CN113720489A - Electronic thermometer and temperature measuring method - Google Patents
Electronic thermometer and temperature measuring method Download PDFInfo
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- CN113720489A CN113720489A CN202111160551.0A CN202111160551A CN113720489A CN 113720489 A CN113720489 A CN 113720489A CN 202111160551 A CN202111160551 A CN 202111160551A CN 113720489 A CN113720489 A CN 113720489A
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- temperature
- electronic thermometer
- thermistor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
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- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
The application belongs to the technical field of medical instruments and relates to an electronic thermometer and a temperature measuring method. The electronic thermometer includes: the temperature measuring device comprises a thermistor and a temperature measuring chip, wherein the thermistor is electrically connected with the temperature measuring chip; the thermistor is used for detecting temperature data in a first time period, and the first time period is a time interval when the thermistor is contacted with a detected object; and a plurality of groups of temperature change curves are stored in the temperature measurement chip, so that the corresponding temperature change curves are matched according to the temperature data in the first time period, and the corresponding highest temperature value on the temperature change curves is output. By utilizing the electronic thermometer provided by the embodiment of the application, the temperature data of the measured object in the first time period is measured by utilizing the thermistor to predict the highest temperature value by pre-storing a plurality of groups of temperature change curves in the temperature measuring chip, so that the temperature measuring time is greatly shortened, and the service efficiency is improved.
Description
Technical Field
The application relates to the technical field of medical instruments, in particular to an electronic thermometer and a temperature measuring method.
Background
The electronic thermometers in the market collect temperature data of a measured object through a thermistor, and the principle is that temperature conversion is performed by using the change of the resistance value of the thermistor along with the change of the temperature, however, a slow process exists in the process of collecting the temperature, the temperature is maintained for at least several minutes until the temperature value is not changed any more, and obviously, the efficiency of temperature detection is very low.
Moreover, if the tested object is replaced, the temperature detection is needed, and the temperature of the thermistor is required to return to the normal temperature state for testing, so that the process is quite slow, and the method is not suitable for the use scene of a plurality of people in a hospital.
Disclosure of Invention
In order to solve the technical problem that the electronic thermometer needs to wait for a long time when being used for multiple times in the related art, the application provides the electronic thermometer and a temperature measuring method.
In a first aspect, an electronic thermometer provided in an embodiment of the present application includes: the temperature measuring device comprises a thermistor and a temperature measuring chip, wherein the thermistor is electrically connected with the temperature measuring chip;
the thermistor is used for detecting temperature data in a first time period, and the first time period is a time interval when the thermistor is contacted with a detected object;
and a plurality of groups of temperature change curves are stored in the temperature measurement chip, so that the corresponding temperature change curves are matched according to the temperature data in the first time period, and the corresponding highest temperature value on the temperature change curves is output.
Optionally, the probe comprises a shell, the thermistor is arranged on the outer periphery of the shell, and the temperature measuring chip is accommodated in the shell.
Optionally, the electronic thermometer further comprises a host, and the probe and the host are connected in a magnetic attraction manner or in a buckling manner.
Optionally, the host includes a power supply, and the power supply is electrically connected to the probe to supply electric energy to the thermometer.
Optionally, the host computer includes the display screen, the display screen with power supply spare electric connection, the display screen is in order to be used for showing the temperature value of measured object.
Optionally, the host includes a key electrically connected to the power supply device for controlling the host to be turned on or off.
Optionally, the temperature measurement chip further comprises a resistance value calibration module, and the resistance value calibration module is used for correcting the positive and negative deviation values of the thermistor.
In a second aspect, an embodiment of the present application provides a temperature measuring method applied to an electronic thermometer, including the following steps:
acquiring temperature data of a measured object in a first time period, wherein the first time period is a time interval when the electronic thermometer is in contact with the measured object;
comparing the similarity between the temperature data and the plurality of groups of temperature change curves;
determining one of the multiple groups of temperature change curves as a corresponding temperature change curve;
and outputting the highest temperature value in the corresponding temperature change curve.
Optionally, before acquiring the temperature data of the measured object in the first time period, the method further includes: and calibrating the positive and negative deviation values of the temperature change curve according to a preset algorithm.
Optionally, the starting point of the time interval is 5s to 20s when the object to be measured is in contact with the electronic thermometer.
