CN116273994B - Electrical equipment aging test equipment with intelligent feeding and sorting functions - Google Patents
Electrical equipment aging test equipment with intelligent feeding and sorting functions Download PDFInfo
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- CN116273994B CN116273994B CN202310600978.0A CN202310600978A CN116273994B CN 116273994 B CN116273994 B CN 116273994B CN 202310600978 A CN202310600978 A CN 202310600978A CN 116273994 B CN116273994 B CN 116273994B
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- 230000032683 aging Effects 0.000 title claims abstract description 64
- 238000012360 testing method Methods 0.000 title claims abstract description 32
- 238000001514 detection method Methods 0.000 claims abstract description 51
- 238000003825 pressing Methods 0.000 claims description 18
- 230000009471 action Effects 0.000 claims description 9
- 238000010438 heat treatment Methods 0.000 claims description 5
- 238000000034 method Methods 0.000 abstract description 13
- 230000008569 process Effects 0.000 abstract description 10
- 238000013461 design Methods 0.000 abstract description 9
- 238000012544 monitoring process Methods 0.000 abstract description 3
- 239000000428 dust Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 230000035882 stress Effects 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002431 foraging effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C2301/00—Sorting according to destination
- B07C2301/0008—Electronic Devices, e.g. keyboard, displays
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to the technical field of aging detection of electronic components, in particular to electrical appliance aging test equipment with an intelligent feeding and sorting function. The detection items of the power supply module mainly comprise load voltage, load current, shell temperature monitoring and the like, a plurality of aging units respectively conduct electrifying tests on the power supply module placed in the aging units, whether the current of each pin is expected current or not is detected in the test process, the power supply module is in the design temperature under the expected load, electrifying is conducted for a certain period of time, an aging original record list is filled in, the aging original record list is marked as qualified in the design range, and otherwise, the aging original record list is placed in an NG area when the sorting manipulator is transferred. The aging unit has a contact resistance detecting structure when in contact with the power module.
Description
Technical Field
The invention relates to the technical field of electronic component aging detection, in particular to electrical appliance aging test equipment with an intelligent feeding and sorting function.
Background
With the increasing quality requirements of aviation, aerospace, military, industry, civil and other departments on electronic products, the reliability problem of electronic equipment is receiving more and more widespread attention. Screening electronic components is one of the most effective measures to improve electronic devices. The stability of the power module is extremely important as a power supply system of the system, so that the reliability detection of the power module plays a role in the use of electronic products. And the aging test is an indispensable link of the reliability test. The aging test refers to applying certain stress, such as current, voltage, temperature and the like, to the components in a certain time, and is generally higher than normal use stress of the components, so that the components enter an accidental failure period in advance, and early failure products are removed, and the use reliability is improved.
In the related art, according to the GJB548B-2005 microelectronic test method and program and the method 1015.1 burn-in test, the burn-in test of the power supply module is performed; the power module is aged, corresponding rated voltage and current are required to be applied to the power module for aging, and the shell temperature of the device is guaranteed to be at a specified condition value. In the prior art, the aging shell temperature of the power supply module cannot be effectively controlled, the current application is complex, the aging quantity is small at one time, the aging environment is in a box body environment, all the power supply modules are subjected to the same environment temperature when the temperature is controlled in the box body, and the temperature rises of the different power supply modules are different when the power supply modules are electrified, so that the final shell temperature is higher than the temperature required by detection, and the final shell temperature is lower than the temperature required by detection, thereby limiting the efficient performance of the aging test.
Disclosure of Invention
The invention aims to provide electrical appliance aging test equipment with an intelligent feeding and sorting function, so as to solve the problems in the background technology.
In order to solve the technical problems, the invention provides the following technical scheme:
electrical appliance aging test equipment with intelligent feeding and sorting functions comprises a sorting manipulator, a plurality of aging units and a power supply current detection circuit, wherein the sorting manipulator clamps a power module to be detected and is placed in the aging units, the aging units are respectively provided with an independent temperature control structure, and the aging units are connected with the independent power supply current detection circuit.
