CN116225796A - Cross-chip-platform ONU (optical network Unit) production and measurement method and device and electronic equipment - Google Patents
Cross-chip-platform ONU (optical network Unit) production and measurement method and device and electronic equipment Download PDFInfo
- Publication number
- CN116225796A CN116225796A CN202211641114.5A CN202211641114A CN116225796A CN 116225796 A CN116225796 A CN 116225796A CN 202211641114 A CN202211641114 A CN 202211641114A CN 116225796 A CN116225796 A CN 116225796A
- Authority
- CN
- China
- Prior art keywords
- command
- production
- function
- test
- mode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 202
- 230000003287 optical effect Effects 0.000 title claims abstract description 9
- 238000000691 measurement method Methods 0.000 title claims description 3
- 238000012360 testing method Methods 0.000 claims abstract description 242
- 238000012544 monitoring process Methods 0.000 claims abstract description 43
- 230000002093 peripheral effect Effects 0.000 claims abstract description 41
- 238000000034 method Methods 0.000 claims abstract description 25
- 230000006870 function Effects 0.000 claims description 98
- 238000005316 response function Methods 0.000 claims description 39
- 238000013515 script Methods 0.000 claims description 34
- 238000001514 detection method Methods 0.000 claims description 23
- 230000000694 effects Effects 0.000 claims description 22
- 238000007689 inspection Methods 0.000 claims description 22
- 238000013461 design Methods 0.000 claims description 16
- 238000004590 computer program Methods 0.000 claims description 6
- 238000010200 validation analysis Methods 0.000 claims description 6
- 238000004806 packaging method and process Methods 0.000 claims description 4
- 238000011161 development Methods 0.000 abstract description 6
- 238000012986 modification Methods 0.000 abstract description 6
- 230000004048 modification Effects 0.000 abstract description 6
- 230000008569 process Effects 0.000 abstract description 6
- 238000012827 research and development Methods 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 14
- 239000010410 layer Substances 0.000 description 11
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000002346 layers by function Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000011800 void material Substances 0.000 description 3
- 230000003044 adaptive effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000003012 network analysis Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001502 supplementing effect Effects 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Abstract
The invention discloses a cross-chip-platform ONU (optical network Unit) production testing method, device and electronic equipment, which are characterized in that a production testing mode specification, a hardware peripheral monitoring echo specification and a definition production testing command definition specification are prepared, then test items are distinguished according to different test modules based on the production testing mode specification, the hardware peripheral monitoring echo specification and the definition production testing command definition specification, the load of a production testing process brought by chip iteration is solved, the investment of research and development force in a production link is saved, the automatic production testing efficiency is improved, the phenomenon that the production force cannot be formed rapidly due to the fact that the production testing process and flow are different after the development of iterative products is completed is effectively avoided, so that a new product can be rapidly and efficiently pushed out at equipment manufacturers, besides ONU equipment with similar forms, other ONU products based on different development ideas can be used as standard modification.
Description
Technical Field
The present invention relates to the field of ONU device production technologies, and in particular, to a method and an apparatus for ONU production and measurement across chip platforms, and an electronic device.
Background
The ONU equipment consists of a core functional circuit, a public unit such as power supply and management and a communication interface, and the core functional block comprises a user and service multiplexing function, a transmission multiplexing function and an ODN interface function.
The user and service multiplexing functions include assembling information from each user, distributing information to be transmitted to each user, and connecting individual service interface functions; the transmission multiplexing function includes analyzing a signal from the ODN and extracting a portion belonging to the ONU and reasonably arranging information to be transmitted to the ODN; the ODN interface function then provides a range of photophysical interface functions including optical/electrical and electrical/optical conversion.
In the context of the acceleration of chip update and iteration, the phenomenon that devices with the same hardware form adopt different main control chips to make backups or iteration schemes is becoming more common. However, as the development of new products is completed, the new and old production and measurement processes are often asynchronous and non-uniform, and the high-efficiency automatic production and measurement environment with stable operation is also subjected to multiple integration and modification, which aggravates the investment of research and development personnel in the production process, and also causes the reduction of production efficiency, so that the new products cannot well reach the high yield of old equipment, and the phenomenon of slow iterative product output is formed, as shown in fig. 1. To cope with such problems of wasted development force and low efficiency, a test scheme compatible with each main control chip platform is required.
The prior art provides an ONU automatic test method based on a TCL script, which is realized by adopting the TCL script and comprises the following steps: step S1, the OLT automatically configures the ONU functions and judges whether the configuration is successful, if so, the step S2 is carried out; otherwise, automatically reporting errors, and ending the test; step S2, performing streaming test by using a network analysis instrument, judging whether the configuration is successful, and if so, turning to step S3; otherwise, automatically reporting errors, and ending the test; and step S3, acquiring an ONU test result, and ending the test. The method cannot realize the production test of ONU equipment crossing the chip platform.
Disclosure of Invention
The primary purpose of the invention is to provide a cross-chip-platform ONU (optical network Unit) production and test method, which solves the problems that the production flow of a manufacturer is uneven due to the replacement of a main control chip scheme, the period of new product access production is prolonged, and various commands of the chip scheme aggravate the input of research and development forces in a production environment.
A further object of the present invention is to provide an ONU production testing device across chip platforms.
A third object of the present invention is to provide an electronic device.
In order to solve the technical problems, the technical scheme of the invention is as follows:
an ONU production testing method of a cross-chip platform comprises the following steps:
defining a production test mode specification, wherein the production test mode comprises a mode of entering or exiting the production test mode and a production test configuration of the production test mode;
defining a hardware peripheral monitoring echo specification, wherein the hardware peripheral monitoring echo specification takes effect on hardware peripheral monitoring echo and limitation;
defining a production test command definition specification, wherein the production test command definition specification carries out redirection packaging on operation commands of production design;
judging whether the equipment meets the condition of entering the production test mode, if so, enabling the equipment to enter the production test mode, distinguishing test items of the equipment according to different test modules according to the production test mode specification, the hardware external monitoring display specification and the production test command definition specification, and realizing quick release of a production test script;
and checking the equipment by using the obtained production test script, and after the equipment passes, producing the equipment in batches.
