CN114050880B - Method and system for testing signal coverage of near field communication chip - Google Patents

Method and system for testing signal coverage of near field communication chip Download PDF

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CN114050880B
CN114050880B CN202210034157.0A CN202210034157A CN114050880B CN 114050880 B CN114050880 B CN 114050880B CN 202210034157 A CN202210034157 A CN 202210034157A CN 114050880 B CN114050880 B CN 114050880B
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CN114050880A (en
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秦军瑞
吴劲
李启文
段志奎
林冰胜
许剑锋
李洋
邓锐
邓俊杰
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Guangzhou Bochuang Information Technology Co ltd
Guangzhou Zhongke Yaoxin Group Co ltd
Development Research Institute Of Guangzhou Smart City
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Guangzhou Zhongke Yaoxin Group Co ltd
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/30—Monitoring; Testing of propagation channels
    • H04B17/309—Measuring or estimating channel quality parameters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B5/00—Near-field transmission systems, e.g. inductive loop type

Abstract

The invention discloses a method and a system for testing signal coverage of a close-range wireless communication chip, which carry out calibration of cycle iteration according to mutual restriction of various test standards, calculate a path trust connection probability and a transmission path optimization distance by a communication path state and a transmission feedback function in a plurality of time periods, construct a network connection topology set to determine the qualified state of the test of the chip to be tested, effectively improve the test precision of the chip, reduce the test time and reduce the test cost; and the signal coverage communication range of the chip to be tested is calculated according to the optimal routing path distance, so that the test efficiency is optimized and the coverage rate is ensured.

Description

Method and system for testing signal coverage of near field communication chip
Technical Field
The invention relates to the technical field of short-distance wireless communication and integrated chip testing, in particular to a short-distance wireless communication chip signal coverage testing method and system.
Background
In recent years, various wireless communication technologies have greatly improved the work efficiency and quality of life of people. Short-range wireless communication is a short-range high-frequency radio technology in which both communication transceivers transmit information via radio waves and the transmission distance is limited to a short range (several tens of meters).
The existing short-distance wireless communication technologies such as Bluetooth, Wi-Fi, IrDA, NFC and the like have different technical characteristics or special requirements based on transmission speed, distance and power consumption; or to focus on the expandability of the function; or meet the special requirements of certain single applications; or to establish differentiation of competing technologies, etc., none of which is perfect enough to meet all the needs. The wireless signal coverage test method for integrated chips mainly utilizes a special test instrument or running professional test software to respectively perform a coverage level test, a signal-to-noise ratio test, a ping packet test, a system throughput and an access bandwidth test and the like in a design target coverage area, but various test items are independently performed, different test methods are set and selected, and a comprehensive test standard index for wireless signal coverage is difficult to obtain by comparing different index requirements. In addition, the existing signal coverage test method for the short-distance wireless communication chip has the following defects: (1) the testing mode is single, and the testing efficiency is low; (2) the test equipment has complex conditions and long time consumption; (3) the single test standard, the test precision is not high.
Disclosure of Invention
In view of the above disadvantages of the prior art, an object of the present invention is to provide a method and a system for testing signal coverage of a short-range wireless communication chip, wherein multiple test standards are mutually restricted to perform a cyclic iterative calibration, a path trust connection probability and a transmission path optimization distance are calculated from a communication path state and a transmission feedback function within multiple time periods, and a network connection topology set is constructed to determine a qualified state of a test of the chip to be tested, so that the test accuracy of the chip can be effectively improved, the test time can be reduced, and the test cost can be reduced; and the signal coverage communication range of the chip to be tested is calculated according to the optimal routing path distance, so that the test efficiency is optimized and the coverage rate is ensured.
In order to achieve the above object, according to an aspect of the present disclosure, there is provided a short-range wireless communication chip signal coverage testing method, the method including:
s100, initializing a sensor testing network, and setting an initial value of the cycle number t of a time period as 1; the sensor nodes in the sensor test network comprise a master node to be tested and a plurality of test slave nodes, wherein the master node to be tested is a wireless sensor network node, a wireless communication module of the master node to be tested adopts a chip to be tested (the chip to be tested is a wireless transceiving chip), the test slave nodes are wireless sensor network nodes, a wireless communication module of the master node to be tested adopts a standard chip (the standard chip is any one of a wireless transceiving chip XC4366, a wireless transceiving chip MC13213, a wireless communication chip NRF24L01, a CC110LRGPR, an RFX2401C and an ADF7021 BCPZ-RL), and the sensor test network is a wireless sensor network; the sensor testing network initialization method comprises the steps of randomly setting sensor nodes in the sensor testing network in an X multiplied by Y space range, carrying out network initialization, clustering each sensor node through a clustering algorithm, and connecting to a base station through a cluster head node; wherein the time period is [100,2000] milliseconds;
s200, randomizing the positions of the sensor nodes in the sensor test network in the tth time period, wherein the t value range is [1, N ]; the meaning of randomizing the sensor node positions in the sensor test network is as follows: randomly setting the positions of the sensor nodes in the sensor test network within a spatial range of X multiplied by Y, wherein X, Y is generally [2,100] m;
s300, calculating a network connection topology set G =between the master node to be tested and the test slave node<S,T,F,C>Including communication path statusSequence ofSSequence of communication transmission pathsTTransmitting a feedback sequenceFAnd path trust connection probability sequenceC；
S400, determining the optimal routing node according to the network connection topology set G and obtaining the optimal routing path distance Wt,1Judging whether the optimal routing node is a main node to be tested, if so, testing the chip to be tested to be qualified, otherwise, testing the chip to be tested to be unqualified;
s500, judging whether the value t reaches a loop threshold value N, if so, jumping to the step S600, and if not, adding 1 to the value t and jumping to the step S200;
s600, judging whether the test qualified times of the chip to be tested in the circulation N times exceed a dynamic test threshold, if so, skipping to the step S700, otherwise, skipping to the step S100;
s700, according to the optimal routing path distance Wt,1Calculating the signal coverage adjacent connection strength matrix S of the wireless communication of the host node to be testedadjoinObtaining a signal coverage connected region S of the chip to be testedconnectAnd its signal coverage connectivity distance DSignalOutputting a signal coverage range test result of the chip to be tested;
further, in S100, the initialization of the sensor test network based on wireless communication includes initialization of a test environment, initialization of sensor nodes, and initialization of a network topology, where:
initializing a test environment, wherein the length of a horizontal coordinate and a vertical coordinate is X multiplied by Y, and a plurality of obstacles which can be arranged randomly are arranged in the test field;
initializing sensor nodes, wherein the sensor nodes comprise P total nodes, one of the P total nodes is randomly selected as a main node to be tested to be provided with a chip to be tested as a wireless communication module, and the rest (P-1) sensor nodes are all testing slave node installation standard chips;
initializing network topology, and constructing a network connection topology set G =<S,T,F,C>And initializing and setting a path trust connection probability sequenceCIs the probability median, and the cycle number t of the initial time period is 1.
