CN115223652A

CN115223652A - Test monitoring device, method, device, storage medium and electronic device

Info

Publication number: CN115223652A
Application number: CN202210716122.5A
Authority: CN
Inventors: 黄丽萍
Original assignee: Changxin Memory Technologies Inc
Current assignee: Changxin Memory Technologies Inc
Priority date: 2022-06-22
Filing date: 2022-06-22
Publication date: 2022-10-21

Abstract

The disclosure provides test monitoring equipment, a method and a device, a storage medium and electronic equipment, and relates to the technical field of semiconductor testing. This test monitoring equipment includes: the content analysis device is used for acquiring a test log from the target device in a test state, analyzing the test log to obtain cyclic fault information and memory fault information in the test log, solves the technical problem that an engineer needs to enter a server system regularly to check the test log and remotely log in a BMC system to check the server log in the test process at present, and achieves the technical effect of improving the test monitoring efficiency.

Description

Test monitoring device, method, device, storage medium and electronic device

Technical Field

The present disclosure relates to the field of semiconductor testing technologies, and in particular, to a test monitoring device, a method, an apparatus, a storage medium, and an electronic device.

Background

In the development phase of a random access memory (i.e., a memory bank, hereinafter referred to as a memory bank), a memory engineer needs to perform compatibility tests on the memory bank, for example, power cycling test (powercycling test), DC cycling test (DC Power cycling test), reboot test (on/off test), and the like, so as to verify that the memory bank can be normally used on different platforms. Taking DC cycling test as an example, during testing, a test script or test software needs to be installed on a test system of a server, and then the server is controlled to be powered on → the system is controlled to enter → the system stays for a period of time → the system is powered off, and the process needs to be cycled for hundreds to thousands of times.

In the testing process, an engineer needs to enter the server system regularly to check the test log, and remotely logs in a Baseboard Management Controller (BMC) system to check the server log, so that the efficiency is low.

Disclosure of Invention

The disclosure provides a test monitoring device, a test monitoring method, a test monitoring device, a storage medium and an electronic device, so that test monitoring efficiency is improved.

In a first aspect, an embodiment of the present disclosure provides a test monitoring device, including:

and the input end of the content analysis device is in signal connection with the target equipment, and the content analysis device is used for acquiring the test log from the target equipment in the test state and analyzing the test log to obtain the cyclic fault information and the memory fault information in the test log.

In an optional embodiment of the present disclosure, the content parsing apparatus includes:

the communication component is connected with the target equipment in a signal mode, and is used for acquiring the test log from the target equipment;

and the input end of the content analysis component is in signal connection with the receiving component of the communication component, and the content analysis component is used for analyzing the test log to obtain the cycle fault information and the memory fault information in the test log.

In an optional embodiment of the present disclosure, the test monitoring apparatus further includes:

and the input end of the display device is in signal connection with the output end of the content analysis device, and the display device is used for displaying the cycle fault information and the memory fault information.

In an alternative embodiment of the present disclosure, the display device includes:

and the first display component is in signal connection with the output end of the content analysis device and is used for displaying the test cycle times in the cycle fault information.

And the second display component is in signal connection with the output end of the content analysis device and is used for displaying fault position information in the memory fault information.

the input end of the page turning component is in signal connection with the output end of the content analysis device, the output end of the page turning component is in signal connection with the control ends of the first display component and the second display component respectively, and the page turning component is used for controlling the first display component and the second display component to synchronously turn pages under the action of the first driving signal.

the first warning component is in signal connection with the output end of the content analysis device and is used for displaying a first warning signal when the single cycle time length in the cycle fault information is longer than the preset time length; and/or the presence of a gas in the gas,

and the second warning component is in signal connection with the output end of the content analysis device, and the second display component is used for displaying a second warning signal when the memory fault information exists.

and the output end of the reset component is in signal connection with the content analysis device, and the reset component is used for controlling the content analysis device to clear the cycle fault information and the memory fault information under the action of the second driving signal.

and the storage device is in signal connection with the content analysis device and is used for storing the memory fault position information in the memory fault information.

In a second aspect, an embodiment of the present disclosure provides a test monitoring method, including:

acquiring a test log of target equipment during testing;

analyzing the test log to obtain cycle fault information and memory fault information in the test process;

and monitoring the test process in the target equipment in real time based on the cycle fault information and the memory fault information.

In an optional embodiment of the present disclosure, analyzing the test log to obtain the cycle fault information and the memory fault information in the test process includes:

extracting the startup and shutdown information and the memory fault information of the target equipment in the test log;

determining the number of test cycles and the cycle state of each test cycle based on the startup and shutdown information;

and determining fault position information of the memory fault based on the memory fault information.

In an optional embodiment of the present disclosure, determining the number of test cycles and the cycle status of each test cycle based on the power on/off information includes:

determining the number of times of power on and power off of target equipment and the duration of each power on and power off;

determining the test cycle times according to the startup and shutdown times;

and determining the cycle state of each test cycle according to the relative size of the duration of each startup and shutdown and the preset duration.

In an optional embodiment of the present disclosure, determining the cycle status of each test cycle according to the relative size of the duration of each power on/off and the preset duration includes:

if the duration of the current startup and shutdown is longer than the preset duration, determining that the cycle state of the current test cycle is abnormal; and/or the presence of a gas in the gas,

and if the continuous time length of the current startup and shutdown is not more than the preset time length, determining that the cycle state of the current test cycle is normal.

In an optional embodiment of the present disclosure, the test monitoring method further includes:

if the circulation state is abnormal circulation, a first control signal is sent to the first warning component to indicate the first warning component to generate a first warning signal.

sending the test cycle times to a first display component for display; and/or the presence of a gas in the gas,

and sending the fault position information to a second display component for display.

and if the memory fault information has a memory error, sending a second control signal to the second warning component to indicate the second warning component to generate a second warning signal.

