CN113947049A - Self-feedback chip verification platform for improving function coverage rate - Google Patents
Self-feedback chip verification platform for improving function coverage rate Download PDFInfo
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- CN113947049A CN113947049A CN202111411255.3A CN202111411255A CN113947049A CN 113947049 A CN113947049 A CN 113947049A CN 202111411255 A CN202111411255 A CN 202111411255A CN 113947049 A CN113947049 A CN 113947049A
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Abstract
The invention discloses a self-feedback chip verification platform for improving functional coverage rate, which comprises an excitation generator, an input monitor, an output monitor, a reference model, a comparator, a coverage rate collector and a coverage rate feedback device, wherein the coverage rate feedback device is added, and the collected coverage rate result is stored and analyzed to generate uncovered functional items, and then the uncovered functional items are transmitted to an excitation generator to prompt the excitation generator to generate specific uncovered excitation. The coverage rate feedback device is newly added in the prior verification platform, so that the verification platform forms a self-feedback system, thereby reducing unnecessary tests, reducing the measurement times and the measurement time and improving the chip verification efficiency.
Description
Technical Field
The invention relates to the field of chip verification, in particular to a self-feedback chip verification platform for improving functional coverage rate.
Background
As the scale of the chip is larger and larger, the logic is more and more complex, the adoption of a constrained random test method is the only effective way for comprehensively verifying the chips, and the completeness of verification is usually measured by coverage. The coverage rate is mainly divided into code coverage rate and function coverage rate, the code coverage rate reflects the execution result of the code and can be directly tested through a tool, and the function coverage rate is used for ensuring that the design acts correctly in the actual environment and can be divided into function point coverage rate and cross coverage rate. The functional coverage rate is closely connected with the design intention, cannot be directly tested by a tool, and needs a verifier to build a coverage rate collector to complete the test.
The existing coverage rate collector can detect the coverage condition of the function, but as the chip is more and more complex, the coverage rate of the function is difficult to reach 100%, the test times are required to be increased to promote an excitation generator to generate more excitation when the coverage rate of the function is increased, and the biggest problem brought by increasing the measurement times is that the time cost is increased and the efficiency of chip test is reduced. For example: for example, there are two function points a and B to be tested, both of which are uniformly distributed. Assuming that a has 20 values and B has 30 values, if a and B are cross-aligned and combined, there should theoretically be 600 combinations of a and B. Even if the validation item runs 600 times, 100% cross-coverage is not achieved. The number of measurements and the time of the measurements are increased in order to increase the cross-coverage. In addition, during simulation, both A and B are homogenized randomly at the same time, and even if the measurement times are increased by 10 times, the cross coverage rate cannot be guaranteed to reach 100%.
Disclosure of Invention
The invention aims to solve the technical problem of providing a self-feedback chip verification platform for improving the functional coverage rate, wherein a coverage rate feedback device is added, the collected functional coverage rate result is stored and analyzed, uncovered functional items are given out and fed back to an excitation generator to generate uncovered specific excitation, so that the measurement times and the measurement time are reduced, and the functional coverage rate and the measurement efficiency are improved.
In order to solve the technical problem, the technical scheme adopted by the invention is as follows: a self-feedback chip verification platform for improving functional coverage rate comprises:
the excitation generator is used for providing excitation to be applied for the design to be checked and sending the excitation to the design to be checked;
the input monitor is connected with the excitation generator and used for collecting data of an input interface to be tested and designed and sending the collected data to the reference model and the coverage rate collector;
the output monitor is connected with the output end of the design to be checked and used for collecting data of the output port of the design to be checked, observing the boundary and the internal information of the design to be checked and sending the information to the comparator;
the reference model is connected with the input monitor, completes the same function as the design to be checked, and gives out an expected result according to the data input into the monitor;
the comparator is respectively connected with the reference model and the output monitor, compares the data from the reference model and the output monitor, and if the data from the reference model and the output monitor are correct, the design to be verified is correct;
the coverage rate collector is used for detecting whether codes are redundant, whether design points are traversed or not, whether design conditions are observed or not, verifying and testing, and sending a collection result to a coverage rate feedback device;
and the coverage rate feedback device is connected with the coverage rate collector, stores and analyzes the results collected by the coverage rate collector, obtains the uncovered coverage items and transmits the uncovered coverage items to the excitation generator so that the excitation generator generates specific uncovered excitation.
