CN113917309A - Method and system for detecting whether tooling for measuring delay time of circuit board is qualified - Google Patents
Method and system for detecting whether tooling for measuring delay time of circuit board is qualified Download PDFInfo
- Publication number
- CN113917309A CN113917309A CN202110975731.8A CN202110975731A CN113917309A CN 113917309 A CN113917309 A CN 113917309A CN 202110975731 A CN202110975731 A CN 202110975731A CN 113917309 A CN113917309 A CN 113917309A
- Authority
- CN
- China
- Prior art keywords
- tool
- signal
- delay time
- oscilloscope
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 25
- 238000006243 chemical reaction Methods 0.000 claims abstract description 41
- 238000005259 measurement Methods 0.000 claims abstract description 14
- 230000000630 rising effect Effects 0.000 claims description 14
- 238000012935 Averaging Methods 0.000 claims description 3
- 239000000126 substance Substances 0.000 claims description 3
- 238000003825 pressing Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 3
- 238000012797 qualification Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2837—Characterising or performance testing, e.g. of frequency response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2843—In-circuit-testing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Unknown Time Intervals (AREA)
Abstract
The invention discloses a method and a system for detecting whether a tool for measuring delay time of a circuit board is qualified, wherein the method comprises the following steps: s1: electrically connecting the tool to be detected with an oscilloscope, and electrically connecting the tool to be detected with a signal generator through a voltage conversion circuit to form a measuring system; s2: setting the delay output time of the signal generator to be 0, and acquiring the inherent delay time t0 of the system of the tool through the oscilloscope; s3: setting the delay output time of the signal generator to be a preset non-0 value, and acquiring the measurement delay time t1 of the tool through the oscilloscope; s4: and comparing the difference t1-t0 between the measured delay time and the inherent delay time of the system with the time difference of the preset non-0 value by the oscilloscope to determine whether the time difference is within a preset error range, if so, determining that the tool is qualified, and otherwise, determining that the tool is unqualified.
Description
Technical Field
The invention relates to the field of test metering. More particularly, the invention relates to a method and a system for detecting whether a tool for measuring the delay time of a circuit board is qualified.
Background
The circuit board is provided with a delay circuit, and whether the delay time meets the requirement needs to be tested during production, so that a special tool needs to be designed to detect the delay time of the delay circuit on the circuit board. The tool for measuring the delay time of the circuit board needs to be calibrated every year, and a method and a system special for detecting whether the tool for measuring the delay time of the circuit board is qualified are designed for the purpose.
Disclosure of Invention
In order to solve the problems in the background art, the invention provides a method and a system for detecting whether a tool for measuring the delay time of a circuit board is qualified.
The invention provides a method for detecting whether a tool for measuring the delay time of a circuit board is qualified or not, which comprises the following steps:
s1: electrically connecting the tool to be detected with an oscilloscope, and electrically connecting the tool to be detected with a signal generator through a voltage conversion circuit to form a measuring system;
s2: setting the delay output time of the signal generator to be 0, and acquiring the inherent delay time t0 of the system of the tool through the oscilloscope;
s3: setting the delay output time of the signal generator to be a preset non-0 value, and acquiring the measurement delay time t1 of the tool through the oscilloscope;
s4: and comparing the difference t1-t0 between the measured delay time and the inherent delay time of the system with the time difference of the preset non-0 value by the oscilloscope to determine whether the time difference is within a preset error range, if so, determining that the tool is qualified, and otherwise, determining that the tool is unqualified.
In a specific embodiment, the S2 includes:
s21: the tool to be detected outputs a first pulse signal;
s22: the voltage conversion circuit converts the first pulse signal into a first receiving signal suitable for the input of the signal generator;
s23: the signal generator outputs a first output signal according to the first receiving signal;
s24: the voltage conversion circuit converts the first output signal into a first feedback signal suitable for the tool to input;
s25: and the oscilloscope measures the time difference between the first pulse signal and the first feedback signal as the inherent delay time t0 of the system.
In another embodiment, the S2 further comprises
Repeating the steps S21-S25 to obtain a plurality of inherent delay times of the system;
averaging the plurality of system inherent delay times as the system inherent delay time t 0.