Compared with the prior art, the technical scheme provided by the embodiment of the application has the following advantages:
the electronic clinical thermometer that this application embodiment provided includes: the temperature measuring device comprises a thermistor and a temperature measuring chip, wherein the thermistor is electrically connected with the temperature measuring chip; the thermistor is used for detecting temperature data in a first time period, and the first time period is a time interval when the thermistor is contacted with a detected object; and a plurality of groups of temperature change curves are stored in the temperature measurement chip, so that the corresponding temperature change curves are matched according to the temperature data in the first time period, and the corresponding highest temperature value on the temperature change curves is output. Therefore, a plurality of groups of temperature change curves are stored in the temperature measurement chip, and the temperature change curves consistent with the temperature data are searched by comparing the temperature change curves with the temperature data, so that the highest temperature value in the temperature change curves is obtained. Thereby reducing the time required by the electronic thermometer and improving the use efficiency.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a schematic structural diagram of an electronic thermometer provided in an embodiment of the present application;
fig. 2 is an exploded view of an electronic thermometer according to an embodiment of the present disclosure;
FIG. 3 is a flowchart of a temperature measurement method provided by an embodiment of the present application;
FIG. 4 is another flow chart of a temperature measurement method provided by an embodiment of the present application;
fig. 5 is a graph of temperature change provided in the embodiments of the present application.
Reference numerals:
100. an electronic thermometer; 110. a probe; 120. a host;
111. a thermistor; 112. a housing;
121. a display screen; 122. pressing a key; 123. a housing; 124. an electrical contact; 125. and (4) magnetic attraction points.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1 and 2, an electronic thermometer 100 provided by an embodiment of the present application includes: the thermistor 111 and a temperature measuring chip (not shown), and the thermistor 111 is electrically connected with the temperature measuring chip; the thermistor 111 is used for detecting temperature data in a first time period, wherein the first time period is a time interval when the thermistor 111 is in contact with a detected object; the temperature measuring chip is internally stored with a plurality of groups of temperature change curves so as to be used for matching the corresponding temperature change curves according to the temperature data in the first time period and outputting the highest temperature value on the corresponding temperature change curves. Therefore, a plurality of groups of temperature change curves are stored in the temperature measurement chip, the temperature change curves consistent with the temperature data are searched by comparing the temperature change curves with the temperature data, and the highest temperature value in the corresponding temperature change curves is obtained. Thereby reducing the time required for the electronic thermometer 100 and improving the use efficiency.
The electronic thermometer 100 includes a host 120 and a probe 110. The probe 110 includes a thermistor 111, a temperature measuring chip, and a case 112. The thermistor 111 is disposed on the outer peripheral side of the case 112, and the temperature measuring chip is accommodated in the case 112.
The host computer 120 includes a housing 123, a power supply unit, a display screen 121, and keys 122. The power supply is accommodated in the housing 123, the display screen 121 is disposed on the outer periphery of the housing 123, and the button 122 is disposed at an end of the housing 123 away from the probe 110. The power supply is electrically connected to the probe 110 for providing power to the probe 110. The display screen 121 is electrically connected with the power supply part, and the display screen 121 is used for displaying the highest temperature value of the measured object. The key 122 is electrically connected to the power device for controlling the host 120 to turn on or off. Thus, the host 120 integrates the functions of power supply, display, analysis, interpretation and operation control.
The probe 110 is electrically connected to the host 120, and transmits the temperature data to the host 120 for analysis and interpretation; when the probe 110 contacts with the object to be measured, under the stimulation of the heat source, the resistance change data of the thermistor 111 is immediately transmitted to the host computer 120, and is quickly matched with the temperature change curve in the temperature measurement chip, the temperature change curve with the consistent trend is found for locking, and the highest temperature value of the object to be measured can be calculated without waiting for a long time.
When the probe 110 contacts the object to be tested, the thermistor 111 has a certain resistance value, the resistance value of the thermistor 111 changes, and the voltage output by the host computer 120 is constant. Therefore, the measured current changes in a reverse consistent manner with the resistance value, the resistance value is reversely deduced to change according to the measured current value, and finally the temperature is measured. The higher the temperature of the measured object is, the smaller the resistance value is, the larger the generated current is, and the corresponding temperature value is calculated.
Under the influence of a specific temperature, the temperature rise process of the thermistor 111 follows a curve with a specific rule, and temperature rise curves with different rules are presented at different temperatures. The temperature change curves have the common characteristic that the initial temperature rise stage rises quickly, and the generation trend of the temperature rise curve can be basically presented within a few seconds. Namely, the higher the temperature of the measured object is, the faster the resistance value changes, and the sharper the change trend is shown.
Therefore, the highest temperature value of the measured object can be judged in advance by reading the temperature data of the previous seconds and shortening the original time of several minutes to several seconds, so that the time is greatly saved, and the use efficiency is improved.
The thermistor 111 is provided with a columnar structure or a rod-shaped structure, so that the electronic thermometer 100 can be clamped under the armpit of a human body or held in the mouth for temperature measurement.