Further, the coverage rate feedback device comprises a coverage item accumulator, a coverage item distributor, a coverage item memory, a coverage item analyzer and a coverage item analysis controller;
the coverage item accumulator accumulates the coverage items output by the coverage rate collector and transmits the coverage items to the coverage item analysis controller;
the coverage item distributor is connected with the input coverage item and distributes the coverage item to a storage area corresponding to the coverage item storage according to a set rule;
the coverage item memory is connected with the coverage item distributor and stores the input coverage items according to a set rule; the set rule means that the coverage item memory is divided into n storage areas according to the interval set by the user, the coverage items are also divided into n parts according to the interval set by the user, and the n parts of coverage items are respectively stored in the corresponding storage areas;
the coverage item analysis controller is connected with the coverage item accumulator and the input coverage item, judges whether the coverage rate reaches 100% according to the input coverage item, and controls the coverage item analyzer to analyze the coverage items stored in the coverage item memory if the coverage rate does not reach 100%, so as to obtain the uncovered coverage item and send the uncovered coverage item to the excitation generator, so that the excitation generator generates specific excitation which is not covered.
Further, the coverage item analysis controller analyzes the accumulated value of the coverage item accumulator, when the accumulated value is equal to a designed threshold value N, the coverage item analysis controller judges whether the coverage rate reaches 100% according to the input coverage item, and if not, the coverage item analyzer is controlled to analyze the coverage item stored in the coverage item memory.
Further, the process of the coverage item analyzer analyzing the coverage items stored in the coverage item storage is as follows: the coverage item analyzer reads out the data in the coverage item memory, and the memory area which does not store the data is the coverage item which is not covered, thereby analyzing the coverage item which is not covered.
Further, the stimulus generator provides normal stimulus and abnormal stimulus according to the interface protocol, and sends the stimulus to the design to be tested.
The invention has the beneficial effects that: the invention adds a coverage rate feedback device, stores and analyzes the collected coverage rate results to generate uncovered functional items, and then transmits the uncovered functional items to the excitation generator to prompt the excitation generator to generate specific uncovered excitation. According to the method, a coverage rate feedback device is newly added in the conventional verification platform, so that the verification platform forms a self-feedback system, unnecessary tests are reduced, the measurement times and the measurement time are reduced, and the chip verification efficiency is improved.
Drawings
FIG. 1 is a functional block diagram of a verification platform;
FIG. 2 is a functional block diagram of a coverage rate feedback;
FIG. 3 is a flow chart of self-feedback chip verification.
Detailed Description
The invention is further described with reference to the following figures and specific embodiments.
Example 1
In the conventional technical scheme, in order to achieve the expected coverage rate, the number of times of measurement is generally increased, and a stimulus generator is prompted to generate enough stimuli, so that the measurement time is increased, and the efficiency of chip verification is reduced.
In view of the above problems, the present invention provides a self-feedback chip verification platform for improving functional coverage, as shown in fig. 1, which includes an excitation generator, an input monitor, an output monitor, a reference model, a comparator, a coverage collector and a coverage feedback device.
The function of each part is as follows:
the stimulus generator provides the stimulus to be applied to the design to be verified, and is a source of the data stream of the whole verification platform. The method mainly simulates various real use conditions of the design to be checked, provides normal excitation and abnormal excitation according to an interface protocol, and sends the excitation to the design to be checked through an interface.
The input monitor is connected with the excitation generator and is used for sampling data of the input interface to be tested and designed. The verification platform must monitor the behavior of the design to be verified, and can judge whether the design to be verified is correct or not according to the signal changes only after knowing the changes of the input and output signals of the design to be verified. The input monitor monitors the results of the excitation generated by the excitation generator and sends the monitored results to the reference model and the coverage collector.
The output monitor is connected with the design to be checked and samples data of the output interface of the design to be checked. The output monitor mainly functions to observe the boundary and internal signals of the design to be checked and package them to be sent to the comparator.
