CN112798875B - Millimeter wave and terahertz wave electric field measurement method, device and system - Google Patents
Millimeter wave and terahertz wave electric field measurement method, device and system Download PDFInfo
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Abstract
The invention relates to a millimeter wave and terahertz wave electric field measurement method, a device and a system, which are used for obtaining an amplification value of standing waves in an atomic bubble cavity to electromagnetic wave amplitude, determining a correction coefficient, moving a measured value determined by a standing wave period along the diameter direction in a glass probe according to detection light, and finally correcting the measured value according to the correction coefficient to obtain millimeter wave and terahertz wave electric field values. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
Description
Technical Field
The invention relates to the technical field of measurement, in particular to a millimeter wave and terahertz wave electric field measurement method, device and system.
Background
Millimeter wave refers to electromagnetic wave with wavelength range of millimeter magnitude and corresponding frequency in the range of tens GHz to hundreds GHz. The TeraHertz (Thz) band refers to an electromagnetic radiation region having a frequency ranging from several tenths to several tens of Thz, which is quite wide between millimeter waves and infrared light. THz and millimeter wave field intensity measuring instrument equipment is relatively slow to develop due to high technical difficulty, so that the technical research is relatively lagged. The precise measurement of the electromagnetic field strength and the polarization direction has great research significance in the aspects of communication, remote sensing, aerospace, radar detection and the like. The conventional measurement usually adopts a dipole antenna as a receiving measurement instrument, but before measurement, a dipole antenna probe needs to be placed in a standard electric field for calibration, and the measurement of the standard electric field needs to be calibrated, so that the calibration has no absolute fixed standard, and a larger calibration error can be introduced; it is generally believed that the minimum measurement of the conventional electric dipole probe method is about 1mV/cm, and the measurement uncertainty is in the range of 4% -20% depending on the frequency measured. In modern technology, one reduces the minimum measured value to 30 mu V/cm by optical means, and the sensitivity can reach 1 mV.cm < -1 > Hz < -1 >.
Currently, there is a quantum measurement system that uses a reed-burg atom in combination with a laser system for detecting electromagnetic wave signals. The main method is (taking cesium atom as an example): the cesium atom probe was irradiated with pump light of wavelength 509nm and probe laser of 852nm to produce EIT (Electromagnetically induced transparency electromagnetic induction transparency) process. When microwaves with proper frequency are irradiated in the color bubble, absorption peaks in the EIT process can be split, and the amplitude of the microwave electric field intensity can be accurately analyzed from the split width. Cesium atomic bubbles are generally made of quartz glass, and are evacuated and then filled with vapor of cesium atoms. Current cesium atomic bubbles are typically around 1cm in diameter due to processing problems. Atomic bubbles of this size can ignore the standing wave effect of electromagnetic waves formed in the bubbles when measuring microwave fields below 10 GHz. When the wavelength of the electromagnetic wave is in the range of 10G-500GHz, the wavelength of the electromagnetic wave is reduced, and the standing wave phenomenon generated by the electromagnetic wave irradiating on the wall can interfere the optical field of the finally measured detection light, so that the accuracy of electric field measurement is affected.
Disclosure of Invention
Based on this, it is necessary to provide a millimeter wave and terahertz wave electric field measurement method, device and system for overcoming the defect that the standing wave phenomenon generated by electromagnetic wave irradiation on the wall will interfere with the optical field of the finally measured probe light, and affect the accuracy of electric field measurement.
A millimeter wave and terahertz wave electric field measurement method includes the steps:
acquiring an amplitude value of standing waves in the atomic bubble cavity on the electromagnetic wave amplitude to determine a correction coefficient;
a measured value determined by moving a standing wave period in a diameter direction inside the glass probe according to the probe light;
and correcting the measured value according to the correction coefficient to obtain millimeter wave and terahertz wave electric field values.
According to the millimeter wave and terahertz wave electric field measurement method, after the amplification value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude is obtained, the correction coefficient is determined, the measured value is corrected according to the correction coefficient after the detection light moves in the glass probe along the diameter direction by one standing wave period, and finally the measured value is corrected according to the correction coefficient, so that the millimeter wave and terahertz wave electric field value is obtained. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
In one embodiment, the process of obtaining the amplitude increase value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude to determine the correction coefficient includes the steps of:
quantitatively calculating the standing wave phenomenon in the atomic bubble cavity to obtain the amplitude amplification value of the standing wave to the electromagnetic wave amplitude; wherein the increment value is a correction coefficient.
In one embodiment, the process of quantitatively calculating the standing wave phenomenon in the atomic bubble cavity to obtain the amplitude increasing value of the standing wave to the electromagnetic wave comprises the following steps:
and calculating a proportional coefficient of the standing wave field intensity average value relative to the signal field intensity by an electromagnetic field time domain difference method, and determining the proportional coefficient as an amplification value.
In one embodiment, a process for determining a measured value based on a period of a standing wave of probe light moving diametrically inside a glass probe, comprises the steps of:
the light source controlling the probe light is moved diametrically along the inside of the glass probe for one standing wave period to determine the measured value.
In one embodiment, the process of correcting the measured value according to the correction coefficient to obtain the electric field values of the millimeter wave and the terahertz wave includes the steps of:
calculating the average value of the measured values;
and dividing the correction coefficient by the average value to obtain millimeter wave and terahertz wave electric field values.
In one embodiment, the measurement includes amplitude values of electric field strength at various points over a period of the standing wave.
A millimeter wave and terahertz wave electric field measurement apparatus comprising:
the coefficient determining module is used for obtaining the amplitude increasing value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude so as to determine the correction coefficient;
the standing wave measuring module is used for moving a measured value determined by a standing wave period along the diameter direction in the glass probe according to the detection light;
the electric field correction module is used for correcting the measured value according to the correction coefficient so as to obtain millimeter wave and terahertz wave electric field values.
According to the millimeter wave and terahertz wave electric field measuring device, after the amplification value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude is obtained, the correction coefficient is determined, the measured value is corrected according to the correction coefficient after the detection light moves in the glass probe along the diameter direction by one standing wave period, and finally the measured value is corrected according to the correction coefficient, so that the millimeter wave and terahertz wave electric field value is obtained. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
A computer storage medium having stored thereon computer instructions which, when executed by a processor, implement the millimeter wave and terahertz wave electric field measurement method of any of the embodiments described above.
According to the computer storage medium, after the amplification value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude is obtained, the correction coefficient is determined, the measured value determined by the period of the standing wave is moved in the glass probe along the diameter direction according to the detection light, and finally the measured value is corrected according to the correction coefficient, so that the millimeter wave and terahertz wave electric field value is obtained. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
A computer device comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor realizes the millimeter wave and terahertz wave electric field measurement method of any embodiment when executing the program.
According to the computer equipment, after the amplification value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude is obtained, the correction coefficient is determined, the measured value is determined according to the period of the standing wave which is moved in the diameter direction inside the glass probe by the detection light, and finally the measured value is corrected according to the correction coefficient, so that the millimeter wave and terahertz wave electric field value is obtained. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
The millimeter wave and terahertz wave electric field measurement system comprises a precision displacement table and a data processing module;
the precise displacement table is used for enabling the detection light to move in the glass probe along the diameter direction for one standing wave period;
the data processing module is used for executing the millimeter wave and terahertz wave electric field measurement method in any embodiment.
According to the millimeter wave and terahertz wave electric field measurement system, standing wave periodic movement is completed through the precise displacement table, and the data processing module is used for executing the millimeter wave and terahertz wave electric field measurement method. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
Drawings
FIG. 1 is a flowchart of a millimeter wave and terahertz wave electric field measurement method according to an embodiment;
FIG. 2 is a flowchart of a millimeter wave and terahertz wave electric field measurement method according to another embodiment;
FIG. 3 is a flowchart of a millimeter wave and terahertz wave electric field measurement method according to another embodiment;
FIG. 4 is a block diagram of a millimeter wave and terahertz wave electric field measurement apparatus according to an embodiment;
fig. 5 is a block diagram of a millimeter wave and terahertz wave electric field measurement system according to an embodiment.
Detailed Description
For a better understanding of the objects, technical solutions and technical effects of the present invention, the present invention will be further explained below with reference to the drawings and examples. Meanwhile, it is stated that the embodiments described below are only for explaining the present invention and are not intended to limit the present invention.
The embodiment of the invention provides a millimeter wave and terahertz wave electric field measurement method.
Fig. 1 is a flowchart of a millimeter wave and terahertz wave electric field measurement method according to an embodiment, as shown in fig. 1, the millimeter wave and terahertz wave electric field measurement method according to an embodiment includes steps S100 to S102:
s100, obtaining an amplitude value of standing waves in an atomic bubble cavity on electromagnetic wave amplitude so as to determine a correction coefficient;
wherein the atomic bubble cavity stores Redberg atoms. And (3) the coupled light beam and the probe light beam are irradiated into the atomic bubble, standing wave interference in the coupled light beam and the probe light beam is analyzed, and the amplitude increasing value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude is obtained, so that the correction coefficient is determined.
