CN112684234B - Probe identification method of oscilloscope and oscilloscope - Google Patents
Probe identification method of oscilloscope and oscilloscope Download PDFInfo
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- CN112684234B CN112684234B CN202110293326.8A CN202110293326A CN112684234B CN 112684234 B CN112684234 B CN 112684234B CN 202110293326 A CN202110293326 A CN 202110293326A CN 112684234 B CN112684234 B CN 112684234B
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Abstract
A method for identifying probe of oscilloscope and oscilloscope, collecting partial pressure signal output by probe of oscilloscope by partial pressure signal sampling module, first controller module determining corresponding interval mark according to magnitude of partial pressure signal and judging whether interval mark is changed, if so, outputting interrupt signal to control processing module, control processing module obtaining said interval mark from first controller module when detecting interrupt signal, determining attenuation proportion of probe connected to oscilloscope according to interval mark, because each interval mark is corresponding to one attenuation proportion of probe of oscilloscope, so that oscilloscope can identify attenuation proportion of connected probe according to interval mark corresponding to magnitude of partial pressure signal, and control processing module adopts self interrupt processing unit to process interrupt signal without occupying resource of control processing module, the problem of multi-task conflict of the oscilloscopes is avoided.
Description
Technical Field
The invention relates to the technical field of oscilloscopes, in particular to a probe identification method of an oscilloscope and the oscilloscope.
Background
The probe of the oscilloscope is a device for connecting a measured signal to the input of the oscilloscope, the performance of the probe is crucial to the accuracy and correctness of the measurement result, and the probe is essentially an electronic component for connecting the measured circuit and the input end of the oscilloscope. The simplest probe is a conducting wire which is used for connecting a tested circuit and the input end of the electronic oscilloscope, and because no shielding measure is adopted, the probe is easily interfered by an external electromagnetic field, and the equivalent capacitance of the probe is large, the load of the tested circuit is easily increased; however, complex probes consist of a resistive-capacitive element and an active device.
Probes of oscilloscopes can be generally classified as active probes and passive probes. The passive probe is composed of a cable and a passive device, and does not need a power supply. The passive probe can usually provide high input impedance of 1M omega or 10M omega, but the input capacitance cannot be very small, so the bandwidth of the passive probe cannot be very high, and the bandwidth is generally within 500 MHz. The active probe contains source devices such as amplifiers and transistors, and needs an external power supply. The active probe can realize high input impedance and small input capacitance, the load effect is obviously better than that of a passive probe, and the bandwidth of the active probe can be generally more than 1 GHz.
Probes of the oscilloscope can be generally classified into 1X (no attenuation) and 10X (10 times attenuation) according to different attenuation ratios, and the derived probe attenuation ratios can generally reach 20X (20 times attenuation), 50X (50 times attenuation), 100X (100 times attenuation), 200X (200 times attenuation), 500X (500 times attenuation), 1000X (1000 times attenuation) and the like.
When the oscilloscope is connected with the probes with different attenuation ratios, the oscilloscope needs to adjust the attenuation multiple of the acquisition channel of the oscilloscope according to the change of the attenuation ratio of the probe, and display the attenuation ratio of the currently connected probe in a display interface of the oscilloscope, so that a user can acquire the attenuation ratio of the waveform corresponding to signal data acquisition when observing the waveform. However, the conventional oscilloscope usually can only automatically identify the type of the probe of 10X, and cannot automatically identify other attenuation ratios, so that a user needs to manually configure the attenuation ratios of the oscilloscope when accessing the probe.
In addition, when the oscilloscope automatically identifies the probe, the processor in the oscilloscope usually adopts a timing polling mode to detect whether the probe is accessed, and the mode occupies a large amount of resources for the processor in the oscilloscope, so that when multiple tasks conflict, the conflict between the tasks cannot be avoided.
Disclosure of Invention
The invention mainly solves the technical problem of how to automatically identify the attenuation proportion of a probe connected into an oscilloscope.
