CN112986799A - FCT test fixture and method - Google Patents
FCT test fixture and method Download PDFInfo
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- CN112986799A CN112986799A CN202110185448.5A CN202110185448A CN112986799A CN 112986799 A CN112986799 A CN 112986799A CN 202110185448 A CN202110185448 A CN 202110185448A CN 112986799 A CN112986799 A CN 112986799A
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- 238000010408 sweeping Methods 0.000 claims description 7
- 238000011990 functional testing Methods 0.000 claims description 6
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses an FCT test fixture and a method, wherein the FCT test fixture is provided with a test device, the test device comprises an MCU (microprogrammed control Unit) main control circuit, a power supply module, an infrared emission circuit, a current and voltage detection module, a peripheral function test port module and an alarm circuit, the power supply module, the infrared emission circuit, the current and voltage detection module, the peripheral function test port module and the alarm circuit are electrically connected with the MCU main control circuit, the peripheral function test port module comprises one or more test connection circuits, each test connection circuit comprises a connection terminal, and each pin of the connection terminals is grounded through a resistor and a voltage stabilizing tube respectively; the invention can test according to the test requirements of a plurality of different functional modules of the circuit board to be tested, can test and judge whether the circuits of all the functional modules of the circuit main board of the sweeper are normal in a short time, and effectively improves the working efficiency.
Description
Technical Field
The invention relates to the field of FCT (Flexible Circuit test), in particular to an FCT test fixture and an FCT test method.
Background
With the continuous development of artificial intelligence technology, more and more intelligent homes are produced, and the appearance of the sweeper gradually replaces manual cleaning and is accepted by more and more people. A sweeping robot (also called an automatic sweeper, an intelligent dust collector, a robot dust collector and the like), which is one of intelligent household appliances, is widely applied at present. The main working process of the existing sweeping robot is as follows: the floor sweeping robot moves on the ground, and absorbs garbage such as ground dust and the like into the dust box of the floor sweeping robot, so that the function of cleaning the ground is achieved. Then, the user needs to press the dust box release button on the surface of the sweeping robot at regular intervals, take out the dust box, clean the dust box, remove the garbage in the dust box, and then reload the dust box into the sweeping robot.
In the process of manufacturing the sweeper, the FCT test (function test) needs to be carried out on the circuit board of the sweeper, and when the function test of the circuit board of the sweeper is qualified, the subsequent assembly process is carried out so as to intercept defective products at the initial stage of the product, thereby improving the product quality and avoiding unnecessary rework. At present, in the functional test of the circuit main board of the sweeper in the existing market, different functional module circuits generally need different test tools to be tested, and the test mode has the defects of long test time, low working efficiency and the like.
Disclosure of Invention
In view of the above, the present invention provides an FCT testing fixture and method, so as to solve the defects of long testing time, low working efficiency, etc. in the testing method of the circuit board of the sweeper in the prior art.
In order to achieve the purpose, the invention provides the following technical scheme: an FCT test fixture is applied to the functional test of a circuit main board of a sweeper and is provided with a test device which comprises an MCU master control circuit,
the power supply module is electrically connected with the MCU master control circuit and used for providing a power supply;
the infrared transmitting circuit is electrically connected with the MCU main control circuit and is used for transmitting a preset test infrared code value;
the current and voltage detection module is electrically connected with the MCU main control circuit and is used for detecting current and voltage information of the circuit board to be detected;
the peripheral function test port module is electrically connected with the MCU master control circuit and is used for being connected with a circuit board to be tested and carrying out peripheral function test;
the alarm circuit is electrically connected with the MCU main control circuit and is used for outputting an alarm signal when the abnormal function of the circuit board to be detected is detected;
the peripheral function test port module comprises one or more test connection circuits, each test connection circuit comprises a connection terminal, and each pin of each connection terminal is grounded through a resistor and a voltage regulator tube;
the current and voltage detection module comprises a connecting terminal, the connecting terminal at least comprises four pins, one pin of the connecting terminal is grounded, the other pin of the connecting terminal is connected with a power supply end of the circuit board to be detected, and the third pin and the fourth pin are respectively connected with the MUC main control circuit through resistors.