The probe 110 has a resistance calibration function, and the temperature measurement chip includes a resistance calibration module having a function of calibrating the resistance of the thermistor, so as to calibrate the positive and negative deviation values of the thermistor 111. The temperature measurement chip is responsible for collecting temperature data and matching with the temperature change curve, so that a result is obtained quickly.
Each thermistor 111 is processed so that there is a positive or negative deviation in resistance value. Therefore, before the electronic thermometer 100 is assembled, the resistance calibration module on the temperature measurement chip of the probe 110 needs to calibrate the resistance value once. For example, the preset standard of the electronic thermometer 100 is 5 Ω resistor, and the actual production is 5.2 Ω resistor, and then the resistance value calibration module on the temperature measurement chip should subtract 0.2 Ω resistor from the deviation as the initial resistance value.
The problem of positive and negative deviations in the resistance values of the probes 110 themselves is solved by an algorithm, so that the resistance-thermal-change effect of each probe 110 is consistent. Even if the probe 110 is replaced every time, the measured data can be ensured to have no deviation.
The resistance calibration module performs calculation calibration by using an algorithm, wherein the algorithm is that voltage is divided by resistance to be equal to current. That is, the voltage output from the host computer 120 is a constant value, the initial resistance value of the thermistor 111 is also a constant value, the resistance value changes under the influence of the temperature of the object to be measured, the measured and calculated current also changes, and when the temperature rises to the highest temperature point (which is consistent with the temperature of the object to be measured), the resistance value does not change any more, and the current is determined. And the equivalent temperature value is converted by the current value at the moment.
It should be noted that, the time required for the temperature of the thermistor 111 to rise to be consistent with the temperature of the measured object is relatively long, so that by using the electronic thermometer 100 provided by the embodiment of the present application, a plurality of sets of current change trend data under the influence of temperature change curves (the temperature condition is accurate to one bit after the decimal point) are stored in the temperature measurement chip, and when the actually measured temperature data is matched with one of the prestored temperature change curves, the corresponding highest temperature value can be directly derived. Thereby reducing the time required for the electronic thermometer 100 and improving the use efficiency.
The probe 110 is detachably connected to the host 120. When the measured object is replaced each time, the temperature can be measured quickly only by replacing the new probe 110, and the temperature measurement can be carried out without waiting for returning to normal temperature like the traditional thermometer. And the disposable probe 110 is also more hygienic and does not have the problem of cross-infection. The detachable connection mode comprises magnetic attraction connection or buckling connection.
The probe 110 is magnetically connected to the main body 120, so that the probe 110 can be removed and replaced after each use. The magnetic attraction point 125 is arranged on one side of the host machine 120 close to the probe 110, the magnetic attraction point 125 is a magnetic iron disc, the magnetic attraction point 125 is also arranged on one side of the probe 110 close to the host machine 120, and the two magnetic attraction points 125 are aligned and attracted, so that the host machine 120 and the probe 110 are detachably connected. The temperature measuring time of the electronic thermometer 100 is shortened, and the use efficiency of the electronic thermometer 100 is improved.
Referring to fig. 3, an embodiment of the present application provides a temperature measurement method applied to an electronic thermometer 100, including the following steps:
acquiring temperature data of a measured object in a first time period, wherein the first time period is a time interval when the electronic thermometer 100 is in contact with the measured object;
comparing the similarity between the temperature data and the multiple groups of temperature change curves;
determining one of the multiple groups of temperature change curves as a corresponding temperature change curve;
and outputting the highest temperature value in the corresponding temperature change curve.
Therefore, by using the temperature measuring method provided by the embodiment of the application, the temperature data of the measured object in the first time period is obtained, the temperature data is matched with the multiple groups of temperature change curves, one group of the multiple groups of temperature change curves is determined to be the corresponding temperature change curve, and the highest temperature value of the determined temperature change curve is output. The time required by temperature measurement is shortened, and the use efficiency is improved.
Referring to fig. 4, before acquiring the temperature data of the measured object in the first time period, the method further includes: and calibrating the positive and negative deviation values of the temperature change curve according to a preset algorithm.
Since the resistance of the thermistor 111 has a certain error, the calibration of the positive and negative deviation values of the preset temperature variation curve is required. Thereby ensuring that the temperature does not cause too large a deviation after the probe 110 is replaced. The temperature measuring time of the electronic thermometer 100 is shortened, and the use efficiency of the electronic thermometer 100 is improved.
The starting point of the time interval is 5s to 20s for the subject to be tested to contact the electronic thermometer 100. The electronic thermometer 100 does not need to contact the object to be measured until the temperature value of the thermistor 111 is stable, and only needs to be within the first few seconds, for example, within 5s to 20s, of the object to be measured contacting the electronic thermometer 100. And acquiring temperature data of the first time period, namely matching with a plurality of groups of temperature change curves. Thereby measuring the temperature fast and improving the use efficiency.