According to a first aspect, there is provided in an embodiment an oscilloscope, comprising:
the signal acquisition processing module is used for receiving signals transmitted by a probe accessed to the oscilloscope, and acquiring and processing the received signals to obtain first signal data;
the voltage division signal sampling module is used for acquiring a voltage division signal output by a probe of the oscilloscope and outputting the voltage division signal to the first controller module; the magnitude of the voltage division signal is related to the resistance value of a voltage division resistor built in a probe of the oscilloscope;
the first controller module is used for receiving the partial pressure signal, determining an interval identifier corresponding to the magnitude of the partial pressure signal, judging whether the interval identifier changes or not, and outputting an interrupt signal to the control processing module if the interval identifier changes; the interval mark is used for marking the attenuation proportion of a probe accessed by the oscilloscope;
and the control processing module is used for receiving the first signal data, processing the first signal data into display image data, acquiring the interval identifier from the first controller module when an interrupt signal output by the first controller module is detected, and determining the attenuation proportion of the probe accessed to the oscilloscope according to the interval identifier.
According to a second aspect, an embodiment provides a probe identification method for an oscilloscope, which is applied to the oscilloscope, and comprises the following steps:
receiving a signal transmitted by a probe of an oscilloscope, and acquiring and processing the received signal to obtain first signal data;
acquiring a voltage division signal output by a probe of the oscilloscope; the magnitude of the voltage division signal is related to the resistance value of a voltage division resistor built in a probe of the oscilloscope;
determining an interval identifier corresponding to the magnitude of the partial pressure signal, judging whether the interval identifier changes, and if so, outputting an interrupt signal; the interval mark is used for marking the probe type and the attenuation proportion of a probe accessed by the oscilloscope;
processing the first signal data into display image data, acquiring the interval identification when an interrupt signal is detected, configuring the attenuation multiple when the signal is acquired according to the attenuation proportion corresponding to the interval identification, and determining the attenuation proportion of a probe accessed to the oscilloscope according to the interval identification.
According to the oscilloscope of the embodiment, the partial pressure signal output by the probe of the oscilloscope is acquired through the partial pressure signal sampling module, the first controller module determines the corresponding interval identifier according to the magnitude of the partial pressure signal and judges whether the interval identifier changes or not, if the interval identifier changes, the interrupt signal is output to the control processing module, the control processing module acquires the interval identifier from the first controller module when detecting the interrupt signal, the attenuation proportion of the probe accessed into the oscilloscope is determined according to the interval identifier, each interval identifier corresponds to one attenuation proportion of the probe of the oscilloscope, so that the oscilloscope can identify the attenuation proportion of the accessed probe according to the interval identifier corresponding to the magnitude of the partial pressure signal, and the control processing module adopts the interrupt processing unit of the oscilloscope to process the interrupt signal without occupying the resources of the control processing module, the problem of multi-task conflict of the oscilloscopes is avoided.
Drawings
FIG. 1 is a block diagram of a passive probe connected to an oscilloscope;
FIG. 2 is a block diagram of a connection structure of an active probe and an oscilloscope;
FIG. 3 is a schematic diagram of an oscilloscope according to an embodiment;
FIG. 4 is a schematic diagram of an oscilloscope according to another embodiment;
FIG. 5 is a schematic diagram of an oscilloscope according to yet another embodiment;
FIG. 6 is a flow diagram of a method for identifying a probe of an oscilloscope according to an embodiment;
FIG. 7 is a flowchart of the operation of the first controller module;
fig. 8 is a flowchart of the operation of the control processing module.
Detailed Description
The present invention will be described in further detail with reference to the following detailed description and accompanying drawings. Wherein like elements in different embodiments are numbered with like associated elements. In the following description, numerous details are set forth in order to provide a better understanding of the present application. However, those skilled in the art will readily recognize that some of the features may be omitted or replaced with other elements, materials, methods in different instances. In some instances, certain operations related to the present application have not been shown or described in detail in order to avoid obscuring the core of the present application from excessive description, and it is not necessary for those skilled in the art to describe these operations in detail, so that they may be fully understood from the description in the specification and the general knowledge in the art.