In one example, fig. 2 is a flowchart of a millimeter wave and terahertz wave electric field measurement method according to another embodiment, as shown in fig. 2, in step S100, a process of obtaining an amplitude value of a standing wave in an atomic bubble cavity to an electromagnetic wave amplitude to determine a correction coefficient includes step S200:
s200, quantitatively calculating the standing wave phenomenon in the atomic bubble cavity to obtain the amplitude amplification value of the standing wave to the electromagnetic wave amplitude; wherein the increment value is a correction coefficient.
The standing wave is two waves with the same frequency and opposite transmission directions, and is a distribution state formed along the transmission line. One of the waves is typically a reflected wave of the other wave. An antinode occurs at a point where the two are added, and a node is formed at a point where the two are subtracted. The locations of the nodes and antinodes are constant throughout, with their instantaneous values changing over time. If the amplitudes of the two waves are equal, the amplitude of the node is zero. The light beam irradiates into the atomic bubble, and is reflected by the interface, and light waves with opposite directions are overlapped or subtracted, so that standing waves are formed. The following formula is followed:
waves propagating in opposite directions are represented by the following equation:
wherein y is 0 Is the amplitude of the wave; ω is angular frequency, ω=2pi f; k is wave number; x and t represent the variables of coordinates and time, respectively.
The result of the superposition of the two waves is as follows:
y＝y 0 sin(kx-ωt)+y 0 sin(kx+ωt)
the simplified result is as follows:
y＝2y 0 cosωt sinωt
and quantitatively calculating the amplification value of the standing wave to the electromagnetic wave amplitude, and taking the amplification value as a correction coefficient.
In one example, fig. 3 is a flowchart of a millimeter wave and terahertz wave electric field measurement method according to another embodiment, as shown in fig. 3, in step S200, a process of quantitatively calculating a standing wave phenomenon in an atomic bubble cavity to obtain an amplitude increasing value of the standing wave to an electromagnetic wave amplitude is shown, and includes step S300:
s300, calculating a proportion coefficient of the standing wave field intensity average value relative to the signal field intensity by an electromagnetic field time domain difference method, and determining the proportion coefficient as an amplification value.
As a preferred embodiment, the scaling factor of the average value of the standing wave field strength relative to the signal field strength can be calculated by FDTD (Finite Difference Time Domain time domain finite difference method) or com sol simulation software, etc. to determine the correction factor.
S101, moving a measured value determined by a standing wave period along the diameter direction in the glass probe according to the detection light;
the standing wave is related to reflection of the detection light, and the movement of the standing wave is realized by controlling movement of the detection light in the glass probe along the diameter direction.
In one embodiment, as shown in fig. 2, the process of moving the measured value determined by one standing wave period in the glass probe in the diameter direction according to the probe light in step S101 includes step S400:
s400, controlling the light source of the detection light to move along the diameter direction along the inner part of the glass probe for one standing wave period so as to determine a measured value.
The precise displacement platform can be designed, and the detection light source is driven to move by moving the precise displacement platform, so that the detection light can move in the glass probe along the diameter direction.
S102, correcting the measured value according to the correction coefficient to obtain millimeter wave and terahertz wave electric field values.
After the measured value related to the standing wave phenomenon is obtained, the measured value is corrected through the correction coefficient, so that the millimeter wave and terahertz wave electric field values are more accurate. Because the Redberg atoms have extremely high polarizability and microwave transition dipole moment, the device is extremely sensitive to external electromagnetic fields, and can realize high-resolution and high-sensitivity measurement of ultra-wideband radio frequency electric fields based on the Redberg atoms. Through the full-optical lossless electromagnetic induction transparent detection means of the Redberg atoms, the precise measurement of the external electric field of the fast calibration-free broadband (0.01-1000 GHz) based on the atoms can be realized. For microwave fields with frequencies greater than 1GHz, autler-Townes splits formed by coupling adjacent Redburg energy levels by the microwave fields are measured; and for long wave radio frequency fields with frequencies less than 1GHz, the measurement is made by the radio frequency sideband energy level of the Redberg energy level. The technical scheme of the embodiment is based on atomic energy level parameters, can trace to basic physical constants, does not depend on external references, and has no interference on an electric field.
In one embodiment, as shown in fig. 2, the process of correcting the measured value according to the correction coefficient in step S102 to obtain the electric field values of the millimeter wave and the terahertz wave includes step S500 and step S501:
s500, calculating an average value of the measured values;
s501, dividing the correction coefficient by the average value to obtain millimeter wave and terahertz wave electric field values.
