CN115290561A - Co-extruded film abnormal crystal point detection clamp and co-extruded film crystal point detection method - Google Patents
Co-extruded film abnormal crystal point detection clamp and co-extruded film crystal point detection method Download PDFInfo
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- CN115290561A CN115290561A CN202210948048.XA CN202210948048A CN115290561A CN 115290561 A CN115290561 A CN 115290561A CN 202210948048 A CN202210948048 A CN 202210948048A CN 115290561 A CN115290561 A CN 115290561A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
Abstract
The invention provides a fixture for detecting abnormal crystal points of a co-extrusion film, which comprises a first mold and a second mold; the first die and the second die are respectively provided with a die assembly plane, a slicing plane positioned on the upper side and a placing plane positioned on the lower side, the die assembly plane is mutually vertical to the slicing plane and the placing plane, and the die assembly plane is provided with a groove penetrating through the upper surface and the lower surface of the die; when the first die and the second die are closed, the two slicing planes are coplanar, the first die and the second die are closed to clamp the film to be detected between the two closing planes, and the two grooves are opposite to each other to form an observation channel for observing the area to be detected; the invention also provides a co-extruded film crystal point detection method using the co-extruded film abnormal crystal point detection clamp. The fixture for detecting the abnormal crystal points of the co-extruded film is convenient for production personnel to further confirm which material layer the crystal points in the co-extruded film are positioned in.
Description
Technical Field
The invention relates to the field of co-extrusion film crystal point detection, in particular to a co-extrusion film abnormal crystal point detection clamp and a co-extrusion film crystal point detection method.
Background
The method comprises the steps that a plurality of materials are respectively processed into different material layers by a multi-channel heating type co-extruder and then compounded into an integrated thin film, wherein the materials in the material layers are excessively polymerized in the processing process to form 'crystal points' (cross-linked crystal points, oxidized crystal points, non-molten crystal points, impurity crystal points and the like), so that the subsequent printing, compounding and forming use of the co-extruded film are affected besides the appearance defects of the co-extruded film, the co-extruded film is required to be subjected to sampling inspection in the production process, the phenomenon that the co-extruded film has too many 'crystal points' is avoided, the conventional crystal point detection method is to take a planar co-extruded film sample, then a light source is used for irradiating the direction of the co-extruded film, a production person observes the co-extruded film above the co-extruded film to determine the 'crystal points' on the co-extruded film, but the detection method can only know whether the 'crystal points' exist on the co-extruded film, and cannot know which material layer the 'crystal points' are located, so that the processing parameters of a specific heating channel on the multi-extruded film can not be accurately adjusted to eliminate abnormal 'crystal points' on the co-extruded film, and the co-extruded film can not be used for the problem that the raw material can be adjusted to fix the raw material, and the production person can be conveniently obtained by replacing the high crystal point.
Disclosure of Invention
The invention aims to overcome the problem that a device which is convenient for a producer to fix a sample to split a crystal point is absent in the market, and provides a fixture for detecting an abnormal crystal point of a co-extrusion film, so that the producer can fix the sample to split the crystal point conveniently, and the crystal point in the co-extrusion film can be further confirmed to be located in which material layer.
In order to achieve the purpose, the invention adopts the following technical scheme:
the fixture for detecting the abnormal crystal points of the co-extruded film comprises a first mold and a second mold; the first die is provided with a first die closing plane, a first slice plane positioned on the upper side and a first placing plane positioned on the lower side, the first die closing plane is perpendicular to the first slice plane and the first placing plane, and the first die closing plane is provided with a first groove penetrating through the upper surface and the lower surface of the first die; the second die is provided with a second die assembly plane, a second slicing plane positioned on the upper side and a second placing plane positioned on the lower side, the second die assembly plane is perpendicular to the second slicing plane and the second placing plane, and the second die assembly plane is provided with a second groove penetrating through the upper surface and the lower surface of the second die; when the first die and the second die are closed, the first slice plane and the second slice plane are coplanar, the first die and the second die are closed to clamp the film to be detected between the closing planes of the first die and the second die, and the first groove and the second groove oppositely form an observation channel for observing the area to be detected.