In a specific embodiment, the S3 includes:
s31: the tool to be detected outputs a second pulse signal;
s32: the voltage conversion circuit converts the second pulse signal into a second receiving signal suitable for the input of the signal generator;
s33: the signal generator outputs a second output signal according to the second receiving signal;
s34: the voltage conversion circuit converts the second output signal into a second feedback signal suitable for the tool to input;
s35: and the oscilloscope measures the time difference between the second pulse signal and the second feedback signal as the measurement delay time t1 of the tool.
In another specific embodiment, the S3 further includes:
changing the preset non-0 value to obtain k preset non-0 values, tk, repeating the steps S31-S35 to obtain the measurement delay time of a plurality of the tools,
and k is more than or equal to 1 and less than or equal to N, wherein N is the delay time of the N circuit boards which can be measured by the tool, N and k are natural numbers, and tk corresponds to the delay time of the kth circuit board measured by the tool.
In a specific embodiment, the S4 includes:
and comparing whether the time difference between the tk-t0 and the preset non-0 value is within a corresponding kth preset error range, if so, judging that the delay time of the tool for measuring the kth circuit board is qualified, and if not, judging that the delay time of the tool for measuring the kth circuit board is unqualified.
In another specific embodiment, the method further comprises:
judging whether the kth circuit board is a rising edge trigger circuit board or a falling edge trigger circuit board;
and determining the first pulse signal and the second pulse signal to be rising edge trigger pulse signals or falling edge trigger pulse signals based on the judgment result.
In one embodiment, the voltage conversion circuit includes:
a step-down conversion unit for converting the first pulse signal into a first receiving signal suitable for the input of the signal generator and converting the second pulse signal into a second receiving signal suitable for the input of the signal generator;
and the boost conversion unit is used for converting the first output signal into a first feedback signal suitable for the tool input and converting the second output signal into a second feedback signal suitable for the tool input.
In a specific embodiment, the buck conversion unit includes a first resistor and a second resistor, wherein a first end of the first resistor receives the first pulse signal and the second pulse signal, a second end of the second resistor is grounded, and the second end of the first resistor and the first end of the second resistor are connected to output the first received signal and the second received signal;
the boost conversion unit comprises a boost circuit, wherein a first end of the boost circuit outputs the first feedback signal and the second feedback signal, and a second end of the boost circuit receives the first output signal and the second output signal.
On the other hand, the invention also provides a system for detecting whether the tool for measuring the delay time of the circuit board is qualified, which comprises the following steps: a voltage conversion circuit, a signal generator and an oscilloscope which are electrically connected with the tool to be detected,
wherein the content of the first and second substances,
the delay output time of the signal generator is set to be 0, and the inherent delay time t0 of the system of the tool is obtained through the oscilloscope;
the delay output time of the signal generator is set to be a preset non-0 value, and the measurement delay time t1 of the tool is obtained through the oscilloscope;
and the oscilloscope compares whether the difference t1-t0 between the measured delay time and the inherent delay time of the system and the time difference of the preset non-0 value are within a preset error range, if so, the tool is judged to be qualified, and if not, the tool is judged to be unqualified.
The invention has the following beneficial effects:
the invention provides a method and a system for detecting whether a tool for measuring the delay time of a circuit board is qualified, the qualification of the tool for measuring the delay time of the circuit board is detected by setting the delay output time of a signal generator, the precision of the tool for measuring the delay time of the circuit board is detected by comparing the difference value of the measured value t1 of the tool for measuring the delay time of the circuit board minus the inherent delay time t0 of a detection system with the preset delay output time of the signal generator, and the qualification of the tool for measuring the delay time of the circuit board is judged.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a diagram illustrating the steps of a method of detecting the qualification of a tool for measuring the delay time of a circuit board according to the present invention;
FIG. 2 illustrates a system connection diagram for detecting whether a tool for measuring circuit board delay time is qualified according to one embodiment of the invention;
FIG. 3 shows a schematic diagram of a voltage conversion circuit according to one embodiment of the invention.