Further, in S200, inUpdating the position in the t-th time period, randomizing the positions of the sensor nodes in the sensor test network, and setting the position coordinate of the randomly placed main node to be tested as (x)t, yt) Wherein x ist= [0, X]，yt = [0, Y]。
Further, in S300, the method for calculating the network connection topology set G = < S, T, F, C > between the master node to be tested and the test slave node includes:
s301, initializing the connection request times i to be 1, and setting a connection request threshold to be a Max value (for example, Max takes 10, 100);
s302, a chip to be tested of the main node to be tested sends an ith connection request, and the communication path state sequence of the main node to be tested and the rest (P-1) testing slave nodes is calculated as Si=[ s1，s2，s3，s4]；
S303, according to the communication path state sequence SiCalculating a transmission feedback function of the next connection request of the host node to be tested after the ith connection request F i+1=f i1+f i2Whereinf i1Andf i2respectively an ith connection request is a data throughput rate set and a connection delay set thereof which are connected from the master node to be tested to the test slave node in a bidirectional way in the tth time period;
s304, according to the transmission feedback function of the next connection requestF i+1Calculating a path trust connection probability sequence C at the ith connection requesti = [c1,i , c2,i , c3,i+1]Wherein c is1,iFor connecting successful path sets, c2,iFor a set of successful path throughputs, c3,i+1The next connection path trust probability set.
S305, judging whether the connection request frequency i value is a Max value, and if so, jumping to the step S306; otherwise, the value of i is added by 1, and the step S302 is skipped.
S306, according to the path trust connection probability sequence C = { C = { (C)i}，i=[1,Max]Calculating a transmission path optimization distance sequenceT；
S307, the communication path state sequenceSTransmission path optimization distance sequenceTTransmission feedback functionFAnd path trust connection probability sequenceCSaving to the network connection topology set G =<S,T,F,C>And outputs to step S400.
Wherein, in step S302, the communication path state sequence S of the master node to be tested and the other (P-1) test slave nodes is calculatedi=[ s1，s2，s3，s4]The method comprises the following steps:
s3021, setting the serial number of a communication path formed by the main node to be tested and the test slave node as j, setting the initial value as 1, and setting the change range of the j value as [1, P-1 ];
s3022, at the time of the ith connection request
A data transmission rate set s after the master node to be tested establishes connection with each test slave node1 (i, j) = bi(ei) / max(bi (ei,j) Wherein, max (b)i (ei,j) Is the maximum bandwidth of the communication path for the master node under test to establish a connection with P-1 test slave nodes in the t-th time period, eiA communication path between a main node to be tested and a jth test slave node in the tth time period in the sensor test network, bi (ei) A set formed by bandwidths of communication paths between a master node to be tested and each test slave node in the t-th time period in the sensor test network, eiThe method comprises the steps that communication paths between a master node to be tested and each test slave node in the t-th time period in the sensor test network are collected, wherein collection division means operation that two collections divide corresponding elements of the two collections or sequentially divide the elements in the collections with numerical values;
alternatively, the first and second electrodes may be,
the data transmission rate set s after the main node to be tested and the jth test slave node are connected1 (i, j) = bi (ei,j) / max(bi (ei,j) Wherein, max (b)i (ei,j) Is said to be measured during the t-th time periodMaximum bandwidth of communication path for main node and P-1 test slave nodes to establish connection, ei,jA communication path between a main node to be tested and a jth test slave node in the tth time period in the sensor test network, bi (ei,j) The bandwidth of a communication path between a main node to be tested and a jth test slave node in the tth time period in the sensor test network is set;
s3023, calculating a connection path throughput rate set S of the master node to be tested and the jth test slave node2 (i, j) wherein,
Figure 171043DEST_PATH_IMAGE001
，Dt(ei) For the main node to be tested to pass through the communication path e in the interval of delta t during the time periodi,jA set of data traffic sent to each test slave node;
alternatively, the first and second electrodes may be,
Figure 812109DEST_PATH_IMAGE002
，Dt(ei,j) For the main node to be tested to pass through the communication path e in the interval of delta t during the time periodi,jThe total amount of data transmission sent to the jth test slave node;
s3024, collecting S according to the data transmission rate1 (i, j) and connection path throughput rate set s2 (i, j) calculating a set of connection path loss rates
Figure 387447DEST_PATH_IMAGE003
(ii) a In the formula, 1-s1 (i, j) means that the set s is subtracted by 11 (i, j) for each element in (i, j), set multiplication refers to an operation of multiplying the corresponding elements by two sets, and set division refers to an operation of dividing the corresponding elements by the two sets;
s3025, collecting S according to the connection path loss rate3 (i, j) determining a set s of communication path states4 (i, j) if s3 (i, j)≥γs1 (i, j), then judgeThe communication path is in a normal transmission state, order s4 (i, j) = 1; otherwise, it is a failure path state, let s4 (i, j) = 0; wherein gamma is ∈ [0, 1]]Can set an attenuation factor of gamma s1 (i, j) means that γ is multiplied by the set s1 (ii) each element of (i, j);
s3026, judging whether the value of the communication path serial number j is equal to the value of (P-1), and if so, jumping to the step S3027; otherwise, adding 1 to the j value and jumping to the step S3022;
s3027, returning the data transmission capacity rate set S1Set of connection path throughput rates s2Set of connection path loss rates s3And a set of communication path states s4Saving to said communication path state sequence Si=[s1，s2，s3，s4]Wherein s is1 (i, j) 、s2 (i, j) 、s3 (i, j)、s4(i, j) are each abbreviated as s1、s2、s3、s4。
Wherein in step S303 according to the communication path state sequence SiCalculating a transmission feedback function of the next connection request of the host node to be tested after the ith connection requestF i+1=f i1+f i2The method comprises the following steps:
s3031, in the ith connection request, according to the communication path state sequence SiS of communication path states4Traversing and searching the path(s) in the normal transmission state when the master node to be tested and the (P-1) test slave nodes are connected4 When (i, j) =1, corresponding to the jth test slave node, recording the serial number j of the communication path thereof to form a connection success path set in sequence as c1,i Obtaining the number of successful connection paths as M;
s3032, setting the serial number of the successful connection path as k, setting the initial value as 1, and setting the change range of the k value as [1, M ];
s3033, according to the connection success path set c1,i (k) Corresponding communication path serial number j value, calculating data throughput rate set of bidirectional connection from the main node to be tested to jth test slave node
Figure 723750DEST_PATH_IMAGE004
Wherein
Figure 918102DEST_PATH_IMAGE005
And
Figure 23461DEST_PATH_IMAGE006
respectively sending data throughput rates of uplink connection and downlink connection within the current time interval delta t when the ith connection request is sent to the main node to be tested; ϕ e [0, 1]]For a bidirectional connection factor, according to the communication path state sequence SiConnection path throughput rate set S in (1)2Obtaining a value of 1.5 generally, and when ϕ =1, the throughput rate of a connection path between the master node to be tested and the slave node to be tested is the maximum;
s3034, selecting the communication path status sequence S accordinglyiConnection path throughput rate set s in (1)2 (i, j) according to the connection success path c1,i (k) Corresponding communication path sequence number j value, order connection success path throughput rate c2,i (k) = s2 (i, j)；
S3035, correspondingly, calculating a connection delay set of the bidirectional connection from the main node to be tested to the kth test slave node asf i2(k)={d(ei,k) In which d (e)i,k) The data throughput rates of uplink connection and downlink connection in the connection delay time from the ith connection request of the master node to be tested to the kth bidirectional connection of the slave node to be tested are obtained;