Compared with the prior art, the fixture for detecting the abnormal crystal points of the co-extruded film is used for fixing the film to be detected, avoiding the displacement of the film to be detected in the slicing and observing processes, enabling the crystal point part area of the film to be detected to be located in the observing channel, enabling the crystal point part area to be located on the outer edge of the observing channel, slicing and splitting the crystal points through the section of the film cutter blade, adding the auxiliary light source below the observing channel, and then confirming the specific position of the crystal points from the upper part of the observing channel by using the microscope, so that a producer can conveniently and accurately confirm that the crystal points on the film to be detected cut from the co-extruded film are located in which material layer, and further has important significance for selecting raw materials, improving the production process of the multi-layer co-extruded film and improving the quality of the multi-layer co-extruded film; in addition, the die assembly planes of the two dies are required to be perpendicular to the slicing plane and the placing plane, so that the observation channel is ensured to be vertically arranged relative to the slicing plane and the placing plane, and the detection precision is ensured.
Furthermore, the levelness of the first slicing plane, the first placing plane, the second slicing plane and the second placing plane is +/-0.02 mm/m-0.05 mm/m.
The upper surface of the die is required to be used as a reference starting point in the process of slicing the film to be detected by the film cutter blade, and the upper surface of the die has higher levelness, so that the flatness of the section of the sliced film to be detected can be ensured, and the subsequent observation and measurement results are ensured; the lower surface of the die has high levelness, so that when the clamp is placed on a horizontal operation table surface, the upper surface of the clamp is kept parallel relative to a horizontal plane, and the phenomenon that the light of the auxiliary light source enters and the observation of a microscope is influenced due to the fact that the clamp inclines relative to the horizontal plane is avoided.
The invention also aims to provide a co-extruded film crystal point detection method using the above co-extruded film abnormal crystal point detection clamp, which comprises the following steps:
sampling: intercepting an area with crystal points on the co-extruded film as a film to be detected;
fixing the film to be detected: fixing a film to be detected between the die assembly planes of the first die and the second die, wherein the crystal point area of the film to be detected is positioned at the junction of the observation channel and the outer side of the clamp;
cutting the film to be detected: cutting a crystal point area at the junction of the observation channel and the outer side of the clamp by using a film cutting blade to split the crystal point;
searching for abnormal areas: determining the position of the film with abnormal thickness to be detected and determining the material layer with abnormal thickness by using a microscope;
positioning a crystal point: using a microscope to determine the presence or absence of heterogeneous particles on a layer of material having an abnormal thickness;
and (3) repeated detection: intercepting a plurality of films to be detected for detection, and counting detection results of the plurality of films to be detected.
Has the advantages that: the existing crystal point removing method is that after a production worker observes crystal points on a co-extruded film, the problem of raw materials is firstly removed (the improvement condition of the crystal points is observed by replacing the raw materials of different batches layer by layer), and then the problem of equipment is removed (the change condition of the crystal points is observed by changing the process parameters of an extruder so as to judge which material layer the abnormal crystal points are generated on); the process of eliminating the problem of raw materials is long in time consumption, consumes more materials and generates more defective products; the process of eliminating equipment problems takes long time, and the co-extruded film produced after the processing parameters of the extruder are adjusted can cause new problems of crystal points due to overlong heating time and viscosity change, thereby influencing the judgment of production personnel on the original production process; compared with the prior art, the method for detecting the crystal points of the co-extruded film has the advantages that the areas containing the crystal points on the multi-layer co-extruded film are analyzed by using the fixture, the film slicing knife and the microscope for detecting the abnormal crystal points of the co-extruded film, the material layer where the crystal points are located is determined, and after a plurality of representative films to be detected are analyzed, the positions of the material layers mainly appearing in the crystal points are counted, so that the extrusion process of the material layers can be adjusted in a targeted manner, raw materials can be adjusted, the product debugging time can be greatly shortened, the product appearance can be effectively improved, and the method has important significance in producing the multi-layer co-extruded film with stable quality.
Further, the sampling step comprises:
determining the positions of crystal points on the co-extruded film by observing the appearance of the co-extruded film;
and cutting the Amm x Bmm area with the crystal point positioned in the middle part as the film to be detected, wherein A, B is more than 10 and not more than 200.
