CN114111895A - Device and method for sharing electronic instrument - Google Patents
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- CN114111895A CN114111895A CN202111340391.8A CN202111340391A CN114111895A CN 114111895 A CN114111895 A CN 114111895A CN 202111340391 A CN202111340391 A CN 202111340391A CN 114111895 A CN114111895 A CN 114111895A
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- 238000012360 testing method Methods 0.000 claims abstract description 68
- 239000013307 optical fiber Substances 0.000 claims abstract description 36
- 239000011159 matrix material Substances 0.000 claims abstract description 21
- 238000004891 communication Methods 0.000 claims description 8
- 238000009826 distribution Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 4
- 239000000835 fiber Substances 0.000 claims description 3
- 238000004132 cross linking Methods 0.000 claims description 2
- 230000005693 optoelectronics Effects 0.000 claims 1
- 238000007726 management method Methods 0.000 description 20
- 239000011521 glass Substances 0.000 description 8
- 239000012788 optical film Substances 0.000 description 8
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- 238000012827 research and development Methods 0.000 description 3
- 230000002457 bidirectional effect Effects 0.000 description 2
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- G01—MEASURING; TESTING
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Abstract
The invention discloses a device and a method for sharing an electronic instrument, which relate to the technical field of electronics and comprise a plurality of nodes, wherein each node in the plurality of nodes is provided with a test computer and a first photoelectric protocol converter, and a control signal cross-link exists between the test computer and the photoelectric protocol converter; the system comprises an electronic instrument sharing center, wherein all electronic instruments are concentrated in the electronic instrument sharing center, and a management computer, an optical switch matrix and a second photoelectric protocol converter are arranged in the electronic instrument sharing center; the management computer establishes control signal connection with the optical switch matrix and the second photoelectric protocol converter respectively, and the optical switch matrix is connected with the first photoelectric protocol converter and the second photoelectric protocol converter through optical fibers respectively; the first photoelectric protocol converter and the second photoelectric protocol converter are connected through an optical fiber. The invention can improve the utilization rate of the instrument, reduce the purchase cost of the instrument and lighten the workload of instrument management.
Description
Technical Field
The present invention relates to the field of electronic technologies, and in particular, to an apparatus and a method for sharing an electronic device.
Background
In research and development and production of electronic products, electronic instruments (abbreviated as instruments) are required to be used for detecting and analyzing the electronic products and testing the functions and the performances of the electronic products. Generally, a required electronic instrument is placed beside an electronic product to be tested, the electronic product is connected with an electrical interface of the instrument, then the electronic product operates, the instrument generates a certain electrical signal to be provided for the electronic product, detects and analyzes the electrical signal output by the electronic product, and a test result is obtained after analysis and judgment.
When an electronic product is tested, the collection of the electronic product, a field, instruments required for testing and other equipment is called a station. Generally, a set of instruments is configured at one station, and if another electronic product needs to be tested at the same time, a set of instruments needs to be configured. Therefore, as the scale of research and development and production tasks gradually increases, a situation in which a large number of instruments are distributed over different stations is increasingly presented. The disadvantages of this approach are: in order to meet the requirements of research and development and production, a large number of instruments need to be purchased, and the input cost is high; the start time of each station is different, and the instruments configured at each station are not used all the time, so the utilization rate of the instruments is not high; in order to save cost and improve the utilization rate, instruments which are not used temporarily are generally allocated to required stations, so that management and operating personnel need to frequently acquire the use condition, coordinate and carry the instruments, the work load is increased, and the risk of damage to the instruments and cables is increased due to frequent disassembly, assembly and carrying; the instruments usually need to be measured and checked regularly, the validity periods of the instruments are different, the validity period and the current site of each instrument need to be mastered at any time, the conflict between the delivery inspection and the test work of the instruments is coordinately solved, and the management work of the instruments is heavy and difficult.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide a device and a method for sharing electronic instruments, which adopt the device and the method for sharing electronic instruments which can be dispatched and remotely connected to ensure that all the instruments are centralized in an instrument sharing center and are not required to be distributed and configured on different stations, thereby improving the utilization rate of the instruments, reducing the acquisition cost of the instruments, lightening the workload of instrument management and the like.
The purpose of the invention is realized by the following scheme:
a system for sharing electronic instruments comprises a plurality of nodes, wherein each node in the plurality of nodes is provided with a test computer and a first photoelectric protocol converter, and control signal cross-linking exists between the test computer and the photoelectric protocol converter; the system comprises an electronic instrument sharing center, wherein all electronic instruments are concentrated in the electronic instrument sharing center, and a management computer, an optical switch matrix and a second photoelectric protocol converter are arranged in the electronic instrument sharing center; the management computer establishes control signal connection with an optical switch matrix and a second photoelectric protocol converter respectively, and the optical switch matrix is connected with the first photoelectric protocol converter and the second photoelectric protocol converter respectively through optical fibers; the first photoelectric protocol converter and the second photoelectric protocol converter are connected through an optical fiber.
Furthermore, the test computer establishes control signal connection with the electronic product, and the electronic product establishes measurement signal connection with the first photoelectric protocol converter.
Further, the second photoelectric protocol converter is respectively connected with the electronic product through a measurement signal and a control signal.
Furthermore, the first optical-electrical protocol converter and the second optical-electrical protocol converter are provided with an input interface and an output interface for a test signal, an input interface and an output interface for an optical fiber signal, and an input interface and an output interface for a control signal.
Further, the input and output interfaces of the control signal include a LAN interface.
Further, the first optical-electrical protocol converter converts the input test signal and control signal into optical signals and combines the optical signals to one optical fiber for output, and the optical fiber input signal is converted into corresponding test signal and control signal and output from corresponding interfaces, where the optical fiber input signal is the optical fiber output signal of another optical-electrical protocol converter connected to the second optical-electrical protocol converter. In this embodiment of the present invention, the first optical-electrical protocol converter on the node side converts the input test signal and control signal into optical signals, and the test signal and control signal are transmitted by using optical signals of different frequencies, respectively. The photoelectric protocol converter firstly generates carrier optical signals of two frequencies F1 and F2 by a laser source, then modulates an input test signal onto the carrier optical signal of the frequency F1, modulates a control signal onto the carrier optical signal of the frequency F2, and converges the optical signals of the two frequencies F1 and F2 onto one optical fiber through an optical film on the surface of a glass substrate. The second optical-electrical protocol converter sharing the center firstly generates carrier optical signals of F3 and F4 by a laser source, then modulates the input test signal onto the carrier optical signal of F3, modulates the control signal onto the carrier optical signal of F4, and converges the optical signals of F3 and F4 onto one optical fiber through the optical film on the surface of the glass substrate. Meanwhile, a first photoelectric protocol converter on the node side decomposes an optical fiber input signal into signals of two optical frequencies F3 and F4 through an optical film on the surface of a glass substrate, demodulates a test signal and a control signal, and outputs the signals from corresponding interfaces after the signals are amplified by a low-noise amplifier module; the second optical-electrical protocol converter of the shared center decomposes the optical fiber input signal into signals of two optical frequencies F1 and F2 through an optical film on the surface of the glass substrate, then demodulates a test signal and a control signal, and outputs the signals from corresponding interfaces after the signals are amplified by a low-noise amplifier module. Test signals and control signals of a node side and a shared center are transmitted in a fiber in a bidirectional mode through optical signals with four frequencies, and therefore the utilization rate of an instrument is improved to a great extent.
Furthermore, the optical switch matrix is provided with a control interface and an optical interface, and the optical switch matrix can complete the communication switching between any two of the multiple optical channels.
Further, the optical switch array receives the control signal sent by the optical fiber photoelectric protocol converter, converts the control signal into an electric signal, provides the electric signal to the management computer through the control interface, receives the instruction sent by the management computer, and completes the communication switching of the optical channel according to the instruction.
Further, the management computer arranged in the electronic instrument sharing center is used for managing and scheduling the electronic instrument resources; and the test computer is arranged on the node and used for finishing the control of specific test work and the application of test requirements.
A method based on a system for sharing electronic instruments according to any of the above, comprising the steps of:
s1, centralizing all electronic instruments in the electronic instrument sharing center, converting various test signals of the electronic instruments into optical signals, transmitting the optical signals to the optical switch matrix, switching the optical signals to other optical fibers by the optical switch matrix, and restoring the received optical signals to corresponding electrical signals by the nodes at the far end;
s2, after the test computer of each station and the management computer of the electronic instrument sharing center interact with each other, the management computer completes the distribution of the use right of the instrument and the dispatching of the test signal by controlling the optical channel switching of the optical switch array according to the requirement and the resource condition;
and S3, the testing computer at the node side after the use right of the electronic instrument is obtained performs remote control and remote data reading on the electronic instrument through the control signal, and completes the testing work of the electronic product.
The beneficial effects of the invention include:
the invention realizes a device and a method for sharing an electronic instrument which can simultaneously support the schedulable remote connection of radio frequency, analog and digital signals by photoelectric interconversion, optical transmission and control of an optical channel, so that the instruments are all centralized in an instrument sharing center without being distributed on different stations, thereby improving the utilization rate of the instruments, reducing the acquisition cost of the instruments and lightening the workload of instrument management.
In the embodiment of the invention, after the method is applied to the research and production work of electronic products, the daily average on-time rate of the electronic instruments is increased to more than 80%, the asset management working time of the instruments is shortened by more than 40%, a manager is reduced to one person, and the number of required applications for purchasing the instruments is obviously less than that before the method is applied.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a schematic diagram of the components and principles of the present invention;
FIG. 2 is a schematic diagram of an optical-to-electrical protocol converter according to the present invention;
FIG. 3 is a schematic diagram of an optical switch array according to the present invention;
FIG. 4 is a flow chart of method steps of the present invention.
Detailed Description
All features disclosed in all embodiments in this specification, or all methods or process steps implicitly disclosed, may be combined and/or expanded, or substituted, in any way, except for mutually exclusive features and/or steps.
Example 1: in order to solve the conflict between the delivery and testing of the instrument and the heavy and difficult management of the instrument, the embodiment provides an apparatus for sharing an electronic instrument, which includes a system composed of a plurality of nodes, an electronic instrument sharing center, and optical fibers connecting the nodes and the electronic instrument sharing center, as shown in fig. 1.
The nodes are arranged on the stations, and generally, one node is arranged on one station, and the implementation can be not limited to one. A node at least comprises a testing computer and an optical-electrical protocol converter, and control signals are crosslinked among the testing computer and the optical-electrical protocol converter. Each tested electronic product is correspondingly connected with one photoelectric protocol converter, and the number of the photoelectric protocol converters is not limited in the implementation.
The electronic instrument sharing center at least comprises a management computer, an optical switch matrix, a plurality of photoelectric protocol converters and a plurality of electronic instruments. Each instrument is correspondingly connected with one photoelectric protocol converter, and the number of the photoelectric protocol converters is not limited in the implementation process.
The photoelectric protocol converter can complete the mutual conversion of electric signals and optical signals and is provided with an input interface and an output interface of test signals, an input interface and an output interface of optical fiber signals and an input interface and an output interface of control signals. The test signal refers to a signal which needs to be generated and detected by an electronic instrument when an electronic product is tested, and includes a radio frequency signal, an analog signal and the like. The frequency range of the radio frequency signal is 20 MHz-20 GHz, the maximum input power of the radio frequency is 15dBm, the analog signal is a voltage or current signal, the control signal adopts a LAN communication protocol, and the number of interfaces, signal parameters or the protocol are not limited during implementation. The optical-electrical protocol converter converts the input test signal and control signal into optical signal, and combines these optical signals to an optical fiber for output, at the same time, the optical fiber input signal is converted into corresponding test signal and control signal and output from corresponding interface, the optical fiber input signal is the optical fiber output signal of another optical-electrical protocol converter connected with the optical-electrical protocol converter. As shown in fig. 2.
