CN116298825B

CN116298825B - Chip test system and method, device, drive access device and method

Info

Publication number: CN116298825B
Application number: CN202310523715.4A
Authority: CN
Inventors: 焦时伟; 周欢驰; 吴友凤; 邱军龙; 董卫; 商帅
Original assignee: Hangzhou Changchuan Technology Co Ltd
Current assignee: Hangzhou Changchuan Technology Co Ltd
Priority date: 2023-05-08
Filing date: 2023-05-08
Publication date: 2023-10-20
Anticipated expiration: 2043-05-08
Also published as: CN116298825A

Abstract

The embodiment of the disclosure discloses a chip test system and method, equipment, a drive access device and a method, relating to the semiconductor test technology, wherein a function call interface is standardized by configuring abstract implementation programs of various functions, at least one specific implementation program of corresponding functions respectively realized based on the abstract implementation programs of the various functions and an acquisition method program of the specific implementation programs of the various functions in a drive access module, so that a unified function call interface is realized, and the type limitation of a machine type and a board card of test equipment can be broken through; when the board card needs to be updated in the test equipment or the function call needs to be updated and expanded, the board card of a new type can be compatible only by updating the drive access module without changing the upper computer software of the test equipment, the development workload can be greatly reduced, the development period can be shortened, and the robustness and the stability of the upper computer software can be maintained.

Description

Chip test system and method, device, drive access device and method

Technical Field

The present disclosure relates to semiconductor testing technology, and more particularly, to a chip testing system and method, a drive access device and method, and a chip testing apparatus.

Background

Electronic devices often require integration of a large number of electronic chips. Before the chip is integrated into an electronic device, it is often necessary to go through Wafer (Wafer test) and final test (FT, also called package test, finished product test or chip test) to determine the reliability and performance of the test object and to separate bad and good products.

When a test object performs a test, a hardware resource board (also referred to as a function board) for providing a corresponding function test in a test device needs to be connected to the test object, for example, in a wafer test, a probe of a probe card (probe card) is connected to a connection point (bond pads) of a die (die) in the wafer, in a chip test, a test slot (socket) of a load board is connected to a pin of the chip, and an input signal is applied to the test object through the resource board and a corresponding output signal is collected, so as to determine a test result.

In the process of realizing the present disclosure, the inventor of the present disclosure finds through research that, in the related art, the upper computer software of the test device is directly called by the hardware driver to access the corresponding resource board cards, while different resource board cards are often independent on the drive interface package, the test device needs to call by the hardware driver through different drive interfaces, so that when the resource board card is newly added in the test device, the upper computer software of the test device needs to be modified, the development workload is large, and the development period is long; and then, the overall regression test is required to be carried out on the upper computer software, the workload of the regression test is larger, and the time consumption is longer.

Disclosure of Invention

Embodiments of the present disclosure provide a chip testing system and method, a drive access apparatus and method, a chip testing device, an electronic device, a computer-readable storage medium, and a computer program product to at least partially solve the above-described problems in the related art.

In one aspect of the disclosed embodiments, a chip test system is provided, including a test module, a driver access module, and a hardware driver module;

the drive access module is configured with an abstract implementation program of each function in a plurality of functions, at least one concrete implementation program of corresponding functions implemented by the abstract implementation program of each function and an acquisition method program of the concrete implementation program of each function, wherein the at least one concrete implementation program corresponds to at least one hardware unit supporting the corresponding function in a one-to-one correspondence manner;

the hardware driver module is configured to: a driving unit storing at least one hardware unit;

the test module is configured to: calling an acquisition method program of a target function in the drive access module based on a test task, determining a target specific implementation program of the target function according to test information in the test task when the acquisition method program of the target function is called, and generating an instance of the target specific implementation program; and calling a business function in the instance of the target specific implementation program, and controlling a target hardware unit to realize the function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target driving unit is a driving unit of the target hardware unit corresponding to the target specific implementation program.

In another aspect of the embodiments of the present disclosure, a method for testing a chip is provided, including:

calling an acquisition method program for a target function in a drive access module based on a test task; the drive access module is configured with an abstract implementation program of each function in a plurality of functions, at least one concrete implementation program of corresponding functions implemented by the abstract implementation program of each function and an acquisition method program of the concrete implementation program of each function, wherein each concrete implementation program in the at least one concrete implementation program corresponds to one hardware unit supporting the corresponding function;

when the acquisition method program of the target function is called, determining a target specific implementation program under the target function according to the test information in the test task, and generating an instance of the target specific implementation program;

and calling a business function in the instance of the target specific implementation program, and controlling a target hardware unit to realize the function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target driving unit is a driving unit of the target hardware unit corresponding to the target specific implementation program.

In yet another aspect of the embodiments of the present disclosure, there is provided a drive access apparatus including a service function unit, a function interface unit, and a function implementation unit;

the function interface unit is configured with abstract realization programs of various functions in a plurality of functions;

the function realizing unit is configured with at least one concrete realizing program of corresponding functions realized based on the abstract realizing programs of the functions respectively, and each concrete realizing program in the at least one concrete realizing program corresponds to one hardware unit supporting the corresponding functions respectively;

the service function unit is configured with an acquisition method program of the specific implementation program of each function, and the acquisition method program is configured to: and when the business function in the instance of the target specific implementation program is called, controlling a target hardware unit to realize the function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target driving unit is a driving unit of the target hardware unit corresponding to the target specific implementation program.

In still another aspect of the embodiments of the present disclosure, a drive access method is provided, which is applied to a drive access device configured with an abstract implementation program of each function of a plurality of functions, at least one concrete implementation program of a corresponding function implemented based on the abstract implementation program of each function, respectively, and an acquisition method program of the concrete implementation program of each function, each concrete implementation program of the at least one concrete implementation program corresponding to one hardware unit supporting the corresponding function, respectively;

the method comprises the following steps:

the method comprises the steps of determining a target specific implementation program under a target function according to received test information by a called target function acquisition method program;

generating an instance of the target implementation program;

when a business function in an instance of the target specific implementation program is called, a target driving unit controls a target hardware unit to realize a function corresponding to the instance of the target specific implementation program, and the target driving unit is a driving unit of the target hardware unit corresponding to the target specific implementation program.

In yet another aspect of embodiments of the present disclosure, a chip test apparatus having disposed thereon a chip test system according to any one of the embodiments of the present disclosure is provided.

In still another aspect of the embodiments of the present disclosure, there is provided an electronic device including:

a memory for storing a computer program;

and the processor is used for executing the computer program stored in the memory, and when the computer program is executed, the chip testing method or the drive access method of any embodiment of the disclosure is realized.

In yet another aspect of the embodiments of the present disclosure, there is provided a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the chip test method or the drive access method of any of the embodiments of the present disclosure.

In yet another aspect of embodiments of the present disclosure, a computer program product is provided, comprising computer program instructions which, when executed by a processor, implement the chip test method or the drive access method of any of the embodiments of the present disclosure.

According to the embodiment of the disclosure, by configuring an abstract implementation program of each function, at least one specific implementation program of a corresponding function realized based on the abstract implementation program of each function and an acquisition method program of the specific implementation program of each function in a driving access module (i.e. a driving access device), when a test module calls the acquisition method program of a target function in the driving access module, the acquisition method program of the target function can determine the target specific implementation program under the target function according to test information in a test task and generate an instance of the target specific implementation program, and further, by calling a service function in the instance of the target specific implementation program, the function corresponding to the instance of the target specific implementation program can be realized by controlling a target hardware unit through a target driving unit, thereby, the function call interface is standardized through the driving access module, and a unified function call interface is realized, so that the model and the type limitation of a resource board card (hereinafter referred to as a board card) of a chip test device (hereinafter referred to as a test device) can be broken through; when the board card needs to be updated in the test equipment, for example, when the type of the board card is increased, reduced and changed, the driver access module is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the board card of a new type can be compatible, the development workload can be greatly reduced, the development period is shortened, and the whole regression test on the upper computer software is not required, so that the workload and time consumption caused by the regression test are avoided, the updating efficiency is improved, and the cost is saved; in addition, the call of each function is isolated into the drive access module, and when the function call needs to be updated and expanded, the drive access module is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the robustness and stability of the upper computer software are maintained.

The technical scheme of the present disclosure is described in further detail below through the accompanying drawings and examples.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the disclosure and together with the description, serve to explain the principles of the disclosure.

The disclosure may be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings in which:

FIG. 1 is a schematic diagram of a chip test system according to an embodiment of the disclosure;

FIG. 2 is an example of an implementation of a driver access module in a chip test system of the present disclosure;

FIG. 3 is a schematic diagram of an exemplary embodiment of a chip test system of the present disclosure;

FIG. 4 is a flow chart of one embodiment of a method of testing a chip of the present disclosure;

FIG. 5 is a flow chart of another embodiment of a chip testing method of the present disclosure;

FIG. 6 is a flow chart of yet another embodiment of a chip testing method of the present disclosure;

FIG. 7 is a flow chart of yet another embodiment of a chip testing method of the present disclosure;

FIG. 8 is a flow chart of yet another embodiment of a chip test method of the present disclosure;

FIG. 9 is a schematic diagram illustrating one embodiment of a drive access device of the present disclosure;

FIG. 10 is a schematic diagram of another embodiment of a drive access device of the present disclosure;

FIG. 11 is a flow chart of one embodiment of a method of driving access of the present disclosure;

FIG. 12 is a flow chart of another embodiment of a method of driving access of the present disclosure;

FIG. 13 is a flow chart of yet another embodiment of a drive access method of the present disclosure;

FIG. 14 is a schematic diagram of an embodiment of a chip test apparatus of the present disclosure;

fig. 15 is a schematic structural view of an application embodiment of the electronic device of the present disclosure.

Detailed Description

Various exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present disclosure unless it is specifically stated otherwise.

It will be appreciated by those of skill in the art that the terms "first," "second," etc. in embodiments of the present disclosure are used merely to distinguish between different steps, devices or modules, etc., and do not represent any particular technical meaning nor necessarily logical order between them.

It should also be understood that in embodiments of the present disclosure, "plurality" may refer to two or more, and "at least one" may refer to one, two or more.