In the sampling process, the area with the crystal point positioned in the middle is intercepted and used as the film to be detected, so that a sufficient distance is reserved between the crystal point and the edge of the film to be detected, and the position of the film to be detected is adjusted in multiple directions to place the crystal point in the observation channel when the film to be detected is fixed.
Further, the step of fixing the film to be detected includes:
placing the film to be detected between a first die and a second die, wherein a crystal point area of the film to be detected is positioned at the junction of the observation channel and the outer side of the clamp;
the first mold and the second mold are closed;
and fixing the relative positions of the first die and the second die by using a fixing piece, so that the first die and the second die clamp the film to be detected.
Further, the step of fixing the film to be detected further includes:
after the first die and the second die are fixed, detecting whether the upper surfaces of the first die and the second die are positioned on the same horizontal plane, and if not, adjusting the relative positions of the first die and the second die in the vertical direction; and if so, detecting whether the first mold and the second mold are not aligned, otherwise, judging that a crystal point is positioned in a mold closing plane of the first mold and the second mold to enable the first mold and the second mold to be staggered, and adjusting the position of the film to be detected.
The step of fixing the film to be detected also comprises the position correction of the two dies and the position correction of the film to be detected; if the upper surfaces of the first die and the second die are not positioned on the same horizontal plane, the first die and the second die are relatively inclined, so that the observation channel is inclined relative to the horizontal plane, the film to be detected is clamped by the first die and the second die and is inclined relative to the horizontal plane, the subsequent slicing effect of the film to be detected is influenced, and the observation and detection of the sliced film to be detected are influenced; if the first die and the second die are not aligned, it is indicated that a crystal point is not located in a die assembly plane (the thickness of the crystal point is much thicker than that of the normal position of the co-extruded film), so that when the first die and the second die are relatively fixed and clamp the film to be detected, the first die and the second die are staggered, and then the slicing effect and the observation result of the film to be detected are influenced.
Further, the step of cutting the film to be tested includes:
the blade edge of the film cutter blade is tightly attached to the upper surface of the clamp;
the film cutter blade obliquely moves at an included angle of 20-50 degrees relative to the plane where the die assembly plane of the clamp is located to cut the film to be detected.
The arrangement mode has the following beneficial effects:
(1) Because the accuracy of measuring the thickness of the material layer can influence the subsequent finding of an abnormal area, if the moving direction of the film cutter blade during sectioning is vertical to the mold closing plane of the fixture (the film cutter blade horizontally and linearly moves to cut the film to be detected), the blade can generate a friction line (parallel to the boundary between layers) which is the same as the moving direction with the cross section of the film during moving, so that the identification of the boundary between layers is influenced, and the measurement of the thickness of the material layer is influenced; therefore, a certain angle is required to be kept between the cutting trace (cutting moving route) of the blade of the section of the film to be detected and the cutting interface of the film to be detected, so that the blade and a friction line generated by the section of the film form a corresponding angle with a boundary between layers, the identification of the boundary between layers is not influenced, and the higher precision is ensured when the thickness of a material layer is measured;
(2) The film cutter blade is cut into slices at an included angle of 20-50 degrees relative to the plane where the die assembly plane of the clamp is located, so that when the film cutter blade is used for sectioning, different positions of the cutting edge of the film cutter blade are in contact with and cut different positions of a film to be detected, the serrated lines appearing at the edge position of the section of the film to be detected are effectively reduced, the definition of the material layer boundary is improved, and the observation is facilitated.
Further, in the process of searching for the abnormal area, if the thickness of the film body at one position is thicker than that of the film body at the adjacent position by more than 40%, the position is judged to be the position with abnormal thickness; and observing the position with abnormal thickness, and if the thickness of one position in the material layer is increased by more than 40% compared with the thickness of the same material layer at the adjacent position, judging that the material layer is the material layer with abnormal thickness.
Because the molecular weight in the crystal point region is higher than that in the surrounding region, the position of the material layer where the crystal point is located can be directly positioned by directly observing the thickness change of the film to be detected and the thickness change of the material layer.
Furthermore, the microscope is a metallographic microscope with an eyepiece capable of being connected with an electronic display device.
The metallographic microscope can be used for observing a material microstructure, a macrostructure, a fracture structure and the like, so that metallographic images can be directly observed, a metallographic atlas is analyzed, and after an eyepiece of the metallographic microscope is connected with electronic display equipment, production personnel can conveniently observe and measure various indexes of the film to be detected.