Furthermore, the features, operations, or characteristics described in the specification may be combined in any suitable manner to form various embodiments. Also, the various steps or actions in the method descriptions may be transposed or transposed in order, as will be apparent to one of ordinary skill in the art. Thus, the various sequences in the specification and drawings are for the purpose of describing certain embodiments only and are not intended to imply a required sequence unless otherwise indicated where such sequence must be followed.
The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings).
Referring to fig. 1, fig. 1 is a block diagram of a connection structure of a passive probe and an oscilloscope, where the passive probe includes a signal test path and a detection circuit, the oscilloscope includes an oscilloscope channel, an acquisition and data processing module, a main processor, a display module and a logic device, the signal test path in the passive probe includes an analog front end, a cable and a BNC connector, the test path is connected with the oscilloscope channel, the test path is used to send a signal to be tested to the oscilloscope channel, and after the signal input to the oscilloscope channel is processed by the acquisition and data processing module, the signal is input to the main processor and the signal to be tested after being sorted by the main processor is displayed on the display module; the detection circuit in the passive probe comprises a pull-down resistor R2 and an elastic needle, wherein when the passive probe is connected, the elastic needle is in a closed state, when the passive probe is not connected, the elastic needle is in an open state, one end of the pull-down resistor R2 is grounded, the other end of the pull-down resistor R2 is connected with one end of the elastic needle, the other end of the elastic needle is connected with a logic device in an oscilloscope, the oscilloscope further comprises a pull-up resistor R1, one end of the pull-up resistor R1 is connected with a power supply VCC, and the other end of the pull-up resistor R1.
When the passive probe is connected, the pull-up resistor R1 is connected with the pull-down resistor R2 to divide the voltage of VCC, and the divided voltage is output to the logic device.
The voltage supplied to the logic device at this time is: v _ L = R2/(R1+ R2) × VCC.
When the probe is disconnected, the connection between the pull-up resistor R1 and the pull-down resistor R2 is disconnected, and the voltage output to the logic device is as follows: v _ H = VCC.
When the selected resistance values of R1 and R2 are reasonable, when the passive probe is accessed, V _ L is lower than the judgment threshold of the logic device, and the output level of the logic device is 0; when the passive probe is disconnected, V _ H is higher than the judgment threshold of the logic device, and the output level of the logic device is 1.
The identification process of the passive probe is as follows:
the main processor periodically inquires the logic signal sent by the logic device.
When the passive probe is not accessed, the main processor detects a high-level signal, and does not process the high-level signal if the main processor does not detect signal jump.
When the passive probe is accessed, the main processor detects that the level of the logic device is low, the gain of the analog channel is configured, and the attenuation ratio of 10X is displayed on a screen.
When the passive probe is removed, the main processor detects that the level jumps from 0 to 1, and executes the action configuration simulation channel, and displays the attenuation ratio of 1X on the screen.
Referring to fig. 2, fig. 2 is a block diagram of a connection structure of an active probe and an oscilloscope, the internal structure of the active probe is similar to that of a passive probe, the active probe also includes a signal testing path and a detection circuit, the signal testing path and the detection circuit in the active probe also have the same function and the same connection mode with the oscilloscope as the passive probe, and the passive probe also includes a probe information storage module compared with the active probe.
The probe information storage module comprises a slave IIC controller, a memory, a DAC (digital-to-analog converter) and a connector for controlling signals, wherein the oscilloscope comprises a master IIC controller, the memory stores two types of information, one type is the model and specification information of the active probe, and the other type is the calibration information of the active probe. The type and specification information of the active probe is fixed information, the information is not randomly changed after being written, and the calibration information of the active probe is updated after being calibrated by a user through the slave IIC controller and a corresponding calibration algorithm.
The identification process of the active probe is as follows:
the main processor periodically inquires the logic signal sent by the logic device.
When the probe is not accessed, the main processor detects a high level signal 1, and does not process the high level signal if the main processor does not detect signal jump.
When the probe is accessed, the main processor detects that the logic level is changed from high 1 to low 0.
The slave IIC address of the active probe is accessed by the IIC controller.
And obtaining the model and specification information of the active probe from the memory, and reading the model and specification information into the memory of the main processor.
