CN114614914A - One-to-many zigbee production test system and method based on white list - Google Patents
One-to-many zigbee production test system and method based on white list Download PDFInfo
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- H—ELECTRICITY
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- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
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- H—ELECTRICITY
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Abstract
The invention belongs to the technical field of wireless testing, and discloses a one-to-many zigbee production testing system and method based on a white list, wherein the testing system comprises an upper computer and a testing gateway, the testing gateway is used for establishing a zigbee network and connecting zigbee equipment to be tested, and the upper computer is used for analyzing and displaying a testing result; the upper computer sends the Mac address list to the test gateway by identifying the test channel from the Mac address of the zigbee equipment to be tested to the upper computer in advance, and in the process of processing the information of the network access equipment by the test gateway, the messages which do not belong to the Mac address list can be shielded, so that the interference of other equipment on the processing of the test gateway is reduced, and the test gateway can accurately acquire the information of the zigbee equipment to be tested and perform communication connection. The invention has the beneficial effects that: the problem that a test gateway processing system is interfered by other information is solved, the processing performance of the test gateway is improved, on the basis of a simple test system, a shielding room environment is not needed, and the construction cost of the test environment is saved.
Description
[ technical field ] A method for producing a semiconductor device
The invention relates to the technical field of wireless testing, in particular to a one-to-many zigbee production testing system and method based on a white list.
[ background of the invention ]
Under the background of the universal internet era, the zigbee network is mainly established as sensing layer data transmission and is widely applied to the fields of sensor networks and the like. The zigbee has strong networking capability as a wireless network technology with short distance, low power consumption, low data transmission rate and low cost. The wireless test technology plays an important role in the production process of wireless products, and is used for ensuring the radio frequency consistency of the products, thereby improving the quality and stability of the products. A good automatic production test system can greatly improve the production test efficiency. In a common zigbee automatic production test system, under the conditions of complexity of a wireless environment and multi-device interference, the test system is adopted in a shielding room, only one device to be tested can be tested at each time, the test efficiency is very low, the test environment is set up to be complex, the cost of the shielding room is very high, and the production test cost is high. Therefore, it is necessary to provide a one-to-many zigbee production test system and method based on a white list, so as to solve the disadvantages of low efficiency, high cost and the like of the one-to-one test method in most existing zigbee production test systems, and achieve the purposes of reducing the production test cost and improving the production test efficiency.
[ summary of the invention ]
The invention discloses a white list-based one-to-many zigbee production test system and method, which can effectively solve the technical problems involved in the background technology.
In order to achieve the purpose, the technical scheme of the invention is as follows:
a one-to-many zigbee production test system based on a white list is used for carrying out production test on zigbee equipment to be tested and comprises an upper computer and a test gateway, wherein the test gateway is used for establishing a zigbee network and connecting the zigbee network to be tested with the zigbee equipment to be tested, the upper computer is used for analyzing and displaying a test result and sending a Mac address of the zigbee equipment to be tested to the test gateway to serve as the white list.
As a preferred improvement of the present invention: the upper computer is connected with the test gateway through a serial port.
As a preferred improvement of the present invention: the number of the zigbee devices to be tested is multiple.
As a preferred improvement of the present invention: the zigbee equipment to be tested is a product or a development board carrying a zigbee chip.
A white list-based one-to-many zigbee production test method comprises the following steps:
s1, connecting the upper computer and the test gateway to obtain a Mac address of the zigbee equipment to be tested;
s2, starting the upper computer, and inputting the Mac address of the zigbee device to be tested;
s3, the upper computer sends the Mac address of the zigbee device to be tested to the test gateway to serve as a white list;
s4, the upper computer generates a test command to the test gateway, and the test gateway is in network connection with the zigbee equipment to be tested;
and S5, the test gateway sends the test data of the zigbee equipment to be tested to the upper computer, and the upper computer performs data statistics and gives a test result.
As a preferred improvement of the present invention: in the step S1, the upper computer is connected to the test gateway based on a serial protocol.
As a preferred improvement of the present invention: the number of the zigbee devices to be tested is multiple.
The invention has the following beneficial effects:
1. the white list design of the test gateway is adopted, the problem that a test gateway processing system is interfered by other information can be solved, the processing performance of the test gateway is improved, the shielding of a room environment can be avoided on the basis of a simple test system, the test is carried out by using the scheme, and the construction cost of the test environment is saved;
2. when the test system needs to expand the channel, the processing capacity of the test gateway is continuously optimized, so that the test channel can be easily expanded, the test efficiency is greatly improved, and the production test flow is improved;
3. the test environment is simple to build, the test can be easily carried out only by the upper computer and the test gateway, the use scene is more flexible and not limited, and the method is suitable for the existing zigbee test system, and is particularly suitable for parallel high-efficiency production test of large-batch same equipment.
[ description of the drawings ]
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without inventive efforts, wherein:
FIG. 1 is a schematic structural diagram of a white list-based one-to-many zigbee production test system according to the present invention;
FIG. 2 is a logic flow diagram of a white list based one-to-many zigbee production test method according to the present invention;
FIG. 3 is a flowchart illustrating an implementation of a white list-based one-to-many zigbee production test method according to the present invention.
