CN112835802A - Equipment testing method, device, equipment and storage medium - Google Patents
Equipment testing method, device, equipment and storage medium Download PDFInfo
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- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3684—Test management for test design, e.g. generating new test cases
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- G06F11/36—Preventing errors by testing or debugging software
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Abstract
The invention discloses a device testing method, a device, equipment and a storage medium, wherein the method comprises the steps of receiving equipment information sent by equipment to be tested, wherein the equipment information at least comprises equipment types and equipment characteristics; selecting at least one target test component from test components in a test component library according to the equipment category, and determining the test sequence of the target test components, wherein each test component comprises a plurality of sub-components; at least one target test component is invoked in test order, and subcomponents in each target test component that match device characteristics are invoked. The device type and the device characteristics of the device to be tested are identified according to the device information of the device to be tested, so that the target test component is called according to the identified device type and is executed according to the test sequence to complete the automatic test, the devices to be tested in different types are automatically identified, the test flow does not need to be rewritten, the development workload is greatly reduced, and the resource waste is effectively reduced.
Description
Technical Field
The present invention relates to the field of automated testing technologies, and in particular, to a device testing method, apparatus, device, and storage medium.
Background
With the increase of the types and the number of the intelligent devices, how to quickly detect whether the quality of the devices meets requirements, for example, whether basic parameters meet expectations, whether communication between each module and the cloud is smooth, and the like, becomes a problem to be solved urgently. In the existing product test systems, many test flows are developed by taking the equipment type and the type as a unit, so that when a new equipment type appears, a set of test flow needs to be set up again, the code writing and changing are complicated, and a large amount of human resources are consumed.
Disclosure of Invention
The embodiment of the application provides a device testing method, a device, equipment and a storage medium, and aims to solve the technical problems that in the prior art, when a new device type appears, a set of testing flow needs to be set up again, codes are compiled and changed complicatedly, and a large amount of human resources are consumed.
In a first aspect, the present application provides a device testing method, including:
receiving equipment information sent by equipment to be tested, wherein the equipment information at least comprises equipment types and equipment characteristics of the equipment to be tested;
selecting at least one target test component from the test components in the test component library according to the equipment category, and determining the test sequence of the target test components; wherein each of the test assemblies comprises a plurality of subassemblies;
and calling the at least one target test component according to the test sequence, and calling sub-components matched with the device characteristics in each target test component.
Optionally, the invoking the at least one target test component according to the test sequence, and invoking a sub-component in each target test component that matches the device characteristic, includes:
traversing all sub-components in the target test component;
executing the sub-component when the elements of the sub-component match the device characteristics of the device under test,
skipping the sub-component when an element of the sub-component does not match a device characteristic of the device under test.
Optionally, before receiving the device information sent by the device to be tested, the method includes:
creating the test component library, wherein the test component library comprises a plurality of test components;
establishing a mapping relation between the equipment category and the test component;
configuring a device type test flow corresponding to the device type;
and determining the priority of the corresponding test component according to the equipment type test flow.
Optionally, the selecting a target test component from the test components in the test component library according to the device category, and determining a test sequence of the target test component includes:
selecting the at least one target test component from the test components in the test component library according to the mapping relation;
acquiring the priority of the target test component;
and determining the testing sequence of the target testing component according to the priority.
In a second aspect, the present application further provides a device testing apparatus, including:
the device comprises a receiving unit, a judging unit and a judging unit, wherein the receiving unit is used for receiving device information sent by a device to be tested, and the device information at least comprises a device type and a device characteristic of the device to be tested;
the identification unit is used for selecting at least one target test component from the test components in the test component library according to the equipment category and determining the test sequence of the target test component, wherein each test component comprises a plurality of sub-components;
and the calling test unit is used for calling the at least one target test component according to the test sequence and calling the sub-components matched with the device characteristics in each target test component.
Optionally, the invoking the test unit specifically includes:
the traversing unit is used for traversing all sub-components in the target test component;
a first unit for executing the sub-component when the elements of the sub-component match the device characteristics of the device under test;
a second unit for skipping the sub-component when an element of the sub-component does not match the device characteristic of the device under test.
