CN115252117B

CN115252117B - Intense pulse light therapeutic apparatus capable of monitoring light source luminous energy and energy monitoring method

Info

Publication number: CN115252117B
Application number: CN202211133724.4A
Authority: CN
Inventors: 吴小松; 于航; 颜培华
Original assignee: Zhuhai Xigu Medical Technology Co ltd
Current assignee: Zhuhai Xigu Medical Technology Co ltd
Priority date: 2022-09-19
Filing date: 2022-09-19
Publication date: 2022-12-13
Anticipated expiration: 2042-09-19
Also published as: CN116392722A; CN115252117A

Abstract

The invention discloses an intense pulse light therapeutic apparatus capable of monitoring luminous energy of a light source and an energy monitoring method. The intense pulse light therapeutic apparatus comprises an intense pulse light source, a monitoring light path, an attenuation unit and a first monitoring unit. The monitoring light path is used for capturing a part of light emitted by the intense pulse light source during power-on work, the attenuation unit is used for attenuating the captured light and providing the attenuated light to the first monitoring unit, and the first monitoring unit is used for measuring the luminous energy of the intense pulse light source during power-on work according to the attenuated light. The invention also relates to a luminous energy monitoring method. The invention remarkably attenuates the light emitted by the intense pulse light source after sampling through the innovative monitoring light path and the attenuation unit so as to enable the light to accord with the monitoring range, and the luminous energy of the intense pulse light source can be accurately measured in real time.

Description

Intense pulse light therapeutic apparatus capable of monitoring light source luminous energy and energy monitoring method

Technical Field

The invention belongs to the technical field of intense pulse light sources, and particularly relates to an intense pulse light therapeutic apparatus capable of monitoring the luminous energy of a light source and a luminous energy monitoring method thereof.

Background

An intense-pulse light source is a light source that can emit light with a very high intensity, also called intense pulse light. After being focused and filtered, the intense pulse light can form high-energy light (namely, the high-energy light becomes wide-spectrum light) with a certain wavelength range and is emitted in a pulse mode. Intense pulsed light is essentially incoherent ordinary light rather than laser light. At present, intense pulsed light sources have been widely used in the medical field to improve light therapy techniques, for example for skin beauty.

However, the intense pulse light source naturally attenuates with use, and the function of many intense pulse light therapeutic apparatuses is significantly reduced after the attenuation. For intense pulse light source products in light therapy, it also further affects therapy.

Taking an intense pulse light therapeutic apparatus as an example, the main purpose of the intense pulse light therapeutic apparatus is to provide accurate high-energy pulse light, and if the emitted light is inaccurate during use, the therapeutic effect will be greatly reduced, so that the monitoring of the luminous energy of the intense pulse light source is very important. The problem is precisely that when monitoring the luminous energy of an intense-pulse light source, it is not easy to detect the luminous energy, because: on one hand, the energy of emergent light of the intense pulse light source is too strong, and a common sensor can directly explode the meter, so that the detection cannot be performed; on the other hand, the size of the therapy head of the therapy apparatus is limited, and a detection apparatus cannot be placed on the therapy head, which not only increases the weight and the volume, but also is not friendly to operators.

In the prior art, one of the methods for monitoring the luminous energy of the intense-pulse light source is to record the use times, the use time and the like according to the empirical value of the use times, and then to prompt the replacement of the treatment head of the treatment instrument based on the record and the threshold comparison, which obviously results in the failure of real-time monitoring; in addition, there is another method of monitoring the electric power by omitting the monitoring light and converting it into the magnitude of the voltage and current of the monitoring discharge. However, neither of the above two prior arts can realize accurate and real-time monitoring of the light emission energy of the intense pulse light source, because: the former way can only achieve energy not less than a certain percentage; in the latter strong pulse light source, the conversion efficiency of the strong pulse light source to electric energy is reduced during use, so that the voltage and the current cannot objectively and truly represent the magnitude of the luminous energy of emergent light.

In view of this, how to conveniently monitor the light emitting energy of the intense-pulse light source accurately and in real time, and even further achieve the calibration of the light emitting energy, is a technical problem that needs to be solved in the art.

Disclosure of Invention

In order to solve the above technical problem, an objective of the present application is to provide an intense pulse light therapy apparatus capable of monitoring the light emitting energy of a light source. Specifically, the intense pulse light therapeutic apparatus described herein may include an intense pulse light source, a monitoring light path, an attenuation unit, and a first monitoring unit, where the monitoring light path is configured to capture a portion of light emitted by the intense pulse light source during power-on operation, then attenuate the light captured by the monitoring light path through the attenuation unit, and finally measure, through the first monitoring unit, light emission energy based on the light attenuated by the attenuation unit during power-on operation of the intense pulse light source.

The present application also provides a method for monitoring luminous energy.

The technical problem of the application is solved by the following technical scheme.

In a first aspect, the present invention provides an intense pulse light therapy apparatus capable of monitoring the light emitting energy of a light source, the intense pulse light therapy apparatus includes a housing made of opaque material and an intense pulse light source located in the housing, and the intense pulse light therapy apparatus further includes:

at least one monitoring optical path defined by an internal channel of the housing for capturing a portion of light emitted by the intense pulsed light source when energized, the internal channel being formed as a small aperture light sampling aperture at the intense pulsed light source, the at least one monitoring optical path being configured to capture a portion of light emitted by the intense pulsed light source when energized;

at least one attenuation unit located on the at least one monitoring optical path, wherein the at least one attenuation unit is used for attenuating the captured part of light and providing the attenuated light to the first monitoring unit;

the first monitoring unit is used for measuring the luminous energy of the intense pulse light source during the power-on operation according to the attenuated light;

wherein the attenuated light is adapted to a range which can be monitored by the first monitoring unit.

In a second aspect, the present invention also discloses a method for monitoring luminescence energy, the method comprising the steps of:

s10: under the condition that the intense pulse light source is electrified, capturing a part of light emitted by the intense pulse light source during the electrification work;

s20: attenuating the captured portion of light to a monitorable range;

s30: and measuring the luminous energy of the intense pulse light source during power-on operation according to the attenuated light.