In a third aspect, an embodiment of the present disclosure provides a test monitoring apparatus, including:

the acquisition module is used for acquiring a test log of the target equipment during testing;

the analysis module is used for analyzing the test logs to obtain cycle fault information and memory fault information in the test process;

and the monitoring module is used for monitoring the test process in the target equipment in real time based on the cycle fault information and the memory fault information.

In a fourth aspect, an embodiment of the present disclosure provides a computer-readable storage medium, on which a computer program is stored, which, when executed by a processor, implements the method as above.

In a fifth aspect, an embodiment of the present disclosure provides an electronic device, including: a processor; and a memory for storing executable instructions for the processor; wherein the processor is configured to perform the above method via execution of the executable instructions.

The technical scheme of the disclosure has the following beneficial effects:

the test monitoring equipment can acquire the test log from the target equipment in a test state and analyze the test log to obtain the cycle fault information and the memory fault information in the test log, and does not need to frequently enter the target equipment for manual inquiry by workers, so that the efficiency is higher, the technical problem that an engineer needs to regularly enter a server system to check the test log and remotely log in a BMC system to check the server log in the test process at present is solved, the efficiency is lower, and the technical effect of improving the test monitoring efficiency is achieved; meanwhile, the testing monitoring device is adopted to monitor the testing logs in the target device, the problem that a worker who is down in the target device cannot continuously and normally enter the log system to check historical testing logs due to conditions such as memory faults of the target device can be avoided, the worker can continuously analyze and process the testing logs acquired by the content analysis device and the analyzed cyclic fault information and memory fault information, and the reliability is higher.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the disclosure. It should be apparent that the drawings in the following description are merely some embodiments of the disclosure, and that other drawings may be derived from those drawings by one of ordinary skill in the art without inventive effort.

FIG. 1 illustrates an interaction diagram of a test monitoring device with a test system in an exemplary embodiment;

FIG. 2 is a schematic diagram of a test monitoring device in accordance with the exemplary embodiment;

FIG. 3 shows a schematic diagram of a test monitoring device in this exemplary embodiment;

FIG. 4 illustrates a flow chart of a test monitoring method in the exemplary embodiment;

FIG. 5 illustrates a flow chart of a test monitoring method in the exemplary embodiment;

FIG. 6 illustrates a flow chart of a test monitoring method in the exemplary embodiment;

FIG. 7 illustrates a flow node of a test monitoring method in the exemplary embodiment;

FIG. 8 is a schematic diagram of a test monitoring apparatus according to the exemplary embodiment;

fig. 9 shows a schematic structural diagram of an electronic device in the present exemplary embodiment. Wherein:

10. testing the monitoring equipment; 100. a content analysis device; 110. a communication section; 120. a content analysis section; 200. a display device; 210. a first display assembly; 220. a second display assembly; 300. a page turning component; 410. a first warning assembly; 420. a second warning component; 500. a reset assembly; 600. a storage device; 20. testing the system; 201. a target device.

Detailed Description

Exemplary embodiments will now be described more fully with reference to the accompanying drawings. The exemplary embodiments, however, may be embodied in many different forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a thorough understanding of embodiments of the disclosure. One skilled in the relevant art will recognize, however, that the subject matter of the present disclosure can be practiced without one or more of the specific details, or with other methods, components, devices, steps, and the like. In other instances, well-known technical solutions have not been shown or described in detail to avoid obscuring aspects of the present disclosure.

Furthermore, the drawings are merely schematic illustrations of the present disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus their repetitive description will be omitted. Some of the block diagrams shown in the figures are functional entities and do not necessarily correspond to physically or logically separate entities. These functional entities may be implemented in the form of software, or in one or more hardware modules or integrated circuits, or in different networks and/or processor devices and/or microcontroller devices.

The flow charts shown in the drawings are merely illustrative and do not necessarily include all steps. For example, some steps may be decomposed, and some steps may be combined or partially combined, so that the actual execution sequence may be changed according to the actual situation.

In the related art, during a development phase of a random access memory (i.e., a memory bank, hereinafter referred to as a memory bank), a memory engineer needs to perform compatibility tests on the memory bank, for example, power cycling test (powercycling test), DC cycling test (Power cycling test), reboot test (Power on/off test), and the like, so as to verify that the memory bank can be normally used on different platforms. Taking DC cycling test as an example, during testing, a test script or test software needs to be installed on a test system of a server, and then the server is controlled to be powered on → the system is controlled to enter → the system stays for a period of time → the system is powered off, and the process needs to be cycled for hundreds to thousands of times. In the test process, an engineer needs to enter the server system periodically to check the test log and log in the BMC system remotely to check the server log, so that the efficiency is low.

The BMC system is a small operating system independent of the server system, and the BMC system and an IPMI (Intelligent Platform Management Interface), that is, a baseboard Management controller and an Intelligent Platform Management Interface, are basic core function subsystems of the server and are responsible for core functions of the server, such as hardware state Management, operating system Management, health state Management, power consumption Management, and the like.

The following briefly introduces an application environment of the test monitoring device, the method, the apparatus, the storage medium, and the electronic device provided in the embodiments of the present disclosure:

referring to fig. 1, the test monitoring device, method, apparatus, storage medium, and electronic device provided in the embodiments of the present disclosure are applied to a memory compatibility test system 20, where a hardware device of the test system 20 at least includes a target device 201 configured with a test script and a memory bank, and the test script tests compatibility of the memory bank during running. The target device 201 may be any other device having data processing and script running functions, such as a server, a computer device, a wearable device, and the like, and the embodiment of the present disclosure is not particularly limited. The test log generated in the test process is stored in the BMC system, which is a specific key component in the target device 201, is used to monitor and manage the target device 201, is an independent system, is not affected by a system, hardware, and the like built in the target device 201, and can record the system log, fault analysis, and the like of the target device 201. Through the log in the BMC system, the startup and shutdown information of the target device 201 each time can be known, and whether a memory has a problem in the startup and shutdown process each time can also be known.