s3036, judging whether the k value is equal to the M value, and if yes, jumping to the step S3037; otherwise, adding 1 to the k value, and jumping to the step S3033;
3037, aggregating data throughput rates according to said bidirectional connectionf i1And connection delay setf i2Calculating the transmission feedback function of the next connection requestF i+1(m)=f i1(m)+f i2(m)，m∈[1,M](ii) a And obtaining a connection success path throughput rate set c2,i = {c2,i (k), k=1,...,M }；
Wherein, in step S304, the transmission feedback function according to the next connection requestF i+1Calculated path trust connection probability sequence Ci = [c1,i, c2,i, c3,i+1]The method comprises the following steps:
s3041, according to the transmission feedback function of the next connection requestF i+1Calculating the next connection path trust probability set c3,i+1 = F i+1×P iWhereinP i={ϕpi,k1}，k1∈[1,M]To achieve a set of trust probabilities for a bi-directional connection, ϕ ∈ [0, 1]]Is a bidirectional connection factor, pi,k1When the corresponding master node to be tested is in the ith connection request with the test slave node, the communication path with the successful connection path serial number k1 passes through the routing probability;
s3042, inputting the connection success path set c in the step S30311,iAnd the connection success path throughput rate set c described in step S30372,iOutputting and obtaining a path trust connection probability sequence Ci = [c1,i, c2,i, c3,i+1]；
Wherein, in step S306, the connection probability sequence is trusted according to the pathCCalculating transmission path optimized distance sequenceTThe method comprises the following steps:
s3061, when the connection request times i belongs to [1, Max ]]Traversing and searching within a range, and the path trust connection probability sequence CiConnection success path throughput rate set c in (1)2,iGet the maximum value max (c)2,i) The test slave node vector corresponding to the longest communication path is Ai(ii) a Minimum value of min (c)2,i) The test slave node vector corresponding to the shortest communication path is Bi；
S3062, calculating a connection success path distance matrix DS(Ai,Bi)：
Figure 327721DEST_PATH_IMAGE008
，
Thereby obtaining a connection success path distance function
Figure 595539DEST_PATH_IMAGE009
Wherein
Figure 555405DEST_PATH_IMAGE010
Wherein mean (c)2,i) Is a set c2,iAverage of all elements in (1);
for delta (A)i) Carrying out normalization processing to obtain Ti’=δ(Ai) A/δ wherein
Figure 472545DEST_PATH_IMAGE011
；
S3063, calculating to obtain a transmission path optimization distance sequence T = { T = { (T)iWhere T isi=δ(1- Ti') is the transmission path optimization distance for which the connection was successful at the ith connection request.
Further, in S400, according to the network connection topology setGDetermining the optimal routing node and obtaining the optimal routing path distanceW t,1The method for judging whether the optimal routing node is the master node to be tested comprises the following steps:
s401, according to the network connection topology setGIn (2) transmission path optimization distance sequenceTCalculating an optimized routing path sequence O = { O = { (O)i|i∈[1,Max]Therein of
Figure 783441DEST_PATH_IMAGE012
Q is a variable;
Figure 319596DEST_PATH_IMAGE013
function optimizes distance sequence in [ i, Max ] for transmission path]The minimum value is calculated in the range,
Figure 133968DEST_PATH_IMAGE014
function optimizes distance sequence in [ i, Max ] for transmission path]Calculating the maximum value in the range;
s402, calculating an optimal routing interval function
Figure 487589DEST_PATH_IMAGE015
So as to obtain the optimal route path distance in the t time period
Figure 20201DEST_PATH_IMAGE016
；
S403, according to the network connection topology setGPath trust connection probability sequence C ini = [c1,i, c2,i, c3,i+1]Calculating the successful connection path throughput rate set c of the main node to be tested2,iMaximum value of (c) max2,i ) Corresponding optimal path distance
Figure 609314DEST_PATH_IMAGE017
Wherein, in the t time period, the position coordinate of the main node to be measured is (x)t, yt) Maximum value max (c)2,i ) The vector coordinate of the corresponding testing slave node of the longest communication path is Ai = (xm, ym)；
S404, calculating the optimal routing path distanceW t,1Distance from optimal pathW t,2Difference between deltaW t = W t,1 -W t,2If, if
|△W tIf the value of | ≦ sigma and sigma is the allowable standard error, setting a state sequence CS (t) =1 of the chip to be tested, namely the optimal routing node is the main node to be tested and the chip to be tested is qualified; otherwise, setting a state sequence CS (t) =0 of the chip to be tested, namely the optimal routing node is not the main node to be tested, and the chip to be tested is unqualified in test.
Further, in S600, the method for determining whether the number of times that the chip to be tested passes the test pass within N cycles exceeds the dynamic test threshold line includes:
s601, calculating the Pass times Pass of the chip to be tested, namely calculating the number of 1 (CS (t) = 1) states in the chip state sequence CS to be tested asPassThat is, the number of Pass tests of the chip to be tested, Pass= [0, N]；
S602, calculating the test pass rate P of the chip to be testedPass = ( Pass/N )×100%，PPass = [0, 1]；
S603, dynamically testing the threshold value as line; wherein line takes on the value [10,30 ]]Or, line = N × PPass/[1-PPass×(N×mod( 1/PPass) Mod is a remainder function;
s604, if the test Pass times Pass of the chip to be tested is larger than line, jumping to the step S700; otherwise, the process jumps to step S100.
Further, in S700, according to the optimal routing path distanceW t,1Calculating the signal coverage adjacent connection strength matrix S of the wireless communication of the host node to be testedadjoinObtaining a signal coverage connected region S of the chip to be testedconnectAnd its signal coverage connectivity distance DsignalThe method comprises the following steps:
s701, according to the optimal routing path distanceW t,1And a size of [ X, Y ]]The test field is proportionally constructed into a signal transmission area with the same shape, and the length of the horizontal and vertical coordinates is X-W t,1, Y / W t,1]；
S702, the signal transmission area is divided into a plurality of transmission unit sub-areas with the size of Q multiplied by Q according to the unit proportion, wherein Q is the length of the minimum unit sub-area which can be divided, for example, Q is [5,10]]cm, total division to obtain [ X/Q ]W t,1, Y / QW t,1]A plurality of unit sub-regions;
s703, setting the horizontal and vertical coordinates corresponding to the unit sub-areas in the signal transmission area as [ x1, y 1]]The corresponding signal intensity of the connection request sent by the main node to be tested in each unit subregion can be obtained and a signal coverage matrix S is formedcover(X1, y1) where X1. epsilon. [1, X/Q ]W t,1]，y1∈[1,Y/QW t,1](ii) a Setting the initial values of x1 and y1 to be 1;
s704, calculating a signal coverage adjacent connection strength matrix Sadjoin(x1, y1), and judges SadjoinWhether the value (x1, y1) is smaller than sigma or not, if yes, jumping to S703, outputting a calculation error prompt, and carrying out the signal coverage test again; otherwise, adding 1 to the value of y1, and jumping to step S705;
Sadjoin(x1, y1)=[Scover(x1, y1)- Scover(x1, y1+1)]2+ [Scover(x1, y1)- Scover(x1+1, y1)]2；
s705, judging whether X1 is less than X/QW t,1And Y1 is less than Y/QW t,11, if yes, jumping to step S704; otherwise, jumping to step S706;
s706, judge whether X1 equals X/QW t,1If yes, jumping to step S707; otherwise, adding 1 to the value of x1, setting the value of y1 as 1, and jumping to the step S704;
s707, covering the adjacent connection strength matrix S according to the signaladjoinCalculating a signal coverage connected region matrix SconnectWherein, in the step (A),
Figure 278193DEST_PATH_IMAGE018
p1 denotes the sequence number of the unit sub-area through which the communication path that issued the connection request from the master node under test passes, Sadjoin p1Covering adjacent connection strengths for signals of p1 th element sub-regions passed by communication paths of connection requests from the master node to be tested, i.e. matrix SadjoinThe p1 th value of (x1, y 1);
s708, traversing the signal coverage connected region matrix SconnectCalculating the position coordinates (x, y) of the main node to be measured and the coordinates (x) of the non-zero unit subareas , ys) The maximum value of the modulus of the vector between the two chips to obtain the signal coverage communication distance of the chip to be tested
Figure 802715DEST_PATH_IMAGE019
Namely, the result is the signal coverage test result of the short-distance wireless communication chip.