Of course, the starting point of the time interval may be set within 10s to 15s of the contact of the object to be measured with the electronic thermometer 100. Therefore, the measured temperature data is perfect and the fluctuation is not large, and the temperature data is convenient to match with a temperature change curve.
Referring to FIG. 5, a plurality of sets of current trend data under the influence of temperature, such as W1/W2/W3/W4, are stored in the temperature measuring chip, and the unit is accurate to one bit after decimal point. The object to be measured is a human body. When carrying out the temperature measurement with electrothermometer 100 and testee, when probe 110 contact is surveyed, probe 110 receives the heat source influence, the resistance value begins to diminish, the electric current crescent, the change of several seconds is very fast very steep before, consequently as long as catch several seconds's current change data before, can match with the data set that the temperature measurement chip prestores, the identical heat source temperature that can calculate of first half section, need not to wait for and rise to the maximum temperature value, great reduction test time, the temperature measurement efficiency has been improved.
It is noted that, in this document, relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The foregoing are merely exemplary embodiments of the present invention, which enable those skilled in the art to understand or practice the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. An electronic thermometer, comprising: the temperature measuring device comprises a thermistor and a temperature measuring chip, wherein the thermistor is electrically connected with the temperature measuring chip;
the thermistor is used for detecting temperature data in a first time period, and the first time period is a time interval when the thermistor is contacted with a detected object;
and a plurality of groups of temperature change curves are stored in the temperature measurement chip, so that the corresponding temperature change curves are matched according to the temperature data in the first time period, and the corresponding highest temperature value on the temperature change curves is output.
2. The electronic thermometer of claim 1, wherein the electronic thermometer comprises a probe, wherein the probe comprises a housing, wherein the thermistor is arranged on an outer peripheral side of the housing, and wherein the temperature measuring chip is accommodated in the housing.
3. The electronic thermometer of claim 2 further comprising a host, wherein the probe and the host are magnetically or snap-fit connected.
4. The electronic thermometer of claim 3, wherein the host includes a power supply, the power supply being electrically connected to the probe for providing power to the thermometer.
5. The electronic thermometer of claim 4, wherein the host comprises a display screen, the display screen is electrically connected to the power supply, and the display screen is used for displaying the temperature value of the object to be measured.
6. The electronic thermometer of claim 4, wherein the main body comprises a button, and the button is electrically connected to the power supply device for controlling the main body to be turned on or off.
7. The electronic thermometer of claim 1, wherein the temperature measuring chip further comprises a resistance value calibration module, and the resistance value calibration module is used for correcting the positive and negative deviation values of the thermistor.
8. A temperature measuring method is applied to an electronic thermometer and is characterized by comprising the following steps:
acquiring temperature data of a measured object in a first time period, wherein the first time period is a time interval when the electronic thermometer is in contact with the measured object;
comparing the similarity between the temperature data and the plurality of groups of temperature change curves;
determining one of the multiple groups of temperature change curves as a corresponding temperature change curve;
and outputting the highest temperature value in the corresponding temperature change curve.
9. The method of claim 8, wherein the obtaining temperature data of the object under test over the first time period further comprises: and calibrating the positive and negative deviation values of the temperature change curve according to a preset algorithm.
10. The temperature measuring method according to claim 8, wherein the starting point of the time interval is 5s to 20s when the object is in contact with the electronic thermometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111160551.0A CN113720489A (en) | 2021-09-30 | 2021-09-30 | Electronic thermometer and temperature measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111160551.0A CN113720489A (en) | 2021-09-30 | 2021-09-30 | Electronic thermometer and temperature measuring method |
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| Publication Number | Publication Date |
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| CN113720489A true CN113720489A (en) | 2021-11-30 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202111160551.0A Pending CN113720489A (en) | 2021-09-30 | 2021-09-30 | Electronic thermometer and temperature measuring method |
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| CN (1) | CN113720489A (en) |
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- 2021-09-30 CN CN202111160551.0A patent/CN113720489A/en active Pending
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Address after: 410329 No. 2588, Jinyang Avenue, Liuyang Economic Development Zone (high tech Zone), Changsha City, Hunan Province Applicant after: Hunan Xinnuo Technology Group Co.,Ltd. Address before: 410329 room 404, building 3, science and technology entrepreneurship center, No. 125, Kangtian Road, Liuyang economic and Technological Development Zone, Changsha City, Hunan Province Applicant before: Hunan xinnuozhi Medical Instrument Co.,Ltd. |