Optionally, the device testing apparatus further includes:
the creating unit is used for creating the test component library, wherein the test component library comprises a plurality of test components;
the mapping unit is used for establishing a mapping relation between the equipment category and the test component;
the configuration unit is used for configuring a device type test flow corresponding to the device type;
and the first determining unit is used for determining the priority of the corresponding test component according to the equipment type test flow.
Optionally, the identification unit specifically includes:
a selecting unit, configured to select the at least one target test component from the test components in the test component library according to the mapping relationship;
an obtaining unit, configured to obtain a priority of the target test component;
and the second determining unit is used for determining the testing sequence of the target testing component according to the priority. Device information
In a third aspect, the present application further provides a network device, where the network device includes a processor and a memory connected to the processor, where the memory stores one or more programs, and the programs are executed by the processor to implement the steps in the device testing method.
In a fourth aspect, the present application also provides a computer readable storage medium storing one or more programs for execution by a processor to perform the steps of the device testing method.
The embodiment of the invention has the following beneficial effects:
the invention discloses a device testing method, a device, equipment and a storage medium, wherein the equipment type and the equipment characteristic of the equipment to be tested are identified according to the equipment information of the equipment to be tested, so that a target testing component is called according to the identified equipment type, and the target testing component is executed according to a testing sequence to complete automatic testing. In the automatic test process, target subassemblies matched with the finished automatic test are screened out through the equipment characteristics, subassemblies which are not related to the equipment characteristics in the assemblies to be tested are discarded, invalid tests are reduced, and the test efficiency is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Wherein:
fig. 1 is a flowchart of a device testing method according to the present invention.
Fig. 2 is a block diagram of a device testing apparatus according to the present invention.
Fig. 3 is a block diagram of a network device according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 illustrates a flowchart of a device testing method provided by the present invention, and as shown in fig. 1, the device testing method includes:
Specifically, the equipment testing method is applied to an automatic testing system, and the automatic testing system is used for completing automatic testing of different types of equipment, so that manual operation is reduced. The automatic test system comprises a server and a terminal, and in the embodiment of the application, the equipment test method is mainly applied to the server. The terminal is used as a device to be tested which needs to carry out automatic testing on the product quality. The server is in network connection with the device to be tested. The network connection can be a wired network connection or a wireless network connection, so that the server and the device to be tested can perform communication interaction. The device to be tested can be a device with a communication function module, such as an intelligent air fryer, an electronic scale, an air purifier and other intelligent devices with a communication function.
In this step, the device to be tested sends the device information of the device to be tested to the server through the network, and the device information adopts a standard json format, so that the storage and the transmission are convenient. However, the device information may also be in an excel format, a txt format, and the like, which is not limited in the present application. The device information includes, but is not limited to, device class, device characteristics, etc., and it may also include device model, IP address, firmware version, etc. The device categories, also called device types and device categories, are generally classified according to device usage, performance or function. The device type can be expressed in various forms, and in the application, the information corresponding to the type key field contained in the device information of the device to be tested is used as the device type.
Example 1: the device information of a certain device to be tested is as follows:
{
"type”："humidifier”，
"mac”："mac”，
"rssi”：10，
"bleRssi"：10，
"wifiName”：“wifiName”，
"mainFwersion”：”1.0.0”，
"temperature"：”10”,
"humidity”：“10”
}
wherein, the information corresponding to the type field is as follows: the humifier (humidifier) is used as the equipment category of the equipment to be tested, and the equipment category is the humidifier.
The devices to be tested may have the same device class or different device classes. In practical applications, since devices in the same device class have commonality, if the devices have the same functional attributes, the test flows of the devices belonging to the same device class in the product test are the same. Therefore, when a plurality of different devices to be tested are detected to carry out product testing, the different devices to be tested are distinguished through the device types, so that the devices to be tested in the same device type adopt the same testing method. In this way, a corresponding device type testing process and a plurality of testing components related to the device type testing process are configured for each device type in the database of the server side, and once the device type of the device to be tested is detected to be corresponding to the device type stored in the database, the plurality of testing components corresponding to the device type in the database can be called, so that the related testing is performed on the device to be tested, and the automatic testing is realized.