Detailed Description
In order to make the technical solutions and advantages of the present invention clearer, the following will describe embodiments of the present invention in further detail with reference to the accompanying drawings. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and is not to be taken as limiting the scope of the invention.
In order to detect whether a tool for measuring the delay time of the circuit board is qualified or not, the invention designs a method and a system for detecting whether the tool for measuring the delay time of the circuit board is qualified or not, wherein the method comprises the following steps:
s1: and electrically connecting the tool to be detected with an oscilloscope, and electrically connecting the tool to be detected with a signal generator through a voltage conversion circuit to form a measuring system.
In one embodiment, the measurement system is connected in the manner shown in FIG. 2.
The tool to be detected is used for measuring the delay time of the delay circuit on the circuit board.
In a specific embodiment, the tool to be detected can output a pulse signal through a key, a timer of the tool starts timing, when a corresponding feedback signal is detected to be fed back, timing is stopped, and the time between the timing and the feedback signal is the delay time measured by the tool; the tool is suitable for the existing tool for measuring the delay time of the circuit board.
As shown in fig. 2, the tool may output a rising edge trigger pulse signal or a falling edge trigger pulse signal, depending on whether the circuit board measured by the tool is a rising edge trigger circuit board or a falling edge trigger circuit board.
The signal generator is used for receiving a pulse signal sent by a tool for measuring the delay time of the circuit board, and outputting a feedback signal after delaying preset delay output time.
In a specific embodiment, the signal generator can receive the pulse signal and can set to output a single period of the pulse signal, and the period of outputting a single period of the waveform can also be set.
In one embodiment, the signal generator is a german 33512B signal generator.
S2: setting the delay output time of the signal generator to be 0, and acquiring the inherent delay time t0 of the system of the tool through the oscilloscope;
in a specific embodiment, the signal generator is a german technology 33512B signal generator, and the method for setting the delay output time of the signal generator to be 0 includes:
trigger setting
Firstly, pressing a Trigger button, then pressing a Source button, selecting external Trigger of Ext, then pressing a Trigger setup button, setting Delay time to 0ms, and setting slope to Rising;
burst setting
Pressing a 'Burst' button, selecting Output as 'on' Output, pressing a '# of cycles' button, and setting the button to be 1;
basic setup
The Output is selected as "on" Output by setting the Output impedance to be a High impedance (High-Z), a square wave with a frequency of 10mHz, an amplitude of 10Vpp, an Offset of 5Vpp, and a duty ratio of 50%.
In a specific embodiment, the S2 further includes:
s21: the tool to be detected outputs a first pulse signal;
s22: the voltage conversion circuit converts the first pulse signal into a first receiving signal suitable for the input of the signal generator;
in one embodiment, the voltage conversion circuit includes:
a step-down conversion unit for converting the first pulse signal into a first receiving signal suitable for the input of the signal generator and converting the second pulse signal into a second receiving signal suitable for the input of the signal generator;
the boost conversion unit is used for converting the first output signal into a first feedback signal suitable for the tool input and converting the second output signal into a second feedback signal suitable for the tool input;
in a specific embodiment, the voltage conversion circuit is as shown in fig. 3, the buck conversion unit includes a first resistor 110 and a second resistor 120, wherein a first end of the first resistor 110 receives the first pulse signal, a second end of the second resistor 120 is grounded, and a second end of the first resistor 110 and a first end of the second resistor 120 are connected to output the first received signal;
the boost converting unit comprises a boost circuit 130, wherein a first terminal of the boost circuit 130 outputs the first feedback signal, and a second terminal of the boost circuit 130 receives the first output signal.
In other embodiments, the voltage conversion circuit may also be a dedicated voltage conversion chip or a relay;
in a specific embodiment, the voltage of the first pulse signal output by the tool is 28V, the voltage of the first receiving signal suitable for the input of the signal generator is 2V, and the voltage of the 28V is converted into the voltage of 2V by the voltage reduction conversion unit of the voltage conversion circuit so as to adapt to the input of the signal generator.