Compared with the prior art, the invention has the following advantages:

according to the invention, the light emitted by the intense pulse light source is remarkably attenuated after sampling by innovatively designing the at least one monitoring light path and the at least one attenuation unit so as to meet the monitoring range, so that the problem of monitoring the luminous energy of the intense pulse light source is solved by measuring the luminous energy after sampling and attenuation, and the requirements on possible photoelectric components and electronic components are also remarkably reduced. In addition, the method and the device solve the problem of monitoring the luminous energy of the intense pulse light source, and can further solve the problem of calibrating the luminous energy of the intense pulse light source by secondarily utilizing a means of measuring the luminous energy of the intense pulse light source under the condition that the intense pulse light source generates light attenuation. The invention has ingenious conception, can realize a solution with small volume and low cost, and can avoid the influence of afterglow effect under the condition that the intense pulse light source is powered off, thereby accurately measuring the luminous energy of the intense pulse light source.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate exemplary embodiments of the invention and together with the description serve to explain the principles of the invention.

FIG. 1 is a schematic diagram of an apparatus for monitoring the luminous energy of an intense pulsed light source, in accordance with an embodiment of the present invention;

FIG. 2 (A) is a diagram of a specific implementation of an apparatus for monitoring the luminous energy of an intense-pulsed-light source and a first schematic diagram thereof, according to an embodiment of the present invention;

FIG. 2 (B) is a second schematic diagram of the apparatus for monitoring the luminous energy of the intense-pulsed-light source shown in FIG. 2 (A);

FIG. 2 (C) is a third schematic diagram of the apparatus for monitoring the luminous energy of the intense-pulsed-light source shown in FIG. 2 (A);

FIG. 3 is a cross-sectional view of an assembled embodiment of an apparatus for monitoring the luminous energy of an intense pulsed light source, in accordance with an embodiment of the present invention;

FIG. 4 is a schematic illustration of a specific implementation of an apparatus for monitoring the luminous energy of an intense pulsed light source, in accordance with an embodiment of the present invention, prior to assembly;

FIG. 5 is a schematic flow chart of an apparatus for monitoring the luminous energy of an intense-pulse light source according to an embodiment of the present invention;

FIG. 6 exemplarily reveals a possible curve relationship S1 between the control voltage of the light intensity of the intense-pulse light source and the luminous energy generated by the light source, and a possible curve relationship S2 that becomes possible when light decay occurs as the number of uses gradually increases, and the efficiency thereof decreases;

FIG. 7 is a schematic flow chart of a method for monitoring the luminous energy of an intense pulsed light source, in accordance with an embodiment of the present invention;

fig. 8 to 11 are a specific implementation of the circuit part of the apparatus for monitoring the luminous energy of an intense-pulse light source and a circuit schematic diagram thereof in an embodiment of the present invention.

The reference numerals are explained below:

in fig. 2 (a), 2 (B), 2 (C), and 3:

1 denotes an intense-pulsed-light source, which may be, for example, a xenon lamp;

2, an apparatus for monitoring the light emitting energy of the intense-pulse light source is implemented as, for example, a detection head, which is implemented as an apparatus sleeved on the circumference of the intense-pulse light source and does not affect the light emitting surface of the top end surface of the intense-pulse light source;

3 denotes a light guiding crystal;

4 denotes a small seal cap as a first seal cap;

5 a large seal cover of an outer ring of the small seal cover as a second seal cover;

6 denotes a filter;

7 denotes a sealing cover at the filter as a third sealing cover;

8 denotes a photodetector;

9 a glass tube provided in the circumferential direction of the intense pulse light source;

and 10 denotes a light sampling hole.

In fig. 2 (B) and fig. 4:

6 denotes a filter, which is a 1 st filter, a 2 nd filter and a 3 rd filter in sequence from top left to bottom right;

in fig. 8:

d17 represents a photodetector which converts the optical signal into a current signal;

u10 denotes an operational amplifier which converts the current signal into a voltage signal and amplifies it;

r54 represents a resistance for adjusting the magnification;

the output of the 6 th pin at the lower right of U10, namely PD1 provides voltage output to the PD1 pin at the upper left in FIG. 9;

in fig. 9:

PD1 is connected with the voltage signal output by PD1 in FIG. 8;

c64 and R57 form a high-pass filter through an RC circuit;

q7 represents a voltage switch, and when the FD _ KZ1 pin is high, a signal is grounded; when low, monitoring the signal;

FD _ KZ1 pin for connecting the control pin of the single chip machine;

u11 denotes an operational amplifier for voltage amplification;

r55 and R56 resistors are used for adjusting multiples;

r58 and C67 form a low-pass filter through an RC circuit;

in fig. 10:

PD1OUT represents an analog signal after signal processing, which is input to pin 3 of U19 in fig. 10;

u19, which implements ADC signal conversion for converting analog signals into digital signals;

ADS _ CLK, ADC _ SDO, ADS _ SDI, ADS _ CS, ADS _ INT and ADS _ CONVST pins which are all used for connecting pins of a singlechip for digital acquisition;

in fig. 11, a xenon lamp is taken as an example of the intense pulse light source:

the XENON pin is connected with the cathode of the XENON lamp, and the high-intensity heavy current of the XENON lamp is introduced from the XENON pin;

the XENON _ KZ pin is connected with a control pin of a Q13 MOS tube;

U20A denotes an amplifier circuit;

r85 and R88 are used as resistors for adjusting the amplification factor;

the Q12 MOS tube is used for driving the U21 optocoupler;

the XENON _ ENABLED pin is connected with the singlechip, and when the pin is at a low level, the XENON lamp current exists; there is no xenon lamp current at this high level.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are for purposes of illustration only and are not to be construed as limitations of the invention. It should be noted that, for convenience of description, only the portions related to the present invention are shown in the drawings.

It should be noted that the embodiments and features of the embodiments of the present invention may be combined with each other without conflict. The technical solution of the present invention will be described in detail with reference to the accompanying drawings in conjunction with the embodiments.

Unless otherwise indicated, the illustrated exemplary embodiments/examples are to be understood as providing exemplary features of various details of some ways in which the technical concepts of the present invention may be practiced. Therefore, unless otherwise specified, the features of the various embodiments/examples may be additionally combined, separated, interchanged, and/or rearranged without departing from the technical concept of the present invention.