Typically, a library of test components is created on the server side. The test component library is used for storing each test component and the corresponding sub-component of each test component. The testing of the equipment to be tested is completed by calling different testing components in the testing component library, and each equipment category is configured with an equipment category testing flow in the testing component library. In the embodiment of the present application, the device type test flow does not include a code, the device type test flow is equivalent to a test guide, and the device type test flow guides the test component and the corresponding sub-component thereof to complete the automated test. Specifically, the device class test flow indicates the test order of the test components. Each test component may be considered test code for a functional module. In this way, when a certain device type is triggered to call the corresponding multiple test components, the test codes corresponding to the corresponding test components are sequentially executed according to the device type test flow corresponding to the device type.
In the embodiment of the application, the test components are defined by functional test items, and in a feasible manner, the test components are uniquely determined by test function names, that is, each test component is stored in the component library by the test function name. For example: the testing component with the equipment category of 'humidifier' comprises an issuing equipment ID component, a synchronous equipment ID component, a parameter checking component, a channel checking component and the like, wherein the issuing equipment ID, the synchronous equipment ID, the parameter checking and the channel checking are testing function names of the corresponding testing components.
When the device to be tested is tested, a plurality of test components matched with the device to be tested need to be called to complete the automatic test. That is, one device class may correspond to a plurality of test components. Therefore, after the test component library of the server needs to configure the device type, the test components and the device type test flows corresponding to the test components, a mapping relationship between the device type and each test component needs to be established, so that a plurality of test components matched with the device type can be found through the mapping relationship.
In practical applications, although different device classes exist among the devices to be tested, the test components that need to be called may exist in the same manner, that is, multiple device classes may correspond to the same test component, and therefore the same test components among different device classes have a sharing property, that is, the same test components exist in the test components corresponding to different device classes determined by the mapping relationship, and the test components are called together. Therefore, the reusability of the test assembly is realized, a test flow does not need to be additionally configured, a new test assembly does not need to be added, the storage space of a database is saved, the cost is reduced, meanwhile, manual operation is reduced, and the automatic test efficiency is improved.
Each test component in the test component library includes a plurality of sub-components, each sub-component implementing a local function of the test component. In other words, a test component is a large functional test module, and the sub-components included in the test component are correspondingly smaller test functions, for example, the test component is a parameter checking component, which may include sub-components of: subassembly 1: testing WiFi signal strength parameters, subassembly 2: test bluetooth signal strength parameter, subassembly 3: test thermometer parameters, subassembly 4: test hygrometer parameters, etc. Elements of the sub-components: the device information is used for representing the device characteristics of the device to be tested and is represented by field names in the device information. As in the above example 1, the field name "bleRssi" indicates that the device to be tested has the device characteristics of bluetooth communication, and the field name "wifiName" indicates that the device has the device characteristics of WiFi communication. The field names "temperature" and "humidity" indicate the device characteristics of the device to be tested, which are temperature and humidity. . That is to say, when a test component is called, one test component is split into a plurality of sub-processes, which is equivalent to calling each sub-component in sequence, and sequentially implementing the device characteristics corresponding to the device to be tested.
The device characteristics are also referred to as device attributes, i.e. the functional properties of the device to be tested. The devices to be tested in the same device category may have the same device characteristics, or may have different device characteristics, that is, have basic characteristics (commonality) and unique characteristics, where the basic characteristics refer to functional properties common among the devices to be tested, and the unique characteristics refer to functional properties specific to the devices to be tested. For example: the air conditioner can be divided into a single-cooling type air conditioner, a cold-heating type air conditioner and an electric auxiliary heating type air conditioner according to functions, so that the cold-heating type air conditioner not only has the refrigeration function (namely, commonality) of the single-cooling type air conditioner, but also has the heating function (namely, unique characteristic) which the single-cooling type air conditioner does not have.
The device characteristics of the device to be tested are determined from the field name, as in example 1 above, the field name "bleRssi" indicates that the device to be tested has the device characteristics of bluetooth communication, and the field name "wifiName" indicates that the device has the device characteristics of WiFi communication. The field names "temperature" and "humidity" indicate that the device to be tested has device characteristics of temperature and humidity, that is, the device to be tested has requirements for temperature and humidity.
In this step, after receiving the device information of the device to be tested, the server analyzes the device information, and identifies the device type and the plurality of device characteristics of the device to be tested by the field name.
If the number of the device information received by the server is multiple, after the device type and the device characteristics corresponding to each device to be tested are identified, whether the device types to be tested are the same or not can be judged. If the same equipment type exists, the server only executes the matching operation of the equipment type and the test component once for the equipment to be tested with the same equipment type, and the same test component is called together to complete the automatic test.
If the server identifies that at least two different device types exist in the plurality of pieces of device information and the same to-be-tested component exists in the plurality of to-be-tested components corresponding to the two different device types, the to-be-tested components are called together for the to-be-tested devices corresponding to the different device types.
102, selecting at least one target test component from test components in a test component library according to the equipment category, and determining a test sequence of the target test component, wherein each test component comprises a plurality of sub-components;
specifically, after identifying the current device type and a plurality of device characteristics of the device to be tested, the server determines whether the device type is stored in the test component library. If the server stores the equipment type in the test component library, at least one test component matched with the equipment type is found through the preset mapping relation between the equipment type and each test component, the test component is used as a target test component, and then all sub-components of the target test component are obtained from the test component library.
When the product is tested, the relevance among the test components needs to be considered so as to ensure the success rate of the product test. Therefore, when the device to be tested performs the automatic test, the corresponding target test component needs to be executed according to a certain test sequence, so as to ensure the execution of the next target test component calling operation. Each equipment type in the test component library corresponds to an equipment type test flow, and the equipment type test flow indicates the test sequence of the associated test components, so that the equipment type of the equipment to be tested is known, and the test sequence between the associated target test components of the equipment to be tested can be known through the equipment type test flow associated with the equipment type. The test sequence is also the calling sequence of each target test component. In the embodiment of the application, the test sequence of the test component associated with each device category in the test component library is predefined. Specifically, the test sequence of the test components associated with each device class is determined by the priority among the test components. In one possible approach, numbers or letters may be used to determine the priority level, such as: if the priority corresponding to the number is defined to be from high to low, and the priority of the testing component corresponding to the number 1 is the lowest, the priority of each testing component can be determined according to the number, and then the testing sequence among the target testing components corresponding to the equipment to be tested is determined according to the priority.
The device type of the device to be tested is determined as humidifier by the device information in example 1. The obtaining of the plurality of test components corresponding to the device class from the test component library may be:
the basic parameter checking component has the priority of 10, and the corresponding sub-components comprise: subassembly 1: testing WiFi signal strength parameters, subassembly 2: test bluetooth signal strength parameter, subassembly 3: test thermometer parameters, subassembly 4: testing hygrometer parameters, etc.;
humidity adjustment test subassembly, priority is 9, and the subassembly that corresponds includes: and the sub-assembly 5: renewal of humidity, etc.;
temperature adjustment test subassembly, priority is 8, and the subassembly that corresponds includes: the subassembly 6: update temperature, etc.;
humiture rechecks the subassembly, and the priority is 7, and the subassembly that corresponds includes: the subassembly 7: re-testing temperature and humidity, etc.
Based on the device information in example 1, the server obtains a basic parameter verification component, a humidity adjustment test component and a temperature and humidity re-verification component of the target test component corresponding to the humidifier, and determines the priority of the target test component in the humidifier as follows according to the priority of each target test component (10>9> 7): basic parameter calibration components (firmware version, communication signal intensity, temperature and humidity parameters, and the like) - > humidity adjustment test components- > temperature and humidity re-calibration components, therefore, the test sequence of calling target test components by the server is as follows: the device comprises a basic parameter checking component, a humidity adjusting and testing component and a temperature and humidity re-checking component. When the basic parameter checking assembly is called, the subassemblies 1 to 4 are sequentially traversed, whether the elements of the subassembly 1 are matched with the equipment characteristics in the equipment information of the humidifier or not is sequentially judged, if yes, the subassembly 1 is executed, and if not, whether the elements of the subassembly 2 are matched with the equipment characteristics of the humidifier or not is judged, and the like until the last subassembly of the basic parameter checking assembly is traversed. Then, the humidity adjustment testing component is called to perform the same testing operation.
Specifically, calling at least one target test component according to a test sequence specifically refers to calling the associated target test components in sequence by the server according to the test sequence, when the current target test component is called, acquiring all sub-components of the current target test component in the test component library, traversing all sub-components of the current target test component, executing equipment characteristic test codes corresponding to the sub-components, and completing the test of the current target test component. For example: when the server automatically tests the equipment to be tested, a first target test component in a test sequence is called first, when the first target test component is executed, all sub-components corresponding to the first target test component are traversed, then a second target test component in the first test sequence is executed, when the second target test component is executed, all sub-components of the second target test component are traversed, the process is repeated until a last target test component in the first test sequence is called, when the last target test component is executed, all sub-components of the last target test component are traversed, then the automatic test of the equipment to be tested is completed, the manual operation is reduced, meanwhile, the equipment types of different equipment to be tested are automatically identified to carry out the corresponding automatic test, the test flow does not need to be rewritten, and the development workload is greatly reduced, thereby effectively reducing resource waste.
Although each test component in the test component library is configured with a sub-component corresponding to the basic device characteristic involved in the product function test, in an actual test, the device to be tested may involve only a part of the function test, and when the test component is called, the calling test is not required to be performed on the part of the sub-component in the test component, so that after the server finds the target test component matched with the device type, the server can also determine the target sub-component in the target test component, which is correspondingly matched with the device characteristic of the device to be tested, according to the multiple device characteristics of the device to be tested. Therefore, when the server calls the target test component corresponding to the device to be tested, only the target sub-component related to the device characteristic of the device to be tested is called to complete the automatic test, so that the operation is simplified, and the calling efficiency is improved.
Specifically, when traversing all sub-components of the current target test assembly, sequentially judging whether elements of the current sub-components are associated with the device characteristics of the device to be tested, if so, taking the sub-components as the target sub-components, executing the device characteristic test codes corresponding to the target sub-components, if not, skipping the sub-components, continuously judging whether the next sub-components are associated with the device characteristics of the device to be tested, and so on until whether the last sub-components of the current target test assembly are associated with the device characteristics of the device to be tested, that is, when the current target test assembly is called, screening out the target characteristic test codes associated with the device characteristics of the sub-components to be tested through the device characteristics, thereby executing only the device characteristic test codes corresponding to the sub-components in the current target test assembly which are matched with the device characteristics of the device to be tested, and not executing the sub-components, therefore, irrelevant subassemblies of the device to be tested are prevented from being tested, invalid tests are reduced, and the testing efficiency is improved. Further, when the server does not find the sub-component associated with the device characteristic of the device to be tested in all the target test assemblies while traversing all the target test assemblies, it is indicated that the sub-component corresponding to the device characteristic is not stored under the target test assembly in the test assembly library of the server. Therefore, when the server does not find the corresponding sub-component, the server prompts developers whether to add a new sub-component or add a new testing component and the corresponding new sub-component in a user-defined adding mode or not in pop-up window, short message, voice and other modes. And when the server receives the confirmation reply of the developer, storing the added new sub-component or the added new testing component and the new sub-component corresponding to the new sub-component in the testing component library, so as to be convenient for next calling, and calling the new sub-component to complete the automatic testing of the device to be tested. Wherein the new subassembly is configured with device characteristics that conform to the device under test. Therefore, the requirements of different devices to be tested are met through a user-defined adding mode, and the expansibility is improved.
In order to further know the test condition so as to adjust the test flow according to the test condition to improve the test effect, when the corresponding device characteristic test code is executed on each target subassembly, a feedback result of the device to be tested calling each target subassembly is received. Therefore, the fault part of the device to be tested can be quickly positioned according to the feedback result of each target subassembly, and a basis is provided for the diagnosis of development designers.
Thus, based on step 101-. In the automatic test process, target subassemblies matched with the finished automatic test are screened out through the equipment characteristics, subassemblies which are not related to the equipment characteristics in the assemblies to be tested are discarded, invalid tests are reduced, and the test efficiency is improved.
In the above embodiments, all or part of the implementation may be realized by software, hardware, firmware, or any combination thereof. When implemented using a software program, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, cause the processes or functions described in accordance with the embodiments of the invention to occur, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a network of computers, or other programmable device. The computer instructions may be stored in a computer readable storage medium or transmitted from one computer readable storage medium to another, for example, the computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, Digital Subscriber Line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device, such as a server, a data center, etc., that incorporates one or more of the available media. The usable medium may be a magnetic medium (e.g., floppy Disk, hard Disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., Solid State Disk (SSD)), among others.
Based on the above method, the present application further provides an apparatus testing device, as shown in fig. 2, the apparatus including:
the device information receiving unit 10 is configured to receive device information sent by a device to be tested, where the device information at least includes a device type and a device characteristic of the device to be tested;
the identification unit 20 is configured to select at least one target test component from test components in a test component library according to the device class, and determine a test sequence of the target test component, where each test component includes a plurality of sub-components;
the calling test unit 30 is used for calling the at least one target test component according to the test sequence and calling the sub-components matched with the device characteristics in each target test component.
The invoking test unit 30 specifically includes:
the traversing unit is used for traversing all sub-components in the target test component;
a first unit for executing the sub-component when the elements of the sub-component match the device characteristics of the device under test;
a second unit for skipping said sub-component when an element of said sub-component does not match a device characteristic of said device under test, in particular as described in the above method.
The device testing apparatus further includes:
the creating unit is used for creating the test component library, wherein the test component library comprises a plurality of test components;
the mapping unit is used for establishing a mapping relation between the equipment category and the test component;
the configuration unit is used for configuring a device type test flow corresponding to the device type;
a first determining unit, configured to determine a priority of a corresponding test component according to the device class test procedure, which is specifically described in the foregoing method.
The identification unit 20 specifically includes:
a selecting unit, configured to select the at least one target test component from the test components in the test component library according to the mapping relationship;
an obtaining unit, configured to obtain a priority of the target test component;
a second determining unit, configured to determine a testing order of the target test components according to the priority, specifically as described in the above method. It should be noted that, the content of the receiving unit 10, the identifying unit 20, and the invoking test unit 30 may refer to the content described in fig. 1, which is not described herein again.
Based on the foregoing method, the present application further provides a network device, and in an embodiment, as shown in fig. 3, fig. 3 shows a structural block diagram of the network device. Which includes at least one processor (processor) 20; a display screen 21; and a memory (memory)22, and may further include a communication Interface (Communications Interface)23 and a bus 24. The processor 20, the display 21, the memory 22 and the communication interface 23 can communicate with each other through the bus 24. The display screen 21 is configured to display a user guidance interface preset in the initial setting mode. The communication interface 23 may transmit information. The processor 20 may call logic instructions in the memory 22 to perform the methods in the embodiments described above.
Furthermore, the logic instructions in the memory 22 may be implemented in software functional units and stored in a computer readable storage medium when sold or used as a stand-alone product.
The memory 22, which is a computer-readable storage medium, may be configured to store a software program, a computer-executable program, such as program instructions or modules corresponding to the methods in the embodiments of the present invention. The processor 20 executes the functional application and data processing, i.e. implements the method in the above-described embodiments, by executing the software program, instructions or modules stored in the memory 22.
