CN116881058A - Fuzzy test method for embedded equipment - Google Patents
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
Abstract
The application relates to the field of equipment testing, and discloses a fuzzy testing method of embedded equipment, which comprises the following steps: acquiring normal elements, variant elements and generated elements according to the content of the communication protocol; generating a first variation value set based on the requirement of a first variation element, generating a second variation value set based on the requirement of a second variation element, determining a combination set of variation elements based on the combination rules of the first variation value set, the second variation value set and the variation elements, obtaining corresponding generation elements based on the combination set of variation elements, normal elements and the rules of obtaining the generation elements, obtaining test cases based on the normal elements, the variation elements and the generation elements, and testing the test cases. The application can rapidly generate and test a large number of test cases, cover the combination of various normal and abnormal test data scenes, and find potential problems. The random data can be used for carrying out full test, so that accidental events with extremely low probability are increased, and the test is complete.
Description
Technical Field
The application relates to the field of equipment testing, in particular to a fuzzy testing method of embedded equipment.
Background
The embedded system is composed of hardware and software, and is a device capable of operating independently. The software content only comprises a software running environment and an operating system thereof. The hardware content includes various contents including a signal processor, a memory, a communication module, and the like. Compared with a common computer processing system, the embedded system has larger difference, and can not realize the large-capacity storage function, because no large-capacity medium matched with the embedded system exists, most of adopted storage media comprise E-PROM, EEPROM and the like, and the software part takes an API programming interface as the core of a development platform. The goal of embedded systems is to meet the specific needs of the user. For most of complete embedded systems, users can directly enjoy the functions by turning on the power supply, and secondary development or a small amount of configuration operation is not needed. Most of the applications of embedded systems have high requirements on reliability and real-time performance, which determines that the special system serving a specific application is a mainstream mode of the embedded system, and does not emphasize the universality and scalability of the system. This specificity also typically results in the embedded system being a final system with tightly integrated hardware and software, as this is more effective in improving overall system reliability and reducing costs and providing a better user experience. The most basic support technology of the embedded system mainly comprises integrated circuit design technology, system structure technology, sensing and detecting technology, embedded operation system and real-time operation system technology, high-reliability software development technology of a resource-limited system, system formal specification and verification technology, communication technology, low-power consumption technology, data analysis, signal processing and control optimization technology in specific application fields and the like, and the embedded system is formed by integrating the embedded system into specific special equipment around the basic principle of a computer. The embedded system brings great design index requirements (functional performance, reliability, cost and power consumption) for application scenes.
There are more and more embedded devices used in our lives and more embedded software is contacted. But testing of embedded devices is difficult to accomplish adequately. The embedded device/software has more and more complex functions, so that the third party components and the external libraries used in the software are more and more, all inputs cannot be used as test cases in the test, and all possible abnormal scenes cannot be exhausted.
Thus, a test method is needed to test embedded devices and software. Through an automatic use case generation technology and an automatic test technology, a large amount of abnormal test data which is easy to cause problems is automatically generated according to an embedded equipment interface protocol, and the test is completed through an automatic test method, so that the test coverage and the test strength of the tested software are enhanced.
Disclosure of Invention
The application aims to overcome one or more of the prior art problems and provide a fuzzy test method of embedded equipment.
In order to achieve the above object, the present application provides a fuzzy test method for an embedded device, including:
acquiring normal elements, variant elements and generated elements according to the content of the communication protocol;
generating a first variation value set based on the requirements of the first variation element;
generating a second set of variation values based on the requirements of the second variation element;
determining a combination set of variant elements based on the first variation value set, the second variation value set and a combination rule of variant elements;
obtaining corresponding generated elements based on the combination set of variant elements, normal elements and rules for obtaining the generated elements;
obtaining a test case based on the normal element, the variant element and the generated element;
the test is performed using the test case.
According to one aspect of the application, the combination rules of variant elements include single or multiple combinations.
According to one aspect of the application, the combination rule of the variant elements is to perform a combination test on variant data obtained by combining one or more variant elements.
According to one aspect of the present application, the variant elements have weights, the weights of which are the sum of the variant elements included when the variant elements are combined, and the weights of each variant element are updated after one test case is completed.