The invention also provides a system for testing the signal coverage of the near field wireless communication chip, which comprises: data acquisition module, central processing unit module, wireless communication module, storage module and power module, wherein the system module includes:
the data acquisition module comprises a sensor, a conditioning circuit and an analog-to-digital conversion unit, wherein the sensor acquires a wireless analog signal, the conditioning circuit is required to perform data preprocessing such as amplification, rectification, filtering and the like, and the analog signal is converted into a digital signal through the analog-to-digital conversion unit and then enters the central processing unit module;
the central processing unit module comprises a microprocessor, and common microprocessors comprise a microcontroller, an embedded CPU, a field programmable gate array and the like and are used for digital signal processing such as data acquisition control, task scheduling, data fusion and the like;
the wireless communication module utilizes a chip to be tested to send out wireless radio frequency, the central processor module controls the information exchange, transmission and control, and the technical points of the size, the working mode, the transmitting power, the sensitivity and the like of the wireless communication module are considered;
a memory module controlled by the central processor module, comprising a memory and a computer program stored in the memory and executable on the microprocessor, the microprocessor executing the computer program to run in the units of the following system:
a cycle period clock unit for cycling at [1, N]Updating the positions of the main node to be tested and the test slave node in the test field in a time period, and recording and circularly calculating the optimal route path distanceW t,1And judging the times t of qualified test of the chip to be tested;
a sensor node position cache unit for caching the updated positions of the main node and the test slave node to be tested in the tth time period and then the sizes of the main node and the test slave node to be tested in the test field are [ X, Y ]]Inner position coordinate (x)t, yt)；
And the connection request counter unit is used for recording the frequency i of sending connection requests by a chip to be tested in the wireless communication module of the host node to be tested, and setting the threshold value of the connection requests as a Max value.
A network connection topology set data caching unit for caching the network connection topology set G = calculated in each time period<S,T,F,C>Stacking communication path state sequences in a cycle periodSSequence of communication transmission pathsTTransmitting a feedback sequenceFAnd path trust connection probability sequenceC；
A network connection topology set calculation unit for gradually calculating the communication path state sequence of the main node to be tested and the rest (P-1) test slave nodes in the ith connection request as Si=[s1，s2，s3，s4]Transmission feedback function of next connection requestF i+1=f i1+f i2Sequence of path trust connection probabilities Ci = [c1,i, c2,i, c3,i+1]And a transmission path optimization distance sequenceT；
An optimal routing path distance calculation unit for inputting the network connection topology setGDetermining the optimal routing node and obtaining the optimal routing path distanceW t,1Optimizing the distance sequence step by step from the transmission pathTComputing optimized routing path sequencesOOptimum route interval function
Figure 963569DEST_PATH_IMAGE020
And optimal path distanceW t,1；
The test qualification screening unit of the chip to be tested is used for recording the time period Pass of the qualified test of the chip to be tested when the optimal routing node is the main node to be tested, and calculating the test qualification rate P of the chip to be testedPassAnd its dynamic test threshold line;
the test calculation unit for the signal coverage range of the chip to be tested inputs the optimal route path distanceW t,1Calculating the signal coverage adjacent connection strength matrix S of the wireless communication of the host node to be testedadjoinObtaining a signal coverage connected region S of the chip to be testedconnectAnd a signal overlay connectivity distance DsignalAnd outputting a signal coverage range test result of the short-distance wireless communication chip to be tested.
As described above, the method and system for testing signal coverage of the short-range wireless communication chip according to the present invention have the following advantages:
(1) the method can be used for carrying out cyclic iteration calibration by combining multiple test standards to obtain a comprehensive network connection topology set standard, so that the test efficiency is efficiently optimized, and the individual test time is reduced;
(2) the qualified state of the chip to be tested is determined through the calibration test standard after the cycle iteration, so that the test precision of the chip can be effectively improved;
(3) and the signal coverage communication range of the chip to be tested is calculated according to the optimal route path distance, an optimal test route can be selected under the condition of not reducing the test precision, the test cost is reduced, and the coverage rate is ensured.
Drawings
The foregoing and other features of the present disclosure will become more apparent from the detailed description of the embodiments shown in conjunction with the drawings in which like reference characters designate the same or similar elements throughout the several views, and it is apparent that the drawings in the following description are merely some examples of the present disclosure and that other drawings may be derived therefrom by those skilled in the art without the benefit of any inventive faculty, and in which:
FIG. 1 is a flow chart illustrating a method for testing signal coverage of a near field communication chip according to an embodiment;
FIG. 2 is a schematic diagram of a hardware configuration of a short-range wireless communication chip signal coverage testing system in an embodiment;
FIG. 3 is a flowchart of a computer program of a system for testing signal coverage of a near field communication chip according to an embodiment.
Detailed Description
The conception, specific structure and technical effects of the present disclosure will be clearly and completely described below in conjunction with the embodiments and the accompanying drawings to fully understand the objects, aspects and effects of the present disclosure. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict.
It should be noted that the drawings provided in the following embodiments are only for illustrating the basic idea of the present invention, and the drawings only show the components related to the present invention rather than the number, shape and layout of the components in actual implementation, and the types, the numbers and the proportions of the components in actual implementation may be changed arbitrarily, and the layout of the components may be more complicated.
In the description of the present invention, a plurality of means is one or more, a plurality of means is two or more, and greater than, less than, more than, etc. are understood as excluding the present numbers, and greater than, less than, more than, etc. are understood as including the present numbers, and outer and inner are understood as relative inside-outside relationships. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
The method and the system for testing the signal coverage of the near field communication chip can be used for carrying out cyclic iteration calibration by combining multiple test standards, efficiently optimizing the test efficiency, improving the test precision and reducing the separate test time, thereby reducing the test cost and ensuring the test coverage.
Referring to fig. 1, a flow chart of a signal coverage testing method for a short-range wireless communication chip according to the present invention is shown, and a signal coverage testing method for a short-range wireless communication chip according to an embodiment of the present invention is described with reference to fig. 1.
