CN113671262B - Capacitance value measuring method under high-voltage environment - Google Patents
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- CN113671262B CN113671262B CN202111238257.7A CN202111238257A CN113671262B CN 113671262 B CN113671262 B CN 113671262B CN 202111238257 A CN202111238257 A CN 202111238257A CN 113671262 B CN113671262 B CN 113671262B
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Abstract
The invention provides a capacitance value measuring method under a high-voltage environment, which belongs to the technical field of capacitance measurement, and comprises the steps of firstly obtaining parameters of the high-voltage environment where a capacitor to be measured is located, and constructing a voltage and current measuring circuit of a loop formed by connecting a high-voltage direct-current bias unit, a high-frequency voltage transformation unit and a discharge unit connected with the capacitor to be measured in parallel in series; accessing a voltage and current measuring circuit by taking an adjustable capacitor as a capacitor to be measured to obtain a reference working curve; switching off a discharge unit after a capacitor to be tested is connected, starting a high-voltage direct-current voltage-stabilized power supply to high-voltage output, starting a high-frequency voltage transformation unit to measure the voltage and current of a primary side, switching off the high-voltage direct-current voltage-stabilized power supply and the high-frequency voltage transformation unit, and switching on the discharge unit; and searching for an optional capacitance value in the reference working curve according to the voltage and the current corresponding to the capacitor to be detected, wherein the optional capacitance value is used as the capacitance value of the capacitor to be detected in the high-voltage environment. The invention ensures that the working state of the circuit is consistent when the reference working curve is obtained and the capacitance to be measured is measured, and realizes the high-precision capacitance value measurement of the capacitor under the high-voltage environment.
Description
Technical Field
The invention belongs to the technical field of capacitance measurement, and particularly relates to a capacitance value measurement method in a high-voltage environment.
Background
The high-voltage capacitor has wide application in ignition, X-ray, large-scale transformer substation and other equipment. In a high-voltage environment of 1.5-20 kV, the capacitance value of the capacitor can change. Due to the lack of an effective capacitance value measuring method in a high-voltage environment, the capacitance value is often used as a constant in the current circuit design, so that circuit parameter deviation is large and calibration is difficult. The conventional capacitance value measuring instrument mainly performs measurement in a low-voltage environment, such as an LCR tester, a capacitance bridge tester, and the like. Although the LCR tester can guarantee higher measurement accuracy, the equipment is large in size and complex in operation, the maximum voltage which can be provided by measurement is 2V, and the test requirement of thousands of volts in a high-voltage environment cannot be met. The capacitance bridge tester is fast and convenient to apply, stable in performance and high in measurement accuracy, but the maximum voltage which can be provided by measurement is 26V, and the actual test requirements cannot be met.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a capacitance value measuring method in a high-voltage environment, and a reference working curve is drawn by constructing a voltage and current measuring circuit of a capacitor, so that the capacitance value measurement in the high-voltage environment is realized.
The specific technical scheme of the invention is as follows:
a capacitance value measuring method under a high-voltage environment is characterized by comprising the following steps:
s1: obtaining a capacitance C to be measuredXParameters of the high-voltage environment comprise direct-current bias voltage, voltage amplitude and voltage frequency;
s2: constructing a voltage and current measuring circuit of a loop formed by connecting a high-voltage direct-current bias unit, a high-frequency voltage transformation unit and a discharge unit in series, and connecting a capacitor C to be measuredXConnected in parallel with the discharge unit for measuring the capacitance C to be measuredXThe voltage and the current of the primary side of the corresponding high-frequency transformation unit;
the high-voltage direct-current bias unit comprises a high-voltage direct-current voltage-stabilizing power supply, a resistor R and a capacitor C which are connected in series to form a loop, and two ends of the capacitor C are used as connection points with a voltage and current measuring circuit and are used for measuring the capacitance C to be measuredXProviding a bias voltage; the high-voltage direct-current stabilized power supply provides voltage according to the direct-current bias voltage obtained in the step S1;
the high-frequency transformation unit is used as the capacitor C to be tested according to the voltage amplitude and the voltage frequency obtained by S1XApplying an alternating voltage and measuring the voltage and current of the primary side;
the discharge unit is used for measuring the capacitance CXCarrying out intermittent discharge;
s3: will be a tunable capacitor CTAs the capacitor C to be measuredXThe method comprises the following specific processes of accessing a voltage and current measuring circuit to obtain a reference working curve:
s3.1: to measure the capacitance CXRespectively as the adjustable capacitor CTThe upper limit and the lower limit of the capacitance value of (C), N selectable capacitance values C are setiI =1,2, …, N, wherein N ≧ 3;
s3.2: let sequence number i = 1;
S3.3: will be a tunable capacitor CTIs set to a selectable capacitance value Ci；