According to one aspect of the application, the weights of the variant element fields are adjusted according to the test coverage of the fields.
According to one aspect of the present application, after a test case passes, the weights of the variant element fields included in the test case are updated, and the weight adjustment policy of the fields is adjusted downward.
According to one aspect of the application, when a test case fails, the weights of the variant element fields contained in the test case are updated, and the weight adjustment strategy of the fields is up-regulated.
In order to achieve the above object, the present application provides a ambiguity test system for an embedded device, including:
element acquisition module: acquiring normal elements and variant elements according to the content of the communication protocol;
a combined set generating module: generating a first variation value set based on the requirements of the first variation element;
generating a second set of variation values based on the requirements of the second variation element;
determining a combination set of variant elements based on the first variation value set, the second variation value set and a combination rule of variant elements;
the generating element acquisition module: obtaining corresponding generated elements based on the combination set of variant elements, normal elements and rules for obtaining the generated elements;
test case acquisition module: obtaining a test case based on the normal element, the variant element and the corresponding generated element;
and the fuzzy test module is used for: the test is performed using the test case.
In order to achieve the above object, the present application provides an electronic device, including a processor, a memory, and a computer program stored in the memory and executable on the processor, where the computer program when executed by the processor implements the above-mentioned ambiguity test method for an embedded device.
To achieve the above object, the present application provides a computer readable storage medium having a computer program stored thereon, which when executed by a processor, implements the above-described fuzzy test method for an embedded device.
Based on the above, the application has the beneficial effects that:
(1) The method can be used for rapidly generating and testing a large number of test cases, and covering the combination of various normal and abnormal test data scenes, thereby finding potential problems. The random data can be used for carrying out full test, so that accidental events with extremely low probability are increased, and the test is complete.
(2) The setting of normal elements and generated elements ensures that the test cases can accord with corresponding protocol rules, thereby reaching the core part of the tested software. The scale of the test case can be flexibly adjusted by adjusting the generation rule and the combination rule of the variation elements, and balance points can be found in the execution time and the test effect; the weight and the adjustment rule thereof can dynamically adjust the variation direction, thereby achieving better test effect.
Drawings
FIG. 1 is a flow chart of a fuzzy test method of an embedded device of the present application;
FIG. 2 is a flow chart of a fuzzy test system for embedded devices of the present application.
Detailed Description
The present disclosure will now be discussed with reference to exemplary embodiments, it being understood that the embodiments discussed are merely for the purpose of enabling those of ordinary skill in the art to better understand and thus practice the present disclosure and do not imply any limitation to the scope of the present disclosure.
As used herein, the term "comprising" and variants thereof are to be interpreted as meaning "including but not limited to" open-ended terms. The terms "based on" and "based at least in part on" are to be construed as "at least one embodiment.
Fig. 1 is a schematic flow chart of a fuzzy testing method of an embedded device according to an embodiment of the present application, and as shown in fig. 1, the fuzzy testing method of an embedded device includes:
acquiring normal elements and variant elements according to the content of the communication protocol;
generating a first variation value set based on the requirements of the first variation element;
generating a second set of variation values based on the requirements of the second variation element;
determining a combination set of variant elements based on the first variation value set, the second variation value set and a combination rule of variant elements;
obtaining corresponding generated elements based on the combination set of variant elements, normal elements and rules for obtaining the generated elements;
obtaining a test case based on the normal element, the variant element and the generated element;
the test is performed using the test case.
According to one embodiment of the application, the combination rule of variant elements comprises single or multiple combinations.
According to one embodiment of the present application, the combination rule of the variant elements is to perform a combination test on variant data obtained by combining one or more variant elements.
According to one embodiment of the present application, the variant elements have weights, the weights of the variant elements are the sum of the variant elements included when the variant elements are combined, and the weights of each variant element are updated after one test case is completed.
According to one embodiment of the application, the weights of the variant element fields are adjusted according to the test coverage of the fields.
According to one embodiment of the present application, after a test case passes, the weights of the variant element fields included in the test case are updated, and the weight adjustment policy of the fields is adjusted downward.