[ detailed description ] embodiments
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the following embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that all the directional indicators (such as up, down, left, right, front, and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the movement situation, etc. in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, the descriptions related to "first", "second", etc. in the present invention are only for descriptive purposes and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the present invention, unless otherwise explicitly stated or limited, the terms "connected", "fixed", and the like are to be understood broadly, for example, "fixed" may be fixedly connected, may be detachably connected, or may be integrated; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In addition, the technical solutions in the embodiments of the present invention may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination of technical solutions should not be considered to exist, and is not within the protection scope of the present invention.
Referring to fig. 1, the invention provides a one-to-many zigbee production test system based on a white list, which is used for carrying out production test on zigbee equipment to be tested, and the system comprises an upper computer and a test gateway, wherein the test gateway is used for establishing a zigbee network and connecting the zigbee network with the zigbee equipment to be tested, and the upper computer is used for analyzing and displaying a test result and sending a Mac address of the zigbee equipment to be tested to the test gateway to serve as the white list.
As an implementation mode, the test system comprises a PC upper computer and a Zigbee test gateway, a plurality of Zigbee devices to be tested are connected to the Zigbee test gateway through a Zigbee networking, and the PC upper computer is connected with the Zigbee test gateway through a serial port. PC host computer: and the test system is interacted with the gateway based on a serial port protocol and is used for analyzing and displaying a test result. zigbee test gateway: the zigbee full-function node is realized based on the NXP-zigbee chip JN5169, and the zigbee full-function node serves as a coordinator of a zigbee network, establishes the zigbee network and is connected with zigbee equipment to be tested. The zigbee equipment to be tested: the invention can be a product or a development board carrying zigbee chips, and the invention is specifically implemented by adopting the product of EFR32MG21 series zigbee chips of Silicon Labs as the to-be-tested equipment for actual production test.
Preferably, the number of the zigbee devices to be tested is multiple, the upper computer is connected with the test gateway through a serial port, and the zigbee devices to be tested are products or development boards carrying zigbee chips.
The function of the above-mentioned equipment is: 1. starting a PC upper computer, and inputting a Mac address of the zigbee equipment to be tested in a test channel; 2. the PC upper computer whitelists the Mac address of the zigbee equipment to be tested to the test gateway through the UART interface; 3. the PC upper computer sends a test command to the test gateway, and the test gateway allows network access; 4. powering on zigbee equipment to be tested, and sending network access broadcast; 5. the test gateway acquires the information of the zigbee equipment to be tested through data interaction in the network access process; 6. the test gateway sends the obtained test result to a PC upper computer through a UART; 7. and the PC upper computer performs statistical analysis on the test data of each device according to the Mac address of the device and gives a test result.
The upper computer sends the Mac address list to the test gateway through a test channel for identifying the Mac address of the zigbee equipment to be tested to the upper computer in advance, and in the process of processing the information of the network access equipment by the test gateway, the messages which do not belong to the Mac address list can be shielded, so that the interference of other equipment on the processing of the test gateway is reduced, the processing performance of the test gateway is improved, and the test gateway can also accurately acquire the information of the zigbee equipment to be tested for communication connection. Because the Mac address is globally unique, the upper computer performs multi-channel processing according to the Mac address identifier, and therefore the one-to-many zigbee testing method is achieved.
As shown in fig. 2, a white-list-based one-to-many zigbee production test method includes the following steps:
s1, connecting the upper computer and the test gateway to obtain a Mac address of the zigbee equipment to be tested;
s2, starting the upper computer, and inputting the Mac address of the zigbee device to be tested;
s3, the upper computer sends the Mac address of the zigbee device to be tested to the test gateway to serve as a white list;
s4, the upper computer generates a test command to the test gateway, and the test gateway is in network connection with the zigbee equipment to be tested;
and S5, the test gateway sends the test data of the zigbee equipment to be tested to the upper computer, and the upper computer performs data statistics and gives a test result.
Preferably, in step S1, the upper computer is connected to the test gateway based on a serial protocol, and the number of zigbee devices to be tested is plural.
As shown in fig. 3, one embodiment of the present invention includes the steps of:
the method comprises the following steps: before the production test system is started, program firmware burning and Mac address writing are carried out on the zigbee equipment to be tested, and the Mac address two-dimensional code of the zigbee equipment to be tested is attached to the zigbee equipment to be tested.
Step two: the method comprises the steps of opening upper computer software of a production test system, setting relevant parameters (coordinator channels, power and the like), and selecting multi-channel test.
Step three: and respectively inputting the Mac address of the zigbee equipment to be tested into the corresponding channel information frames through a code scanning gun, and starting a test system command.
Step four: and the starting command writes the setting parameters and the equipment Mac address white list into the test gateway through the serial port, starts the network access allowing command of the test gateway and starts to scan the network access request instruction of the zigbee equipment to be tested.