S3.4: the discharge unit is disconnected, the high-voltage direct-current stabilized voltage power supply is started and adjusted to preset low-voltage output to the adjustable capacitor CTThe voltage at the two ends is not changed any more; then starting the high-frequency voltage transformation unit, and measuring the voltage V of the primary side after the voltage and current measurement circuit is stabilizediAnd current Ii；
S3.5: turning off the high-voltage DC stabilized voltage power supply and the high-frequency voltage transformation unit, turning on the discharge unit, and adjusting the capacitance of the adjustable capacitor CTDischarging;
s3.6: judging whether i < N, if yes, entering step S3.7; otherwise, entering step S3.8;
s3.7: let i = i +1, return to step S3.3;
s3.8: according to the adjustable capacitor C in a three-dimensional coordinate systemTN selectable capacitance values CiCorresponding voltage ViAnd current IiDrawing to obtain a reference working curve;
s4: the capacitor C to be measuredXConnecting a voltage and current measuring circuit, disconnecting the discharge unit, starting the high-voltage direct-current stabilized voltage power supply, regulating the high-voltage direct-current stabilized voltage power supply to high-voltage output, and sending the high-voltage direct-current stabilized voltage power supply to the capacitor C to be measuredXThe voltage at the two ends is not changed any more; then starting the high-frequency voltage transformation unit, and measuring the voltage V 'and the current I' of the primary side after the voltage and current measurement circuit is stabilized; then the high-voltage direct-current voltage-stabilized power supply and the high-frequency voltage transformation unit are turned off, the discharge unit is turned on, and the capacitor C to be measured is subjected to voltage transformationXDischarging;
s5: according to the capacitance C to be measuredXThe corresponding voltage V 'and current I' are used to search the corresponding selectable capacitance value in the reference working curve obtained in step S3, and the value is used as the capacitor C to be measuredXA capacitance value in a high-pressure environment.
Further, the high-frequency transformation unit comprises a voltmeter, a high-frequency power supply, a high-frequency transformer T and an ammeter, wherein the high-frequency power supply, the high-frequency transformer T and the ammeter are connected in series to form a loop, the voltmeter and the ammeter are respectively used for measuring voltage and current of a primary side, and two ends of the high-frequency transformer T are used as connection points of the high-frequency transformer T and the voltage and current measurement circuit.
Further onThe resistor R and the capacitor C in the HVDC bias unit form a low-pass filter with a cut-off frequency fCThe output frequency f of the high-frequency power supply in the high-frequency voltage transformation unit is not more than one tenth of the output frequency f of the high-frequency power supply in the high-frequency voltage transformation unit, so that the output of the high-frequency power supply is prevented from influencing the high-voltage direct-current stabilized power supply.
Further, the capacitance value of the capacitor C is not lower than that of the capacitor C to be measuredXThe capacitance value of the capacitor C is 1000 times, so that the capacitive reactance of the capacitor C is prevented from influencing the measurement result, and the measurement precision is improved.
Further, the value of the preset low voltage in S3.4 is determined according to the adjustable capacitor CTThe upper limit and the lower limit of the capacitance value are determined so as to ensure that the adjustable capacitor C is ensured after the high-voltage direct-current voltage-stabilized power supply is startedTOptional capacitance value C ofiAnd is not changed.
Further, the discharge unit comprises a switch K and a discharge resistor R which are connected in seriesL。
The invention has the beneficial effects that:
1. the invention provides a capacitance value measuring method under a high-voltage environment, which adopts a high-voltage direct-current stabilized voltage power supply as a capacitor C to be measuredXProviding working voltage to ensure the capacitor C to be testedXThe working state of the device is consistent with the actual high-pressure environment; adopting a high-frequency transformer T as a capacitor C to be measuredXAlternating voltage disturbance is injected, high-voltage isolation is realized, and conditions are created for the use of a high-precision low-voltage measuring instrument;
2. in measuring the capacitance C to be measuredXAnd a tunable capacitor CTWhen the voltage and the current are in the high-voltage direct-current stabilized voltage supply, the charging and discharging current in the loop is zero after the high-voltage direct-current stabilized voltage supply is started, so that the high-frequency transformer T (the working state of the high-frequency transformer T is mainly influenced by the current and the frequency) obtains a reference working curve and measures the capacitor C to be measuredXThe working states are consistent, so that the transmission of high-precision measurement reference is ensured;
3. preferably, the capacitance value of the capacitor C required by the invention is far greater than that of the capacitor C to be measuredXThe capacitance value of the capacitor C can effectively avoid the influence of the capacitance value of the capacitor C caused by a high-voltage environment, so that the working state of the capacitor C under the high-voltage environment is approximately consistent with that under a low-voltage environment when a reference working curve is obtained,the working state of the high-frequency transformer T is not influenced by voltage, so that the capacitor C to be tested in a high-voltage environment is ensuredXOperating conditions in the test circuit, and adjustable capacitors C in low-voltage environmentsTThe working states in the test circuit are consistent, so that the accuracy of the capacitance value measurement result of the capacitor is improved.