According to one embodiment of the present application, when a test case fails, the weights of the variant element fields included in the test case are updated, and the weight adjustment policy of the fields is adjusted upwards.
According to one embodiment of the application, the communication protocol is a MODBUS protocol.
According to one embodiment of the application, a data frame for a test case includes a frame header, body data of the frame, and a frame trailer; the first few bits in the frame head are fixed, the frame tail comprises check codes and a plurality of values calculated according to the main body data of the frame, and fixed bytes, the main body of the frame, namely the data section, comprises useful test data, verification data are obtained after the test data are calculated through rules, and the verification data are written into the frame tail.
According to one embodiment of the application, the embedded device discards invalid data from the header and the trailer, e.g., header not pair or trailer check errors.
According to one embodiment of the application, some parameters in the frame are variable, these parameters are variant elements in the application, and the elements obtained from the numerical calculation of these variant elements are generated elements;
according to an embodiment of the present application, the numerical range outside the normal value range of the variant element is the range covered by the target test.
According to one embodiment of the application, the rules of the generated elements are fixed and determined according to the protocol, otherwise the verification cannot be passed.
According to one embodiment of the application, the number of variant elements is obtained from the number of variable field types in the protocol; if the number is relatively large, e.g. more than 10 fields, the time and period of the full test may be long, and the gap between the expected and actual test needs to be determined. For example, setting the target test number to 100w, an equal-scale test may be obtained according to the field number combination, for example, 2 fields at a time, to complete the test. Then 2 fields are tested each time, namely the tested combination rule; performing secondary combination on the fields obtained by combination and generating actual test data, namely generating rules of variant element combination; that is, the generation rule of the variant element combination includes a first variant element combination and a second variant element combination, a first variant element is obtained based on a field and a value corresponding to the first variant element combination, a second variant element is obtained based on a field and a value corresponding to the second variant element combination, a data set is obtained after the combination, for example, 30×10=300, a first variant element set with a size of 300 is obtained, for example, 20×10=200, and a second variant element set with a size of 200 is obtained; and taking values and mixing according to the proportion, splicing the values and the normal elements to obtain a data main body, calculating the data main body to obtain a generated element, and further obtaining the test case. The method is used for avoiding the fact that response offset of the embedded equipment is true when one type of element is simply tested, and normal elements comprise a frame head and a frame tail; the generation element includes a length of the communication frame or a check code. The combination of the plurality of test elements has weights which are arranged in reverse order according to the test coverage ratio, and the test is updated after the test is completed. When an element test meets the requirement, deleting the use case rule containing the variant element. The weight if the ratio is reduced. 0-2 frame head, 3-4 type, 5-6 length, 7-8 temperature data, numerical value, check bit, frame tail, frame head normal element, frame tail normal element, check element as generating element, variation element as data, character string, type, numerical value, coverage rate adjustment weight.
According to one embodiment of the present application, when a test is performed, the fields corresponding to variant elements are not all set to the values of the normal value range, but part of the elements are set to the abnormal values, and the other elements are set to the normal values. The normal values of other elements can be consistent values, and random values in the normal value range can also be taken. By the method, the problem of low coverage rate of the test sample caused by taking only a single point value can be avoided.
In accordance with one embodiment of the present application, assuming that the compiled element E= { a, b, c, d, E, F, g, h, i, j } is present, then when the combination can be set to 2, then the resulting set is F= { ab, ac, ad...ij } and then two combinations are arbitrarily removed from this set, which are used to generate the test dataset. When the combination is ac and ab, generating fields a and c with values of variation values based on the combination ac to obtain a series of variation elements; generating fields a and b with values of variation values based on the combination ab to obtain a series of variation elements; these elements are combined with normal elements, so that a set of test cases can be obtained, which can be used to test two sets of variant elements simultaneously.
