CN1136534C - Display with self tester - Google Patents
Display with self tester Download PDFInfo
- Publication number
- CN1136534C CN1136534C CNB001064452A CN00106445A CN1136534C CN 1136534 C CN1136534 C CN 1136534C CN B001064452 A CNB001064452 A CN B001064452A CN 00106445 A CN00106445 A CN 00106445A CN 1136534 C CN1136534 C CN 1136534C
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- Prior art keywords
- display
- circuit
- signal
- image frame
- host computer
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Abstract
The present invention relates to a display with a self-testing circuit, which comprises a display screen, a display circuit, a connection device and a self-testing circuit, wherein the self-testing circuit electrically connected to the input end of the display circuit comprises a test signal generator, a switching circuit and a testing circuit, wherein the switching circuit is electrically connected between the output end of the test signal generator and the input end of the display circuit, and the testing circuit electrically connected to the control end of the switching circuit is used for detecting whether image signals are transmitted to a computer host or not; when the image signals are detected, the switching circuit is switched off, so the test signal can not be output to the input end of the display circuit; when the image signals are not detected, the switching circuit is switched on to cause the test signal to be transmitted into the display circuit.
Description
Technical field
The present invention relates to a kind of method that produces image frame, particularly relate to one and have the method that produces image frame in the display of self-test circuit with H-BLANK signal imitation image frame signal.
Background technology
Known display is to utilize its screen display (On Screen Display) function and a microcontroller (micro-controller) to carry out selftest.When the user wants to know that its display whether can normal operation, the user can be not attached to this display one host computer, if display can successfully show a signal, as " no signal ", with the image frame signal of representing that it does not receive this host computer and is transmitted, represent that then this display can normal operation.
When this display is not connected in this host computer, the microcontroller of this display just can't receive the image frame signal that transmits from this host computer, therefore this microcontroller can start the screen display function of this display, to show a signal on screen, as " no signal ".If this display can successfully show this signal, represent that then this display can normal operation.Otherwise, then represent this display fault.
Yet some display does not have screen display function or microcontroller, therefore can't carry out selftest.That is to say, just not have the function of selftest if a display does not have screen display function and microcontroller simultaneously.
Summary of the invention
Therefore, fundamental purpose of the present invention is to provide a kind of in the method that produces image frame in not needing to include the display with self-test circuit of function that screen display function or microcontroller can reach selftest with H-BLANK signal imitation image frame signal.
The invention provides a kind of method that in a display, produces image frame with H-BLANK signal imitation image frame signal, this display includes a display screen, be used for the show image picture, one display circuit, be used for converting the image frame signal that a host computer is transmitted to corresponding horizontal image scan line in regular turn, when this display circuit and foundation one H-BLANK signal are shown in a horizontal image scan line on this display screen with decision, so that a plurality of horizontal image scan lines are formed a corresponding image frame; Whether it is characterized in that this method includes the following step: detecting this host computer has signal to transmit, with judge this display whether with this host computer line; And, this display circuit is suitably adjusted and inputed to the amplitude of this H-BLANK signal when this display during not with this host computer line, to simulate the image frame signal that this host computer transmitted and to produce corresponding image frame.
Description of drawings
The present invention will be described hereinbelow in detail with reference to the accompanying drawings in conjunction with the embodiments.
Fig. 1 is the functional-block diagram of display of the present invention;
Fig. 2 is the synoptic diagram of coupling arrangement and pin definition thereof;
Fig. 3 is the synoptic diagram of Fig. 1 self-test circuit;
Fig. 4 is H-BLANK signal and the full synoptic diagram of image frame signal in vain;
Fig. 5 produces the process flow diagram of image frame with H-BLANK signal imitation image frame signal for the present invention.
Embodiment
Please refer to Fig. 1.Fig. 1 is the functional-block diagram of display 10 of the present invention.Display 10 includes a display screen 12, be used for the show image picture, one display circuit 14, be used for converting the image frame signal that a host computer 16 is transmitted to corresponding horizontal image scan line in regular turn, to form a corresponding image frame and it be shown on the display screen 12, one self-test circuit 20, be electrically connected on the input end of display circuit 14, be used for carrying out the function of selftest, an and coupling arrangement 18, be electrically connected on the input end of self-test circuit 20, be used for receiving the image frame signal that host computer 16 is transmitted.And display circuit 14 is when horizontal scan period prepare to show the horizontal image scan line of each bar, must decide according to a H-BLANK signal when just this horizontal image scan line can be shown on the display screen 12, so that a plurality of horizontal image scan lines are formed a corresponding image frame.
Please refer to Fig. 2.Fig. 2 is the synoptic diagram of coupling arrangement 18 and pin definition thereof.Coupling arrangement 18 of the present invention can be a D15 connector, and wherein the definition of 15 pins is as shown in scheming.The image frame signal that host computer 16 is transmitted is an IBM VGA signal, and it contains an EPS1 subsignal, and coupling arrangement 18 is the EPS1 pin of shown the 5th pin of Fig. 2 corresponding to the pin of this EPS1 subsignal.
Please refer to Fig. 3.Fig. 3 is the synoptic diagram of Fig. 1 self-test circuit 20.Self-test circuit 20 includes a test signal generator 22, be used for producing the test signal that to test display 10, one on-off circuit 24, be electrically connected between the input end of the output terminal of test signal generator 22 and display circuit 14, be used for controlling the output of this test signal, and a testing circuit 26, be electrically connected on the control end 32 of on-off circuit 24, be used for detecting host computer 16 and whether transmit the image frame signal, with the unlatching of gauge tap circuit 24 or close.
When testing circuit 26 detects the image frame signal (IBM VGA signal) that host computer 16 transmitted, testing circuit 26 can off switch circuit 24, make test signal that test signal generator 22 produced can't export the input end of display circuit 14 via on-off circuit 24 to.The image frame signal input display circuit 14 that coupling arrangement 18 can be transmitted host computer 16, and display circuit 14 can become an image frame with this image frame conversion of signals, and it is shown on the display screen 12.
When testing circuit 26 detects the image frame signal that is transmitted less than host computer 16, testing circuit 26 can be opened on-off circuit 24, make the test signal that test signal generator 22 produced to import display circuit 14 into via on-off circuit 24, and display circuit 14 can convert this test signal to a test pictures, and it is shown on the display screen 12.For example, when this test pictures presents a complete white picture (full-white picture), represent that promptly display 10 can normal operation.Otherwise, then represent display 10 faults.
Because one of purpose of the present invention is to make the display that does not possess screen display function or microcontroller, also can reach the function of selftest.For example when display passes through test, picture can present a complete white picture to inform that user or tester's display can normal operations, that is to say that needing a test signal among the present invention can demonstrate the full effect of picture in vain that similar complete white image frame signal can demonstrate via display.Yet, display of the present invention when carrying out selftest and host computer 16 are the states that are in off-line (off-line), therefore, this can not be to come from host computer 16 once the test signal that can demonstrate complete white picture, and must be the display 10 inner survivors that produce.And because a control signal H-BLANK signal that is used for controlling display circuit 14 in the display 10 just and can demonstrate the complete white image frame signal similar of complete white picture, therefore can utilize this ready-made H-BLANK signal to be used as test signal required for the present invention.
Please refer to Fig. 4.Fig. 4 is H-BLANK signal and the full synoptic diagram of image frame signal in vain.H-BLANK signal 25 for display 10 in horizontal scan period when be used to refer to can the show image picture control signal, amplitude between its crest and crest is about 5 volts, work period is about 83%～90%, and complete white image frame signal 27 its crest and the amplitude between crest are about 0.7 volt, work period, (Duty Cycle) was about 75%～80%, and the waveform of the waveform of H-BLANK signal 23 and complete white image frame signal 27 is quite similar as seen from Figure 4.Because the difference of work period can't influence the operation of self-test circuit 20, the amplitude of H-BLANK signal 23 then can be dwindled or adjust to the difference of amplitude in simple electric resistance partial pressure mode, therefore, can utilize this ready-made H-BLANK signal to be used as test signal required for the present invention, show that when display 10 passes through test a complete white picture is on display screen 12.That is to say that the present invention can utilize H-BLANK signal 23 to simulate image frame signals such as R1, G1, B1, CLAMP, comes to export to respectively or simultaneously display circuit 14.If display 10 can normal operation, then as R1, G1 that this test signal produced, when image frame signals such as B1, CLAMP export display circuit 14 to separately respectively, display screen then can the corresponding picture that produces R, G, B, and R1, G1, the image frame signals such as B1, CLAMP of working as simulation export display circuit 14 simultaneously to, on display screen 12, present a complete white picture (full-white picture), embodiments of the invention are to be that example is illustrated with the latter, so not as limit.
As shown in Figure 3, the testing circuit 26 of self-test circuit 20 includes a first transistor 28, and a transistor seconds 30.On-off circuit 24 includes one the 3rd transistor 32 to form a control end.When coupling arrangement 18 was connected with host computer 16, the EPS1 pin 25 of coupling arrangement 18 can present ground state (grounded).Because EPS1 pin 25 is connected in the base stage of the first transistor 28, therefore when EPS1 pin 25 presented ground state, the base stage of the first transistor 28 can be an electronegative potential, made the first transistor 28 conductings.Because the first transistor 28 is connected in the base stage of transistor seconds 30, therefore when the first transistor 28 conductings, the base stage of transistor seconds 30 can be a noble potential, makes that transistor seconds 30 can't conducting.Therefore, the 3rd transistor 32 of on-off circuit 24 can conducting yet, makes that power supply 29 can't be through the 3rd transistor 32.Therefore, the test signal that test signal generator 22 produced can't export display circuit 14 via on-off circuit 24 to.
When coupling arrangement 18 was not connected with host computer 16, the EPS1 pin 25 of coupling arrangement 18 can present floating (floating).Because EPS1 pin 25 is connected in the base stage of the first transistor 28, therefore when EPS1 pin 25 presented floating, the base stage of the first transistor 28 can be a noble potential, made the first transistor 28 not conductings.Because the first transistor 28 is connected in the base stage of transistor seconds 30, therefore when the first transistor 28 not conductings, the base stage of transistor seconds 30 can be an electronegative potential, makes transistor seconds 30 conductings.Therefore, the 3rd transistor 32 of on-off circuit 24 also can conducting, makes that power supply 29 can be through the 3rd transistor 32.Therefore, the test signal that test signal generator 22 produced can export display circuit 14 via on-off circuit 24 to.Therefore, testing circuit 26 is with the control end of gauge tap circuit 24, and just transistor 32, unlatching or close, decide the H-BLANK test signal could export the input end of display circuit 14 to.
Please refer to Fig. 5.Fig. 5 produces flow process Figure 40 of image frame with H-BLANK signal imitation image frame signal for the present invention.Include the following step:
Step 42: beginning;
Does step 44: whether testing circuit 26 detects host computer 16 have signal to transmit, to judge display 10 and host computer 16 lines? line is set up, and to step 46, line is not set up, to step 52;
Step 46: EPS 1 pin 25 of coupling arrangement 18 presents ground state;
Step 48: the transistor 32 of on-off circuit 24 is closed;
Step 50:H-BLANK signal can't export the input end of display circuit 14 via transistor 32 to, to step 62;
Step 52: EPS 1 pin 25 of coupling arrangement 18 can present floating;
Step 54: the transistor 32 of on-off circuit 24 is opened;
Step 56; The amplitude of H-BLANK signal is suitably adjusted;
Step 58: adjusted H-BLANK signal exports the input end of display circuit 14 to via transistor 32;
Step 60: display screen 12 shows complete white image frame;
Step 62: finish.
Compared to known display, display 10 of the present invention includes a self-test circuit 20, and whether be used for testing display 10 can normal operation.Self-test circuit 20 is the EPS1 subsignals that utilize image frame signal (IBMVGA signal) to be comprised, and the test signal (H-BLANK signal) that produced of test signal generator 22 is carried out the function of selftest.When the user wants to know that display 10 whether can normal operation, the user can be not attached to a host computer with display 10, make testing circuit 26 can't detect the image frame signal that host computer 16 is transmitted, therefore, test signal (H-BLANK signal) can export display circuit 14 to via on-off circuit 24.If display 10 can successfully show a complete white picture (full-white picture), represent that then display 10 can normal operation.
Therefore, display 10 of the present invention need not have screen display function and microcontroller, just can reach the function of selftest.
The above only is preferred embodiment of the present invention, and all equalizations of doing according to claim of the present invention change and modify, and all should belong to the covering scope of patent of the present invention.
Claims (3)
1. method that in a display, produces image frame with H-BLANK signal imitation image frame signal, this display includes a display screen, be used for the show image picture, one display circuit, be used for converting the image frame signal that a host computer is transmitted to corresponding horizontal image scan line in regular turn, when this display circuit and foundation one H-BLANK signal are shown in a horizontal image scan line on this display screen with decision, so that a plurality of horizontal image scan lines are formed a corresponding image frame; It is characterized in that this method includes the following step:
Whether detect this host computer has signal to transmit, with judge this display whether with this host computer line; And
When this display during, this display circuit is suitably adjusted and inputed to the amplitude of this H-BLANK signal, to simulate the image frame signal that this host computer transmitted and to produce corresponding image frame not with this host computer line.
2. the method for claim 1, it is characterized in that this display more includes an on-off circuit, this H-BLANK signal also can be via this on-off circuit to be sent to the input end of this display circuit, when detecting this host computer and have signal to transmit, this on-off circuit can be closed so that this H-BLANK signal can't export the input end of this display circuit to, otherwise this on-off circuit can be unlocked so that this H-BLANK signal exports the input end of this display circuit to.
3. the method for claim 1, the waveform that it is characterized in that this H-BLANK signal is and a full waveform similarity of image frame signal in vain, therefore when this H-BLANK signal was input to the input end of this display circuit, this display screen can show a complete white image frame.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB001064452A CN1136534C (en) | 2000-04-10 | 2000-04-10 | Display with self tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB001064452A CN1136534C (en) | 2000-04-10 | 2000-04-10 | Display with self tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1317780A CN1317780A (en) | 2001-10-17 |
| CN1136534C true CN1136534C (en) | 2004-01-28 |
Family
ID=4578338
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB001064452A Expired - Fee Related CN1136534C (en) | 2000-04-10 | 2000-04-10 | Display with self tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1136534C (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140035590A (en) * | 2012-09-14 | 2014-03-24 | 삼성전자주식회사 | Electronic apparatus and method of controlling the same |
-
2000
- 2000-04-10 CN CNB001064452A patent/CN1136534C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN1317780A (en) | 2001-10-17 |
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Owner name: BENQ ELECTRONS STOCK CO., LTD. Free format text: FORMER NAME OR ADDRESS: MINGHONG STOCK CO., LTD. Owner name: BENQ MOTOR CO., LTD. Free format text: FORMER NAME OR ADDRESS: BENQ ELECTRONS STOCK CO., LTD. |
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| CP01 | Change in the name or title of a patent holder |
Patentee after: BENQ Corp. Patentee before: BenQ Corporation Patentee after: BenQ Corporation Patentee before: MINGQI COMPUTER Co.,Ltd. |
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| CF01 | Termination of patent right due to non-payment of annual fee |