The detection items of the power supply module mainly comprise load voltage, load current, shell temperature monitoring and the like, a plurality of aging units respectively conduct electrifying tests on the power supply module placed in the aging units, whether the current of each pin is expected current or not is detected in the test process, the power supply module is in the design temperature under the expected load, electrifying is conducted for a certain period of time, an aging original record list is filled in, the aging original record list is marked as qualified in the design range, and otherwise, the aging original record list is placed in an NG area when the sorting manipulator is transferred.
The aging unit has a contact resistance detecting structure when in contact with the power module. When the aging unit supplies power to the power module, the power module is supplied by a mode of contacting with pins, the power module is electrically connected in an actual use process in a sufficient fixing mode such as soldering, the resistance of a connecting position is small, the contact resistance in the test is unstable, and the contact resistance is obviously larger than that in the actual use process when the contact resistance is positioned at an oxide film position or dust is positioned in the middle of the contact resistance, so that the power voltage actually distributed by the aging unit may not reach the power module, and the power module is limited by the contact resistance when outputting current to the outside and cannot reach a normal level, the abnormality of the detection parameter is not caused by the defect of the power module, but the problem exists in the module when the detection parameter is reflected in the field of view of a detector, therefore, the influence of the contact resistance of the aging unit and the power module is eliminated, the corresponding contact resistance needs to be detected first before the influence is eliminated, if the contact resistance is lower, the contact resistance is not treated, and an operator needs to be reminded of paying attention or a clean contact surface is kept clean if the contact surface is higher.
The aging unit comprises a working cavity, a contact seat, a pressing buckle and a hot air duct, wherein the contact seat corresponding to the pin position on the power supply module is arranged at the bottom of the working cavity, the pressing buckle is arranged on the side wall of the working cavity, one end of the hot air duct is connected with an external air source, the other end of the hot air duct is connected with the inner wall of the working cavity, and an independent heating structure is arranged in the hot air duct;
the contact seat comprises an insulating block, a first contact electrode and a second contact electrode, wherein the first contact electrode and the second contact electrode are arranged on the upper surface of the insulating block and are not in contact with each other, voltage is applied between the first contact electrode and the second contact electrode before the aging unit is used for conducting power detection on the power module, and the sum of the resistances of the first contact electrode and the second contact electrode and the pins is detected.
The power supply module is placed in the working cavity, the pressing buckle rotates and presses the power supply module to keep good contact pretightening force with the contact seat, hot air blown in the hot air duct enables the shell of the power supply module to reach the design temperature, and the surface temperature of each power supply module can be detected in sequence in an infrared sensor mode to serve as the power control basis of the heating structure in the hot air duct. In the circuit structure, the contact resistances of the two contact poles and the pins are in a series connection, if the two contact poles are fully electrically connected with the pins, the total resistance is theoretically small, the current on the contact resistance detection circuit is directly determined by the applied voltage and the configured resistance, if the contact resistance is too large, the current detection circuit is more than expected, so that the sum of the contact resistances of the two contact poles and the pins can be obtained through the current detection circuit, the two contact resistances are smaller as long as the sum is smaller, then the two contact resistances can be considered to be synchronous to the specific potential by modifying the circuit structure behind the two contact poles, and the two contact poles can be synchronously connected with the pins in parallel in the circuit to introduce different potentials to perform the power-on test of the power module.
The contact seat also comprises a floating support and a vibrating motor, wherein the floating support is arranged between the insulating block and the bottom surface of the working cavity, and the vibrating motor is arranged in the insulating block.
The vibration motor is started when a large resistor exists between the first contact electrode and the second contact electrode and the pins, the whole vibration of the contact seat is caused, dust on the contact surface of the contact electrode and the pins is discharged or a thin oxide layer is ground off to expose a metal layer, good electric connection is realized, contact resistance is reduced, the floating support is the test condition that the insulating block has vibration conditions, the contact condition of the adjacent pins is not influenced during vibration, and even the partition aging unit is tested.