According to one embodiment of the present application, the weights are understood herein to be of importance, e.g. all variant fields have an initial weight of 100, and after the test is passed, the new field weights are pn=pold×0.999, and when the combination is performed, the combination with the same weight is preferentially selected. Weights can be set in segments, for example, when the coverage ratio exceeds 10%, and when the corresponding field weight is calculated, corresponding reduction is performed, and the higher the coverage ratio is, the larger the weight reduction ratio is. So that variant fields of low coverage are preferentially tested. When a variant field test passes, the error probability is smaller to a certain extent, the importance coefficient is correspondingly reduced, and the higher the coverage ratio is, the larger the weight reduction ratio is. So that variant fields of low coverage are preferentially tested. When a variant field test fails, the error probability is larger to a certain extent, and the importance coefficient is correspondingly increased. For example, a field ab combination is erroneous, then the combination containing a and b will increase in weight on the next generation, so that the error-prone field is tested more.
Moreover, in order to achieve the above object, the present application further provides a fuzzy test system for an embedded device, and fig. 2 is a schematic structural diagram of a fuzzy test system for an embedded device according to the present application, as shown in fig. 2, where the fuzzy test system for an embedded device according to the present application includes:
element acquisition module: acquiring normal elements and variant elements according to the content of the communication protocol;
a combined set generating module: generating a first variation value set based on the requirements of the first variation element;
generating a second set of variation values based on the requirements of the second variation element;
determining a combination set of variant elements based on the first variation value set, the second variation value set and a combination rule of variant elements;
the generating element acquisition module: obtaining corresponding generated elements based on the combination set of variant elements, normal elements and rules for obtaining the generated elements;
test case acquisition module: obtaining a test case based on the normal element, the variant element and the corresponding generated element;
and the fuzzy test module is used for: the test is performed using the test case.
According to one embodiment of the application, the combination rule of variant elements comprises single or multiple combinations.
According to one embodiment of the present application, the combination rule of the variant elements is to perform a combination test on variant data obtained by combining one or more variant elements.
According to one embodiment of the present application, the variant elements have weights, the weights of the variant elements are the sum of the variant elements included when the variant elements are combined, and the weights of each variant element are updated after one test case is completed.
According to one embodiment of the application, the weights of the variant element fields are adjusted according to the test coverage of the fields.
According to one embodiment of the present application, after a test case passes, the weights of the variant element fields included in the test case are updated, and the weight adjustment policy of the fields is adjusted downward.
According to one embodiment of the present application, when a test case fails, the weights of the variant element fields included in the test case are updated, and the weight adjustment policy of the fields is adjusted upwards.
According to one embodiment of the application, the communication protocol is a MODBUS protocol.
According to one embodiment of the application, a data frame for a test case includes a frame header, body data of the frame, and a frame trailer; the first few bits in the frame head are fixed, the frame tail comprises check codes and a plurality of values calculated according to the main body data of the frame, and fixed bytes, the main body of the frame, namely the data section, comprises useful test data, verification data are obtained after the test data are calculated through rules, and the verification number is written into the frame tail.
According to one embodiment of the application, the embedded device discards invalid data from the header and the trailer, e.g., header not pair or trailer check errors.
According to one embodiment of the application, some parameters in the frame are variable, these parameters are variant elements in the application, and the elements obtained from the numerical calculation of these variant elements are generated elements;
according to an embodiment of the present application, the numerical range outside the normal value range of the variant element is the range covered by the target test.
According to one embodiment of the application, the rules of the generated elements are fixed and determined according to the protocol, otherwise the verification cannot be passed.