Preferably, when the device is judged to be the initial mac, the device is caused to perform the production mode.
Preferably, in the test mode specification, when entering the test mode, the test mode comprises marking the test mode, importing test configuration, configuring test mac, validating and limiting peripheral hardware and unlocking test command, wherein:
marking the yield test mode: designating a mark with the code initial mac as a blank of the device;
leading in the production testing configuration: leading in a production testing mode configuration to the blank plate, wherein the production testing mode configuration comprises Lan side telnet, login url, login account password, LOID, LOID_PASSWD, WIFI account password, streaming configuration, automatic Pon switching and Pon mode;
peripheral hardware validation limit: in the production mode, the specific key function will not be effective, and only the detection echo is returned, the network limitation is not started, and the registration limitation is not started.
Preferably, the hardware peripheral monitoring and displaying specification specifically includes:
the key monitoring standard is that when the equipment is in a production mode and the hardware monitors a key event, the cut-off key is in particular effective, and instead, only the current event type is displayed back:
when the functional pin corresponding to the main chip gpio monitors that a reset key event occurs, outputting RSTPUSH;
when the wifi key event is monitored by the functional pin corresponding to the main chip gpio, outputting WIFIPUSH;
when the wpps key event is monitored to occur by the function pin corresponding to the main chip gpio, outputting WPSPUSH;
when the function pin corresponding to the master chip gpio monitors that the mesh key event occurs, outputting MESSUSH;
usb inspection criteria: when the hardware monitors USB mounting, GETUSB_X can be output to the command line, and the number of USB ports is X;
lighting inspection standard: the method comprises three command modes of lighting all lamps, extinguishing all lamps and recovering lamp states;
voice inspection criteria: the voice test is successful, and unified playback can be performed in the production test mode.
Preferably, the production command defines a specification, specifically:
the original configuration command of the open source code of each chip platform is redirected by using a unified function interface, so that the original configuration command is a universal command with unified format and naming when facing a production operator.
Preferably, in the production test command definition specification, the command adopts a command line repackaging mode, and a linux system native system (cmd) is called; and compiling the function according to a common linux application tool transplanting method when the xproducts are transplanted on different platforms.
Preferably, the xproduct tool defines the following structures and functions:
1) Command structure: the method comprises the steps that an xproduct_cmd is formed, members contained in the command structure body xproduct_cmd are cmd_name, cmd_handler and err_hellp, wherein the cmd_name is of a character string pointer and serves as an instruction name of a traversing instruction; the type of cmd_handler is an int type pointer, which acts as a response function for traversing the instruction; the err_hellp is of a character string pointer and is used as an aid callback of an error prompt;
the effective method comprises the following steps: when traversing and executing a command firstly transmitted from a command line, a command searching function getcmd finds a specific cmd_handler or err_hellp according to cmd_name in a structural body, an executing function executes a response function cmd_handler therein, and an error is executed to print out err_hellp;
2) Command lookup function: getcmd, the command lookup function getcmd contains parameters cmd_ name, checkCmdTab, wherein the type of cmd_name is a string pointer, and the string pointer is used as an incoming instruction name to be searched; the type of CheckCmdTab is a command structure pointer that acts to provide a traversable list of commands;
the effective mode is as follows: the command searching function searches a corresponding executable response function in the CheckCmdTab through the incoming cmd_name, and returns a pointer of the response function;
3) Command execution function: the parameters contained in the command execution function cmd_check_do include cmd_len and cmd_ name, checkCmdTab, wherein the types of cmd_len are integer and are used as the number of parameters contained in the command execution function cmd_check_do; the type of cmd_name is a character string pointer, and acts as an instruction name to be executed; the type of CheckCmdTab is a command structure pointer that acts to provide an executable command list;
the command executing function calls the command searching function getcmd to search the corresponding executable response function in the CheckCmdTab through the incoming cmd_name, then executes the command executing function, if no executable function exists, then outputs 'CmdNoSupport', and if the function execution fails, then outputs an error prompt err_hellp in the command structure;
4) Standard format of response function: the type of the standard format xproduct_xxx_xxx of the response function is integer, the function is used for responding to the function of a specific configuration item, the function naming is adjusted by a developer along with the configuration item, the included parameters comprise command parameter number and command parameter array, wherein the type of the command parameter number is integer and is used as the parameter number included by an instruction to be executed, the type of the command parameter array is a character string array pointer and is used as an integral command input by a command line;
xxx is the format of the general response function and is not a specific function name, and the specific function name needs to be named according to the naming mode of the format 'tool name_function layer command_configuration layer command' in writing codes; in the cross-chip platform production test design, a general response function is a specific instruction used for responding to the input of a command line, a mode of redirecting the command line is adopted, the commands with the same left and right original schemes are packaged into corresponding response functions, and the commands are executed through a system command.
Preferably, the test items of the device are distinguished according to different test modules, specifically:
dividing related test items into an upgrade module, a login module, an optical module detection module, a wireless detection module, a telephone port detection module, a usb module detection, an indicator light detection module, a key detection module, a factory default configuration module, a hardware parameter configuration module and a hardware parameter inspection module, and classifying different test items into an upgrade script, a test script and an inspection script according to test requirements.
