the server is further configured to connect with different electronic products to be tested in a communication manner through the integrated sub-board, and send different test files to the corresponding electronic products to be tested.
4. The system according to claim 1, wherein the server is further configured to test the electronic product according to the type and the test item of the electronic product.
5. The system according to claim 1, wherein the server is further configured to store the test result in a database and display the test result.
6. A method for testing a memory cell of an electronic product, comprising:
according to the type of the electronic product to be tested, the server builds a corresponding test environment;
the server side supplies power to the electronic product to be tested, and selects a corresponding system image file to burn according to the test environment to generate a test file;
the server side sends different test files to the corresponding electronic products to be tested;
and the electronic product to be tested is tested according to the corresponding test file so as to generate a corresponding test result.
7. The method for testing a storage unit of an electronic product according to claim 6, wherein the step of the server building a corresponding testing environment according to the type of the electronic product to be tested comprises:
according to the type of the electronic product to be tested, the server selects the compatibility test type of the corresponding configuration test;
and connecting the electronic product to be tested to the server in a communication way so as to build a corresponding test environment.
8. The method according to claim 6, wherein the step of the server sending different test files to the corresponding electronic products to be tested includes:
responding to the communication instruction of the server side, and judging whether the electronic product to be tested is in communication connection with the server side or not;
when the electronic product to be tested is in communication connection with the server, the server sends different test files to the corresponding electronic product to be tested;
when the electronic product to be tested is not in communication connection with the server, the server repeatedly sends out a communication instruction until the connection times reach the preset times, and when the electronic product to be tested is still not in communication connection with the server, the server sends out a connection failure warning.
9. The method according to claim 6, wherein the step of testing the electronic product according to the corresponding test file to generate the corresponding test result comprises:
the server side sends a corresponding test instruction to the electronic product to be tested according to the type and the test item of the electronic product to be tested;
and responding to the test instruction, testing the electronic product to be tested according to the test file, and generating a corresponding test result in real time.
10. The method according to claim 9, wherein the step of responding to the test instruction, testing the electronic product to be tested according to the test file, and generating the corresponding test result in real time includes:
responding to the test instruction, testing the electronic product to be tested according to the test file, and judging whether the test flow is finished smoothly by the server side;
when the test flow is successfully finished, the test result is stored in a database of the server;
stopping testing when the testing process has problems, and sending an early warning notice by the server;
analyzing the early warning notice, generating a test failure record, and storing the test failure record in a database of the server.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
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