It should also be appreciated that any component, data, or structure referred to in the presently disclosed embodiments may be generally understood as one or more without explicit limitation or the contrary in the context.

In addition, the term "and/or" in this disclosure is merely an association relationship describing an association object, and indicates that three relationships may exist, for example, a and/or B may indicate: a exists alone, A and B exist together, and B exists alone. In addition, the character "/" in the present disclosure generally indicates that the front and rear association objects are an or relationship.

It should also be understood that the description of the various embodiments of the present disclosure emphasizes the differences between the various embodiments, and that the same or similar features may be referred to each other, and for brevity, will not be described in detail.

Meanwhile, it should be understood that the sizes of the respective parts shown in the drawings are not drawn in actual scale for convenience of description.

The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the disclosure, its application, or uses.

Techniques, methods, and apparatus known to one of ordinary skill in the relevant art may not be discussed in detail, but are intended to be part of the specification where appropriate.

It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further discussion thereof is necessary in subsequent figures.

Embodiments of the present disclosure may be applicable to electronic devices such as terminal devices, computer systems, servers, etc., which may operate with numerous other general purpose or special purpose computing system environments or configurations. Examples of well known terminal devices, computing systems, environments, and/or configurations that may be suitable for use with the terminal device, computer system, server, or other electronic device include, but are not limited to: personal computer systems, server computer systems, thin clients, thick clients, hand-held or laptop devices, microprocessor-based systems, set-top boxes, programmable consumer electronics, network personal computers, small computer systems, mainframe computer systems, and distributed cloud computing technology environments that include any of the foregoing, and the like.

Electronic devices such as terminal devices, computer systems, servers, etc. may be described in the general context of computer system-executable instructions, such as program modules, being executed by a computer system. Generally, program modules may include routines, programs, objects, components, logic, data structures, etc., that perform particular tasks or implement particular abstract data types. The computer system/server may be implemented in a distributed cloud computing environment in which tasks are performed by remote processing devices that are linked through a communications network. In a distributed cloud computing environment, program modules may be located in both local and remote computing system storage media including memory storage devices.

Fig. 1 is a schematic structural diagram of an embodiment of a chip testing system of the present disclosure. As shown in FIG. 1, the chip test system of one embodiment includes a test module 102, a driver access module 104, and a hardware driver module 106. Wherein:

the driver access module 104 is configured with an abstract implementation program of each function in the plurality of functions, at least one concrete implementation program of a corresponding function implemented based on the abstract implementation program of each function, and an acquisition method program of the concrete implementation program of each function, wherein the at least one concrete implementation program corresponds to at least one hardware unit supporting the corresponding function in a one-to-one correspondence manner. Hardware units in embodiments of the present disclosure may include, for example, but are not limited to: a board card or other form of hardware unit supporting various functions, having various physical characteristics, to which embodiments of the present disclosure are not limited.

A hardware driver module 106 configured to: a drive unit storing at least one hardware unit.

A test module 102 configured to: the method comprises the steps that a target function acquisition method program in a drive access module 104 is called based on a test task, when the target function acquisition method program is called, a target specific implementation program under the target function can be determined according to test information in the test task, and an instance of the target specific implementation program is generated; and calling a business function in the instance of the target specific implementation program, and controlling a target hardware unit to realize the function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target hardware unit is a hardware unit corresponding to the target specific implementation program, and the target driving unit is a driving unit of the target hardware unit. The test task, that is, the task that needs to be completed this time, may be a measurement task or an output task for performing performance detection on an object to be tested (Device Under Test, DUT), etc., and the object to be tested in the embodiment of the present disclosure may be a wafer before packaging, a chip after packaging, etc., or may be other products applicable to the embodiment of the present disclosure, that is, the embodiment of the present disclosure may be used for testing a wafer before packaging, or may be used for testing a chip after packaging, or may be used for testing other products, which is not limited in this embodiment of the present disclosure.

In a specific application, when the object to be measured is a wafer, the hardware unit may be a probe card; when the object to be tested is a chip, the hardware unit may be a mounting substrate. The embodiments of the present disclosure are not limited in this regard.

Based on the embodiment, by configuring an abstract implementation program of each function, at least one specific implementation program of a corresponding function implemented based on the abstract implementation program of each function respectively, and an acquisition method program of the specific implementation program of each function in a driving access module, when a test module calls the acquisition method program of a target function in the driving access module, the acquisition method program of the target function can determine the target specific implementation program under the target function according to test information in a test task, and generate an instance of the target specific implementation program, and further, by calling a service function in the instance of the target specific implementation program, the function corresponding to the instance of the target specific implementation program can be realized by controlling a target hardware unit through a target driving unit, thereby, the function calling interface is standardized through the driving access module, and a unified function calling interface is realized, so that the limitation of the model and the type of a board of test device can be broken through, and the platformization and the sustainability of a product are facilitated; when the board card needs to be updated in the test equipment, for example, when the type of the board card is increased, reduced and changed, the driver access module is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the board card of a new type can be compatible, the development workload can be greatly reduced, the development period is shortened, and the whole regression test on the upper computer software is not required, so that the workload and time consumption caused by the regression test are avoided, the updating efficiency is improved, and the cost is saved; in addition, the call of each function is isolated into the drive access module, and when the function call needs to be updated and expanded, the drive access module is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the robustness and stability of the upper computer software are maintained.

In some specific examples, the plurality of functions in the embodiments of the present disclosure may include, for example, but are not limited to, any of the following: pin precision measurement unit (Per Pin Precision Measurement Unit, PPMU) function, time measurement unit (Time Parameter Measurement Unit, TMU) function, arbitrary waveform generator (ArbitraryWaveform Generator, AWG) function, digital function, waveform collector (Waveform Digitizer, DGT) function, voltage current source (DCVI) function, power supply (Power) function, etc., the specific types of functions of the embodiments of the present disclosure are not limited.

In some specific examples, each hardware unit may correspond in name to a specific implementation program under its supporting function, for example, assuming that both the board type a and the board type pa b support the AWG function, the specific implementation program under the AWG function supported by the board type a and the board type pa b may be denoted as AWG board type a and AWG board type b, respectively; alternatively, the corresponding relationship between the specific implementation program of each function and the hardware unit supporting the corresponding function may be preconfigured in the driving access module 104, so that the correspondence between the hardware unit and the specific implementation program under each function may be achieved, which is not limited in the embodiments of the present disclosure.

For example, in some specific examples, assuming that two types of board cards, namely, board type a and board type pa, support AWG functions at present, the driver access module 104 is configured with an abstract implementation program (AWG interface) of the AWG functions, specific implementation programs AWG board type a and AWG board type b based on the AWG interface implementation, and an acquisition method program of the specific implementation program of the AWG functions, if another board card board type c supporting the AWG functions needs to be newly added in the future, a specific implementation program AWG board type c is created based on the AWG interface, and expansion of the AWG functions can be completed.

Similarly, assuming that the test device currently has a board card supporting the PPMU function, the TMU function and the DGT function, the driver access module 104 is configured with an abstract implementation program of each function of the PPMU function, the TMU function and the DGT function, at least one specific implementation program of a corresponding function implemented based on the abstract implementation program of each function, and an acquisition method program of the specific implementation program of each function, if a board card type d supporting the Digital function needs to be newly added in the future, the acquisition method program of the Digital function, the abstract implementation program (Digital interface) of the Digital function, and the specific implementation program Digital card type implemented based on the Digital interface may be created in the driver access module 104, so that the Digital function may be expanded.

For the case of adding other boards and realizing other functional expansion, the above examples may be referred to for implementation, and the embodiments of the disclosure are not repeated.

The chip test system of any embodiment of the disclosure can be applied to test equipment, and a test module in the chip test system can be used as upper computer software of the test equipment.

Fig. 2 is an example of an implementation of a driver access module in a chip test system of the present disclosure. Fig. 2 shows one specific example of the abstract implementation program 1042, the concrete implementation program 1044, and the acquisition method program 1046 configured by the drive access module 104. The driver access module 104 configures abstract implementation programs of each function in the multiple functions, each abstract implementation program corresponds to one function, at least one concrete implementation program of the corresponding function is implemented based on each abstract implementation program, and an acquisition method program of the concrete implementation program of each function is configured, and the concrete implementation program of the corresponding function can be acquired through the acquisition method program of the concrete implementation program of each function.

Optionally, in some implementations, the capability supported by the test device may be abstracted according to a function, and a set of abstract functions may be defined, as an abstract implementation program of the above multiple functions, where each abstract implementation program of each function may be implemented by using an abstract function class, and each concrete implementation program of each function is implemented as a concrete function class (also called a subclass) based on a corresponding hardware unit, where the concrete function implementation class inherits the abstract function class of the corresponding function, so as to implement abstraction of the function. For example, there is a board type a having four functions of PPMU function, TMU function, DGT function and Digital function, and then abstract function classes PPMUInterface, TMUInterface, DGTInterface and Digital interface are defined respectively, and four inherited abstract function classes PPMUInterface, TMUInterface, DGTInterface and Digital interface are defined respectively, and specific function classes PPMUBoardTypeA, TMUBoardTypeA, DGTBoardTypeA and Digital board type a for implementing the four inherited abstract function classes are correspondingly implemented according to physical characteristic parameters (such as voltage range, current range, etc.) of the board type a. The method for acquiring the specific implementation program of each function may be implemented as a factory method of the corresponding function, for example, an exemplary basic implementation form of the factory method corresponding to the AWG function is: . The embodiments of the present disclosure are not limited in this regard.

Optionally, in some implementations of the chip test system of the disclosure, each abstract implementation program and each concrete implementation program respectively include at least one service function, where the at least one service function may include at least one of a first service function and a second service function, that is, each abstract implementation program respectively defines a service function required for implementing a corresponding function. The first service function is used for setting working parameters of the hardware unit in the corresponding function, wherein the working parameters are working parameters which need to be set for the hardware unit when the corresponding function is realized, for example, the corresponding working parameters such as sampling frequency, sampling period and the like need to be set for the board when the AWG function is realized. The first service function may include one service function or a plurality of service functions according to implementation requirements of the corresponding functions, for example, the AWG function may include a first service function SetSampleRate (), a first service function SetSampleCycle () for setting a sampling frequency, and the like. The second service function is used for realizing at least one sub-function of the corresponding functions, which is a function that can be realized in the corresponding functions, for example, a second service function setram data () for generating ramp wave data in the AWG function, and the like, and a second service function for realizing the voltage test function, the current test function, and the like in the PPMU function. Also, the second business function may include one business function or a plurality of business functions according to implementation requirements of the corresponding functions.