Furthermore, the magnification of the objective lens of the microscope is 5-50 times.
The microscope objective lens has a wide magnification range, so that production personnel can conveniently select proper magnification and focal length for observation, and in addition, the microscope objective lens magnification is limited to be 5-50 times, so that the problem that the production personnel cannot distinguish boundary lines among material layers and accurately measure the thickness change of the layer during observation due to the fact that the objective lens magnification is too small is avoided, and the problem that displayed images exceed the boundary of a view screen, and the film body cannot be integrally observed and effectively measured due to the fact that the magnification is too large is avoided.
Drawings
FIG. 1 is a schematic view of a clamp;
FIG. 2 is a top view of the clamp;
FIG. 3 is an exploded view of the clamp;
FIG. 4 is a cross-sectional view of the viewing channel after the fixture has gripped the film to be inspected;
FIG. 5 is a cross-sectional view of the end of the film to be inspected after being cut by the jig;
FIG. 6 is a schematic view of the direction of movement of the film cutting blade;
FIG. 7 is an observation view of an abnormal region found under a microscope;
FIG. 8 is an observation view showing the crystal point observed under a microscope.
Description of reference numerals:
the film detection device comprises a clamp 1, a first mold 10, a first mold closing plane 11, a first slicing plane 12, a first placing plane 13, a first groove 14, a second mold 2, a second mold closing plane 21, a second slicing plane 22, a second placing plane 23, a second groove 24, an observation channel 3, a fixing part 4, a microscope 5 and a film 6 to be detected.
Detailed Description
Embodiments of the present invention are described below with reference to the accompanying drawings:
example one
Referring to fig. 1 to 5, the device for detecting an abnormal crystal point of a co-extruded film of the present embodiment includes a fixture 1 for detecting an abnormal crystal point of a co-extruded film (hereinafter referred to as fixture 1), a film cutter (not shown in the figure), and a microscope 5.
The clamp 1 comprises a first die 10 and a second die 2; the first mold 10 has a first clamping plane 11, a first slice plane 12 located on the upper side, and a first placement plane 13 located on the lower side, the first clamping plane 11 is perpendicular to the first slice plane 12 and the first placement plane 13, and the first clamping plane 11 is provided with a first groove 14 penetrating through the upper surface and the lower surface of the first mold 10; the second mold 2 has a second clamping plane 21, a second slicing plane 22 located on the upper side, and a second placing plane 23 located on the lower side, the second clamping plane 21 is perpendicular to the second slicing plane 22 and the second placing plane 23, and the second clamping plane 21 is provided with a second groove 24 penetrating through the upper surface and the lower surface of the second mold 2; when the first die 10 and the second die 2 are closed, the first slicing plane 12 and the second slicing plane 22 are coplanar, the first die 10 and the second die 2 are closed to clamp the film 6 to be detected between the closing planes of the first die and the second die, and the first groove 14 and the second groove 24 are opposite to form the observation channel 3 for observing the area to be detected.
Referring to fig. 2 and 4, the aperture of the observation channel 3 is not less than 20mm.
Referring to FIG. 4, the levelness of the first slicing plane 12, the first placing plane 13, the second slicing plane 22 and the second placing plane 23 are each. + -. 0.02mm/m to 0.05mm/m.
The upper surface of the die is required to be used as a reference starting point in the process of slicing the film 6 to be detected by the film cutter blade, and the upper surface of the die has higher levelness, so that the smoothness of the section of the sliced film 6 to be detected can be ensured, and the subsequent observation and measurement results are ensured; the lower surface of the clamp 1 has high levelness, so that when the clamp 1 is placed on a horizontal operating platform, the upper surface of the clamp 1 is kept parallel relative to a horizontal plane, and the phenomenon that the light of an auxiliary light source enters and the observation of the microscope 5 are influenced due to the fact that the clamp 1 inclines relative to the horizontal plane is avoided.