The amplitude value of the electric field intensity of each point in one standing wave period is obtained as a measured value, and the average value of the measured values is obtained. And when the signal field intensity is E, the proportion of the standing wave field intensity average value relative to the signal field intensity E is a coefficient k, namely a correction coefficient. And dividing the correction coefficient k by the average value to obtain the real signal field intensity, and determining the electric field values of the millimeter wave and the terahertz wave.
According to the millimeter wave and terahertz wave electric field measurement method in any embodiment, after the amplification value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude is obtained, the correction coefficient is determined, the measured value is corrected according to the correction coefficient after the detection light moves in the glass probe along the diameter direction by one standing wave period, so that the millimeter wave and terahertz wave electric field value is obtained. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
The embodiment of the invention also provides a millimeter wave and terahertz wave electric field measuring device.
Fig. 4 is a block diagram of a millimeter wave and terahertz wave electric field measurement apparatus according to an embodiment, as shown in fig. 4, the millimeter wave and terahertz wave electric field measurement apparatus according to an embodiment includes a module 100, a module 101, and a module 102:
the coefficient determining module 100 is configured to obtain an amplitude value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude so as to determine a correction coefficient;
a standing wave measuring module 101 for moving a measured value determined by a standing wave period in a diameter direction inside the glass probe according to the probe light;
the electric field correction module 102 is configured to correct the measured value according to the correction coefficient to obtain electric field values of millimeter waves and terahertz waves.
According to the millimeter wave and terahertz wave electric field measuring device, after the amplification value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude is obtained, the correction coefficient is determined, the measured value is corrected according to the correction coefficient after the detection light moves in the glass probe along the diameter direction by one standing wave period, and finally the measured value is corrected according to the correction coefficient, so that the millimeter wave and terahertz wave electric field value is obtained. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
The embodiment of the invention also provides a computer storage medium, on which computer instructions are stored, which when executed by a processor, implement the millimeter wave and terahertz wave electric field measurement method of any one of the embodiments.
Those skilled in the art will appreciate that: all or part of the steps for implementing the above method embodiments may be implemented by hardware associated with program instructions, where the foregoing program may be stored in a computer readable storage medium, and when executed, the program performs steps including the above method embodiments; and the aforementioned storage medium includes: a mobile storage device, a random access Memory (RAM, random Access Memory), a Read-Only Memory (ROM), a magnetic disk or an optical disk, or the like, which can store program codes.
Alternatively, the above-described integrated units of the present invention may be stored in a computer-readable storage medium if implemented in the form of software functional modules and sold or used as separate products. Based on such understanding, the technical solution of the embodiments of the present invention may be essentially or part contributing to the related art, and the computer software product may be stored in a storage medium, and include several instructions to cause a computer device (which may be a personal computer, a terminal, or a network device) to execute all or part of the methods of the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program code, such as a removable storage device, RAM, ROM, magnetic or optical disk.
Corresponding to the above-mentioned computer storage medium, in one embodiment, there is also provided a computer device, including a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor implements the millimeter wave and terahertz wave electric field measurement method according to any one of the above-mentioned embodiments when executing the program.
According to the computer equipment, after the amplification value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude is obtained, the correction coefficient is determined, the measured value is determined according to the period that the probe light moves in the glass probe along the diameter direction, and finally the measured value is corrected according to the correction coefficient, so that the millimeter wave electric field value and the terahertz wave electric field value are obtained. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
The embodiment of the invention also provides a millimeter wave and terahertz wave electric field measurement system.
Fig. 5 is a block diagram of a millimeter wave and terahertz wave electric field measurement system according to an embodiment, as shown in fig. 5, the millimeter wave and terahertz wave electric field measurement system according to an embodiment includes a precision displacement table 1000 and a data processing module 1001;
the precise displacement table 1000 is used for enabling the probe light to move in the diameter direction in the glass probe for one standing wave period;
the precise displacement table 1000 is used for setting a detection light source, and the detection light source is driven by moving the precise displacement table 1000 so as to realize the movement of the detection light in the glass probe along the diameter direction.
The data processing module 1001 is configured to perform the millimeter wave and terahertz wave electric field measurement method of any one of claims 1 to 6.
According to the millimeter wave and terahertz wave electric field measurement system, standing wave periodic movement is completed through the precise displacement table, and the data processing module is used for executing the millimeter wave and terahertz wave electric field measurement method. Based on the above, the millimeter wave electric field value and the terahertz electric field value obtained after the measured value is corrected by the correction coefficient can reduce the interference caused by the standing wave phenomenon and improve the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The foregoing examples illustrate only a few embodiments of the invention, which are described in detail and are not to be construed as limiting the scope of the invention. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the invention, which are all within the scope of the invention. Accordingly, the scope of protection of the present invention is to be determined by the appended claims.