Accordingly, in this implementation, the test module 102 invokes the business function in the instance of the target implementation program, and controls, through the target driving unit, the target hardware unit to implement the function corresponding to the instance of the target implementation program, and may be further configured to: according to preset test configuration information, each business function in the instance of the target specific implementation program is called respectively, wherein the test configuration information can include, but is not limited to: calling sequence of each service function in a specific implementation program, setting information (i.e. setting value) of working parameters related to each first service function and the like when the corresponding function is implemented; responding to the fact that a currently called business function (hereinafter referred to as a target business function) belongs to a first business function, and when the target business function is called, controlling a target hardware unit to set target working parameters according to setting information of the working parameters (hereinafter referred to as target working parameters) related to the target business function in test configuration information through a driving unit of the target hardware unit; when the target business function is called, the driving unit of the target hardware unit controls the target hardware unit to execute the operation of the sub-function (hereinafter referred to as a target sub-function) corresponding to the target business function, and returns the execution result of the target sub-function, wherein the execution result of the target sub-function can be the acquired output signal of the object to be tested after the preset input signal is input to the object to be tested through the target hardware unit.

Based on the embodiment, the test module can call the service function in the instance of the target specific implementation program to further enable the target hardware unit to perform specific working parameter setting, and achieve functions of measurement, output and the like, so that a test flow or a functional flow corresponding to the test task is completed.

Optionally, in some implementations of the chip test system of the disclosure, the first service function may include a security defense procedure for a hardware unit, and/or the second service function may include a security defense procedure for a hardware unit, and accordingly, the security defense procedures in the specific implementation procedures are respectively implemented based on physical characteristics of the hardware unit corresponding to the specific implementation procedures.

Accordingly, in the above implementation manner, when the first service function includes the security defense program, in response to the currently invoked target service function belonging to the first service function, when the target service function is invoked, according to the setting information of the target working parameter related to the target service function in the test configuration information, the driving unit of the target hardware unit controls the target hardware unit to set the target working parameter, and may be further configured to: responding to the fact that the currently called target service function belongs to a first service function, and when the target service function is called, performing security check on setting information of target working parameters related to the target service function based on physical characteristics of a target hardware unit through a security defense program in the target service function; and responding to the passing of the safety check, and controlling the target hardware unit to set the target working parameters through the driving unit of the target hardware unit according to the setting information of the target working parameters related to the target business function.

When the second service function includes a security defending program, in response to the currently called target service function belonging to the second service function, when the target service function is called, the operation of executing the sub-function corresponding to the target service function by the target hardware unit is controlled by the driving unit of the target hardware unit, and may be further configured to: responding to the fact that the currently called target business function belongs to a second business function, and when the target business function is called, performing security check on setting information of target working parameters related to the target business function based on physical characteristics of a target hardware unit through a security defense program in the target business function; and in response to the passing of the security check, controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target business function through the driving unit of the target hardware unit, for example, controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target business function through the driving unit of the target hardware unit under the condition that the target working parameter is at the parameter value corresponding to the setting information.

For example, taking the second service function setram data () in the AWG function as an example, the second service function setram data () is used to generate ramp data according to a start voltage (startVoltage) and a stop voltage (double stopVoltage) in the test configuration information, where the start voltage and the stop voltage are target working parameters, and setting information of the start voltage and the stop voltage in the test configuration information is setting information of the target working parameters. Assuming that the voltage range of the board type a is [ -10v,10v ], and the voltage range of the board type b is [ -30v,30v ], when the second service function setram data () in the board BoardTypeA, boardTypeB is called, a range formed by the start voltage and the stop voltage in the test configuration information needs to be determined according to the voltage ranges of the two boards, and if the range is within the voltage range of the board, ramp data is generated based on the start voltage and the stop voltage, so that the security protection program is moved down to the function setram data in the specific function implementation programs awg board type a and awg board type b to be implemented, without performing complex hardware strong coupling determination at the application program interface (Application Programming Interface, API) call of the test module 102.

Based on the embodiment, a security defending program for the hardware unit is set in each specific implementation program, so that when the target service function is called, security check is firstly performed on setting information related to the target working parameter based on physical characteristics of the target hardware unit, for example, security check is performed on a voltage range and a current range to be set in a PPMU function, whether the voltage range and the current range to be set are within a voltage range and a current range of the target board card is judged, and only after the security check is passed, the target hardware unit is controlled to set the target working parameter according to the setting information of the target working parameter, and/or operation of executing a target sub-function corresponding to the target service function by the target hardware unit is controlled by a driving unit of the target hardware unit, so that the security of the hardware unit can be effectively ensured; in addition, the security defending program is moved down to each specific implementation program to be realized, so that the maintenance and the updating are convenient, and the function implementation efficiency can be improved.

Optionally, in some implementations of the chip test system of the disclosure, when the target function obtaining method program is called, determining a target specific implementation program under the target function according to test information in the test task, and generating an instance of the target specific implementation program, may be further configured to: when the acquisition method program of the target function is called, determining at least one target specific implementation program under the target function to be called according to the test information; instantiating the at least one object-specific implementation program to obtain an instance of the at least one object-specific implementation program, and returning the directional information of the instance of the at least one object-specific implementation program to the test module 102, e.g., the directional information of the instance of the at least one object-specific implementation program may be put into a container and returned to the test module 102, the test module may cache the directional information of the instance of the at least one object-specific implementation program, where the directional information is used to point to the instance of the corresponding object-specific implementation program, and each business function of the instance of the corresponding object-specific implementation program may be accessed through high directional information, where the directional information may include, but is not limited to: pointers, references, etc., embodiments of the present disclosure do not limit the specific implementation of pointing information.

Accordingly, in this implementation, the test module 102 invoking business functions in the instance of the target implementation program may be further configured to: the test module 102 traverses each of the at least one directional information to call the business function in each instance of the at least one target implementation program in turn. Specifically, when a business function in an instance of a target specific implementation program needs to be called through the test module 102, the cached pointing information can be traversed to find the pointing information of the corresponding function, and the business function in the instance of the target specific implementation program is called by the polymorphic mode to control the corresponding target hardware unit to realize the corresponding business function.

Based on the embodiment, at least one specific implementation program under the corresponding function is instantiated and called by acquiring the method program, so that the corresponding hardware unit is controlled to perform specific working parameter setting, and functions such as measurement and output are realized, and a test flow or a functional flow corresponding to the test task is completed.

Optionally, in some implementations of the chip test system of the present disclosure, the test information may include a pin list to be tested (pin list), where the pin list to be tested includes Identification (ID) information of at least one pin to be tested, where an identifier of each pin to be tested is used to uniquely identify one pin to be tested, and the pin to be tested in the embodiment of the present disclosure may be a pin of a chip connected through a test slot, or may be a connection point above a die in a wafer, which is not limited by the embodiment of the present disclosure.

Accordingly, in this implementation, the test module 102 may be further configured to: the preset test configuration information is sent to the drive access module 104 based on the test task, where the test configuration information includes a hardware unit identifier, a channel identifier, and a pin identifier, where each hardware unit identifier is used to uniquely identify one hardware unit, each hardware unit may provide multiple channels, each channel identifier is used to uniquely identify one channel (channel) on the hardware unit, and the pin identifier is used to uniquely identify one pin of the object to be tested.

In the above implementation manner, when the target function obtaining method program is called, determining, according to the test information, at least one target specific implementation program under the target function to be called, may be further configured to: when the acquisition method program of the target function is called, determining at least one target hardware unit identifier corresponding to the identifier information of at least one pin to be tested in the pin list to be tested based on the test configuration information, and determining at least one specific implementation program corresponding to the at least one target hardware unit identifier as at least one target specific implementation program under the target function to be called.

Based on the embodiment, the test module can send preset test configuration information to the drive access module based on the requirements of the test task, namely, which pins (pinlist) need to be subjected to corresponding functions, so that when the acquisition method program of the target function is called, the target specific implementation program to be called by the pin list to be tested can be determined based on the test information, and the corresponding target specific implementation program is called to perform the operation of the corresponding functions on the pin implementation in the pin list to be tested, thereby realizing the corresponding functions. When the pins to be tested in the pin list to be tested are pins of the chip connected through the test slot, corresponding functions of the chip are correspondingly realized; when the pins to be tested in the pin list to be tested are the connection points on the crystal grains in the wafer, corresponding functions on the wafer are correspondingly realized.

Alternatively, in other implementations of the chip test system of the present disclosure, the test information includes at least one target hardware unit identification information, each target hardware unit identification being used to uniquely identify one target hardware unit. Accordingly, in the above implementation manner, when the target function obtaining method program is called, determining, according to the test information, at least one target specific implementation program under the target function to be called may be further configured to: when the acquisition method program of the target function is called, at least one target specific implementation program under the target function to be called is determined based on at least one target hardware unit identification information in the test information.

Based on the embodiment, a specific target hardware unit can be specified directly through the test information, so that when the acquisition method program of the target function is called, the target specific implementation program to be called can be directly determined based on the test information, and the corresponding target specific implementation program is called to control the target hardware unit to perform the operation of the corresponding function, thereby realizing the corresponding function.

Optionally, in some implementations of the chip test system of the disclosure, the test module 102 may be further configured to call the acquisition method program for the target function in the drive access module 104 based on the test task: the test module 102 generates a test task, where the test task includes identification information of a target function (i.e. a function to be implemented) and the test information, where the identification information of each target function is used to uniquely identify a target function, where the identification information of a function may be a specific function name (for example PPMU, TMU, DGT, digital, etc.), or may also be a number of a function (for example 01 identifies PPMU,02 identifies TMU, etc.), where the test information is used to determine a corresponding specific implementation program; the test module 104 invokes the get method program for the target function in the driver access module 104 based on the identification information of the target function.