Cross-hatching and/or shading, which may be used in the drawings, is often used to clarify the boundaries between adjacent components. As such, unless otherwise noted, the presence or absence of cross-hatching or shading does not convey or indicate any preference or requirement for a particular material, material property, size, proportion, commonality between the illustrated components and/or any other characteristic, attribute, property, etc., of a component. Further, in the drawings, the size and relative sizes of components may be exaggerated for clarity and/or descriptive purposes. While example embodiments may be practiced differently, the specific process sequence may be performed in a different order than the described steps. For example, two processes described consecutively may be performed substantially simultaneously or in reverse order to that described. In addition, like reference numerals denote like parts.

When an element is referred to as being "on" or "on," "connected to" or "coupled to" another element, it can be directly on, connected or coupled to the other element or intervening elements may be present. However, when an element is referred to as being "directly on," "directly connected to" or "directly coupled to" another element, there are no intervening elements present. For purposes of this disclosure, the term "connected" may refer to physically connected, electrically connected, and the like, with or without intervening components.

For descriptive purposes, the invention may use spatially relative terms such as "under 8230; \8230; under \8230;,"' 8230; under 8230; over "," on 8230; over "," higher "and" side (e.g., as in "sidewall"). To describe the relationship of one component to another (other) component as shown in the figures. Spatially relative terms are intended to encompass different orientations of the device in use, operation, and/or manufacture in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "below" or "beneath" other elements or features would then be oriented "above" the other elements or features. Thus, the exemplary term "at 8230 \8230;" below "may encompass both an orientation of" above "and" below ". Further, the devices may be otherwise positioned (e.g., rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

The terminology used herein is for the purpose of describing particular embodiments and is not intended to be limiting. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. Furthermore, when the terms "comprises" and/or "comprising" and variations thereof are used in this specification, the stated features, integers, steps, operations, elements, components and/or groups thereof are stated to be present but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and/or groups thereof. It is also noted that, as used herein, the terms "substantially," "about," and other similar terms are used as approximate terms and not as degree terms, and as such, are used to interpret inherent deviations in measured values, calculated values, and/or provided values that would be recognized by one of ordinary skill in the art.

Referring to fig. 1, in one embodiment, the present invention discloses an intense pulse light therapy apparatus capable of monitoring the light emitting energy of a light source, the intense pulse light therapy apparatus includes a housing made of opaque material and an intense pulse light source located in the housing, and the intense pulse light therapy apparatus further includes:

at least one monitoring optical path, wherein the at least one monitoring optical path is defined by an internal channel of the housing and is used for capturing a part of light emitted when the intense-pulse light source is powered on, and the internal channel is formed into a small-aperture light sampling hole at the intense-pulse light source. The at least one monitoring light path is used for capturing a part of light emitted by the intense pulse light source when the intense pulse light source is electrified;

at least one attenuation unit located on at least one monitoring optical path, wherein the at least one attenuation unit is used for attenuating a part of captured light and providing the attenuated light to the first monitoring unit;

the first monitoring unit is used for measuring the luminous energy of the intense pulse light source during the electrifying operation according to the attenuated light;

wherein the attenuated light is adapted to the range which the first monitoring unit is capable of monitoring.

For this embodiment, it is noted that: the embodiment is characterized in that the at least one monitoring light path and the at least one attenuation unit are innovatively designed to attenuate light emitted by the intense pulse light source obviously after sampling so that the light meets the monitoring range, and therefore the requirement on a photoelectric component and an electronic component which are possibly used is remarkably reduced while the problem of monitoring the luminous energy of the intense pulse light source is solved by measuring the luminous energy after sampling and attenuation.

In another embodiment, in the therapeutic apparatus for intense pulsed light capable of monitoring the luminous energy of the light source, at least one end of the monitoring light path is provided with a small hole as a light sampling hole.

In another embodiment, the at least one attenuation unit is provided with a filter.

In another embodiment, the apparatus for intense pulsed light therapy for monitoring the luminous energy of a light source, at least one of the monitoring light paths is provided with a cavity.

In another embodiment, the apparatus for intense pulsed light therapy for monitoring the amount of energy emitted by the light source, the at least one monitoring optical path comprises an L-shaped optical path.

In another embodiment, in an intense pulse light apparatus capable of monitoring the luminous energy of a light source, at least one monitoring light path comprises two cavities.

In another embodiment, the intense pulse light treatment apparatus for monitoring the luminous energy of the light source, at least one attenuation unit is provided with a plurality of filters.

In another embodiment, the intense pulse light therapeutic apparatus capable of monitoring the light emitting energy of the light source in the intense pulse light therapeutic apparatus capable of monitoring the light emitting energy of the light source passes through one small hole, three optical filters and two cavities, so that the attenuation unit attenuates the light emitting energy of the intense pulse light source to the range that the first monitoring unit can monitor, and the attenuation unit measures the light emitting energy of the intense pulse light source during the power-on operation according to the attenuated light.

In another embodiment, referring to fig. 2 (a), fig. 2 (B) and fig. 2 (C), a specific implementation of an apparatus for monitoring the luminous energy of an intense-pulsed-light source and a schematic diagram thereof are illustrated, wherein,

an intense-pulse light source 1, which may be a xenon lamp, for example, and is located at the center of or near the opaque housing, and a glass tube 9 disposed circumferentially of the intense-pulse light source is located outside the light source;

the device 2 for monitoring the light emitting energy of the intense-pulse light source, which is composed of the casing and the components of the monitoring light path inside the casing, is realized as a detection head, for example, and is sleeved on the circumference of the intense-pulse light source without affecting the light emitting surface of the top end surface of the intense-pulse light source;

a small sealing cover 4 as a first sealing cover; a large sealing cover 5 serving as a second sealing cover on the outer ring of the small sealing cover; a sealing cover 7 at the optical filter 6 as a third sealing cover;

under the action of the plurality of optical filters 6, a part of the light emitted by the light source is attenuated and sensed by the photoelectric detector 8, so as to be converted into an electric signal, and the electric signal is input to a circuit part of the device 2 for monitoring the luminous energy of the intense-pulse light source to realize the monitoring of the luminous energy of the light source. The monitoring light path can be seen as the dashed line symbol L in fig. 3. The light guide crystal 3 is a member for extracting light generated by the xenon lamp and acting on the eyelid.