A complete test cycle is a process from startup to start of a test until shutdown after the test is completed. Generally, the boot time of the target device 201 is relatively long, and in order to compress the test time, the time for the test script to run in the target device 201 once is also relatively short, so that a worker needs to spend a large amount of time waiting for the boot of the target device 201, and to check the test log before the target device 201 is powered off, otherwise, the worker needs to wait for the next boot. Meanwhile, if it is found that a certain test cycle is abnormal in the checking process, a worker needs to further judge whether the cycle abnormality is related to the memory bank, which needs to remotely connect the target device 201, input the IP address, the user name and the password of the target device 201, log in the BMC system to check the log, find out whether the memory is in error at the time point when the cycle abnormality occurs in the large log, and the workload and the working difficulty are very high. In addition, a memory fault easily causes a down condition of the target device 201, and the target device cannot be normally started, so that the current test process cannot be continuously checked, and normal test analysis is affected.

With reference to fig. 1, in view of the above problem, the present disclosure provides a test monitoring device 10, configured to monitor a test log in a target device 201, which can implement automatic monitoring of a system log without excessive manual intervention, so as to improve efficiency of test monitoring. The test monitoring device 10 at least comprises a content parsing apparatus 100, wherein:

the input end of the content analysis device 100 is connected to the target device 201 through a signal, and the content analysis device 100 is configured to obtain a test log from the target device 201 in a test state, and analyze the test log to obtain cyclic fault information and memory fault information in the test log. The test log refers to a log generated by the target device 201 when running the test script and used for representing the compatibility state of the memory bank. The cycle fault information refers to abnormal information generated in a test cycle, and a general cycle log has a corresponding cycle identifier and a corresponding error identifier is configured for the abnormal cycle, so that the content analysis device 100 can directly screen a log having both the cycle identifier and the error identifier from an initial test log based on an information extraction script configured in advance inside, and can obtain the cycle fault information; meanwhile, the period of each cycle is also relatively fixed, the content analysis device 100 may also compare the preset time interval of each cycle with the actual cycle time interval of each cycle in the actual test directly based on the preset time interval of each cycle, if the preset time interval of each cycle is consistent with the actual cycle time interval, it means that the current test cycle is normal, and if the preset time interval of each cycle is inconsistent with the actual cycle time interval, it means that the current cycle is abnormal, and then record the label of the current cycle, so as to obtain the corresponding cycle fault information. The memory fault information is fault information related to a memory bank in a test cycle, and corresponding to the cycle fault, a test log related to the memory also has a corresponding memory identifier, and a corresponding error identifier is configured for an abnormal state, so that the content analysis device 100 can directly screen and check a log having both the memory identifier and the error identifier from an initial test log based on an internally configured information extraction script, and can obtain the memory fault information. The content analysis device 100 may be a server, a computer device, a controller, a PLC chip, or the like, and this implementation is not particularly limited, and only needs to implement a function of obtaining a test log from the target device 201 in a test state, and analyzing the test log to obtain cyclic fault information and memory fault information in the test log.

The test monitoring device 10 provided by the embodiment of the disclosure can acquire the test log from the target device 201 in the test state, and analyze the test log to obtain the cycle fault information and the memory fault information in the test log, and does not need to frequently enter the target device 201 for manual query by a worker, so that the efficiency is higher, thereby solving the technical problem that an engineer needs to regularly enter the server system to check the test log and remotely log in the BMC system to check the server log in the test process at present, and the efficiency is lower, and achieving the technical effect of improving the test monitoring efficiency; meanwhile, in the embodiment of the present disclosure, the test monitoring device 10 is used to monitor the test logs in the target device 201, so that a problem that a worker who is down in the target device 201 cannot enter the log system to check the historical test logs normally due to a memory fault of the target device 201 and the like can be avoided, and the worker can continue to perform analysis processing based on the test logs acquired by the content analysis device 100 and the cycle fault information and the memory fault information acquired by analysis, so that the reliability is higher.

Referring to fig. 2, in an alternative embodiment of the present disclosure, the content parsing apparatus 100 includes: communication component 110 and content parsing component 120, wherein:

the sending component of the communication component 110 is in signal connection with the target device 201, the receiving component of the communication component 110 is in signal connection, and the communication component 110 is configured to obtain the test log from the target device 201 and transmit the test log to the content analysis component 120. The communication module may be any wired communication module, for example, signals are transmitted by optical fibers, cables, or the like, or may be a wireless communication module, in which a signal transmitter is provided on the target device 201 side as a transmission module, and a receiver is provided on the content analysis unit 120 side as a reception module, thereby realizing communication between the target device 201 and the content analysis unit 120. The specific form or category of the communication component 110 in the embodiment of the present disclosure is not limited at all, and may be specifically selected or set according to the actual situation, and only the function of signal transmission between the actual target device 201 and the content analysis component 120 is required.

The input end of the content analysis component 120 is connected to the receiving component of the communication component 110 by a signal, and the content analysis component 120 is configured to analyze the test log to obtain the cyclic fault information and the memory fault information in the test log. The cycle failure information obtained by the content analysis component 120 may include the current cycle number, the time length of each cycle, and the like, and the obtained memory failure information may include the failure content, the failure physical location, the failure occurrence time, and the like of the memory. The content analysis component 120 may be any electronic device having a content analysis function, such as a computer device, a controller, a PLC chip, and the like, the specific form, the category, and the like of the content analysis component 120 are not limited in any way in the embodiment of the present disclosure, and may be specifically selected and set according to an actual situation, and only the function of analyzing the test log to obtain the cycle fault information and the memory fault information in the test log needs to be implemented.

The content analysis device 100 according to the embodiment of the present disclosure includes a communication component 110 and a content analysis component 120, the communication component 110 is used to transport the test logs between the target device 201 and the content analysis component 120, the content analysis component 120 may cache or store the test logs obtained by the communication component 110, and then gradually analyze the test logs according to its own analysis rate to obtain the cyclic fault information and the memory fault information of the test logs, different components execute different functions, may reserve more computing resources for the memory analysis component, improve the analysis efficiency of the memory analysis device for the test logs, and further improve the monitoring efficiency of the test monitoring of the embodiment of the present disclosure.