Referring to fig. 5, the levelness of the first die closing plane 11 and the levelness of the second die closing plane 21 are both +/-0.02-0.0 mm/m, so that the first die closing plane 11 and the second die closing plane 21 are parallel to each other, and after the clamp 1 is closed, the first die closing plane 11 and the second die closing plane 21 are vertical to the horizontal plane, the film 6 to be detected is vertical to the horizontal plane after the first die 10 and the second die 2 clamp the film 6 to be detected, and the observation precision is improved.
mm/m is a levelness unit, and for example, 1mm/m means that when the bar-type level is placed on a specific plane of the object (the production specification of the object is 1m high), the error of the left side and the right side of the specific plane of the object is 1mm (common knowledge).
Compared with the prior art, the fixture 1 for detecting the abnormal crystal points of the co-extruded film is used for fixing the film 6 to be detected, avoiding the displacement of the film 6 to be detected in the slicing and observing processes, enabling the crystal point part area of the film 6 to be detected to be located in the observing channel 3, enabling the crystal point part area to be located on the outer edge of the observing channel 3, slicing and splitting the crystal points through the cross section of the film cutter blade, adding an auxiliary light source (the arrangement can be omitted under the sufficient external light) below the observing channel 3, and then confirming the specific positions of the crystal points from the upper part of the observing channel 3 by using the microscope 5, so that a producer can quickly and accurately confirm which material layer the crystal points on the film 6 to be detected, which is cut from the co-extruded film, and further has important significance for selecting raw materials, improving the production process of the multi-layer co-extruded film and improving the quality of the multi-layer co-extruded film; in addition, the die assembly planes of the two dies are required to be perpendicular to the slicing plane and the placing plane, so that the observation channel 3 is ensured to be vertically arranged relative to the slicing plane and the placing plane, and the detection precision is ensured.
Referring to fig. 4, the microscope 5 is a metallographic microscope with an eyepiece connectable to an electronic display device.
The metallographic microscope can be used for observing a material microstructure, a macrostructure, a fracture structure and the like, so that a metallographic image can be directly observed, a metallographic map can be analyzed, and after an eyepiece of the optical microscope is connected with electronic display equipment, production personnel can conveniently observe and measure various indexes of the film 6 to be detected.
The objective magnification of the microscope 5 is 5 to 50 times.
The magnification range of the objective lens of the microscope 5 is wide, so that production personnel can conveniently select proper magnification and focal length for observation, in addition, the magnification of the objective lens of the microscope 5 is limited to be 5-50 times, so that the situation that the production personnel cannot distinguish the boundary lines among material layers and accurately measure the thickness change of the layers during observation due to the fact that the magnification of the objective lens is too small is avoided, and the situation that displayed images exceed the boundary of a view screen, and the whole observation and effective measurement of a membrane body cannot be realized due to the fact that the magnification is too large is avoided.
The eyepiece is positioned above the microscope, can be used for observing by eyes or is connected with a computer, and the objective lens is a lens close to an observed object.
Example two
Referring to fig. 5 to 6, another object of the present invention is to provide a method for detecting a crystalline point of a co-extruded film by using the above apparatus for detecting an abnormal crystalline point of a co-extruded film, including:
sampling: intercepting an area with crystal points on the co-extruded film as a film to be detected;
fixing the film to be detected: fixing the film to be detected between the die assembly planes of the first die and the second die, wherein the crystal point area of the film to be detected is positioned at the junction of the observation channel and the outer side of the clamp;
cutting the film to be detected: cutting a crystal point area at the junction of the observation channel and the outer side of the clamp by using a film cutting blade to split the crystal point;
searching for abnormal areas: determining the position of the film with abnormal thickness to be detected and determining the material layer with abnormal thickness by using a microscope;
positioning a crystal point: using a microscope to determine the presence or absence of heterogeneous particles on a layer of material having an abnormal thickness;
and (3) repeated detection: intercepting a plurality of films to be detected for detection, and counting detection results of the plurality of films to be detected.
The sampling step comprises the following steps:
determining the positions of crystal points on the co-extruded film by observing the appearance of the co-extruded film;
and cutting the Amm x Bmm area with the crystal point positioned in the middle part as the film to be detected, wherein A, B is more than 10 and not more than 200.
In the sampling process, the area with the crystal point positioned in the middle is intercepted and used as the film to be detected, so that a sufficient distance is reserved between the crystal point and the edge of the film to be detected, and the position of the film to be detected is adjusted in multiple directions to place the crystal point in the observation channel when the film to be detected is fixed.