The vibration motor is electrically connected in the contact resistance detection structure, and the first contact electrode and the second contact electrode are respectively connected in series with the contact resistance of the pin and then connected in parallel with the vibration motor.
When the contact resistance is detected, the contact resistances at the two contact poles are connected in series, the larger the contact resistance is, the smaller the shunt in the detection circuit is, the more current flows through the vibration motor, the vibration motor has larger amplitude, and the electric connection condition of the contact poles and the pins is improved more quickly.
The power supply current detection circuit comprises a first power supply, a first ammeter, a second power supply, a first switch, a second ammeter and a current limiting resistor, wherein the positive electrode of the first power supply is connected with a first contact electrode, the negative electrode of the first power supply is grounded, the first ammeter is arranged on a line at the outlet position of the positive electrode of the first power supply, the negative electrode of the second power supply is grounded, the positive electrode of the second power supply is connected with a second contact electrode, the first switch is arranged between the second power supply and the second contact electrode, the current limiting resistor is arranged at the outlet position of the positive electrode of the second power supply, the second ammeter is arranged at the outlet position of the electrode of the second power supply,
a branch is arranged between the first switch and the second contact electrode, the other end of the branch is connected to different electric potentials according to interface requirements of corresponding pins, and the second switch is arranged on the branch.
In the step of detecting the contact resistance, the first power supply and the second power supply have unequal voltages, potential difference exists at the first contact electrode and the second contact electrode, if the contact resistance is small, the resistance value of the potential difference divided by the current limiting resistance is basically equal to the current displayed on the two ampere meters, if the contact electrode and the pin have larger resistance, the current quantity on the two ampere meters is smaller, the condition of the contact resistance is judged, the vibrating motor wiring terminal is respectively connected with the two contact electrodes and is in parallel connection with the two contact resistances, when the contact resistance is small, most of current is separated, the current passing through the vibrating motor is small, larger vibration is not generated, and the electric connection trend of the pin at the position is full. The branch circuit arranged between the first switch and the second contact electrode acts after the contact resistance is detected, and the two contact electrodes are grounded or connected by adjusting the potential according to the requirement of the power supply module at the pin. In the connection of the voltage input pin of the power supply module, the first ammeter can be directly used as a detection structure for the input load current.
The pressing buckle is rotatably arranged on the side wall of the working cavity, and the rotation of the pressing buckle is interlocked with the operation of the contact resistance detection structure. When the contact resistance detection structure is used for measuring the contact resistance, the pressing buckle is rotated to lock the power module, and the action occurs before the power-on operation inside the power module.
The action arm of the pressing buckle is connected with the rotation drive through a volute spring. The volute spring only transmits fixed torque to the acting arm, namely the pressing force of the pressing buckle on the power module is unchanged.
Compared with the prior art, the invention has the following beneficial effects: according to the invention, the plurality of contact poles are arranged in the contact seat at the same pin, one detection is carried out on the sum of the series connection of the two contact resistances before the power supply module is electrified and detected, the sum of the two contact resistances is kept smaller than the expected degree, then the power supply module is electrified and detected, the electric load fluctuation and error caused by the pin contact resistances are eliminated, the scrapping condition caused by the non-power supply module is prevented, the contact surface is reestablished by using the vibration motor in the contact resistance detection process, dust is removed or the oxidation layer is ground, the metal layer is fully contacted to reduce the connection resistance, the hot air duct independently establishes the operation environment for each power supply module, the modules are all in the design detection temperature for ageing test, the sorting manipulator intelligently feeds materials, the work piece is discharged instead of manpower, and the detection efficiency is improved.