An ONU production testing device across a chip platform, comprising:
the system comprises a production test mode specification module, a test module and a test module, wherein the production test mode specification module defines production test mode specifications, and the production test mode comprises a mode of entering or exiting the production test mode and production test configuration of the production test mode;
the hardware peripheral monitoring and displaying standard module defines a hardware peripheral monitoring and displaying standard, and the hardware peripheral monitoring and displaying standard takes effect on hardware peripheral monitoring and displaying and limiting;
the system comprises a production test command definition specification module, a production test command management module and a control module, wherein the production test command definition specification module defines a production test command definition specification which redirects and encapsulates operation commands of production design;
the test script module judges whether the equipment meets the condition of entering the test mode, if so, the equipment enters the test mode, and test items of the equipment are distinguished according to different test modules according to the test mode specification, the hardware peripheral monitoring display specification and the test command definition specification, so that the quick release of the test script is realized;
and the checking module is used for checking the equipment by using the obtained production test script, and the equipment can be produced in batches after the equipment passes the inspection.
An electronic device, comprising:
a memory for storing a computer program;
and the processor is used for realizing the cross-chip-platform ONU production testing method when executing the computer program stored in the memory.
Compared with the prior art, the technical scheme of the invention has the beneficial effects that:
according to the invention, the production test mode specification, the hardware external monitoring display back display specification and the definition production test command definition specification are prepared, and then the test items are distinguished according to different test modules based on the production test mode specification, the hardware external monitoring display back display specification and the definition production test command definition specification, so that the load of a production test process caused by chip iteration is solved, the investment of research and development forces in a production link is saved, the automatic production test efficiency is improved, the phenomenon that the production force cannot be quickly formed due to the fact that the production test process and the flow are different after the development of an iterative product is completed is effectively avoided, new products can be quickly and efficiently pushed out by equipment manufacturers, and besides ONU equipment with similar forms, other ONU products based on development ideas with different forms can be used as standard modification.
Drawings
Fig. 1 is a schematic diagram of a conventional iterative production process of a chip.
Fig. 2 is a schematic diagram of an iterative production flow of a chip after the present invention is used.
Fig. 3 is a schematic diagram of a production mode specification provided in an embodiment.
Fig. 4 is a schematic diagram illustrating an embodiment of entering a test mode.
FIG. 5 is a flow chart of the execution of a yield test command according to an embodiment.
FIG. 6 is a diagram illustrating a format of a yield instruction according to an embodiment.
FIG. 7 is a log diagram of the execution effect of the test command according to the embodiment.
FIG. 8 is a log diagram of the effect of entering the production mode according to the embodiment.
Fig. 9 is a log schematic diagram of a hardware peripheral monitoring effect according to an embodiment.
Fig. 10 is a schematic diagram of a production script module according to an embodiment.
Fig. 11 is a schematic diagram of a production upgrade script provided in an embodiment.
FIG. 12 is a schematic diagram of a test script for production according to an embodiment.
Fig. 13 is a schematic diagram of a production test script according to an embodiment.
Fig. 14 is a schematic diagram of an ONU production testing device with a cross-chip platform according to an embodiment.
Fig. 15 is a schematic diagram of an electronic device according to an embodiment.
Detailed Description
The drawings are for illustrative purposes only and are not to be construed as limiting the present patent;
for the purpose of better illustrating the embodiments, certain elements of the drawings may be omitted, enlarged or reduced and do not represent the actual product dimensions;
it will be appreciated by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted.
The technical scheme of the invention is further described below with reference to the accompanying drawings and examples.
Example 1
The embodiment provides a cross-chip-platform ONU production testing method, as shown in fig. 2, comprising the following steps:
defining a production test mode specification, wherein the production test mode comprises a mode of entering or exiting the production test mode and a production test configuration of the production test mode;
defining a hardware peripheral monitoring echo specification, wherein the hardware peripheral monitoring echo specification takes effect on hardware peripheral monitoring echo and limitation;
defining a production test command definition specification, wherein the production test command definition specification carries out redirection packaging on operation commands of production design;
judging whether the equipment meets the condition of entering the production test mode, if so, enabling the equipment to enter the production test mode, distinguishing test items of the equipment according to different test modules according to the production test mode specification, the hardware external monitoring display specification and the production test command definition specification, and realizing quick release of a production test script;
and checking the equipment by using the obtained production test script, and after the equipment passes, producing the equipment in batches.
The overall framework of the solution is shown in fig. 3: defining a production test mode specification, designing a mode of entering or exiting the production test mode, and carrying out production test configuration under the mode; monitoring and displaying the hardware peripheral (keys, usb, lamp, voice port, etc.) and limiting the hardware peripheral to take effect; redirecting and packaging the operation command of the production design according to the command definition specification; based on the production mode specification, the monitoring display back specification and the command definition specification, the test items are distinguished according to different test modules.
When the device is judged to be the initial mac, the device is made to perform the production mode as shown in fig. 4.
And (3) utilizing the production test mode standard specified by the embodiment to normalize the monitoring feedback of the peripheral hardware in the production mode, and repackaging the command related to production through an xproduct tool. After the display and the command are unified, the test items are distinguished according to the modules, and are classified into three types of upgrading, testing and checking scripts according to different using modes. The following details are made on the production test mode standard, the monitoring echo standard, the production test command definition standard and the test item modularization:
in the production test mode specification, when entering the production test mode, the method comprises the steps of marking the production test mode, importing production test configuration, configuring production test mac, limiting the peripheral hardware to take effect and unlocking the production test command, wherein:
marking the yield test mode: designating a mark with the initial mac of the code as a blank board of the equipment, and importing the blank board into a production testing mode configuration, thereby reducing the influence of the original configuration of different chip schemes on the production of new products;
leading in the production testing configuration: the blank board is imported with a production testing mode configuration, wherein the production testing mode configuration comprises Lan side telnet, login url, login account password, LOID, LOID_PASSWD, WIFI account password, streaming configuration, automatic Pon switching and Pon mode, and the specific table is as follows:
TABLE 1
Peripheral hardware validation limit: in the production mode, the specific key function will not be effective, only the detection return display is returned, the network limitation is not enabled (the dns or wanip limitation function may exist in some manufacturer devices), and the registration limitation (the encryption registration verification limitation function exists in some manufacturer devices).