S23: the signal generator outputs a first output signal according to the first receiving signal;
s24: the voltage conversion circuit converts the first output signal into a first feedback signal suitable for the tool to input;
in a specific embodiment, a voltage of 5V is converted into a voltage of 28V by a boost conversion unit of the voltage conversion circuit to adapt to the voltage of the tool;
s25: and the oscilloscope measures the time difference between the first pulse signal and the first feedback signal as the inherent delay time t0 of the system.
In order to measure the system inherent delay time t0 more accurately, in another specific embodiment, the S2 further includes:
repeating the steps S21-S25 to obtain a plurality of inherent delay times of the system;
averaging the plurality of system inherent delay times as the system inherent delay time t 0.
S3: setting the delay output time of the signal generator to be a preset non-0 value, and acquiring the measurement delay time t1 of the tool through the oscilloscope;
in a specific embodiment, the S3 further includes:
s31: the tool to be detected outputs a second pulse signal;
in one embodiment, the second pulse signal is a rising edge trigger pulse signal, and the operation steps are as follows: pressing a zero clearing button on a tool for measuring the delay time of the circuit board, then releasing the zero clearing button, pressing a rising edge testing button, and outputting a rising edge trigger pulse signal by the tool for measuring the delay time of the circuit board;
s32: the voltage conversion circuit converts the second pulse signal into a second receiving signal suitable for the input of the signal generator;
s33: the signal generator outputs a second output signal according to the second receiving signal;
s34: the voltage conversion circuit converts the second output signal into a second feedback signal suitable for the tool to input;
s35: and the oscilloscope measures the time difference between the second pulse signal and the second feedback signal as the measurement delay time t1 of the tool.
If the circuit boards which can be detected by the tool are various (corresponding to various delay times), the invention can respectively measure whether the tool is qualified or not for each circuit board (corresponding to various delay times). To this end, in another specific embodiment, the S3 further includes:
changing the preset non-0 value to obtain k preset non-0 values, tk, repeating the steps S31-S35 to obtain the measurement delay time of a plurality of the tools,
and k is more than or equal to 1 and less than or equal to N, wherein N is the delay time of the N circuit boards which can be measured by the tool, N and k are natural numbers, and tk corresponds to the delay time of the kth circuit board measured by the tool. In some embodiments, the delay time of the signal generator may be preset to a value of 30ms, 200ms, or 500ms for circuit boards having delay times of 30ms, 200ms, and 500 ms.
In another specific embodiment, the method further comprises:
judging whether the kth circuit board is a rising edge trigger circuit board or a falling edge trigger circuit board;
and determining the first pulse signal and the second pulse signal to be rising edge trigger pulse signals or falling edge trigger pulse signals based on the judgment result.
In a specific embodiment, taking the signal generator as an example of a german technology 33512B signal generator, setting the delay time of the signal generator to be 30ms, where the second pulse signal output by the tool is a rising edge trigger pulse signal, and the delay time method of the preset signal generator is as follows:
trigger setting
Firstly, pressing a Trigger button, then pressing a Source button, selecting external Trigger of Ext, then pressing a Trigger setup button, setting Delay time to 30ms, and setting slope to Rising;
burst setting
Pressing a 'Burst' button, selecting Output as 'on' Output, pressing a '# of cycles' button, and setting the button to be 1;
basic setup
The Output is selected as "on" Output by setting the Output impedance to be a High impedance (High-Z), a square wave with a frequency of 10mHz, an amplitude of 10Vpp, an Offset of 5Vpp, and a duty ratio of 50%.
S4: and comparing the difference t1-t0 between the measured delay time and the inherent delay time of the system with the time difference of the preset non-0 value by the oscilloscope to determine whether the time difference is within a preset error range, if so, determining that the tool is qualified, and otherwise, determining that the tool is unqualified.
In a specific embodiment, the S4 includes:
and comparing whether the time difference between the tk-t0 and the preset non-0 value is within a corresponding kth preset error range, if so, judging that the delay time of the tool for measuring the kth circuit board is qualified, and if not, judging that the delay time of the tool for measuring the kth circuit board is unqualified.