With continued reference to fig. 2, in an alternative embodiment of the present disclosure, the test monitoring apparatus 10 further includes: a display device 200, wherein:

the input end of the display device 200 is in signal connection with the output end of the content analysis device 100, and the display device 200 is used for displaying cycle fault information and memory fault information, so that a worker can conveniently check the current test process in real time, the test process is more intuitive, and corresponding measures can be taken in time under the condition of fault or abnormity, and the reliability, stability and safety of the test are improved. The display device 200 may be any type of LCD display, CRT display, LED display, 3D display, etc., and the embodiments of the present disclosure are not limited in particular, and may be specifically selected or set according to actual situations.

Referring to fig. 3, in an alternative embodiment of the present disclosure, the display device 200 includes a first display element 210 and a second display element 220, wherein:

the first display component 210 is connected to the output end of the content analysis apparatus 100, and the first display component 210 is used for displaying the number of test cycles in the cycle failure information. In the above embodiment, the content analysis component 120 analyzes the test log to obtain the loop fault information including the current loop frequency, where the test loop frequency refers to the current loop frequency when performing a test loop, and may be used to characterize the current test process. In this embodiment, the number of test cycles is displayed by setting the first display component 210, which is more intuitive, so that the worker can know the number of current test cycles in time, and then determine the process of the current cycle test through the number of test cycles, and take corresponding measures for the current process, thereby further improving the reliability of the test monitoring provided by the embodiment of the present disclosure. The first display component 210 can be a display for displaying text, images and videos, and has a better display effect; the counter only displaying numbers can be used, so that the cost is lower, the embodiment is not particularly limited, the counter can be specifically selected and set according to actual conditions, and the purpose of displaying the current cycle number can be achieved.

The second display module 220 is in signal connection with an output end of the content analysis apparatus 100, and the second display module 220 is configured to display fault location information in the memory fault information. In the above embodiment, the content analysis component 120 analyzes the test log to obtain the memory fault information including the fault location information, where the memory fault location information refers to the physical location of the test fault related to the memory. In this embodiment, the fault location information is displayed through the second display component 220, which is more intuitive and can facilitate quick positioning by a worker when a memory fault occurs, so that reason analysis is quickly performed and corresponding measures are taken, the efficiency of solving the test cycle fault is improved, and the reliability of test monitoring provided by the embodiment of the disclosure is further improved. The second display module 220 may be the same as or different from the first display module 210, and only needs to implement a function of displaying fault location information.

According to the embodiment of the disclosure, the first display component 210 and the second display component 220 are independent from each other, the current cycle number is displayed through the first display component 210, and the fault position information is displayed through the second display component 220, so that the first display component 210 and the second display component 220 can be conveniently separated from each other, and corresponding information provided for corresponding workers, such as the current cycle number or the fault position information, is higher in flexibility; meanwhile, the inconvenience that information confusion or workers identify due to the fact that various information is displayed in the same display assembly can be prevented, the intuition of various information is improved, and the monitoring effect of test monitoring of the embodiment of the disclosure is further improved.

With continued reference to fig. 3, in an alternative embodiment of the present disclosure, the test monitoring device 10 further includes: the page turning component 300, the first warning component 410, the second warning component 420, the resetting component 500 and the storage device 600, wherein:

the input end of the page turning component 300 is in signal connection with the output end of the content analysis device 100, the output end of the page turning component 300 is in signal connection with the control ends of the first display component 210 and the second display component 220, respectively, the page turning component 300 is used for controlling the first display component 210 and the second display component 220 to synchronously turn pages under the action of the first drive signal, so that the test cycle times displayed in the first display component 210 correspond to the fault location information displayed in the second display component 220, for example, a memory fault occurs in the 15 th cycle, the first display component 210 displays the 15 th cycle, the second display component 220 displays the specific fault location information of the memory fault occurring in the 15 th cycle, and thus the contents displayed in the first display component 210 and the second display component 220 are matched, which is more intuitive, which is convenient for a worker to check, and further improves the test monitoring effect.

The first warning component 410 is in signal connection with the output end of the content analysis apparatus 100, and the first warning component 410 is configured to display a first warning signal when the time length of a single cycle in the cycle failure information is greater than a preset time length. In the loop process, the test loop duration of each test loop is generally determined by the test function to be executed, and is generally fixed. Therefore, when the single cycle duration is longer than the preset duration, it means that an abnormality may occur in the current cycle, in this case, the first warning component 410 may generate, for example, a sound signal, a light signal, or another first warning signal having a warning function, so as to remind a worker of the current abnormal condition, so that the worker may perform an investigation at the first time and take a corresponding measure, so as to ensure the normal operation of the test, and further improve the stability of the test monitoring of the embodiment of the present disclosure. The preset time length can be set by a worker according to own experience, or can be calculated from historical cycle time length, for example, the time interval between two adjacent boot logs or two shutdown logs is obtained through statistics, and the time interval is determined as the single cycle time length of the test cycle; for example, an average value or a weighted average value of time intervals between a plurality of adjacent two startup logs or shutdown logs is calculated, and the average value or the weighted average value is used as the preset time length.

The second warning component 420 is in signal connection with the output end of the content analysis apparatus 100, and the second display component 220 is configured to display a second warning signal when there is memory error information in the memory fault information. As in the above embodiment, the content analysis device 100 obtains the memory fault information including the fault content, the physical fault location, the fault occurrence time, and the like of the memory by analysis, and as long as any one of the memory fault information indicates that the current memory has an error, the second warning component 420 may generate, for example, a sound signal, an optical signal, or another second warning signal with a warning function, so as to remind the worker of the current abnormal condition, so that the worker can perform the troubleshooting and take corresponding measures in the first time, thereby ensuring the normal operation of the test and further improving the stability of the test monitoring in the embodiment of the present disclosure.

