CN113014438B - Multi-node testing method and device for whole cabinet - Google Patents
Multi-node testing method and device for whole cabinet Download PDFInfo
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- CN113014438B CN113014438B CN202110293677.9A CN202110293677A CN113014438B CN 113014438 B CN113014438 B CN 113014438B CN 202110293677 A CN202110293677 A CN 202110293677A CN 113014438 B CN113014438 B CN 113014438B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L41/00—Arrangements for maintenance, administration or management of data switching networks, e.g. of packet switching networks
- H04L41/08—Configuration management of networks or network elements
- H04L41/0876—Aspects of the degree of configuration automation
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/06—Generation of reports
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
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Abstract
The invention discloses a multi-node testing method and a device for an entire cabinet, wherein the method comprises the following steps: acquiring cabinet configuration information of a cabinet and network card information of a plurality of nodes in the cabinet; sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating each test server with a node as a test client corresponding to the node; configuring test environments of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client; performing a bidirectional test on the test server and the test client based on the test environment to generate a single link log; and determining the test results of the test servers based on the single link logs, and gathering the test results of all the test servers into the test result of the whole cabinet. The invention can execute automatic test aiming at different cabinets and node configurations, liberates manpower and improves efficiency.
Description
Technical Field
The present invention relates to the field of testing, and more particularly, to a method and an apparatus for testing multiple nodes of an entire cabinet.
Background
In order to ensure that a network link is stable and reliable, the whole cabinet node needs to perform pressurization test on the whole cabinet network during production test, the conventional scheme needs manual intervention, manual adjustment is performed according to the number of network cables configured on the node, automatic test cannot be performed, the application range is small, and increasingly complex test requirements cannot be met.
Aiming at the problems of complex operation, dependence on manpower and low efficiency of the whole cabinet in the prior art, no effective solution is available at present.
Disclosure of Invention
In view of this, an object of the embodiments of the present invention is to provide a method and an apparatus for testing multiple nodes of an entire cabinet, which can perform automatic testing for different cabinets and node configurations, liberate manpower, and improve efficiency.
Based on the above object, a first aspect of the embodiments of the present invention provides a method for testing multiple nodes of an entire cabinet, including the following steps:
acquiring cabinet configuration information of a cabinet and network card information of a plurality of nodes in the cabinet;
sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating each test server with a node as a test client corresponding to the node;
configuring test environments of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client;
performing a bidirectional test on the test server and the test client based on the test environment to generate a single link log;
and determining the test results of the test servers based on the single link logs, and gathering the test results of all the test servers into the test result of the whole cabinet.
In some embodiments, obtaining the enclosure configuration information comprises: the product serial number of the cabinet, the product serial number of each of the plurality of nodes, and the position of each of the plurality of nodes are obtained from the database, the number of the plurality of nodes is determined based on the number of the product serial numbers of each of the plurality of nodes, and the position of each of the plurality of nodes is determined based on the position of each of the plurality of nodes.
In some embodiments, obtaining the network card information for each of the plurality of nodes comprises performing the following steps on each node:
acquiring network card equipment names and PCIE equipment codes of all network cards on a node;
determining the PCIE equipment codes which are loaded to the specific network card equipment name and are distributed with the dynamic network address as the PCIE equipment to be tested;
and determining the PCIE equipment code of the PCIE equipment to be tested, the corresponding network card equipment name and the corresponding dynamic network address as the network card information of the node.
In some embodiments, assigning each test server a corresponding test client comprises:
responding to the odd node position of the test server, and designating the corresponding test client as the node position of the test server plus one corresponding node;
in response to the test server being the last node under test and the total number of nodes being an odd number, the corresponding test client is designated as the penultimate node.
In some embodiments, assigning each test server a node as the test client corresponding to the node further comprises:
in response to the node position of the test server being an even number, designating the corresponding test client as the node corresponding to the node position of the test server minus one;
the corresponding test client is designated as the last node in response to the test server being the penultimate node under test, the total number of nodes being an odd number, and the nodes of the test server having previously passed a test.
In some embodiments, configuring the test environment of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client comprises:
determining a dynamic network address of the test client in the network card information of the test client based on the product serial number of the test client;
establishing a link between the test server and the test client based on the dynamic network address to transmit network card information of the test server to the test client;
and checking the consistency of the network card information of the test server and the test client based on the network card information of the test server.
In some embodiments, the collecting the test results of all the test servers into the test results of the complete equipment cabinet includes: determining the test result of the whole cabinet as pass in response to the test results of all the test servers being pass; and determining the test result of the whole cabinet as not passing in response to the test result of the at least one test server being not passing.