The present disclosure provides a method for testing signal coverage of a near field wireless communication chip, which specifically includes the following steps:
s100, initializing a sensor test network based on wireless communication, and setting an initial value of the cycle number t of a time period as 1; the sensor nodes in the sensor test network comprise a main node to be tested and a plurality of test slave nodes, wherein the wireless communication module of the main node to be tested is a chip to be tested, and the wireless communication module of the test slave nodes is a standard chip;
s200, in the tth time period, the positions of the sensor nodes in the sensor test network are randomized, and the t value range is [1, N ];
s300, calculating a network connection topology set G =between the master node to be tested and the test slave node<S,T,F,C>Including communication path state sequencesSSequence of communication transmission pathsTTransmitting a feedback sequenceFAnd path trust connection probability sequenceC；
S400, determining the optimal routing node and obtaining the optimal routing path distance according to the network connection topology set GW t,1Judging whether the optimal routing node is a main node to be tested, if so, testing the chip to be tested to be qualified, otherwise, testing the chip to be tested to be unqualified;
s500, judging whether the value t reaches a loop threshold value N, if so, jumping to the step S600, and if not, adding 1 to the value t and jumping to the step S200;
s600, judging whether the test qualified times of the chip to be tested in the circulation N times exceed a dynamic test threshold, if so, skipping to the step S700, otherwise, skipping to the step S100;
s700, according to the optimal routing path distance Wt,1Calculating the signal coverage adjacent connection strength matrix S of the wireless communication of the host node to be testedadjoinObtaining a signal coverage connected region S of the chip to be testedconnectAnd its signal coverage connectivity distance DSignalOutputting a signal coverage range test result of the chip to be tested;
preferably, the dynamic test threshold is generally set to [3,5 ].
Further, in S100, the initialization of the sensor test network based on wireless communication includes initialization of a test environment, initialization of sensor nodes, and initialization of a network topology, where:
initializing a test environment, wherein the length of a horizontal coordinate and a vertical coordinate is X multiplied by Y, and a plurality of obstacles which can be arranged randomly are arranged in the test field; optionally, setting the test environment to be a square test site with the size of 20 × 20m, and placing a barrier at each of four corners of the square;
initializing sensor nodes, wherein the sensor nodes comprise P total nodes, one of the P total nodes is randomly selected as a main node to be tested to be provided with a chip to be tested as a wireless communication module, and the rest (P-1) sensor nodes are all testing slave node installation standard chips;
optionally, 100 sensor nodes are randomly deployed, the main node to be tested is placed near the central area of the test site as much as possible, the test slave nodes are uniformly distributed, and the coverage condition of the test site can be reflected; and the chip to be tested in the main node to be tested sends out wireless radio frequency, so that a wireless network can be established quickly and automatically, a wireless virtual connection is provided for the test slave nodes, and a point-to-point communication path is established, so that near-range communication is realized among the sensor nodes.
Initializing network topology, and constructing a network connection topology set G =<S,T,F,C>And initializing, emptying the topological data cache and setting a path trust connection probability sequenceCIs the probability median, and the cycle number t of the initial time period is 1.
Further, in S200, a location update is performed at the t-th time period, the location of the sensor node in the sensor test network is randomized, and a location coordinate where the master node to be tested is randomly placed is set to be (x)t, yt) Wherein x ist= [0, X]，yt = [0, Y]。
Further, in S300, the method for calculating the network connection topology set G = < S, T, F, C > between the master node to be tested and the test slave node includes:
s301, initializing the connection request times i to be 1, and setting a connection request threshold value to be a Max value; optionally, setting Max value to 100;
s302, a chip to be tested of the main node to be tested sends an ith connection request, and the communication path state sequence of the main node to be tested and the rest (P-1) testing slave nodes is calculated as Si=[ s1，s2，s3，s4]；
S303, according to the communication path state sequence SiCalculating a transmission feedback function of the next connection request of the host node to be tested after the ith connection request F i+1=f i1+f i2Whereinf i1Andf i2data throughput rate set and connection delay set thereof for bi-directional connection from main node to be tested to test slave node in t time period of ith connection request respectivelyCombining;
s304, according to the transmission feedback function of the next connection requestF i+1Calculating a path trust connection probability sequence C at the ith connection requesti = [c1,i , c2,i , c3,i+1]Wherein c is1,iFor connecting successful path sets, c2,iFor a set of successful path throughputs, c3,i+1The next connection path trust probability set.
S305, judging whether the connection request frequency i value is a Max value, and if so, jumping to the step S306; otherwise, the value of i is added by 1, and the step S302 is skipped.
S306, according to the path trust connection probability sequence C = { C = { (C)i}，i=[1,Max]Calculating a transmission path optimization distance sequenceT；
S307, the communication path state sequenceSTransmission path optimization distance sequenceTTransmission feedback functionFAnd path trust connection probability sequenceCSaving to the network connection topology set G =<S,T,F,C>And outputting to step S400;
wherein, in step S302, the communication path state sequence S of the master node to be tested and the other (P-1) test slave nodes is calculatedi=[ s1，s2，s3，s4]The method comprises the following steps:
s3021, setting the serial number of a communication path formed by the main node to be tested and the test slave node as j, setting the initial value as 1, and setting the change range of the j value as [1, P-1 ];
s3022, at the time of the ith connection request
A data transmission rate set s after the master node to be tested establishes connection with each test slave node1 (i, j) = bi(ei) / max(bi (ei,j) Wherein, max (b)i (ei,j) Is the maximum bandwidth of the communication path for the master node under test to establish a connection with P-1 test slave nodes in the t-th time period, eiA communication path between a main node to be tested and a jth test slave node in the tth time period in the sensor test network, bi (ei) A set formed by bandwidths of communication paths between a master node to be tested and each test slave node in the t-th time period in the sensor test network, eiThe method comprises the steps that communication paths between a master node to be tested and each test slave node in the t-th time period in the sensor test network are collected, wherein collection division means operation that two collections divide corresponding elements of the two collections or sequentially divide the elements in the collections with numerical values;
alternatively, the first and second electrodes may be,
the data transmission rate set s after the main node to be tested and the jth test slave node are connected1 (i, j) = bi (ei,j) / max(bi (ei,j) Wherein, max (b)i (ei,j) Is the maximum bandwidth of the communication path for the master node under test to establish a connection with P-1 test slave nodes in the t-th time period, ei,jA communication path between a main node to be tested and a jth test slave node in the tth time period in the sensor test network, bi (ei,j) The bandwidth of a communication path between a main node to be tested and a jth test slave node in the tth time period in the sensor test network is set;
s3023, calculating a connection path throughput rate set S of the master node to be tested and the jth test slave node2 (i, j) wherein,
Figure 966161DEST_PATH_IMAGE001
，Dt(ei) For the main node to be tested to pass through the communication path e in the interval of delta t during the time periodi,jA set of data traffic sent to each test slave node;
alternatively, the first and second electrodes may be,
Figure 755125DEST_PATH_IMAGE002
，Dt(ei,j) For the main node to be tested to pass through the communication path e in the interval of delta t during the time periodi,jTotal amount of data transmission sent to jth test slave node；