It can be found that, in this embodiment, the device for monitoring the light-emitting energy of the intense-pulse light source is realized as a device sleeved on the circumference of the intense-pulse light source in a compact and small manner, and the light-emitting surface of the top end surface of the intense-pulse light source is not affected.

In another embodiment, the apparatus for intense pulse light therapy capable of monitoring the luminous energy of a light source further comprises a second monitoring unit;

when the second monitoring unit monitors that the intense pulse light source is electrified to work, the first monitoring unit works;

when the second monitoring unit monitors that the intense pulse light source is not electrified, the first monitoring unit does not work.

It should be noted that, in this embodiment, in order to avoid the influence of the afterglow effect on the first monitoring unit, a specific implementation manner of the present invention for avoiding the afterglow effect will be described in detail below with reference to a specific circuit design.

In another embodiment, the apparatus for monitoring the light emission of a light source comprises an MOS transistor;

when the second monitoring unit monitors that the intense pulse light source is electrified and works, the MOS tube is not conducted, and the first monitoring unit works;

when the second monitoring unit monitors that the intense pulse light source is not electrified, the MOS tube is conducted, and the first monitoring unit works.

It can be understood that the MOS transistor acts as a switching transistor, which in this embodiment controls the operation of the first monitoring unit, e.g. whether the first monitoring unit performs its measurement function and other functions.

In another embodiment, the apparatus in the monitoring optical path and the apparatus in the monitoring optical path are not only used for monitoring the light emitting energy of the intense pulsed light source, but also for calibrating the light emitting energy of the intense pulsed light source, so that the light emitted by the intense pulsed light source is consistent with the set light emitting energy.

For the embodiment, it fully explains how to monitor the light emitting energy of the intense-pulse light source, and further solves the problem of calibrating the light emitting energy of the intense-pulse light source by secondarily utilizing the means for measuring the light emitting energy of the intense-pulse light source under the condition that the intense-pulse light source generates light decay.

In another embodiment, the entrance of the light sampling hole is set to be circular and the diameter is selected from any value within the range of 1-4mm, thereby allowing the light sampling hole to accurately sample the light actually emitted from the intense-pulse light source without affecting the function of the intense-pulse light source.

Referring to fig. 3, in another embodiment, the apparatus for monitoring the light emitted from a light source further comprises a light guide crystal 3 for contacting a user and communicating with the monitoring light path of the intense-pulse light source. The light guiding crystal 3 and the light sampling hole 10 are opposite to different positions of the intense pulsed light source 1.

Referring to fig. 4, in another embodiment, when the plurality of filters is 3 filters, by changing the light transmittance of the filters and the combination thereof, the light emission energy of the intense-pulse light source is attenuated to a range that the first monitoring unit can monitor so that it measures the light emission energy of the intense-pulse light source when the intense-pulse light source is operated by being powered on according to the attenuated light.

It should be noted that fig. 4 exemplarily expresses the following specific implementation manner: for the 3 optical filters 6, from top left to bottom right, a 1 st optical filter, a 2 nd optical filter and a 3 rd optical filter are sequentially arranged, wherein the 1 st optical filter is positioned on a transverse monitoring optical path, the 2 nd optical filter and the 3 rd optical filter are positioned on a longitudinal monitoring optical path, the 1 st optical filter and the 2 nd optical filter are positioned in a first cavity, and the 3 rd optical filter is positioned in a second cavity. The surface of each cavity can be blackened.

In another embodiment, the apparatus for intense pulse light therapy capable of monitoring the luminous energy of a light source comprises at least one filter for selecting a filter of a full wavelength band.

In another embodiment, in the intense pulse light therapeutic apparatus capable of monitoring the luminous energy of the light source, the light transmittance of any filter is 0.01% -70%.

Referring to fig. 2 (B) and 3, the light emitted from the light source is attenuated to a range that can be monitored by the first monitoring unit after passing through the light sampling hole 10, the first cavity, the second cavity perpendicular to the first cavity, and the three optical filters 6 in the two cavities. Exemplarily, the light-emitting energy of the light-guiding crystal is in an energy range of 5-20J, and when the intense-pulse light source is a xenon lamp and the xenon lamp emits light in the energy range, the light intensity attenuated by the at least one attenuation unit and finally entering the first monitoring unit is required to be in a range which can be monitored by the first monitoring unit.

In another embodiment, in the intense pulse light therapeutic apparatus capable of monitoring the light emitting energy of the light source, the first monitoring unit is provided with a photoelectric detector.

In another embodiment, the L-shaped monitoring optical path is composed of two optical paths perpendicular to each other, and the length of each optical path is not more than 25mm.

Referring to fig. 5, in another embodiment, the intense pulsed light treatment apparatus further comprises at least a single chip microcomputer and an ADC module, and monitors the light emitting energy of the intense pulsed light source by performing the following steps:

s100: when the intense pulse light source is not electrified and emits light, an ADC signal in the first monitoring unit is collected in advance and is used as an environment noise value ad1;

s200: the single chip microcomputer sends a preset pulse signal, and the intense pulse light source is powered on; according to the set pulse time, the intense pulse light source can generate a plurality of pulse lights;

s300: acquiring an ADC signal every other first preset time, and comparing the acquired ad value with an environmental noise value ad 1:

if the absolute value of the difference between the currently acquired ad value and the environmental noise value ad1 is smaller than or equal to a first threshold value, the marked intense pulse light source does not emit light at the moment;

otherwise, marking the strong pulse light source to emit an effective light emitting signal, and reserving the acquired ad value minus the environmental noise value ad1;

s400: within a second continuous preset time, repeatedly executing the step S300 every other first preset time until the end of light emission is monitored, and integrating to calculate the sum of all ADC signals sum;

s500: meanwhile, fitting the energy X of the reference light and the sum of all ADC signals sum calculated by integration;

in some embodiments, the energy X of the reference light is acquired using a third party professional detection device.