The output end of the reset component 500 is in signal connection with the content analysis device 100, and the reset component 500 is used for controlling the content analysis device 100 to clear the cyclic fault information and the memory fault information under the action of the second driving signal. The reset component 500 can be any form such as a microswitch and a key, and a worker can clear the log of the last test or all logs measured historically by acting on the reset component 500 so as to start a new round of compatibility test, prevent the confusion caused by the excessive logs and save more storage resources at the same time.

The storage device 600 is in signal connection with the content analysis device 100, and the storage device 600 is used for storing memory failure location information in the memory failure information. The storage device 600 can be a random access memory, which can randomly access the data content of any storage unit, and the access time is independent of the physical location of the storage unit, so that the flexibility is better; the storage device 600 may also be a sequential storage device, so that the memory analysis device can conveniently perform the storage in the storage order of the memory fault location information, and sequentially read the memory fault location information according to the storage order, thereby achieving better order. By arranging the storage device 600, the memory fault location information with memory faults can be conveniently stored, and the stored memory fault location information can be directly derived from the storage device 600 when fault processing is needed, so that a worker can conveniently and directly perform fault processing from a corresponding location, fault troubleshooting time is saved, the efficiency of memory fault processing is improved, and the efficiency of test monitoring of the embodiment is further improved.

Certainly, the test monitoring device 10 further includes other auxiliary components such as a power supply and an internet access, which support the normal operation of the test monitoring device, and are not described herein again.

In order to solve the above technical problem, another embodiment of the present disclosure provides a test monitoring method, which takes the content analysis apparatus as an execution subject, and exemplifies a test process generated by applying the test monitoring method to the target device in a test state of the content analysis apparatus. Referring to fig. 4, the test monitoring method includes the following steps 401 to 403:

step 401, the content analysis apparatus obtains a test log of the target device during testing.

The content analysis device may obtain the currently generated test log from the target device in real time through the communication component 110, and the communication component 110 may be an external communication device of the content analysis device, or may be an internal device of the content analysis device, which is not limited in this disclosure. The test log refers to a log which is generated when the target device runs the test script and used for representing the compatibility state of the memory bank.

Step 402, the content analysis device analyzes the test log to obtain the cycle fault information and the memory fault information in the test process.

As described above, the cycle failure information refers to exception information generated in a test cycle, and the memory failure information refers to failure information associated with a memory bank. After the content analysis device obtains the test logs, the test logs can be analyzed based on the modes of keyword screening, semantic analysis, category division and the like, and then the cycle fault information and the memory fault information can be obtained.

And step 403, the content analysis device monitors the test process in the target equipment in real time based on the cycle fault information and the memory fault information.

The cycle fault information is used for representing the process of the current fault in the test, the fault range can be quickly reduced, and a worker can search a corresponding test log in the test cycle where the fault is located to determine the specific content of the fault, so that the efficiency is higher. The memory failure information refers to failure information related to a memory bank in a test process.

According to the embodiment of the invention, the test log of the target equipment during testing is firstly obtained, then the test log is analyzed to obtain the cycle fault information and the memory fault information in the test process, finally the test process in the target equipment is monitored in real time based on the cycle fault information and the memory fault information, the test is marked through the cycle fault information, so that the next cycle test based on the node is conveniently continued, and the test state is monitored through the memory fault information, so that the information related to the memory fault, such as the memory fault position, the fault content, the fault occurrence time and the like, can be directly obtained based on the memory fault information under the condition of the memory fault, and the working personnel can conveniently determine the fault information in time and adopt corresponding solving measures, thereby solving the technical problem of low test monitoring efficiency at present, and achieving the technical effects of improving the test monitoring efficiency and reliability.

Referring to fig. 5, in an optional embodiment of the present disclosure, the analyzing the test log by the content analyzing device in step 402 to obtain the cyclic fault information and the memory fault information in the test process includes the following steps 501 to 503:

step 501, the content analysis device extracts the startup and shutdown information and the memory fault information of the target device in the test log.

The power-on and power-off information may be any one of power-on information and power-off information of the target device, and the power-on and power-off information at least includes power-on and power-off time. The content analysis device analyzes the obtained test log to obtain various information, the test log related to the memory has a corresponding memory identifier, and a corresponding error identifier is configured for the abnormal state, so that the content analysis device can directly screen and obtain the log with the memory identifier and the error identifier from the initial test log based on the internally configured information extraction script, and the memory fault information can be obtained.

Step 502, the content analysis device determines the number of test cycles and the cycle state of each test cycle based on the power on/off information.

The target device is a cycle between two adjacent start-ups or two adjacent shut-downs, so that the cycle time can be determined based on the time interval between two start-ups or the time interval between two shut-downs, and the cycle state of each test cycle is used for representing whether the test cycle is normal or not or whether the test cycle is wrong or not. The cycling state may include two types: the loop is normal and abnormal, and the state grade can be determined in other manners, such as first-stage, second-stage, third-stage, and the like, so that the loop state of the loop can be represented more accurately.

Step 503, the content analysis device determines the fault location information of the memory fault based on the memory fault information.

The memory fault information may include information such as fault content, fault physical location, and fault occurrence time of the memory, and the memory analysis device may obtain the fault location information only by searching based on a keyword or dividing information. The fault location information refers to a specific physical location where a memory fault occurs.

According to the method and the device, the startup and shutdown information and the memory fault information of the target device in the test log are extracted according to the analysis content, and then the test cycle times for representing the test process and the cycle state of each test cycle are determined according to the startup and shutdown information, so that the test can be continued based on the test cycle node in the next compatibility test without repeating, and the test efficiency is greatly improved. Meanwhile, the fault position information of the memory fault is determined based on the memory fault information, and the specific position of the fault can be conveniently and quickly determined by a worker, so that the fault content can be quickly screened and corresponding measures can be taken at the position, the fault solving efficiency is greatly improved, and the test monitoring effect of the embodiment of the disclosure is further improved.

Referring to fig. 6, in an optional embodiment of the present disclosure, the step 502, the content analysis device determining the number of test cycles and the cycle status of each test cycle based on the power on/off information, includes the following steps 601 to 603:

step 601, the content analysis device determines the number of times of power on/off of the target device and the duration of each power on/off.