The hardware peripheral monitoring echo standard specifically comprises the following steps:
key monitoring criteria, when the device is in production mode and the hardware monitors a key event, the truncated key will be in effect and instead only the current event type will be displayed back (key part effect see fig. 7, 9, see table 2 for specific definition):
when the functional pin corresponding to the main chip gpio monitors that a reset key event occurs, outputting RSTPUSH;
when the wifi key event is monitored by the functional pin corresponding to the main chip gpio, outputting WIFIPUSH;
when the wpps key event is monitored to occur by the function pin corresponding to the main chip gpio, outputting WPSPUSH;
when the function pin corresponding to the master chip gpio monitors that the mesh key event occurs, outputting MESSUSH;
usb inspection criteria: when the hardware monitors USB mounting, GETUSB_X can be output to the command line, and the number of USB ports is X;
TABLE 2
The detection and display standard requirement for the equipment expansion mainly comprises keys and USB.
| Detection item | Triggering method and requirement | The requirements of the display |
| Usb | Inserting a U disk to detect | GETUSB |
| Reset key | Pressing the key, the device does not recover and restart, and has corresponding echo display | RSTPUSH |
| WifiKey-press | The key is pressed down and the key is pressed down,wifithe state is unchanged, and the corresponding echo is displayed | WIFIPUSH |
| WPS key | The key is pressed down and the key is pressed down,wpsthe state is unchanged, and the corresponding echo is displayed | WPSPUSH |
| Mesh button | Pressing the key, the mesh state is not changed, and the corresponding echo is displayed | MESHPUSH |
Lighting inspection standard: the method comprises three command modes of lighting all lamps, turning off all lamps and recovering the state of the lamps;
voice inspection criteria: the voice test is successful, and unified feedback display can be performed in the production test mode.
The production test command definition specification specifically comprises the following steps:
the original configuration commands of the open source codes of each chip platform are redirected using a unified function interface, so that when facing the production operator, they are universal commands in a unified format and named, the command format is shown in fig. 6.
Generally, ONU devices need to configure cpu mac, pon model, gpon n, eponsn, and different manufacturers may have some other parameters besides these basic contents, and may be added by themselves according to the standard format defined by the scheme to achieve the objective.
In the production test command definition specification, a command adopts a mode of repackaging a command line, and a linux system native system (cmd) is called; function, when the xproduct is transplanted to different platforms, the function is used according to common lin u x application tool migration method compilation.
The xproduct tool defines the following structures and functions:
1) Command structure: the specific definition of the xproduct_cmd is shown in table 3, and the command structure xproduct_cmd comprises a cmd_name, a cmd_handler and an err_hellp, wherein the cmd_name is of a character string pointer and is used as an instruction name of a traversing instruction; the type of cmd_handler is an int type pointer, which acts as a response function for traversing the instruction; the err_hellp is of a character string pointer and is used as an aid callback of an error prompt;
the effective method comprises the following steps: when traversing and executing a command firstly transmitted from a command line, a command searching function getcmd finds a specific cmd_handler or err_hellp according to cmd_name in a structural body, an executing function executes a response function cmd_handler therein, and an error is executed to print out err_hellp;
TABLE 3 Table 3
2) Command lookup function: getcmd, the specific definition of which is shown in table 4, the parameter included in the command lookup function getcmd has cmd_ name, checkCmdTab, wherein the type of cmd_name is a string pointer, and the string pointer is used as an incoming instruction name to be searched; the type of CheckCmdTab is a command structure pointer that acts to provide a traversable list of commands;
the effective mode is as follows: the command searching function searches a corresponding executable response function in the CheckCmdTab through the incoming cmd_name, and returns a pointer of the response function;
TABLE 4 Table 4
3) Command execution function: the specific definition of the cmd_check_do is shown in table 5, and the parameters contained in the command execution function cmd_check_do include cmd_len and cmd_ name, checkCmdTab, wherein the type of cmd_len is integer and is used as the number of parameters contained in the command to be executed; the type of cmd_name is a character string pointer, and acts as an instruction name to be executed; the type of CheckCmdTab is a command structure pointer that acts to provide an executable command list;
the command executing function calls the command searching function getcmd to search the corresponding executable response function in the CheckCmdTab through the incoming cmd_name, then executes the command executing function, if no executable function exists, then outputs 'CmdNoSupport', and if the function execution fails, then outputs an error prompt err_hellp in the command structure;
TABLE 5
4) Standard format of response function: the specific definition is shown in table 6, the type of the standard format xproduct_xxx_xxx of the response function is integer, the function is used for responding to the function of the specific configuration item, the function naming is adjusted along with the configuration item by a developer, the included parameters comprise command parameter number and command parameter array, wherein the type of the command parameter number is integer and is used as the parameter number included by the command to be executed, the type of the command parameter array is character string array pointer and is used as the integral command input by the command line;
xxx is the format of the general response function and is not a specific function name, and the specific function name needs to be named according to the naming mode of the format 'tool name_function layer command_configuration layer command' in writing codes; in the cross-chip platform production test design, a general response function is a specific instruction used for responding to the input of a command line, adopts a mode of redirecting the command line from the direction, encapsulates the commands with the same left and right original schemes into corresponding response functions, and executes the commands through a system command;
TABLE 6
The test items of the equipment are distinguished according to different test modules, specifically:
the related test items are divided into an upgrade module, a login module, an optical module detection module, a wireless detection module, a telephone port detection module, a usb module detection module, an indicator light detection module, a key detection module, a factory default configuration module, a hardware parameter configuration module and a hardware parameter inspection module as shown in fig. 10, and then different test items are classified into an upgrade script, a test script and an inspection script according to test requirements.