S600: repeating the steps S100 to S500 for multiple times, and finally obtaining a functional relation of the measured energy X of the light and the sum of all ADC signals sum through statistics and fitting;

s700: on the basis of the function relation, the first monitoring unit measures the luminous energy of the intense pulse light source during power-on work according to the light attenuated by the attenuation unit.

In another embodiment, the first predetermined time is any value between 50-200 microseconds, such as 100 microseconds, 150 microseconds, etc.

In another embodiment, in the intense pulse light therapeutic apparatus capable of monitoring the light emitting energy of the light source, the second predetermined time is suitable for the pulse time set in step S200, for example, the second predetermined time is the same as the pulse time and is 1 to 2 seconds.

In another embodiment, in an intense pulse light treatment apparatus capable of monitoring the energy emitted by a light source, the measured energy X of the light is a function of the sum of all ADC signals sum as follows:

sum = aX+b；

in the formula, a represents a slope, and b represents an intercept.

In another embodiment, the apparatus for monitoring the energy emitted by the light source further adjusts the energy of the light emitted by the intense-pulse light source by performing the following steps:

s800: when the intense pulse light therapeutic apparatus leaves the factory, setting the first joule J1 of luminous energy of the intense pulse light source according to the first joule J1 of luminous energy of the intense pulse light source measured in step S700 when the intense pulse light source is powered on to make the set luminous energy consistent with the actually measured luminous energy, thereby completing product calibration when leaving the factory;

s900: along with the use of strong pulsed light therapeutic instrument, when judging that strong pulsed light source takes place the light decay, the actual luminous energy of strong pulsed light source is not enough first joule J1, and its decay is second joule J2, and wherein second joule J2 is less than first joule J1, this moment:

when the functional relation between the measured light energy X and the sum of all ADC signals sum calculated through integration is a linear relation, according to the proportional relation between the second joule J2 and the first joule J1, the actual light-emitting energy of the intense pulse light source is linearly increased from the second joule J2 to the first joule J1;

s1000: along with strong pulse light therapeutic instrument's continuation use, when judging that strong pulse light source takes place the light decay once more, the energy of the actual luminescence of strong pulse light source is not enough first joule J1, and its decay is third joule ear J3, and wherein third joule ear J3 is less than first joule J1, this moment:

when the functional relation between the measured light energy X and the sum of all ADC signals sum calculated through integration is a linear relation, according to the proportional relation between the third joule J3 and the first joule J1, the actual light-emitting energy of the intense pulse light source is linearly increased from the second joule J3 to the first joule J1;

s1100: by analogy, the energy of the light actually emitted is always ensured by measuring the energy of the actual light emission of the intense-pulse light source, and the light emission energy is in accordance with the set light emission energy.

In another embodiment, the apparatus for monitoring the amount of light emitted by the light source further comprises:

s801: when the intense pulse light therapeutic apparatus leaves the factory, according to the first joule J1 of luminous energy of the intense pulse light source measured in step S700 when the intense pulse light source is powered on to work, the luminous energy of the intense pulse light source is set to be the first joule J1, so that the set luminous energy is consistent with the luminous energy actually measured, and the product calibration when leaving the factory is completed.

S901: along with the use of strong pulsed light therapeutic instrument, when judging that strong pulsed light source takes place the light decay, the actual luminous energy of strong pulsed light source is not enough first joule J1, and its decay is second joule J2, and wherein second joule J2 is less than first joule J1, this moment:

when a functional relation of the total sum of all ADC signals sum is calculated based on the measured energy X and the integral of the light, the fitting relation of the measured energy X of the light reflected by the functional relation and the total sum of all ADC signals sum is calculated according to the integral, and the actual luminous energy of the intense pulse light source is increased from second Joule J2 to first Joule J1;

s1001: along with strong pulse light therapeutic instrument's continuation use, when judging that strong pulse light source takes place the light decay once more, the energy of the actual luminescence of strong pulse light source is not enough first joule J1, and its decay is third joule ear J3, and wherein third joule ear J3 is less than first joule J1, this moment:

when a functional relation of the total sum of all ADC signals sum is calculated based on the measured energy X and the integral of the light, the fitting relation of the measured energy X of the light reflected by the functional relation and the total sum of all ADC signals sum is calculated according to the integral, and the actual luminous energy of the intense pulse light source is increased from the third Joule J3 to the first Joule J1;

s1101: by analogy, the energy of the light actually emitted is always ensured by measuring the energy of the actual light emission of the intense-pulse light source, and the light emission energy is in accordance with the set light emission energy.

Based on the above steps S900-S1100 or the adjustment of steps S901-S1101, the energy of the light actually emitted by the intense pulse light source can be consistent with the set luminous energy, so as to avoid the occurrence of poor treatment effect caused by the weak luminous intensity of the intense pulse light treatment apparatus due to the properties of the light guide crystal.

Referring to fig. 6, a possible curve relation S1 between the control voltage of the light intensity of the intense-pulse light source and the light-emitting energy generated by the light source and a possible curve relation S2 that becomes possible when light decay occurs as the number of uses gradually increases, the efficiency thereof decreases, are exemplarily revealed. Since it is desirable that the light emission energies indicated by the ordinate of a and B are not changed, it is necessary to adjust the control voltage from V1 to V2 in the past. Therefore, the energy of the actually emitted light is always ensured by measuring the actually emitted energy of the intense-pulse light source, and the actually emitted energy of the light is in accordance with the set light-emitting energy, which can be completely realized by the technical scheme disclosed by the invention.

Furthermore, referring to fig. 7, in another embodiment, the present invention further discloses a method for monitoring the luminous energy of an intense pulsed light source, the method comprising the steps of:

s10: under the condition that the intense pulse light source is electrified, capturing a part of light emitted by the intense pulse light source during the electrifying work;

s20: attenuating the captured portion of light to a range that can be monitored;

s30: and measuring the luminous energy of the intense pulse light source during the power-on work according to the attenuated light.

In another embodiment, at least one monitoring optical path is used to capture a portion of the light emitted by the intense pulsed light source during power-up operation in step S10.

In another embodiment, at least one attenuation unit is utilized to attenuate a portion of the captured light in step S20.

In another embodiment, in step S30, the first monitoring unit is utilized to measure the light emitting energy of the intense pulse light source during the power-on operation according to the attenuated light.