The step of fixing the film to be detected includes:
placing the film to be detected between a first die and a second die, wherein a crystal point area of the film to be detected is positioned at the junction of the observation channel and the outer side of the clamp;
the first mold and the second mold are closed;
and fixing the relative positions of the first die and the second die by using a fixing piece, so that the first die and the second die clamp the film to be detected.
The step of fixing the film to be detected further comprises:
after the first die and the second die are fixed, detecting whether the upper surfaces of the first die and the second die are positioned on the same horizontal plane, and if not, adjusting the relative positions of the first die and the second die in the vertical direction; and if so, detecting whether the first mold and the second mold are not aligned, otherwise, judging that a crystal point is positioned in a mold closing plane of the first mold and the second mold to enable the first mold and the second mold to be staggered, and adjusting the position of the film to be detected.
Specifically, the method for detecting whether the upper surfaces of the first mold and the second mold are located on the same horizontal plane comprises the following steps: after the first die and the second die are closed, the lower surface of the clamp is placed on a horizontal operating platform, and a bar-type level meter is used for testing whether the upper surfaces of the first die and the second die are positioned on the same horizontal plane. The method for detecting whether the first die and the second die are not aligned comprises the following steps: after the first mold and the second mold are closed, the fixture is put into the fixture to be erected, the end parts of the fixture are upward, and a bar type level meter is used for testing whether the end parts of the first mold and the second mold are positioned on the same horizontal plane.
The step of fixing the film to be detected also comprises the position correction of the two dies and the position correction of the film to be detected; if the upper surfaces of the first die and the second die are not positioned on the same horizontal plane, the first die and the second die are relatively inclined, so that the observation channel is inclined relative to the horizontal plane, the film to be detected is clamped by the first die and the second die and is inclined relative to the horizontal plane, the subsequent slicing effect of the film to be detected is influenced, and the observation and detection of the sliced film to be detected are influenced; if the first mold and the second mold are not aligned, it is indicated that the crystal point is not located in the mold closing plane (the thickness of the crystal point is much thicker than that of the normal position of the co-extruded film), and when the first mold and the second mold are relatively fixed and clamp the film to be detected, the first mold and the second mold are staggered, so that the slicing effect and the observation result of the film to be detected are influenced.
Referring to fig. 6, in fig. 6, the dark dots in the observation channel represent the crystal dots, and the arrow represents the moving direction of the film cutting blade, and the step of cutting the film to be detected includes:
the blade edge of the film cutter blade is tightly attached to the upper surface of the clamp;
the film cutter blade obliquely moves at an included angle of 20-50 degrees relative to the plane where the die assembly plane of the clamp is located to cut the film to be detected.
The arrangement mode has the following beneficial effects:
(1) Because the accuracy of measuring the thickness of the material layer can influence the subsequent finding of an abnormal area, if the moving direction of the film cutter blade during sectioning is vertical to the mold closing plane of the fixture (the film cutter blade horizontally and linearly moves to cut the film to be detected), the blade can generate a friction line (parallel to the boundary between layers) which is the same as the moving direction with the cross section of the film during moving, so that the identification of the boundary between layers is influenced, and the measurement of the thickness of the material layer is influenced; therefore, a certain angle is required to be kept between the cutting trace (cutting moving route) of the blade of the section of the film to be detected and the cutting interface of the film to be detected, so that the blade and a friction line generated by the section of the film form a corresponding angle with a boundary between layers, the identification of the boundary between layers is not influenced, and the higher precision is ensured when the thickness of a material layer is measured;
(2) The film cutter blade is cut into slices at an included angle of 20-50 degrees relative to the plane where the die assembly plane of the clamp is located, so that when the film cutter blade is used for sectioning, different positions of the cutting edge of the film cutter blade are in contact with and cut different positions of a film to be detected, the serrated lines appearing at the edge position of the section of the film to be detected are effectively reduced, the definition of the material layer boundary is improved, and the observation is facilitated.
When searching for the abnormal area, the film to be detected is placed in a microscope, and the lens of the microscope is adjusted to a proper focal length to observe the thickness change condition of each layer of the film to be detected and the difference between the position of the crystal point and the normal position.