Based on the embodiment, the test module can carry the identification information and the test information of the target function in the generated test task, so that the acquisition method program of the target function can be determined and called based on the identification information of the target function.

Fig. 3 is a schematic structural diagram of an application embodiment of the chip test system of the present disclosure. As shown in fig. 3, in this application embodiment, the test module 102 generates test tasks that are further configured to: receiving a start test message sent by sorting equipment, wherein the start test message comprises identification information of objects to be tested and identification information of the target hardware units, and the identification of each object to be tested is used for uniquely identifying one type of objects to be tested, namely objects to be tested with certain specification or performance, such as chips, wafers and the like, and the identification of each target hardware unit is used for uniquely identifying one target hardware unit, and in the embodiment of the disclosure, different hardware units can be hardware units supporting the same or different functions and/or having the same or no performance; and generating a test task according to the starting test information and the preset test configuration information. The test configuration information may include a correspondence between the input signal and the output signal.

Optionally, the test module 102 may be further configured to: after calling a business function in an instance of a target specific implementation program, controlling a target hardware unit to realize a function corresponding to the instance of the target specific implementation program through a target driving unit, generating a test result based on an execution result returned by the instance of the target specific implementation program, for example, when the business function in the instance of the target specific implementation program is called to realize the function corresponding to the instance of the target specific implementation program, inputting a preset input signal to an object to be tested through the target hardware unit, collecting an output signal of the object to be tested, comparing the output signal with an input signal corresponding to the preset input signal in test configuration information, generating a test result whether the function of the object to be tested is qualified or not according to whether the output signal is consistent with the input signal corresponding to the preset input signal, and sending end test information to sorting equipment, wherein the end test information comprises the test result, so that sorting equipment can execute corresponding operations based on the test result, for example, marking, screening and the like the object to be tested can be marked as being qualified if the test result is that the function of the object to be tested is qualified; if the test result is that the function of the object to be tested is not qualified, the object to be tested can be marked as being unqualified, and the object to be tested with unqualified function is screened out for removal.

Based on the embodiment, the joint sorting equipment can perform function related operation on the object to be tested, and perform corresponding operation on the object to be tested based on the obtained test result, so as to determine whether the object to be tested passes the function test, so that different treatments can be performed on the object to be tested subsequently.

FIG. 4 is a flow chart of one embodiment of a method of testing a chip of the present disclosure. The chip testing method of the embodiments of the present disclosure may be implemented based on the chip testing system of any of the embodiments of the present disclosure. As shown in fig. 4, the chip testing method of one embodiment includes:

202, calling an acquisition method program for the target function in the drive access module based on the test task.

When the acquisition method program of the target function is called, the target specific implementation program under the target function can be determined according to the test information in the test task, and an instance of the target specific implementation program is generated.

The drive access module is configured with an abstract implementation program of each function in a plurality of functions, at least one concrete implementation program of corresponding functions realized based on the abstract implementation program of each function respectively, and an acquisition method program of the concrete implementation program of each function, wherein the at least one concrete implementation program corresponds to at least one hardware unit supporting the corresponding function in a one-to-one correspondence manner. The target function is a function called based on a test task, and the target specific implementation program is a specific implementation program under the target function determined according to the test information.

The test task in the embodiment of the present disclosure, that is, the task that needs to be completed this time, may be a measurement task or an output task for performing performance detection on an object to be tested, etc., and the object to be tested in the embodiment of the present disclosure may be a wafer before packaging, a chip after packaging, etc., or may be other products applicable to the embodiment of the present disclosure, that is, the embodiment of the present disclosure may be used for testing a wafer before packaging, or may be used for testing a chip after packaging, or may be used for testing other products, which is not limited by the embodiment of the present disclosure.

Hardware units in embodiments of the present disclosure may include, for example, but are not limited to: a board card or other form of hardware unit supporting various functions, having various physical characteristics, to which embodiments of the present disclosure are not limited.

In some specific examples, the plurality of functions in the embodiments of the present disclosure may include, for example, but are not limited to, any of the following: PPMU functions, TMU functions, AWG functions, digital functions, DGT functions, DCVI functions, power functions, etc., and specific function types of embodiments of the present disclosure are not limited.

In some specific examples, each hardware unit may correspond to a specific implementation program under a supporting function thereof in terms of names, or a correspondence between a specific implementation program of each function and a hardware unit supporting a corresponding function may be preconfigured in the driving access module, so that the correspondence between the hardware unit under each function and the specific implementation program may be achieved, which is not limited by the embodiments of the present disclosure.

204, calling a business function in an instance of a target specific implementation program, and controlling a target hardware unit to realize a function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target hardware unit is a hardware unit corresponding to the target specific implementation program, and the target driving unit is a driving unit of the target hardware unit.

Operations 202-204 of the present embodiment may be performed by a test module in an embodiment of the chip test system of the present disclosure.

Based on the embodiment, the function call interface is standardized through the drive access module, so that a unified function call interface is realized, the type limitation of the type and the board card of the test equipment can be broken through, and the product platformization and the sustainability are facilitated; when the board card needs to be updated in the test equipment, for example, when the type of the board card is increased, reduced and changed, the driver access module is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the board card of a new type can be compatible, the development workload can be greatly reduced, the development period is shortened, and the whole regression test on the upper computer software is not required, so that the workload and time consumption caused by the regression test are avoided, the updating efficiency is improved, and the cost is saved; in addition, the call of each function is isolated into the drive access module, and when the function call needs to be updated and expanded, the drive access module is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the robustness and stability of the upper computer software are maintained.

Fig. 5 is a flow chart of another embodiment of a chip testing method of the present disclosure. In this embodiment, each abstract implementation program and each concrete implementation program respectively comprises at least one business function, which may comprise at least one of a first business function and a second business function. The first business function is used for realizing the working parameter setting of the hardware unit in the corresponding function, wherein the working parameter is the working parameter which needs to be set for the hardware unit when the corresponding function is realized. The second business function is used for realizing at least one sub-function in the corresponding function, and the sub-function is a function which can be realized in the corresponding function. The first business function may include one business function or a plurality of business functions according to the implementation requirements of the corresponding functions, and likewise, the second business function may include one business function or a plurality of business functions.

As shown in fig. 5, on the basis of the embodiment shown in fig. 4, in this embodiment, operation 204 includes:

2042, respectively calling each service function in the instance of the target specific implementation program according to the preset test configuration information.

The test configuration information may include, but is not limited to: the calling sequence of each business function in the specific implementation program, the setting information (i.e. the setting value) of the working parameters related to each first business function, etc. when the corresponding function is implemented.

Responsive to the currently invoked target business function belonging to the first business function, performing operation 2044; in response to the currently invoked target business function belonging to the second business function, operation 2046 is performed.

The target service function is the currently called service function and can be one, namely, one service function in the example of calling the target concrete implementation program each time; alternatively, the target business function may be plural, that is, plural business functions in the instance of the target specific implementation program are called each time, at this time, it may be determined whether each target business function belongs to the first business function or the second business function, and the operations 2044 or 2046 are executed according to the determination result of each target business function, respectively.

In some specific implementation examples, one of the first business functions may be sequentially called, or a plurality of the first business functions may be called in parallel for setting corresponding target working parameters, for an instance of the target specific implementation program; after the setting of the working parameters required for realizing the functions corresponding to the instances of the target specific implementation program is finished, one of the second business functions can be sequentially called, or a plurality of the second business functions can be called in parallel to realize the corresponding sub-functions. In the embodiment of the present disclosure, the specific calling sequence of the first service function and the second service function, and the number of service functions called each time are specifically set according to actual requirements, and may be updated according to the requirements, which is not limited by the embodiment of the present disclosure.

2044, when the target service function is called, controlling the target hardware unit to set the target working parameters through the driving unit of the target hardware unit according to the setting information of the target working parameters related to the target service function in the test configuration information.

The target working parameters are the working parameters related to the target business function.

2046, when the target service function is called, controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target service function by the driving unit of the target hardware unit, and returning the execution result of the target sub-function, where the execution result of the target sub-function may be the acquired output signal of the object to be tested after the preset input signal is input to the object to be tested by the target hardware unit.

Based on the embodiment, the business function in the instance of the target specific implementation program can be called so as to enable the target hardware unit to perform specific working parameter setting, and the functions of measurement, output and the like are realized, so that the test flow or the functional flow corresponding to the test task is completed.

Optionally, in some implementations of the chip testing method of the disclosure, the first service function may include a security defense procedure for a hardware unit, and/or the second service function may include a security defense procedure for a hardware unit, and accordingly, the security defense procedures in the specific implementation procedures are respectively implemented based on physical characteristics of the hardware unit corresponding to the specific implementation procedures. Fig. 6 is a flowchart of another embodiment of the chip testing method of the present disclosure, and fig. 6 illustrates that the first service function and the second service function respectively include a security defending procedure. As shown in fig. 6, in this implementation, operation 2044 may be implemented by:

20442, and performing security check on the setting information of the target working parameters related to the target business function based on the physical characteristics of the target hardware unit through the security defense program in the target business function when the target business function is called.

Responsive to the security check passing, performing an operation 20444; otherwise, in response to the security check failing, the subsequent flow of the present embodiment is not performed, or a prompt message of the security check failing is further output.

20444, according to the setting information of the target working parameters related to the target business function, the target hardware unit is controlled by the driving unit of the target hardware unit to set the target working parameters.

In this implementation, operation 2046 may be implemented as follows:

20462, in response to the currently invoked target business function belonging to the second business function, performing security check on setting information of target working parameters related to the target business function based on physical characteristics of the target hardware unit through a security defense program in the target business function when the target business function is invoked.

Responsive to the security check passing, performing an operation 20464; otherwise, in response to the security check failing, the subsequent flow of the present embodiment is not performed, or a prompt message of the security check failing is further output.

20464, the driving unit of the target hardware unit is used for controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target business function.

For example, the driving unit of the target hardware unit is used for controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target business function under the condition that the target working parameter is at the parameter value corresponding to the setting information.