In another embodiment, in a method for monitoring the luminous energy of an intense pulsed light source, the method further comprises the steps of:

s40: and after judging that the intense pulse light source generates light attenuation, calibrating the luminous energy of the intense pulse light source according to the actually measured luminous energy of the intense pulse light source during the power-on work.

Furthermore, in the following embodiments, the present invention also discloses specific implementations of circuit portions of an apparatus for monitoring luminous energy of an intense pulsed light source.

Referring to fig. 8 to 11, in which,

in the context of figure 8 of the drawings,

d17 represents a photoelectric detector, and the photoelectric detector converts the optical signal into a current signal;

u10 denotes an operational amplifier which converts a current signal into a voltage signal and amplifies it;

r54 represents a resistance for adjusting magnification;

in fig. 9:

PD1 is connected with the voltage signal output by PD1 in FIG. 8;

c64 and R57 form a high-pass filter through an RC circuit;

the FD _ KZ1 pin is used for connecting a control pin of the single chip microcomputer;

u11 denotes an operational amplifier for voltage amplification;

r55 and R56 resistors are used for adjusting multiples;

r58 and C67 form a low-pass filter through an RC circuit, and the output of U11 is connected to the 3 rd pin of U19 in FIG. 10 through the low-pass filter;

in fig. 10:

ADS _ CLK, ADC _ SDO, ADS _ SDI, ADS _ CS, ADS _ INT and ADS _ CONVST pins which are all used for connecting pins of the singlechip so as to be used for digital acquisition under the control of the singlechip;

the XENON _ KZ pin is connected with a control pin of a Q13 MOS tube;

U20A denotes an amplifier circuit;

r85 and R88 are used as resistors for adjusting the amplification factor;

the Q12 MOS tube is used for driving the U21 optocoupler, and the adoption of the optocoupler improves the circuit isolation and the safety performance of the device for monitoring the luminous energy of the intense pulse light source;

the XENON _ ENABLED pin is connected with the singlechip, and when the pin is at a low level, the XENON lamp current flows through the XENON lamp; when the pin is at a high level, no xenon lamp current flows through the xenon lamp;

as shown in fig. 8, 9, 10, 11, wherein,

in fig. 8, a circuit is shown for converting a current signal obtained by a photodetector to a voltage signal;

in fig. 9, the circuit shown filters and amplifies the voltage signal;

in fig. 10, the circuit shown is an exemplary circuit for converting an analog signal into a digital signal using a 16-bit precision ADC, and performing an arithmetic process;

in fig. 11, a xenon lamp is taken as an example of the intense-pulse light source, and the circuit shown illustrates a xenon lamp voltage and current monitoring circuit;

the above circuit is further described as follows:

the 2 nd pin in fig. 8 is connected to the photodetector, the U10 operational amplifier converts the current into voltage, outputs the voltage through the 6 th pin, further transmits the voltage signal to the PD1 in fig. 9 through the connector with a shield, and further amplifies the voltage signal to a reasonable multiple through the U11 in fig. 9 after filtering the voltage signal by the high-pass filter composed of R57 and C64, and then connects the pin 3 of the U19 in fig. 10 through the PD1OUT pin after filtering the voltage signal by the filter composed of R58 and C67, and then converts the analog signal into a digital signal through the U19 ADC chip in fig. 10;

referring to fig. 11, in the XENON lamp powered state, it means that the XENON _ KZ pin will send a signal to the control pin of Q13; furthermore, when current flows in the XENON lamp, the XENON pin is connected with the cathode of the XENON lamp, the current of the XENON lamp flows through the R89 to the ground through the XENON end and the Q13, the 3 rd pin of the U20A acquires a current signal, the current signal is amplified by a certain proportion and then drives the U21 isolation optocoupler, when the current flows in the R89, the U21 is conducted, and the XENON _ ENABLED pin is at a low level; when no current flows in the XENON lamp, no current flows in R89, U21 is not conducted, and XENON _ ENABLED is at high level; therefore, the invention can detect the high and low level of the XENON _ ENABLE pin through the singlechip to judge whether to monitor the luminous energy of the XENON lamp by using a subsequent circuit.

The detailed description is as follows:

1) When no current flows in the XENON lamp, no current flows in the R89, the XENON _ ENABLED is at a high level, because a signal of an XENON _ ENABLED pin is used as an input signal of the singlechip, the XENON _ ENABLED pin can control a control pin of the singlechip, and when the XENON _ ENABLED pin is at the high level, the output of the control pin of the singlechip is also at the high level, so that an FD _ KZ1 pin is also at the high level, and a Q7 MOS tube in the graph 9 is conducted, so that the fast discharge can be realized; therefore, the singlechip does not need to execute the previous step S200 and the like to monitor the luminous energy of the intense pulse light source; but at this time, the foregoing step S100 may be executed to pre-collect the ADC signal of U19 in fig. 10 as the ambient noise value ad1;

2) When the single chip microcomputer sends a preset pulse signal to enable the XENON lamp to be powered on, the single chip microcomputer sends a signal to a control pin of Q13 through an XENON _ KZ pin, and according to the set pulse time, the XENON lamp can generate a plurality of pulse lights in the pulse time; when current flows in the XENON lamp, current flows through the R89, the XENON _ enable is at a low level, since a signal of the XENON _ enable pin is used as an input signal of the single chip microcomputer, the XENON lamp can control a control pin of the single chip microcomputer, and when the XENON _ enable is at a low level, an output of the control pin of the single chip microcomputer is also at a low level, so that the FD _ KZ1 pin is also at a low level, the Q7 MOS transistor in fig. 9 is not conductive, a signal of the PD1 pin in fig. 9 is filtered by the high-pass filter, input to the U11 and amplified to a reasonable multiple, then filtered by the filter composed of the R58 and the C67, connected to the 3 rd pin of the U19 in fig. 10 by the PD1OUT pin, and then the U19 ADC chip in fig. 10 converts an analog signal into a digital signal, so that the foregoing steps S200, S300 and the like can be performed to monitor the light emission energy of the intense pulse light source.