In this embodiment, the first optical-electrical protocol converter on the node side converts the input test signal and control signal into optical signals, and the test signal and control signal respectively adopt optical signals with different frequencies for signal transmission. The photoelectric protocol converter firstly generates carrier optical signals of two frequencies F1 and F2 by a laser source, then modulates an input test signal onto the carrier optical signal of the frequency F1, modulates a control signal onto the carrier optical signal of the frequency F2, and converges the optical signals of the two frequencies F1 and F2 onto one optical fiber through an optical film on the surface of a glass substrate. The second optical-electrical protocol converter sharing the center firstly generates carrier optical signals of F3 and F4 by a laser source, then modulates the input test signal onto the carrier optical signal of F3, modulates the control signal onto the carrier optical signal of F4, and converges the optical signals of F3 and F4 onto one optical fiber through the optical film on the surface of the glass substrate. Meanwhile, a first photoelectric protocol converter on the node side decomposes an optical fiber input signal into signals of two optical frequencies F3 and F4 through an optical film on the surface of a glass substrate, demodulates a test signal and a control signal, and outputs the signals from corresponding interfaces after the signals are amplified by a low-noise amplifier module; the second optical-electrical protocol converter of the shared center decomposes the optical fiber input signal into signals of two optical frequencies F1 and F2 through an optical film on the surface of the glass substrate, then demodulates a test signal and a control signal, and outputs the signals from corresponding interfaces after the signals are amplified by a low-noise amplifier module. Test signals and control signals of a node side and a shared center are transmitted in a fiber in a bidirectional mode through optical signals with four frequencies, and therefore the utilization rate of an instrument is improved to a great extent.
The optical switch array is provided with a control interface and two groups of 8 optical interfaces, the optical switch array can complete the communication switching between any two of the 8 optical channels and the 8 optical channels, the optical channel difference loss is not more than 3dB, the communication switching time is less than 20ms, the control interface adopts a LAN communication protocol, the diagram in figure 3 shows that the parameters are not limited during implementation.
When the optical switch array works, the optical switch array receives a control signal sent by the photoelectric protocol converter through the optical fiber, converts the control signal into an electric signal and then provides the electric signal to a computer through a control interface, receives an instruction sent by the computer at the same time, and completes communication switching of an optical channel according to the instruction.
As shown in fig. 2 and fig. 3, the present invention concentrates all electronic instruments in the electronic instrument shared center, converts various test signals of the instruments into optical signals, and transmits the optical signals to the optical switch array, the optical switch array switches the optical signals to other optical fibers, and the remote node restores the optical signals to corresponding electrical signals, and vice versa.
As shown in fig. 4, the management computer of the electronic instrument sharing center is responsible for managing and scheduling instrument resources, the test computer of each node is responsible for completing control of specific test work and application of test requirements, and after control signals are interacted between the test computer of each station and the management computer of the electronic instrument sharing center, the management computer completes distribution of instrument usage rights and scheduling of test signals by controlling optical channel switching of the optical switch matrix according to requirements and resource conditions; and the node testing computer after the use right of the instrument is obtained performs remote control and remote data reading on the instrument through the control signal to finish the testing work of the electronic product.
Example 2: on the basis of embodiment 1, this embodiment provides a method based on the system for sharing electronic instruments as described above, including the steps of:
s1, centralizing all electronic instruments in the electronic instrument sharing center, converting various test signals of the electronic instruments into optical signals, transmitting the optical signals to the optical switch matrix, switching the optical signals to other optical fibers by the optical switch matrix, and restoring the received optical signals to corresponding electrical signals by the nodes at the far end;
s2, after the test computer of each station and the management computer of the electronic instrument sharing center interact with each other, the management computer completes the distribution of the use right of the instrument and the dispatching of the test signal by controlling the optical channel switching of the optical switch array according to the requirement and the resource condition;
and S3, the testing computer at the node side after the use right of the electronic instrument is obtained performs remote control and remote data reading on the electronic instrument through the control signal, and completes the testing work of the electronic product.
After the invention is applied to the research and production work of electronic products, the daily average on-time rate of electronic instruments is increased to more than 80%, the asset management working time of the instruments is shortened by more than 40%, managers are reduced to one person, and the number of required applications for purchasing the instruments is less than that before the invention is applied.
The parts not involved in the present invention are the same as or can be implemented using the prior art.
The above-described embodiment is only one embodiment of the present invention, and it will be apparent to those skilled in the art that various modifications and variations can be easily made based on the application and principle of the present invention disclosed in the present application, and the present invention is not limited to the method described in the above-described embodiment of the present invention, so that the above-described embodiment is only preferred, and not restrictive.
Other embodiments than the above examples may be devised by those skilled in the art based on the foregoing disclosure, or by adapting and using knowledge or techniques of the relevant art, and features of various embodiments may be interchanged or substituted and such modifications and variations that may be made by those skilled in the art without departing from the spirit and scope of the present invention are intended to be within the scope of the following claims.
Claims (10)
1. A system for sharing electronic instruments is characterized by comprising a plurality of nodes, wherein each node in the plurality of nodes is provided with a test computer and a first photoelectric protocol converter, and control signal cross-linking exists between the test computer and the photoelectric protocol converter;
the system comprises an electronic instrument sharing center, wherein all electronic instruments are concentrated in the electronic instrument sharing center, and a management computer, an optical switch matrix and a second photoelectric protocol converter are arranged in the electronic instrument sharing center; the management computer establishes control signal connection with an optical switch matrix and a second photoelectric protocol converter respectively, and the optical switch matrix is connected with the first photoelectric protocol converter and the second photoelectric protocol converter respectively through optical fibers; the first photoelectric protocol converter and the second photoelectric protocol converter are connected through an optical fiber.
2. The system of claim 1, wherein the test computer establishes a control signal connection with an electronic product, and the electronic product establishes a measurement signal connection with the first optical-to-electrical protocol converter.
3. The system of claim 1, wherein the second optical-to-electrical protocol converter establishes a measurement signal connection and a control signal connection with the electronic product, respectively.
4. The system of claim 1, wherein the first and second optoelectronic protocol converters are each provided with an input and output interface for test signals, an input and output interface for fiber optic signals, and an input and output interface for control signals.
5. The system of claim 4, wherein the input and output interfaces for the control signal comprise LAN interfaces.
6. The system of claim 4, wherein the first optical-to-electrical protocol converter converts the input test signals and control signals into optical signals and combines the optical signals onto an optical fiber for output, and the optical fiber input signals are converted into corresponding test signals and control signals and output from corresponding interfaces, wherein the optical fiber input signals are the optical fiber output signals of another optical-to-electrical protocol converter connected to the second optical-to-electrical protocol converter.
7. The system of claim 6, wherein the optical switch matrix has a control interface and an optical interface, and the optical switch matrix is capable of performing communication switching between any two of the multiple optical channels.
8. The system of claim 7, wherein the optical switch array receives the control signal from the optical-to-electrical protocol converter through an optical fiber, converts the control signal into an electrical signal, and provides the electrical signal to the management computer through the control interface, and receives the command from the management computer, and completes the connection switching of the optical channels according to the command.
9. The system for sharing electronic instruments according to claim 1, wherein said management computer provided in the electronic instrument sharing center is used for management and scheduling of electronic instrument resources; and the test computer is arranged on the node and used for finishing the control of specific test work and the application of test requirements.
10. A method based on a system for sharing electronic instruments according to any one of claims 1 to 9, comprising the steps of:
s1, centralizing all electronic instruments in the electronic instrument sharing center, converting various test signals of the electronic instruments into optical signals, transmitting the optical signals to the optical switch matrix, switching the optical signals to other optical fibers by the optical switch matrix, and restoring the received optical signals to corresponding electrical signals by the nodes at the far end;
s2, after the test computer of each station and the management computer of the electronic instrument sharing center interact with each other, the management computer completes the distribution of the use right of the instrument and the dispatching of the test signal by controlling the optical channel switching of the optical switch array according to the requirement and the resource condition;
and S3, the testing computer at the node side after the use right of the electronic instrument is obtained performs remote control and remote data reading on the electronic instrument through the control signal, and completes the testing work of the electronic product.
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| CN202111340391.8A CN114111895A (en) | 2021-11-12 | 2021-11-12 | Device and method for sharing electronic instrument |
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| CN202111340391.8A CN114111895A (en) | 2021-11-12 | 2021-11-12 | Device and method for sharing electronic instrument |
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| US5519526A (en) * | 1992-10-21 | 1996-05-21 | California Institute Of Technology | Optical protocols for communication networks |
| JP2008067048A (en) * | 2006-09-07 | 2008-03-21 | National Institute Of Information & Communication Technology | Wavelength conversion type wavelength division multiplexing transmission device |
| CN102413388A (en) * | 2011-11-18 | 2012-04-11 | 电子科技大学 | Optical fiber wireless RoF passive optical network realizing method based on optical code division multiplexing |
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Application publication date: 20220301 |