And acquiring the calibration information of the active probe from the memory, and reading the calibration information into the memory of the main processor.
And displaying the specification and model information of the active probe in a display module.
And configuring the calibration information of the active probe into a DAC module of the probe.
When the active probe is removed, the main processor detects that the logic level goes from low 0 to high 1.
The main processor removes the specification model information of the probe from the display module.
According to the identification mode of the oscilloscope on the active probe and the passive probe, the oscilloscope can only identify whether the probe is accessed, and the judgment state is only two, namely, the access state and the non-access state. If the proportion of the connected probe is not the default 10 times of the attenuation probe, the oscilloscope cannot distinguish, reasonable adaptation processing can not be carried out on the acquired data according to the actual attenuation proportion of the probe, and a user needs to manually configure the attenuation proportion of the oscilloscope. In addition, a main processor in the oscilloscope can only scan whether a probe is accessed or not in a timed polling mode, and other processes such as a waveform acquisition process and a user configuration process can be interrupted when the processor is busy in service, so that the complexity of code design is greatly increased, the stability of system operation is influenced, the smoothness of equipment operation is reduced, and the operation experience of a user is influenced. In addition, the oscilloscope can only read and configure the probe in a bus mode of IIC, and when the data volume stored in the probe is large, the speed of the IIC cannot meet the requirement of data transmission; at this time, a data transmission interface with a higher speed, such as an SPI interface, needs to be considered, where the oscilloscope cannot adapt to the interface type.
In the embodiment of the invention, the partial pressure signal output by the probe of the oscilloscope is acquired by the partial pressure signal sampling module, the first controller module determines the corresponding interval identifier according to the magnitude of the partial pressure signal, and judging whether the interval mark changes, if so, outputting an interrupt signal to the control processing module, and when the control processing module detects the interrupt signal, acquiring the interval identifier from the first controller module, determining the attenuation proportion of a probe accessed to the oscilloscope according to the interval identifier, because each interval mark corresponds to one attenuation proportion of the probe of the oscilloscope, the oscilloscope can identify the attenuation proportion of the accessed probe according to the interval mark corresponding to the magnitude of the voltage division signal, and the control processing module adopts the interrupt processing unit of the control processing module to process interrupt signals, so that the resource of the control processing module is not required to be occupied, and the problem of multi-task conflict of the oscilloscope is avoided.
Referring to fig. 3, fig. 3 is a schematic structural diagram of an oscilloscope according to an embodiment, where the oscilloscope includes a signal acquisition processing module 10, a voltage division signal sampling module 20, a first controller module 30, and a control processing module 40.
The signal acquisition processing module 10 is configured to receive a signal transmitted by a probe connected to the oscilloscope, and acquire and process the received signal to obtain first signal data.
The voltage division signal sampling module 20 is configured to acquire a voltage division signal output by a probe of the oscilloscope, and output the voltage division signal to the first controller module; the magnitude of the voltage division signal is related to the resistance value of a voltage division resistor built in a probe of the oscilloscope.
The first controller module 30 is configured to receive the voltage division signal, determine an interval identifier corresponding to the size of the voltage division signal, determine whether the interval identifier changes, and output an interrupt signal to the control processing module if the interval identifier changes; the interval mark is used for marking the attenuation proportion of the probe accessed by the oscilloscope.
The control processing module 40 is configured to receive the first signal data, process the first signal data into display image data, obtain the interval identifier from the first controller module when an interrupt signal output by the first controller module is detected, and determine an attenuation ratio of a probe connected to the oscilloscope according to the interval identifier.
Referring to fig. 4, in an embodiment, the probe connected to the oscilloscope is a passive probe, which is described in detail below.
The signal acquisition and processing module 10 includes an oscilloscope channel 11 and an acquisition and data processing module 12, the corresponding passive probe includes an analog front end 51, a BNC connector 52, a voltage dividing resistor R2 (pull-down resistor R2) and a pogo pin 61, the analog front end 51 is connected with the circuit to be tested and is used for transmitting the signal to be tested on the circuit to be tested, the BNC connector 52 is used for outputting the signal to be tested transmitted by the analog front end 51 to the oscilloscope channel 11 in the oscilloscope, and the acquisition and data processing module 12 is used for acquiring and processing the signal transmitted by the probe of the oscilloscope to obtain first signal data.