It should be noted that the key inventive concept of the above circuit part is as follows:

1) Although R54 of fig. 8 is used to adjust the amplification factor, the amplified voltage cannot be too large or too small; according to the practical findings: for the invention, when the light-emitting energy of the light guide crystal is 20J with the maximum, the voltage of the 6 th pin of U10 is preferably not more than 2V; when the light-emitting energy of the light guide crystal is minimum 5J, the minimum is not less than 100mV; this is because, in practice, it has been found that: if the voltage exceeds 2V, the circuit is easy to overflow; if less than 100mV, the circuit is easily disturbed;

2) In fig. 9, the cut-off frequency of the high-pass filter composed of C64 and R57 and the low-pass filter composed of R58 and C67 cannot exceed the effective frequency range; the practical findings are that: the frequency of the filtering is preferably 5.88Hz to 111.1Hz;

3) In fig. 9, in the voltage operational amplifier circuit composed of U11, R55 and R56 need to adjust the amplification factor to satisfy: when the energy is maximum and minimum, it is within the measurement range of the fig. 10 u19 ADC chip. Illustratively, when the energy of the emitted light is 20J energy, the amplification factor of the voltage at PD1OUT at 2V-2.5V is the best condition;

4) In fig. 11, the XENON _ enable is low level, that is, when the XENON lamp emits light, the Q7 shown in fig. 9 is turned off, the voltage converted by the optical signal collected by the photodetector is allowed to be transmitted to the 1 st pin of the U11 in fig. 9, so that the signal is detected when the XENON lamp discharges, once the XENON lamp does not emit light, the XENON _ enable is high level, under the action of the XENON _ enable, the output of the control pin of the single chip microcomputer is also high level, which makes the FD _ KZ1 pin also high level, the Q7 MOS transistor in fig. 9 is turned on, so that the 1 st pin of the U11 in fig. 9 is directly grounded, the potential at the R57 is quickly grounded to 0, the U11 and other subsequent circuits are substantially equal to non-working, which greatly reduces the workload of the algorithm, and avoids inaccurate measurement caused by afterglow effect. In other words, in the circuit embodiment of the present invention, when the photodetector obtains an electrical signal by detecting light, and the electrical signal is subjected to primary amplification and primary filtering, and then is connected to the input end of the secondary amplification, the circuit embodiment is connected in parallel with an MOS transistor controlled by the single chip, wherein the control end of the MOS transistor is controlled by the high and low levels of the single chip, and one end of the remaining two ends is connected to the input end of the secondary amplification, and the other end is grounded.

In combination with the foregoing embodiments disclosed:

wherein the attenuated light is adapted to a range which can be monitored by the first monitoring unit;

when the second monitoring unit monitors that the intense pulse light source is not electrified, the MOS tube is conducted, and the first monitoring unit does not work;

it can be found that:

in the embodiment disclosed in figures 8-11,

the first monitoring unit and the second monitoring unit belong to the division of units on the functional and logical levels;

under the condition that a single chip microcomputer controls a Q7 MOS tube in a 9 to be non-conductive, a loop formed by an XENON _ ENABLED end to an FD _ KZ1 through the single chip microcomputer forms a second monitoring circuit, and circuits of other actions of the single chip microcomputer, circuits except the Q7 in the 9, and related circuits in actions of the 8, 10 and 11 form a first monitoring unit so as to measure luminous energy of an exemplary intense pulse light source of a XENON lamp during power-on operation according to attenuated light sensed by a D17 in the 8; the range that the first monitoring unit can monitor is exemplarily 5J to 20J;

under the condition that the single chip microcomputer controls the Q7 MOS tube in the FIG. 9 to be conducted, a loop formed by the XENON _ ENABLED end and the FD _ KZ1 through the single chip microcomputer still forms a second monitoring circuit, but at the moment, the first monitoring unit is taken as a complete functional unit and does not work substantially.

In addition, it will be appreciated that, with respect to the embodiments disclosed in FIGS. 8-11,

the single chip microcomputer and the ADC U19 in fig. 10 are mainly used to execute the foregoing steps S200 to S1100, and steps S8001 to S1101.

In the description of the present specification, reference to the description of "one embodiment/mode", "some embodiments/modes", "example", "specific example", or "some examples" or the like means that a particular feature, structure, material, or characteristic described in connection with the embodiment/mode or example is included in at least one embodiment/mode or example of the present application. In this specification, the schematic representations of the terms used above are not necessarily intended to be the same embodiment/mode or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments/modes or examples. Furthermore, the various embodiments/modes or examples and features of the various embodiments/modes or examples described in this specification can be combined and combined by one skilled in the art without being mutually inconsistent.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present application, "plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

It will be understood by those skilled in the art that the foregoing embodiments are merely for clarity of description and are not intended to limit the scope of the invention. Other variations or modifications will occur to those skilled in the art based on the foregoing disclosure and are within the scope of the invention.

Claims

1. The utility model provides a but monitor light source luminous energy's intense pulse light therapy apparatus, intense pulse light therapy apparatus includes the casing made by opaque material and is located the intense pulse light source of casing, its characterized in that, intense pulse light therapy apparatus still includes:

at least one monitoring optical path defined by an internal passage within the housing and configured to capture a portion of light emitted by the intense pulsed light source when energized, the internal passage being formed as a small aperture light sampling aperture at the intense pulsed light source;

intense pulse light therapeutic instrument still includes singlechip and ADC module at least, and through implementing following step in order to monitor intense pulse light source's luminous energy:

s200: the single chip microcomputer sends a preset pulse signal, and the intense pulse light source is electrified; generating a plurality of pulsed lights by the intense-pulsed-light source according to a set pulse time;

s300: acquiring an ADC signal every first preset time, and comparing the acquired ad value with an environmental noise value ad 1:

if the absolute value of the difference between the acquired ad value and the environmental noise value ad1 is smaller than or equal to a first threshold, marking that the intense pulse light source does not emit light at the moment;

otherwise, marking the intense pulse light source to emit an effective light emitting signal, and reserving the ad value acquired this time after subtracting the environmental noise value ad1;

s400: repeatedly executing the step S300 every other first preset time within continuous second preset time until the end of light emission is monitored, and integrating to calculate the sum of all ADC signals sum;

s600: repeating the steps S100 to S500 for multiple times, and finally obtaining a functional relation of the energy X of the reference light and the sum of all ADC signals through statistics and fitting;

s700: on the basis of the functional relation, the first monitoring unit measures the luminous energy of the intense pulse light source during power-on operation according to the light attenuated by the attenuation unit.