The reference model is connected with the input monitor to complete the same function as the design to be tested, and the expected result is given according to the data of the input monitor, the reference model plays the role of simulating the hardware function, and the model is required to be completed without referring to the hardware design logic.
The comparator is respectively connected with the reference model and the output monitor to check the functions, one part of data is from the reference model, one part of data is signals sampled by the output monitor, then the two parts of data are compared, and if the two parts of data are correct, the design to be tested is correct.
The coverage collector is connected with the input monitor and is used for checking whether the codes are redundant, whether the design point is traversed, and whether the design condition is observed, verified and tested. The results of the coverage rate collection are sent to a coverage rate feedback device for processing.
The coverage rate feedback device is connected with the coverage rate collector, stores and analyzes the results collected by the coverage rate collector, obtains the uncovered coverage items and transmits the uncovered coverage items to the excitation generator, so that the excitation generator generates specific uncovered excitation.
As shown in FIG. 2, the coverage rate feedbacker includes a coverage item accumulator, a coverage item assignor, a coverage item memory, a coverage item analyzer, and a coverage item analysis controller.
The functions of each part are as follows:
the coverage item accumulator accumulates the coverage items output by the coverage rate collector and transmits the coverage items to the coverage item analysis controller.
The coverage item distributor is connected with the input coverage items and distributes the coverage items to the storage areas corresponding to the coverage item storage according to a set rule.
The coverage item memory is connected with the coverage item distributor and stores the input coverage items according to a set rule; the set rule means that the coverage item memory is divided into n storage areas according to the interval set by the user, the coverage items are also divided into n parts according to the interval set by the user, and the n parts of coverage items are respectively stored in the corresponding storage areas;
the coverage item analysis controller is connected with the coverage item accumulator and the input coverage item, judges whether the coverage rate reaches 100% according to the input coverage item, and controls the coverage item analyzer to analyze the coverage items stored in the coverage item memory if the coverage rate does not reach 100%, so as to obtain the uncovered coverage item and send the uncovered coverage item to the excitation generator, so that the excitation generator generates specific excitation which is not covered.
In this embodiment, the coverage item analysis controller analyzes the accumulated value of the coverage item accumulator, when the accumulated value is equal to the designed threshold N, the coverage item analysis controller determines whether the coverage rate reaches 100% according to the input coverage item, and if not, controls the coverage item analyzer to analyze the coverage item stored in the coverage item memory.
The process of the coverage item analyzer analyzing the coverage items stored in the coverage item storage is as follows: the coverage item analyzer reads out the data in the coverage item memory, and the memory area which does not store the data is the coverage item which is not covered, thereby analyzing the coverage item which is not covered.
The verification platform can perform self-feedback chip verification according to the verification platform, and as shown in fig. 3, the chip verification process is as follows:
first, the stimulus generator randomly generates random packets that are input to the design under test via the input interface.
Second, the input monitor monitors the data from the input interface for the reference model and the coverage collector.
Thirdly, the input data is processed by the logic to be verified and then output through the output interface.
Fourth, the output monitor monitors the data of the output interface for delivery to the comparator.
Fifth, the reference model processes the data input to the monitor to generate expected data, which is sent to the comparator.
Sixth, the comparator compares the data of the output monitor with the data of the reference model.
Seventh, the coverage collector collects coverage item data to the coverage feedbacker.
Eighth, in the coverage rate feedback device, the coverage item accumulator accumulates the coverage items, and the coverage item allocator stores the input coverage items into the n storage spaces corresponding to the coverage item storage.
Ninthly, the first to eighth steps are performed if the accumulated value of the cover term accumulator does not reach the set threshold N, and the tenth step is performed otherwise.
Tenth, when the accumulated value of the coverage item accumulator is equal to the designed threshold value N, the coverage item controller will judge whether the coverage rate reaches 100%, if not, the coverage item analyzer will be controlled to read out the data in the coverage item memory and analyze the uncovered coverage items, and send them to the excitation generator, and prompt the excitation generator to generate the corresponding excitation, and execute the first to eighth steps, otherwise, the end is finished.
The invention adds the coverage rate feedback device which can store and analyze the result of the coverage rate and feed the analyzed result back to the excitation generator to prompt the excitation generator to generate uncovered specific excitation, thereby improving the coverage rate and the efficiency of chip verification.