Drawings
Fig. 1 is a flowchart of a capacitance value measuring method in a high-voltage environment according to embodiment 1 of the present invention;
fig. 2 is a structural diagram of a voltage-current measuring circuit according to embodiment 1 of the present invention;
fig. 3 is a specific structural diagram of a voltage-current measuring circuit according to embodiment 1 of the present invention;
fig. 4 is a flowchart of acquiring a reference working curve in embodiment 1 of the present invention;
fig. 5 is a reference operating curve obtained in example 1 of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be further described with reference to the following embodiments and the accompanying drawings.
The following non-limiting examples are presented to enable those of ordinary skill in the art to more fully understand the present invention and are not intended to limit the invention in any way.
Example 1
The present embodiment provides a method for measuring a capacitance value of a capacitor in a high-voltage environment, where the process is shown in fig. 1, and the method includes the following steps:
s1: acquiring capacitor C to be measured by voltmeter and oscilloscopeXParameters of the high-voltage environment comprise direct-current bias voltage, voltage amplitude and voltage frequency;
s2: constructing a voltage and current measuring circuit which is shown in figure 2 and is formed by connecting a high-voltage direct-current bias unit, a high-frequency transformation unit and a discharge unit in series into a loop, and connecting a capacitor C to be measuredXConnected in parallel with the discharge unit for measuring the capacitance C to be measuredXThe voltage and the current of the primary side of the corresponding high-frequency transformation unit; in which, as shown in figure 3,
said heightThe voltage-direct current bias unit comprises a high-voltage direct-current voltage-stabilized power supply, a resistor R and a capacitor C which are connected in series to form a loop, and two ends of the capacitor C are used as connection points with a voltage and current measuring circuit and are used for measuring the capacitance C to be measuredxProviding a bias voltage; the high-voltage direct-current stabilized power supply provides voltage according to the direct-current bias voltage obtained in the step S1;
the high-frequency transformation unit comprises a voltmeter, a high-frequency power supply, a high-frequency transformer T and an ammeter, wherein the high-frequency power supply, the high-frequency transformer T and the ammeter are connected in series to form a loop; the high-frequency voltage transformation unit is used as the capacitor C to be tested according to the voltage amplitude and the voltage frequency obtained by the S1XApplying alternating voltage, and measuring the voltage and the current of a primary side through a voltmeter and an ammeter respectively;
the discharge unit comprises a switch K and a discharge resistor R which are connected in seriesLAnd respectively with a switch K and a discharge resistor RLThe other end of the voltage measuring circuit is a connection point with a voltage and current measuring circuit and is used for measuring the capacitance C to be measuredXCarrying out intermittent discharge;
wherein the high-voltage direct current bias unit provides at least one kilovolt; the resistor R and the capacitor C in the high-voltage direct-current bias unit form a low-pass filter with cut-off frequency fCThe value of = 1/(2 pi RC) is not more than one tenth of the output frequency f of the high-frequency power supply in the high-frequency voltage transformation unit, so that the output of the high-frequency power supply is prevented from influencing the high-voltage direct-current stabilized power supply; the capacitance value of the capacitor C is not lower than that of the capacitor C to be measuredXThe capacitance value of the capacitor C is 1000 times, so that the capacitive reactance of the capacitor C is prevented from influencing the measurement result, and the measurement precision is improved; on the premise of meeting the measurement precision, the relative positions of the current meter and the voltmeter are flexibly configured; the working state of the high-frequency transformer T is mainly influenced by current and frequency, and the high-frequency transformer T is used as a capacitor C to be measuredxAlternating voltage disturbance is injected to realize high-voltage isolation, so that the influence of a high-voltage loop on measuring circuits such as a high-frequency power supply, a current meter and a voltmeter is prevented, and conditions are created for the use of a high-precision low-voltage measuring instrument;
s3: will be a tunable capacitor CTAs the capacitor C to be measuredXAccess voltage current measuring circuit, obtainReferring to the working curve, as shown in fig. 4, the specific process is as follows:
s3.1: to measure the capacitance CXRespectively as the adjustable capacitor CTThe upper limit and the lower limit of the capacitance value of (C), N selectable capacitance values C are setiI =1,2, …, N, wherein N ≧ 3;
s3.2: let sequence number i = 1;
s3.3: will be a tunable capacitor CTIs set to a selectable capacitance value Ci；
S3.4: the discharge unit is disconnected, the high-voltage direct-current stabilized voltage power supply is started and adjusted to preset low-voltage output to the adjustable capacitor CTThe voltage at the two ends is not changed any more; then starting the high-frequency voltage transformation unit, and measuring the voltage V of the primary side after the voltage and current measurement circuit is stabilizediAnd current Ii(ii) a Wherein the value of the preset low voltage is determined according to the adjustable capacitor CTThe upper limit and the lower limit of the capacitance value are determined so as to ensure that the adjustable capacitor C is ensured after the high-voltage direct-current voltage-stabilized power supply is startedTOptional capacitance value C ofiThe change is not changed;
s3.5: turning off the high-voltage DC stabilized voltage power supply and the high-frequency voltage transformation unit, turning on the discharge unit, and adjusting the capacitance of the adjustable capacitor CTDischarging;
s3.6: judging whether i < N, if yes, entering step S3.7; otherwise, entering step S3.8;
s3.7: let i = i +1, return to step S3.3;
s3.8: according to the adjustable capacitor C in a three-dimensional coordinate systemTN selectable capacitance values CiCorresponding voltage ViAnd current IiDrawing to obtain a reference working curve, as shown in FIG. 5;
s4: obtaining a capacitance C to be measuredXCorresponding voltage current: the capacitor C to be measuredXConnecting a voltage and current measuring circuit, disconnecting the discharge unit, starting the high-voltage direct-current stabilized voltage power supply, regulating the high-voltage direct-current stabilized voltage power supply to high-voltage output, and sending the high-voltage direct-current stabilized voltage power supply to the capacitor C to be measuredXThe voltage at the two ends is not changed any more; then starting the high-frequency voltage transformation unit, and measuring the voltage V 'and the current I' of the primary side after the voltage and current measurement circuit is stabilized; then the high voltage direct current is turned offA piezoelectric power supply and a high-frequency voltage transformation unit, a discharge unit is connected to the capacitor C to be measuredXDischarging; wherein the high voltage is a dc bias voltage obtained according to S1;
s5: according to the capacitance C to be measuredXThe corresponding voltage V 'and current I' are used to search the corresponding selectable capacitance value in the reference working curve obtained in step S3, and the value is used as the capacitor C to be measuredXA capacitance value in a high-pressure environment.
Furthermore, the parameter configuration of the high-frequency transformers of the high-frequency transformation units in S3 and S4 is the same, so that the working states of the high-frequency transformers in the two processes are consistent, and the transmission of high-precision measurement references is ensured.
Further, in practical applications, equivalent impedance exists in circuit wires, components and the like in the voltage and current measuring circuit, and a small resistance can be necessarily added to meet the impedance requirement of the voltage and current measuring circuit.
Although illustrative embodiments of the present invention have been described above to facilitate the understanding of the present invention by those skilled in the art, it should be understood that the present invention is not limited to the scope of the embodiments, and various changes may be made apparent to those skilled in the art as long as they are within the spirit and scope of the present invention as defined and defined by the appended claims, and all matters of the invention which utilize the inventive concepts are protected.
Claims (6)
1. A capacitance value measuring method under a high-voltage environment is characterized by comprising the following steps:
s1: obtaining a capacitance C to be measuredXParameters of the high-voltage environment comprise direct-current bias voltage, voltage amplitude and voltage frequency;
s2: constructing a voltage and current measuring circuit of a loop formed by connecting a high-voltage direct-current bias unit, a high-frequency voltage transformation unit and a discharge unit in series, and connecting a capacitor C to be measuredXConnected in parallel with the discharge unit;
the high-voltage direct-current bias unit comprises a high-voltage direct-current voltage-stabilizing power supply, a resistor R and a capacitor C which are connected in series to form a loop, and the voltage and current are measured by taking the two ends of the capacitor C as the voltage and currentThe connection point of the measuring circuit is the capacitor C to be measuredXProviding a bias voltage;
the high-frequency voltage transformation unit is used as the capacitor C to be tested according to the voltage amplitude and the voltage frequencyXApplying an alternating voltage and measuring the voltage and current of the primary side;
the discharge unit is used for measuring the capacitance CXCarrying out intermittent discharge;
s3: will be a tunable capacitor CTAs the capacitor C to be measuredXThe method comprises the following specific processes of accessing a voltage and current measuring circuit to obtain a reference working curve:
s3.1: to measure the capacitance CXRespectively as the adjustable capacitor CTThe upper limit and the lower limit of the capacitance value of (C), N selectable capacitance values C are setiI =1,2, …, N, wherein N ≧ 3;
s3.2: let sequence number i = 1;
s3.3: will be a tunable capacitor CTIs set to a selectable capacitance value Ci；
S3.4: the discharge unit is disconnected, the high-voltage direct-current stabilized voltage power supply is started and adjusted to preset low-voltage output to the adjustable capacitor CTThe voltage at the two ends is not changed any more; then starting the high-frequency voltage transformation unit, and measuring the voltage V of the primary side after the voltage and current measurement circuit is stabilizediAnd current Ii；
S3.5: turning off the high-voltage DC stabilized voltage power supply and the high-frequency voltage transformation unit, turning on the discharge unit, and adjusting the capacitance of the adjustable capacitor CTDischarging;
s3.6: judging whether i < N, if yes, entering step S3.7; otherwise, entering step S3.8;
s3.7: let i = i +1, return to step S3.3;
s3.8: according to the adjustable capacitor C in a three-dimensional coordinate systemTN selectable capacitance values CiCorresponding voltage ViAnd current IiDrawing to obtain a reference working curve;
s4: the capacitor C to be measuredXConnecting in a voltage and current measuring circuit, disconnecting the discharge unit, starting the high-voltage DC stabilized power supply, regulating the high-voltage output according to the DC bias voltage, and outputtingCapacitor C to be measuredXThe voltage at the two ends is not changed any more; then starting the high-frequency voltage transformation unit, and measuring the voltage V 'and the current I' of the primary side after the voltage and current measurement circuit is stabilized; then the high-voltage direct-current voltage-stabilized power supply and the high-frequency voltage transformation unit are turned off, the discharge unit is turned on, and the capacitor C to be measured is subjected to voltage transformationXDischarging;
s5: according to the capacitance C to be measuredXCorresponding voltage V 'and current I' are searched in a reference working curve for corresponding selectable capacitance values to be used as the capacitor C to be measuredXA capacitance value in a high-pressure environment.
2. The method according to claim 1, wherein the high-frequency transforming unit comprises a voltmeter, and a high-frequency power supply, a high-frequency transformer T and an ammeter connected in series to form a loop, the voltmeter is connected in parallel with a primary side of the high-frequency transformer T, and two ends of a secondary side of the high-frequency transformer T are used as connection points with the voltage and current measuring circuit.
3. The method according to claim 2, wherein the resistor R and the capacitor C in the HVDC bias unit form a low-pass filter with a cut-off frequency fCNot exceeding one tenth of the output frequency f of the high frequency power supply.
4. The method according to claim 1, wherein the capacitance value of the capacitor C is not lower than that of the capacitor C to be measuredX1000 times the capacitance value of (c).
5. The method according to claim 1, wherein the discharge unit comprises a switch K and a discharge resistor R connected in seriesL。
6. The method for measuring capacitance and capacitance values in a high-voltage environment according to claim 1, wherein the value of the low voltage preset in S3.4 is determined according to the value of the adjustable capacitor CTIs determined to ensure thatAdjustable capacitor C after starting high-voltage direct-current voltage-stabilized power supplyTOptional capacitance value C ofiAnd is not changed.
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| CN101738544B (en) * | 2008-11-17 | 2012-08-22 | 瑞鼎科技股份有限公司 | Capacitance measurement circuit and capacitance measurement method |
| US8947107B2 (en) * | 2012-09-17 | 2015-02-03 | Semtech Corporation | Capacitance measurement of high voltage device |
| US10309997B2 (en) * | 2013-03-15 | 2019-06-04 | Infineon Technologies Ag | Apparatus and a method for generating a sensor signal indicating information on a capacitance of a variable capacitor comprising a variable capacitance |
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