2. An intense pulse light therapy apparatus according to claim 1 and capable of monitoring the luminous energy of said light source, wherein:

the at least one monitoring optical path comprises an L-shaped optical path.

3. An apparatus for intense pulse light therapy capable of monitoring the luminous energy of a light source according to claim 1, wherein:

the intense pulse light therapeutic apparatus further comprises a second monitoring unit;

4. An intense pulse light treatment apparatus according to claim 3, wherein:

the intense pulse light therapeutic apparatus comprises an MOS tube;

when the second monitoring unit monitors that the intense pulse light source is electrified to work, the MOS tube is not conducted, and the first monitoring unit works;

5. An intense pulse light apparatus according to claim 1, wherein:

the entrance of the light sampling hole is circular.

6. An intense pulse light treatment apparatus according to claim 1, wherein:

the light sampling hole is opposite to an end of the intense pulse light source.

7. An intense pulse light treatment apparatus according to claim 3, wherein:

the attenuation unit comprises at least one optical filter, and the optical filter selects the optical filter of the full wave band;

and/or the light transmittance of any optical filter is 0.01% -70%.

8. An intense pulse light treatment apparatus according to claim 1, wherein:

intense pulse light therapeutic instrument still including be used for the contact user and with the light guide crystal that intense pulse light source light path switched on, wherein, the light guide crystal with the light thief hole with intense pulse light source's different positions are relative.

9. An intense pulse light treatment apparatus according to claim 8, wherein:

the intense pulse light source is a xenon lamp.

10. An intense pulse light treatment apparatus according to claim 1, wherein:

the first monitoring unit is provided with a photoelectric detector.

11. An intense pulse light treatment apparatus according to claim 2, wherein:

the L-shaped optical path is composed of two optical paths which are perpendicular to each other, and the length of each optical path is not more than 25mm.

12. An intense pulse light treatment apparatus according to claim 1, wherein:

the first predetermined time is selected from any value within 50-200 microseconds.

13. An intense pulse light treatment apparatus according to claim 1, wherein:

the second predetermined time is adapted to the pulse time set in the step S200.

14. An intense pulse light apparatus according to claim 1, wherein:

the energy X of the reference light is a function of the sum of all ADC signals sum calculated as follows:

sum = aX+b；

in the formula, a represents a slope, and b represents an intercept.

15. An intense pulse light treatment apparatus according to claim 1, wherein:

the intense pulse light therapeutic apparatus further adjusts the energy of the light emitted by the intense pulse light source by implementing the following steps:

s800: before the intense pulse light therapeutic apparatus leaves a factory, according to the first joule J1 of luminous energy of the intense pulse light source measured in step S700 when the intense pulse light source is powered on to work, setting the luminous energy of the intense pulse light source to be the first joule J1, so that the set luminous energy is consistent with the actually measured luminous energy to complete the calibration process;

s900: with the use of the intense pulsed light therapeutic apparatus, when judging that the intense pulsed light source generates light decay, the actually luminous energy of the intense pulsed light source is not enough for the first joule J1, and the attenuation is the second joule J2, wherein the second joule J2 is less than the first joule J1, this moment:

when the functional relation between the energy X of the reference light and the sum of all ADC signals calculated through integration is a linear relation, according to the proportional relation between the second joule J2 and the first joule J1, linearly increasing the actual light-emitting energy of the intense pulse light source from the second joule J2 to the first joule J1;

s1000: with the continuous use of the intense pulse light therapeutic apparatus, when judging that the intense pulse light source generates light decay again, the actually luminous energy of the intense pulse light source is not enough for the first joule J1, and the attenuation is the third joule ear J3, wherein the third joule ear J3 is less than the first joule J1, this moment:

when the functional relation between the energy X of the reference light and the sum of all ADC signals sum calculated through integration is a linear relation, according to the proportional relation between a third joule J3 and a first joule J1, the energy actually emitted by the intense pulse light source is linearly increased from the third joule J3 to the first joule J1;

s1100: by analogy, the energy of the light actually emitted by the intense pulse light source is always ensured by measuring the energy of the light actually emitted by the intense pulse light source, and the energy accords with the set light-emitting energy.

16. An intense pulse light therapy apparatus according to claim 1 and capable of monitoring the luminous energy of said light source, wherein:

the intense pulse light therapeutic apparatus also adjusts the energy of the light emitted by the intense pulse light source by implementing the following steps:

s801: before the intense pulse light therapeutic apparatus leaves the factory, a calibration process is completed according to the first joule J1 of luminous energy of the intense pulse light source measured in the step S700 when the intense pulse light source is powered on and works;

s901: along with intense pulse light therapeutic apparatus's use, when judging when intense pulse light source takes place the light decay, the actual luminous energy of intense pulse light source is not enough first joule J1, and its decay is second joule J2, and wherein second joule J2 is less than first joule J1, this moment:

when a functional relation of the energy X of the reference light and the total sum of all ADC signals sum is calculated based on the energy X of the reference light and the integral, according to a fitting relation of the energy X of the reference light reflected by the functional relation and the total sum of all ADC signals sum calculated by the integral, the energy actually emitted by the intense pulse light source is increased from second Joule J2 to first Joule J1;

s1001: with the continuous use of the intense pulse light therapeutic apparatus, when judging that the intense pulse light source generates light decay again, the actually luminous energy of the intense pulse light source is not enough for the first joule J1, and the attenuation is the third joule ear J3, wherein the third joule ear J3 is less than the first joule J1, this moment:

when a functional relation of the energy X of the reference light and the total sum of all ADC signals sum is calculated based on the energy X of the reference light and the integral, according to a fitting relation of the energy X of the reference light reflected by the functional relation and the total sum of all ADC signals sum calculated by the integral, the energy actually emitted by the intense pulse light source is increased from a third joule J3 to a first joule J1;

s1101: by analogy, the energy of the light actually emitted is always ensured by measuring the energy of the actual light emission of the intense-pulse light source, and the energy accords with the set light emission energy.