The invention also provides a system for detecting whether the tool for measuring the delay time of the circuit board is qualified, which comprises the following steps: a voltage conversion circuit, a signal generator and an oscilloscope which are electrically connected with the tool to be detected,
wherein the content of the first and second substances,
the delay output time of the signal generator is set to be 0, and the inherent delay time t0 of the system of the tool is obtained through the oscilloscope;
the delay output time of the signal generator is set to be a preset non-0 value, and the measurement delay time t1 of the tool is obtained through the oscilloscope;
and the oscilloscope compares whether the difference t1-t0 between the measured delay time and the inherent delay time of the system and the time difference of the preset non-0 value are within a preset error range, if so, the tool is judged to be qualified, and if not, the tool is judged to be unqualified.
It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it will be obvious to those skilled in the art that other variations or modifications may be made on the basis of the above description, and all embodiments may not be exhaustive, and all obvious variations or modifications may be included within the scope of the present invention.
Claims (10)
1. A method for detecting whether a tool for measuring the delay time of a circuit board is qualified is characterized by comprising the following steps:
s1: electrically connecting the tool to be detected with an oscilloscope, and electrically connecting the tool to be detected with a signal generator through a voltage conversion circuit to form a measuring system;
s2: setting the delay output time of the signal generator to be 0, and acquiring the inherent delay time t0 of the system of the tool through the oscilloscope;
s3: setting the delay output time of the signal generator to be a preset non-0 value, and acquiring the measurement delay time t1 of the tool through the oscilloscope;
s4: and comparing the difference t1-t0 between the measured delay time and the inherent delay time of the system with the time difference of the preset non-0 value by the oscilloscope to determine whether the time difference is within a preset error range, if so, determining that the tool is qualified, and otherwise, determining that the tool is unqualified.
2. The method according to claim 1, wherein the S2 includes:
s21: the tool to be detected outputs a first pulse signal;
s22: the voltage conversion circuit converts the first pulse signal into a first receiving signal suitable for the input of the signal generator;
s23: the signal generator outputs a first output signal according to the first receiving signal;
s24: the voltage conversion circuit converts the first output signal into a first feedback signal suitable for the tool to input;
s25: and the oscilloscope measures the time difference between the first pulse signal and the first feedback signal as the inherent delay time t0 of the system.
3. The method according to claim 2, wherein the S2 further comprises
Repeating the steps S21-S25 to obtain a plurality of inherent delay times of the system;
averaging the plurality of system inherent delay times as the system inherent delay time t 0.
4. The method according to claim 2, wherein the S3 includes:
s31: the tool to be detected outputs a second pulse signal;
s32: the voltage conversion circuit converts the second pulse signal into a second receiving signal suitable for the input of the signal generator;
s33: the signal generator outputs a second output signal according to the second receiving signal;
s34: the voltage conversion circuit converts the second output signal into a second feedback signal suitable for the tool to input;
s35: and the oscilloscope measures the time difference between the second pulse signal and the second feedback signal as the measurement delay time t1 of the tool.
5. The method according to claim 4, wherein the S3 further comprises:
changing the preset non-0 value to obtain k preset non-0 values, tk, repeating the steps S31-S35 to obtain the measurement delay time of a plurality of the tools,
and k is more than or equal to 1 and less than or equal to N, wherein N is the delay time of the N circuit boards which can be measured by the tool, N and k are natural numbers, and tk corresponds to the delay time of the kth circuit board measured by the tool.
6. The method according to claim 5, wherein the S4 includes:
and comparing whether the time difference between the tk-t0 and the preset non-0 value is within a corresponding kth preset error range, if so, judging that the delay time of the tool for measuring the kth circuit board is qualified, and if not, judging that the delay time of the tool for measuring the kth circuit board is unqualified.
7. The method of claim 5, further comprising:
judging whether the kth circuit board is a rising edge trigger circuit board or a falling edge trigger circuit board;
and determining the first pulse signal and the second pulse signal to be rising edge trigger pulse signals or falling edge trigger pulse signals based on the judgment result.
