CN113313664A - Stone image analysis method based on stone processing - Google Patents
Stone image analysis method based on stone processing Download PDFInfo
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- CN113313664A CN113313664A CN202010082641.1A CN202010082641A CN113313664A CN 113313664 A CN113313664 A CN 113313664A CN 202010082641 A CN202010082641 A CN 202010082641A CN 113313664 A CN113313664 A CN 113313664A
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- 239000004575 stone Substances 0.000 title claims abstract description 106
- 238000003703 image analysis method Methods 0.000 title claims abstract description 28
- 238000004458 analytical method Methods 0.000 claims abstract description 22
- 238000010191 image analysis Methods 0.000 claims abstract description 22
- 238000003754 machining Methods 0.000 claims abstract description 22
- 238000000034 method Methods 0.000 claims abstract description 9
- 238000006243 chemical reaction Methods 0.000 claims abstract description 7
- 230000007547 defect Effects 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 5
- 230000002950 deficient Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/12—Edge-based segmentation
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30132—Masonry; Concrete
Abstract
A stone image analysis method based on stone machining, performed by an image analysis system comprising a shooting unit, said method being adapted to analyze an image of a stone to be machined shot by said shooting unit, and comprising the steps of: (A) acquiring at least shooting set data according to the stone image to be processed; (B) shooting the stone to be processed according to the at least one shooting setting data to obtain at least one target image corresponding to the at least one shooting setting data; (C) performing gray-scale and binary conversion on the at least one target image to obtain at least one converted image; and (D) analyzing the at least one converted image to generate analysis data including edge position information related to the edge position of the stone to be processed.
Description
Technical Field
The invention relates to an image analysis method, in particular to a stone image analysis method based on stone machining.
Background
In the stone processing industry, before processing stone, the shape and size of the stone must be measured before the stone can be processed. The existing measuring method is to measure the stone manually by using a ruler to obtain the shape and size of the stone.
However, it is time-consuming to measure the shape and size of the stone manually, and it is time-consuming and labor-consuming to measure the stone with irregular complicated shape due to the variety of the stone shapes.
Therefore, how to provide a method capable of improving the efficiency of measuring stone is the primary subject to be solved by the present invention.
Disclosure of Invention
The invention aims to provide a stone image analysis method based on stone processing, which can improve stone measurement efficiency.
The stone image analysis method based on stone machining is executed by an image analysis system, the image analysis system comprises a shooting unit, the method is suitable for analyzing the stone image to be machined of the stone to be machined shot by the shooting unit, and comprises a step (A), a step (B), a step (C) and a step (D).
In the step (a), the image analysis system obtains at least one shooting setting data according to the stone image to be processed.
In the step (B), the image analysis system photographs the stone to be processed according to the at least one photographing setting data to obtain at least one target image corresponding to the at least one photographing setting data.
In the step (C), the image analysis system performs grayscaling and binarization conversion on the at least one target image to obtain at least one converted image.
In the step (D), the image analysis system analyzes the at least one converted image to generate analysis data including edge position information related to the edge position of the stone to be processed.
Preferably, in the stone image analysis method based on stone processing of the present invention, in the step (a), each photographing setting data includes at least one of a shutter speed and an aperture value associated with the image photographing unit.
Preferably, in the stone image analysis method based on stone processing of the present invention, the image analysis system stores processing parameter data, and further includes the following steps after the step (D):
(E) and generating processing path position information related to a processing path according to the edge position information of the analysis data and the processing parameter data.
Preferably, the stone image analysis method based on stone processing of the present invention, step (E) includes the following substeps:
(E-1) obtaining rectangle position information related to a position of a maximum inscribed rectangle in the stone material to be processed, based on the edge position information of the analysis data; and
and (E-2) generating the processing path position information according to the processing parameter data and the rectangle position information.
Preferably, in the method for analyzing stone image based on stone processing according to the present invention, the processing parameter data includes a cutting shape and a cutting size associated with the cutting shape, in the step (E-2), the processing path associated with the processing path position information is associated with the cutting shape, and the processing path is within the maximum inscribed rectangle.