Based on the embodiment, a security defending program for the hardware unit is set in each specific implementation program, so that when the target business function is called, security check is firstly carried out on setting information related to target working parameters based on physical characteristics of the target hardware unit, and only after the security check is passed, the target hardware unit is controlled to set the target working parameters according to the setting information of the target working parameters, and/or a driving unit of the target hardware unit is used for controlling the target hardware unit to execute operation of a target sub-function corresponding to the target business function, so that the security of the hardware unit can be effectively ensured; in addition, the security defending program is moved down to each specific implementation program to be realized, so that the maintenance and the updating are convenient, and the function implementation efficiency can be improved.

Optionally, in the above embodiment of the chip testing method of the present disclosure, when the acquiring method program of the target function is called in operation 202, determining the target implementation program under the target function according to the test information in the test task, and generating an instance of the target implementation program may include: when the acquisition method program of the target function is called, at least one target specific implementation program under the target function to be called is determined according to the test information, namely, one or more corresponding target specific implementation programs under the target function can be determined through the test information; instantiating the at least one target specific implementation program to obtain an instance of the at least one target specific implementation program, and returning the pointing information of the instance of the at least one target specific implementation program to the test module. Accordingly, in operation 204, when the test module invokes the business function in the instance of the target implementation program, the corresponding business function in the instance of each target implementation program may be sequentially invoked by traversing each of the at least one directional information.

Optionally, in some implementations of the chip testing method of the disclosure, the test information includes at least one target hardware unit identification information, and an identification of each target hardware unit is used to uniquely identify one target hardware unit. Accordingly, in this implementation, in operation 202, the method program for acquiring the target function to be called may specifically determine, based on the at least one target hardware unit identification information in the test information, at least one target specific implementation program under the target function to be called.

Fig. 7 is a flow chart of yet another embodiment of a chip testing method of the present disclosure. The chip testing method of the embodiment of the disclosure may be implemented by the testing module in the embodiment of the chip testing system of the disclosure. As further implementations of the chip testing method of the present disclosure, in this embodiment, the test information may include a pin under test list including identification information of at least one pin under test, where the identification of each pin under test is used to uniquely identify one pin under test. As shown in fig. 7, the chip test method of this embodiment includes:

302, the preset test configuration information is sent to the drive access module based on the test task.

The test configuration information includes a hardware unit identifier, a channel identifier, and a pin identifier, where each hardware unit identifier is used to uniquely identify a hardware unit, each channel identifier is used to uniquely identify a channel on the hardware unit, and the pin identifier is used to uniquely identify a pin of an object to be tested.

304, calling the acquisition method program for the target function in the drive access module based on the test task.

When the target function acquisition method program is called, at least one target hardware unit identifier corresponding to the identifier information of at least one pin to be tested in the test information can be determined based on the test configuration information, and at least one specific implementation program corresponding to the at least one target hardware unit identifier is determined to be at least one target specific implementation program under the target function to be called.

306, calling a business function in an instance of the target specific implementation program, and controlling a target hardware unit to realize a function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target hardware unit is a hardware unit corresponding to the target specific implementation program, and the target driving unit is a driving unit of the target hardware unit.

Operations 302-306 of the present embodiment may be performed by a test module in an embodiment of the chip test system of the present disclosure.

Based on the embodiment, the preset test configuration information can be sent to the drive access module based on the requirements of the test task, namely, which pins need to be subjected to corresponding functions, so that when the acquisition method program of the target function is called, the target specific implementation program to be called in the pin list to be tested can be determined based on the test information, and the corresponding target specific implementation program is called to perform the operation of the corresponding functions on the pin implementation in the pin list to be tested, thereby realizing the corresponding functions.

Optionally, in some implementations of the chip testing method of the disclosure, a test task may be generated first, where the test task includes identification information of a target function and test information, where the test information is used to determine a corresponding specific implementation program; in operation 202 or 302, an acquisition method program for driving the target function in the access module may be invoked based on the identification information of the target function.

Fig. 8 is a flow chart of a further embodiment of the disclosed chip testing method. The chip testing method of the embodiment of the disclosure may be implemented by the testing module in the embodiment of the chip testing system of the disclosure. As shown in fig. 8, the chip test method of this embodiment includes:

And 402, receiving a start test message sent by the sorting equipment, wherein the start test message comprises identification information of an object to be tested and identification information of a target hardware unit.

The identification of each object to be tested is used for uniquely identifying one object to be tested, and the identification of each target hardware unit is used for uniquely identifying one target hardware unit.

404, generating a test task according to the preset test configuration information and the start test information.

The test configuration information may include a correspondence between the input signal and the output signal. The test task may include identification information of the target function and test information, where the identification information of each target function is used to uniquely identify an item target function, and the test information is used to determine a corresponding specific implementation program.

406, calling an acquisition method program of the target function in the drive access module based on the identification information of the target function in the test task.

408, calling a business function in the instance of the target specific implementation program, and controlling a target hardware unit to realize the function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target hardware unit is a hardware unit corresponding to the target specific implementation program, and the target driving unit is a driving unit of the target hardware unit.

410, generating a test result based on the execution result returned by the instance of the target concrete implementation program, and sending ending test information to the sorting equipment.

The ending test information includes the test result, so that the sorting device performs corresponding operations, such as marking, screening, and the like, on the object to be tested based on the test result. For example, if the test result is that the function of the object to be tested is acceptable, the object to be tested may be marked as acceptable; if the test result is that the function of the object to be tested is not qualified, the object to be tested can be marked as being unqualified, and the object to be tested with unqualified function is screened out for removal.

In one embodiment, when a business function in an instance of a target specific implementation program is called to implement a function corresponding to the instance of the target specific implementation program, a preset input signal can be input to an object to be tested through a target hardware unit, an output signal of the object to be tested is collected, the output signal is compared with an input signal corresponding to the preset input signal in test configuration information, and a test result whether the function of the object to be tested is qualified or not is generated according to whether the output signal is consistent with the input signal corresponding to the preset input signal in test configuration information.

Operations 402-410 of the present embodiment may be performed by a test module in an embodiment of a chip test system of the present disclosure.

Fig. 9 is a schematic structural view of one embodiment of a drive access device of the present disclosure. The driving access device of the embodiment of the disclosure can be used as a driving access module in the embodiment of the chip test system of the disclosure to realize the corresponding function of the driving access module. As shown in fig. 9, the drive access device of one embodiment includes: a business function unit 502, a function interface unit 504, and a function implementation unit 506. Wherein:

the function interface unit 504 is configured with an abstract implementation program of each of the plurality of functions.

The function realizing unit 506 is configured with at least one concrete implementation program of the corresponding function realized based on the abstract implementation program of each function, respectively, each concrete implementation program in the at least one concrete implementation program corresponding to one hardware unit supporting the corresponding function, respectively.

The service function unit 502 is configured with an acquisition method program of a specific implementation program of each function, the acquisition method program being configured to: and when the business function in the instance of the target specific implementation program is called, controlling a target hardware unit to realize the function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target hardware unit is a hardware unit corresponding to the target specific implementation program, and the target driving unit is a driving unit of the target hardware unit.

The corresponding relationship between the abstract implementation program configured by the functional interface unit 504, the specific implementation program configured by the functional implementation unit 506, and the acquisition method program configured by the service functional unit 502 can be seen in fig. 2.

According to the embodiment, by configuring an abstract implementation program of each function, at least one specific implementation program of a corresponding function realized based on the abstract implementation program of each function respectively and an acquisition method program of the specific implementation program of each function in a driving access device, the called acquisition method program of the target function can determine the target specific implementation program under the target function according to test information in a test task and generate an instance of the target specific implementation program, and when a business function in the instance of the target specific implementation program is called, a target driving unit can control a target hardware unit to realize the function corresponding to the instance of the target specific implementation program, thereby standardizing a function call interface through the driving access device, realizing a unified function call interface, and breaking through the type limitation of a machine type and a board card of test equipment, and being beneficial to the platformization and sustainability of a product; when the board card needs to be updated in the test equipment, for example, when the type of the board card is increased, reduced and changed, the drive access device is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the board card of a new type can be compatible, the development workload can be greatly reduced, the development period is shortened, and the whole regression test on the upper computer software is not required, so that the workload and time consumption caused by the regression test are avoided, the updating efficiency is improved, and the cost is saved; in addition, the call of each function is isolated to the drive access module, and when the function call needs to be updated and expanded, the drive access device is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the robustness and stability of the upper computer software are maintained.

Fig. 10 is a schematic structural view of another embodiment of the drive access device of the present disclosure. As shown in fig. 10, in the embodiment shown in fig. 9, the functional interface unit 504 may include a plurality of functional interface sub-units, where each of the functional interface sub-units is configured with an abstract implementation program of one of the plurality of functions. Similarly, the function implementing unit 506 may also include a plurality of function implementing sub-units, each of which is configured with at least one specific implementation program of the corresponding function.

Optionally, in some implementations of the drive access device of the present disclosure, each abstract implementation program and each concrete implementation program respectively includes at least one business function, and the at least one business function may include at least one of a first business function and a second business function. The first service function is used for setting working parameters of the hardware unit in the corresponding function, and can comprise one service function or a plurality of service functions according to the implementation requirement of the corresponding function. The second business function is used for realizing at least one sub-function in the corresponding functions, and the sub-function is the function included in the corresponding function. The first business function may include one business function or a plurality of business functions according to the implementation requirements of the corresponding functions, and likewise, the second business function may include one business function or a plurality of business functions.

The first business function may include a security defense procedure for the hardware unit, and/or the second business function may include a security defense procedure for the hardware unit, and accordingly, the security defense procedure in each specific implementation procedure is implemented based on physical characteristics of the corresponding hardware unit of each specific implementation procedure. Correspondingly, when the security defending program in the target specific implementation program is called, the security defending program is used for performing security check on the setting information of the working parameters of the target hardware unit based on the physical characteristics of the target hardware unit, and the first service function can realize the setting of the working parameters of the hardware unit in the corresponding function only after the security check is passed, and the second service function can realize the corresponding sub-function.