S3024, collecting S according to the data transmission rate1 (i, j) and connection path throughput rate set s2 (i, j) calculating a set of connection path loss rates
Figure 450549DEST_PATH_IMAGE003
(ii) a In the formula, 1-s1 (i, j) means that the set s is subtracted by 11 (i, j) for each element in (i, j), set multiplication refers to an operation of multiplying the corresponding elements by two sets, and set division refers to an operation of dividing the corresponding elements by the two sets;
s3025, collecting S according to the connection path loss rate3 (i, j) determining a set s of communication path states4 (i, j) if s3 (i, j)≥γs1 (i, j), then judging that the communication path is in normal transmission state, and making s4 (i, j) = 1; otherwise, it is a failure path state, let s4 (i, j) = 0; wherein gamma is ∈ [0, 1]]Is a settable attenuation factor;
s3026, judging whether the value of the communication path serial number j is equal to the value of (P-1), and if so, jumping to the step S3027; otherwise, adding 1 to the j value and jumping to the step S3022;
s3027, returning the data transmission capacity rate set S1Set of connection path throughput rates s2Set of connection path loss rates s3And a set of communication path states s4Saving to said communication path state sequence Si=[s1，s2，s3，s4]；
Wherein in step S303 according to the communication path state sequence SiCalculating a transmission feedback function of the next connection request of the host node to be tested after the ith connection requestF i+1=f i1+f i2The method comprises the following steps:
s3031, in the ith connection request, according to the communication path state sequence SiS of communication path states4Traversing and searching the path(s) in the normal transmission state when the master node to be tested and the (P-1) test slave nodes are connected4 (i, j) =1Corresponding to the jth test slave node, recording the communication path serial number j of the jth test slave node, forming a connection success path set in sequence, and recording the connection success path set as c1,i Obtaining the number of successful connection paths as M;
s3032, setting the serial number of the successful connection path as k, setting the initial value as 1, and setting the change range of the k value as [1, M ];
s3033, according to the connection success path set c1,i(k) Corresponding communication path serial number j value, calculating data throughput rate set of bidirectional connection from the main node to be tested to jth test slave node
Figure 816808DEST_PATH_IMAGE021
Wherein
Figure 623090DEST_PATH_IMAGE022
And
Figure 532140DEST_PATH_IMAGE006
respectively sending data throughput rates of uplink connection and downlink connection within the current time interval delta t when the ith connection request is sent to the main node to be tested; ϕ e [0, 1]]For a bidirectional connection factor, according to the communication path state sequence SiConnection path throughput rate set S in (1)2Obtaining that the throughput rate of a connection path between the master node to be tested and the slave node to be tested is maximum when ϕ = 1;
s3034, selecting the communication path status sequence S accordinglyiConnection path throughput rate set s in (1)2 (i, j) according to the connection success path c1,i (k) Corresponding communication path sequence number j value, order connection success path throughput rate c2,i (k) = s2 (i, j)；
S3035, correspondingly, calculating a connection delay set of the bidirectional connection from the main node to be tested to the kth test slave node asf i2(k)={d(ei,k) In which d (e)i,k) The data throughput rates of uplink connection and downlink connection in the connection delay time from the ith connection request of the master node to be tested to the kth bidirectional connection of the slave node to be tested are obtained;
s3036, judging whether the k value is equal to the M value, and if yes, jumping to the step S3037; otherwise, adding 1 to the k value, and jumping to the step S3033;
3037, aggregating data throughput rates according to said bidirectional connectionf i1And connection delay setf i2Calculating the transmission feedback function of the next connection requestF i+1(m)=f i1(m)+f i2(m)，m∈[1,M](ii) a And obtaining a connection success path throughput rate set c2,i = {c2,i (k), k=1,...,M }；
Wherein, in step S304, the transmission feedback function according to the next connection requestF i+1Calculated path trust connection probability sequence Ci = [c1,i, c2,i, c3,i+1]The method comprises the following steps:
s3041, according to the transmission feedback function of the next connection requestF i+1Calculating the next connection path trust probability set c3,i+1 = F i+1×P iWhereinP i={ϕpi,k1}，k1∈[1,M]To achieve a set of trust probabilities for a bi-directional connection, ϕ ∈ [0, 1]]Is a bidirectional connection factor, pi,k1When the corresponding master node to be tested is in the ith connection request with the test slave node, the communication path with the successful connection path serial number k1 passes through the routing probability;
s3042, inputting the connection success path throughput rate set c in the step S30311,iAnd the connection success path throughput rate set c described in step S30372,iOutputting and obtaining a path trust connection probability sequence Ci = [c1,i, c2,i, c3,i+1]；
Wherein, in step S306, the connection probability sequence is trusted according to the pathCCalculating transmission path optimized distance sequenceTThe method comprises the following steps:
s3061, when the connection request times i belongs to [1, Max ]]Traversing and searching within a range, and the path trust connection probability sequence CiConnection success path throughput rate set c in (1)2,iGet the maximum value max (c)2,i) The test slave node vector corresponding to the longest communication path is AiMinimum value of min (c)2,i) The test slave node vector corresponding to the shortest communication path is Bi；
S3062, calculating a connection success path distance matrix DS(Ai,Bi)：
Figure 132886DEST_PATH_IMAGE023
，
Thereby obtaining a connection success path distance function
Figure 2753DEST_PATH_IMAGE009
Wherein
Figure 612725DEST_PATH_IMAGE010
Wherein mean (c)2,i) Is a set c2,iAverage of all elements in (1);
for delta (A)i) Carrying out normalization processing to obtain Ti’=δ(Ai) A/δ wherein
Figure 110703DEST_PATH_IMAGE011
；
S3063, calculating to obtain a transmission path optimization distance sequence T = { T = { (T)iWhere T isi=δ(1- Ti') is the transmission path optimization distance for which the connection was successful at the ith connection request.
Further, in S400, according to the network connection topology setGDetermining the optimal routing node and obtaining the optimal routing path distanceW t,1The method for judging whether the optimal routing node is the master node to be tested comprises the following steps:
s401, according to the network connection topology setGIn (2) transmission path optimization distance sequenceTCalculating an optimized routing path sequence O = { O = { (O)i|i∈[1,Max]Therein of
Figure 882350DEST_PATH_IMAGE024
Q is a variable;
Figure 488781DEST_PATH_IMAGE025
function optimizes distance sequence in [ i, Max ] for transmission path]The minimum value is calculated in the range,
Figure 636865DEST_PATH_IMAGE026
function optimizes distance sequence in [ i, Max ] for transmission path]Calculating the maximum value in the range;
s402, calculating an optimal routing interval function
Figure 254928DEST_PATH_IMAGE015
So as to obtain the optimal route path distance in the t time period
Figure 463056DEST_PATH_IMAGE016
；
S403, according to the network connection topology setGPath trust connection probability sequence C ini = [c1,i, c2,i, c3,i+1]Calculating the successful connection path throughput rate set c of the main node to be tested2,iMaximum value of (c) max2,i ) Corresponding optimal path distance
Figure 41936DEST_PATH_IMAGE017
Wherein, in the t time period, the position coordinate of the main node to be measured is (x)t, yt) Maximum value max (c)2,i ) The vector coordinate of the corresponding testing slave node of the longest communication path is Ai = (xm, ym)；
S404, calculating the optimal routing path distanceW t,1Distance from optimal pathW t,2Difference between deltaW t = W t,1 -W t,2If, if
|△W tSetting the shortest distance B1 between the master node to be tested and each test slave node and the mean value B2 between the distance B and the mean value B1-B2|, setting the chip state sequence CS (t) =1, namely the optimal route node is the master node to be tested, and the chip test combination to be testedGrid; otherwise, setting a state sequence CS (t) =0 of the chip to be tested, namely the optimal routing node is not the main node to be tested, and the chip to be tested is unqualified in test.
Further, in S600, the method for determining whether the number of times that the chip to be tested passes the test pass within N cycles exceeds the dynamic test threshold line includes:
s601, calculating the Pass times Pass of the chip to be tested, namely calculating the number of 1 (CS (t) = 1) states in the chip state sequence CS to be tested asPassThat is, the number of Pass tests of the chip to be tested, Pass= [0, N]；
S602, calculating the test pass rate P of the chip to be testedPass = ( Pass/N )×100%，PPass = [0, 1]；
S603, dynamically testing the threshold value as line; wherein line takes on the value [10,30 ]]Or, line = N × PPass/[1-PPass×(N×mod( 1/PPass) Mod is a remainder function;
s604, if the test Pass times Pass of the chip to be tested is larger than line, jumping to the step S700; otherwise, the process jumps to step S100. Preferably, the cycling threshold N is set to [5,10] times.
Further, in S700, according to the optimal routing path distanceW t,1Calculating the signal coverage adjacent connection strength matrix S of the wireless communication of the host node to be testedadjoinObtaining a signal coverage connected region S of the chip to be testedconnectAnd its signal coverage connectivity distance DSignalThe method comprises the following steps:
s701, according to the optimal routing path distanceW t,1And a size of [ X, Y ]]The test field is proportionally constructed into a signal transmission area with the same shape, and the length of the horizontal and vertical coordinates is X-W t,1, Y / W t,1]；
S702, the signal transmission area is divided into a plurality of transmission unit sub-areas with the size of Q multiplied by Q according to the unit proportion, wherein Q is the length of the minimum unit sub-area which can be divided, and [ X/Q ] is obtained by dividing in totalW t,1, Y/QW t,1]A plurality of unit sub-regions; optionally, setting is made to test squaresThe field is virtually divided into 1000 × 1000 grid areas, which are sub-areas of the transmission unit.
Setting the horizontal and vertical coordinates corresponding to the unit sub-areas in the signal transmission area as [ x1, y 1]]The corresponding signal intensity of the connection request sent by the main node to be tested in each unit subregion can be obtained and a signal coverage matrix S is formedcover(X1, y1) where X1. epsilon. [1, X/Q ]W t,1]，y1∈[1,Y/QW t,1](ii) a Setting the initial values of x1 and y1 to be 1;
s704, calculating a signal coverage adjacent connection strength matrix Sadjoin(x1, y1), and judges SadjoinWhether the value (x1, y1) is smaller than sigma or not, if yes, jumping to S703, outputting a calculation error prompt, and carrying out the signal coverage test again; otherwise, adding 1 to the value of y1, and jumping to step S705;
Sadjoin(x1, y1)=[Scover(x1, y1)- Scover(x1, y1+1)]2+ [Scover(x1, y1)- Scover(x1+1, y1)]2；
s705, judging whether X1 is less than X/QW t,1And Y1 is less than Y/QW t,11, if yes, jumping to step S704; otherwise, jumping to step S706;
s706, judge whether X1 equals X/QW t,1If yes, jumping to step S707; otherwise, adding 1 to the value of x1, setting the value of y1 as 1, and jumping to the step S704;
s707, covering the adjacent connection strength matrix S according to the signaladjoinCalculating a signal coverage connected region matrix SconnectWherein, in the step (A),
Figure 728132DEST_PATH_IMAGE027
p1 denotes the sequence number of the unit sub-area through which the communication path that issued the connection request from the master node under test passes, Sadjoin p1Covering adjacent connection strengths for signals of p1 th element sub-regions passed by communication paths of connection requests from the master node to be tested, i.e. matrix SadjoinThe p1 th value of (x1, y 1);
s708, traversing the signal coverage connected region matrixSconnectCalculating the position coordinates (x, y) of the main node to be measured and the coordinates (x) of the non-zero unit subareas , ys) The maximum value of the modulus of the vector between the two chips to obtain the signal coverage communication distance of the chip to be tested
Figure 466281DEST_PATH_IMAGE028
Namely, the result is the signal coverage test result of the short-distance wireless communication chip.
Fig. 2 is a schematic diagram of a hardware structure of a short-range wireless communication chip signal coverage testing system according to an embodiment of the present disclosure, where the short-range wireless communication chip signal coverage testing system according to the embodiment includes: the system comprises a data acquisition module, a central processor module, a wireless communication module, a storage module, a power supply module and a computer program which is stored in the memory and can run on the processor, wherein when the central processor executes the computer program, the steps in the system embodiment of the short-range wireless communication chip signal coverage test are realized, and a flow chart of the computer program is shown in fig. 3.
Wherein the system module comprises:
the data acquisition module comprises a sensor, a conditioning circuit and an analog-to-digital conversion unit, wherein the sensor acquires a wireless analog signal, the conditioning circuit is required to perform data preprocessing such as amplification, rectification, filtering and the like, and the analog signal is converted into a digital signal through the analog-to-digital conversion unit and then enters the central processing unit module;
the central processing unit module comprises a microprocessor, and common microprocessors comprise a microcontroller, an embedded CPU, a field programmable gate array and the like and are used for digital signal processing such as data acquisition control, task scheduling, data fusion and the like;
the wireless communication module utilizes a chip to be tested to send out wireless radio frequency, the central processor module controls the information exchange, transmission and control, and the technical points of the size, the working mode, the transmitting power, the sensitivity and the like of the wireless communication module are considered;
a memory module controlled by the central processor module, comprising a memory and a computer program stored in the memory and executable on the microprocessor, the microprocessor executing the computer program to run in the units of the following system:
a cycle period clock unit for cycling at [1, N]Updating the positions of the main node to be tested and the test slave node in the test field in a time period, and recording and circularly calculating the optimal route path distanceW t,1And judging the times t of qualified test of the chip to be tested;
a sensor node position cache unit for caching the position of the main node to be tested and the test slave node in the tth time period as [ X, Y ] in the test field after the positions of the main node to be tested and the test slave node are updated]Inner position coordinate (x)t , yt)；
And the connection request counter unit is used for recording the frequency i of sending connection requests by a chip to be tested in the wireless communication module of the host node to be tested, and setting the threshold value of the connection requests as a Max value.
A network connection topology set data caching unit for caching the network connection topology set G = calculated in each time period<S,T,F,C>Stacking communication path state sequences in a cycle periodSSequence of communication transmission pathsTTransmitting a feedback sequenceFAnd path trust connection probability sequenceC；
A network connection topology set calculation unit for gradually calculating the communication path state sequence of the main node to be tested and the rest (P-1) test slave nodes in the ith connection request as Si=[s1，s2，s3，s4]Transmission feedback function of next connection requestF i+1=f i1+f i2Sequence of path trust connection probabilities Ci = [c1,i, c2,i, c3,i+1]And a transmission path optimization distance sequenceT；
An optimal routing path distance calculation unit for inputting the network connection topology setGDetermining the optimal routing node and obtaining the optimal routing path distanceW t,1Optimizing the distance step by step from the transmission pathSequence ofTComputing optimized routing path sequencesOOptimum route interval function
Figure 579730DEST_PATH_IMAGE029
And optimal path distanceW t,1；
The test qualification screening unit of the chip to be tested is used for recording the time period Pass of the qualified test of the chip to be tested when the optimal routing node is the main node to be tested, and calculating the test qualification rate P of the chip to be testedPassAnd its dynamic test threshold line;
the test calculation unit for the signal coverage range of the chip to be tested inputs the optimal route path distanceW t,1Calculating the signal coverage adjacent connection strength matrix S of the wireless communication of the host node to be testedadjoinObtaining a signal coverage connected region S of the chip to be testedconnectAnd a signal overlay connectivity distance DsignalAnd outputting a signal coverage range test result of the short-distance wireless communication chip to be tested.
The system for testing signal coverage of the near field wireless communication chip is a mobile near field sensor node hardware structure, and can include, but is not limited to, a sensor, a processor, a memory and a wireless communication module. Those skilled in the art will appreciate that the example is only an example of a signal coverage testing system of a short-range wireless communication chip, and does not constitute a limitation of the signal coverage testing system of the short-range wireless communication chip, and may include more or less components than the short-range wireless communication chip, or combine some components, or different components, for example, the signal coverage testing system of the short-range wireless communication chip may further include a conditioning circuit, an analog-to-digital conversion module, a network interface, and the like.
The Processor may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA), other Programmable logic devices (plc), or the like. The general purpose processor may be a microprocessor or the processor may be any conventional processor, etc., the processor is a control center of the signal coverage testing system of the short-range wireless communication chip, and various interfaces and lines are used for connecting various parts of the signal coverage testing system of the whole short-range wireless communication chip.
The memory can be used for storing the computer programs and/or modules, and the processor can realize various functions of the signal coverage testing system of the short-distance wireless communication chip by running or executing the computer programs and/or modules stored in the memory and calling the data stored in the memory. The memory may mainly include a storage program area and a storage data area, where the storage program area may store a main program, an application program required by at least one function (e.g., calculating a network connection topology, an optimal routing path distance, etc.), and the like; the data storage area can store data and clock data (such as network connection topology set data cache, cycle period clock and the like) cached by the processor according to the collection of the chip to be tested.
Although the description of the present disclosure has been rather exhaustive and particularly described with respect to several illustrated embodiments, it is not intended to be limited to any such details or embodiments or any particular embodiments, so as to effectively encompass the intended scope of the present disclosure. Furthermore, the foregoing disclosure has been described in terms of foreseeable embodiments, for the purpose of providing a useful description, and insubstantial modifications of the disclosure, not presently foreseen, may nonetheless represent equivalent modifications thereto.

Claims (6)

1. A signal coverage test method for a near field wireless communication chip is characterized by comprising the following steps:
s100, initializing a sensor testing network, and setting an initial value of the cycle number t of a time period as 1; the sensor nodes in the sensor test network comprise a main node to be tested and a plurality of test slave nodes; the wireless sensor network node comprises a main node to be tested, a wireless communication module, a wireless transceiver chip and a test slave node, wherein the main node to be tested is a wireless sensor network node, the wireless communication module of the main node to be tested adopts a chip to be tested, the chip to be tested is a wireless transceiver chip, and the test slave node is a wireless sensor network node;
s200, randomizing the positions of the sensor nodes in the sensor test network in the tth time period, wherein the t value range is [1, N ];
s300, calculating a network connection topology set G =between the master node to be tested and the test slave node<S,T,F,C>Including communication path state sequencesSSequence of communication transmission pathsTTransmitting a feedback sequenceFAnd path trust connection probability sequenceC；
S400, according to the network connection topology setGDetermining the optimal routing node and obtaining the optimal routing path distanceW t,1Judging whether the optimal routing node is a main node to be tested, if so, testing the chip to be tested to be qualified, otherwise, testing the chip to be tested to be unqualified;
s500, judging whether the value t reaches a loop threshold value N, if so, jumping to the step S600, and if not, adding 1 to the value t and jumping to the step S200;
s600, judging whether the test qualified times of the chip to be tested in the circulation N times exceed a dynamic test threshold, if so, skipping to the step S700, otherwise, skipping to the step S100;
s700, according to the optimal routing path distance Wt,1Calculating the signal coverage adjacent connection strength matrix S of the wireless communication of the host node to be testedadjoinObtaining a signal coverage connected region S of the chip to be testedconnectAnd its signal coverage connectivity distance DSignalAnd outputting a signal coverage range test result of the chip to be tested.
2. The method for testing signal coverage of the short-distance wireless communication chip as claimed in claim 1, wherein in S100, the master node to be tested is a wireless sensor network node, the wireless communication module of the master node is a chip to be tested, the test slave node is a wireless sensor network node, the wireless communication module of the slave node is a standard chip, and the sensor test network is a wireless sensor network.
3. The method for testing signal coverage of the short-range wireless communication chip according to claim 1, wherein in step S100, in step S600, the method for determining whether the number of times that the chip to be tested passes the dynamic test threshold line within N cycles is as follows:
s601, calculating the Pass times Pass of the chip to be tested;
s602, calculating the test pass rate P of the chip to be testedPass = ( Pass/N )×100%，PPass = [0, 1]；
S603, dynamically testing the threshold value as line; wherein line = NxPPass/[1-PPass×(N×mod( 1/PPass) ); mod is a remainder function;
s604, if the test Pass times Pass of the chip to be tested is larger than line, jumping to the step S700; otherwise, the process jumps to step S100.
4. The method for testing signal coverage of the short-distance wireless communication chip as claimed in claim 1, wherein in S100, the initialization of the sensor test network based on wireless communication includes initialization of a test environment, initialization of sensor nodes and initialization of network topology, wherein the test environment is a test field with a horizontal and vertical coordinate length of X × Y, and the test field includes a plurality of obstacles which can be set up randomly; the number of the sensor nodes is P, one of the sensor nodes is randomly selected as a main node to be tested and is provided with a chip to be tested as a wireless communication module, and the other (P-1) sensor nodes are all testing slave node installation standard chips; constructing a set of network connection topologies G =<S,T,F,C>And initializing and setting a path trust connection probability sequenceCIs the probability median, and the cycle number t of the initial time period is 1.
5. The method of claim 1, wherein in step S200, the position is updated at the t-th time period, the positions of the sensor nodes in the sensor test network are randomized, and the position coordinates where the master node to be tested is randomly placed are set to (x)t, yt) Wherein x ist= [0, X]，yt = [0, Y]。
6. A close range wireless communication chip signal coverage test system is characterized in that the close range wireless communication chip signal coverage test system comprises: the system comprises a processor, a memory and a computer program stored in the memory and running on the processor, wherein the processor executes the computer program to realize the steps in the signal coverage test method of the short-distance wireless communication chip of claim 1, and the signal coverage test system of the short-distance wireless communication chip can run in computing equipment of desktop computers, notebooks, palm computers and cloud data centers.
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