According to one embodiment of the application, the number of variant elements is obtained from the number of variable field types in the protocol; if the number is relatively large, e.g. more than 10 fields, the time and period of the full test may be long, and the gap between the expected and actual test needs to be determined. For example, setting the target test number to 100w, an equal-scale test may be obtained according to the field number combination, for example, 2 fields at a time, to complete the test. Then 2 fields are tested each time, namely the tested combination rule; performing secondary combination on the fields obtained by combination and generating actual test data, namely generating rules of variant element combination; that is, the generation rule of the variant element combination includes a first variant element combination and a second variant element combination, a first variant element is obtained based on a field and a value corresponding to the first variant element combination, a second variant element is obtained based on a field and a value corresponding to the second variant element combination, a data set is obtained after the combination, for example, 30×10=300, a first variant element set with a size of 300 is obtained, for example, 20×10=200, and a second variant element set with a size of 200 is obtained; and taking values and mixing according to the proportion, splicing the values and the normal elements to obtain a data main body, calculating the data main body to obtain a generated element, and further obtaining the test case. The method is used for avoiding the fact that response offset of the embedded equipment is true when one type of element is simply tested, and normal elements comprise a frame head and a frame tail; the generation element includes a length of the communication frame or a check code. The combination of the plurality of test elements has weights which are arranged in reverse order according to the test coverage ratio, and the test is updated after the test is completed. When an element test meets the requirement, deleting the use case rule containing the variant element. The weight if the ratio is reduced. 0-2 frame head, 3-4 type, 5-6 length, 7-8 temperature data, numerical value, check bit, frame tail, frame head normal element, frame tail normal element, check element as generating element, variation element as data, character string, type, numerical value, coverage rate adjustment weight.
According to one embodiment of the present application, when a test is performed, the fields corresponding to variant elements are not all set to the values of the normal value range, but part of the elements are set to the abnormal values, and the other elements are set to the normal values. The normal values of other elements can be consistent values, and random values in the normal value range can also be taken. By the method, the problem of low coverage rate of the test sample caused by taking only a single point value can be avoided.
In accordance with one embodiment of the present application, assuming that the compiled element E= { a, b, c, d, E, F, g, h, i, j } is present, then when the combination can be set to 2, then the resulting set is F= { ab, ac, ad...ij } and then two combinations are arbitrarily removed from this set, which are used to generate the test dataset. When the combination is ac and ab, generating fields a and c with values of variation values based on the combination ac to obtain a series of variation elements; generating fields a and b with values of variation values based on the combination ab to obtain a series of variation elements; these elements are combined with normal elements, so that a set of test cases can be obtained, which can be used to test two sets of variant elements simultaneously.
According to one embodiment of the present application, the weights are understood herein to be of importance, e.g. all variant fields have an initial weight of 100, and after the test is passed, the new field weights are pn=pold×0.999, and when the combination is performed, the combination with the same weight is preferentially selected. Weights can be set in segments, for example, when the coverage ratio exceeds 10%, and when the corresponding field weight is calculated, corresponding reduction is performed, and the higher the coverage ratio is, the larger the weight reduction ratio is. So that variant fields of low coverage are preferentially tested. When a variant field test passes, the error probability is smaller to a certain extent, the importance coefficient is correspondingly reduced, and the higher the coverage ratio is, the larger the weight reduction ratio is. So that variant fields of low coverage are preferentially tested. When a variant field test fails, the error probability is larger to a certain extent, and the importance coefficient is correspondingly increased. For example, a field ab combination is erroneous, then the combination containing a and b will increase in weight on the next generation, so that the error-prone field is tested more.
In order to achieve the above object, the present application also provides an electronic device including: the fuzzy test system comprises a processor, a memory and a computer program which is stored in the memory and can run on the processor, wherein the computer program realizes the fuzzy test method of the embedded device when being executed by the processor.
In order to achieve the above object, the present application further provides a computer readable storage medium, on which a computer program is stored, which when executed by a processor implements a fuzzy test method of an embedded device as described above.
Based on the above, the method has the advantages that a large number of test cases can be rapidly generated and tested by using the method, and the method is covered on the combination of various normal and abnormal test data scenes, so that potential problems are found. The random data can be used for carrying out full test, so that accidental events with extremely low probability are increased, and the test is complete.
The setting of normal elements and generated elements ensures that the test cases can accord with corresponding protocol rules, thereby reaching the core part of the tested software. The scale of the test case can be flexibly adjusted by adjusting the generation rule and the combination rule of the variation elements, and balance points can be found in the execution time and the test effect; the weight and the adjustment rule thereof can dynamically adjust the variation direction, thereby achieving better test effect.
Those of ordinary skill in the art will appreciate that the modules and algorithm steps described in connection with the embodiments disclosed herein can be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
It will be clearly understood by those skilled in the art that, for convenience and brevity of description, specific working procedures of the apparatus and device described above may refer to corresponding procedures in the foregoing method embodiments, which are not described herein again.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other manners. For example, the apparatus embodiments described above are merely illustrative, and for example, the division of the modules is merely a logical function division, and there may be additional divisions when actually implemented, for example, multiple modules or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or modules, which may be in electrical, mechanical, or other forms.