In the process of searching the abnormal area, if the thickness of the film body at one position is thicker than that of the film body at the adjacent position by more than 40%, the position is judged to be the position with abnormal thickness; and observing the position with abnormal thickness, and if the thickness of one position in the material layer is increased by more than 40% compared with the thickness of the same material layer at the adjacent position, judging that the material layer is the material layer with abnormal thickness.
As the processing parameters of the co-extruder fluctuate in the operation process, the thickness of the material layer can change within a certain thickness range, therefore, the 'thickness of the film body is increased by more than 40 percent' is taken as the selected condition of the position with abnormal thickness, and the interference of the position with increased thickness caused by the fluctuation of the processing parameters of the co-extruder is eliminated.
Because the molecular weight in the crystal point region is higher than that in the surrounding region, the position of the material layer where the crystal point is located can be directly positioned by directly observing the thickness change of the film to be detected and the thickness change of the material layer.
Fig. 7 of the present embodiment shows an image displayed by the display when an abnormal region is found, in which a region (marked by an arrow) having a larger thickness than other regions in the film to be detected can be directly observed; fig. 8 of the present embodiment shows an image displayed by the display when a crystal dot is found after finding an abnormal region, wherein the existence of a region (marked by an arrow) with an abnormal increase in thickness in a material layer in the film to be detected can be directly observed. When searching for the abnormal area and positioning the crystal point, the lens adjusting multiple range of the microscope is close (the lens is finely adjusted to accurately observe the crystal point after the abnormal area is found), and the crystal point is searched by moving the position of the clamp relative to the microscope.
Has the advantages that: the existing crystal point removing method is that after a production worker observes crystal points on a co-extruded film, the problem of raw materials is firstly removed (the improvement condition of the crystal points is observed by replacing the raw materials of different batches layer by layer), and then the problem of equipment is removed (the change condition of the crystal points is observed by changing the process parameters of an extruder so as to judge which material layer the abnormal crystal points are generated on); the process of eliminating the problem of raw materials is long in time consumption, consumes more materials and generates more defective products; the process of eliminating equipment problems takes long time, and the co-extruded film produced after the processing parameters of the extruder are adjusted can cause new problems of crystal points due to overlong heating time and viscosity change, thereby influencing the judgment of production personnel on the original production process; compared with the prior art, the method for detecting the crystal points of the co-extruded film analyzes the area containing the crystal points on the multi-layer co-extruded film by using the fixture for detecting the abnormal crystal points of the co-extruded film, the film slicing knife and the microscope, determines the material layer where the crystal points are located, and counts the positions of the material layers mainly appearing at the crystal points after analyzing a plurality of representative films to be detected, so that the extrusion process of the material layers can be adjusted in a targeted manner, the raw materials can be adjusted, the product debugging time can be greatly shortened, the product appearance can be effectively improved, and the method has important significance for producing the multi-layer co-extruded film with stable quality.
Variations and modifications to the above-described embodiments may occur to those skilled in the art based upon the disclosure and teachings of the above specification. Therefore, the present invention is not limited to the specific embodiments disclosed and described above, and some modifications and variations of the present invention should fall within the scope of the claims of the present invention. Furthermore, although specific terms are employed herein, they are used in a generic and descriptive sense only and not for purposes of limitation.
Claims (10)
1. Crowded membrane anomaly crystal point detection anchor clamps altogether, its characterized in that includes:
the first die is provided with a first die assembly plane, a first slice plane positioned on the upper side and a first placing plane positioned on the lower side, the first die assembly plane is perpendicular to the first slice plane and the first placing plane, and the first die assembly plane is provided with a first groove penetrating through the upper surface and the lower surface of the first die;
the second die is provided with a second die assembly plane, a second slicing plane positioned on the upper side and a second placing plane positioned on the lower side, the second die assembly plane is perpendicular to the second slicing plane and the second placing plane, and the second die assembly plane is provided with a second groove penetrating through the upper surface and the lower surface of the second die;
when the first die and the second die are closed, the first slice plane and the second slice plane are coplanar, the first die and the second die are closed to clamp the film to be detected between the closing planes of the first die and the second die, and the first groove and the second groove oppositely form an observation channel for observing the area to be detected.
2. The fixture for detecting the abnormal crystal points of the co-extruded film as claimed in claim 1, wherein the levelness of the first slicing plane, the first placing plane, the second slicing plane and the second placing plane is ± 0.02mm/m to 0.05mm/m.