The memory 22 may include a storage program area and a storage data area, wherein the storage program area may store an application program required for operating the voice customer service system, at least one function; the storage data area may store data created according to the use of the terminal device, and the like. Further, the memory 22 may include a high speed random access memory and may also include a non-volatile memory. For example, a variety of media that can store program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk, may also be transient storage media.
In one embodiment, the present application also provides a computer storage medium storing one or more programs for execution by processor 20 to implement the steps of the device testing method, particularly as described above.
The above disclosure is only for the purpose of illustrating the preferred embodiments of the present invention, and it is therefore to be understood that the invention is not limited by the scope of the appended claims.
Claims (10)
1. An apparatus testing method, characterized in that the apparatus testing method comprises:
receiving equipment information sent by equipment to be tested, wherein the equipment information at least comprises equipment types and equipment characteristics of the equipment to be tested;
selecting at least one target test component from the test components in the test component library according to the equipment category, and determining the test sequence of the target test components; wherein each of the test assemblies comprises a plurality of subassemblies;
and calling the at least one target test component according to the test sequence, and calling sub-components matched with the device characteristics in each target test component.
2. The device testing method of claim 1, wherein invoking the at least one target test component in the testing order and invoking sub-components in each target test component that match the device characteristics comprises:
traversing all sub-components in the target test component;
executing the sub-component when the elements of the sub-component match the device characteristics of the device under test,
skipping the sub-component when an element of the sub-component does not match a device characteristic of the device under test.
3. The device testing method according to claim 1, wherein before receiving the device information sent by the device to be tested, the method comprises:
creating the test component library, wherein the test component library comprises a plurality of test components;
establishing a mapping relation between the equipment category and the test component;
configuring a device type test flow corresponding to the device type;
and determining the priority of the corresponding test component according to the equipment type test flow.
4. The device testing method according to claim 3, wherein the selecting a target test component from the test components in the test component library according to the device category and determining a test order of the target test component comprises:
selecting the at least one target test component from the test components in the test component library according to the mapping relation;
acquiring the priority of the target test component;
and determining the testing sequence of the target testing component according to the priority.
5. An apparatus testing device, comprising:
the device comprises a receiving unit, a judging unit and a judging unit, wherein the receiving unit is used for receiving device information sent by a device to be tested, and the device information at least comprises a device type and a device characteristic of the device to be tested;
the identification unit is used for selecting at least one target test component from the test components in the test component library according to the equipment category and determining the test sequence of the target test component, wherein each test component comprises a plurality of sub-components;
and the calling test unit is used for calling the at least one target test component according to the test sequence and calling the sub-components matched with the device characteristics in each target test component.
6. The device testing apparatus of claim 5, wherein the invoking test unit specifically comprises:
the traversing unit is used for traversing all sub-components in the target test component;
a first unit for executing the sub-component when the elements of the sub-component match the device characteristics of the device under test;
a second unit for skipping the sub-component when an element of the sub-component does not match the device characteristic of the device under test.
7. The device testing apparatus of claim 5, further comprising:
the creating unit is used for creating the test component library, wherein the test component library comprises a plurality of test components;
the mapping unit is used for establishing a mapping relation between the equipment category and the test component;
the configuration unit is used for configuring a device type test flow corresponding to the device type;
and the first determining unit is used for determining the priority of the corresponding test component according to the equipment type test flow.
8. The device testing apparatus of claim 7, wherein the identification unit specifically comprises:
a selecting unit, configured to select the at least one target test component from the test components in the test component library according to the mapping relationship;
an obtaining unit, configured to obtain a priority of the target test component;
and the second determining unit is used for determining the testing sequence of the target testing component according to the priority.
9. A network device comprising a processor and a memory coupled to the processor, the memory storing one or more programs for execution by the processor to perform the steps of the device testing method of any one of claims 1-4.
10. A computer-readable storage medium, characterized in that the computer-readable storage medium stores one or more programs, which are executed by a processor to implement the steps in the device testing method according to any one of claims 1 to 4.
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