Preferably, the power module includes a DCDC circuit and an LDO conversion circuit electrically connected in sequence, and the LDO conversion circuit is electrically connected with the MCU main control circuit.
Preferably, the testing device further comprises a display screen module, wherein the display screen module is electrically connected with the MCU main control circuit and used for displaying the testing data; the testing device also comprises a key module which is electrically connected with the MCU master control circuit and used for controlling the working state of the FCT testing jig.
The invention also provides an FCT test method, which is applied to the FCT test fixture, and comprises the following steps:
s10, placing the circuit board to be tested on the FCT test fixture, and connecting the current and voltage detection module and/or the peripheral function test port module in the FCT test fixture with the corresponding connection terminal of the circuit board to be tested;
s20, electrifying the FCT test fixture and the circuit board to be tested, sending a preset test infrared code value by the infrared emission circuit, and entering a test mode after receiving the test infrared code value by the circuit board to be tested;
s30, checking whether the corresponding version number is correct, if so, entering the next step, and if not, turning to the step S70;
s40, detecting the charging voltage value and the charging current value of the adapter of the circuit board to be tested through the current and voltage detection module, if the charging voltage value and the charging current value obtained through detection are within a preset range value, entering the next step, otherwise, turning to the step S70;
s50, detecting whether the functions of all functional modules of the sweeper are normal through the peripheral function test port module, if the function of one functional module is detected to be abnormal in the detection process, turning to S70, and if the functions of all the functional modules are detected to be normal, turning to S60;
s60, displaying the information that the test is passed by the display screen, and turning to the step S80;
s70, the alarm module sends out alarm information and/or the display screen displays information that the function of the corresponding function module is abnormal, and the step is switched to S80;
and S80, ending the test.
Preferably, in the step S50, when the peripheral function test port module detects whether the functions of the functional modules of the sweeper are normal, the specific detection step includes:
s501, detecting a current value of a main wheel of the sweeper and a main wheel grating count value through the peripheral function test port module to judge whether the main wheel functions normally or not, if so, entering the next step, and if not, turning to the step S70;
s502, detecting the current value of a peripheral motor of the sweeper through the peripheral function test port module to judge whether the function of the peripheral motor is normal or not, if so, entering the next step, and if not, turning to the step S70;
s503, detecting sensor data of the sweeper through the peripheral function test port module to judge whether the sensor function of the sweeper is normal, if so, entering the next step, otherwise, turning to the step S70;
s504, detecting infrared module data of the sweeper through the peripheral function test port module to judge whether the infrared module function of the sweeper is normal, if so, entering the next step, and if not, turning to the step S70;
s505, performing corresponding operation on the keys of the key module, detecting level data of the keys through the peripheral function test port module to judge whether the functions of the keys of the sweeper are normal, if so, entering the next step, otherwise, turning to the step S70;
and S506, detecting power supply ripple data of the sweeper through the peripheral function test port module to judge whether the infrared module function of the sweeper is normal, if so, entering the step S60, and otherwise, turning to the step S70.
Preferably, in step S503, the sensor data of the sweeper is detected, including ground detection sensor data, omni-directional sensor data and along-wall sensor data.
Preferably, in the step S40, if the charging voltage value of the adapter is detected to be between 17V-21V, and the charging current value of the adapter is stabilized to be between 400 ma and 600ma within 2 seconds, it indicates that the detected charging voltage value and charging current value are within the preset range value.
Preferably, in step S501, the current value of the main wheel of the sweeper and the grating count value of the main wheel are detected to determine whether the main wheel is normal, five thousandth of PWM is first provided to control the main wheel, and then the current value is collected to prevent the circuit board from being burned out due to short circuit, if the current is not abnormal, PWM is increased to the normal running time and PWM output is performed, the current value of the main wheel is collected through the AD port of the MCU, the grating count value of the main wheel is collected through the interrupt port and counted, and after the main wheel rotates for 2S, whether the current of the main wheel is between 20ma and 90ma and the grating count value is normal is determined;
preferably, in step S502, detecting a current value of a peripheral motor of the sweeper to determine whether the function of the peripheral motor is normal, outputting a PWM of 5 per thousand to control the motor, and collecting the current value to prevent the motor from short circuit and burning out the circuit board; if the current is not abnormal, increasing the PWM to a normal treadmill PWM test, detecting the side brush current value and the rolling brush current through an AD port of the MCU, acquiring data after the motor rotates for 2s and is stable, and judging whether the rolling brush current value is between 120ma and 190ma and whether the side brush current value is between 20ma and 50ma after 2 s.
Compared with the prior art, the invention has the beneficial effects that: the testing device can test the circuit board to be tested according to the testing requirements of different functional modules of the circuit board to be tested, for example, the circuit board to be tested can be subjected to functional tests such as current and voltage information testing, sensor data testing, infrared module functional testing, motor testing, collision testing, water tank testing, dust box testing, power supply voltage testing and the like, and if a certain functional module of the circuit board to be tested is abnormal, the alarm module can send alarm information to give an alarm in time; by utilizing the invention, whether a plurality of different functional module circuits of the circuit main board of the sweeper are normal can be tested and judged in a short time, so that the working efficiency is effectively improved and the product quality is improved.
Drawings
FIG. 1 is a schematic block diagram of a circuit configuration module of the test apparatus according to embodiment 1 of the present invention;
fig. 2 is a specific circuit schematic diagram of the MCU master control circuit in embodiment 1 of the present invention;
fig. 3 is a schematic diagram of a specific circuit of the power module according to embodiment 1 of the present invention;
fig. 4 is a schematic circuit diagram of an infrared transmitting circuit according to embodiment 1 of the present invention;
fig. 5 is a schematic circuit diagram of an alarm module according to embodiment 1 of the present invention;
fig. 6 is a schematic circuit diagram of a specific circuit of the current-voltage detection module according to embodiment 1 of the present invention;
fig. 7 is a schematic circuit diagram of a specific circuit of the peripheral function test port module according to embodiment 1 of the present invention;
fig. 8 is a schematic block diagram of a flow of the FCT testing method in embodiment 2 of the present invention;
fig. 9 is a schematic block diagram of a specific flow of step S50 in embodiment 2 of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example 1
The embodiment of the invention provides an FCT test fixture, which is applied to the function test of a circuit main board of a sweeper and is provided with a test device, as shown in figure 1, the test device comprises an MCU main control circuit,
the power supply module is electrically connected with the MCU master control circuit and used for providing a power supply;
the infrared transmitting circuit is electrically connected with the MCU main control circuit and is used for transmitting a preset test infrared code value;
the current and voltage detection module is electrically connected with the MCU main control circuit and is used for detecting current and voltage information of the circuit board to be detected;
the peripheral function test port module is electrically connected with the MCU master control circuit and is used for being connected with a circuit board to be tested and carrying out peripheral function test;
the alarm circuit is electrically connected with the MCU main control circuit and is used for outputting an alarm signal when the abnormal function of the circuit board to be detected is detected;
the current and voltage detection module comprises a connecting terminal, the connecting terminal at least comprises four pins, one pin of the connecting terminal is grounded, the other pin of the connecting terminal is connected with a power supply end of the circuit board to be detected, and the third pin and the fourth pin are respectively connected with the MUC main control circuit through resistors;
the peripheral function test port module comprises one or more test connection circuits, each test connection circuit comprises a connection terminal, each pin of each connection terminal is grounded through a resistor and a voltage regulator tube, and the pins of the connection terminals are electrically connected with the pins of the IO port of the MCU main control circuit through the resistors.
In a specific embodiment, a specific circuit of the current and voltage detection module is as shown in fig. 6, and information such as charging current and charging voltage of the circuit board to be tested can be tested through the current and voltage detection module.
In the embodiment of the invention, in order to test whether different functional module circuits of the circuit board to be tested are normal or not, the FCT test fixture in the embodiment is provided with the peripheral functional test port module, and the peripheral functional test port module can be used for testing different functional module circuits of the circuit board, such as sensor data test, infrared module test, motor test, collision test, water tank test, dust box test, power supply voltage test and the like. In a specific embodiment, the peripheral function test port module includes one or more test connection circuits, each test connection circuit includes a connection terminal, each pin of the connection terminal is grounded through a resistor and a voltage regulator tube, and the pin of the connection terminal is electrically connected with an IO port pin of the MCU main control circuit through a resistor. In fig. 7, a test connection circuit having a connection terminal with 6 pins is shown, in order to implement various different functional module circuit tests on a circuit board, the test connection circuit is connected with different functional module circuits, the test connection circuit can be configured to be arranged in a plurality, and the number of pins of the connection terminal in the test connection circuit can be 2, 3, 4, 5, 6, 8, etc. When the circuit board is tested by various functional module circuits, the IO port of the MCU main control circuit outputs different levels (such as pulse signals with different pulse widths).
In a specific embodiment, the circuit board is a circuit main board of the sweeper, the chip model of the MCU in the MCU main control circuit is BK2535, and the specific circuit of the MCU main control circuit is shown in fig. 2. Because the circuit main board of the sweeper has a 19V quick charging function, the convenience in the test process is improved for providing general adaptability, and therefore the power module in the embodiment is provided with the DCDC circuit and the LDO conversion circuit which are electrically connected in sequence, wherein the LDO conversion circuit is electrically connected with the MCU main control circuit. The DCDC circuit is used for converting the high voltage 19V into 5V, and the LDO conversion circuit is used for converting the 5V into 3.3V, so that the MCU in the MCU main control circuit can be powered. The specific circuit of the power module in this embodiment is shown in fig. 3.
The specific circuit of the infrared transmitting circuit is shown in the attached drawing 4, the MCU master control circuit can control the infrared transmitting circuit to send a preset testing infrared code value, the circuit board to be tested can enter a testing mode after receiving the preset testing infrared code value, and then the FCT testing jig can test various functional modules on the circuit board to be tested through the current voltage detection module and the peripheral functional testing port module, such as the current voltage information test of the circuit board, the sensor data test, the infrared module test, the motor test, the collision test, the water tank test, the dust box test, the power supply voltage test and the like.
In a preferred embodiment, the alarm circuit is a buzzer alarm circuit (as shown in fig. 5); in addition, in order to display test data conveniently, the FCT test fixture can also be provided with a display screen module electrically connected with the MCU main control circuit, and the display screen module can be used for displaying the test data, so that a worker can analyze the adverse conditions of the test circuit board in time according to the test data. In addition, the FCT test fixture further comprises a key module, wherein the key module is electrically connected with the MCU main control circuit and used for controlling the working state of the FCT test fixture, and if one key is pressed, the key module can control the infrared emission circuit to send a preset test infrared code value; pressing another key can control the display screen in the display screen module to display test data, and pressing a certain key can remove alarm information of the alarm module.
The brief working process in this embodiment is: connecting and electrifying the FCT test fixture and a circuit board to be tested (hereinafter referred to as a circuit board), and carrying out related operation on a key module to enable an infrared emission circuit of the FCT test fixture to send a test infrared code value, enabling the circuit board to enter a test mode after receiving the test infrared code value verification, detecting whether charging current and charging voltage of the circuit board are stable or not through a current and voltage detection module, displaying detected charging current and voltage information on a display screen, and if the detected charging current and charging voltage are not within a preset range value, sending alarm information to a buzzer in an alarm module to alarm; by utilizing the peripheral function test port module, according to the requirements for testing different function module circuits, the IO port of the MUC outputs corresponding pulse signals for testing, so that the function tests such as sensor data test, infrared module test, motor test, collision test, water tank test, dust box test, power supply voltage test and the like can be realized, in the test process, if the function of a certain function module is abnormal, a buzzer in the alarm module sends alarm information for alarming, and the tested data information can be displayed on a display screen; the test time of the whole test process is less than 20 seconds, the test time is short, the working efficiency is high, and the test of various functional modules can be completed in a short time.
Example 2
The present invention further provides an FCT testing method applied to the FCT testing jig according to embodiment 1, as shown in fig. 8, the FCT testing method includes the following steps:
s10, placing the circuit board to be tested on the FCT test fixture, and connecting the current and voltage detection module and/or the peripheral function test port module in the FCT test fixture with the corresponding connection terminal of the circuit board to be tested;
s20, electrifying the FCT test fixture and the circuit board to be tested, sending a preset test infrared code value by the infrared emission circuit, and entering a test mode after receiving the test infrared code value by the circuit board to be tested;
s30, checking whether the corresponding version number is correct, if so, entering the next step, and if not, turning to the step S70;
s40, detecting the charging voltage value and the charging current value of the adapter of the circuit board to be tested through the current and voltage detection module, if the charging voltage value and the charging current value obtained through detection are within a preset range value, entering the next step, otherwise, turning to the step S70;
s50, detecting whether the functions of all functional modules of the sweeper are normal through the peripheral function test port module, if the function of one functional module is detected to be abnormal in the detection process, turning to S70, and if the functions of all the functional modules are detected to be normal, turning to S60;
s60, displaying the information that the test is passed by the display screen, and turning to the step S80;
s70, the alarm module sends out alarm information and/or the display screen displays information that the function of the corresponding function module is abnormal, and the step is switched to S80;
and S80, ending the test.
Specifically, in step S50, when the peripheral function test port module detects whether the functions of the functional modules of the sweeper are normal, the specific detection steps are as shown in fig. 9 and include:
s501, detecting a current value of a main wheel of the sweeper and a main wheel grating count value through the peripheral function test port module to judge whether the main wheel functions normally or not, if so, entering the next step, and if not, turning to the step S70;
s502, detecting the current value of a peripheral motor of the sweeper through the peripheral function test port module to judge whether the function of the peripheral motor is normal or not, if so, entering the next step, and if not, turning to the step S70;
s503, detecting sensor data of the sweeper through the peripheral function test port module to judge whether the sensor function of the sweeper is normal, if so, entering the next step, otherwise, turning to the step S70;
s504, detecting infrared module data of the sweeper through the peripheral function test port module to judge whether the infrared module function of the sweeper is normal, if so, entering the next step, and if not, turning to the step S70;
s505, performing corresponding operation on the keys of the key module, detecting level data of the keys through the peripheral function test port module to judge whether the functions of the keys of the sweeper are normal, if so, entering the next step, otherwise, turning to the step S70;
and S506, detecting power supply ripple data of the sweeper through the peripheral function test port module to judge whether the infrared module function of the sweeper is normal, if so, entering the step S60, and otherwise, turning to the step S70.
It should be noted that, in the step S501 to the step S506, the test steps may be changed in any order, for example, in the step S501, the current value of the peripheral motor of the sweeper may be tested first to determine whether the function of the external motor is normal, or the infrared module data of the sweeper may be detected to determine whether the function of the infrared module of the sweeper is normal, and so on, which is not illustrated in any detail.
In a specific embodiment, in the step S40, if the charging voltage value of the adapter is detected to be between 17V-21V, and the charging current value of the adapter is stabilized to be between 400 ma and 600ma within 2 seconds, it is determined that the detected charging voltage value and charging current value are within the preset range value.
In the step S501, when detecting the current value of the main wheel of the sweeper and the grating count value of the main wheel to determine whether the main wheel is normal, five thousandth of PWM is first given to control the main wheel, and then the current value is collected to prevent the circuit board from being burned out due to short circuit, if the current is not abnormal, PWM is increased to normal running, PWM is output, the current value of the main wheel is collected through an AD port of the MCU, the grating count value of the main wheel is collected through an interrupt port and counted, and after the main wheel rotates for 2S, whether the current of the main wheel is between 20ma and 90ma or not and the grating count value is normal or not is determined;
in the step S502, when detecting the current value of the peripheral motor of the sweeper to determine whether the function of the peripheral motor is normal, firstly outputting 5 per thousand of PWM to control the motor, and then collecting the current value to prevent the motor from short circuit and burning out the circuit board; if the current is not abnormal, increasing the PWM to a normal treadmill PWM test, detecting the side brush current value and the rolling brush current through an AD port of the MCU, acquiring data after the motor rotates for 2s and is stable, and judging whether the rolling brush current value is between 120ma and 190ma and whether the side brush current value is between 20ma and 50ma after 2 s.
In step S503, sensor data of the sweeper is detected, which includes ground detection sensor data, omni-directional sensor data, and along-the-wall sensor data. Specifically, whether feedback data of 4 ground detection sensors of the sweeper is between 150-; the peripheral function test port module detects whether feedback data of 3 groups of all-directional sensors of the sweeper are between 500 and 4095. The numerical value is less than 200 under the all-round barrier-free condition, and the numerical value is higher when the numerical value is closer to the barrier; in the embodiment, the distance between the omnidirectional sensor and the wall is about 4 cm; and detecting whether the feedback data of the 2 groups of wall-following sensors of the sweeper are between 550 and 4095 through the peripheral function test port module. Under the condition of no barrier along the wall, the numerical value is within 120, and the numerical value is higher when the wall is closer to the wall; in this embodiment, the distance along the wall from the wall sensor is about 3 cm.
In the step S504, when detecting the infrared module data of the sweeper to determine whether the infrared module function of the sweeper is normal, the infrared transmitting circuit continuously transmits a special fixed infrared code value, the tested circuit board performs infrared decoding through IO interruption, the decoded code value is compared with the programmed code value, and thus whether the function of the infrared module is normal is determined, and if all the infrared modules receive the code value, the detection is passed.
In the step S505, when the level data of the key is detected to determine whether the key function of the sweeper is normal, the tester presses the key, and if the IO level of the key is detected to be inverted, the detection is passed.
In an optional embodiment, in step S50, when the peripheral function test port module detects whether the functions of the functional modules of the sweeper are normal, the peripheral function test port module may further perform a fan function test, a dust box function test, a water tank function test, an air pump function test, a collision function test, and the like on the sweeper, and these function tests are not necessary and may be used as an optional test.
By using the FCT testing method provided by the embodiment of the invention, different functional module circuits of the circuit board of the sweeper can be quickly tested by using the FCT testing jig, the testing time is short (the whole testing time is less than 20 seconds), the working efficiency can be effectively improved, whether the function of the circuit board is normal or not can be judged in the initial stage, defective products can be effectively intercepted, and the product quality can be effectively improved.
Claims (10)
1. The utility model provides a FCT test fixture, is applied to the functional test of the circuit mainboard of machine of sweeping the floor, FCT test fixture is provided with testing arrangement, its characterized in that: the test device comprises an MCU main control circuit,
the power supply module is electrically connected with the MCU master control circuit and used for providing a power supply;
the infrared transmitting circuit is electrically connected with the MCU main control circuit and is used for transmitting a preset test infrared code value;
the current and voltage detection module is electrically connected with the MCU main control circuit and is used for detecting current and voltage information of the circuit board to be detected;
the peripheral function test port module is electrically connected with the MCU master control circuit and is used for being connected with a circuit board to be tested and carrying out peripheral function test;
the alarm circuit is electrically connected with the MCU main control circuit and is used for outputting an alarm signal when the abnormal function of the circuit board to be detected is detected;
the peripheral function test port module comprises one or more test connection circuits, each test connection circuit comprises a connection terminal, and each pin of each connection terminal is grounded through a resistor and a voltage regulator tube;
the current and voltage detection module comprises a connecting terminal, the connecting terminal at least comprises four pins, one pin of the connecting terminal is grounded, the other pin of the connecting terminal is connected with a power supply end of the circuit board to be detected, and the third pin and the fourth pin are respectively connected with the MUC main control circuit through resistors.
2. The FCT test fixture of claim 1, wherein: the power module comprises a DCDC circuit and an LDO conversion circuit which are electrically connected in sequence, and the LDO conversion circuit is electrically connected with the MCU main control circuit.
3. The FCT test fixture of claim 1, wherein: the alarm circuit is a buzzer alarm circuit.
4. The FCT test fixture of any one of claims 1-3, wherein: the testing device also comprises a display screen module which is electrically connected with the MCU main control circuit and used for displaying the testing data.
5. The FCT test fixture of claim 4, wherein: the testing device also comprises a key module which is electrically connected with the MCU master control circuit and used for controlling the working state of the FCT testing jig.
6. An FCT testing method applied to the FCT testing fixture according to claim 5, the FCT testing method comprising the steps of:
s10, placing the circuit board to be tested on the FCT test fixture, and connecting the current and voltage detection module and/or the peripheral function test port module in the FCT test fixture with the corresponding connection terminal of the circuit board to be tested;
s20, electrifying the FCT test fixture and the circuit board to be tested, sending a preset test infrared code value by the infrared emission circuit, and entering a test mode after receiving the test infrared code value by the circuit board to be tested;
s30, checking whether the corresponding version number is correct, if so, entering the next step, and if not, turning to the step S70;
s40, detecting the charging voltage value and the charging current value of the adapter of the circuit board to be tested through the current and voltage detection module, if the charging voltage value and the charging current value obtained through detection are within a preset range value, entering the next step, otherwise, turning to the step S70;
s50, detecting whether the functions of all functional modules of the sweeper are normal through the peripheral function test port module, if the function of one functional module is detected to be abnormal in the detection process, turning to S70, and if the functions of all the functional modules are detected to be normal, turning to S60;
s60, displaying the information that the test is passed by the display screen, and turning to the step S80;
s70, the alarm module sends out alarm information and/or the display screen displays information that the function of the corresponding function module is abnormal, and the step is switched to S80;
and S80, ending the test.
7. The FCT testing method according to claim 6, wherein: in step S50, when detecting whether the functions of the functional modules of the sweeper are normal through the peripheral function test port module, the specific detection steps include:
s501, detecting a current value of a main wheel of the sweeper and a main wheel grating count value through the peripheral function test port module to judge whether the main wheel functions normally or not, if so, entering the next step, and if not, turning to the step S70;
s502, detecting the current value of a peripheral motor of the sweeper through the peripheral function test port module to judge whether the function of the peripheral motor is normal or not, if so, entering the next step, and if not, turning to the step S70;
s503, detecting sensor data of the sweeper through the peripheral function test port module to judge whether the sensor function of the sweeper is normal, if so, entering the next step, otherwise, turning to the step S70;
s504, detecting infrared module data of the sweeper through the peripheral function test port module to judge whether the infrared module function of the sweeper is normal, if so, entering the next step, and if not, turning to the step S70;
s505, performing corresponding operation on the keys of the key module, detecting level data of the keys through the peripheral function test port module to judge whether the functions of the keys of the sweeper are normal, if so, entering the next step, otherwise, turning to the step S70;
and S506, detecting power supply ripple data of the sweeper through the peripheral function test port module to judge whether the infrared module function of the sweeper is normal, if so, entering the step S60, and otherwise, turning to the step S70.
8. The FCT testing method according to claim 7, wherein: in step S503, sensor data of the sweeper is detected, including ground detection sensor data, omni-directional sensor data, and along-wall sensor data.
9. The FCT testing method according to claim 6, wherein: in step S40, if the charging voltage value of the adapter is detected to be between 17V-21V, and the charging current value of the adapter is stabilized to be between 400 ma and 600ma within 2 seconds, it is determined that the detected charging voltage value and charging current value are within the preset range.
10. The FCT testing method according to claim 6, wherein in step S501, a current value of a main wheel of the sweeper and a grating count value of the main wheel are detected to determine whether the main wheel is normal, five thousandths of PWM is firstly provided to control the main wheel, then the current value is collected to prevent a circuit board from being burnt out due to short circuit, if the current is not abnormal, the PWM is increased to the PWM output when the sweeper runs normally, the current value of the main wheel is collected through an AD port of the MCU, the grating count value of the main wheel is collected through an interrupt port, and after the main wheel rotates for 2S, whether the current of the main wheel is between 20ma and 90ma is determined, and the grating count value is normal.
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