In a specific embodiment, the implementation example is implemented by using a scheme of a wifi-carrying XPON ONU cross-realtek platform and a ZTE platform:
first step, design of equipment production test mode
The realtek is in the startup. C file, and the ZTE solution modifies the zxicd_main. C file. Supplementing void autoAgeingCheck (void) in the start active function main; a function for identifying whether the current mac burns the initial mac of the file, if so, copying the AutoAgreeing.xml (the file needs to be compiled into the version in the compiling stage) of the production configuration of the equipment, and restarting to take effect; the effect of the validation of the parturient model is shown in fig. 8.
And a second step of: hardware monitoring design
ONU equipment hardware peripheral equipment generally distinguishes button, usb. Light up, voice port, wifi calibration (effect show see figure 10)
1. Key inspection criteria:
the target can be achieved by modifying the rtl _gpio.c file void_gpio_ timer (unsigned long data) by realtek, the function judges the event type of pb_is_pushed, a/proc/factory_mode record production and test mode is created, and when the fact that the factory_mode_flag is assigned is monitored, the corresponding key type is returned, and the specific effect is not carried out.
Event PB_WIFIWPSONEFF- > WPSPUSH
Event PB_WIFISW- > WIFIPUSH
Event PB_RESET- > RSTPUSH
The function of the void report_sys_event (s 32 event, u8 pdata, s32 datalen) of the ZTE modification module-gpio.c file judges the factor_mode_status, and if the function judges that the factor_mode_status has been assigned, the key type of the corresponding event is returned, and the specific effect is not performed.
Event EV_KEY_WPS_ACTIVE- > WPSPUSH
Event EV_KEY_WLAN_ONFF- > WIFIPUSH
Event EV_KEY_RESTORE_DEFAULT- > RSTPUSH
2. usb peripheral inspection:
the xproduct.c file monitors/mnt/whether usb_x exists, if usb device mount is successful, check pass output get_x.
3. Lighting inspection standard:
the scheme includes three command modes of turning on all lamps led off, turning off all lamps led off, and restoring the lamp status led restore.
4. Voice port inspection criteria:
and the test can be carried out according to the respective test command of the manufacturer, the program to be tested is finished, and the print success is returned.
And a third step of: command line configuration design
Lightweight linux command tool xproduct (see fig. 6 for format of generic configuration command item); the tool takes a specific effect on a given configuration item at the xproduct.h life declaration function and structure. The execution flow of the command can be seen in fig. 5, and the effect of the command in effect can be seen in fig. 7, 8 and 9.
The following configuration cpu is exemplary:
the RTK scheme is adaptive to the scheme configuration mode, so that the response function can be directly added with command redirection; the ZTE has character format mismatch, and command redirection is continuously added after function addition is performed for adaptive conversion.
1 in the tool, adding a command structure xproduct_cmd for reading the configuration content corresponding to the command item, wherein the structure must include three members, namely a command name pointer const char_name, a response function cmd_handler (int, char [ ]) and a string pointer const char [ ];
2 require defining a getcmd function with a return value of xprodcmd command structure pointer type for looking up the response function corresponding to the input command from the command list and helping the echo.
3 require defining an xproductclicheckdo function whose return value is integer for executing the configuration command.
The xproduct_xxx effective method is that the xproduct_xxx is the format of a general response function and is not a specific function name, and the specific function name needs to be named according to the naming mode of the format tool name_function layer command_configuration layer command in writing codes. For example, the function layer corresponds to (config), the configuration layer corresponds to (cpu), and the canonical writing should be xproduct config cpumac; in the cross-chip platform production test design, a general response function is a specific instruction used for responding to the input of a command line, a mode of redirecting the command line is adopted, the commands with the same left and right original schemes are packaged into corresponding response functions, and the commands are executed through a system command. Upon validation of the cpu mac configuration:
the configuration response function xproduct_config_cpu mac of cpu mac is required to be defined, and the input and output of the RTK scheme are in character formats with continuous character strings, so that the definition method is directly required to be performed according to the general response function format; since the input format of the ZTE scheme is a 16-ary input/output format, the mac conversion function input_str_to_ztemac is defined for the ZTE scheme, and matching is performed on the input character string: the response function can be supplemented continuously through the general configuration function format only by converting the input mac address value into the xxxxxxxxxxxxxxxxxx according to the xxxxxxxxxxxxxxxxxxxx format. According to the above design example, the input categories (command support list see table 7) are distinguished when configuring cpu mac, for example, the cpu mac standard mode is configured as follows: xproduct config cpumac xxxxxxxxxxxx.
TABLE 7
The 4 pairs of xproduct tools define the following initial terms:
definition of tool commands in turn: functional layer (Large test item) - > configuration layer (specific each sub-configuration item)
Parsing the input commands also follows the order in which configuration begins from the functional layer to the configuration layer takes effect, keeping in line with the custom of definition and code writing. Functional layer (see Table 8 for specific definition) and configuration layer (see Table 9) Table 8
TABLE 9
Fourth step: test item design
After the three steps are completed, when the current equipment faces production personnel, the equipment is basically equivalent to equipment with the same scheme, only one ONU equipment is needed to refer to defined test modularization (refer to figure 10) in the process of manufacturing a script template, script classification (figures 11, 12 and 13) is carried out, and the quick release of ONU production scripts under different platforms can be realized by modifying specific values corresponding to parameters.
Example 2
The embodiment provides an ONU production testing device across chip platforms, as shown in fig. 14, including:
the system comprises a production test mode specification module, a test module and a test module, wherein the production test mode specification module defines production test mode specifications, and the production test mode comprises a mode of entering or exiting the production test mode and production test configuration of the production test mode;
the hardware peripheral monitoring and displaying standard module defines a hardware peripheral monitoring and displaying standard, and the hardware peripheral monitoring and displaying standard takes effect on hardware peripheral monitoring and displaying and limiting;
the system comprises a production test command definition specification module, a production test command management module and a control module, wherein the production test command definition specification module defines a production test command definition specification which redirects and encapsulates operation commands of production design;
the test script module judges whether the equipment meets the condition of entering the test mode, if so, the equipment enters the test mode, and test items of the equipment are distinguished according to different test modules according to the test mode specification, the hardware peripheral monitoring display specification and the test command definition specification, so that the quick release of the test script is realized;
and the checking module is used for checking the equipment by using the obtained production test script, and the equipment can be produced in batches after the equipment passes the inspection.
Example 3
The present embodiment provides an electronic device, as shown in fig. 15, including:
a memory for storing a computer program;
and the processor is used for realizing the cross-chip-platform ONU production testing method in the embodiment 1 when executing the computer program stored in the memory.
The same or similar reference numerals correspond to the same or similar components;
the terms describing the positional relationship in the drawings are merely illustrative, and are not to be construed as limiting the present patent;
it is to be understood that the above examples of the present invention are provided by way of illustration only and not by way of limitation of the embodiments of the present invention. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the invention are desired to be protected by the following claims.
Claims (10)
1. The cross-chip-platform ONU production and measurement method is characterized by comprising the following steps:
defining a production test mode specification, wherein the production test mode comprises a mode of entering or exiting the production test mode and a production test configuration of the production test mode;
defining a hardware peripheral monitoring echo specification, wherein the hardware peripheral monitoring echo specification takes effect on hardware peripheral monitoring echo and limitation;
defining a production test command definition specification, wherein the production test command definition specification carries out redirection packaging on operation commands of production design;
judging whether the equipment meets the condition of entering the production test mode, if so, enabling the equipment to enter the production test mode, distinguishing test items of the equipment according to different test modules according to the production test mode specification, the hardware external monitoring display specification and the production test command definition specification, and realizing quick release of a production test script;
and checking the equipment by using the obtained production test script, and after the equipment passes, producing the equipment in batches.
2. The cross-chip ONU production testing method according to claim 1, wherein when the device is judged to be the initial mac, the device is made to perform the production testing mode.
3. The method of ONU production testing across a chip platform according to claim 2, wherein when entering production testing mode in the production testing mode specification, it includes marking production testing mode, importing production testing configuration, configuring production testing mac, peripheral hardware validation limit and unlocking production testing command, wherein:
marking the yield test mode: designating the initial mac of the code as a mark of the device blank;
leading in the production testing configuration: leading in a production testing mode configuration to the blank plate, wherein the production testing mode configuration comprises Lan side telnet, login url, login account password, LOID, LOID_PASSWD, WIFI account password, streaming configuration, automatic Pon switching and Pon mode;
peripheral hardware validation limit: in the production mode, the specific key function will not be effective, and only the detection echo is returned, the network limitation is not started, and the registration limitation is not started.
4. The cross-chip-platform ONU production testing method according to claim 1, wherein said hardware peripheral monitoring echo specification specifically comprises:
the key monitoring standard is that when the equipment is in a production mode and the hardware monitors a key event, the cut-off key is in particular effective, and instead, only the current event type is displayed back:
when the functional pin corresponding to the main chip gpio monitors that a reset key event occurs, outputting RSTPUSH;
when the wifi key event is monitored by the functional pin corresponding to the main chip gpio, outputting WIFIPUSH;
when the wpps key event is monitored to occur by the function pin corresponding to the main chip gpio, outputting WPSPUSH;
when the function pin corresponding to the master chip gpio monitors that the mesh key event occurs, outputting MESSUSH;
usb inspection criteria: when the hardware monitors USB mounting, GETUSB_X can be output to the command line, and the number of USB ports is X;
lighting inspection standard: the method comprises three command modes of lighting all lamps, extinguishing all lamps and recovering lamp states;
voice inspection criteria: the voice test is successful, and unified playback can be performed in the production test mode.
5. The cross-chip-platform ONU production testing method according to claim 1, wherein said production testing command definition specification specifically is:
the original configuration command of the open source code of each chip platform is redirected by using a unified function interface, so that the original configuration command is a universal command with unified format and naming when facing a production operator.
6. The method for ONU production test over a chip platform according to claim 5, wherein in the production test command definition specification, the command is in a command line repackaging manner, and the call is a linux system native system (cmd); and compiling the function according to a common linux application tool transplanting method when the xproducts are transplanted on different platforms.
7. The cross-chip-platform ONU production testing method of claim 6, wherein the xproduct tool defines the following structures and functions:
1) Command structure: the method comprises the steps that an xproduct_cmd, a command structure body xproduct_cmd comprises members including cmd_name, cmd_handler and err_hellp, wherein the cmd_name is of a character string pointer and is used as an instruction name of a traversing instruction, the cmd_handler is of an int type pointer and is used as a response function of the traversing instruction, the err_hellp is of a character string pointer and is used as a help echo of an error prompt;
the effective method comprises the following steps: when traversing and executing a command firstly transmitted from a command line, a command searching function getcmd finds a specific cmd_handler or err_hellp according to cmd_name in a structural body, an executing function executes a response function cmd_handler therein, and an error is executed to print out err_hellp;
2) Command lookup function: getcmd, the command lookup function getcmd contains parameters cmd_ name, checkCmdTab, wherein the type of cmd_name is a string pointer, and the string pointer is used as an incoming instruction name to be searched; the type of CheckCmdTab is a command structure pointer that acts to provide a traversable list of commands;
the effective mode is as follows: the command searching function searches a corresponding executable response function in the CheckCmdTab through the incoming cmd_name, and returns a pointer of the response function;
3) Command execution function: the parameters contained in the command execution function cmd_check_do include cmd_len and cmd_ name, checkCmdTab, wherein the types of cmd_len are integer and are used as the number of parameters contained in the command execution function cmd_check_do; the type of cmd_name is a character string pointer, and acts as an instruction name to be executed; the type of CheckCmdTab is a command structure pointer that acts to provide an executable command list;
the command executing function calls the command searching function getcmd to search the corresponding executable response function in the CheckCmdTab through the incoming cmd_name, then executes the command executing function, if no executable function exists, then outputs 'CmdNoSupport', and if the function execution fails, then outputs an error prompt err_hellp in the command structure;
4) Standard format of response function: the type of the standard format xproduct_xxx_xxx of the response function is integer, the function is used for responding to the function of a specific configuration item, the function naming is adjusted by a developer along with the configuration item, the included parameters comprise command parameter number and command parameter array, wherein the type of the command parameter number is integer and is used as the parameter number included by an instruction to be executed, the type of the command parameter array is a character string array pointer and is used as an integral command input by a command line;
xxx is the format of the general response function and is not a specific function name, and the specific function name needs to be named according to the naming mode of the format 'tool name_function layer command_configuration layer command' in writing codes; in the cross-chip platform yield design, the general response function is a specific instruction used for responding to the input of a command line, adopts a mode of redirecting the command line, encapsulates the commands with the same function of the chip scheme into corresponding homonymous response functions, and executes the commands through a system command.
8. The method for producing and testing the ONU across the chip platform according to claim 7, wherein the distinguishing the test items of the device according to different test modules is specifically as follows:
dividing related test items into an upgrade module, a login module, an optical module detection module, a wireless detection module, a telephone port detection module, a usb module detection, an indicator light detection module, a key detection module, a factory default configuration module, a hardware parameter configuration module and a hardware parameter inspection module, and classifying different test items into an upgrade script, a test script and an inspection script according to test requirements.
9. An ONU production testing device across a chip platform, comprising:
the system comprises a production test mode specification module, a test module and a test module, wherein the production test mode specification module defines production test mode specifications, and the production test mode comprises a mode of entering or exiting the production test mode and production test configuration of the production test mode;
the hardware peripheral monitoring and displaying standard module defines a hardware peripheral monitoring and displaying standard, and the hardware peripheral monitoring and displaying standard takes effect on hardware peripheral monitoring and displaying and limiting;
the system comprises a production test command definition specification module, a production test command management module and a control module, wherein the production test command definition specification module defines a production test command definition specification which redirects and encapsulates operation commands of production design;
the test script module judges whether the equipment meets the condition of entering the test mode, if so, the equipment enters the test mode, and test items of the equipment are distinguished according to different test modules according to the test mode specification, the hardware peripheral monitoring display specification and the test command definition specification, so that the quick release of the test script is realized;
and the checking module is used for checking the equipment by using the obtained production test script, and the equipment can be produced in batches after the equipment passes the inspection.
10. An electronic device, comprising:
a memory for storing a computer program;
a processor configured to implement the cross-chip-platform ONU production testing method according to any one of claims 1-8 when executing the computer program stored on the memory.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211641114.5A CN116225796B (en) | 2022-12-20 | 2022-12-20 | Cross-chip-platform ONU (optical network Unit) production and measurement method and device and electronic equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211641114.5A CN116225796B (en) | 2022-12-20 | 2022-12-20 | Cross-chip-platform ONU (optical network Unit) production and measurement method and device and electronic equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116225796A true CN116225796A (en) | 2023-06-06 |
| CN116225796B CN116225796B (en) | 2023-12-08 |
Family
ID=86583244
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211641114.5A Active CN116225796B (en) | 2022-12-20 | 2022-12-20 | Cross-chip-platform ONU (optical network Unit) production and measurement method and device and electronic equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116225796B (en) |
Citations (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7366961B1 (en) * | 2000-01-24 | 2008-04-29 | Ati Technologies, Inc. | Method and system for handling errors |
| CN102882737A (en) * | 2012-08-24 | 2013-01-16 | 烽火通信科技股份有限公司 | Transaction language-1(TL1) command automatically testing method based on extensible markup language (XML) script |
| CN104270289A (en) * | 2014-10-17 | 2015-01-07 | 上海斐讯数据通信技术有限公司 | ONU automatic testing method based on TCL script |
| CN206117697U (en) * | 2016-09-06 | 2017-04-19 | 深圳极智联合科技股份有限公司 | Multimachine is produced and is surveyed device |
| CN107465530A (en) * | 2016-06-06 | 2017-12-12 | 中兴通讯股份有限公司 | The collocation method and device of optical network unit ONU |
| CN108540217A (en) * | 2018-07-13 | 2018-09-14 | 太仓市同维电子有限公司 | A kind of test method improving OLT test ONT or ONU efficiency |
| US20180307594A1 (en) * | 2015-10-20 | 2018-10-25 | China Electric Power Research Institute Company Limited | System, method and storage device for cim/e model standard compliance test |
| US20190004932A1 (en) * | 2017-06-30 | 2019-01-03 | Infinera Corporation | Unit test and automation framework (utaf) system and method |
| CN109275051A (en) * | 2018-08-16 | 2019-01-25 | 烽火通信科技股份有限公司 | A kind of ONU phonetic function detection method and system |
| CN109471015A (en) * | 2018-10-09 | 2019-03-15 | 佛山中科芯蔚科技有限公司 | A kind of formulating method and system of chip product test specification |
| CN109660887A (en) * | 2018-12-24 | 2019-04-19 | 广州芯德通信科技股份有限公司 | The method that ONU is adapted to different OLT |
| CN109739522A (en) * | 2019-01-03 | 2019-05-10 | 中国—东盟信息港股份有限公司 | A kind of TEE OS adaption system suitable for eSIM application |
| US10353806B1 (en) * | 2015-12-07 | 2019-07-16 | Mx Technologies, Inc. | Multi-platform testing automation |
| CN111190812A (en) * | 2019-12-12 | 2020-05-22 | 华东计算技术研究所（中国电子科技集团公司第三十二研究所） | Automatic test framework based on embedded equipment |
| CN112286741A (en) * | 2020-10-09 | 2021-01-29 | 湖南中联重科智能技术有限公司 | Hardware testing method and device, electronic equipment and storage medium |
| US20210076113A1 (en) * | 2019-09-09 | 2021-03-11 | Viavi Solutions Inc. | Test instruments and methods for emulating optical network terminal (ont) devices and testing optical networks based on the emulation |