And step five, electrifying the three zigbee devices to be tested simultaneously, and accessing the zigbee devices to be tested to the test gateway through the network access request.
And step six, the test gateway is filtered through a Mac address white list, is accessed to the zigbee equipment to be tested, and sends a test instruction and an information inquiry instruction to obtain the test information of the zigbee equipment to be tested.
Step seven: and the test gateway sends the information of all the zigbee devices to be tested back to the upper computer software through the serial port device.
Step eight: and (3) the upper computer software carries out classification processing on data of different Mac address channels through serial port message processing, calculates a test result through statistical analysis and displays the test result on an upper computer interface, and if all test indexes meet the standard, the judgment is passed, otherwise, the judgment is failed.
The white list design of the test gateway is adopted, the problem that a test gateway processing system is interfered by other information can be solved, the processing performance of the test gateway is improved, on the basis of a simple test system, a shielding room environment is not needed, the scheme is used for testing, and the test environment building cost is saved.
The working principle is as follows: the upper computer sends the Mac address list to the test gateway through a test channel for identifying the Mac address of the zigbee equipment to be tested to the upper computer in advance, and in the process of processing the information of the network access equipment by the test gateway, the messages which do not belong to the Mac address list can be shielded, so that the interference of other equipment on the processing of the test gateway is reduced, the processing performance of the test gateway is improved, and the test gateway can also accurately acquire the information of the zigbee equipment to be tested for communication connection.
While embodiments of the invention have been disclosed above, it is not limited to the applications set forth in the specification and the embodiments, which are fully applicable to various fields of endeavor for which the invention pertains, and further modifications may readily be made by those skilled in the art, it being understood that the invention is not limited to the details shown and described herein without departing from the general concept defined by the appended claims and their equivalents.
Claims (7)
1. A one-to-many zigbee production test system based on a white list is used for carrying out production test on zigbee equipment to be tested, and is characterized in that: the device comprises an upper computer and a test gateway, wherein the test gateway is used for establishing a zigbee network and connecting the zigbee equipment to be tested, and the upper computer is used for analyzing and displaying a test result and sending a Mac address of the zigbee equipment to be tested to the test gateway to serve as a white list.
2. The whitelist-based one-to-many zigbee production test system of claim 1, wherein: the number of the zigbee devices to be tested is multiple.
3. The whitelist-based one-to-many zigbee production test system of claim 1, wherein: the upper computer is connected with the test gateway through a serial port.
4. The whitelist-based one-to-many zigbee production test system of claim 1, wherein: the zigbee equipment to be tested is a product or a development board carrying a zigbee chip.
5. A testing method of a white-list based one-to-many zigbee production test system according to any one of claims 1 to 4, comprising the steps of:
s1, connecting the upper computer with the test gateway to obtain a Mac address of the zigbee device to be tested;
s2, starting the upper computer, and inputting the Mac address of the zigbee device to be tested;
s3, the upper computer sends the Mac address of the zigbee device to be tested to the test gateway to serve as a white list;
s4, the upper computer generates a test command to the test gateway, and the test gateway is in network connection with the zigbee equipment to be tested;
and S5, the test gateway sends the test data of the zigbee equipment to be tested to the upper computer, and the upper computer performs data statistics and gives a test result.
6. The method of claim 5, wherein the method comprises: in the step S1, the upper computer is connected to the test gateway based on a serial protocol.
7. The method of claim 5, wherein the method comprises: the number of the zigbee devices to be tested is multiple.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210135987.2A CN114614914A (en) | 2022-02-15 | 2022-02-15 | One-to-many zigbee production test system and method based on white list |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20190258805A1 (en) * | 2016-11-04 | 2019-08-22 | Singapore University Of Technology And Design | Computer-implemented method and data processing system for testing device security |
| CN112398828A (en) * | 2020-11-04 | 2021-02-23 | 浙江瑞瀛物联科技有限公司 | Quick network access method and system based on zigbee system |
| CN112702705A (en) * | 2020-12-24 | 2021-04-23 | 深圳市豪恩安全科技有限公司 | Equipment debugging method, device and system based on Zigbee technology |
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- 2022-02-15 CN CN202210135987.2A patent/CN114614914A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20190258805A1 (en) * | 2016-11-04 | 2019-08-22 | Singapore University Of Technology And Design | Computer-implemented method and data processing system for testing device security |
| CN112398828A (en) * | 2020-11-04 | 2021-02-23 | 浙江瑞瀛物联科技有限公司 | Quick network access method and system based on zigbee system |
| CN112702705A (en) * | 2020-12-24 | 2021-04-23 | 深圳市豪恩安全科技有限公司 | Equipment debugging method, device and system based on Zigbee technology |
Non-Patent Citations (1)
| Title |
|---|
| USER4741693: "ZigBee MAC地址白名单设计经验分享", Retrieved from the Internet <URL:https://e2echina.ti.com/support/wireless-connectivity/zigbee-and-thread/f/zigbee-threadforum/ 120609/zigbee-mac> * |
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