The modules described as separate components may or may not be physically separate, and components shown as modules may or may not be physical modules, i.e., may be located in one place, or may be distributed over a plurality of network modules. Some or all of the modules can be selected according to actual needs to achieve the purpose of the embodiment of the application.
In addition, each functional module in the embodiment of the present application may be integrated in one processing module, or each module may exist alone physically, or two or more modules may be integrated in one module.
The functions, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a computer-readable storage medium. Based on such understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method for energy saving signal transmission/reception of the various embodiments of the present application. And the aforementioned storage medium includes: a usb disk, a removable hard disk, a ROM, a RAM, a magnetic disk, or an optical disk, etc.
The above description is only illustrative of the preferred embodiments of the present application and of the principles of the technology employed. It will be appreciated by persons skilled in the art that the scope of the application referred to in the present application is not limited to the specific combinations of the technical features described above, but also covers other technical features formed by any combination of the technical features described above or their equivalents without departing from the inventive concept. Such as the above-mentioned features and the technical features disclosed in the present application (but not limited to) having similar functions are replaced with each other.
It should be understood that, the sequence numbers of the steps in the summary and the embodiments of the present application do not necessarily mean the order of execution, and the execution order of the processes should be determined by the functions and the internal logic, and should not be construed as limiting the implementation process of the embodiments of the present application.
Claims (10)
1. A method for fuzzy testing an embedded device, comprising:
acquiring normal elements, variant elements and generated elements according to the content of the communication protocol;
generating a first variation value set based on the requirements of the first variation element;
generating a second set of variation values based on the requirements of the second variation element;
determining a combination set of variant elements based on the first variation value set, the second variation value set and a combination rule of variant elements;
obtaining corresponding generated elements based on the combination set of variant elements, normal elements and rules for obtaining the generated elements;
obtaining a test case based on the normal element, the variant element and the generated element;
the test is performed using the test case.
2. The method of claim 1, wherein the combination rule of variant elements comprises single or multiple combinations.
3. The method for fuzzy testing an embedded device according to claim 2, wherein the combination rule of the variant elements is to combine variant data obtained by combining one or more variant elements.
4. The method of claim 3, wherein the variant elements have weights, the weights of the variant elements are the sum of the variant elements, and the weights of the variant elements are updated after one test case is completed.
5. The method of claim 4, wherein the weights of the variant element fields are adjusted according to the test coverage of the fields.
6. The method of claim 5, wherein after a test case passes, the weights of the variant element fields included in the test case are updated, and the weight adjustment strategy of the fields is adjusted downward.
7. The method of claim 6, wherein when a test case fails, the weights of the variant element fields included in the test case are updated, and the weight adjustment strategy of the fields is adjusted upward.
8. A ambiguity test system for an embedded device, comprising:
element acquisition module: acquiring normal elements, variant elements and generated elements according to the content of the communication protocol;
a combined set generating module: generating a first variation value set based on the requirements of the first variation element;
generating a second set of variation values based on the requirements of the second variation element;
determining a combination set of variant elements based on the first variation value set, the second variation value set and a combination rule of variant elements;
the generating element acquisition module: obtaining corresponding generated elements based on the combination set of variant elements, normal elements and rules for obtaining the generated elements;
test case acquisition module: obtaining a test case based on the normal element, the variant element and the corresponding generated element;
and the fuzzy test module is used for: the test is performed using the test case.
9. An electronic device comprising a processor, a memory and a computer program stored on the memory and executable on the processor, the computer program implementing a method of ambiguity testing an embedded device as claimed in any one of claims 1 to 7 when executed by the processor.
10. A computer readable storage medium, characterized in that the computer readable storage medium has stored thereon a computer program which, when executed by a processor, implements a method of blur testing of an embedded device according to any one of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310886097.XA CN116881058A (en) | 2023-07-19 | 2023-07-19 | Fuzzy test method for embedded equipment |
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