Claims (7)
1. The millimeter wave and terahertz wave electric field measurement method is characterized by comprising the following steps:
acquiring an amplitude value of standing waves in the atomic bubble cavity on the electromagnetic wave amplitude to determine a correction coefficient;
the process for obtaining the amplitude increasing value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude so as to determine the correction coefficient comprises the following steps:
quantitatively calculating the standing wave phenomenon in the atomic bubble cavity to obtain the amplitude amplification value of the standing wave to the electromagnetic wave amplitude; wherein the increment value is the correction coefficient;
wherein the wave propagating in the opposite direction of the standing wave is expressed by the following equation:
wherein y is 0 Is the amplitude of the wave; ω is angular frequency, ω=2pi f; k is wave number; x and t represent the variables of coordinates and time, respectively;
the result of the superposition of the two waves is as follows:
y＝y 0 sin(kx-ωt)+y 0 sin(kx+ωt)
the simplified result is as follows:
y＝2y 0 cosωtsinωt
quantitatively calculating the amplification value of the standing wave to the amplitude of the electromagnetic wave, and taking the amplification value as a correction coefficient;
a measured value determined by moving a standing wave period in a diameter direction inside the glass probe according to the probe light;
the process of measuring the value determined by moving the probe light in the diameter direction for one standing wave period in the glass probe comprises the following steps:
controlling the light source of the detection light to move along the diameter direction along the inside of the glass probe for one standing wave period so as to determine the measured value;
and correcting the measured value according to the correction coefficient to obtain millimeter wave and terahertz wave electric field values.
2. The millimeter wave and terahertz wave electric field measurement method according to claim 1, wherein the process of correcting the measurement value according to the correction coefficient to obtain millimeter wave and terahertz wave electric field values includes the steps of:
averaging the measured values;
and dividing the correction coefficient by the average value to obtain millimeter wave and terahertz wave electric field values.
3. The millimeter wave and terahertz wave electric field measurement method according to claim 1 or 2, wherein the measurement value includes amplitude values of electric field intensities of points in a standing wave period range.
4. A millimeter wave and terahertz wave electric field measurement apparatus, characterized by comprising:
the coefficient determining module is used for obtaining the amplitude increasing value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude so as to determine the correction coefficient;
the process for obtaining the amplitude increasing value of the standing wave in the atomic bubble cavity to the electromagnetic wave amplitude so as to determine the correction coefficient comprises the following steps:
quantitatively calculating the standing wave phenomenon in the atomic bubble cavity to obtain the amplitude amplification value of the standing wave to the electromagnetic wave amplitude; wherein the increment value is the correction coefficient;
wherein the wave propagating in the opposite direction of the standing wave is expressed by the following equation:
wherein y is 0 Is the amplitude of the wave; ω is angular frequency, ω=2pi f; k is wave number; x and t represent the variables of coordinates and time, respectively;
the result of the superposition of the two waves is as follows:
y＝y 0 sin(kx-ωt)+y 0 sin(kx+ωt)
the simplified result is as follows:
y＝2y 0 cosωtsinωt
quantitatively calculating the amplification value of the standing wave to the amplitude of the electromagnetic wave, and taking the amplification value as a correction coefficient;
the standing wave measuring module is used for moving a measured value determined by a standing wave period along the diameter direction in the glass probe according to the detection light;
the process of measuring the value determined by moving the probe light in the diameter direction for one standing wave period in the glass probe comprises the following steps:
controlling the light source of the detection light to move along the diameter direction along the inside of the glass probe for one standing wave period so as to determine the measured value;
and the electric field correction module is used for correcting the measured value according to the correction coefficient so as to obtain millimeter wave and terahertz wave electric field values.
5. A computer storage medium having stored thereon computer instructions which, when executed by a processor, implement the millimeter wave and terahertz wave electric field measurement method of any one of claims 1 to 3.
6. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the millimeter wave and terahertz wave electric field measurement method as claimed in any one of claims 1 to 3 when the program is executed by the processor.
7. The millimeter wave and terahertz wave electric field measurement system is characterized by comprising a precision displacement table and a data processing module;
the precise displacement table is used for enabling the detection light to move in the glass probe along the diameter direction for one standing wave period;
the data processing module is used for executing the millimeter wave and terahertz wave electric field measurement method according to any one of claims 1 to 3.
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