The voltage division signal sampling module 20 comprises an analog-digital sampling device ADC 21, the analog-digital sampling device ADC 21 is connected with a voltage division resistor R2 (namely a pull-down resistor R2) arranged in the probe through an elastic pin 61, the analog-digital sampling device ADC 21 is also connected with a power supply VCC through a pull-up resistor R1 in an oscilloscope, when the probe is connected to the oscilloscope, the elastic pin 61 is closed, the voltage division resistor R2 is connected with the voltage division signal sampling module 20, at the moment, the analog-digital sampling device ADC can output a sampled voltage division signal, and the voltage value of the voltage division signal is R2/(R1+ R2) > VCC; when the probe is not connected to the oscilloscope, the elastic pin is disconnected, the voltage dividing resistor R2 is disconnected from the voltage dividing signal sampling module 20, and the voltage value of the voltage dividing signal output by the analog-to-digital sampling device ADC is equal to VCC.
The first controller module 30 includes a first controller 31 and a first memory 32, where the first controller 31 is configured to receive the voltage division signal, obtain magnitudes of a plurality of preset threshold voltage division signals, and determine a voltage division signal interval corresponding to the voltage division signal according to a relationship between the magnitude of the voltage value of the voltage division signal and the magnitudes of the voltage values of the plurality of preset threshold voltage division signals; when detecting that the partial pressure signal interval corresponding to the partial pressure signal changes, determining an interval identifier corresponding to the changed partial pressure signal interval, generating an interrupt signal and sending the interrupt signal to the control processing module; the interval marks correspond to the voltage division signal intervals one by one; the first memory is used for storing a plurality of preset threshold voltage division signals.
The first controller module in this embodiment may be implemented by a single chip microcomputer, for example, an STM32 single chip microcomputer, an STM32 single chip microcomputer having an on-chip RAM (random access memory) and a ROM (read only memory), and an internal 12-bit ADC. Of course, this application can also be implemented using discrete devices, but at increased cost.
In addition, the first controller includes an interrupt register, and when it is detected that the divided-voltage signal interval corresponding to the divided-voltage signal changes, the first controller sets a value of the interrupt register as an interval identifier, where the interval identifier in this embodiment is 0, 1, 2, and 3 … …, and after the control processing module detects the interrupt signal, the control processing module directly reads the value of the interrupt register from the first controller to obtain the interval identifier after the divided-voltage signal interval changes.
In this embodiment, when the control processing module does not acquire the interval identifier from the first controller module, the first controller module continues to send the interrupt signal to the control processing module until the first controller module detects that the control processing module acquires the interval identifier from the first controller module, and stops outputting the interrupt signal.
The control processing module processes the interrupt signal by adopting the interrupt processing unit of the control processing module, so that resources for processing other tasks are not occupied, the problem of multi-task conflict is avoided, and after the control processing module reads the interval identifier from the first controller module, the first controller module stops sending the interrupt signal, so that the probe identification is more efficient.
In an embodiment, as shown in table 1, the resistance of the pull-up resistor R1 in the oscilloscope is 2.7Kohm, the resistance of R1 is fixed and unchanged, the resistances of the voltage dividing resistors R2 in different types of probes are different, the voltage value of the power source VCC is 3.3V, and the voltage values of the voltage dividing signals sampled by the analog-to-digital sampling device ADC are different for different probes connected to the oscilloscope.
TABLE 1
It should be noted that the types of the probe may include different attenuation ratios of the probe, different interfaces (different bus modes) for the probe and the oscilloscope to transmit control signals, and the like. In this embodiment, the attenuation ratio of the probe may be 1X, 10X, 100X, etc., and the interface between the probe and the oscilloscope for transmitting the control signal may also be an IIC interface and an SPI interface. In addition, the embodiment also comprises the condition that the oscilloscope does not access the probe and the condition that the probe is short-circuited.