Preferably, in the stone image analyzing method based on stone processing of the present invention, in the step (a), the image analyzing system obtains first photographing setting data and second photographing setting data according to the stone image to be processed, in the step (B), the image analyzing system photographs the stone to be processed according to the first photographing setting data and the second photographing setting data to obtain a first target image corresponding to the first photographing setting data and a second target image corresponding to the second photographing setting data, in the step (C), the image analyzing system performs gray-scale and binary conversion on the first target image and the second target image to obtain a first converted image corresponding to the first target image and a second converted image corresponding to the second target image, in the step (D), the analysis data further includes defect location information associated with at least one defect pattern, and the image analysis system analyzes the first converted image to obtain the edge location information and analyzes the second converted image to obtain the defect location information.
Preferably, in the stone image analysis method based on stone processing of the present invention, the image analysis system stores processing parameter data, and further includes the following steps after the step (D):
(F) and generating processing path position information related to a processing path according to the edge position information and the flaw position information of the analysis data and the processing parameter data.
Preferably, the stone image analysis method based on stone processing of the present invention, step (F) includes the following substeps:
(F-1) obtaining rectangle position information related to a position of a maximum inscribed rectangle in the stone material to be processed, based on the edge position information and the flaw position information of the analysis data; and
(F-2) generating the processing path position information according to the processing parameter data and the rectangle position information.
Preferably, in the stone image analysis method based on stone processing of the present invention, in the step (F-1), the at least one defective figure is not included in the maximum inscribed rectangle.
The invention has the beneficial effects that: and after the image analysis system analyzes the at least one converted image, generating the analysis data comprising the edge position information so as to quickly obtain the shape and the size of the stone to be processed.
Drawings
Other features and effects of the present invention will become apparent from the following detailed description of the embodiments with reference to the accompanying drawings, in which:
fig. 1 is a block diagram illustrating an image analysis system for implementing an embodiment of the stone image analysis method based on stone processing according to the present invention;
FIG. 2 is a schematic view illustrating an image of a stone to be processed;
fig. 3 is a flow chart illustrating the embodiment of the stone image analysis method based on stone processing according to the present invention;
FIG. 4 is a diagram illustrating a first converted image;
FIG. 5 is a diagram illustrating a second converted image;
FIG. 6 is a flow chart that facilitates an explanation of substeps of step 25 of FIG. 3; and
fig. 7 is a schematic view illustrating a maximum inscribed rectangle in a stone to be processed.
Detailed Description
Before the present invention is described in detail, it should be noted that in the following description, similar components are denoted by the same reference numerals.
Referring to fig. 1, an embodiment of the stone image analysis method based on stone processing according to the present invention is an image analysis system 1, wherein the image analysis system 1 includes a storage unit 11, a shooting unit 12, and a processing unit 13 electrically connected to the storage unit 11 and the shooting unit 12, and the embodiment of the stone image analysis method based on stone processing according to the present invention is suitable for analyzing an image of a stone to be processed, which is shot by the shooting unit 12, of a stone to be processed (as shown in fig. 2).
The storage unit 11 stores processing parameter data including a cutting shape, such as an arbitrary shape of a rectangle, a circle, a triangle, an ellipse, and a cutting size associated with the cutting shape.
The photographing unit 12 includes a field light source Device and a Charge-coupled Device (CCD). It should be noted that, in the present embodiment, the user can control the field light source device according to the requirement, so that the field light source device gives the optimal light source.
Referring to fig. 1 and 3, how the image analysis system 1 performs the embodiment of the stone image analysis method based on stone processing according to the present invention is described. The steps involved in this example are described in detail below.
In step 21, the processing unit 13 obtains at least one shooting setting data according to the stone image to be processed, wherein each shooting setting data includes at least one of a shutter speed and an aperture value related to the image shooting unit 12. It should be noted that, in the embodiment, the processing unit 13 obtains a first shooting setting data and a second shooting setting data according to the stone image to be processed, and in other embodiments, the processing unit 13 can also obtain only one shooting setting data according to the stone image to be processed, which is not limited thereto.
