CN114236285B - Detonation experiment electrical measurement dynamic self-checking test system and test method thereof - Google Patents

Detonation experiment electrical measurement dynamic self-checking test system and test method thereof Download PDF

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CN114236285B
CN114236285B CN202111542515.0A CN202111542515A CN114236285B CN 114236285 B CN114236285 B CN 114236285B CN 202111542515 A CN202111542515 A CN 202111542515A CN 114236285 B CN114236285 B CN 114236285B
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trigger
circuit
signal
module
delay
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CN114236285A (en
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张信
文雪峰
李波
杨振伟
蒲国红
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Institute of Fluid Physics of CAEP
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00—Energy generation of nuclear origin
    • Y02E30/30—Nuclear fission reactors

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  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention relates to the technical field of integrated detonation experiment test systems, and discloses a detonation experiment electrical measurement dynamic self-checking test system which comprises a trigger module, a signal delay circuit and a plurality of switch conducting circuits, wherein the trigger module is connected with the signal delay circuit; the trigger module is used for providing a trigger signal to the signal delay circuit, and simultaneously, the trigger signal is synchronously output through the synchronous output module; the invention further discloses an electric measurement dynamic self-detection test method for detonation experiments, wherein the signal delay circuit is provided with a plurality of output channels, the triggering time of each output channel is delayed for a plurality of nanoseconds in sequence, and each channel outputs a triggering line number to the electric probe circuit through the corresponding switch conducting circuit. The invention realizes the time-sharing discharge of the multi-path electric probe, the time delay among the channels is increased by a plurality of nanoseconds, and the state of each channel can be rapidly checked on the oscilloscope.

Description

Detonation experiment electrical measurement dynamic self-checking test system and test method thereof
Technical Field
The invention relates to the technical field of integrated detonation experiment testing systems, in particular to an electric measurement dynamic self-checking testing system and a testing method thereof for a detonation experiment.
Background
In a large detonation integrated test, a time signal of an electric probe is commonly used to distinguish a physical change process, a large number of signals monitored by the electric probe are commonly arranged in a test device, in order to ensure that each probe loop of the electric probe is normal, a mode of manually scraping the signals by each channel is generally adopted to determine whether the loop is normal, a large amount of manpower and time are generally required for manually checking the loop once to complete the work, and in general, two to three times of manual checking are required for a large test, and meanwhile, the time is also increased for the whole test period.
In a large-scale test, the master control system can fully check each subsystem many times, but the electrical probe signal is a signal which needs to be short-circuited at two ends of the probe by explosion impact of a physical device, so each joint test can only check the triggering of an oscilloscope set, and cannot check an electrical probe loop, and if a certain signal fails, the problem can not be found basically.
The simplification of test flow promotes efficiency, and traditional test can increase the simulation device dynamic examination and check whether all systems are normal before formal test, and the introduction of this simulation test device also can increase a lot of consumptions for time schedule, manpower financial resources, has cancelled the examination of dynamic simulation device after the flow optimization now, and the success rate of every passageway is still required to the opportunity that does not have dynamic examination, and electric probe system pressure is great.
Disclosure of Invention
Aiming at the situations of three aspects, in order to fully examine an electric probe system, reduce the operation flow and shorten the whole experiment time, and ensure the reliability of a large-scale electric signal loop, the invention provides an electric measurement dynamic self-checking test system for detonation experiments and a test method thereof, which can complete the discharge process of the electric probe and present discharge data on an oscilloscope only by one trigger, can complete the real whole system examination contact effect, and take down a direct connection formal device after the final joint test is completed, thereby reducing the time spent by experiment operators to test each channel one by one and greatly improving the self-checking efficiency.
The invention is realized by the following technical scheme:
a detonation experiment electrical measurement dynamic self-checking test system comprises a trigger module, a signal delay circuit and a plurality of switch conducting circuits;
the trigger module is used for providing a trigger signal to the signal delay circuit, and simultaneously, the trigger signal is synchronously output through the synchronous output module;
the signal delay circuit is provided with a plurality of output channels, the triggering time of each output channel is delayed for a plurality of nanoseconds in sequence, and each channel outputs a triggering line number to the electric probe circuit through the corresponding switch conducting circuit.
As an optimization, the triggering module comprises a manual triggering sub-module, an optical triggering sub-module and an electric triggering sub-module.
As an optimization, the manual triggering submodule comprises a MAX6817 chip and a peripheral circuit of the MAX6817 chip, and an output end of the MAX6817 chip is connected with an input end of the signal delay circuit.
As optimization, the signal delay circuit comprises a plurality of delay chips connected in series and peripheral circuits of the delay chips, wherein the input end of the delay chip positioned at the first position in the transmission direction of a trigger signal is connected with the output end of the trigger module, and the output end of the delay chip positioned at the last position transmits the trigger signal to the switch-on circuit through a channel; and the last set output end of the previous delay chip is connected with the input end of the next delay chip, and the non-last set output end of the delay chip transmits a trigger signal to the switch conducting circuit through a channel.
As an optimization, the delay chip adopts a DS1005 chip.
As optimization, the switch conducting circuit comprises a triode, a transformer, a mos switch and a BNC connector, wherein the base electrode of the triode is connected with the output end of the signal delay circuit, the emitting electrode of the triode is grounded, the collecting electrode of the triode is connected with one primary end of the transformer, and the other primary end of the transformer is connected with a power supply; the grid electrode and the drain electrode of the mos switch are respectively connected with the two secondary ends of the transformer, and the source electrode and the drain electrode of the mos switch are also respectively connected with the BNC connector.
As an optimization, the mos switch adopts an N MOSFET switch.
As an optimization, the triode adopts an NPN triode.
The intelligent monitoring system is characterized by further comprising an adapter and a synchronous output module, wherein the input end of the adapter is connected with a plurality of output channels of the signal delay circuit through the synchronous output module, and the output end of the adapter is connected with an oscilloscope and used for displaying trigger signals of the analog trigger electric probe.
The invention also discloses a test method of the detonation experiment-based electrical measurement dynamic self-checking test system, which comprises the following steps:
step 1, a trigger signal is given to a signal delay circuit through the trigger module;
step 2, a plurality of output channels of the signal delay circuit sequentially delay for a plurality of nanoseconds to output trigger signals to corresponding switch-on circuits;
and 3, transmitting a trigger signal to a corresponding electric probe circuit by the switch conducting circuit so as to simulate the trigger electric probe circuit.
Compared with the prior art, the invention has the following advantages and beneficial effects:
the invention realizes the time-sharing discharge of the multi-path electric probe, the time delay among the channels is increased by a plurality of nanoseconds, the state of each output channel can be rapidly checked on the oscilloscope, the aim of the whole system joint test check is truly realized, the system is only required to be connected once when the system is built, the system electric probe system can be checked for a plurality of times, and the operating efficiency of the test system operation can be greatly improved.
Drawings
In order to more clearly illustrate the technical solutions of the exemplary embodiments of the present invention, the drawings that are needed in the examples will be briefly described below, it being understood that the following drawings only illustrate some examples of the present invention and therefore should not be considered as limiting the scope, and that other related drawings may be obtained from these drawings without inventive effort for a person skilled in the art. In the drawings:
FIG. 1 is a system frame diagram of an electrical measurement dynamic self-test system for detonation experiments according to the present invention;
FIG. 2 is a circuit diagram of the manual trigger sub-module, signal delay circuit of FIG. 1;
FIG. 3 is a circuit diagram of a switch turn-on circuit;
FIG. 4 is a circuit diagram of an adapter;
FIG. 5 is a signal diagram of an oscilloscope demonstrating simulated triggering of an electrical probe by the detonation experiment electrical measurement dynamic self-test system described in the invention.
Detailed Description
For the purpose of making apparent the objects, technical solutions and advantages of the present invention, the present invention will be further described in detail with reference to the following examples and the accompanying drawings, wherein the exemplary embodiments of the present invention and the descriptions thereof are for illustrating the present invention only and are not to be construed as limiting the present invention.
Example 1
1-5, the detonation experiment electrical measurement dynamic self-checking test system comprises a trigger module, a signal delay circuit and a plurality of switch conducting circuits;
the trigger module is used for providing a trigger signal to the signal delay circuit, and simultaneously, the trigger signal is synchronously output through the synchronous output module; in this embodiment, the triggering module includes a manual triggering sub-module, an optical triggering sub-module, and an electrical triggering sub-module. The manual triggering submodule comprises a MAX6817 chip and a peripheral circuit of the MAX6817 chip, and the output end of the MAX6817 chip is connected with the input end of the signal delay circuit. As shown in fig. 2, the peripheral circuit of the manual triggering sub-module comprises a resistor R14 and a capacitor C4. The electrical probe circuit, the optical triggering sub-module and the electrical triggering sub-module are all in the prior art, and can be obtained by a person skilled in the art according to the prior knowledge, and are not described herein.
The signal delay circuit is provided with a plurality of output channels, the triggering time of each output channel is delayed for a plurality of nanoseconds in sequence, and each channel outputs a triggering line number to the electric probe circuit through the corresponding switch conducting circuit. By forward delay is meant herein that the delay time of each output channel is sequentially incremented, e.g., channel 1 has a delay time of 100ns, channel 2 has a delay time of 200ns, and channel 3 has a delay time of 300ns
In this embodiment, the signal delay circuit includes a plurality of delay chips connected in series and a peripheral circuit of the delay chips, as shown in fig. 2, where the delay chips are DS1005 chips, the peripheral circuit includes a resistor, one end of the resistor is connected to an input end of the DS1005 chip, the other end of the resistor is connected to a ground end of the DS1005 chip, an input end of the delay chip located at the first position in a transmission direction of the trigger signal is connected to an output end of the trigger module, and an output end of the delay chip located at the last position transmits the trigger signal to the switch-on circuit through a channel; and the last set output end of the previous delay chip is connected with the input end of the next delay chip, and the non-last set output end of the delay chip transmits a trigger signal to the switch conducting circuit through a channel. Specifically, as shown in fig. 2, the first delay chip is U1, the last delay chip is U10, the last pin of the last output end of the delay chip DS1005 is TAP5, and meanwhile, for example, the chip U2 is the previous delay chip, and the U3 is the latter delay chip.
The number of delay chips can be set according to the number of electrical probes to be tested. In this embodiment, a self-test system can test 60 electrical probes, and then 15 delay chips and their peripheral circuits are provided.
As shown in fig. 3, in this embodiment, the switch conducting circuit includes a triode Q11, a transformer T1, a mos switch Q1 and a BNC connector Q5, where the mos switch adopts an N MOSFET switch, and the triode adopts an NPN triode.
The base electrode of the triode is connected with the output end of the signal delay circuit, the emitting electrode of the triode is grounded, the collecting electrode of the triode is connected with one primary end of the transformer, and the other primary end of the transformer is connected with a power supply; the grid electrode and the drain electrode of the mos switch are respectively connected with the two secondary ends of the transformer, and the source electrode and the drain electrode of the mos switch are also respectively connected with the BNC connector.
The working principle of the circuit is as follows: after receiving the trigger signal, the trigger signal is sent to a signal delay circuit for outgoing, the signal delay circuit is formed by serially connecting delay lines DS1005-100 chips, the chip outputs a total of 5 channels, the delay between triggering of each channel is 100ns, then a trigger switch conducting circuit is output through a signal delay control circuit, after the SG1 receives the signal, the positive 15V given by the storage battery is conducted through R3 and then through a primary stage of a transformer when a triode Q11 is conducted, so that the secondary stage of the transformer generates a-15V signal to trigger a MOSFET switch Q1 through a current limiting resistor R1, and therefore two ends of a BNC connector Q5 are closed to achieve a simulated trigger state, and the trigger signal is transmitted to an electric probe.
In this embodiment, the device further includes an adapter and a synchronous output module, where an input end of the adapter is connected with a plurality of output channels of the signal delay circuit through the synchronous output module, and an output end of the adapter is connected with an oscilloscope, and is used to display a trigger signal of the analog trigger electric probe.
The invention also discloses a test method of the detonation experiment-based electrical measurement dynamic self-checking test system, which comprises the following steps:
step 1, a trigger signal is given to a signal delay circuit through the trigger module;
step 2, a plurality of output channels of the signal delay circuit sequentially delay for a plurality of nanoseconds to output trigger signals to corresponding switch-on circuits;
and 3, transmitting a trigger signal to a corresponding electric probe circuit by the switch conducting circuit so as to simulate the trigger electric probe circuit.
Taking a detonation ball experiment of a certain explosive as an example, 180 electric probe test points are uniformly and densely distributed on the spherical surface of the explosive, and only 3 dynamic self-checking test systems are needed (60 electric probes can be detected by one self-checking test system is assumed). The trigger signal of the synchronous machine (trigger module) for triggering the oscilloscope is divided into three paths to trigger three sets of systems respectively, and the systems are connected with the record of the oscilloscope together, so that the discharge process of all electric probe measuring points can be completed only by triggering the synchronous machine when self-checking is needed. When the whole system joint test is needed, the initiation device triggers the synchronous machine, and the synchronous machine outputs a trigger signal to trigger the oscilloscope and the dynamic self-checking system to realize the discharge check of the electric probe, so that the joint test can be triggered at any time.
The foregoing description of the embodiments has been provided for the purpose of illustrating the general principles of the invention, and is not meant to limit the scope of the invention, but to limit the invention to the particular embodiments, and any modifications, equivalents, improvements, etc. that fall within the spirit and principles of the invention are intended to be included within the scope of the invention.