A second aspect of an embodiment of the present invention provides an apparatus, including:
a processor; and
a memory storing program code executable by the processor, the program code when executed performing the steps of:
acquiring cabinet configuration information of a cabinet and network card information of a plurality of nodes in the cabinet;
sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating each test server as a test client corresponding to each node;
configuring test environments of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client;
performing a bidirectional test on the test server and the test client based on the test environment to generate a single link log;
and determining the test results of the test servers based on the single link logs, and gathering the test results of all the test servers into the test result of the whole cabinet.
In some embodiments, obtaining the enclosure configuration information comprises: acquiring the product serial number of the cabinet, the product serial numbers of the nodes and the positions of the nodes from a database, determining the number of the nodes based on the number of the product serial numbers of the nodes, and determining the position of each node based on the positions of the nodes;
acquiring the respective network card information of a plurality of nodes comprises executing the following steps on each node: acquiring network card equipment names and PCIE equipment codes of all network cards on a node; determining the PCIE equipment codes which are loaded to the specific network card equipment name and are distributed with the dynamic network address as the PCIE equipment to be tested; and determining the PCIE equipment code of the PCIE equipment to be tested, the corresponding network card equipment name and the corresponding dynamic network address as the network card information of the node.
In some embodiments, configuring the test environment of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client comprises:
determining a dynamic network address of the test client in the network card information of the test client based on the product serial number of the test client;
establishing a link between the test server and the test client based on the dynamic network address to transmit network card information of the test server to the test client;
and checking the consistency of the network card information of the test server and the test client based on the network card information of the test server.
The invention has the following beneficial technical effects: according to the multi-node testing method and device for the whole cabinet, the cabinet configuration information of the cabinet and the network card information of each of a plurality of nodes in the cabinet are obtained; sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating each test server as a test client corresponding to each node; configuring test environments of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client; performing a bidirectional test on the test server and the test client based on the test environment to generate a single link log; the technical scheme that the test results of the test servers are determined based on the single link logs and the test results of all the test servers are collected into the test result of the whole cabinet can be used for executing automatic tests aiming at different cabinets and node configurations, so that the labor is relieved, and the efficiency is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the prior art descriptions will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic flow chart of a multi-node testing method for an entire cabinet according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following embodiments of the present invention are described in further detail with reference to the accompanying drawings.
It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are used for distinguishing two entities with the same name but different names or different parameters, and it should be noted that "first" and "second" are only used for convenience of expression and should not be construed as a limitation to the embodiments of the present invention, and no description is given in the following embodiments.
Based on the above objectives, a first aspect of the embodiments of the present invention provides an embodiment of a multi-node testing method for an entire cabinet, which is capable of performing automated testing, releasing manual labor, and improving efficiency for different cabinets and node configurations. Fig. 1 is a flow chart illustrating a multi-node testing method for an entire cabinet provided by the present invention.
The multi-node testing method of the whole cabinet, as shown in fig. 1, includes the following steps:
step S101, acquiring cabinet configuration information of a cabinet and network card information of a plurality of nodes in the cabinet;
step S103, sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating each test server with a node as a test client corresponding to the node;
step S105, configuring the test environment of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client;
step S107, performing bidirectional test on the test server and the test client based on the test environment to generate a single link log;
step S109, determining the test results of the test servers based on the single link logs, and gathering the test results of all the test servers into the test result of the whole cabinet.
The invention needs to be configured with DHCP (dynamic host configuration protocol) service, database and iperf tool of Linux system; the node can be communicated with the server, information can be obtained from a server database, and the test needs to obtain information such as SN (product serial number) of the whole cabinet, SN of the node in the whole cabinet, position of the node on the cabinet and the like from the server, so that the information needs to be uploaded to the database from a production system so as to be convenient to capture, and if the information cannot be automatically transmitted, the maintenance needs to be carried out in advance.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by a computer program, which can be stored in a computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. The storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM), or a Random Access Memory (RAM). Embodiments of the computer program may achieve the same or similar effects as any of the preceding method embodiments corresponding thereto.
In some embodiments, obtaining the enclosure configuration information comprises: the product serial number of the cabinet, the product serial number of each of the plurality of nodes, and the position of each of the plurality of nodes are obtained from the database, the number of the plurality of nodes is determined based on the number of the product serial numbers of each of the plurality of nodes, and the position of each of the plurality of nodes is determined based on the position of each of the plurality of nodes.
In some embodiments, obtaining the network card information for each of the plurality of nodes comprises performing the following steps on each node:
acquiring network card equipment names and PCIE equipment codes of all network cards on a node;
determining the PCIE equipment codes which are loaded to the specific network card equipment name and are distributed with the dynamic network address as the PCIE equipment to be tested;
and determining the PCIE equipment code of the PCIE equipment to be tested, the corresponding network card equipment name and the corresponding dynamic network address as the network card information of the node.
In some embodiments, assigning each test server a node as the test client corresponding thereto comprises:
in response to the node position of the test server being an odd number, designating the corresponding test client as the node position of the test server plus a corresponding node;
in response to the test server being the last node under test and the total number of nodes being an odd number, the corresponding test client is designated as the penultimate node.
In some embodiments, assigning each test server a corresponding test client further comprises:
in response to the node position of the test server being an even number, designating the corresponding test client as the node corresponding to the node position of the test server minus one;
the corresponding test client is designated as the last node in response to the test server being the penultimate node under test, the total number of nodes being an odd number, and the nodes of the test server having previously passed a test.
In some embodiments, configuring the test environment of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client comprises:
determining a dynamic network address of the test client in the network card information of the test client based on the product serial number of the test client;
establishing a link between the test server and the test client based on the dynamic network address so as to transmit network card information of the test server to the test client;
and checking the consistency of the network card information of the test server and the test client based on the network card information of the test server.
In some embodiments, the step of aggregating the test results of all the test servers into a test result of the whole rack comprises: determining the test result of the whole cabinet as pass in response to the test results of all the test servers being pass; and determining the test result of the whole cabinet as not passing in response to the test result of the at least one test server being not passing.
The following further illustrates embodiments of the invention in terms of specific examples.
First the node test is performed under Linux OS (operating system). After the node enters the OS, acquiring the network card information of the node; obtaining PCIe (peripheral component interconnect express) device numbers of all network cards by using the lspci; and executing the ip addr command to acquire the network card device names of all the network cards. When the ethtoolol-I command is executed, the fact that the PCIe device number is contained in the name of the network card device is determined, and the device number has a dynamic IP (network address) acquired from the server is determined, the fact that the device is configured with a network cable is indicated, and a network port needs to be tested. And finally, redirecting the acquired network card equipment, network card PCIe equipment and network port IP addresses to iperfs.
And meanwhile, the information of the whole cabinet and the nodes is obtained from the database. The method specifically comprises the steps of obtaining SN, NODE SN and NODE position information of the whole cabinet, redirecting to a track. And simultaneously, the obtained information of the whole equipment cabinet SN, the node SN and the node position is redirected to iperfs.
Then, an iperf tool is used for testing a network link, two nodes are required to be tested in a bidirectional mode, and therefore a server end and a client end need to be mutually confirmed, and pairing needed by testing is provided for the nodes. On one hand, when the current position number NODE _ L _ NUM of the server end NODE is an odd number, the position number CLIENT _ L _ NUM of the corresponding CLIENT end NODE is added with 1 bit on the basis of the position number of the server end; however, if the total NODE number NODE _ ALL _ NUM is also odd and the NODE's current location number is the same as the total NODE number (i.e., the current NODE is the last NODE), then the CLIENT end NODE location number CLIENT _ L _ NUM is decremented by 1 bit based on the server end location number (i.e., the next to last NODE is selected).
On the other hand, similarly, when the current position number NODE _ L _ NUM of the server end NODE is an even number, the CLIENT end NODE position number CLIENT _ L _ NUM subtracts 1 bit on the basis of the server end position number; however, if the total number of NODEs NODE _ ALL _ NUM is odd, the NODE is the penultimate NODE of the whole cabinet, and when the iperf test Passed precedes the current NODE, the CLIENT end NODE location number CLIENT _ L _ NUM is incremented by 1 bit based on the server end location number (i.e., the last NODE is selected).
And after determining the server end and the client end, further configuring the environments of the server end and the client end. And acquiring a client end SN through the generated track. And meanwhile, copying the generated iperfs. Info file to the client end to obtain iperfc. Info so as to judge whether the ip addresses of the server end and the client end are consistent with the name number of the network card equipment.
And after the steps are executed, automatically testing the network link by using the acquired server and client side information. Specifically, all network card devices in the nodes are traversed by using for loop for testing. And obtaining the network card equipment name and the ip address of the server end through iperfs. The Server side executes iperf-s-B [ Server end ip address ] -P4 binding ip address and 4 threads, the client side executes iperf-c [ Server end ip address ] -B [ client end ip address ] -i 60-t 600-P4 to perform iperf test, and corresponding test results are input to the [ network card equipment name ]. Iperf. And finally, performing ethtoolol-S [ network card device name ] to collect related link logs.
And finally, utilizing a for loop to traverse all network card devices in the node to check the link log. When all log results pass, the Passed field is uploaded to the database.
As can be seen from the foregoing embodiments, in the multi-node testing method for the entire cabinet provided by the embodiments of the present invention, the cabinet configuration information of the cabinet and the network card information of each of the plurality of nodes in the cabinet are obtained; sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating each test server with a node as a test client corresponding to the node; configuring test environments of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client; performing a bidirectional test on the test server and the test client based on the test environment to generate a single link log; the technical scheme of determining the test results of the test servers based on the single link logs and gathering the test results of all the test servers into the test results of the whole cabinet can execute automatic tests aiming at different cabinets and node configurations, liberate manpower and improve efficiency.
It should be noted that, the steps in the embodiments of the multi-node testing method for the whole cabinet can be mutually intersected, replaced, added, or deleted, so that the multi-node testing method for the whole cabinet with these reasonable permutations and combinations should also belong to the protection scope of the present invention, and should not limit the protection scope of the present invention to the described embodiments.
In view of the above, a second aspect of the embodiments of the present invention provides an embodiment of a multi-node testing apparatus for an entire cabinet, which is capable of performing an automated test for different cabinets and node configurations, releasing manual labor, and improving efficiency. The device comprises:
a processor; and
a memory storing program code executable by the processor, the program code when executed performing the steps of:
acquiring cabinet configuration information of a cabinet and network card information of a plurality of nodes in the cabinet;
sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating each test server with a node as a test client corresponding to the node;
configuring test environments of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client;
performing a bidirectional test on the test server and the test client based on the test environment to generate a single link log;
and determining the test results of the test servers based on the single link logs, and gathering the test results of all the test servers into the test result of the whole cabinet.
In some embodiments, obtaining the enclosure configuration information comprises: acquiring the product serial number of the cabinet, the product serial numbers of the nodes and the positions of the nodes from a database, determining the number of the nodes based on the number of the product serial numbers of the nodes, and determining the position of each node based on the positions of the nodes;
acquiring the respective network card information of a plurality of nodes comprises executing the following steps on each node: acquiring network card equipment names and PCIE equipment codes of all network cards on a node; determining the PCIE equipment codes which are loaded to the specific network card equipment name and are distributed with the dynamic network address as the PCIE equipment to be tested; and determining the PCIE equipment code of the PCIE equipment to be tested, the corresponding network card equipment name and the corresponding dynamic network address as the network card information of the node.
In some embodiments, configuring the test environment of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client comprises:
determining a dynamic network address of the test client in the network card information of the test client based on the product serial number of the test client;
establishing a link between the test server and the test client based on the dynamic network address to transmit network card information of the test server to the test client;
and checking the consistency of the network card information of the test server and the test client based on the network card information of the test server.
As can be seen from the foregoing embodiments, in the apparatus provided in the embodiments of the present invention, the cabinet configuration information of the cabinet and the network card information of each of the plurality of nodes in the cabinet are obtained; sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating each test server as a test client corresponding to each node; configuring test environments of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client; performing a bidirectional test on the test server and the test client based on the test environment to generate a single link log; the technical scheme of determining the test results of the test servers based on the single link logs and gathering the test results of all the test servers into the test results of the whole cabinet can execute automatic tests aiming at different cabinets and node configurations, liberate manpower and improve efficiency.
It should be noted that, the above-mentioned embodiment of the apparatus adopts the embodiment of the multi-node testing method of the complete cabinet to specifically describe the working process of each module, and those skilled in the art can easily think that these modules are applied to other embodiments of the multi-node testing method of the complete cabinet. Of course, since the steps in the embodiment of the multi-node testing method for the entire cabinet can be mutually intersected, replaced, added, or deleted, these reasonable permutations and combinations should also fall within the scope of the present invention, and should not limit the scope of the present invention to the embodiment.
The foregoing are exemplary embodiments of the present disclosure, but it should be noted that various changes and modifications could be made herein without departing from the scope of the present disclosure as defined by the appended claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. Furthermore, although elements of the disclosed embodiments of the invention may be described or claimed in the singular, the plural is contemplated unless limitation to the singular is explicitly stated.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, of embodiments of the invention is limited to these examples; within the idea of an embodiment of the invention, also technical features in the above embodiment or in different embodiments may be combined and there are many other variations of the different aspects of an embodiment of the invention as described above, which are not provided in detail for the sake of brevity. Therefore, any omissions, modifications, substitutions, improvements, and the like that may be made without departing from the spirit and principles of the embodiments of the present invention are intended to be included within the scope of the embodiments of the present invention.
Claims (9)
1. A multi-node test method of a whole cabinet is characterized by comprising the following steps:
acquiring cabinet configuration information of a cabinet and network card information of a plurality of nodes in the cabinet;
sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating one node as a corresponding test client for each test server;
configuring the test environments of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client;
performing a bidirectional test on the test server and the test client based on the test environment to generate a single link log;
determining the test results of the test servers based on the single link logs, and gathering the test results of all the test servers into a test result of the whole cabinet;
wherein obtaining the network card information of each of the plurality of nodes comprises executing the following steps on each of the nodes: acquiring network card equipment names and PCIE equipment codes of all network cards on the node; determining the PCIE equipment codes which are loaded to the specific network card equipment name and distributed with the dynamic network address as PCIE equipment to be tested; and determining the PCIE equipment codes of the PCIE equipment to be tested, the corresponding network card equipment names and the corresponding dynamic network addresses as the network card information of the nodes.
2. The method of claim 1, wherein obtaining the cabinet configuration information comprises:
the product serial number of the cabinet, the product serial number of each of the plurality of nodes, and the position of each of the plurality of nodes are obtained from a database, the number of the plurality of nodes is determined based on the number of the product serial numbers of the plurality of nodes, and the position of each of the plurality of nodes is determined based on the position of each of the plurality of nodes.
3. The method of claim 1, wherein assigning each of the test servers a corresponding test client comprises:
responding to the node position of the test server being an odd number, and designating the corresponding test client as the node corresponding to the node position of the test server plus one;
designating the corresponding test client as a penultimate node in response to the test server being the last node under test and the total number of nodes being an odd number.
4. The method of claim 1, wherein assigning each of the test servers one of the nodes as a test client corresponding thereto further comprises:
in response to the node position of the test server being an even number, designating the corresponding test client as the node corresponding to the node position of the test server minus one;
designating the corresponding test client as a last node in response to the test server being a penultimate node under test, the total number of nodes being an odd number, and the nodes of the test server having previously passed a test.
5. The method of claim 1, wherein configuring the test environment of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client comprises:
determining the dynamic network address of the test client in the network card information of the test client based on the product serial number of the test client;
establishing a link between the test server and the test client based on the dynamic network address to transmit the network card information of the test server to the test client;
and checking the consistency of the network card information of the test server and the test client based on the network card information of the test server.
6. The method of claim 1, wherein aggregating the test results of all of the test servers into a complete rack test result comprises:
determining the test result of the whole cabinet as pass in response to the test results of all the test servers being pass; and determining the test result of the whole cabinet as not passing in response to the test result of at least one test server being not passing.
7. A multi-node testing device of a complete machine cabinet is characterized by comprising:
a processor; and
a memory storing program code executable by the processor, the program code when executed performing the steps of:
acquiring cabinet configuration information of a cabinet and network card information of a plurality of nodes in the cabinet;
sequentially designating each node as a test server in a plurality of nodes based on the cabinet configuration information, and designating one node as a corresponding test client for each test server;
configuring the test environments of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client;
performing a bidirectional test on the test server and the test client based on the test environment to generate a single link log;
determining the test results of the test servers based on the single link logs, and gathering the test results of all the test servers into a test result of the whole cabinet;
wherein obtaining the network card information of each of the plurality of nodes comprises executing the following steps on each of the nodes: acquiring network card equipment names and PCIE equipment codes of all network cards on the node; determining the PCIE equipment codes which are loaded to the specific network card equipment name and distributed with the dynamic network address as PCIE equipment to be tested; and determining the PCIE equipment code of the PCIE equipment to be tested, the corresponding name of the network card equipment and the corresponding dynamic network address as the network card information of the node.
8. The apparatus of claim 7, wherein obtaining the cabinet configuration information comprises: the product serial number of the cabinet, the product serial number of each of the plurality of nodes, and the position of each of the plurality of nodes are obtained from a database, the number of the plurality of nodes is determined based on the number of the product serial numbers of the plurality of nodes, and the position of each of the plurality of nodes is determined based on the position of each of the plurality of nodes.
9. The apparatus of claim 8, wherein configuring the test environment of the test server and the test client based on the cabinet configuration information and the network card information of the test server and the test client comprises:
determining the dynamic network address of the test client in the network card information of the test client based on the product serial number of the test client;
establishing a link between the test server and the test client based on the dynamic network address to transmit the network card information of the test server to the test client;
and checking the consistency of the network card information of the test server and the test client based on the network card information of the test server.
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