As in the above embodiment, the content analysis device obtains the identifier of each startup and shutdown and the corresponding startup and shutdown time based on screening in the startup and shutdown log of the target device. For example, the first startup time is recorded as t1, the first shutdown time is recorded as t2, the second startup time is recorded as t3, the second shutdown time is recorded as t4, the corresponding first startup and shutdown duration is recorded as t2-t1, the corresponding second startup and shutdown duration is recorded as t4-t3, and so on, so as to obtain the duration corresponding to each startup and shutdown.

Step 602, the content analysis device determines the number of test cycles according to the number of power-on/off times.

The test script runs on the target device, and the running period generally refers to a complete test cycle from the start-up of the target device to the automatic shutdown of the target device, that is, one test cycle can be counted by one start-up, or one test cycle is counted by one shutdown. Certainly, one on/off operation may also correspond to, for example, 0.5 test cycles or 2 or n test cycles, and the embodiment of the present disclosure is not specifically limited and may be specifically set according to an actual situation.

Step 603, the content analysis device determines the cycle state of each test cycle according to the relative size of the duration of each power on/off and the preset duration.

The duration refers to the duration of the target device from power on to power off, and the content analysis device may calculate the duration based on the difference between each time of power on and the corresponding obtained time of power off. The preset time length may be determined by a worker according to experience, or may be calculated from the historical cycle time length in the same manner as in the above embodiment, and will not be described herein again. The loop status is used to characterize whether the current test loop is normal or faulty. The content analysis device may determine the circulation state based on a difference between the duration and the preset duration, wherein the larger the absolute value of the difference is, the more normal the circulation is, the smaller the absolute value of the difference is, the more normal the circulation is.

According to the method and the device for monitoring the power on/off of the target equipment, the power on/off times of the target equipment and the duration of each power on/off are determined, then the testing cycle times are determined according to the power on/off times, the power on/off times are information which can be directly determined and obtained from the testing log of the target equipment, the reliability of the testing cycle times determined and obtained based on the power on/off times is higher, and the reliability of the testing monitoring method provided by the embodiment of the invention is further improved. Meanwhile, the cycle state of each test cycle is determined according to the relative size of the duration of each startup and shutdown and the preset duration, the cycle state of each test cycle is determined through the correlation among the duration, the preset duration and the cycle state, the determination method is simple and rapid, the determination efficiency can be greatly improved on the premise of ensuring the accuracy of the determined cycle state, and further the reliability and the efficiency of the test monitoring method of the embodiment of the disclosure are improved.

In an optional embodiment of the present disclosure, the step 603 and the content analysis device determine the cycle state of each test cycle according to the relative size of the duration of each power on/off and the preset duration, which includes the following two cases:

in the first case, if the duration of the current power on/off is longer than the preset duration, the content analysis device determines that the cycle state of the current test cycle is abnormal.

As in the above embodiment, if the duration is longer than the preset duration, and the time spent in the current test cycle is longer than the expected time, it means that the current test cycle may have a fault, and thus the current cycle is abnormal, and the content analysis device determines the current cycle state as the cycle abnormality.

In the second case, if the duration of the current power on/off is not greater than the preset duration, the content analysis device determines that the cycle state of the current test cycle is normal.

If the duration is not longer than the preset duration, the time spent by the current test cycle is far within the expected time range, the probability that the current test cycle may have a fault is low, and the content analysis device determines the current cycle state as abnormal cycle.

The embodiment of the disclosure determines whether the cycle state of the current test cycle is abnormal or normal based on the relative size between the duration and the preset duration, the determination method does not need a complex algorithm, is simple and quick, can greatly improve the efficiency of determining the cycle state, and further improves the monitoring efficiency of the test monitoring method provided by the embodiment of the disclosure.

In an optional embodiment of the present disclosure, the test monitoring method further includes the following steps:

in the first case, if the loop status is loop abnormal, the content analysis device sends a first control signal to the first warning component to instruct the first warning component to generate a first warning signal.

The first warning component can be an acoustic alarm, an optical alarm or other types of alarms, and can send out first warning signals in any forms such as acoustic signals, optical signals and the like under the condition that the circulation state is abnormal; the first warning component can also be an indicator light, the indication is not bright or emits light of a first color under normal conditions, and the first warning component emits light or emits light of a second color under the condition that the cycle state of the current test cycle is abnormal; the first warning component can also be a display, and displays the text or image information of the normal class under the condition that the circulation state is normal, for example, displays the text content of the normal class, and displays the text or image information of the abnormal class under the condition that the circulation state is abnormal, for example, displays the text content of the error class, so as to remind the current abnormal situation of the working personnel, and the working personnel can conveniently perform the troubleshooting and take the corresponding measures at the first time, so as to ensure the normal operation of the test, and further improve the stability of the test monitoring of the embodiment of the disclosure.

In the second case, if there is a memory error in the memory failure information, the content analysis device sends a second control signal to the second warning component to instruct the second warning component to generate a second warning signal.

Corresponding to the above embodiment, the second warning component may be an acoustic alarm, an optical alarm or other type of alarm, and issues a second warning signal in any form, such as an acoustic signal and an optical signal, when there is a memory error in the memory fault information; the second warning component can also be an indicator light, the indication is not on or emits light with a second color under normal conditions, and the second warning component emits light or emits light with the second color under the condition that the memory error exists in the current memory fault information; the second warning component may also be a display, and displays "normal" type text or image information, for example, "normal" text content, when there is no memory error in the memory fault information, and displays "abnormal" type text or image information, for example, "memory error" text content, when there is a memory error in the memory fault information, so as to remind a worker of the current abnormal situation, so that the worker can perform troubleshooting and take corresponding measures in the first time, so as to ensure normal performance of the test, and further improve the stability of the test monitoring of the embodiment of the present disclosure.

and the content analysis device sends the test cycle times to the first display component for display.