Optionally, in some implementations of the drive access device of the present disclosure, the acquisition method program is further configured to: the method comprises the steps that a method program for acquiring a called target function determines at least one target specific implementation program under the target function to be called according to received test information; instantiating the at least one target specific implementation program to obtain an instance of the at least one target specific implementation program, and returning the pointing information of the instance of the at least one target specific implementation program to a calling party, wherein each piece of pointing information in the at least one pointing information is used for calling a business function in the instance of the corresponding target specific implementation program, and the calling party can call the business function in the instance of each corresponding target specific implementation program in turn by traversing each piece of pointing information. The pointing information may include, for example, but is not limited to: pointers, references, etc., embodiments of the present disclosure do not limit the specific implementation of pointing information.

Optionally, in some implementations of the driving access device of the present disclosure, the test information may include a pin to be tested list, where the pin to be tested list includes identification information of at least one pin to be tested, and an identification of each pin to be tested is used to uniquely identify one pin to be tested. Accordingly, in this implementation, the service function unit 502 is further configured to: and receiving and storing test configuration information sent by the test module, wherein the test configuration information comprises hardware unit identifiers, channel identifiers and pin identifiers, each hardware unit identifier is used for uniquely identifying one hardware unit, each hardware unit can provide a plurality of channels, each channel identifier is used for uniquely identifying one channel on the hardware unit, and the pin identifier is used for uniquely identifying one pin of an object to be tested. The object to be tested in the embodiment of the present disclosure may be a wafer before packaging, a chip after packaging, or other products applicable to the embodiment of the present disclosure, and accordingly, the pins to be tested may be connection points on the die in the wafer, or pins of a chip connected through a test slot, which is not limited by the embodiment of the present disclosure.

In the above implementation manner, the method program for acquiring the called target function, according to the test information, determines at least one target specific implementation program under the target function to be called, and may be further configured to: the method comprises the steps of determining at least one target hardware unit identifier corresponding to the identifier information of at least one pin to be tested in test information based on test configuration information, and determining at least one specific implementation program corresponding to the at least one target hardware unit identifier as at least one target specific implementation program under the target function to be called.

Alternatively, in other implementations of the drive access device of the present disclosure, the test information includes at least one target hardware unit identification information, and each target hardware unit identification is used to uniquely identify one target hardware unit. Accordingly, in this implementation manner, the method program for acquiring the called target function, according to the test information, determines at least one target specific implementation program under the target function to be called, and may be further configured to: and determining at least one target specific implementation program under the target function to be called based on at least one target hardware unit identification information in the test information.

The driving access device of the embodiment of the disclosure can be used as a driving access module in the embodiment of the chip test system of the disclosure to realize the corresponding function of the driving access module. The driving access device of the embodiment of the present disclosure and the chip test system of the foregoing embodiment may be referred to each other in terms of specific implementation, and will not be described in detail.

FIG. 11 is a flow chart of one embodiment of a method of driving access of the present disclosure. The drive access method of the embodiment of the present disclosure is applied to the drive access device of any embodiment of the present disclosure. The drive access device is configured with an abstract implementation program of each function in a plurality of functions, at least one concrete implementation program of corresponding functions realized based on the abstract implementation program of each function respectively, and an acquisition method program of the concrete implementation program of each function, wherein the at least one concrete implementation program corresponds to at least one hardware unit supporting the corresponding function in a one-to-one correspondence manner. As shown in fig. 11, the drive access method of one embodiment includes:

602, determining a target specific implementation program under the target function according to the received test information by the called acquisition method program of the target function.

The target function is a function called based on a test task, for example, a function called by a test module, and the target specific implementation program is a specific implementation program under the target function determined according to the test information. The test configuration information may include, but is not limited to: the calling sequence of each business function in the specific implementation program, the setting information (i.e. the setting value) of the working parameters related to each first business function, etc. when the corresponding function is implemented.

At 604, an instance of the target implementation is generated.

606, when the business function in the instance of the target specific implementation program is called, the target driving unit controls the target hardware unit to realize the function corresponding to the instance of the target specific implementation program.

The target hardware unit is a hardware unit corresponding to the target specific implementation program, and the target driving unit is a driving unit of the target hardware unit.

Based on the embodiment, the function calling interface is standardized by driving the access device, so that a unified function calling interface is realized, the type limitation of the type and the board card of the test equipment can be broken through, and the product platformization and the sustainability are facilitated; when the board card needs to be updated in the test equipment, for example, when the type of the board card is increased, reduced and changed, the drive access device is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the board card of a new type can be compatible, the development workload can be greatly reduced, the development period is shortened, and the whole regression test on the upper computer software is not required, so that the workload and time consumption caused by the regression test are avoided, the updating efficiency is improved, and the cost is saved; in addition, the call of each function is isolated to the drive access module, and when the function call needs to be updated and expanded, the drive access device is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the robustness and stability of the upper computer software are maintained.

Optionally, in some implementations of the drive access method of the present disclosure, each abstract implementation program and each concrete implementation program respectively includes at least one business function, and the at least one business function may include at least one of a first business function and a second business function. The first business function is used for realizing the working parameter setting of the hardware unit in the corresponding function, wherein the working parameter is the working parameter which needs to be set for the hardware unit when the corresponding function is realized. The second business function is used for realizing at least one sub-function in the corresponding function, and the sub-function is a function which can be realized in the corresponding function. The first business function may include one business function or a plurality of business functions according to the implementation requirements of the corresponding functions, and likewise, the second business function may include one business function or a plurality of business functions.

Accordingly, in this implementation, in operation 606, in response to the currently invoked target service function belonging to the first service function, when the target service function is invoked, the target hardware unit is controlled by the driving unit of the target hardware unit to set the target working parameter according to the setting information of the target working parameter related to the target service function, where the target working parameter is the working parameter related to the target service function. And when the target business function is called, controlling the target hardware unit to execute the operation of a target sub-function corresponding to the target business function through a driving unit of the target hardware unit, and returning an execution result of the target sub-function, wherein the execution result of the target sub-function can be an acquired output signal of the object to be tested after a preset input signal is input to the object to be tested through the target hardware unit. The object to be tested in the embodiment of the present disclosure may be a wafer before packaging, a chip after packaging, or the like, or may be other products applicable to the embodiment of the present disclosure, which is not limited in the embodiment of the present disclosure.

Optionally, in some implementations of the driving access method of the present disclosure, the first service function may include a security defense procedure for a hardware unit, and/or the second service function may include a security defense procedure for a hardware unit, and accordingly, the security defense procedures in the specific implementation procedures are implemented based on physical characteristics of the hardware unit corresponding to the specific implementation procedures, respectively. Fig. 12 is a flowchart of another embodiment of the method for driving access in the present disclosure, and fig. 12 is an illustration of a first service function and a second service function respectively including a security defense procedure. As shown in fig. 12, on the basis of the embodiment shown in fig. 11, in this embodiment, operation 606 includes:

6062, the business function in the instance of the target implementation (i.e., the target business function) is invoked.

Executing 6064 in response to the currently invoked target business function belonging to the first business function; in response to the currently invoked target business function belonging to the second business function, operation 6068 is performed.

6064, when the target business function is executed, security checking is performed on the setting information of the target operation parameter related to the target business function based on the physical characteristics of the target hardware unit by the security defense program in the target business function.

Responsive to the security check passing, performing operation 6066; otherwise, in response to the security check failing, the subsequent flow of the present embodiment is not performed, or a prompt message of the security check failing is further output.

6066 controlling the target hardware unit to set the target working parameters by the driving unit of the target hardware unit according to the setting information of the target working parameters related to the target business function.

6068, when the target business function is called, by the security defense program in the target business function, security checking is performed on the setting information of the target operation parameters related to the target business function based on the physical characteristics of the target hardware unit.

Responsive to the security check passing, performing operation 6070 responsive to the security check passing; otherwise, in response to the security check failing, the subsequent flow of the present embodiment is not performed, or a prompt message of the security check failing is further output.

6070 controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target business function through the driving unit of the target hardware unit, and returning the execution result of the target sub-function.

Optionally, in some implementations of the drive access method of the present disclosure, in operation 602, the target function acquisition method program determines at least one target implementation program under the target function to be invoked according to the test information. Accordingly, in operation 604, the at least one object-specific implementation program may be instantiated, an instance of the at least one object-specific implementation program is obtained, and pointing information of the instance of the at least one object-specific implementation program is returned, for example, to a test module of an acquisition method program that invokes a target function, where each piece of pointing information in the at least one pointing information is used to correspondingly invoke a business function in each instance of each object-specific implementation program in the at least one object-specific implementation program.

In some implementations of the drive access method of the present disclosure, the test information includes at least one target hardware unit identification information, and an identification of each target hardware unit is used to uniquely identify one target hardware unit. Accordingly, in this implementation manner, in operation 602, the method program for acquiring the target function to be called may specifically determine, based on the at least one target hardware unit identification information in the test information, at least one target specific implementation program under the target function to be called.

Fig. 13 is a flow chart of yet another embodiment of a drive access method of the present disclosure. As further implementations of the drive access method of the present disclosure, in this embodiment, the test information may include a pin under test list including identification information of at least one pin under test, where the identification of each pin under test is used to uniquely identify one pin under test. As shown in fig. 13, the drive access method of this embodiment includes:

702, test configuration information is received and stored.

The test configuration information includes a corresponding relation between hardware unit identifiers, channel identifiers and pin identifiers, wherein each hardware unit identifier is used for uniquely identifying one hardware unit, each channel identifier is used for uniquely identifying one channel on the hardware unit, and the pin identifier is used for uniquely identifying one pin of an object to be tested, and corresponds to the chip and the wafer as the object to be tested.

704, determining at least one target hardware unit identifier corresponding to the identifier information of at least one pin to be tested in the test information based on the test configuration information, and determining at least one specific implementation program corresponding to the at least one target hardware unit identifier as at least one target specific implementation program under the target function to be called.

The target function is a function called based on the test task, such as a function called by the test module.

706, respectively generating instances of the at least one target implementation program.

708, when the business function in the instance of each target implementation program in the at least one target implementation program is called, respectively taking the called business function in the instance of each target implementation program as the target business function.

Executing 710 in response to the currently invoked target business function belonging to the first business function; in response to the currently invoked target business function belonging to the second business function, operation 714 is performed.

When the target service function is executed, the security defending program in the target service function performs security check on the setting information of the target working parameters related to the target service function based on the physical characteristics of the target hardware unit 710.

Responsive to the security check passing, performing operation 712; otherwise, in response to the security check failing, the subsequent flow of the present embodiment is not performed, or a prompt message of the security check failing is further output.

And 712, controlling the target hardware unit to set the target working parameters by the driving unit of the target hardware unit according to the setting information of the target working parameters related to the target business function.

714, by the security defense program in the target service function, security checking is performed on the setting information of the target working parameter related to the target service function based on the physical characteristics of the target hardware unit.

Responsive to the security check passing, performing operation 716; otherwise, in response to the security check failing, the subsequent flow of the present embodiment is not performed, or a prompt message of the security check failing is further output.

716, when the target service function is called, controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target service function by the driving unit of the target hardware unit, and returning the execution result of the target sub-function.

The driving access method in the embodiment of the present disclosure corresponds to an operation executed by the driving access module in the embodiment of the chip testing method in the present disclosure, and specific implementations of the driving access method in the embodiment of the present disclosure and the chip testing method in the embodiment of the present disclosure may be referred to each other, which is not repeated.

In addition, the embodiment of the disclosure also provides a chip testing device, and the chip testing system of any embodiment of the disclosure is deployed on the chip testing device. As shown in fig. 14, a schematic diagram of an embodiment of a chip testing apparatus of the present disclosure is provided, which merely illustrates an example of a chip testing apparatus deploying a chip testing system as in the embodiment of fig. 1.

In this embodiment, the test module in the chip test system may be implemented as upper computer software of the chip test apparatus.

Based on the embodiment, the chip test system of any embodiment is deployed on the chip test equipment, and the function call interface is standardized by driving the access module, so that a unified function call interface is realized, the type limitation of the type and the board card of the test equipment can be broken through, and the product platformization and the sustainability are facilitated; when the board card needs to be updated in the test equipment, for example, when the type of the board card is increased, reduced and changed, the driver access module is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the board card of a new type can be compatible, the development workload can be greatly reduced, the development period is shortened, and the whole regression test on the upper computer software is not required, so that the workload and time consumption caused by the regression test are avoided, the updating efficiency is improved, and the cost is saved; in addition, the call of each function is isolated into the drive access module, and when the function call needs to be updated and expanded, the drive access module is only required to be updated, and the upper computer software of the test equipment is not required to be changed, so that the robustness and stability of the upper computer software are maintained.

The chip test method or drive azimuth method provided by any of the embodiments of the present disclosure may be performed by any suitable device having data processing capabilities, including, but not limited to: terminal equipment, servers, etc. Alternatively, the disclosed chip test method or drive orientation method may be executed by a processor, such as by the processor executing the disclosed chip test method or drive orientation method by invoking corresponding instructions stored in a memory. And will not be described in detail below.

Those of ordinary skill in the art will appreciate that: all or part of the steps of implementing any of the method embodiments described above may be performed by hardware associated with program instructions, and the foregoing program may be stored in a computer readable storage medium, which when executed, performs steps including the method embodiments described above; and the aforementioned storage medium includes: various media that can store program code, such as ROM, RAM, magnetic or optical disks.

In yet another aspect of the disclosed embodiments, there is provided an electronic device including:

a memory for storing a computer program;

and a processor for executing the computer program stored in the memory, and when the computer program is executed, implementing the chip test method or the drive access method of any embodiment of the disclosure.

Fig. 15 is a schematic structural view of an application embodiment of the electronic device of the present disclosure. Next, an electronic device according to an embodiment of the present disclosure is described with reference to fig. 15. The electronic device may be either or both of the first device and the second device, or a stand-alone device independent thereof, which may communicate with the first device and the second device to receive the acquired input signals therefrom.

As shown in fig. 15, the electronic device includes one or more processors 802 and memory 804.

The processor 802 may be a Central Processing Unit (CPU) or other form of processing unit having data processing and/or instruction execution capabilities, and may control other components in the electronic device to perform desired functions.

The memory 804 may store one or more computer program products, and the memory 804 may include various forms of computer-readable storage media, such as volatile memory and/or nonvolatile memory. The volatile memory may include, for example, random Access Memory (RAM) and/or cache memory (cache), and the like. The non-volatile memory may include, for example, read Only Memory (ROM), hard disk, flash memory, and the like. One or more computer program products may be stored on the computer readable storage medium that can be run by the processor 802 to implement the chip test method or drive azimuth method and/or other desired functions of the various embodiments of the disclosure described above.

In one example, the electronic device may further include: input devices 806 and output devices 808, which are interconnected by a bus system and/or other forms of connection mechanisms (not shown).

In addition, the input device 806 may also include, for example, a keyboard, a mouse, and the like.

The output device 808 may output various information to the outside, including the determined distance information, direction information, and the like. The output devices 808 may include, for example, a display, speakers, a printer, and a communication network and remote output devices connected thereto, etc.

Of course, only some of the components of the electronic device relevant to the present disclosure are shown in fig. 15 for simplicity, components such as buses, input/output interfaces, and the like being omitted. In addition, the electronic device may include any other suitable components depending on the particular application.

In addition to the methods and apparatus described above, embodiments of the present disclosure may also be a computer program product comprising computer program instructions which, when executed by a processor, cause the processor to perform steps in a chip test method or a drive azimuth method according to various embodiments of the present disclosure described in the above section of the present description.

The computer program product may write program code for performing the operations of embodiments of the present disclosure in any combination of one or more programming languages, including an object oriented programming language such as Java, C++ or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device, partly on a remote computing device, or entirely on the remote computing device or server.

Furthermore, embodiments of the present disclosure may also be a computer-readable storage medium, having stored thereon computer program instructions, which when executed by a processor, cause the processor to perform steps in a chip test method or a drive azimuth method according to various embodiments of the present disclosure described in the above section of the present disclosure.

The computer readable storage medium may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium may include, for example, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the readable storage medium would include the following: an electrical connection having one or more wires, a portable disk, a hard disk, random Access Memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

The basic principles of the present disclosure have been described above in connection with specific embodiments, however, it should be noted that the advantages, benefits, effects, etc. mentioned in the present disclosure are merely examples and not limiting, and these advantages, benefits, effects, etc. are not to be considered as necessarily possessed by the various embodiments of the present disclosure. Furthermore, the specific details disclosed herein are for purposes of illustration and understanding only, and are not intended to be limiting, since the disclosure is not necessarily limited to practice with the specific details described.

In this specification, each embodiment is described in a progressive manner, and each embodiment is mainly described in a different manner from other embodiments, so that the same or similar parts between the embodiments are mutually referred to. For system embodiments, the description is relatively simple as it essentially corresponds to method embodiments, and reference should be made to the description of method embodiments for relevant points.

The block diagrams of the devices, apparatuses, devices, systems referred to in this disclosure are merely illustrative examples and are not intended to require or imply that the connections, arrangements, configurations must be made in the manner shown in the block diagrams. As will be appreciated by one of skill in the art, the devices, apparatuses, devices, systems may be connected, arranged, configured in any manner. Words such as "including," "comprising," "having," and the like are words of openness and mean "including but not limited to," and are used interchangeably therewith. The terms "or" and "as used herein refer to and are used interchangeably with the term" and/or "unless the context clearly indicates otherwise. The term "such as" as used herein refers to, and is used interchangeably with, the phrase "such as, but not limited to.

The methods and apparatus of the present disclosure may be implemented in a number of ways. For example, the methods and apparatus of the present disclosure may be implemented by software, hardware, firmware, or any combination of software, hardware, firmware. The above-described sequence of steps for the method is for illustration only, and the steps of the method of the present disclosure are not limited to the sequence specifically described above unless specifically stated otherwise. Furthermore, in some embodiments, the present disclosure may also be implemented as programs recorded in a recording medium, the programs including machine-readable instructions for implementing the methods according to the present disclosure. Thus, the present disclosure also covers a recording medium storing a program for executing the method according to the present disclosure.

It is also noted that in the apparatus, devices and methods of the present disclosure, components or steps may be disassembled and/or assembled. Such decomposition and/or recombination should be considered equivalent to the present disclosure.

The previous description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present disclosure. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other aspects without departing from the scope of the disclosure. Thus, the present disclosure is not intended to be limited to the aspects shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

The foregoing description has been presented for purposes of illustration and description. Furthermore, this description is not intended to limit the embodiments of the disclosure to the form disclosed herein. Although a number of example aspects and embodiments have been discussed above, a person of ordinary skill in the art will recognize certain variations, modifications, alterations, additions, and subcombinations thereof.

Claims

1. The chip testing system is characterized by comprising a testing module, a driving access module and a hardware driving module;

the drive access module is configured with an abstract implementation program of each function in a plurality of functions, at least one concrete implementation program of corresponding functions implemented by the abstract implementation program of each function and an acquisition method program of the concrete implementation program of each function, wherein the abstract implementation program of each function is a group of abstract functions which abstract and define the capability supported by test equipment according to the function, and the at least one concrete implementation program corresponds to at least one hardware unit supporting the corresponding function in a one-to-one correspondence manner;

the test module is configured to: calling an acquisition method program of a target function in the drive access module based on a test task, determining a target specific implementation program of the target function according to test information in the test task when the acquisition method program of the target function is called, and generating an instance of the target specific implementation program; calling a business function in an instance of the target specific implementation program, and controlling a target hardware unit to realize a function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target driving unit is a driving unit of the target hardware unit corresponding to the target specific implementation program;

When the test information comprises a pin list to be tested, the pin list to be tested comprises identification information of at least one pin to be tested;

the test module is further configured to: transmitting preset test configuration information to the drive access module based on a test task, wherein the test configuration information comprises a corresponding relation among a hardware unit identifier, a channel identifier and a pin identifier;

when the acquisition method program of the target function is called, determining at least one target specific implementation program under the target function to be called according to the test information, wherein the target specific implementation program is configured to: when the acquisition method program of the target function is called, determining at least one target hardware unit identifier corresponding to the identifier information of the at least one pin to be tested based on the test configuration information, and determining at least one specific implementation program corresponding to the at least one target hardware unit identifier as a target specific implementation program under the target function to be called.