Claims (8)

1. The detonation experiment electrical measurement dynamic self-checking test system is characterized by comprising a trigger module, a signal delay circuit and a plurality of switch conducting circuits;
the trigger module is used for providing a trigger signal to the signal delay circuit;
the signal delay circuit is provided with a plurality of output channels, the triggering time of each output channel is delayed for a plurality of nanoseconds in sequence, and each channel outputs a triggering signal to the electric probe circuit through the corresponding switch conducting circuit;
the signal delay circuit comprises a plurality of delay chips connected in series and peripheral circuits of the delay chips, wherein the input end of the delay chip positioned at the first position in the transmission direction of a trigger signal is connected with the output end of the trigger module, and the output end of the delay chip positioned at the last position transmits the trigger signal to the switch-on circuit through a channel; the last set output end of the previous delay chip is connected with the input end of the next delay chip, and the non-last set output end of the delay chip transmits a trigger signal to a switch conducting circuit through a channel;
the switch conducting circuit comprises a triode, a transformer, a mos switch and a BNC connector, wherein the base electrode of the triode is connected with the output end of the signal delay circuit, the emitting electrode of the triode is grounded, the collecting electrode of the triode is connected with one primary end of the transformer, and the other primary end of the transformer is connected with a power supply; the grid electrode and the drain electrode of the mos switch are respectively connected with the two secondary ends of the transformer, and the source electrode and the drain electrode of the mos switch are also respectively connected with the BNC connector.
2. The detonation experiment electrical measurement dynamic self-test system of claim 1, wherein the trigger module comprises a manual trigger sub-module, an optical trigger sub-module and an electrical trigger sub-module.
3. The detonation experiment electrical measurement dynamic self-checking test system according to claim 2, wherein the manual triggering submodule comprises a MAX6817 chip and a peripheral circuit of the MAX6817 chip, and an output end of the MAX6817 chip is connected with an input end of the signal delay circuit.
4. The detonation experimental electrical measurement dynamic self-checking test system according to claim 1, wherein the delay chip adopts a DS1005 chip.
5. The detonation experimental electrical measurement dynamic self-test system of claim 1, wherein the mos switch is an N MOSFET switch.
6. The detonation experimental electrical measurement dynamic self-checking test system according to claim 1, wherein the triode is an NPN triode.
7. The detonation experimental electrical measurement dynamic self-checking test system according to claim 1, further comprising an adapter and a synchronous output module, wherein the input end of the adapter is connected with a plurality of output channels of the signal delay circuit through the synchronous output module, and the output end of the adapter is connected with an oscilloscope for displaying a trigger signal of the analog trigger electrical probe.
8. A testing method of an electrical measurement dynamic self-checking testing system based on detonation experiment according to any one of claims 1-7, characterized by comprising the following steps:
step 1, a trigger signal is given to a signal delay circuit through the trigger module;
step 2, a plurality of output channels of the signal delay circuit sequentially delay for a plurality of nanoseconds to output trigger signals to corresponding switch-on circuits;
and 3, transmitting a trigger signal to a corresponding electric probe circuit by the switch conducting circuit so as to simulate the trigger electric probe circuit.
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CN105659875B (en) * 2010-11-09 2014-04-09 北京航天长征飞行器研究所 A kind of Microsecond grade multi-channel synchronous burst time high-precision measuring method

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CN102495349B (en) * 2011-12-12 2014-07-02 中国科学院深圳先进技术研究院 Path delay on-line measurement circuit
CN206248105U (en) * 2016-11-14 2017-06-13 中国工程物理研究院流体物理研究所 For the new Copper Foil electric probe of Detonation Experiments
CN206147052U (en) * 2016-11-15 2017-05-03 安徽富芯微电子有限公司 Probe station acupuncture treatment automatic measuring device
CN113660554B (en) * 2021-08-23 2023-08-18 中国工程物理研究院流体物理研究所 Large-scale sensing system electric signal time division multiplexing data acquisition device and system
CN113485210B (en) * 2021-08-23 2022-06-17 中国工程物理研究院流体物理研究所 Automatic integrated self-checking system and method for large-scale electric signal sensing system

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CN105659875B (en) * 2010-11-09 2014-04-09 北京航天长征飞行器研究所 A kind of Microsecond grade multi-channel synchronous burst time high-precision measuring method

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