The content analysis component analyzes the test log to obtain the cycle fault information containing the current cycle number, wherein the test cycle number refers to the number of the current cycle when the test cycle is performed, and can be used for representing the process of the current test. In this embodiment, through setting up first display module and showing test cycle number, can make things convenient for the staff in time to know current test cycle number, and then confirm the process of current cycle test through test cycle number, take corresponding measure to current process, further improve the reliability of the test control that this disclosed embodiment provided.

And the content analysis device sends the fault position information to the second display component for display.

The content analysis component analyzes the test log to obtain memory fault information containing fault position information, wherein the memory fault position information refers to a physical position of a test fault related to the memory. In this embodiment, this trouble positional information is shown through the second display module, can conveniently be fixed a position fast when memory trouble takes place for the staff to quick reason analysis of carrying on and take corresponding measure, and then improve the efficiency that test cycle trouble was solved, further improve the reliability of the test monitoring that this disclosed embodiment provided.

And if the memory fault information has a memory error, sending a second control signal to a second warning component to indicate the second warning component to generate a second warning signal.

As in the above embodiment, the content analysis device analyzes and obtains the memory fault information including the fault content, the physical fault location, the fault occurrence time, and the like of the memory, and as long as any one of the memory fault information represents that the current memory has an error, the second warning component may generate, for example, a sound signal, an optical signal, or another second warning signal with a warning function, so as to remind the worker of the current abnormal condition, so that the worker can perform the troubleshooting and take corresponding measures in the first time, thereby ensuring the normal operation of the test, and further improving the stability of the test monitoring of the embodiment of the present disclosure.

The following briefly summarizes the general process of the embodiments of the present disclosure with reference to fig. 7 and the above-described embodiments:

referring to fig. 7, in the embodiment of the present disclosure, a test log generated when a memory bank is tested is first acquired from a target device, for example, a server, and then the acquired test log is analyzed in a content analysis device to obtain cyclic fault information that can be used for characterizing a current test process and memory fault information that is used for characterizing a fault related to the memory bank, and a test process in the target device is monitored in real time in the memory analysis device based on the cyclic fault information and the memory fault information. And displaying the current test cycle number on the first display component and displaying the fault position information on the second display component.

Meanwhile, the testing cycle number is determined based on the startup and shutdown number obtained by analysis in the testing log, the cycle state of each testing cycle is determined based on the relative size of the startup and shutdown duration and the preset duration obtained by analysis in the testing log, and a first control signal is sent to the first warning component to indicate the first warning component to generate a first warning signal under the condition that the cycle state is abnormal in cycle. And under the condition that the memory fault information has a memory error, sending a second control signal to the second warning component to indicate the second warning component to generate a second warning signal.

In order to implement the above-mentioned test monitoring method, an embodiment of the present disclosure provides a test monitoring apparatus 800. Fig. 8 shows a schematic architecture diagram of the test monitoring apparatus 800, the test monitoring apparatus 800 comprising an acquisition module 810, a parsing module 820 and a monitoring module 830, wherein:

the obtaining module 810 is configured to obtain a test log of a target device during testing;

the analysis module 820 is configured to analyze the test log to obtain cyclic fault information and memory fault information in the test process;

the monitoring module 830 is configured to monitor a test process in the target device in real time based on the cycle fault information and the memory fault information.

In an optional embodiment, the parsing module 820 is specifically configured to extract the power on/off information and the memory fault information of the target device in the test log; determining the number of test cycles and the cycle state of each test cycle based on the startup and shutdown information; and determining fault position information of the memory fault based on the memory fault information.

In an optional embodiment, the parsing module 820 is specifically configured to determine the number of times of powering on and powering off the target device, and the duration of each powering on and powering off; determining the test cycle times according to the startup and shutdown times; and determining the cycle state of each test cycle according to the relative size of the duration of each startup and shutdown and the preset duration.

In an optional embodiment, the parsing module 820 is specifically configured to determine that the cycle state of the current test cycle is a cycle exception if the duration of the current power on/off is greater than a preset duration; and/or if the duration of the current startup and shutdown is not greater than the preset duration, determining that the cycle state of the current test cycle is normal.

In an alternative embodiment, the parsing module 820 is further configured to send a first control signal to the first warning component to instruct the first warning component to generate the first warning signal if the loop status is a loop exception.

In an alternative embodiment, the parsing module 820 is further configured to send the number of test cycles to the first display component for display; and/or sending the fault position information to the second display component for display.

In an optional embodiment, the parsing module 820 is further configured to send a second control signal to the second warning device to instruct the second warning device to generate a second warning signal if there is a memory fault in the memory fault information.

Exemplary embodiments of the present disclosure also provide a computer-readable storage medium, which may be implemented in the form of a program product, including program code for causing an electronic device to perform the steps according to various exemplary embodiments of the present disclosure described in the above-mentioned "exemplary method" section of this specification, when the program product is run on the electronic device. In one embodiment, the program product may be embodied as a portable compact disc read only memory (CD-ROM) and include program code, and may be run on an electronic device, such as a personal computer. However, the program product of the present disclosure is not limited thereto, and in this document, a readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.

The program product may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples (a non-exhaustive list) of the readable storage medium include: an electrical connection having one or more wires, a portable diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

A computer readable signal medium may include a propagated data signal with readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A readable signal medium may also be any readable medium that is not a readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.

Program code embodied on a readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.

Program code for carrying out operations for the present disclosure may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device, or entirely on the remote computing device or server. In the case of a remote computing device, the remote computing device may be connected to the user computing device through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computing device (e.g., through the internet using an internet service provider). In the disclosed embodiments, the program code stored in the computer readable storage medium, when executed, may implement any of the steps in the test monitoring method described above.

Referring to fig. 9, an exemplary embodiment of the present disclosure further provides an electronic device 900, which may be a background server of an information platform. The electronic device 900 is explained below with reference to fig. 9. It should be understood that the electronic device 900 shown in fig. 9 is only one example and should not bring any limitations to the functionality or scope of use of the embodiments of the present disclosure.