8. The method of claim 2, wherein the voltage conversion circuit comprises:
a step-down conversion unit for converting the first pulse signal into a first receiving signal suitable for the input of the signal generator and converting the second pulse signal into a second receiving signal suitable for the input of the signal generator;
and the boost conversion unit is used for converting the first output signal into a first feedback signal suitable for the tool input and converting the second output signal into a second feedback signal suitable for the tool input.
9. The method of claim 8,
the buck conversion unit comprises a first resistor and a second resistor, wherein a first end of the first resistor receives the first pulse signal and the second pulse signal, a second end of the second resistor is grounded, and a second end of the first resistor is connected with a first end of the second resistor for outputting the first receiving signal and the second receiving signal;
the boost conversion unit comprises a boost circuit, wherein a first end of the boost circuit outputs the first feedback signal and the second feedback signal, and a second end of the boost circuit receives the first output signal and the second output signal.
10. The utility model provides a system for whether detect frock that is used for measuring circuit board delay time is qualified which characterized in that includes: a voltage conversion circuit, a signal generator and an oscilloscope which are electrically connected with the tool to be detected,
wherein the content of the first and second substances,
the delay output time of the signal generator is set to be 0, and the inherent delay time t0 of the system of the tool is obtained through the oscilloscope;
the delay output time of the signal generator is set to be a preset non-0 value, and the measurement delay time t1 of the tool is obtained through the oscilloscope;
and the oscilloscope compares whether the difference t1-t0 between the measured delay time and the inherent delay time of the system and the time difference of the preset non-0 value are within a preset error range, if so, the tool is judged to be qualified, and if not, the tool is judged to be unqualified.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110975731.8A CN113917309B (en) | 2021-08-24 | Method and system for detecting whether tool for measuring delay time of circuit board is qualified or not |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110975731.8A CN113917309B (en) | 2021-08-24 | Method and system for detecting whether tool for measuring delay time of circuit board is qualified or not |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113917309A true CN113917309A (en) | 2022-01-11 |
| CN113917309B CN113917309B (en) | 2024-05-24 |
Family
ID=
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2121100U (en) * | 1991-12-19 | 1992-11-04 | 河北省邢台地区行政公署广播电视局 | Float carrier dynamic measure signal generator |
| CN1370997A (en) * | 2001-02-16 | 2002-09-25 | 株式会社爱德万测试 | Regular calibration method and device for integrated circuit testing unit |
| CN201993551U (en) * | 2011-01-04 | 2011-09-28 | 无锡安特电子有限公司 | Reaction speed and time-delay time testing arrangement of hand-held auto-changing shade welding mask |
| CN202126626U (en) * | 2011-04-11 | 2012-01-25 | 北京广利核系统工程有限公司 | Testing device of digital instrument control system used in nuclear power station |
| CN102346236A (en) * | 2011-06-21 | 2012-02-08 | 电子科技大学 | Time parameter measurement system |
| CN203747768U (en) * | 2014-03-19 | 2014-07-30 | 中国人民解放军总装备部军械技术研究所 | High-resolution accuracy pulse triggering delay circuit with calibration function |
| JP2015154132A (en) * | 2014-02-12 | 2015-08-24 | 住友電気工業株式会社 | Delay time difference measurement system and delay time difference measurement method |
| CN106291333A (en) * | 2016-10-10 | 2017-01-04 | 京东方科技集团股份有限公司 | A kind of circuit board detecting system |
| US20190064329A1 (en) * | 2017-08-31 | 2019-02-28 | SZ DJI Technology Co., Ltd. | Delay time calibration of optical distance measurement devices, and associated systems and methods |
| US20190182983A1 (en) * | 2017-12-08 | 2019-06-13 | Sentelic Corporation | Detection system and method of signal transmission delay for fan chip |
