CN114460875B - Power supply circuit and camera testing device - Google Patents
Power supply circuit and camera testing device Download PDFInfo
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- CN114460875B CN114460875B CN202111660779.6A CN202111660779A CN114460875B CN 114460875 B CN114460875 B CN 114460875B CN 202111660779 A CN202111660779 A CN 202111660779A CN 114460875 B CN114460875 B CN 114460875B
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- 238000006243 chemical reaction Methods 0.000 claims abstract description 14
- 238000005070 sampling Methods 0.000 claims description 107
- 238000005259 measurement Methods 0.000 claims description 70
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
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- G05B2219/24036—Test signal generated by microprocessor, for all I-O tests
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Abstract
The application discloses a power supply circuit and a camera testing device, which relate to the field of industrial universal testing equipment, wherein the power supply circuit comprises: a Micro Control Unit (MCU), an analog-to-digital conversion (ADC) module and at least one power module connected with a Device Under Test (DUT), wherein the MCU controls the power module to output a power signal to the connected DUT and outputs a detected current value and/or voltage value of the DUT to the ADC module; the ADC module performs analog-to-digital conversion on the current value and/or the voltage value of the DUT and feeds the current value and/or the voltage value back to the MCU; the MCU controls the power supply module to adaptively adjust the output power supply signal according to the fed-back current value and/or voltage value, solves the problems of poor power supply precision and stability and poor universality of the camera testing device in the related art, and realizes the camera testing device.
Description
Technical Field
The application relates to the field of industrial universal test equipment, in particular to a power circuit and a camera testing device.
Background
In an industrial general-purpose test apparatus, the apparatus is compatible with testing various test loads, and the power supply voltage, the industrial current, the standby current, the protection current, and the like of each Device Under Test (DUT) may be inconsistent. The power supply voltage ranges from a few tenths V to tens of V, the current ranges from mu A level to A level, the dynamic range of the voltage and the current is very large, and the precision requirement is very high.
Digital power supplies in current test equipment either use Power Management Unit (PMU) chips or discrete device solutions where it is difficult for the adjustable supply voltage and current sampling measurement drive modules to cover both high dynamic range voltages and high dynamic range currents, while in the discrete device solutions, accuracy and stability are difficult to guarantee for different Devices Under Test (DUTs).
Therefore, how to meet the problems of the high voltage dynamic range and the high current dynamic range of the test system on the premise of solving the accuracy of the power supply voltage and the accuracy of the current test is to be solved.
Disclosure of Invention
The invention mainly aims to provide a power supply circuit and a camera testing device, and aims to enable a testing system to cover high dynamic range voltage and high dynamic range current simultaneously on the premise of solving the problems of power supply voltage precision and current testing precision.
In order to achieve the above object, the present invention provides a power supply circuit and a camera testing device, the power supply circuit includes: the device comprises a Micro Control Unit (MCU), an analog-to-digital conversion (ADC) module and at least one power module connected with a Device Under Test (DUT), wherein the MCU controls the power module to output a power signal to the connected DUT and output a detected current value and/or voltage value of the DUT to the ADC module; the ADC module performs analog-to-digital conversion on the current value and/or the voltage value of the DUT and feeds the current value and/or the voltage value back to the MCU; and the MCU controls the power supply module to adaptively adjust the output power supply signal according to the fed-back current value and/or voltage value.
In an exemplary embodiment, a power module includes a digital-to-analog converter (DAC), an adjusting module, and a measurement driving module, where the DAC is configured to perform digital-to-analog conversion on a received output driving voltage of the MCU to obtain a converted analog signal; the adjusting module is used for amplifying and adjusting the converted analog signals and outputting current signals of different measuring gears so that the DUT works normally; the measuring driving module is used for receiving the current signal of at least one measuring gear, providing a driving voltage signal and/or a driving current signal for the DUT, and/or detecting the current value and/or the voltage value of the DUT.
In an exemplary embodiment, a conditioning module includes a current amplifier and a sampling resistor module, where the current amplifier is configured to amplify the converted analog signal to obtain an amplified signal; and the sampling resistor module is used for adjusting different measurement gears of the amplified signal to obtain a current signal of at least one measurement gear.
In an exemplary embodiment, a current amplifier includes a seventh operational amplifier, an eighth operational amplifier, and a ninth operational amplifier, the amplified signals include a first amplified signal, a second amplified signal, and a third amplified signal, wherein an input end of the seventh operational amplifier is connected to an output end of a DAC, and the output signal of the DAC is amplified to obtain the first amplified signal; the input end of the eighth operational amplifier is connected with the output end of the seventh operational amplifier, the first amplified signal is amplified for the second time to obtain the third amplified signal, and the third amplified signal is output to an external sampling resistor; and the input end of the ninth operational amplifier is connected with the output end of the seventh operational amplifier, the first amplified signal is amplified for the second time to obtain the second amplified signal, and the second amplified signal is output to the sampling resistor module.
In an exemplary embodiment, a sampling resistor module includes a plurality of sampling resistor selection circuits connected in parallel, one end of each sampling resistor selection circuit is connected to an output end of the current amplifier, and the other end of each sampling resistor selection circuit is connected to an input end of the measurement driving module and an input end of the DUT respectively, wherein the plurality of sampling resistor selection circuits respectively include a selection switch and a sampling resistor, and each sampling resistor selection circuit corresponds to one measurement gear.
In an exemplary embodiment, a measurement drive module includes a current sampling measurement drive module and/or a voltage sampling measurement drive module, where the current sampling measurement drive module is configured to receive a current signal of at least one measurement gear, provide a drive current for a DUT and/or detect a current value of the DUT; the voltage sampling measurement driving module is used for receiving current signals of at least one measurement gear, providing driving voltage for the DUT and/or detecting the voltage value of the DUT.
In an exemplary embodiment, a current sampling measurement driving module includes a first operational amplifier, a second operational amplifier, a third operational amplifier, a sixth resistor, a seventh resistor, an eighth resistor, and a ninth resistor, where a positive input end of the first operational amplifier is connected to one end of an external sampling resistor, an opposite input end of the first operational amplifier is connected to an output end of the external sampling resistor, and a first buffer amplifier is formed, and an output end of the first buffer amplifier is connected to one end of the sixth resistor; the positive input end of the second operational amplifier is connected with one end of an external sampling resistor, the negative input end of the second operational amplifier is connected with the output end of the second operational amplifier to form a second buffer amplifier, and the output end of the second buffer amplifier is connected to one end of the seventh resistor; a positive input end of the third operational amplifier is connected to the other end of the sixth resistor, and a negative input end of the third operational amplifier is connected to the other end of the seventh resistor; the ninth resistor is connected between the reverse input end and the output end of the third operational amplifier; one end of the eighth resistor is connected with the positive input end of the third operational amplifier, and the other end of the eighth resistor is connected with the voltage signal output by the DAC.
In an exemplary embodiment, the voltage sampling measurement driving module includes a fourth operational amplifier, a fifth operational amplifier, a sixth operational amplifier, a tenth resistor, an eleventh resistor, a twelfth resistor, and a thirteenth resistor, where a positive input terminal of the fourth operational amplifier is connected to one end of the DUT, a negative input terminal thereof is connected to an output terminal thereof, and a third buffer amplifier is formed, and an output terminal of the third buffer amplifier is connected to one end of the tenth resistor; the positive input end of the fifth operational amplifier is connected with the other end of the DUT, the negative input end of the fifth operational amplifier is connected with the output end of the DUT to form a fourth buffer amplifier, and the output end of the fourth buffer amplifier is connected to one end of the eleventh resistor; a positive input end of the sixth operational amplifier is connected to the other end of the tenth resistor, and a negative input end of the sixth operational amplifier is connected to the other end of the eleventh resistor; the thirteenth resistor is connected between the reverse input end and the output end of the sixth operational amplifier; one end of the twelfth resistor is connected with the positive input end of the sixth operational amplifier, and the other end of the twelfth resistor is grounded.
In an exemplary embodiment, a configuration module is configured to configure an operation mode and a measurement gear of a power module, where the operation mode includes: providing a driving voltage, providing a driving current, measuring an actual voltage, measuring an actual current.
In an exemplary embodiment, a power supply module is connected with a DUT through a four-wire system, the four-wire system includes a driving power supply line, a sampling power supply line, a driving ground line and a sampling ground line, wherein one end of the driving power supply line is connected with an output end of a current amplifier in the adjusting module, and the other end of the driving power supply line is connected with one end of an external sampling resistor; one end of the sampling power supply line is connected with the output end of the sampling resistor module in the adjusting module, and the other end of the sampling power supply line is respectively connected with the other end of the external sampling resistor and one end of the DUT; one end of the driving grounding wire is connected with a first positive input end of a voltage sampling measurement driving module in the measurement driving module, and the other end of the driving grounding wire is connected with the other end of the DUT; one end of the sampling grounding wire is connected with a second positive input end of the voltage sampling measurement driving module in the measurement driving module, and the other end of the sampling grounding wire is connected with the other end of the DUT.
In an exemplary embodiment, a camera testing apparatus includes a power circuit that outputs corresponding signals for a DUT according to different modes of operation, the DUT including a camera module, a camera chip.
The technical scheme provided by the application has the beneficial effects that:
In the technical scheme, the MCU of the power supply circuit controls the power supply module to output power supply signals to the connected DUTs, and outputs detected current values and/or voltage values of the DUTs to the ADC module, the ADC module carries out analog-to-digital conversion on the current values and/or voltage values of the DUTs and feeds back the converted current values and/or voltage values to the MCU, and the MCU controls the power supply module to adaptively adjust the output power supply signals according to the fed-back current values and/or voltage values, so that the problems of poor power supply precision and stability and poor universality of the camera testing device in the related art are solved, and the camera testing device is realized.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings that are required to be used in the description of the embodiments of the present application will be briefly described below.
FIG. 1 is a schematic block diagram of a power supply circuit according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a power module according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of an adjustment module according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a measurement driving module according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a current amplifier according to an embodiment of the present invention;
Fig. 6 is a schematic diagram of a camera testing system according to an embodiment of the present invention.
Detailed Description
Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative only and are not to be construed as limiting the application.
As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless expressly stated otherwise, as understood by those skilled in the art. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element or intervening elements may also be present. Further, "connected" or "coupled" as used herein may include wirelessly connected or wirelessly coupled. The term "and/or" as used herein includes all or any element and all combination of one or more of the associated listed items.
For the purpose of making the objects, technical solutions and advantages of the present application more apparent, the embodiments of the present application will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1, a schematic block diagram of a power supply circuit according to an exemplary embodiment is shown.
In this embodiment, the power circuit 100 includes a Micro Control Unit (MCU) 130, an analog-to-digital conversion (ADC) module 150, and at least one power module 110 coupled to a Device Under Test (DUT) 200.
Specifically, the MCU130 controls the power module 110 to output a power signal to the connected DUT200 and outputs the detected current value and/or voltage value of the DUT200 to the ADC module 150; the ADC module 150 performs analog-to-digital conversion on the current value and/or the voltage value of the DUT200 and feeds back the converted current value and/or voltage value to the MCU130; the MCU130 controls the power module 110 to adaptively adjust the output power signal according to the fed-back current value and/or voltage value.
Through the technical scheme, the problems of poor power supply precision and stability and poor universality in the camera testing device in the related art are solved, and the camera testing device is realized.
As shown in fig. 2, a schematic diagram of a power module according to an exemplary embodiment is shown.
In this embodiment, the power module 110 includes a digital-to-analog converter (DAC) 111, a conditioning module 113, a measurement drive module 115, and a configuration module 117.
The DAC111 is configured to perform digital-to-analog conversion on the received output driving voltage of the MCU130, to obtain a converted analog signal; the adjusting module 113 is used for amplifying and adjusting the converted analog signals and outputting current signals with different measuring gears so that the DUT200 works normally; measuring the gear includes: a first measured gear, a second measured gear, a third measured gear, a fourth measured gear, and a fifth measured gear; a measurement drive module 115 for providing a drive power signal to the DUT200 and/or measuring a current value and/or a voltage value of the DUT; the configuration module 117 is configured to configure an operation mode and a measurement gear of the power module, where the operation mode includes: providing a driving voltage, providing a driving current, measuring an actual voltage, measuring an actual current.
Specifically, the conditioning module 113 includes a current amplifier 1131 and a sampling resistor module 1133, where the current amplifier 1131 is configured to amplify the converted analog signal to obtain a first amplified signal; and the sampling resistor module 1133 is used for performing measurement gear adjustment on the first amplified signal to obtain a first adjustment signal.
As shown in fig. 3, a schematic diagram of an adjustment module according to an exemplary embodiment is shown.
In this embodiment, the conditioning module 113 includes a current amplifier 1131 and a sampling resistor module 1133.
Specifically, the sampling resistor module 1133 includes a first sampling resistor selection circuit, a second sampling resistor selection circuit, a third sampling resistor selection circuit, a fourth sampling resistor selection circuit, and a fifth sampling resistor selection circuit, where the five sampling resistor selection circuits are connected in parallel, one end of each of the five sampling resistor selection circuits is connected to an output end of the current amplifier, and the other end of each of the five sampling resistor selection circuits is connected to an input end of the current sampling measurement driving module, and the first sampling resistor selection circuit includes a first selection switch (SW 1) and a first sampling resistor (R1) corresponding to a first measurement gear; the second sampling resistor selection circuit comprises a second selection switch (SW 2) and a second sampling resistor (R2) corresponding to a second measurement gear; the third sampling resistor selection circuit comprises a third selection switch (SW 3) and a third sampling resistor (R3) corresponding to a third measurement gear; the fourth sampling resistor selection circuit comprises a fourth selection switch (SW 4) and a fourth sampling resistor (R4) corresponding to a fourth measurement gear; the fifth sampling resistor selection circuit comprises a fifth selection switch (SW 5) and a fifth sampling resistor (R5) corresponding to a fifth measurement gear.
Specifically, the sampling resistor module 1133 includes a plurality of sampling circuits that measure gear positions including: 25mA, 2.5mA, 250. Mu.A, 25. Mu.A, 5. Mu.A. The voltage conversion precision of 0.5% can be achieved on the measurement gear, and the current measurement precision of the system can reach 1% FS by matching with the ADC150 module. The specific measurement accuracy is shown in table 1.
Table 1 list of current measurement accuracy at different measurement gears
| Project | Gear position | Load current | Unit (B) | Test value | Deviation of |
| Current testing | 5.0 | 4 | uA | 4.00 | 0.00％ |
| Current testing | 25.0 | 19 | uA | 18.95 | -0.26％ |
| Current testing | 250.0 | 190 | uA | 189.09 | -0.48％ |
| Current testing | 2.5 | 1.9 | mA | 1.895 | -0.26％ |
| Current testing | 25.0 | 20 | mA | 20.05 | 0.25％ |
| Current testing | 500.0 | 75 | mA | 75.19 | 0.25％ |
| Current testing | 500.0 | 100 | mA | 100.13 | 0.13％ |
| Current testing | 500.0 | 200 | mA | 200.24 | 0.12％ |
| Current testing | 1200.0 | 800 | mA | 802.50 | 0.31％ |
Specifically, the measurement drive module 115 includes a current sampling measurement drive module 1151 and a voltage sampling measurement drive module 1153, wherein the current sampling measurement drive module 1151 is configured to provide a drive current to the DUT200 and/or measure a current value of the DUT 200; a voltage sample measurement drive module 1153 for providing a drive voltage to the DUT200 and/or measuring a voltage value of the DUT 200.
As shown in fig. 4, a schematic diagram of a measurement drive module according to an exemplary embodiment is shown.
In this embodiment, the measurement drive module 115 includes a current sample measurement drive module 1151 and a voltage sample measurement drive module 1153.
Specifically, the current sampling measurement driving module 1151 includes a first operational amplifier (A1), a second operational amplifier (A2), a third operational amplifier (A3), a sixth resistor (R6), a seventh resistor (R7), an eighth resistor (R8), and a ninth resistor (R9), wherein an inverting input terminal of the first operational amplifier (A1) is connected to an output terminal thereof to form a first buffer amplifier, and an output terminal of the first buffer amplifier is connected to one end of the sixth resistor; the reverse input end of the second operational amplifier (A2) is connected with the output end of the second operational amplifier to form a second buffer amplifier, and the output end of the second buffer amplifier is connected to one end of a seventh resistor (R7); the positive input end of the third operational amplifier (A3) is connected to the other end of the sixth resistor (R6), and the negative input end of the third operational amplifier (A3) is connected to the other end of the seventh resistor (R7); a ninth resistor (R9) is connected between the reverse input end and the output end of the third operational amplifier (A3); one end of the eighth resistor (R8) is connected with the positive input end of the third operational amplifier (A3), and the other end of the eighth resistor (R8) is connected with a voltage measurement gear signal.
Specifically, the voltage sampling measurement driving module 1153 includes a fourth operational amplifier (A4), a fifth operational amplifier (A5), a sixth operational amplifier (A6), a tenth resistor (R10), an eleventh resistor (R11), a twelfth resistor (R12), and a thirteenth resistor (R13), wherein an inverting input terminal of the fourth operational amplifier (A4) is connected to an output terminal thereof to form a third buffer amplifier, and an output terminal of the third buffer amplifier is connected to one terminal of the tenth resistor (R10); the reverse input end of the fifth operational amplifier (A5) is connected with the output end thereof to form a fourth buffer amplifier, and the output end of the fourth buffer amplifier is connected to one end of an eleventh resistor (R11); a positive input end of the sixth operational amplifier (A6) is connected to the other end of the tenth resistor (R10), and a negative input end of the sixth operational amplifier (A6) is connected to the other end of the eleventh resistor (R11); a thirteenth resistor (R13) is connected between the reverse input end and the output end of the sixth operational amplifier (A6); one end of the twelfth resistor (R12) is connected with the positive input end of the sixth operational amplifier (A6), and the other end of the twelfth resistor (R12) is grounded.
As shown in fig. 5, a schematic diagram of a current amplifier according to an exemplary embodiment.
In this embodiment, the current amplifier 113 includes a seventh operational amplifier (A7), an eighth operational amplifier (A8), and a ninth operational amplifier (A9), where an input end of A7 is connected to an output end of the DAC, and amplifies an output signal of the DAC to obtain a first amplified signal; the input end of A8 is connected with the output end of A7, the first amplified signal is amplified for the second time to obtain a third amplified signal, and the third amplified signal is output to an external sampling resistor (Rs) 300; the input end of the A9 is connected with the output end of the seventh operational amplifier, the first amplified signal is amplified for the second time to obtain a second amplified signal, and the second amplified signal is output to the sampling resistor module 1133.
The working principle of the power module will now be described in detail with reference to fig. 2 as follows:
As shown in fig. 2, the voltage sampling measurement driving module 1153 of the power module 110 measures the actual operating voltage, and outputs the actual operating voltage to the MCU130 through the ADC130, and the MCU130 outputs the voltage signal to the current amplifier 1131 through the DAC111 to adjust the voltage output to the DUT 200.
Specifically, the power module 110 provides the desired power supply voltage and current to the DUT200 and is used to measure the voltage and current of the DUT 200; automatically adjusting the output voltage of the DUT200 according to the measured voltage of the DUT200 so that the voltage of the DUT200 reaches the driving voltage required by the DUT200 to compensate the difference between the actual output voltage of the power supply module and the driving voltage required by the DUT 200; and adjusts the external sampling resistor according to the measured operating current of the DUT so that the operating current of the DUT200 accurately tracks the driving current required by the DUT200, thereby improving the accuracy of the driving power and driving current that the power module 110 improves for the DUT 200.
Specifically, the MCU130 configures the operation mode and the measurement gear of the power module 110 through the configuration module 117 of the power module 110, where the operation mode includes: providing a driving voltage, providing a driving current, measuring an actual voltage, measuring an actual current, measuring a gear comprising: 25mA, 2.5mA, 250. Mu.A, 25. Mu.A, 5. Mu.A. The configuration module 117 determines the opening and closing of each selection switch in the sampling resistor module 1133 of the adjustment module 113, and different selection switches correspond to different measurement gears.
As shown in fig. 6, a schematic diagram of a camera testing system according to an exemplary embodiment is shown.
In this embodiment, the camera testing system may be applied to a camera module testing apparatus and a camera chip testing apparatus.
Specifically, the Power supply module is connected to the DUT via a four-wire system including a Power supply line (power_force), a sampling supply line (power_sense), a drive ground line (gnd_force), and a sampling ground line (gnd_sense).
One end of the power_force is connected with the output end of the current amplifier, and the other end of the power_force is connected with one end of an external sampling resistor; one end of the power_sense is connected with the output end of the sampling resistor module, and the other end of the power_sense is connected with the other end of the external sampling resistor and one end of the DUT; one end of the GND_force is connected with a first positive input end of the voltage sampling measurement driving module, and the other end of the GND_force is connected with the other end of the DUT; one end of GND_Sense is connected with the second positive input end of the voltage sampling measurement driving module, and the other end of GND_Sense is connected with the other end of the DUT 200.
Specifically, through the four-wire connection structure, the output voltage is automatically compensated by the power module by collecting the voltage of the DUT terminal, so that the voltage of the DUT is accurately controlled, the accuracy can reach 0.5% FS, and specific parameters are shown in the table 2.
Table 2 list of voltage measurement accuracy at different output voltages
Specifically, the power circuit 100 includes two power modules, namely a first power module 110 and a second power module 120.
Specifically, the power circuit 100 outputs corresponding signals for the DUT according to different modes of operation, the DUT comprising: camera module 201, camera chip 203.
The power module in the embodiment collects the values of the power end and the grounding end through the sampling resistor, and ensures the accuracy of the power voltage applied to the DUT through adjusting the output voltage. The MCU is communicated with the ADC and the power module through a Serial Peripheral Interface (SPI) bus. The DAC in the power module ensures the accuracy of output voltage and high dynamic range. The sampling resistor in the power supply module ensures the precision of small current. The voltage and current sampling data are transmitted to an external ADC, and the current and voltage measurement accuracy meets the requirements.
The MCU writes in the configuration module of the power module which can be accessed directly by the SPI through the SPI, so that the working mode of the power module is configured, the working mode comprises: providing a driving voltage, providing a driving current, measuring an actual voltage, measuring an actual current.
In this embodiment, the power circuit can flexibly expand the number of power modules according to the system requirements to detect multiple DUTs.
According to the scheme, the high precision of the power supply voltage is realized; the current measurement accuracy is high; the output range of the power supply voltage and the current is large; multiple working modes can be realized through the configuration module of the power supply module, and the working modes comprise: providing a driving voltage, providing a driving current, measuring an actual voltage, and measuring an actual current; the system has good expansibility, and the number of the power modules can be flexibly expanded according to the system requirements so as to detect multiple DUTs.
The foregoing is only a partial embodiment of the present application, and it should be noted that it will be apparent to those skilled in the art that modifications and adaptations can be made without departing from the principles of the present application, and such modifications and adaptations are intended to be comprehended within the scope of the present application.
Claims (5)
1. A power supply circuit, the power supply circuit comprising: the micro control unit MCU, the analog-to-digital conversion ADC module and at least one power module connected with the DUT, wherein,
The MCU controls the power supply module to output a current signal of at least one measuring gear to a connected DUT, and outputs a detected current value and/or voltage value of the DUT to the ADC module;
The ADC module performs analog-to-digital conversion on the current value and/or the voltage value of the DUT and feeds the current value and/or the voltage value back to the MCU;
the MCU controls the power module to adaptively adjust the output current signal of at least one measuring gear according to the fed-back current value and/or voltage value;
The power module comprises a digital-to-analog conversion DAC module, an adjusting module and a measurement driving module, wherein the DAC is used for performing digital-to-analog conversion on the received output driving voltage of the MCU to obtain a converted analog signal; the adjusting module is used for amplifying and adjusting the converted analog signals and outputting current signals of at least one measuring gear so that the DUT normally works; the measuring driving module is used for receiving the current signal of at least one measuring gear, providing a driving voltage signal or a driving current signal for the DUT in a first working mode, and detecting a current value or a voltage value of the DUT in normal working in a second working mode; the adjusting module comprises a current amplifier and a sampling resistor module, wherein the current amplifier is used for amplifying the converted analog signal to obtain an amplified signal; the sampling resistor module is used for adjusting different measurement gears of the amplified signal to obtain a current signal of at least one measurement gear; the first operation mode comprises providing a driving voltage or providing a driving current, and the second operation mode comprises measuring an actual current or measuring an actual voltage; the measurement gear comprises 25mA, 2.5mA, 250 μA, 25 μA and 5 μA;
The sampling resistor module comprises a plurality of sampling resistor selection circuits which are connected in parallel, one ends of the sampling resistor selection circuits are connected to the output end of the current amplifier, the other ends of the sampling resistor selection circuits are respectively connected to the input end of the measurement driving module and the input end of the DUT, the sampling resistor selection circuits respectively comprise a selection switch and sampling resistors, each sampling resistor selection circuit corresponds to one measurement gear, and the current amplifier is connected to different sampling resistors by closing different selection switches, so that the power module outputs current signals of different measurement gears;
The measuring driving module comprises a current sampling measuring driving module and/or a voltage sampling measuring driving module, and the current sampling measuring driving module is used for receiving a current signal of at least one measuring gear and providing driving current for the DUT and/or detecting a current value of the DUT; the voltage sampling measurement driving module is used for receiving current signals of at least one measurement gear and providing driving voltage for the DUT and/or detecting the voltage value of the DUT;
The current sampling measurement driving module comprises a first operational amplifier, a second operational amplifier, a third operational amplifier, a sixth resistor, a seventh resistor, an eighth resistor and a ninth resistor, wherein the positive input end of the first operational amplifier is connected with one end of an external sampling resistor, the negative input end of the first operational amplifier is connected with the output end of the external sampling resistor to form a first buffer amplifier, and the output end of the first buffer amplifier is connected to one end of the sixth resistor; the positive input end of the second operational amplifier is connected with the other end of the external sampling resistor, the negative input end of the second operational amplifier is connected with the output end of the second operational amplifier to form a second buffer amplifier, and the output end of the second buffer amplifier is connected to one end of the seventh resistor; a positive input end of the third operational amplifier is connected to the other end of the sixth resistor, and a negative input end of the third operational amplifier is connected to the other end of the seventh resistor; the ninth resistor is connected between the reverse input end and the output end of the third operational amplifier; one end of the eighth resistor is connected with the positive input end of the third operational amplifier, and the other end of the eighth resistor is connected with the voltage signal output by the DAC.
2. The power supply circuit of claim 1, wherein the current amplifier comprises a seventh operational amplifier, an eighth operational amplifier, and a ninth operational amplifier, the amplified signal comprises a first amplified signal, a second amplified signal, and a third amplified signal, wherein,
The input end of the seventh operational amplifier is connected with the output end of the DAC, and the output signal of the DAC is amplified to obtain the first amplified signal;
The input end of the eighth operational amplifier is connected with the output end of the seventh operational amplifier, the first amplified signal is amplified for the second time to obtain the third amplified signal, and the third amplified signal is output to an external sampling resistor;
And the input end of the ninth operational amplifier is connected with the output end of the seventh operational amplifier, the first amplified signal is amplified for the second time to obtain the second amplified signal, and the second amplified signal is output to the sampling resistor module.
3. The power circuit of claim 1, wherein the voltage sampling measurement drive module comprises a fourth operational amplifier, a fifth operational amplifier, a sixth operational amplifier, a tenth resistor, an eleventh resistor, a twelfth resistor, a thirteenth resistor, wherein,
The positive input end of the fourth operational amplifier is connected with one end of the DUT, the negative input end of the fourth operational amplifier is connected with the output end of the fourth operational amplifier to form a third buffer amplifier, and the output end of the third buffer amplifier is connected to one end of the tenth resistor;
the positive input end of the fifth operational amplifier is connected with the other end of the DUT, the negative input end of the fifth operational amplifier is connected with the output end of the fifth operational amplifier to form a fourth buffer amplifier, and the output end of the fourth buffer amplifier is connected to one end of the eleventh resistor;
A positive input end of the sixth operational amplifier is connected to the other end of the tenth resistor, and a negative input end of the sixth operational amplifier is connected to the other end of the eleventh resistor;
the thirteenth resistor is connected between the reverse input end and the output end of the sixth operational amplifier;
One end of the twelfth resistor is connected with the positive input end of the third operational amplifier, and the other end of the twelfth resistor is grounded.
4. The power circuit of any one of claims 1 to 3, wherein said power module is connected to said DUT via four wires including a drive supply line, a sample supply line, a drive ground line, a sample ground line, wherein,
One end of the driving power supply line is connected with the output end of the current amplifier in the regulating module, and the other end of the driving power supply line is connected with one end of an external sampling resistor;
One end of the sampling power supply line is connected with the output end of the sampling resistor module in the adjusting module, and the other end of the sampling power supply line is respectively connected with the other end of the external sampling resistor and one end of the DUT;
one end of the driving grounding wire is connected with a first positive input end of a voltage sampling and measuring driving module in the measuring and driving module, and the other end of the driving grounding wire is connected with the other end of the DUT;
One end of the sampling grounding wire is connected with a second positive input end of the voltage sampling measurement driving module in the measurement driving module, and the other end of the sampling grounding wire is connected with the other end of the DUT.
5. A camera testing apparatus, characterized in that it comprises a power supply circuit according to any one of claims 1 to 4, said power supply circuit outputting current signals of at least one measurement gear for a DUT according to different operation modes, said DUT comprising a camera module, a camera chip.
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