As shown in fig. 9, the electronic device 900 is embodied in the form of a general purpose computing device. Components of electronic device 900 may include, but are not limited to: at least one processing unit 910, at least one memory unit 920, and a bus 930 that couples various system components including the memory unit 920 and the processing unit 910.

Where the storage unit stores program code, which may be executed by the processing unit 910, to cause the processing unit 910 to perform the steps according to various exemplary embodiments of the present invention described in the above section "exemplary methods" of the present specification. For example, processing unit 910 may perform method steps, etc., as shown in fig. 4.

The storage unit 920 may include volatile memory units such as a random access memory unit (RAM) 921 and/or a cache memory unit 922, and may further include a read only memory unit (ROM) 923.

Storage unit 920 may also include a program/utility 924 having a set (at least one) of program modules 925, such program modules 925 including, but not limited to: an operating system, one or more application programs, other program modules, and program data, each of which or some combination thereof may comprise an implementation of a network environment.

The bus 930 may include a data bus, an address bus, and a control bus.

The electronic device 900 may also communicate with one or more external devices 2000 (e.g., keyboard, pointing device, bluetooth device, etc.), which may be through an input/output (I/O) interface 940. Electronic device 900 may also communicate with one or more networks (e.g., a local area network (LA 9), a wide area network (WA 9), and/or a public network, such as the internet) via network adapter 950. As shown, the network adapter 950 communicates with the other modules of the electronic device 900 over a bus 930. It should be appreciated that although not shown in the figures, other hardware and/or software modules may be used in conjunction with the electronic device 900, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems, among others.

In the disclosed embodiments, the program code stored in the electronic device may implement any of the steps of the above test monitoring method when executed.

It should be noted that although in the above detailed description several modules or units of the device for action execution are mentioned, such a division is not mandatory. Indeed, the features and functions of two or more modules or units described above may be embodied in one module or unit, according to exemplary embodiments of the present disclosure. Conversely, the features and functions of one module or unit described above may be further divided into embodiments by a plurality of modules or units.

As will be appreciated by one skilled in the art, aspects of the present disclosure may be embodied as a system, method or program product. Accordingly, various aspects of the present disclosure may be embodied in the form of: an entirely hardware embodiment, an entirely software embodiment (including firmware, microcode, etc.) or an embodiment combining hardware and software aspects that may all generally be referred to herein as a "circuit," module "or" system. Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.

It will be understood that the present disclosure is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is to be limited only by the following claims.

Claims

1. A test monitoring device, comprising:

the content analysis device is used for acquiring a test log from the target equipment in a test state and analyzing the test log to obtain cycle fault information and memory fault information in the test log.

2. The test monitoring device of claim 1, wherein the content parsing means comprises:

the sending component of the communication component is in signal connection with the target equipment, and the communication component is used for acquiring the test log from the target equipment;

the input end of the content analysis component is in signal connection with the receiving component of the communication component, and the content analysis component is used for analyzing the test log to obtain the cycle fault information and the memory fault information in the test log.

3. The test monitoring device of claim 1, further comprising:

4. The test monitoring device of claim 3, wherein the display means comprises:

the first display component is in signal connection with the output end of the content analysis device and is used for displaying the test cycle times in the cycle fault information;

5. The test monitoring device of claim 4, further comprising:

the input end of the page turning component is in signal connection with the output end of the content analysis device, the output end of the page turning component is in signal connection with the control ends of the first display component and the second display component respectively, and the page turning component is used for controlling the first display component and the second display component to synchronously turn pages under the action of a first driving signal.

6. The test monitoring device of claim 1, further comprising:

the first warning component is in signal connection with the output end of the content analysis device and is used for displaying a first warning signal when the single cycle time length in the cycle fault information is longer than a preset time length; and/or the presence of a gas in the gas,

and the second warning component is in signal connection with the output end of the content analysis device, and the second display component is used for displaying a second warning signal when the memory fault information comprises memory error information.

7. The test monitoring device of claim 1, further comprising:

and the output end of the reset component is in signal connection with the content analysis device, and the reset component is used for controlling the content analysis device to clear the cyclic fault information and the memory fault information under the action of a second driving signal.

8. The test monitoring device of claim 1, further comprising:

9. A test monitoring method, comprising:

acquiring a test log of target equipment during testing;

analyzing the test log to obtain cyclic fault information and memory fault information in the test process;

10. The method according to claim 9, wherein the analyzing the test log to obtain the cyclic fault information and the memory fault information in the test process comprises:

11. The method of claim 10, wherein determining the number of test cycles and the cycle status of each test cycle based on the power-on/off information comprises:

determining the times of power on and power off of the target equipment and the duration of each power on and power off;

determining the test cycle times according to the startup and shutdown times;

and determining the cycle state of each test cycle according to the relative size of the continuous time length of each startup and shutdown and a preset time length.

12. The method according to claim 11, wherein determining the cycle status of each test cycle according to the relative size of the duration of each power on/off and a preset duration comprises:

and if the duration of the current startup and shutdown is not greater than the preset duration, determining that the cycle state of the current test cycle is normal.

13. The test monitoring method of claim 12, further comprising:

and if the circulation state is the abnormal circulation state, sending a first control signal to a first warning component to indicate the first warning component to generate a first warning signal.

14. The test monitoring method of claim 11, further comprising:

sending the test cycle times to a first display component for display; and/or the presence of a gas in the atmosphere,

15. The test monitoring method of claim 1, further comprising:

and if the memory fault information has memory errors, sending a second control signal to a second warning component to indicate the second warning component to generate a second warning signal.

16. A test monitoring device, the device comprising:

the analysis module is used for analyzing the test log to obtain cyclic fault information and memory fault information in the test process;

17. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the method of any one of claims 9 to 15.

18. An electronic device, comprising:

a processor; and

a memory for storing executable instructions of the processor;

wherein the processor is configured to perform the method of any of claims 9 to 15 via execution of the executable instructions.