| CN109901429A (en) * | 2019-03-04 | 2019-06-18 | 京微齐力(深圳)科技有限公司 | A kind of delay control method, sampling control method and device, sampling system |
| CN111294022A (en) * | 2020-03-23 | 2020-06-16 | 中国科学技术大学 | Sequence signal generator |
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2121100U (en) * | 1991-12-19 | 1992-11-04 | 河北省邢台地区行政公署广播电视局 | Float carrier dynamic measure signal generator |
| CN1370997A (en) * | 2001-02-16 | 2002-09-25 | 株式会社爱德万测试 | Regular calibration method and device for integrated circuit testing unit |
| CN201993551U (en) * | 2011-01-04 | 2011-09-28 | 无锡安特电子有限公司 | Reaction speed and time-delay time testing arrangement of hand-held auto-changing shade welding mask |
| CN202126626U (en) * | 2011-04-11 | 2012-01-25 | 北京广利核系统工程有限公司 | Testing device of digital instrument control system used in nuclear power station |
| CN102346236A (en) * | 2011-06-21 | 2012-02-08 | 电子科技大学 | Time parameter measurement system |
| JP2015154132A (en) * | 2014-02-12 | 2015-08-24 | 住友電気工業株式会社 | Delay time difference measurement system and delay time difference measurement method |
| CN203747768U (en) * | 2014-03-19 | 2014-07-30 | 中国人民解放军总装备部军械技术研究所 | High-resolution accuracy pulse triggering delay circuit with calibration function |
| CN106291333A (en) * | 2016-10-10 | 2017-01-04 | 京东方科技集团股份有限公司 | A kind of circuit board detecting system |
| US20190064329A1 (en) * | 2017-08-31 | 2019-02-28 | SZ DJI Technology Co., Ltd. | Delay time calibration of optical distance measurement devices, and associated systems and methods |
| US20190182983A1 (en) * | 2017-12-08 | 2019-06-13 | Sentelic Corporation | Detection system and method of signal transmission delay for fan chip |
| CN109901429A (en) * | 2019-03-04 | 2019-06-18 | 京微齐力(深圳)科技有限公司 | A kind of delay control method, sampling control method and device, sampling system |
| CN111294022A (en) * | 2020-03-23 | 2020-06-16 | 中国科学技术大学 | Sequence signal generator |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7825666B2 (en) | Test apparatus and measurement apparatus for measuring an electric current consumed by a device under test | |
| CN100529783C (en) | Calibration comparator circuit | |
| CN101359042A (en) | Auto calibration method for single-phase electronic type electric energy meter | |
| EP0852849A1 (en) | Method of testing an analog-to-digital converter | |
| CN109100928B (en) | High-precision pulse time interval measuring method and circuit | |
| CN105785131A (en) | Testing device and method for low ohm chip resistors | |
| CN113917309B (en) | Method and system for detecting whether tool for measuring delay time of circuit board is qualified or not | |
| CN101153899A (en) | Automatic measuring system and method of digital multimeter | |
| Max | Testing high speed high accuracy analog to digital converters embedded in systems on a chip | |
| CN113917309A (en) | Method and system for detecting whether tooling for measuring delay time of circuit board is qualified | |
| CN102012462A (en) | Device and method for detecting live wire-ground wire loop impedance of power circuit | |
| CN106918731A (en) | A kind of digital oscilloscope and its signal frequency measuring method | |
| CN106841929A (en) | A kind of Anti-interference cable fault test system and method for testing based on TDR | |
| CN206638771U (en) | A kind of Anti-interference cable fault test system based on TDR | |
| CN103809059B (en) | A kind of signal detecting method and device | |
| JP2962244B2 (en) | PCB passive element isolation measurement circuit | |
| CN101871971A (en) | Method for measuring frequency-phase characteristic of electrical network | |
| CN201548649U (en) | Test tooling of single plate | |
| CN201251601Y (en) | Weak low frequency instant vibration signal detection circuit based on frequency measurement | |
| CN107991640B (en) | Pulse current calibration device and method for semiconductor discrete device test system | |
| CN102096049A (en) | Testing method of instantaneous power consumption of dynamic power supply | |
| US3668522A (en) | Method and apparatus for characterizing test elements on the basis of rise-time degradation | |
| US20160146883A1 (en) | Device and method of detecting signal delay | |
| CN203037754U (en) | Customized FCT/ICT integrated test device for electronic products | |
| US6445207B1 (en) | IC tester and IC test method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant |