CN112882415A - BMS-based AFE data acquisition automatic scheduling method, storage device and mobile terminal - Google Patents
BMS-based AFE data acquisition automatic scheduling method, storage device and mobile terminal Download PDFInfo
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- 238000012544 monitoring process Methods 0.000 claims description 3
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- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
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Abstract
The invention discloses an AFE data acquisition automatic scheduling method based on BMS, a storage device and a mobile terminal, wherein the automatic scheduling method comprises the following steps: the AFE chip carries out current collection according to the quantity of current collection granularity configured by the MSR _ I register in the whole scheduling time; awakening the AFE chip 5ms before the end of the previous basic scheduling period, and starting the next basic scheduling period and carrying out measurement and acquisition on data after the AFE chip is awakened; after the basic scheduling period is completed, when the configured interrupt granularity is reached, whether the AFE chip sends an interrupt signal to the MCU is judged, and the MCU reads data collected by the AFE chip after receiving the middle-section signal. The invention saves MCU resource and optimizes the work power consumption of AFE.
Description
Technical Field
The invention relates to the field of automatic scheduling, in particular to an AFE data acquisition automatic scheduling method based on BMS.
Background
In a BMS (battery management system), an AFE (analog front end, AFE, analog front end) is commonly used to acquire data of voltage, temperature, and current signals, and conventionally, an MCU (MCU, microcontroller) is used to issue an instruction, and the AFE executes related data acquisition work.
With the intelligent development of the whole BMS system, the functions required to be processed by the MCU in the BMS are more and more, and the resources are relatively nervous.
There is therefore a need for improvements to existing acquisition modes to reduce the workload of the MCU.
Disclosure of Invention
In order to solve the technical problem, an AFE data acquisition automatic scheduling method capable of reducing the workload of the MCU is proposed.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows: an AFE data acquisition automatic scheduling method based on BMS is suitable for being executed in a computer, and comprises the following steps:
step 1: the AFE chip carries out current collection according to the quantity of current collection granularity configured by the MSR _ I register in the whole scheduling time, and one current collection period corresponds to one basic scheduling particle;
step 2: awakening the AFE chip 5ms before the end of the previous basic scheduling period, and starting the next basic scheduling period and carrying out measurement and acquisition on data after the AFE chip is awakened;
the measurement and acquisition sequence of the AFE chip in any basic scheduling period is battery core voltage acquisition, battery pack voltage acquisition, auxiliary temperature sensor voltage acquisition, chip temperature acquisition and battery pack current acquisition in sequence;
and step 3: after the basic scheduling period is completed, when the configured interrupt granularity is reached, the AFE chip sends an interrupt signal to the MCU, and the MCU reads data acquired by the AFE chip after receiving the interrupt signal.
The enabling/disabling of the basic scheduling cycle is performed in the following way:
1 is written and started through a register enable bit, 0 is written and forbidden, a slow clock is adopted, and an automatic monitoring mode is adopted;
the basic scheduling granule refers to a configurable minimum measurement granule unit, and the time length is 62.5 mS;
the basic scheduling period refers to a data acquisition process completed by the AFE within one basic scheduling particle;
interrupt granularity refers to the number of basic scheduling particles specified by the configuration.
Preferably, in step 3, after the interrupt granularity is reached, the AFE chip remains in an awake state to wait for the MCU to finish data reading, and after the MCU finishes data reading, the AFE chip sends an instruction to sleep;
and if the interruption granularity is over, the AFE chip automatically enters a sleep mode and continues to enter the next basic scheduling period for data acquisition.
Preferably, whenever the AFE chip collects the over-voltage/under-voltage/over-current/short-circuit/over-temperature condition, the AFE chip immediately sends an interrupt alarm and performs the protection operation.
Preferably, the interrupt granularity may be configured as 1/2/4/8/16/32 basic scheduling particles.
Preferably, starting at the end reciprocal 5mS of the basic scheduling particle, if the particle requires a scan operation, it is automatically woken up to take a measurement.
A storage device having stored therein a plurality of instructions adapted to be loaded by a processor and to carry out operations according to the method as described above.
A mobile terminal comprising a processor for executing instructions and a storage device for storing a plurality of instructions, said instructions being adapted to be loaded by said processor and to carry out operations according to the above-mentioned method.
The invention has the beneficial technical effects that: the invention provides a new design applied to an AFE, which automatically finishes data acquisition by the AFE periodically, reports the completion of data acquisition to an MCU through an interrupt signal, and reads related data by the MCU. Therefore, the resources of the MCU are saved, and the working power consumption of the AFE can be optimized. The scheduling time requirements under different working states can be switched through simple register configuration.
Drawings
Fig. 1 is a flowchart illustrating steps of an AFE data acquisition automatic scheduling method based on BMS according to the present invention.
FIG. 2 is a flow chart illustrating scheduling according to the present invention;
FIG. 3 is a diagram illustrating a scheduling function according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following embodiments, but the scope of the present invention is not limited to the following embodiments.
As shown in fig. 1, an AFE data acquisition automatic scheduling method based on BMS is suitable for being executed in a computer, and comprises the following steps:
step 1: the AFE chip (Analog Front End) performs current integration (current integration is current collection) according to the current integration grain number (the current integration grain number is the grain number of current collection, and the grain number refers to the number of basic scheduling grains) configured by the register MSR _ I (MSR _ I is the name of the register) in the whole scheduling time.
Step 2: as shown in fig. 2, the AFE chip automatically wakes up 5ms before the end of the previous basic scheduling period, and after the AFE chip wakes up, the next basic scheduling period is started and data measurement and acquisition are performed;
the measurement and acquisition sequence of the AFE chip in any basic scheduling period is battery core voltage acquisition, battery pack voltage acquisition, auxiliary temperature sensor voltage acquisition, chip temperature acquisition and battery pack current acquisition in sequence;
and step 3: after the basic scheduling period of the AFE chip is collected, when the configured interrupt granularity is reached, the AFE chip sends an interrupt signal to the MCU, and the MCU reads data collected by the AFE chip after receiving the interrupt signal.
The enabling/disabling of the basic scheduling cycle is performed in the following way:
1 is written and started through a register enable bit, 0 is written and forbidden, a slow clock is adopted, and an automatic monitoring mode is adopted;
the basic scheduling granule refers to a configurable minimum measurement granule unit, and the time length is 62.5 mS;
the basic scheduling period refers to a data acquisition process completed by the AFE within one basic scheduling particle;
the interrupt granularity refers to the number of basic scheduling granules specified by the configuration, and may be generally configured to 1/2/4/8/16/32 basic scheduling granules, and when the interrupt granularity is configured to 2 basic scheduling granules, the AFE chip sends an interrupt signal after 2 basic scheduling granules.
Preferably, in step 3, after the interrupt granularity is reached, the AFE chip remains in an awake state to wait for the MCU to finish data reading, and when entering the next basic scheduling granule, the AFE chip enters sleep. After the MCU reads the data, the MCU can also send an instruction to enable the AFE chip to quickly go to sleep.
And if the interruption granularity is not reached, the AFE chip automatically enters a sleep mode and continues to enter the next basic scheduling period for data acquisition.
Preferably, whenever the AFE chip collects an overvoltage/undervoltage/overcurrent/short-circuit/overtemperature condition, the AFE chip immediately issues an interrupt alarm while suspending the data collection function.
In each basic scheduling granule, the following operations can be performed:
current analog-to-digital converter (current ADC):
the current analog-to-digital converter always performs current collection (can be turned off); the current analog-to-digital converter can configure the current acquisition period to be 1,2,4 basic scheduling particles; the current analog-to-digital converter stores 4 particles of data at the maximum.
SCAN (SCAN is a centralized operation mode defined by the system, and multiple data measurement acquisition is performed by using one command):
starting at the end reciprocal 5mS of the basic scheduling particle, if the particle requires scan operation, then automatically waking up to make a measurement;
the SCAN operation is used for measuring according to the sequence and the corresponding configuration of the cell voltage, the battery pack voltage, the auxiliary temperature sensor voltage, the chip temperature and the battery pack current;
and synchronously updating the alarm mark and the result register.
Sleeping:
when the secondary measurement is finished, if the interrupt is not sent out (the set interrupt granularity is more than 1), automatically entering into sleep; and (4) sleep configuration.
Interrupting:
when the basic scheduling granule is finished, the interrupt is sent according to the configuration, and an optional 1/2/4/8/16/32 basic scheduling granule sends an interrupt after the basic scheduling granule is finished;
after sending the interrupt, the AFE keeps the wake-up state until the MCU reads the data and enters the next basic scheduling granule to go to sleep. If fast sleep is required, the MCU may issue an instruction to the AFE to enter sleep mode immediately after reading the data.
The scheduling configuration is shown in the following table:
TABLE 1
And (4) displaying a scheduling function:
as shown in fig. 3, where the interrupt granularity is configured as 2 basic scheduling granules, it can be seen that:
interrupt every 2 basic scheduling granules (Schedule [6:4] ═ 1);
performing a SCAN operation every 1 basic scheduling granule (Schedule [3:1] ═ 1), that is, 1 SCAN execution granule equals to 1 basic scheduling granule;
an AUX measurement was performed every 2 SCAN particles (Schedule [13:12] ═ 2).
A storage device having stored therein a plurality of instructions adapted to be loaded by a processor and to carry out operations according to the method as described above.
A mobile terminal comprising a processor for executing instructions and a storage device for storing a plurality of instructions, said instructions being adapted to be loaded by said processor and to carry out operations according to the above-mentioned method.
Variations and modifications to the above-described embodiments may occur to those skilled in the art, which fall within the scope and spirit of the above description. Therefore, the present invention is not limited to the specific embodiments disclosed and described above, and some modifications and variations of the present invention should fall within the scope of the claims of the present invention. Furthermore, although specific terms are employed herein, they are used in a generic and descriptive sense only and not for purposes of limitation.
Claims (7)
1. An AFE data acquisition automatic scheduling method based on BMS is suitable for a low-power-consumption lithium battery management system, and is characterized by comprising the following steps:
step 1: the AFE chip carries out current collection according to the quantity of current collection granularity configured by the MSR _ I register in the whole scheduling time, and one current collection period corresponds to one basic scheduling particle;
step 2: automatically awakening the AFE chip 5ms before the end of the previous basic scheduling period, and starting the next basic scheduling period and carrying out measurement and acquisition on data after the AFE chip is awakened;
the AFE chip measurement and acquisition in any basic scheduling period are sequentially cell voltage acquisition, battery pack voltage acquisition, auxiliary temperature sensor voltage acquisition, chip temperature acquisition and battery pack current acquisition, and all measurements can be configured and selected;
and step 3: after the basic scheduling period is finished, when the configured interrupt granularity is reached, the AFE chip sends an interrupt signal to the MCU, and the MCU reads data collected by the AFE chip after receiving the middle-stage signal; the issuance of this interrupt signal is configurable for selection;
the enabling/disabling of the basic scheduling cycle is performed in the following way:
1 is written and started through a register enable bit, 0 is written and forbidden, a slow clock is adopted, and an automatic monitoring mode is adopted;
the basic scheduling granule refers to a configurable minimum measurement granule unit, and the time length is 62.5 mS;
the basic scheduling period refers to a data acquisition process completed by the AFE within one basic scheduling particle;
interrupt granularity refers to the number of basic scheduling particles specified by the configuration.
2. The automatic scheduling method of AFE data acquisition based on BMS according to claim 1, wherein in step 3, after the interrupt granularity is reached, the AFE chip remains awake state to wait for the MCU to finish data reading, and after the MCU finishes data reading, the AFE chip sends an instruction to go to sleep;
and if the interruption granularity is reached and the data reading is finished, the AFE chip automatically enters a sleep mode and continues to enter the next basic scheduling period for data acquisition.
3. The automatic scheduling method of AFE data acquisition based on BMS according to claim 1, wherein whenever the AFE chip acquires an over voltage/under voltage/over current/short circuit/over temperature condition, the AFE chip immediately issues an interrupt alarm while performing a protection operation.
4. The BMS-based AFE data acquisition auto-scheduling method of claim 1, wherein the outage granularity is configurable to 1/2/4/8/16/32 basic scheduling particles.
5. The BMS-based AFE data acquisition auto-scheduling method of claim 1, wherein starting at the end inverse 5mS of a basic scheduling granule, if the granule requires scan operation, it automatically wakes up for measurement.
6. A memory device having stored therein a plurality of instructions, wherein the instructions are adapted to be loaded by a processor and to carry out operations according to any one of claims 1 to 5.
7. A mobile terminal comprising a processor for executing instructions and a memory device for storing a plurality of instructions, characterized in that said instructions are adapted to be loaded by said processor and to perform the operations according to any of claims 1-5.
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