| US20210166778A1 (en) * | 2018-10-26 | 2021-06-03 | Changxin Memory Technologies, Inc. | Chip testing method, device, electronic apparatus and computer readable medium |
| CN113962521A (en) * | 2021-09-16 | 2022-01-21 | 杭州博联智能科技股份有限公司 | Method, system, electronic device and storage medium for automatic production test |
-
2022
- 2022-12-20 CN CN202211641114.5A patent/CN116225796B/en active Active
Patent Citations (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7366961B1 (en) * | 2000-01-24 | 2008-04-29 | Ati Technologies, Inc. | Method and system for handling errors |
| CN102882737A (en) * | 2012-08-24 | 2013-01-16 | 烽火通信科技股份有限公司 | Transaction language-1(TL1) command automatically testing method based on extensible markup language (XML) script |
| CN104270289A (en) * | 2014-10-17 | 2015-01-07 | 上海斐讯数据通信技术有限公司 | ONU automatic testing method based on TCL script |
| US20180307594A1 (en) * | 2015-10-20 | 2018-10-25 | China Electric Power Research Institute Company Limited | System, method and storage device for cim/e model standard compliance test |
| US10353806B1 (en) * | 2015-12-07 | 2019-07-16 | Mx Technologies, Inc. | Multi-platform testing automation |
| CN107465530A (en) * | 2016-06-06 | 2017-12-12 | 中兴通讯股份有限公司 | The collocation method and device of optical network unit ONU |
| CN206117697U (en) * | 2016-09-06 | 2017-04-19 | 深圳极智联合科技股份有限公司 | Multimachine is produced and is surveyed device |
| US20190004932A1 (en) * | 2017-06-30 | 2019-01-03 | Infinera Corporation | Unit test and automation framework (utaf) system and method |
| CN108540217A (en) * | 2018-07-13 | 2018-09-14 | 太仓市同维电子有限公司 | A kind of test method improving OLT test ONT or ONU efficiency |
| CN109275051A (en) * | 2018-08-16 | 2019-01-25 | 烽火通信科技股份有限公司 | A kind of ONU phonetic function detection method and system |
| CN109471015A (en) * | 2018-10-09 | 2019-03-15 | 佛山中科芯蔚科技有限公司 | A kind of formulating method and system of chip product test specification |
| US20210166778A1 (en) * | 2018-10-26 | 2021-06-03 | Changxin Memory Technologies, Inc. | Chip testing method, device, electronic apparatus and computer readable medium |
| CN109660887A (en) * | 2018-12-24 | 2019-04-19 | 广州芯德通信科技股份有限公司 | The method that ONU is adapted to different OLT |
| CN109739522A (en) * | 2019-01-03 | 2019-05-10 | 中国—东盟信息港股份有限公司 | A kind of TEE OS adaption system suitable for eSIM application |
| US20210076113A1 (en) * | 2019-09-09 | 2021-03-11 | Viavi Solutions Inc. | Test instruments and methods for emulating optical network terminal (ont) devices and testing optical networks based on the emulation |
| CN111190812A (en) * | 2019-12-12 | 2020-05-22 | 华东计算技术研究所（中国电子科技集团公司第三十二研究所） | Automatic test framework based on embedded equipment |
| CN112286741A (en) * | 2020-10-09 | 2021-01-29 | 湖南中联重科智能技术有限公司 | Hardware testing method and device, electronic equipment and storage medium |
| CN113962521A (en) * | 2021-09-16 | 2022-01-21 | 杭州博联智能科技股份有限公司 | Method, system, electronic device and storage medium for automatic production test |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116225796B (en) | 2023-12-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108628661B (en) | Automatic establishment method of cloud manufacturing service and cloud manufacturing system | |
| CN101212357B (en) | Interface testing method and device | |
| US8010828B2 (en) | Method of providing interoperatibility of different network devices capable of error handling and network device using the same | |
| US10268570B2 (en) | Methods, systems, and computer readable media for automated generation of test files and testing network equipment using same | |
| US7631227B2 (en) | Automated testing and control of networked devices | |
| CN109614313A (en) | Automated testing method, device and computer readable storage medium | |
| CN111338637A (en) | Code generation method and device | |
| CN111399828B (en) | Model-driven logic device modeling method and terminal | |
| US8244844B2 (en) | Tool for data generation for simple network management protocol (SNMP) | |
| CN112035344A (en) | Multi-scenario test method, device, equipment and computer readable storage medium | |
| CN111142878A (en) | SDN operation and maintenance method, device, equipment and readable storage medium | |
| CN112486518A (en) | Consensus algorithm assembling method and device | |
| CN116107893A (en) | Heterogeneous platform embedded software test verification system and method | |
| CN116225796B (en) | Cross-chip-platform ONU (optical network Unit) production and measurement method and device and electronic equipment | |
| US20070220157A1 (en) | Simple network management protocol (SNMP) agent system and method | |
| CN107122307B (en) | Internet of things execution system | |
| US20080126520A1 (en) | Devices, systems and methods for network device conversion | |
| CN101141767A (en) | Network management platform testing system and method | |
| CN106354966B (en) | The method of the conversion of chip id E project file and rapid configuration artificial debugging environment | |
| CN111679942B (en) | Burn-in test method, system and computer readable storage medium | |
| CN111314805B (en) | Debugging method and device for intercommunication OMCI (OMCI) messages of GPON (gigabit passive optical network) system | |
| CN101582928B (en) | Adaptive device and data transmission method for communication of veneer and peripheral device | |
| CN112631894A (en) | Code detection method, device, storage medium and computer equipment | |
| US7206825B1 (en) | System and method for network configuration engine | |
| CN111339100A (en) | Data checking method and device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |