CN113613158A

CN113613158A - Earphone production test calibration method, equipment, earphone test system and storage medium

Info

Publication number: CN113613158A
Application number: CN202110866664.6A
Authority: CN
Inventors: 黎兴荣
Original assignee: Individual
Current assignee: Individual
Priority date: 2021-07-29
Filing date: 2021-07-29
Publication date: 2021-11-05

Abstract

The application discloses earphone production testing and calibrating method, equipment, earphone testing system and storage medium, wherein the earphone production testing and calibrating method is applied to the earphone testing system, and the earphone testing system comprises: the testing equipment is used for testing the earphone to be tested and is in communication connection with the earphone to be tested; the earphone production measurement and calibration method comprises the following steps: controlling the test equipment to send a test signal to the earphone to be tested; calculating calibration parameters of the earphone to be tested based on the test signal and an interactive signal of the earphone to be tested and the test equipment; sending the calibration parameters to the earphone to be tested; and controlling the to-be-tested earphone to configure the calibration parameters to the to-be-tested earphone, and controlling the test equipment to test the to-be-tested earphone after the calibration parameters are configured. The application aims to solve the problem that the product yield of the earphone in the existing production testing method is not high.

Description

Earphone production test calibration method, equipment, earphone test system and storage medium

Technical Field

The present application relates to the field of earphone production testing technologies, and in particular, to an earphone production testing calibration method, an earphone production testing calibration device, an earphone testing system, and a storage medium.

Background

The earphone is generally tested before leaving the factory, and the production and test of a frequency response index (also called a frequency response curve) is one of the core test items.

After the earphone to be tested is assembled, the earphone to be tested is placed into a professional testing device for testing to check whether the earphone to be tested meets the factory standard or not. The method comprises the following steps that the earphone to be tested is placed into an artificial ear of the testing equipment, the testing equipment and the earphone to be tested are connected through a Bluetooth signal, and data and command transmission is completed; in the test process, the earphone to be tested plays a test signal; the artificial ear microphone picks up the sound signal played by the built-in loudspeaker of the earphone and converts the sound signal into an electric signal, and the electric signal is sent to the tester. The tester analyzes the signals picked up by the artificial ear, calculates the frequency response curve of the earphone, selects a group of more appropriate parameters from a plurality of groups of preset frequency domain equalizer parameters (namely EQ parameters) according to the test result, and configures the parameters to the frequency domain equalizer built in the earphone until the frequency response curve meets the factory standard or all the preset frequency domain equalizer parameters are exhausted, and the parameters can not be judged to be defective products through the production test standard.

In the existing scheme, the frequency domain equalizer cannot perform accurate matching of the EQ parameters aiming at the electrical characteristic tolerance (such as the built-in microphone frequency response curve tolerance and the earphone loudspeaker unit frequency response curve tolerance) and the assembly tolerance (the glue dispensing amount tolerance, the sealing tolerance of a cavity before and after the earphone and the like) of each earphone, but a public version of the EQ parameters is provided for the EQ filter according to a typical electro-acoustic characteristic of the earphone to be tested, so that the frequency domain equalizer of the earphone to be tested lacks a method for accurately matching the EQ parameters due to the specific situations of component difference, assembly individual difference and the like, and the problem of low product yield in the existing earphone test is caused.

In addition, for the active noise suppression earphone, the production test of the noise suppression index of the noise suppression earphone is one of the core test items.

The existing testing method of the active noise suppression earphone comprises the following steps: after the earphone to be tested is assembled, the earphone to be tested is placed into a professional testing device for testing to check whether the earphone to be tested meets the factory standard or not. The method comprises the following steps that the earphone to be tested is placed into an artificial ear of the testing equipment, the testing equipment and the earphone to be tested are connected through a Bluetooth signal, and data and command transmission is completed; in the testing process, playing preset noise by an artificial mouth of testing equipment, and after the noise is suppressed by the earphone to be tested, remaining certain noise in the artificial ear; the artificial ear converts the residual noise into an electric signal and sends the electric signal to the testing equipment. The testing equipment adjusts the gain value of the preset noise suppression filter according to the size of the residual noise or selects a group of more appropriate parameters from multiple groups of preset noise suppression parameters to configure the parameters to the noise suppression filter until the residual noise meets the delivery standard or all the preset noise suppression parameters are exhausted and still cannot pass the production testing standard to be judged as a defective product.

In the existing scheme, the noise suppression filter cannot perform accurate matching of noise suppression parameters aiming at the component electrical characteristic tolerance (such as the built-in microphone frequency response curve tolerance and the earphone loudspeaker unit frequency response curve tolerance) and the assembly tolerance (the glue dispensing amount tolerance, the sealing tolerance of a cavity before and after the earphone and the like) of each noise suppression earphone, but provides a public version noise suppression parameter for the noise suppression filter according to a typical electro-acoustic characteristic of the noise suppression earphone, so that the noise suppression filter of the earphone to be tested lacks a method for accurately matching the noise suppression parameters due to the specific conditions of component difference, assembly individual difference and the like, and the problem of low product yield in the existing noise suppression earphone test is caused.

Therefore, the problem of low product yield exists in the existing detection method for both the common earphone and the noise suppression earphone.

Disclosure of Invention

The embodiment of the application provides a method and equipment for testing and calibrating earphone production, an earphone testing system and a storage medium, and aims to solve the problem that the earphone is low in product yield in the existing detection method.

The embodiment of the application provides a method for testing and calibrating earphone production, which is applied to an earphone testing system, wherein the earphone testing system comprises: the testing equipment is used for testing the earphone to be tested and is in communication connection with the earphone to be tested; the earphone production measurement calibration method comprises the following steps:

controlling the test equipment to send a first test signal to the earphone to be tested;

calculating calibration parameters of the earphone to be tested based on the first test signal and the interactive signal of the earphone to be tested and the test equipment;

sending the calibration parameters to the earphone to be tested;

and controlling the to-be-tested earphone to configure the calibration parameters to the noise suppression filter, and controlling the test equipment to test the configured to-be-tested earphone.

The embodiment of the application provides earphone production measurement and calibration equipment, which comprises a processor, an asynchronous resampling module connected with the processor, a first communication contact in communication connection with the processor, a memory electrically connected with the processor and an earphone production measurement and calibration program stored on the memory and capable of running on the processor; the processor further comprises a first Bluetooth communication module for wireless communication, and the earphone production testing calibration program realizes the steps of the earphone production testing calibration method when being executed by the processor.

The embodiment of the application provides an earphone testing system, which comprises testing equipment for testing an earphone to be tested and earphone production testing calibration equipment; the testing equipment is in communication connection with the earphone to be tested, and the earphone to be tested comprises a second communication contact for communicating with the first communication contact, a frequency domain equalizer, a second Bluetooth communication module in wireless communication with the earphone production testing calibration equipment and a noise suppression filter.

The embodiment of the present application further provides a computer-readable storage medium, which stores one or more programs, where the one or more programs are executable by one or more processors to implement the steps in the method for calibrating the headset production test.

Compared with the existing detection method, the method has the advantages that a public version parameter of the frequency domain equalizer or the noise suppression filter of the earphone to be detected is given according to a typical electroacoustic characteristic of the earphone, so that the earphone to be detected lacks a method for accurately matching the parameter of the frequency domain equalizer or the noise suppression filter due to specific conditions such as component difference, assembly individual difference and the like, and the existing earphone is low in product yield in the test. According to the method and the device, the electroacoustic characteristic of the earphone to be tested is firstly calculated according to the test signal of the test equipment and the interactive signal of the earphone to be tested, and the customized calibration parameters matched with the difference (namely component tolerance, transducer tolerance and assembly tolerance) of the electroacoustic characteristic of the earphone to be tested are configured to the earphone to be tested. Therefore, calibration compensation can be performed on each earphone to be detected in a targeted manner, namely, calibration parameters are accurately matched according to the specific conditions of component tolerance, transducer tolerance and assembly tolerance of the earphone to be detected, the customization of a frequency domain equalizer or a noise suppression filter of each earphone to be detected is realized, the consistency of quality indexes among different earphones to be detected is improved, and the yield of earphone detection is improved.

Drawings

FIG. 1 is a schematic diagram of an embodiment of a conventional earphone testing system;

FIG. 2 is a hardware block diagram of an embodiment of the headset production calibration apparatus of the present application;

FIG. 3 is a flowchart of an embodiment of a method for calibrating earphone productivity of the present application;

FIG. 4 is a schematic diagram of an embodiment of a headset calibration system including a feedback noise suppression headset according to the present application;

FIG. 5 is a schematic diagram of an embodiment of a headset calibration system including a feedback noise suppression headset according to the present application;

FIG. 6 is a schematic diagram of another embodiment of a headset calibration system including a feedback noise suppression headset according to the present application;

FIG. 7 is a schematic diagram of another embodiment of a headset calibration system including a feedback noise suppression headset according to the present application;

FIG. 8 is a schematic diagram of an embodiment of a headset calibration system incorporating a feed-forward noise-suppressing headset according to the present application;

FIG. 9 is a schematic diagram of another embodiment of a headset calibration system incorporating a feedforward noise suppression headset according to the present application;

FIG. 10 is a schematic diagram of an embodiment of a headset calibration system including a hybrid noise-suppressing headset according to the present application;

fig. 11 is a schematic structural diagram of an embodiment of a headset calibration system including a frequency domain equalizer according to the present application;

FIG. 12 is a flow chart of another embodiment of a method of headset production calibration according to the present application;

fig. 13 is a block diagram of an embodiment of a calibration apparatus for earphone production measurement according to the present application;

FIG. 14 is a diagram illustrating a synchronization process in step S221a according to an embodiment of the present application;

fig. 15 is a schematic diagram of a synchronization process in step S222a according to an embodiment of the present application.

Detailed Description

In order to better understand the above technical solutions, exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

Referring to fig. 1, fig. 1 is a schematic structural diagram illustrating a conventional testing apparatus testing an earphone to be tested.

The testing device comprises a testing device body 110, an artificial mouth 120 and an artificial ear 130, wherein the artificial mouth 120 is electrically connected with the testing device body 110, the artificial mouth 120 is used for sending out an excitation signal to the earphone to be tested, and the artificial ear 130 is used for picking up an audio signal sent out by the earphone to be tested or picking up residual noise after noise suppression of the noise suppression earphone. The artificial mouth 120 comprises a test speaker and the artificial ear 130 has a test microphone 131 therein.

The existing testing method of the active noise suppression earphone comprises the following two stages:

1. designing one or more groups of noise suppression parameters according to the acoustic characteristics of the noise suppression earphone cavity and the electro-acoustic characteristics of the circuit, wherein the noise suppression parameters comprise parameters of a feedforward noise suppression filter and parameters of a feedback noise suppression filter; these parameters are referred to as preset noise suppression parameters.

2. After the earphone to be tested is assembled, the earphone to be tested is placed into a professional testing device for testing to check whether the earphone to be tested meets the factory standard or not. The method comprises the following steps that the earphone to be tested is placed into an artificial ear of the testing equipment, the testing equipment and the earphone to be tested are connected through a Bluetooth signal, and data and command transmission is completed; in the testing process, an artificial mouth of the testing equipment plays a preset testing signal, and certain noise is remained in the artificial ear after the noise of the earphone to be tested is suppressed; the artificial ear converts the residual noise into an electric signal and sends the electric signal to the testing equipment. The testing equipment adjusts the gain value of the preset noise suppression filter according to the size of the residual noise or selects a group of more appropriate parameters from multiple groups of preset noise suppression parameters to configure the parameters to the noise suppression filter until the residual noise meets the delivery standard or all the preset parameters are exhausted and the parameters still cannot pass the production test standard and are judged to be defective products.

In the existing scheme, the noise suppression filter cannot perform accurate matching of noise suppression parameters aiming at the component electrical characteristic tolerance (such as the built-in microphone frequency response curve tolerance and the earphone loudspeaker unit frequency response curve tolerance) and the assembly tolerance (the glue dispensing amount tolerance, the sealing tolerance of a cavity before and after the earphone and the like) of each earphone, but provides a public version noise suppression parameter for the noise suppression filter according to a typical electro-acoustic characteristic of the noise suppression earphone, so that the problem of low product yield in the existing noise suppression earphone test is caused because an accurate matching method is lacked in the specific situations of component difference, assembly individual difference and the like of the earphone to be tested.

In view of this, the present application provides a method and an apparatus for testing and calibrating an earphone, an earphone testing system, and a storage medium, which are intended to solve the problem of low product yield of the noise-suppressing earphone in the existing testing method.

Referring to fig. 2, a headset production calibration apparatus is described below, which may include: processor 1001, such as a Central Processing Unit (CPU), the processor 1001 may also be other general purpose processors, such as: digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs), other programmable logic devices, and the like. Memory 1005, user interface 1003, network interface 1004, communication bus 1002. Wherein a communication bus 1002 is used to enable connective communication between these components. The user interface 1003 may include an input unit such as a keypad (Keyboard), and the optional user interface 1003 may also include a standard wired interface, a wireless interface. The network interface 1004 may optionally include a wireless interface (e.g., a WI-FI interface). The memory 1005 may be a high-speed RAM memory or a non-volatile memory (e.g., a magnetic disk memory). The memory 1005 may alternatively be a storage device separate from the processor 1001.

The processor also includes a first bluetooth communication module for wireless communication. The first Bluetooth communication module is used for receiving the interactive signals of the earphone to be tested and the test equipment through Bluetooth. It will be noted that the first bluetooth communication module may use various bluetooth communication modules on the market, and the bluetooth communication module is composed of a wireless transceiver (RF), a baseband controller (BB) and a link management Layer (LMP) of a bluetooth protocol stack.

The headset production calibration device further includes an asynchronous resampling module 1006 coupled to the processor, and a first communication contact 1007 communicatively coupled to the processor. The asynchronous resampling module 1006 is used for synchronously processing the interaction signal (e.g. response signal of the headset under test responding to the test signal of the test device) picked up from the headset under test and the test signal of the test device. Therefore, a foundation is laid for calculating the calibration parameters of the earphone to be tested. The first communication contact 1007 is used for electrically connecting with a communication contact on the headset to be tested, and is used for picking up an interactive signal from the headset to be tested, or sending the calculated calibration parameter to a corresponding device (such as a noise suppression filter or a frequency domain equalizer) of the headset to be tested.

It should be noted that the first communication contact 1007 may be a metal contact. The metal contact point is electrically connected with the original charging contact point of the earphone to be tested or a special metal contact point which is additionally arranged on the earphone to be tested and used for communication to carry out data communication. It should be understood that the first communication contact may also be other components that can implement a communication connection, such as various metal screws that can perform data communication, a metal housing of the headset, and other metal connectors on the housing of the headset.

It will be appreciated by those skilled in the art that the headset production calibration apparatus structure shown in figure 2 does not constitute a limitation of the headset production calibration apparatus and may include more or fewer components than shown, or some components in combination, or a different arrangement of components.

As shown in fig. 2, a memory 1005, which is one type of computer storage medium, may include therein an operating system, a network communication module, a user interface module, and a headphone production calibration program. The operating system is a program for managing and controlling hardware and software resources of the earphone production measurement and calibration equipment and supports the operation of the earphone production measurement and calibration program and other software or programs.

In the earphone production measurement and calibration apparatus shown in fig. 2, the network interface 1004 is mainly used for a background server, and is in data communication with the background server; the processor 1001 may be configured to invoke a headset production calibration program stored in the memory 1005 and perform the steps of the headset production calibration method as described above.

In one embodiment, the processor 1001 may be configured to invoke a headset production calibration program stored in the memory 1005 and execute the method including:

controlling the test equipment to send a test signal to the earphone to be tested;

sending the calibration parameters to the earphone to be tested;

acquiring a first response signal generated by the feedback microphone in response to the built-in loudspeaker; acquiring a second response signal generated by the test microphone in response to the built-in loudspeaker;

if the first test signal, the first response signal and the second response signal are in an asynchronous relation, synchronously processing the first test signal, the first response signal and the second response signal;

calculating a first transfer function of the feedback path based on the first test signal, the first response signal and the second response signal after the synchronous processing;

and calculating the calibration parameters of the feedback noise suppression filter according to the first transfer function and the first sub-preset target calibration function.

acquiring a third response signal generated by the feedforward microphone in response to the first test signal; acquiring a fourth response signal generated by the test microphone in response to the first test signal;

if the first test signal, the third response signal and the fourth response signal are in an asynchronous relation, synchronously processing the first test signal, the third response signal and the fourth response signal;

calculating a second transfer function of the feedforward path based on the first test signal, the third response signal and the fourth response signal after synchronous processing;

and calculating the calibration parameters of the feedforward noise suppression filter according to the transfer function from the built-in loudspeaker to the test microphone, the second transfer function and a second sub-preset target calibration function.

calculating a first sub-calibration parameter of the feedback noise suppression filter according to the first transfer function and a first sub-preset target calibration function;

calculating calibration parameters of the feedforward noise suppression filter according to a transfer function from the built-in loudspeaker to the test microphone, the second transfer function and a second sub-preset target calibration function;

the calibration parameters include the first sub-calibration parameters and the second sub-calibration parameters.

calculating a first sub-transfer function from the built-in speaker to the feedback microphone based on the synchronized first response signal;

calculating a second sub-transfer function from the built-in speaker to the test microphone based on the synchronized second response signal;

the first transfer function includes the first sub-transfer function and the second sub-transfer function

calculating a third sub-transfer function from the first test signal to the feedforward microphone based on the synchronously processed third response signal;

calculating a fourth sub-transfer function from the first test signal to the test microphone based on the fourth response signal after the synchronization processing;

the second transfer function includes the third sub-transfer function and the fourth sub-transfer function.

when the test equipment is connected with the earphone to be tested through Bluetooth, the first response signal and the second response signal are synchronized to a clock domain of the first test signal through asynchronous resampling; or

When the test equipment is connected with the earphone to be tested through the communication contact, the first response signal is obtained through the communication contact, and synchronization of the first test signal, the first response signal and the second response signal is achieved.

when the test equipment is connected with the earphone to be tested through Bluetooth, the third response signal and the fourth response signal are synchronized to the clock domain of the first test signal through asynchronous resampling; or

And when the test equipment is connected with the earphone to be tested through the communication contact, the third response signal and the clock signal are transmitted through the communication contact, so that the first test signal, the third response signal and the fourth response signal are synchronized.

controlling the test equipment to send a second test signal to the earphone to be tested;

acquiring a fifth response signal generated by the to-be-tested earphone responding to the second test signal, and calculating a calibration parameter of the to-be-tested earphone according to the fifth response signal and a third sub-preset target calibration function;

sending the calibration parameters to the earphone to be tested;

and controlling the to-be-tested earphone to configure the calibration parameters to the frequency domain equalizer, and controlling the test equipment to test the configured to-be-tested earphone.

acquiring a fifth response signal generated by the test microphone in response to the second test signal;

if the second test signal and the fifth response signal are in an asynchronous relation, performing synchronous processing on the second test signal and the fifth response signal;

calculating a third transfer function of the playing path based on the second test signal and the fifth response signal after the synchronous processing;

and calculating calibration parameters of the frequency domain equalizer according to the third transfer function and the third sub-preset target calibration function.

when the test equipment is connected with the earphone to be tested through Bluetooth, the fifth response signal is synchronized to the clock domain of the second test signal through asynchronous resampling; or

And when the test equipment is connected with the earphone to be tested through the communication contact, the fifth response signal and the clock signal are transmitted through the communication contact, so that the second test signal and the fifth response signal are synchronized.

The earphone production testing calibration equipment calculates the electroacoustic characteristic of the earphone to be tested according to the first test signal of the test equipment and the interactive signal of the earphone to be tested, and configures customized calibration parameters matched with the difference (namely component tolerance, transducer tolerance and assembly tolerance) of the electroacoustic characteristic of the earphone to be tested to the noise suppression filter. Therefore, calibration compensation can be performed on each earphone to be detected in a targeted manner, namely, calibration parameters are accurately matched according to the specific conditions of component tolerance, transducer tolerance and assembly tolerance of the earphone to be detected, the noise suppression parameters of the noise suppression filter of each earphone to be detected are customized, the consistency of noise suppression indexes among different earphones to be detected is improved, and the detection yield of the noise suppression earphones is improved.

Referring to fig. 3, based on the hardware architecture of the earphone production measurement and calibration device, a first embodiment of the earphone production measurement and calibration method of the present application is provided below, where the earphone production measurement and calibration method includes the following steps:

s100, controlling the test equipment to send a test signal to the earphone to be tested;

in this embodiment, please refer to fig. 4, fig. 4 shows a simplified earphone to be tested, in which the earphone to be tested is a feedback noise suppression earphone (or called feedback noise suppression earphone), the earphone to be tested includes a built-in speaker 210 and a feedback microphone 220, the noise suppression filter is a feedback noise suppression filter (FB in the figure), the built-in speaker 210, the feedback noise suppression filter FB and the feedback microphone 220 are electrically connected in sequence to form a feedback path, and the testing apparatus includes a testing apparatus body 110, a testing microphone 130 (i.e., the above artificial ear) for testing the earphone to be tested, and a testing speaker 120 (i.e., the above artificial mouth) for sending a first testing signal to the earphone to be tested.

It is understood that the headset under test further includes an analog-to-digital converter (not shown) corresponding to the feedback microphone, and the analog-to-digital converter is configured to perform analog-to-digital conversion on the sound signal picked up by the feedback microphone. The built-in loudspeaker comprises an analog-to-digital converter, a power amplifier and a loudspeaker transduction device, and for the sake of simplicity, the components are collectively called the built-in loudspeaker, and the built-in loudspeaker is used for converting a digital signal received by a receiving channel of the earphone into a sound signal.

The earphone production test calibration equipment can control the test equipment to send an excitation signal (a first test signal) to the earphone to be tested through the test loudspeaker through the input equipment so that the earphone to be tested can generate an interactive signal interacting with the test equipment.

It is worth mentioning that the excitation signal may be any one of various preset excitation signals, such as white noise, random noise, pink noise, and environmental noise. The environmental noise refers to sound generated in industrial production, building construction, transportation and social life and interfering with surrounding living environment, and includes airport noise, subway noise and the like.

Specifically, the white noise further includes a test signal generated by a PRBS (Pseudo-Random Binary Sequence) manner, or a noise signal generated by the PRBS after being filtered by a filter.

The input device may be a keyboard, a mouse, or the like.

S200, calculating calibration parameters of the earphone to be tested based on the test signal and the interactive signal of the earphone to be tested and the test equipment;

and the earphone production measurement calibration equipment calculates the calibration parameters of the earphone to be measured according to the excitation signal and the interaction signal of the earphone to be measured and the test equipment. The calibration parameter is a calibration parameter adjusted for the feedback noise suppression filter FB.

The test signal includes a first test signal, and the frequency range of the first test signal in this embodiment is a test signal including a 20 hz-20000 hz continuous spectrum, rather than a single frequency or a multi-tone test signal or a frequency-sweep signal composed of multiple single frequency signals. Further, the first test signal comprises a frequency spectrum in the range of 20hz to 5000 hz. In some preferred embodiments, the first test signal comprises a frequency spectrum in the range of 150hz to 300hz, and the first test signal comprises at least a frequency spectrum in this frequency range. The first test signal of this embodiment at least includes a frequency spectrum of 150hz to 300hz, rather than the frequency sweep signal.

In some possible embodiments, step S200 specifically includes:

s210a, acquiring a first response signal generated by the feedback microphone in response to the built-in loudspeaker; acquiring a second response signal generated by the test microphone in response to the built-in loudspeaker;

the earphone production detection calibration equipment acquires a first response signal generated by the feedback microphone in response to the built-in loudspeaker; and acquiring a second response signal generated by the test microphone in response to the built-in loudspeaker.

The first response signal is a digital signal obtained by processing the sound signal of the feedback microphone by an analog-to-digital converter (not shown). The second response signal is a digital signal obtained by processing the sound signal of the test microphone by an analog-to-digital converter (not shown). It will be appreciated that if a digital microphone is employed as the test microphone, the second response signal picked up by the test microphone need not pass through an analogue to digital converter.

It should be noted that, in some possible embodiments, the headset production calibration device and the headset to be tested may obtain the first response signal through a bluetooth connection. In some other possible embodiments, the headset production calibration device obtains the first response signal by connecting with a communication contact on the headset to be tested.

S220a, if the first test signal, the first response signal and the second response signal are asynchronous, synchronously processing the first test signal, the first response signal and the second response signal;

after the headset production test calibration equipment acquires a first response signal and a second response signal, if the first test signal, the first response signal and the second response signal are in an asynchronous relation, the first test signal, the first response signal and the second response signal are synchronously processed.

It should be noted that, if the first test signal, the first response signal, and the second response signal are in an asynchronous relationship, performing synchronous processing on the first test signal, the first response signal, and the second response signal is a prerequisite step for calculating calibration parameters of the to-be-tested earphone.

In some possible embodiments, step S220a specifically includes:

s221a, when the test equipment is connected with the earphone to be tested through Bluetooth, synchronizing the first response signal and the second response signal to the clock domain of the first test signal through asynchronous resampling;

referring to fig. 14, the sampling clock of the adc of the artificial ear is provided by the earphone calibration device, denoted as clk _ a. The earphone production measurement calibration device further comprises an Asynchronous resampling (ASRC) module, and a first response signal collected by a feedback microphone and a second response signal collected by a test microphone (artificial ear in the figure) in the earphone to be tested are synchronized to a clock domain of a first test signal of the test device through the ASRC module. And synchronizing the first response signal, the second response signal and the first test signal, and laying a foundation for calculating the calibration parameters of the earphone to be tested.

Alternatively, in some other possible embodiments, the step S200a further specifically includes:

s222a, when the test equipment is connected with the earphone to be tested through the communication contact, the first response signal is obtained through the communication contact, and synchronization of the first test signal, the first response signal and the second response signal is achieved.

Referring to fig. 15, the sampling clock of the adc of the artificial ear is provided by the earphone calibration device, denoted as clk _ a. It should be noted that the sampling clock of the analog-to-digital converter of the artificial ear can also be provided by the headset to be tested. Both can be used as a provider of a clock, and the analog-to-digital conversion devices of the headset to be tested and the testing equipment operate in the same clock domain.

The communication contact in the earphone to be tested comprises a charging contact or a reserved special data and clock transmission contact, and data and clock transmission can be completed through the charging contact or the special data and clock transmission contact. The data transfer is bidirectional and the clock transfer is unidirectional. The first response signal of the feedback microphone in the earphone to be tested can be transmitted to the earphone production test calibration equipment through the charging contact or the reserved special contact, so that the first test signal, the first response signal and the second response signal are synchronized, namely clk _ A, and a foundation is laid for calculating the calibration parameters of the feedback noise suppression filter of the earphone to be tested. In particular, the data and clock transfer is accomplished through the same communication contacts, which are reserved for dedicated data and clock transmission, for example, in one possible embodiment, the data and clock transfer is accomplished using the spdif transmission protocol in the audio domain. The testing equipment is provided with a communication contact corresponding to the communication contact on the earphone to be tested.

It should be noted that the communication contact may be a metal contact on the headset to be tested. The metal contact can be the original charging contact of the earphone to be tested or a special contact which is additionally arranged on the earphone to be tested and used for communication. It should be understood that the communication contact may also be other components of the headset to be tested that can implement communication connection, such as a metal housing of the headset or a metal fitting that can conduct electricity on the housing.

S230a, calculating a first transfer function of the feedback path based on the first test signal, the first response signal and the second response signal after synchronous processing;

after the earphone production test calibration equipment carries out synchronization processing on the first test signal, the first response signal and the second response signal, a first transfer function of the feedback path is calculated based on the first test signal, the first response signal and the second response signal which are subjected to synchronization processing.

It should be noted that, the premise of calculating the first transfer function of the feedback path of the to-be-tested earphone is that the first test signal (i.e., the above excitation signal) sent by the test equipment, the first response signal of the feedback microphone inside the to-be-tested earphone, and the second response signal collected by the test microphone of the test equipment are synchronous data. Based on step S220a, if the first test signal, the first response signal, and the second response signal are asynchronous, the first test signal, the first response signal, and the second response signal are processed synchronously, so that the first transfer function of the feedback path of the headset to be tested is calculated in this step.

In some possible embodiments, referring to fig. 5, fig. 5 shows a simplified noise-suppressing feedback earphone, where x denotes that the test is a first test signal (i.e., an excitation signal) emitted by the device, y1 denotes a first response signal collected by a feedback microphone of the earphone under test, and y2 denotes a second response signal collected by a test microphone of the test device.

In some possible embodiments, the step S230a of calculating a first transfer function of the feedback path based on the synchronized first test signal, the first response signal and the second response signal includes:

the first transfer function comprises the first sub-transfer function and the second sub-transfer function;

s231a, calculating a first sub-transfer function from the built-in loudspeaker to the feedback microphone based on the first response signal after the synchronization processing;

after the earphone production testing calibration equipment synchronizes the first test signal, the first response signal and the second response signal, a first sub-transfer function from the built-in loudspeaker to the feedback microphone is calculated based on the synchronized first response signal.

In one possible embodiment, the first sub-transfer function of the feedback microphone of the headset under test is calculated by the following equation 1-1:

HS 1-FFT (y1)/FFT (x), equation 1-11. Where HS1 represents the first sub-transfer function of the built-in speaker to the feedback microphone, FFT represents the fast fourier transform, IFFT represents the inverse fast fourier transform, x represents that the test is the first test signal (i.e. excitation signal) emitted by the device, and y1 represents the first response signal picked up by the feedback microphone of the headset under test. The first sub-transfer function from the built-in speaker to the feedback microphone is calculated by the calculation formula HS 1-FFT (y1)/FFT (x).

S232a, calculating a second sub-transfer function from the built-in loudspeaker to the test microphone based on the second response signal after the synchronization processing;

and after synchronizing the first test signal, the first response signal and the second response signal, the earphone production testing calibration equipment calculates a second sub-transfer function from the built-in loudspeaker to the test microphone based on the synchronized second response signal.

In one possible embodiment, the second sub-transfer function of the feedback microphone of the headset under test is calculated by the following equation 1-2:

HS 2-FFT (y2)/FFT (x), equation 1-2. Where HS2 represents the second sub-transfer function of the built-in speaker to the test microphone, FFT represents the fast fourier transform, IFFT represents the inverse fast fourier transform, x represents the first test signal (i.e. excitation signal) that the test is device-emitted, and y2 represents the second response signal collected by the test microphone of the test device. The second sub-transfer function from the built-in speaker to the feedback microphone is calculated by the calculation formula HS 2-FFT (y2)/FFT (x).

S240a, calculating the calibration parameters of the feedback noise suppression filter according to the first transfer function and the first sub-preset target calibration function.

After the earphone production measurement calibration equipment calculates and obtains the first sub-transfer function and the second sub-transfer function, the calibration parameters of the feedback noise suppression filter are calculated according to the first sub-transfer function, the second sub-transfer function and the first sub-preset target calibration function.

In some possible embodiments, in FIG. 6, it is assumed that the human ear in FIG. 6 and the artificial ear in the test device are equivalent.

Then there are

In equations 1-3, y has the meaning: and under the condition that the noise suppression function of the noise suppression earphone is turned on, a feedback microphone of the earphone to be tested picks up the residual noise signal. HFB represents the transfer function of the feedback noise suppression filter.

Assuming that the preset first sub-preset target calibration function is h1, as shown in FIG. 7, then

ydes is IFFT (FFT (h1) · FFT (x)), equation 1-4.

In equations 1-4, ydes has the meaning: and according to a preset first sub-preset target calibration function, after the noise x passes through the noise suppression earphone, the noise x is a residual noise signal heard at the artificial ear.

The present embodiment aims to find the calibration parameters of the noise suppression filter suitable for the purpose of y being ydes, thereby obtaining equations 1 to 5:

for equations 1-5, by eliminating x on both sides of the equation, then there is

In the formula 1-6, HS1 is the first transfer function of the feedback microphone of the current earphone to be tested, which is the actual measurement result; h1 is a preset first sub-preset target calibration function, also a known quantity; then the transfer function frequency domain expression HFB of the feedback noise suppression filter can be solved:

further, equations 1-8 can be derived from equations 1-7: HFB ═ f (HS1, HS2, h 1).

Namely: the HFB is a function of HS1, HS2 and the first sub preset target calibration function h 1. From equations 1-8, it can be seen that the expression HFB already contains information of HS1 (first sub-transfer function) and HS2 (second sub-transfer function), i.e. material tolerance and assembly tolerance information of the headset to be tested. And calculating the calibration parameters of the feedback noise suppression filter according to the HS1 and the HS2, and eliminating the tolerance of the electroacoustic characteristic of the earphone to be tested caused by material tolerance and assembly tolerance.

After obtaining the transfer function of the feedback noise suppression filter, the feedback noise suppression filter is adapted to specific parameters of the feedback noise suppression filter, that is, calibration parameters of the feedback noise suppression filter, according to the resource settings of the feedback noise suppression filter bank, such as how many biquad filters each filter bank is composed of, the gain range supported by each biquad filter, whether the gain can be configured in segments, and the like.

It should be understood that the present embodiment is only an example, and the hardware structure of the feedback noise suppression filter is not a condition for limiting the present invention; different hardware implementations differ only in the way HFB is adapted to the specific hardware, but the way HFB is calculated is the same.

S300, sending the calibration parameters to the to-be-tested earphone;

and the earphone production measurement calibration equipment sends the calculated calibration parameters of the feedback noise suppression filter to the earphone to be tested through a Bluetooth channel or a communication contact on the earphone to be tested. And testing the earphone to be tested by the equipment to be tested.

S400, controlling the to-be-tested earphone to configure the calibration parameters to the to-be-tested earphone, and controlling the test equipment to test the configured to-be-tested earphone.

And the earphone production test calibration equipment controls the earphone to be tested to configure the calibration parameters of the feedback noise suppression filter to the feedback noise suppression filter and controls the test equipment to test the configured earphone to be tested.

It should be noted that the earphone production test calibration device can control the artificial ear of the test device to judge the picked noise residue, and accordingly judge whether the noise suppression effect meets the expectation. In some possible embodiments, the determining may be performed by determining whether a noise suppression curve of noise remaining in a certain frequency band conforms to a preset curve. Alternatively, the noise remaining in a certain frequency band may be weighted-integrated, and the integral value of the remaining noise may be used as the determination criterion.

The noise suppression parameters of the feedback noise suppression filter FB can be calculated by actually measuring the first sub-transfer function HS1 of the feedback microphone and the second sub-transfer function HS2 of the test microphone, and then according to HS1 and HS2, and according to the first sub-preset target calibration function. It can be seen from the implementation process that we have comprehensively considered the characterization of the electro-acoustic characteristics of each earphone to be tested when calibrating the feedback noise suppression filter, so that when calibrating the feedback noise suppression filter, the noise suppression parameters of the feedback noise suppression filter are compensated according to the difference of the first sub-transfer function HS1 of the feedback microphone, and thus, the purpose of automatically calibrating each earphone is achieved.

In this embodiment, calibration is performed on a feedback noise suppression earphone, the test device is first controlled to send a first test signal to the earphone to be tested, and calibration parameters of the earphone to be tested are calculated based on the first test signal and an interaction signal between the earphone to be tested and the test device. Sending the calibration parameters to the earphone to be tested; and controlling the to-be-tested earphone to configure the calibration parameters to a feedback noise suppression filter, and controlling the test equipment to test the configured to-be-tested earphone.

Therefore, in this embodiment, according to the first test signal of the test device and the interactive signal of the to-be-tested earphone, the electroacoustic characteristic of the to-be-tested earphone is tested and calculated, and the customized calibration parameter matched with the difference (i.e., component tolerance, transducer tolerance, and assembly tolerance) of the electroacoustic characteristic of the to-be-tested earphone is configured to the feedback noise suppression filter. Therefore, calibration compensation can be performed on each earphone to be detected in a targeted manner, namely, calibration parameters are accurately matched according to the specific conditions of component tolerance, transducer tolerance and assembly tolerance of the earphone to be detected, customization of noise suppression parameters of the feedback noise suppression filter of each earphone to be detected is realized, so that the consistency of noise suppression indexes among different earphones to be detected is improved, and the detection yield of the feedback noise suppression earphones is improved.

Compared with the prior detection method, a public version noise suppression parameter of the noise suppression filter is given according to a typical electroacoustic characteristic of the noise suppression earphone, so that the noise suppression filter of the earphone to be detected lacks a method for accurately matching the noise suppression parameter due to specific conditions such as component difference, assembly individual difference and the like, and the product yield in the prior noise suppression earphone test is not high. In the embodiment, the electroacoustic characteristic of the earphone to be tested is calculated according to the first test signal of the test equipment and the interactive signal of the earphone to be tested, and the customized calibration parameters matched with the difference (namely component tolerance, transducer tolerance and assembly tolerance) of the electroacoustic characteristic of the earphone to be tested are configured to the noise suppression filter. Therefore, calibration compensation can be performed on each earphone to be detected in a targeted manner, namely, calibration parameters are accurately matched according to the specific conditions of component tolerance, transducer tolerance and assembly tolerance of the earphone to be detected, the noise suppression parameters of the noise suppression filter of each earphone to be detected are customized, the consistency of noise suppression indexes among different earphones to be detected is improved, and the detection yield of the noise suppression earphones is improved.

Example two

Based on the same inventive concept, the present application also provides the second embodiment, and the second embodiment has the same points as the first embodiment. Only the differences between the second embodiment and the first embodiment will be described below. The second embodiment is different from the first embodiment in that:

in this embodiment, please refer to fig. 8, fig. 8 shows a simplified testing scheme, in which the earphone to be tested is a feedforward noise suppression earphone, the earphone to be tested includes a built-in speaker 210 and a feedforward microphone 230, the noise suppression filter is a feedforward noise suppression filter (i.e., FF), the feedforward microphone 230, the feedforward noise suppression filter FF and the built-in speaker 210 are electrically connected in sequence to form a feedforward path, and the testing apparatus includes a testing microphone 130 (i.e., the artificial ear) for testing the earphone to be tested, and a testing speaker 120 (i.e., the artificial mouth) for sending a first testing signal to the earphone to be tested.

It is understood that the headset under test further includes an analog-to-digital converter (not shown) corresponding to the feedforward microphone, and the analog-to-digital converter is used for performing analog-to-digital conversion on the sound signal picked up by the feedforward microphone. The built-in speaker comprises an analog-to-digital converter, a power amplifier and a speaker transduction device, and for simplicity of description, the components are collectively called the built-in speaker.

Step S200, calculating calibration parameters of the to-be-tested earphone based on the test signal and the interaction signal of the to-be-tested earphone and the test device includes:

and the earphone production measurement calibration equipment calculates the calibration parameters of the earphone to be measured according to the excitation signal and the interaction signal of the earphone to be measured and the test equipment. The calibration parameters are calibration parameters adjusted and configured for the feedforward noise suppression filter FF.

It should be noted that the first test signal in this embodiment and the first test signal in the first embodiment may be test signals with the same or different frequencies. The first test signal and the first test signal implementing one in this embodiment are both in the frequency range of 20hz to 20000 hz.

It should be noted that the first test signal (i.e. the excitation signal) of the present embodiment may be any one of various preset excitation signals, such as white noise, random noise, pink noise, and ambient noise. The environmental noise refers to sound generated in industrial production, building construction, transportation and social life and interfering with surrounding living environment, and includes airport noise, subway noise and the like.

It should be noted that, in this embodiment, the frequency range of the first test signal is a test signal including a continuous spectrum of 20hz to 20000hz, and is not a single frequency or a multi-tone test signal or a frequency sweep signal composed of multiple single frequency signals. In some embodiments, the first test signal comprises a continuous spectrum of frequencies in the range of 20hz to 5000 hz. In a preferred embodiment, the first test signal comprises a continuous spectrum with a frequency range of 150hz to 300hz, and the first test signal of this embodiment comprises at least a continuous spectrum with a frequency range of 150hz to 300hz, rather than a frequency sweep signal.

In some possible embodiments, step S200 specifically includes:

step S210b, acquiring a third response signal generated by the feedforward microphone in response to the first test signal; acquiring a fourth response signal generated by the test microphone in response to the first test signal;

the earphone production testing and calibrating equipment acquires a third response signal generated by the feedforward microphone in response to the first test signal; and acquiring a fourth response signal generated by the test microphone in response to the first test signal;

the third response signal is a digital signal of the sound signal of the feedforward microphone processed by the analog-to-digital converter. The fourth response signal is a digital signal of the sound signal of the test microphone processed by the analog-to-digital converter. It should be understood that if the feedforward microphone is a digital microphone, the third response signal picked up by the feedforward microphone does not need to pass through an analog-to-digital converter; and the test microphone adopts a digital microphone, so that the fourth response signal picked up by the test microphone does not need to pass through an analog-to-digital converter.

It should be noted that, in some possible embodiments, the headset production test calibration device and the headset to be tested may obtain the third response signal through a bluetooth connection. In some other possible embodiments, the headset production calibration device obtains the third response signal by connecting with the communication contact on the headset to be tested.

Step S220b, if the first test signal, the third response signal and the fourth response signal are asynchronous, performing synchronous processing on the first test signal, the third response signal and the fourth response signal;

after the earphone production test calibration device acquires a third response signal and a fourth response signal, if the first test signal, the third response signal and the fourth response signal are in an asynchronous relation, the first test signal, the third response signal and the fourth response signal are synchronously processed.

It should be noted that, if the first test signal, the third response signal, and the fourth response signal are in an asynchronous relationship, performing synchronous processing on the first test signal, the third response signal, and the fourth response signal is a prerequisite step of calculating calibration parameters of the to-be-tested earphone.

In some possible embodiments, step S220b specifically includes:

step S221b, when the test device is connected to the to-be-tested headset via bluetooth, synchronizing the third response signal and the fourth response signal to the clock domain of the first test signal via asynchronous resampling;

the earphone production measurement calibration device further comprises an Asynchronous resampling (ASRC) module, and a third response signal collected by a feedforward microphone in the earphone to be tested and a fourth response signal collected by a test microphone of the test device are synchronized to a clock domain of a first test signal of the test device through the ASRC module. And synchronizing the third response signal, the fourth response signal and the first test signal, and laying a foundation for calculating the calibration parameters of the earphone to be tested.

Alternatively, in some other possible embodiments, in step S222b, when the testing device is connected to the headset to be tested through the communication contact, the third response signal and the clock signal are transmitted through the communication contact, so as to synchronize the first test signal, the third response signal, and the fourth response signal.

The communication contact in the earphone to be tested comprises a charging contact or a reserved special data and clock transmission contact, and data and clock transmission can be completed through the charging contact or the special data and clock transmission contact. The data transfer is bidirectional and the clock transfer is unidirectional. The third response signal of the feedforward microphone in the earphone to be tested can be transmitted to the earphone production test calibration equipment through the charging contact or the reserved special contact, so that the first test signal, the third response signal and the fourth response signal are synchronized, and a foundation is laid for calculating the calibration parameters of the earphone to be tested. The testing equipment is provided with a communication contact corresponding to the communication contact on the earphone to be tested.

It should be noted that the communication contact may be a metal contact on the headset to be tested. The metal contact can be the original charging contact of the earphone to be tested or a special contact which is additionally arranged on the earphone to be tested and used for communication. It should be understood that the communication contact may also be other components of the headset to be tested that can implement communication connection, such as a metal shell of the headset, a metal screw on the shell, or other metal parts that can conduct electricity on the shell of the headset.

Step S230b, calculating a second transfer function of the feedforward path based on the first test signal, the third response signal and the fourth response signal after the synchronization processing;

after the earphone production test calibration equipment carries out synchronization processing on the first test signal, the third response signal and the fourth response signal, a second transfer function of the feedforward path is calculated based on the first test signal, the third response signal and the fourth response signal after the synchronization processing.

It should be noted that the premise of calculating the second transfer function of the feedforward path of the to-be-tested earphone is that the first test signal (i.e., the above excitation signal) sent by the test equipment, the third response signal of the feedforward microphone inside the to-be-tested earphone, and the fourth response signal collected by the test microphone of the test equipment are synchronous data. Based on step S220b, if the first test signal, the third response signal and the fourth response signal are asynchronous, the first test signal, the third response signal and the fourth response signal are processed synchronously, and the second transfer function of the feedforward path of the headset to be tested is calculated in this step.

In some possible embodiments, referring to fig. 8, fig. 8 shows a simplified feedforward noise suppression headphone, where x denotes a first test signal (i.e., an excitation signal) emitted by the device under test, y1 denotes a third response signal collected by a feedforward microphone of the headphone under test, and y2 denotes a fourth response signal collected by a test microphone of the device under test.

In some possible embodiments, the step of calculating the second transfer function of the feedforward path based on the synchronized first test signal, the third response signal and the fourth response signal in step S230b includes:

step S231b, calculating a third sub-transfer function from the first test signal to the feedforward microphone based on the third response signal after the synchronization processing;

after synchronizing the first test signal, the third response signal and the fourth response signal, the earphone production test calibration device calculates a third sub-transfer function from the first test signal to the feedback microphone based on the synchronized third response signal.

In one possible embodiment, the third sub-transfer function of the feedforward microphone of the headset under test is calculated by the following equations 1 to 9:

HP1 ═ FFT (x)/FFT (y1), equations 1-9. Where HP1 represents the third sub-transfer function of the first test signal to the feedforward microphone, FFT represents the fast fourier transform, IFFT represents the inverse fast fourier transform, x represents the first test signal (i.e. excitation signal) emitted by the device under test, and y1 represents the third response signal collected by the feedforward microphone of the headset under test. The third sub-transfer function from the first test signal to the feedforward microphone is calculated by the calculation formula HP1 FFT (x)/FFT (y 1).

Step S232b, calculating a fourth sub-transfer function from the first test signal to the test microphone based on the fourth response signal after the synchronization processing; the second transfer function includes the third sub-transfer function and the fourth sub-transfer function.

After synchronizing the first test signal, the third response signal and the fourth response signal, the earphone production test calibration device calculates a fourth sub-transfer function from the first test signal to the test microphone based on the fourth response signal after synchronization processing.

In one possible embodiment, the fourth sub-transfer function of the feedforward microphone of the headset under test is calculated by the following equations 1-10:

HP2 ═ FFT (x)/FFT (y2), equations 1-10. Where HP2 represents the fourth sub-transfer function of the first test signal to the test microphone, FFT represents the fast fourier transform, IFFT represents the inverse fast fourier transform, x represents the first test signal (i.e. excitation signal) that the test is from the device, and y2 represents the fourth response signal collected by the test microphone of the test device. The fourth sub-transfer function from the first test signal to the test microphone is calculated by the calculation formula HP2 FFT (x)/FFT (y 2).

Step S240b, calculating calibration parameters of the feedforward noise suppression filter according to the transfer function from the built-in speaker to the test microphone, the second transfer function and a second sub-preset target calibration function.

And on the basis of obtaining a second transfer function through calculation, the earphone production measurement calibration equipment calculates the calibration parameters of the feedforward noise suppression filter according to the transfer function from the built-in loudspeaker to the test microphone, the second transfer function and a second sub-preset target calibration function.

In one possible embodiment, please refer to fig. 8, in which the transfer function of the feedforward noise suppression filter is denoted as HFF, and y3 ═ IFFT (fft (x) · HP1 · HFF · HS2), equations 1-11 are satisfied.

y4 ═ IFFT (fft (x) HP2), equations 1-12.

y3+ y4, equations 1-13.

Equations 1-11 explain: y3 represents the final noise signal that the artificial ear (i.e. the test microphone) can hear after the external excitation signal x is picked up by the feedforward microphone 230, processed by the feedforward noise suppression filter FF, and played by the built-in speaker; HS2 is the electro-acoustic transfer function between the built-in speaker and the artificial ear, and HS2 can be found by the above equation 1-2.

Interpretation of equations 1-12: y4 represents the noise signal heard by the human ear after the external excitation signal x has passed through the acoustic transmission path from the test speaker to the artificial ear (wearing leakage, leakage through a pressure relief vent on the earpiece, etc.).

Interpretation of equations 1-13: the noise signal that the artificial ear eventually hears is the sum of the superposition of y3 and y 4. It should be noted that y — y3+ y4 is only an algebraic expression. In fact, because y3 is opposite in phase with respect to y4, the net effect is a subtraction. That is, the leakage noise expressed by y4, after cancellation by y3, the noise actually heard by the artificial ear (or human ear) is y.

Assuming that the preset second sub-preset target calibration function is h2, as shown in fig. 9, the expected residual noise signal is ydes for the excitation signal x: for the calculation formula of ydes, please refer to formulas 1-4.

From equations 1-4 and equations 1-13, y is obtained as yes, equations 1-14.

Namely: by setting the noise suppression parameters of the appropriate feedforward noise suppression filter, the residual noise heard at the ears of a human is consistent with the expected noise suppression effect after the excitation signal is suppressed by the noise suppression earphone.

Substituting equations 1-11, equations 1-12 into equations 1-13, and substituting equations 1-4 into equations 1-14 yields:

IFFT (FFT (x) · HP1 · HFF · HS2) + IFFT (FFT (x) · HP2) ═ IFFT (FFT (h2) · FFT (x)), equations 1-15;

eliminating x on both sides and eliminating IFFT operation, obtaining formula 1-16: HP1 HFF HS2+ HP2 FFT (h2),

through mathematical transformation, we get: HFF ═ (FFT (h2) -HP2))/(HP1 · HS2), equations 1-16; i.e., HFF ═ f (HP1, HP2, HS2, h2), formulas 1 to 16;

namely: the HFF is a function of HP1, HP2, and a second sub preset target calibration function h 2. From equations 1-16, it can be seen that the HFF already contains information of HP1, HP2, and HS2, i.e. material tolerance and assembly tolerance information of the headset to be tested.

After the transfer functions (i.e., equations 1-16) of the feedforward noise suppression filters are obtained, the feedforward noise suppression filters are adapted to specific parameters of the feedforward noise suppression filters, i.e., calibration parameters of the feedforward noise suppression filters, according to the resource settings of the feedforward noise suppression filter banks, such as how many biquad filters each filter bank is composed of, the gain range supported by each biquad filter, whether the gain can be configured in segments, and the like.

It should be understood that the present embodiment is only an example, and the hardware structure of the feedforward noise suppression filter is not a condition for limiting the present invention; different hardware implementations differ only in the way HFF is adapted to the specific hardware, but the way HFF is calculated is the same.

Through the calculated third sub-transfer function HP1 and fourth sub-transfer function HP2 of the feedforward microphone and the second sub-transfer function HS2 of the test microphone, and then according to HP1, HP2 and HS2 and according to a second sub-preset target calibration function, the noise suppression parameter of the feedforward noise suppression filter FF can be calculated. It can be seen from the implementation process that we have comprehensively considered the third sub-transfer function HP1 of the feedforward microphone characterizing the electro-acoustic characteristics of each earphone to be tested when calibrating the feedforward noise suppression filter, so that when calibrating the feedforward noise suppression filter, the noise suppression parameters of the feedforward noise suppression filter are compensated according to the difference of the third sub-transfer function HP1 of the feedforward microphone, and thus, the purpose of automatically calibrating each earphone is achieved.

In this embodiment, calibration is performed on the feedforward noise suppression earphone, the test device is first controlled to send a test signal to the earphone to be tested, and calibration parameters of the feedforward noise suppression filter of the earphone to be tested are calculated based on the test signal and an interaction signal between the earphone to be tested and the test device. Sending the calibration parameters to the earphone to be tested; and controlling the to-be-tested earphone to configure the calibration parameters to a feedforward noise suppression filter, and controlling the testing equipment to test the configured to-be-tested earphone.

Therefore, in this embodiment, according to the first test signal of the test device and the interactive signal of the to-be-tested earphone, the electroacoustic characteristic of the to-be-tested earphone is tested and calculated, and the customized calibration parameter matched with the difference (i.e., component tolerance, transducer tolerance, and assembly tolerance) of the electroacoustic characteristic of the to-be-tested earphone is configured to the feedforward noise suppression filter. Therefore, calibration compensation can be performed on each earphone to be detected in a targeted manner, namely, calibration parameters are accurately matched according to the specific conditions of component tolerance, transducer tolerance and assembly tolerance of the earphone to be detected, the noise suppression parameters of the feedforward noise suppression filter of each earphone to be detected are customized, the consistency of noise suppression indexes among different earphones to be detected is improved, and the detection yield of the feedforward noise suppression earphones is improved.

EXAMPLE III

Based on the same inventive concept, the application also provides a third embodiment, which is the same as the first embodiment. Only the differences between the third embodiment and the first embodiment will be described below. The third embodiment is different from the first embodiment in that:

in this embodiment, please refer to fig. 10, fig. 10 shows a simplified earphone to be tested, the earphone to be tested in fig. 10 is a hybrid noise suppression earphone, the earphone to be tested includes a built-in speaker 210, a feedforward microphone 230 and a feedback microphone 220, the noise suppression filter is a feedback noise suppression filter FB, the feedforward noise suppression filter FF and the built-in speaker 210 are sequentially and electrically connected to form a feedforward path, the built-in speaker 210, the feedback noise suppression filter FB and the feedback microphone 220 are sequentially and electrically connected to form a feedback path, the testing apparatus includes a testing microphone 130 (i.e., the above artificial ear) for testing the earphone to be tested, and a testing speaker 120 (i.e., the above artificial mouth) for sending a first testing signal to the earphone to be tested.

Reference numerals

308 and 309 in fig. 10 denote analog-digital converters for performing analog-digital conversion on sound signals collected by the feedforward microphone or the feedback microphone.

and the earphone production measurement calibration equipment calculates the calibration parameters of the earphone to be measured according to the excitation signal and the interaction signal of the earphone to be measured and the test equipment. Wherein the calibration parameters are a first sub-calibration parameter adjusted for the feedback noise suppression filter HFF and a second sub-calibration parameter adjusted for the feedforward noise suppression filter.

It should be noted that the first test signal in this embodiment is in the frequency range of 20hz to 20000 hz.

In some possible embodiments, step S200 specifically includes:

step S210c, acquiring a first response signal generated by the feedback microphone in response to the built-in loudspeaker; acquiring a second response signal generated by the test microphone in response to the built-in loudspeaker;

step S220c, if the first test signal, the first response signal and the second response signal are asynchronous, performing synchronous processing on the first test signal, the first response signal and the second response signal;

step S230c, calculating a first transfer function of the feedback path based on the synchronized first test signal, the first response signal and the second response signal;

step S240c, calculating a first sub-calibration parameter of the feedback noise suppression filter according to the first transfer function and a first sub-preset target calibration function;

it should be noted that, the specific operations of steps S210 c-S240 c refer to the operations of steps S210a and S240a in the first embodiment. And will not be described in detail herein.

Step S250c, acquiring a third response signal generated by the feedforward microphone in response to the first test signal; acquiring a fourth response signal generated by the test microphone in response to the first test signal;

step S260c, if the first test signal, the third response signal and the fourth response signal are asynchronous, performing synchronous processing on the first test signal, the third response signal and the fourth response signal;

step S270c, calculating a second transfer function of the feedforward path based on the first test signal, the third response signal and the fourth response signal after the synchronization processing;

step S280c, calculating calibration parameters of the feedforward noise suppression filter according to the transfer function from the built-in loudspeaker to the test microphone, the second transfer function and a second sub-preset target calibration function;

it should be noted that, the specific operations of steps S250 c-S280 c refer to the operations of step S210b and step S240b in the second embodiment. And will not be described in detail herein.

It should be noted that the first test signal in step S220c and the first test signal in step S260c may be test signals with the same or different frequencies.

Note that, reference numeral 301 in fig. 10 denotes an acquisition channel of the third response signal; 302 denotes a configuration channel of the first sub-calibration parameter; 303 denotes a configuration channel of the second sub-calibration parameter; 304 denotes an acquisition channel of the first response signal; reference numeral 305 denotes an acquisition channel for the second response signal and the fourth response signal.

S300, sending the calibration parameters to the to-be-tested earphone;

and the headset production measurement calibration equipment sends the calculated calibration parameters (including the first sub-calibration parameter and the second sub-calibration parameter) to the headset to be measured through a Bluetooth channel or a communication contact on the headset to be measured. And testing the earphone to be tested by the equipment to be tested.

And the earphone production measurement calibration equipment controls the earphone to be tested to configure the first sub-calibration parameter to a feedback noise suppression filter, controls the earphone to be tested to configure the second sub-calibration parameter to a feedforward noise suppression filter, and controls the test equipment to test the configured earphone to be tested.

In this embodiment, calibration is performed on the hybrid noise suppression earphone, the test device is first controlled to send a first test signal to the earphone to be tested, and calibration parameters of the earphone to be tested are calculated based on the first test signal and an interaction signal between the earphone to be tested and the test device. Sending the calibration parameters to the earphone to be tested; and controlling the to-be-tested earphone to configure the first sub-calibration parameter to a feedback noise suppression filter, controlling the to-be-tested earphone to configure the second sub-calibration parameter to a feedforward noise suppression filter, and controlling the test equipment to test the configured to-be-tested earphone.

Therefore, in this embodiment, according to the first test signal of the test device and the interactive signal of the to-be-tested earphone, the electroacoustic characteristic of the to-be-tested earphone is tested and calculated, and the customized calibration parameters matched with the difference (i.e., component tolerance, transducer tolerance, and assembly tolerance) of the electroacoustic characteristic of the to-be-tested earphone are configured to the feedforward noise suppression filter and the feedback noise suppression filter. Therefore, calibration compensation can be performed on each earphone to be tested in a targeted manner, namely, calibration parameters are accurately matched according to the specific conditions of component tolerance, transducer tolerance and assembly tolerance of the earphone to be tested, the noise suppression parameters of the feedforward noise suppression filter and the feedback noise suppression filter of each earphone to be tested are customized, the consistency of noise suppression indexes among different earphones to be tested is improved, and the detection yield of the hybrid noise suppression earphone is improved.

Example four

Based on the same inventive concept, please refer to fig. 12, the present application further provides a fourth embodiment, which is the same as the first embodiment. Only the differences between the embodiment four and the embodiment one will be described below.

The fourth embodiment is different from the first embodiment in that:

referring to fig. 11, the to-be-tested headphone further includes preset parameters of a frequency domain equalizer (hereinafter abbreviated as EQ: frequency-domain equalizer, which may also be written as an Audio equalizer filter, and may also be referred to as an EQ filter), which are referred to as EQ parameters. The earphone to be tested comprises a built-in loudspeaker, the testing equipment comprises a testing microphone, and the built-in loudspeaker and the testing microphone form a playing channel. It should be noted that reference numeral 310 in fig. 11 denotes a transducer assembly composed of an analog-to-digital converter and an amplifier.

One of the core test items of the earphone of the frequency response index (also called frequency response curve); for the active noise suppression earphone, in addition to testing the noise suppression index of the earphone, the test of the frequency response index is also included in the existing earphone test. After the earphone to be tested is assembled, the earphone to be tested is placed into a professional testing device for testing to check whether the earphone to be tested meets the factory standard or not. The method comprises the following steps that the earphone to be tested is placed into an artificial ear of the testing equipment, the testing equipment and the earphone to be tested are connected through a Bluetooth signal, and data and command transmission is completed; in the test process, the earphone to be tested plays a test signal (an excitation signal); the artificial ear microphone picks up the sound signal played by the built-in loudspeaker of the earphone and converts the sound signal into an electric signal, and the electric signal is sent to the tester. The tester analyzes the signals picked up by the artificial ear, calculates the frequency response curve of the earphone, selects a group of more suitable parameters from a plurality of groups of preset EQ parameters according to the test result and configures the parameters to a frequency domain equalizer arranged in the earphone until the frequency response curve meets the factory standard.

In the existing scheme, the frequency domain equalizer cannot perform accurate matching of the EQ parameters aiming at the component electrical characteristic tolerance (such as the built-in microphone frequency response curve tolerance of the earphone and the frequency response curve tolerance of an earphone speaker unit) and the assembly tolerance (the glue dispensing amount tolerance, the sealing tolerance of a cavity before and after the earphone and the like) of each noise-suppressing earphone, but gives a public version EQ parameter to the EQ according to a typical electro-acoustic characteristic of the noise-suppressing earphone, so that the frequency domain equalizer of the earphone to be tested lacks a method for accurately matching the EQ parameters due to the specific conditions of component difference, assembly individual difference and the like, and the problem of low product yield in the existing earphone test is caused.

Therefore, in the embodiment, in order to calibrate the EQ parameters of the frequency domain equalizer of the headphone to be tested, the product yield in the headphone test is improved. In this embodiment, the test signal includes a second test signal, and the frequency range of the second test signal is 20hz to 20000 hz.

In this embodiment, S110, controlling the testing device to send a second test signal to the to-be-tested earphone;

and the earphone production test calibration equipment controls the test equipment to send a second test signal to the earphone to be tested. For example, the headset production calibration device controls the test device to transmit a second test signal (excitation signal) to a play path built in the headset through bluetooth, and drives a speaker built in the headset to convert an electrical signal into an acoustic signal.

It should be noted that the second test signal (i.e. the excitation signal) of the present embodiment may be any one of various preset excitation signals, such as white noise, random noise, pink noise, and environmental noise. The environmental noise refers to sound generated in industrial production, building construction, transportation and social life and interfering with surrounding living environment, and includes airport noise, subway noise and the like.

It should be noted that the frequency range of the second test signal in this embodiment is a test signal including a continuous spectrum of 20hz to 20000 hz. In some embodiments, the second test signal comprises a continuous spectrum of frequencies in the range of 50hz to 10000 hz. In a preferred embodiment, the second test signal comprises a continuous spectrum with a frequency range of 200hz to 2000hz, and the first test signal of this embodiment comprises at least a continuous spectrum with a frequency range of 200hz to 2000hz, rather than a frequency sweep signal.

In some possible embodiments, the step S200 of calculating calibration parameters of the headset under test based on the test signal and the interaction signal of the headset under test and the test device includes:

step S210d, acquiring a fifth response signal generated by the to-be-tested earphone responding to the second test signal, and calculating a calibration parameter of the frequency domain equalizer of the to-be-tested earphone according to the fifth response signal and a third sub-preset target calibration function;

and the earphone production measurement calibration equipment calculates the calibration parameters of the earphone to be tested according to the fifth response signal (namely the excitation signal) and the interaction signal of the earphone to be tested and the test equipment. The calibration parameter is a calibration parameter adjusted for the frequency domain equalizer.

In some possible embodiments, step S210d includes:

step S211d, acquiring a fifth response signal generated by the test microphone in response to the second test signal;

and the earphone production test calibration equipment acquires a fifth response signal generated by the test microphone in response to the second test signal. And after the second test signal enters the earphone to be tested, the second test signal is filtered by the frequency domain equalizer, the digital-to-analog converter is converted into an analog signal, the analog signal is transmitted to the test microphone through the built-in loudspeaker and is picked up by the test microphone to obtain a fifth response signal.

It should be noted that, in some possible embodiments, the headset production test calibration device and the headset to be tested may obtain the fifth response signal through a bluetooth connection. In some other possible embodiments, the headset production calibration device obtains the fifth response signal by connecting with the communication contact on the headset to be tested.

The communication contact in the earphone to be tested comprises a charging contact or a reserved special data and clock transmission contact, and data and clock transmission can be completed through the charging contact or the special data and clock transmission contact. The data transfer is bidirectional and the clock transfer is unidirectional. The fifth response signal in the earphone to be tested can be transmitted to the earphone production test calibration equipment through the charging contact or the reserved special contact, and a foundation is laid for calculating the calibration parameters of the earphone to be tested. The testing equipment is provided with a communication contact corresponding to the communication contact on the earphone to be tested.

It should be noted that the communication contact may be a metal contact on the headset to be tested. The metal contact can be the original charging contact of the earphone to be tested or a special contact which is additionally arranged on the earphone to be tested and used for communication. It should be understood that the communication contact may also be other components of the headset to be tested that can implement communication connection, such as a metal casing of the headset.

Step S212d, if the second test signal and the fifth response signal are asynchronous, performing synchronous processing on the second test signal and the fifth response signal;

after the earphone production test calibration equipment acquires a fifth response signal, if the second test signal and the fifth response signal are in an asynchronous relation, the second test signal and the fifth response signal are synchronously processed.

It should be noted that, if the second test signal and the fifth response signal are in an asynchronous relationship, performing synchronous processing on the second test signal and the fifth response signal is a prerequisite step for calculating calibration parameters of the to-be-tested earphone.

In some possible embodiments, step S212d specifically includes:

step S2121d, when the test device is connected to the to-be-tested earphone via Bluetooth, the fifth response signal is synchronized to the clock domain of the second test signal via asynchronous resampling;

the earphone production measurement calibration device further comprises an Asynchronous resampling (ASRC) module, and the Asynchronous resampling module synchronizes the fifth response signal collected by the test microphone to the clock domain of the second test signal of the test device. And synchronizing the fifth response signal and the second test signal, and laying a foundation for calculating the calibration parameters of the earphone to be tested.

Alternatively, in some other possible embodiments, in step S2122d, when the testing device is connected to the headset to be tested through the communication contact, the fifth response signal and the clock signal are transmitted through the communication contact, so as to synchronize the second test signal and the fifth response signal.

The communication contact in the earphone to be tested comprises a charging contact or a reserved special data and clock transmission contact, and data and clock transmission can be completed through the charging contact or the special data and clock transmission contact. The data transfer is bidirectional and the clock transfer is unidirectional. The fifth response signal of the playing access in the earphone to be tested can be transmitted to the earphone production test calibration equipment through the charging contact or the reserved special contact, so that the synchronization of the second test signal and the fifth response signal is realized, and a foundation is laid for calculating the calibration parameters of the earphone to be tested. The testing equipment is provided with a communication contact corresponding to the communication contact on the earphone to be tested.

Step S213d, calculating a third transfer function of the playback path based on the synchronized second test signal and the fifth response signal;

after the earphone production test calibration equipment acquires the fifth response signal, the third transfer function of the playing channel is calculated based on the second test signal and the fifth response signal.

In some possible embodiments, referring to fig. 11, fig. 11 shows a simplified noise-suppressing earphone structure, where x denotes that the test is a first test signal (i.e., an excitation signal) emitted by the device, and y denotes a fifth response signal collected by a test microphone of the test device. It should be noted that the noise-suppressing headphone can be any one of a feedforward noise-suppressing headphone, a feedback noise-suppressing headphone, a hybrid noise-suppressing headphone, and a general headphone without a noise-reducing function.

In one possible embodiment, the third transfer function of the playback path is calculated by the following equations 1-17:

h1 fft (x)/fft (y), equations 1-17.

Where H1 denotes the third transfer function of the play path, FFT denotes the fast fourier transform, IFFT denotes the inverse fast fourier transform, x denotes that the test is the first test signal (i.e. excitation signal) emitted by the device, and y denotes the fifth response signal picked up by the test microphone of the test device. And calculating a third transfer function of the playing path in the earphone to be tested by using a calculation formula H1 ═ FFT (x)/FFT (y).

Step S214d, calculating calibration parameters of the frequency domain equalizer according to the third transfer function and the third sub-preset target calibration function.

After the third transfer function is obtained through calculation, the earphone production measurement calibration equipment calculates calibration parameters of the frequency domain equalizer according to the third transfer function and the third sub-preset target calibration function.

Referring to fig. 11, Hd represents a third sub-preset target calibration function, that is, Hd is HE · H1, equations 1-18.

Thus, equations 1 to 18 are obtained, HE — Hd/H1, and equations 1 to 19. Further, it is possible to obtain:

HE ═ f (Hd, HE), equations 1-19.

Wherein, HE represents the transfer function of the frequency domain equalizer built in the earphone to be tested after calibration by the invention. The HE is calculated based on a third transfer function H1 (electro-acoustic characteristics of the headphone to be tested) and a third sub-preset target calibration function of the playback path. For each earphone to be tested, each earphone to be tested has different degrees of assembly tolerance and material tolerance, and a third transfer function H1 of a playing path of each earphone to be tested always has certain discreteness; with equations 1-19, we can calibrate the calibration parameters (EQ parameters) for the electro-acoustic characteristics of each headphone under test.

Further, after obtaining a transfer function of a frequency domain equalizer built in the headphone to be tested, according to resource settings of the frequency domain equalizer (or EQ filter), for example, characteristics such as how many biquad filters each filter bank is composed of, a gain range supported by each biquad filter, whether gain can be configured in a segmented manner, and the like, a specific calibration parameter (i.e., EQ parameter) is adapted to the frequency domain equalizer.

It should be understood that the present embodiment is only an example, and the hardware structure of the frequency domain equalizer is not a condition for limiting the present invention; different hardware implementations differ only in the way HE is adapted to the specific hardware, but the way HE is calculated is the same.

Step S310, sending the calibration parameters of the frequency domain equalizer to the earphone to be tested;

and the earphone production measurement calibration equipment sends the calculated calibration parameters to the earphone to be tested through a Bluetooth channel or a communication contact on the earphone to be tested. And testing the earphone to be tested by the equipment to be tested.

And S410, controlling the to-be-tested earphone to configure the calibration parameters to the frequency domain equalizer, and controlling the test equipment to test the configured to-be-tested earphone.

And the earphone production test calibration equipment controls the earphone to be tested to configure the calibration parameters of the frequency domain equalizer to the frequency domain equalizer and controls the test equipment to test the configured earphone to be tested.

It should be noted that the earphone production calibration device can control the artificial ear of the testing device to judge the picked noise residue, and accordingly judge whether the frequency response curve meets the expectation.

The EQ parameters of the frequency domain equalizer can be calculated by calculating the third transfer function H1 of the play path and then according to the third transfer function H1 and the third sub-preset target calibration function Hd. As can be seen from the implementation process, in the present embodiment, when calibrating the frequency domain equalizer, the third sub-transfer function H1 that characterizes the electro-acoustic characteristics of each headphone to be tested is taken into consideration, so when calibrating the frequency domain equalizer, the EQ parameters of the frequency domain equalizer are compensated according to the difference of the third transfer function H1 of the play path, and thus the purpose of automatically calibrating the frequency domain equalizer of each headphone is achieved.

It should be noted that, in some other embodiments, the method for automatically calibrating the frequency domain equalizer of the headset under test can be applied to normal headsets or noise suppression headsets (including feedback noise suppression headsets, feedforward noise suppression headsets, and hybrid noise suppression headsets).

It is worth mentioning that, for the noise suppression headphone, the frequency domain equalizer of the present embodiment may be automatically calibrated, and then the noise suppression filter (including any one of the feedforward noise suppression filter, the feedback noise suppression filter, and the hybrid noise suppression filter) may be automatically calibrated. Alternatively, the automatic calibration of the noise suppression filter (including any of the feedforward noise suppression filter, the feedback noise suppression filter, and the hybrid noise suppression filter) is performed first, and then the automatic calibration of the frequency domain equalizer of the present embodiment is performed.

In this embodiment, calibration is performed on the frequency domain equalizer of the to-be-tested earphone, the test equipment is first controlled to send a second test signal to the to-be-tested earphone, and the calibration parameters of the to-be-tested earphone are calculated based on the second test signal and the interaction signal between the to-be-tested earphone and the test equipment. Sending the calibration parameters to the earphone to be tested; and controlling the to-be-tested earphone to configure the calibration parameters to a frequency domain equalizer, and controlling the testing equipment to test the configured to-be-tested earphone.

Therefore, in this embodiment, according to the second test signal of the test device and the interactive signal of the to-be-tested earphone, the electroacoustic characteristic of the to-be-tested earphone is tested and calculated, and the customized calibration parameter matched with the difference (i.e., component tolerance, transducer tolerance, and assembly tolerance) of the electroacoustic characteristic of the to-be-tested earphone is configured to the frequency domain equalizer. Therefore, calibration compensation can be performed on each earphone to be tested in a targeted manner, namely, calibration parameters are accurately matched according to the specific conditions of component tolerance, transducer tolerance and assembly tolerance of the earphone to be tested, the customization of EQ parameters of the frequency domain equalizer of each earphone to be tested is realized, the improvement of frequency response index consistency among different earphones to be tested is realized, and the detection yield of the earphones to be tested is improved.

Referring to fig. 13, the present application further provides an earphone production measurement calibration apparatus, including: a first control module 101, a calculation module 102, a transmission module 103, and a second control module 104.

The first control module 101 is used for controlling the test equipment to send a test signal to the earphone to be tested;

the calculation module 102 calculates calibration parameters of the to-be-tested earphone based on the test signal and the interaction signal of the to-be-tested earphone and the test equipment;

the sending module 103 is configured to send the calibration parameter to the to-be-tested earphone;

the second control module 104 is configured to control the to-be-tested earphone to configure the calibration parameter to the noise suppression filter, and control the test device to test the configured to-be-tested earphone.

The steps implemented by each functional module of the earphone production measurement and calibration device can refer to each embodiment of the earphone production measurement and calibration method of the present application, and are not described herein again.

The application also provides an earphone test system, which comprises a test device for testing the earphone to be tested and the earphone production test calibration device. The testing equipment is in communication connection with the earphone to be tested, and the earphone to be tested comprises a second communication contact for communicating with the first communication contact, a frequency domain equalizer, a second Bluetooth communication module in wireless communication with the earphone production testing calibration equipment and a noise suppression filter.

The second Bluetooth communication module is used for sending the interactive signal of the earphone to be tested and the test equipment through Bluetooth. It will be noted that the second bluetooth communication module may use various bluetooth communication modules on the market, and the bluetooth communication module is composed of a wireless transceiver (RF), a baseband controller (BB) and a link management Layer (LMP) of a bluetooth protocol stack.

It should be noted that the second communication contact may be a metal contact on the headset to be tested. The metal contact can be the original charging contact of the earphone to be tested or a special contact which is additionally arranged on the earphone to be tested and used for communication. It should be understood that the second communication contact may also be other components of the headset to be tested that can implement communication connection, such as a metal housing of the headset to be tested.

It should be noted that, in the feedforward noise suppression headphone, the headphone to be tested includes a feedforward noise suppression filter and a frequency domain equalizer, and at this time, the headphone production measurement calibration apparatus executes the headphone production measurement calibration method as described in the first embodiment and the fourth embodiment.

In the feedback noise suppression earphone, the earphone to be tested includes a feedback noise suppression filter and a frequency domain equalizer, and at this time, the earphone production measurement calibration device executes the earphone production measurement calibration method as described in the second embodiment and the fourth embodiment.

In the hybrid noise suppression headphone, the headphone to be tested includes a feedforward noise suppression filter, a feedback noise suppression filter, and a frequency domain equalizer, and at this time, the headphone production measurement calibration apparatus executes the headphone production measurement calibration method as described in the third embodiment and the fourth embodiment.

In the three noise-suppressing earphones and the common earphone without the noise-suppressing function, the earphone production measurement and calibration device can execute the earphone production measurement and calibration method as described in the fourth embodiment.

The present application also proposes a computer-readable storage medium storing one or more programs, which are executable by one or more processors to implement the steps in the headset production calibration method.

The present invention further provides a computer program product comprising a computer program, which when executed by a processor implements the steps of the method for calibrating the production of earphones according to the above, and embodiments of the apparatus for calibrating the production of earphones according to the present invention, a computer readable storage medium and a computer program product according to the present invention can be referred to, and will not be described herein.

As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.

The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

It should be noted that in the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The application can be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The usage of the words first, second and third, etcetera do not indicate any ordering. These words may be interpreted as names.

While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all alterations and modifications as fall within the scope of the application.

It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.

Claims

1. The method for calibrating the production test of the earphone is characterized by being applied to an earphone test system, wherein the earphone test system comprises: the testing equipment is used for testing the earphone to be tested, the testing equipment is in communication connection with the earphone to be tested, and the earphone production testing and calibrating method comprises the following steps:

calculating calibration parameters of the earphone to be tested based on the test signal and the interactive signal of the earphone to be tested and the test equipment;

sending the calibration parameters to the earphone to be tested;

and controlling the to-be-tested earphone to configure the calibration parameters to the to-be-tested earphone, and controlling the test equipment to test the configured to-be-tested earphone.

2. The method of claim 1, wherein the headset under test comprises an internal speaker and a feedback microphone, the noise suppression filter is a feedback noise suppression filter, the internal speaker, the feedback noise suppression filter and the feedback microphone are electrically connected in sequence to form a feedback path, and the test equipment comprises a test microphone; the test signal comprises a first test signal, and the first test signal is a test signal with a frequency range including a frequency spectrum of 20 hz-20000 hz;

the step of calculating the calibration parameters of the headset to be tested based on the test signal and the interaction signal of the headset to be tested and the test equipment comprises:

3. The method of claim 1, wherein the headset under test further comprises an internal speaker and a feedforward microphone, the noise suppression filter is a feedforward noise suppression filter, the feedforward microphone, the feedforward noise suppression filter and the internal speaker are electrically connected in sequence to form a feedforward path, and the testing equipment comprises a testing microphone; the test signal comprises a first test signal, and the first test signal is a test signal with a frequency range including a frequency spectrum of 20 hz-20000 hz;

4. The method of claim 1, wherein the headset under test further comprises an internal speaker, a feedforward microphone and a feedback microphone, the noise suppression filter comprises a feedforward noise suppression filter and a feedback noise suppression filter, the internal speaker, the feedback noise suppression filter and the feedback microphone are electrically connected in sequence to form a feedback path, and the feedforward microphone, the feedforward noise suppression filter and the internal speaker are electrically connected in sequence to form a feedforward path; the test device comprises a test microphone; the test signal comprises a first test signal, and the first test signal is a test signal with a frequency range including a frequency spectrum of 20 hz-20000 hz;

5. The method according to claim 2 or 4, wherein the step of calculating the first transfer function of the feedback path based on the synchronized first test signal, the first response signal and the second response signal comprises:

the first transfer function includes the first sub-transfer function and the second sub-transfer function.

6. The method of claim 3 or 4, wherein the step of calculating the second transfer function of the feedforward path based on the synchronously processed first test signal, third response signal and fourth response signal comprises:

7. The method of claim 2 or 4, wherein synchronizing the first test signal, the first response signal, and the second response signal comprises:

8. The method of claim 3 or 4, wherein synchronizing the first test signal, the third response signal, and the fourth response signal comprises:

9. The method of claim 1, wherein the under-test earphone further comprises a frequency domain equalizer, the test signal comprises a second test signal, and the second test signal is a test signal with a frequency range including 20hz to 20000hz spectrum; the step of calculating calibration parameters of the headset to be tested based on the test signal and the interaction signal of the headset to be tested and the test equipment comprises the following steps:

and acquiring a fifth response signal generated by the to-be-tested earphone responding to the second test signal, and calculating the calibration parameter of the frequency domain equalizer of the to-be-tested earphone according to the fifth response signal and a third sub-preset target calibration function.

10. The method of claim 9, wherein the headset under test comprises a built-in speaker, the test equipment comprises a test microphone, and the built-in speaker and the test microphone form a playback path;

the step of obtaining a fifth response signal generated by the to-be-tested earphone responding to the second test signal, and calculating the calibration parameter of the frequency domain equalizer of the to-be-tested earphone according to the fifth response signal and a third sub-preset target calibration function comprises:

11. The method of claim 10, wherein synchronizing the second test signal and the fifth response signal comprises:

12. The method of claim 1, wherein the test signal comprises any one of white noise, random noise, pink noise, and ambient noise.

13. The method of any of claims 2-4, wherein the first test signal comprises a frequency spectrum in the frequency range of 20hz to 5000 hz.

14. The method of claim 13, wherein the first test signal comprises a frequency spectrum in a frequency range of 150hz to 300 hz.

15. A method according to claim 9 or 10, wherein the second test signal comprises a frequency spectrum in the frequency range of 50hz to 10000 hz.

16. The method of claim 15, wherein the second test signal comprises a frequency spectrum in a frequency range of 200hz to 2000 hz.

17. An earphone production calibration device, comprising a processor, an asynchronous resampling module connected to the processor, a first communication contact communicatively connected to the processor, a memory electrically connected to the processor, and an earphone production calibration program stored on the memory and executable on the processor; the processor further comprises a first bluetooth communication module for wireless communication, the headset production calibration program when executed by the processor implementing the steps of the headset production calibration method according to any one of claims 1 to 16.

18. An earphone test system, characterized in that the earphone test system comprises a test device for testing an earphone to be tested, and the earphone production test calibration device of claim 17; the testing equipment is in communication connection with the earphone to be tested, and the earphone to be tested comprises a second communication contact for communicating with the first communication contact, a frequency domain equalizer, a second Bluetooth communication module in wireless communication with the earphone production testing calibration equipment and a noise suppression filter.

19. A computer readable storage medium storing one or more programs, the one or more programs being executable by one or more processors to perform the steps in the headset production calibration method of any of claims 1 to 16.