In step 22, the processing unit 13 controls the photographing unit 12 to photograph the stone to be processed according to the at least one photographing setting data, so as to obtain at least one target image corresponding to the at least one photographing setting data. It should be noted that, in the present embodiment, the processing unit 13 controls the shooting unit 12 to shoot the stone to be processed according to the first shooting setting data and the second shooting setting data to obtain a first target image corresponding to the first shooting setting data and a second target image corresponding to the second shooting setting data, in other embodiments, the processing unit 13 may also obtain a target image according to the shooting setting data only, which is not limited thereto.
In step 23, the processing unit 13 performs graying and binarization conversion on the at least one target image to obtain at least one converted image. It should be noted that, in the present embodiment, the processing unit 13 performs graying and binarization on the first target image and the second target image to obtain a first converted image corresponding to the first target image (as shown in fig. 4) and a second converted image corresponding to the second target image (as shown in fig. 5), in other embodiments, the processing unit 13 may also obtain a converted image only according to the target image, and the disclosure is not limited thereto.
In step 24, the processing unit 13 analyzes the at least one converted image to generate an analysis data, which includes an edge position information related to the edge position of the stone to be processed and a defect position information related to the position of at least one defect pattern. It should be noted that, in the embodiment, the processing unit 13 analyzes the first converted image to obtain the edge position information and analyzes the second converted image to obtain the defect position information, in other embodiments, the processing unit 13 may also generate analysis data only including the edge position information according to the converted image, which is not limited thereto.
It should be noted that, since the features of the present invention are not known to those skilled in the art to convert the edge position of the stone to be processed and the position of the at least one defect pattern in the at least one converted image into the relative position of the stone to be processed, their details are omitted here for the sake of brevity.
In step 25, the processing unit 13 generates a machining path position information associated with a machining path according to the analysis data and the machining parameter data, wherein the machining path associated with the machining path position information is associated with the cutting shape of the machining parameter data.
Referring collectively to fig. 6, step 25 includes the following substeps.
In step 251, the processing unit 13 obtains a rectangle position information related to a position of a maximum inscribed rectangle (as shown in fig. 7) in the stone material to be processed according to the edge position information and the defect position information of the analysis data, wherein the maximum inscribed rectangle does not include the at least one defect pattern. It is to be noted that, in the present embodiment, the processing unit 13 obtains the maximum inscribed rectangle by using a traversal center diffusion method (traversal center diffusion method) or a rotational histogram method (rotation histogram method). It should be noted that, in other embodiments, the processing unit 13 may also obtain the rectangular position information only according to the edge position information of the analysis data, which is not limited thereto.
In step 252, the processing unit 13 generates the processing path position information according to the processing parameter data and the rectangle position information, wherein the processing path is within the maximum inscribed rectangle.
In summary, in the stone image analysis method based on stone processing of the present invention, after the processing unit 13 analyzes the at least one converted image, the analysis data is generated to quickly obtain the shape and size of the stone to be processed according to the edge position information of the analysis data, the rectangular position information is obtained according to the flaw position information of the analysis data, and finally, the processing path position information is automatically generated according to the processing parameter data and the rectangular position information, so the objective of the present invention can be achieved.
The above description is only an example of the present invention, and the scope of the present invention should not be limited thereby, and the invention is still within the scope of the present invention by simple equivalent changes and modifications made according to the claims and the contents of the specification.
Claims (9)
1. A stone image analysis method based on stone machining, performed by an image analysis system comprising a shooting unit, said method being suitable for analyzing a stone image to be machined of a stone to be machined shot by said shooting unit, characterized in that: and comprises the following steps:
(A) obtaining at least one shooting set data according to the stone image to be processed;
(B) shooting the stone to be processed according to the at least one shooting setting data to obtain at least one target image corresponding to the at least one shooting setting data;
(C) performing gray-scale and binary conversion on the at least one target image to obtain at least one converted image; and
(D) the at least one converted image is analyzed to generate analysis data including edge position information related to an edge position of the stone to be processed.
2. The stone image analysis method based on stone machining as claimed in claim 1, wherein: in the step (a), each photographing setting data includes at least one of a shutter speed and an aperture value related to the image photographing unit.
3. The stone image analysis method based on stone machining as claimed in claim 1, wherein: the image analysis system stores processing parameter data and further comprises the following steps after step (D):
(E) and generating processing path position information related to a processing path according to the edge position information of the analysis data and the processing parameter data.
4. A stone image analysis method based on stone machining as claimed in claim 3, characterized in that: step (E) comprises the sub-steps of:
(E-1) obtaining rectangle position information related to a position of a maximum inscribed rectangle in the stone material to be processed, based on the edge position information of the analysis data; and
and (E-2) generating the processing path position information according to the processing parameter data and the rectangle position information.
5. A stone image analysis method based on stone machining as claimed in claim 4, characterized in that: the machining parameter data includes a cutting shape, and a cutting size associated with the cutting shape, and in step (E-2), the machining path to which the machining path position information is associated with the cutting shape, and the machining path is within the maximum inscribed rectangle.
6. The stone image analysis method based on stone machining as claimed in claim 1, wherein: in step (a), the image analysis system obtains first photographing setting data and second photographing setting data according to the stone image to be processed, in step (B), the image analysis system photographs the stone to be processed according to the first photographing setting data and the second photographing setting data to obtain a first target image corresponding to the first photographing setting data and a second target image corresponding to the second photographing setting data, in step (C), the image analysis system performs gray-scale conversion and binarization conversion on the first target image and the second target image to obtain a first converted image corresponding to the first target image and a second converted image corresponding to the second target image, in step (D), the analysis data further includes defect position information related to at least one defect pattern, and the image analysis system analyzes the first converted image to obtain the edge position information and analyzes the second converted image to obtain the flaw position information.
7. The stone image analysis method based on stone machining as claimed in claim 6, wherein: the image analysis system stores processing parameter data and further comprises the following steps after step (D):
(F) and generating processing path position information related to a processing path according to the edge position information and the flaw position information of the analysis data and the processing parameter data.
8. A stone image analysis method based on stone machining as claimed in claim 7, characterized in that: step (F) comprises the sub-steps of:
(F-1) obtaining rectangle position information related to a position of a maximum inscribed rectangle in the stone material to be processed, based on the edge position information and the flaw position information of the analysis data; and
(F-2) generating the processing path position information according to the processing parameter data and the rectangle position information.
9. A stone image analysis method based on stone machining as claimed in claim 8, characterized in that: in step (F-1), the at least one defective pattern is not included within the largest inscribed rectangle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010082641.1A CN113313664A (en) | 2020-02-07 | 2020-02-07 | Stone image analysis method based on stone processing |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010082641.1A CN113313664A (en) | 2020-02-07 | 2020-02-07 | Stone image analysis method based on stone processing |
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| CN113313664A true CN113313664A (en) | 2021-08-27 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103217436A (en) * | 2013-03-06 | 2013-07-24 | 京东方科技集团股份有限公司 | Backlight module group defect detection method and equipment |
| CN107154050A (en) * | 2017-05-03 | 2017-09-12 | 魏玉震 | A kind of automatic obtaining method of the stone material geometric parameter based on machine vision |
| CN107657641A (en) * | 2016-07-26 | 2018-02-02 | 聊城大学 | A kind of intelligent stone cutting method based on machine vision |
| JP2018156274A (en) * | 2017-03-16 | 2018-10-04 | 株式会社リコー | Image processing apparatus, image processing method, and program |
| CN110596134A (en) * | 2018-05-25 | 2019-12-20 | 上海翌视信息技术有限公司 | Sheet glass edge flaw detection method based on image acquisition |
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2020
- 2020-02-07 CN CN202010082641.1A patent/CN113313664A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103217436A (en) * | 2013-03-06 | 2013-07-24 | 京东方科技集团股份有限公司 | Backlight module group defect detection method and equipment |
| CN107657641A (en) * | 2016-07-26 | 2018-02-02 | 聊城大学 | A kind of intelligent stone cutting method based on machine vision |
| JP2018156274A (en) * | 2017-03-16 | 2018-10-04 | 株式会社リコー | Image processing apparatus, image processing method, and program |
| CN107154050A (en) * | 2017-05-03 | 2017-09-12 | 魏玉震 | A kind of automatic obtaining method of the stone material geometric parameter based on machine vision |
| CN110596134A (en) * | 2018-05-25 | 2019-12-20 | 上海翌视信息技术有限公司 | Sheet glass edge flaw detection method based on image acquisition |
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