The foregoing description is only for the basic principle and the preferred embodiments of the present invention, and modifications and substitutions by those skilled in the art are included in the scope of the present invention.
Claims (5)
1. The utility model provides an improve self-feedback chip verification platform of function coverage which characterized in that: the method comprises the following steps:
the excitation generator is used for providing excitation to be applied for the design to be checked and sending the excitation to the design to be checked;
the input monitor is connected with the excitation generator and used for collecting data of an input interface to be tested and designed and sending the collected data to the reference model and the coverage rate collector;
the output monitor is connected with the output end of the design to be checked and used for collecting data of the output port of the design to be checked, observing the boundary and the internal information of the design to be checked and sending the information to the comparator;
the reference model is connected with the input monitor, completes the same function as the design to be checked, and gives out an expected result according to the data input into the monitor;
the comparator is respectively connected with the reference model and the output monitor, compares the data from the reference model and the output monitor, and if the data from the reference model and the output monitor are correct, the design to be verified is correct;
the coverage rate collector is used for detecting whether codes are redundant, whether design points are traversed or not, whether design conditions are observed or not, verifying and testing, and sending a collection result to a coverage rate feedback device;
and the coverage rate feedback device is connected with the coverage rate collector, stores and analyzes the results collected by the coverage rate collector, obtains the uncovered coverage items and transmits the uncovered coverage items to the excitation generator so that the excitation generator generates specific uncovered excitation.
2. The self-feedback chip verification platform for improving functional coverage of claim 1, wherein: the coverage rate feedback device comprises a coverage item accumulator, a coverage item distributor, a coverage item memory, a coverage item analyzer and a coverage item analysis controller;
the coverage item accumulator accumulates the coverage items output by the coverage rate collector and transmits the coverage items to the coverage item analysis controller;
the coverage item distributor is connected with the input coverage item and distributes the coverage item to a storage area corresponding to the coverage item storage according to a set rule;
the coverage item memory is connected with the coverage item distributor and stores the input coverage items according to a set rule; the set rule means that the coverage item memory is divided into n storage areas according to the interval set by the user, the coverage items are also divided into n parts according to the interval set by the user, and the n parts of coverage items are respectively stored in the corresponding storage areas;
the coverage item analysis controller is connected with the coverage item accumulator and the input coverage item, judges whether the coverage rate reaches 100% according to the input coverage item, and controls the coverage item analyzer to analyze the coverage items stored in the coverage item memory if the coverage rate does not reach 100%, so as to obtain the uncovered coverage item and send the uncovered coverage item to the excitation generator, so that the excitation generator generates specific excitation which is not covered.
3. The self-feedback chip verification platform for improving functional coverage of claim 2, wherein: the coverage item analysis controller analyzes the accumulated value of the coverage item accumulator, judges whether the coverage rate reaches 100% according to the input coverage item when the accumulated value is equal to a designed threshold value N, and controls the coverage item analyzer to analyze the coverage items stored in the coverage item memory if the coverage rate does not reach 100%.
4. The self-feedback chip verification platform for improving functional coverage of claim 2, wherein: the process of the coverage item analyzer analyzing the coverage items stored in the coverage item storage is as follows: the coverage item analyzer reads out the data in the coverage item memory, and the memory area which does not store the data is the coverage item which is not covered, thereby analyzing the coverage item which is not covered.
5. The self-feedback chip verification platform for improving functional coverage of claim 1, wherein: the excitation generator provides normal excitation and abnormal excitation according to the interface protocol and sends the excitation to the design to be tested.
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| CN115796089A (en) * | 2022-11-25 | 2023-03-14 | 南京金阵微电子技术有限公司 | Coverage rate driven verification method, verification device, medium, and electronic apparatus |
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| CN115796089A (en) * | 2022-11-25 | 2023-03-14 | 南京金阵微电子技术有限公司 | Coverage rate driven verification method, verification device, medium, and electronic apparatus |
| CN115796089B (en) * | 2022-11-25 | 2024-05-07 | 南京金阵微电子技术有限公司 | Coverage rate driven verification method, coverage rate driven verification device, coverage rate driven verification medium and electronic equipment |
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