2. The system of claim 1, wherein the abstract implementation and the concrete implementation each comprise at least one business function, the at least one business function comprising at least one of a first business function and a second business function; the first business function is used for realizing the working parameter setting of the hardware unit in the corresponding function, and the second business function is used for realizing at least one sub-function in the corresponding function;

The test module calls a business function in the instance of the target specific implementation program, controls a target hardware unit to realize the function corresponding to the instance of the target specific implementation program through a target driving unit, and is configured to:

respectively calling business functions in the instance of the target specific implementation program according to preset test configuration information;

when the target service function is called, controlling the target hardware unit to set the target working parameters through a driving unit of the target hardware unit according to setting information of the target working parameters related to the target service function in the test configuration information;

and when the target business function is called, controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target business function through the driving unit of the target hardware unit, and returning the execution result of the target sub-function.

3. The system of claim 2, wherein the first business function comprises a security defense procedure for a hardware unit;

The security defending program in the concrete implementation program is realized based on the physical characteristics of the corresponding hardware units of the concrete implementation program;

responding to the fact that a currently called target service function belongs to a first service function, when the target service function is called, controlling the target hardware unit to set target working parameters through a driving unit of the target hardware unit according to setting information of the target working parameters related to the target service function in the test configuration information, and being configured to:

responding to the fact that a currently called target business function belongs to a first business function, and when the target business function is called, performing security check on setting information of target working parameters related to the target business function based on physical characteristics of a target hardware unit through a security defense program in the target business function;

responding to the passing of the safety check, and controlling the target hardware unit to set the target working parameters through a driving unit of the target hardware unit according to the setting information of the target working parameters related to the target business function;

and/or the number of the groups of groups,

the second business function comprises a security defense program for the hardware unit;

In response to the currently called target business function belonging to the second business function, when the target business function is called, controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target business function through the driving unit of the target hardware unit, wherein the operation is configured to:

responding to the fact that a currently called target business function belongs to a second business function, and when the target business function is called, performing security check on setting information of target working parameters related to the target business function based on physical characteristics of the target hardware unit through a security defense program in the target business function;

and responding to the passing of the safety check, and controlling the target hardware unit to execute the operation of the target sub-function corresponding to the target business function through the driving unit of the target hardware unit.

4. The system according to claim 1, wherein when the acquisition method program of the target function is called, determining a target implementation program under the target function according to the test information in the test task, and generating an instance of the target implementation program is configured to:

when the acquisition method program of the target function is called, determining at least one target specific implementation program under the target function to be called according to the test information;

Instantiating the at least one target specific implementation program to obtain an instance of the at least one target specific implementation program, and returning the pointing information of the instance of the at least one target specific implementation program to the test module;

the test module invokes a business function in the instance of the target implementation program configured to:

and traversing each piece of pointing information in the at least one piece of pointing information by the test module, and sequentially calling business functions in the examples of each target specific implementation program in the at least one target specific implementation program.

5. The system of claim 4, wherein when the test information includes at least one target hardware unit identification information, and when the target function acquisition method program is called, determining at least one target implementation program under the target function to be called according to the test information, the at least one target implementation program is configured to:

when the acquisition method program of the target function is called, determining at least one target concrete implementation program under the target function to be called based on the at least one target hardware unit identification information.

6. The system of claim 1, wherein the test module invokes a get method program for a target function in the driver access module based on a test task, configured to:

The test module generates a test task, wherein the test task comprises identification information of the target function and the test information, and the test information is used for determining a corresponding specific implementation program;

and the test module calls the acquisition method program of the target function in the drive access module based on the identification information of the target function.

7. The system of claim 6, wherein the test module generates a test task configured to:

receiving a start test message sent by sorting equipment, wherein the start test message comprises identification information of an object to be tested and identification information of the target hardware unit;

generating the test task according to preset test configuration information and the start test information;

the test module is further configured to:

after a business function in an instance of the target specific implementation program is called, a target driving unit controls a target hardware unit to realize a function corresponding to the instance of the target specific implementation program, a test result is generated based on an execution result returned by the instance of the target specific implementation program, and ending test information is sent to the sorting equipment, wherein the ending test information comprises the test result, so that the sorting equipment executes corresponding operation based on the test result.

8. A method of testing a chip, comprising:

calling an acquisition method program for a target function in a drive access module based on a test task; the drive access module is configured with an abstract implementation program of each function in a plurality of functions, at least one concrete implementation program of corresponding functions realized by the abstract implementation program of each function and an acquisition method program of a concrete implementation program of each function, wherein the abstract implementation program of each function is a group of abstract functions which abstract and define the capability supported by test equipment according to the function, and each concrete implementation program in the at least one concrete implementation program corresponds to one hardware unit supporting the corresponding function;

calling a business function in an instance of the target specific implementation program, and controlling a target hardware unit to realize a function corresponding to the instance of the target specific implementation program through a target driving unit, wherein the target driving unit is a driving unit of the target hardware unit corresponding to the target specific implementation program;

When the test information includes a pin list to be tested, the pin list to be tested includes identification information of at least one pin to be tested, and the method further includes:

transmitting preset test configuration information to a drive access module based on a test task, wherein the test configuration information comprises a corresponding relation among a hardware unit identifier, a channel identifier and a pin identifier;

when the acquisition method program of the target function is called, determining a target specific implementation program under the target function according to the test information in the test task, wherein the method comprises the following steps:

the method program for acquiring the target function determines at least one target hardware unit identifier corresponding to the identifier information of the at least one pin to be tested based on the test configuration information, and determines at least one specific implementation program corresponding to the at least one target hardware unit identifier as a target specific implementation program under the target function to be called.

9. The driving access device is characterized by comprising a service function unit, a function interface unit and a function realization unit;

the function interface unit is configured with abstract implementation programs of various functions in a plurality of functions, wherein the abstract implementation programs of the functions are a group of abstract functions which abstract and define the capability supported by the test equipment according to the functions;

the service function unit is configured with an acquisition method program of the specific implementation program of each function, and the acquisition method program is configured to: the method comprises the steps that a called target function obtaining method program determines a target specific implementation program under the target function according to received test information, and generates an instance of the target specific implementation program, when a business function in the instance of the target specific implementation program is called, a target driving unit controls a target hardware unit to realize a function corresponding to the instance of the target specific implementation program, and the target driving unit is a driving unit of the target hardware unit corresponding to the target specific implementation program;

the service function unit is further configured to: receiving and storing test configuration information sent by a test module, wherein the test configuration information comprises a hardware unit identifier, a channel identifier and a pin identifier;

The method program for acquiring the called target function determines at least one target specific implementation program under the target function to be called according to the test information, and is configured to: the method program for acquiring the target function determines at least one target hardware unit identifier corresponding to the identifier information of the at least one pin to be tested based on the test configuration information, and determines at least one specific implementation program corresponding to the at least one target hardware unit identifier as a target specific implementation program under the target function to be called.

10. The apparatus of claim 9, wherein the functional interface unit includes a plurality of functional interface subunits, each of the plurality of functional interface subunits being configured with an abstract implementation of one of the plurality of functions;

and/or the number of the groups of groups,

the function realizing unit comprises a plurality of function realizing subunits, and each function realizing subunit in the plurality of function realizing subunits is respectively configured with at least one specific realizing program of the corresponding function.

11. The apparatus of claim 9, wherein the abstract implementation procedure and the concrete implementation procedure each comprise at least one business function, the at least one business function comprising at least one of a first business function and a second business function;

The first business function is used for realizing the working parameter setting of the hardware unit in the corresponding function, and the second business function is used for realizing at least one sub-function in the corresponding function.

12. The apparatus according to claim 11, wherein the first business function and/or the second business function comprises a security defense procedure for a hardware unit, the security defense procedure in the implementation-specific procedure being implemented based on physical characteristics of the hardware unit to which the implementation-specific procedure corresponds;

and when the security defense program in the target concrete implementation program is called, the security defense program is used for performing security check on the setting information of the working parameters of the target hardware unit based on the physical characteristics of the target hardware unit.

13. The apparatus of claim 9, wherein the acquisition method program is configured to:

the method comprises the steps of determining at least one target specific implementation program under the target function to be called according to test information by a method program for acquiring the called target function; instantiating the at least one target specific implementation program to obtain an instance of the at least one target specific implementation program, and returning the pointing information of the instance of the at least one target specific implementation program, wherein each piece of pointing information in the at least one pointing information is used for calling a business function in the instance of the corresponding target specific implementation program.

14. The apparatus of claim 13, wherein when the test information includes at least one target hardware unit identification information, the method program for acquiring the called target function, according to the test information, determines at least one target implementation program under the target function to be called, and is configured to:

and determining at least one target specific implementation program under the target function to be called based on the at least one target hardware unit identification information.

15. The drive access method is characterized in that the drive access method is applied to a drive access device, the drive access device is configured with an abstract implementation program of each function in a plurality of functions, at least one concrete implementation program of a corresponding function realized by the abstract implementation program of each function, and an acquisition method program of the concrete implementation program of each function, wherein the abstract implementation program of each function is a group of abstract functions which abstract and define the capability supported by test equipment according to the function, and each concrete implementation program in the at least one concrete implementation program corresponds to one hardware unit supporting the corresponding function;

The method comprises the following steps:

generating an instance of the target implementation program;

when a business function in an instance of the target specific implementation program is called, a target driving unit controls a target hardware unit to realize a function corresponding to the instance of the target specific implementation program, wherein the target driving unit is a driving unit of the target hardware unit corresponding to the target specific implementation program;

receiving and storing test configuration information, wherein the test configuration information comprises a hardware unit identifier, a channel identifier and a pin identifier;

the method program for acquiring the called target function determines a target specific implementation program under the target function according to the received test information, and comprises the following steps:

16. A chip testing apparatus having the chip testing system of any one of claims 1-7 disposed thereon.

17. An electronic device, comprising:

a memory for storing a computer program product;

a processor for executing the computer program product stored in the memory, and when executed, implementing the method of claim 8 or 15.

18. A computer readable storage medium, characterized in that it stores computer program instructions which, when executed by a processor, implement the method of claim 8 or 15.