Drawings
The accompanying drawings are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate the invention and together with the embodiments of the invention, serve to explain the invention. In the drawings:
FIG. 1 is a schematic diagram of a lead of a test object power module of the present invention;
FIG. 2 is a schematic diagram of the detection of the power module;
FIG. 3 is a schematic view of a aging unit distribution and sorting robot of the present invention;
FIG. 4 is a schematic view of the structure within the aging unit of the present invention;
fig. 5 is view a of fig. 4;
FIG. 6 is a schematic diagram of the wiring of the current detection circuit at the first and second contacts;
FIG. 7 is a wiring diagram of different branch modes of the current detection circuit of the present invention;
in the figure: the device comprises a 1-aging unit, an 11-workpiece cavity, a 12-contact seat, a 121-insulating block, a 122-first contact electrode, a 123-second contact electrode, a 124-floating support, a 125-vibrating motor, a 13-press buckle, a 14-hot air duct, a 2-sorting manipulator, a 3-power supply current detection circuit, a 31-first power supply, a 32-first ammeter, a 33-second power supply, a 34-first switch, a 35-second switch, a 36-second ammeter, a 37-current limiting resistor, a 9-power supply module and a 91-pin.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Electrical appliance aging test equipment with intelligent feeding and sorting functions comprises a sorting manipulator 2, a plurality of aging units 1 and a power supply current detection circuit 3, wherein a power module 9 to be detected is clamped by the sorting manipulator 2 and placed in the aging units 1, the aging units 1 are respectively provided with an independent temperature control structure, and the aging units 1 are connected with the independent power supply current detection circuit 3.
As shown in fig. 1 to 3, the detection items of the power module 9 mainly include aspects of monitoring load voltage, load current, shell temperature and the like, and the details are that according to the rules of the 'GJB 548B-2005 microelectronic test method and program', a plurality of aging units 1 respectively conduct power-on tests on the power module 9 placed therein, in the test process, detect whether the current of each pin is an expected current, enable the power module 9 to be in the design temperature under the expected load for a certain period of time, conduct power-on, fill in an aging original record list, mark as qualified in the design scope, otherwise place the sorting manipulator 2 in the NG area when transferring.
The aging unit 1 has a contact resistance detecting structure when in contact with the power module 9. When the aging unit 1 supplies power to the power module 9 by contacting with the pins 91, the electrical connection of the power module 9 in the actual use process is a sufficiently fixed mode such as soldering, the resistance of the connection position is small, the contact resistance in the test is unstable, and sometimes the contact resistance is obviously larger than that in the actual use process when the oxidation film position is just positioned or dust is positioned in between, so that the power voltage actually distributed by the aging unit 1 may not reach the inside of the power module 9, and the power module 9 is limited by the contact resistance when outputting current to the outside and cannot reach the normal level, such abnormal detection parameters are not caused by the defects of the power module 9, but are problematic when the module is reacted to the field of view of the detection personnel, so that the influence of the contact resistance of the aging unit 1 and the power module 9 needs to be detected first before the influence is eliminated, if the influence is eliminated, the corresponding contact resistance needs to be detected, the processing can not be performed, and if the influence is higher, the operator needs to be reminded of paying attention to or cleaning the contact surface to keep the contact surface clean.
The aging unit 1 comprises a working cavity 11, a contact seat 12, a pressing buckle 13 and a hot air duct 14, wherein the contact seat 12 corresponding to the position of a pin 91 on the power module 9 is arranged at the bottom of the working cavity 11, the pressing buckle 13 is arranged on the side wall of the working cavity 11, one end of the hot air duct 14 is connected with an external air source, the other end of the hot air duct 14 is connected with the inner wall of the working cavity 11, and an independent heating structure is arranged in the hot air duct 14;
the contact base 12 includes an insulating block 121, a first contact electrode 122, and a second contact electrode 123, where the first contact electrode 122 and the second contact electrode 123 are both mounted on the upper surface of the insulating block 121, the first contact electrode 122 and the second contact electrode 123 are not contacted, and before the aging unit 1 performs power-on detection on the power module 9, a voltage is applied between the first contact electrode 122 and the second contact electrode 123, and the sum of the resistances of the first contact electrode 122 and the second contact electrode 123 and the pin 91 is detected.