3. The co-extruded film crystal dot detection method using the co-extruded film abnormal crystal dot detection clamp of any one of claims 1 to 2, comprising:
sampling: intercepting an area with crystal points on the co-extruded film as a film to be detected;
fixing the film to be detected: fixing a film to be detected between the die assembly planes of the first die and the second die, wherein the crystal point area of the film to be detected is positioned at the junction of the observation channel and the outer side of the clamp;
cutting the film to be detected: cutting a crystal point area at the junction of the observation channel and the outer side of the clamp by using a film cutting blade to split the crystal point;
searching for abnormal areas: determining the position of the film with abnormal thickness to be detected and determining the material layer with abnormal thickness by using a microscope;
positioning a crystal point: using a microscope to determine the presence or absence of heterogeneous particles on a layer of material having an abnormal thickness;
and (4) repeated detection: and intercepting a plurality of films to be detected for analysis.
4. The method for detecting the crystal points of the co-extruded film according to claim 3, wherein the step of sampling comprises:
determining the positions of crystal points on the co-extruded film by observing the appearance of the co-extruded film;
and cutting the Amm x Bmm area with the crystal point positioned in the middle part as the film to be detected, wherein A, B is more than 10 and not more than 200.
5. The method for detecting the crystal point of the co-extruded film according to claim 3, wherein the step of fixing the film to be detected comprises:
placing the film to be detected between a first die and a second die, wherein a crystal point area of the film to be detected is positioned at the junction of the observation channel and the outer side of the clamp;
the first mold and the second mold are closed;
and fixing the relative positions of the first die and the second die by using a fixing piece, so that the first die and the second die clamp the film to be detected.
6. The method for detecting the crystal point of the co-extruded film according to claim 5, wherein the step of fixing the film to be detected further comprises:
after the first mold and the second mold are fixed, detecting whether the upper surfaces of the first mold and the second mold are positioned on the same horizontal plane, and if not, adjusting the relative positions of the first mold and the second mold in the vertical direction; and if so, detecting whether the first mold and the second mold are not aligned, otherwise, judging that a crystal point is positioned in a mold closing plane of the first mold and the second mold to enable the first mold and the second mold to be staggered, and adjusting the position of the film to be detected.
7. The method for detecting the crystal points of the co-extruded film according to claim 3, wherein the step of cutting the film to be detected comprises the following steps:
the blade edge of the film cutting blade is tightly attached to the upper surface of the clamp;
the film cutter blade obliquely moves at an included angle of 20-50 degrees relative to the plane of the die assembly plane of the clamp to cut the film to be detected.
8. The method for detecting the crystal points of the co-extruded films according to claim 3, wherein in the process of searching for the abnormal area, if the thickness of the film body at one position is increased by more than 40% compared with the thickness of the film body at the adjacent position, the position is judged to be the position with abnormal thickness; and observing the position with abnormal thickness, and if the thickness of one position in the material layer is increased by more than 40% compared with the thickness of the same material layer at the adjacent position, judging that the material layer is the material layer with abnormal thickness.
9. The method for detecting the crystal point of the co-extruded film according to claim 3, wherein the microscope is a metallographic microscope with an eyepiece capable of being connected with an electronic display device.
10. The method for detecting the crystal point of the co-extruded film according to claim 3, wherein the microscope has an objective lens magnification of 5-50 times.
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|---|---|---|---|
| CN202210948048.XA CN115290561A (en) | 2022-08-09 | 2022-08-09 | Co-extruded film abnormal crystal point detection clamp and co-extruded film crystal point detection method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210948048.XA CN115290561A (en) | 2022-08-09 | 2022-08-09 | Co-extruded film abnormal crystal point detection clamp and co-extruded film crystal point detection method |
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| Publication Number | Publication Date |
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| CN115290561A true CN115290561A (en) | 2022-11-04 |
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|---|---|---|---|
| CN202210948048.XA Pending CN115290561A (en) | 2022-08-09 | 2022-08-09 | Co-extruded film abnormal crystal point detection clamp and co-extruded film crystal point detection method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115290561A (en) |
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2022
- 2022-08-09 CN CN202210948048.XA patent/CN115290561A/en active Pending
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