As shown in fig. 4 to 6, the power module 9 is placed in the working cavity 11, the pressing buckle 13 rotates and presses the power module 9 to keep good contact pretightening force with the contact seat 12, the hot air blown in by the hot air duct 14 is to make the outer shell of the power module 9 reach the design temperature, and the surface temperature of each power module 9 can be sequentially detected by an infrared sensor mode to be used as the power control basis of the heating structure in the hot air duct 14. In the above-mentioned contact resistance detection structure, the current on the contact resistance detection circuit is determined directly by the applied voltage and the configured resistance, if the contact resistance is too large, the current will be much smaller than expected, so that the sum of the contact resistances of the two contact poles and the pin 91 can be obtained through the current detection circuit, as long as the sum is small, the two contact resistances are considered to be small, then the two contact poles can be synchronously led into a specific potential by modifying the circuit structure behind the two contact poles, and at the moment, the two contact poles are in parallel connection with the pin 91, and the different pins 91 can be led into different potentials for conducting the power-on test of the power module 9.
The contact base 12 further includes a floating support 124 and a vibration motor 125, the floating support 124 is disposed between the insulating block 121 and the bottom surface of the working chamber 11, and the vibration motor 125 is disposed in the insulating block 121.
The vibration motor 125 is started when a large resistance exists between the first contact electrode 122 and the second contact electrode 123 and the pin 91, so that the whole vibration of the contact seat 12 is caused, dust on the contact surface of the contact electrode and the pin 91 is discharged or a thin oxide layer is ground off to expose a metal layer, good electric connection is realized, the contact resistance is reduced, the floating support 124 is provided with a vibration condition for the insulating block 121, the contact condition of the adjacent pin 91 is not influenced during vibration, and even the test condition of the partition wall aging unit 1 is not influenced.
In the contact resistance detection structure, the vibration motor 125 is electrically connected to the first contact electrode 122 and the second contact electrode 123, respectively, in series with the contact resistance of the pin 91, and then in parallel with the vibration motor 125.
During detection of the contact resistance, the contact resistances at the two contact poles are connected in series, the larger the contact resistance is, the smaller the shunt in the detection circuit is, more current flows through the vibration motor 125, the vibration motor 125 has larger amplitude, and the electric connection condition of the contact poles and the pins 91 is improved more quickly.
The power supply detecting circuit 3 comprises a first power supply 31, a first ammeter 32, a second power supply 33, a first switch 34, a second switch 35, a second ammeter 36 and a current limiting resistor 37, wherein the positive electrode of the first power supply 31 is connected with the first contact electrode 122, the negative electrode of the first power supply 31 is grounded, the first ammeter 32 is arranged on a positive electrode wire outlet position line of the first power supply 31, the negative electrode of the second power supply 33 is grounded, the positive electrode of the second power supply 33 is connected with the second contact electrode 123, the first switch 34 is arranged between the second power supply 33 and the second contact electrode 123, the current limiting resistor 37 is arranged at a positive electrode wire outlet position of the second power supply 33, the second ammeter 36 is arranged at a electrode wire outlet position of the second power supply 33,
a branch is arranged between the first switch 34 and the second contact 123, the other end of the branch is connected to different electric potentials according to the interface requirement of the corresponding pin 91, and the second switch 35 is arranged on the branch.
As shown in fig. 6 and 7, in the step of detecting the contact resistance, the first power supply 31 and the second power supply 33 have unequal voltages, a potential difference exists between the first contact electrode 122 and the second contact electrode 123, if the contact resistance is small, the potential difference divided by the resistance value of the current limiting resistor 37 is basically equal to the currents displayed on the two ammeters, if the contact electrode and the pin 91 have larger resistance, the current amounts on the two ammeters are smaller, so that the contact resistance is judged, the terminals of the vibration motor 125 are respectively connected with the two contact electrodes and are in parallel connection with the two contact resistances, and when the contact resistance is small and most of the current is divided, the current passing through the vibration motor 125 is small, no larger vibration is generated, and the electric connection of the pin 91 tends to be sufficient. The branch provided between the first switch 34 and the second contact 123 acts after the contact resistance has been detected, and is grounded or connected to both contacts by adjusting the potential according to the requirements of the power module 9 at the pin 91, fig. 7, the upper side being the connection of the branch to an adjustable positive potential, and the lower side being the ground of the branch. In the connection of the voltage input pin 91 of the power module 9, the first ammeter 32 may be directly used as a detection structure of the input load current.
The press button 13 is rotatably installed on the side wall of the working cavity 11, and the rotation of the press button 13 is interlocked with the operation of the contact resistance detection structure. That is, when the contact resistance detection structure performs contact resistance measurement, the press button 13 is rotated to lock the power module 9, and this action occurs before the power-on operation inside the power module 9.
The action arm of the press buckle 13 is connected with the rotation drive through a volute spring. The spiral spring only transmits a fixed torque to the action arm, i.e. the pressing force of the press button 13 on the power module 9 is unchanged.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Finally, it should be noted that: the foregoing description is only a preferred embodiment of the present invention, and the present invention is not limited thereto, but it is to be understood that modifications and equivalents of some of the technical features described in the foregoing embodiments may be made by those skilled in the art, although the present invention has been described in detail with reference to the foregoing embodiments. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (4)
1. Electrical equipment aging test equipment with intelligent feeding and sorting functions is characterized in that: the testing equipment comprises a sorting manipulator (2), a plurality of aging units (1) and a power supply current detection circuit (3), wherein the sorting manipulator (2) clamps a power module (9) to be detected and is placed in the aging units (1), the aging units (1) are respectively provided with an independent temperature control structure, and the aging units (1) are connected with the independent power supply current detection circuit (3);
the aging unit (1) is provided with a contact resistance detection structure when contacting with the power supply module (9);
the aging unit (1) comprises a working cavity (11), a contact seat (12), a pressing buckle (13) and a hot air duct (14), wherein the contact seat (12) corresponding to the position of a pin (91) on the power module (9) is arranged at the bottom of the working cavity (11), the pressing buckle (13) is arranged on the side wall of the working cavity (11), one end of the hot air duct (14) is connected with an external air source, the other end of the hot air duct is connected with the inner wall of the working cavity (11), and an independent heating structure is arranged in the hot air duct (14);
the contact seat (12) comprises an insulating block (121), a first contact electrode (122) and a second contact electrode (123), wherein the first contact electrode (122) and the second contact electrode (123) are arranged on the upper surface of the insulating block (121), the first contact electrode (122) and the second contact electrode (123) are not contacted, voltage is applied between the first contact electrode (122) and the second contact electrode (123) before the aging unit (1) conducts power-on detection on the power module (9), and the sum of the resistances of the first contact electrode (122) and the second contact electrode (123) and the pin (91) is detected;
the contact seat (12) further comprises a floating support (124) and a vibrating motor (125), wherein the floating support (124) is arranged between the insulating block (121) and the bottom surface of the working cavity (11), and the vibrating motor (125) is arranged in the insulating block (121);
the vibration motor (125) is electrically connected in the contact resistance detection structure, and the first contact electrode (122) and the second contact electrode (123) are respectively connected with the contact resistance of the pin (91) in series and then connected with the vibration motor (125) in parallel.
2. The electrical appliance aging test equipment with intelligent feeding and sorting functions according to claim 1, wherein: the power supply current detection circuit (3) comprises a first power supply (31), a first ammeter (32), a second power supply (33), a first switch (34), a second switch (35), a second ammeter (36) and a current limiting resistor (37), wherein the positive electrode of the first power supply (31) is connected with a first contact electrode (122), the negative electrode of the first power supply (31) is grounded, the first ammeter (32) is arranged on a line at the positive electrode outlet position of the first power supply (31), the negative electrode of the second power supply (33) is grounded, the positive electrode of the second power supply (33) is connected to a second contact electrode (123), a first switch (34) is arranged between the second power supply (33) and the second contact electrode (123), the current limiting resistor (37) is arranged at the positive electrode outlet position of the second power supply (33), the second ammeter (36) is arranged at the electrode outlet position of the second power supply (33),
a branch circuit is arranged between the first switch (34) and the second contact electrode (123), the other end of the branch circuit is connected to different potentials according to the interface requirement of the corresponding pin (91), and a second switch (35) is arranged on the branch circuit.
3. The electrical appliance aging test equipment with intelligent feeding and sorting functions according to claim 1, wherein: the pressing buckle (13) is rotatably arranged on the side wall of the working cavity (11), and the rotation of the pressing buckle (13) is interlocked with the operation of the contact resistance detection structure.
4. An electrical appliance aging test device with intelligent feeding and sorting functions according to claim 3, wherein: the action arm of the pressing buckle (13) is connected with the rotation drive through a volute spring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310600978.0A CN116273994B (en) | 2023-05-26 | 2023-05-26 | Electrical equipment aging test equipment with intelligent feeding and sorting functions |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310600978.0A CN116273994B (en) | 2023-05-26 | 2023-05-26 | Electrical equipment aging test equipment with intelligent feeding and sorting functions |
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| Publication Number | Publication Date |
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| CN116273994A CN116273994A (en) | 2023-06-23 |
| CN116273994B true CN116273994B (en) | 2023-07-21 |
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| CN202310600978.0A Active CN116273994B (en) | 2023-05-26 | 2023-05-26 | Electrical equipment aging test equipment with intelligent feeding and sorting functions |
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Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11126805A (en) * | 1997-10-22 | 1999-05-11 | Matsushita Electric Ind Co Ltd | Method and substrate for inspecting semiconductor integrated circuit |
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| CN215314011U (en) * | 2021-06-24 | 2021-12-28 | 深圳市万福达精密设备股份有限公司 | Automatic online aging equipment for mobile phone |
| CN115213120A (en) * | 2022-09-01 | 2022-10-21 | 北京京瀚禹电子工程技术有限公司 | High-low temperature intelligent testing device and testing method thereof |
| CN115463901A (en) * | 2021-06-11 | 2022-12-13 | 泰克元有限公司 | Socket cleaning device and socket cleaning method |
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2023
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| JPH11126805A (en) * | 1997-10-22 | 1999-05-11 | Matsushita Electric Ind Co Ltd | Method and substrate for inspecting semiconductor integrated circuit |
| US6292003B1 (en) * | 1998-07-01 | 2001-09-18 | Xilinx, Inc. | Apparatus and method for testing chip scale package integrated circuits |
| CN101546721A (en) * | 2008-03-25 | 2009-09-30 | 泰克元有限公司 | Unit for opening insert for test tray and method of mounting semiconductor device using the same |
| CN103977964A (en) * | 2013-02-07 | 2014-08-13 | 泰克元有限公司 | Pressure applying device for testing sorting machine |
| CN104096684A (en) * | 2013-04-03 | 2014-10-15 | 泰克元有限公司 | Sorting Machine For Testing Semiconductor Components |
| CN104971908A (en) * | 2014-04-10 | 2015-10-14 | 泰克元有限公司 | Test sorting machine, propelling device thereof, test tray, and interface board for test machine |
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| CN115463901A (en) * | 2021-06-11 | 2022-12-13 | 泰克元有限公司 | Socket cleaning device and socket cleaning method |
| CN215314011U (en) * | 2021-06-24 | 2021-12-28 | 深圳市万福达精密设备股份有限公司 | Automatic online aging equipment for mobile phone |
| CN113829016A (en) * | 2021-08-10 | 2021-12-24 | 航天科工防御技术研究试验中心 | Intelligent assembling system and method for aging of electronic components |
| CN115213120A (en) * | 2022-09-01 | 2022-10-21 | 北京京瀚禹电子工程技术有限公司 | High-low temperature intelligent testing device and testing method thereof |
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| CN116273994A (en) | 2023-06-23 |
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