As can be seen from table 1, the oscilloscope is connected to the probes with different attenuation ratios, and the voltage values of the divided voltage signals output by the ADC in the oscilloscope are different, and in this embodiment, the attenuation ratio corresponding to the divided voltage signal is determined according to the relationship between the preset voltage value of the divided voltage signal and the attenuation ratio of the probe.
In this embodiment, the corresponding divided voltage signal when the probe is not accessed is identified as 1, and then the divided voltage signals corresponding to the attenuation ratios are sorted according to a preset sequence, for example, the divided voltage signal corresponding to the attenuation ratio of 1X is identified as 2, and the divided voltage signal corresponding to the attenuation ratio of 10X is identified as 3, … …. In an embodiment, the voltage division signal identifier is an interval identifier.
Since the accuracy of the resistances of the voltage dividing resistor R2 and the pull-up resistor R1 cannot be guaranteed, and the supply voltage of the power VCC also fluctuates, the present embodiment determines different types (attenuation ratios) of probes by using a voltage interval.
The different types of probes correspond to different voltage division signal intervals, each voltage division signal interval comprises a preset threshold voltage division signal, and the embodiment selects the midpoint of the voltage values of the voltage division signal of the current access probe and the voltage division signal of the adjacent probe as the preset threshold voltage division signal.
For example, when there is no probe, the lower limit of the voltage value of the preset threshold voltage division signal is:
；
when no probe exists, the upper limit of the voltage value of the preset threshold voltage division signal is as follows:
；
the lower limit of the voltage value of the preset threshold voltage division signal corresponding to the 1X probe is as follows:
；
the upper limit of the voltage value of the preset threshold voltage division signal corresponding to the 1X probe is as follows:
；
by analogy, the upper limit and the lower limit of the voltage value of the preset threshold voltage division signal corresponding to the other types of probes can be obtained, as shown in table 2.
TABLE 2
As shown in table 2, each voltage division signal interval corresponds to an interval identifier, and when the control processing module detects an interrupt signal output by the first controller module, the control processing module obtains the interval identifier from the first controller module, and can determine the attenuation ratio of the probe connected to the oscilloscope according to the interval identifier.
As can be seen from the above description, the type of the probe includes a transmission interface for a control signal between the probe and the oscilloscope, besides the attenuation ratio of the probe, and the situations of no probe access and short circuit, please refer to fig. 5, in another embodiment, the probe accessed to the oscilloscope is an active probe, which is described in detail below.
Compared with the active probe accessed by the oscilloscope, the oscilloscope also comprises: a second controller module 70. Correspondingly, compared with the passive probe, the active probe further comprises a digital-to-analog conversion device DAC 91, a third controller 81 and a third memory 82.
The second controller module 70 is configured to receive a second controller configuration signal output by the control processing module according to the interval identifier, determine an interface type for transmitting a control signal between the probe of the oscilloscope and the oscilloscope according to the second controller configuration signal, and obtain controller configuration information corresponding to the interface type according to the interface type, where the controller configuration information corresponds to the controller modes one to one, and the controller configuration information is used to configure the second controller module into the corresponding controller mode.
In this embodiment, the control processing module 40 is configured to, when the interval identifier acquired from the first controller module 70 belongs to a first preset interval identifier set (0-11), determine an attenuation ratio of a probe connected to the oscilloscope according to the interval identifier, configure the voltage division signal sampling module by using the attenuation ratio, and display the attenuation ratio on a display interface of the oscilloscope.
The control processing module 40 is further configured to output a second controller configuration signal to the second controller module when the interval identifier acquired from the first controller module belongs to a second preset interval identifier set (12, 13), determine an attenuation ratio of a probe connected to the oscilloscope according to the interval identifier after the second controller module completes configuration, configure the partial pressure signal sampling module by using the attenuation ratio, and display the attenuation ratio on a display interface of the oscilloscope.
The control processing module 40 is further configured to output an error signal when the interval identifier obtained from the first controller module belongs to a third preset interval identifier set (14).
In the present embodiment, the second controller module 70 includes a second controller 71 and a second memory 72; the second controller 71 is configured to receive a second controller configuration signal output by the control processing module according to the interval identifier, determine an interface type for transmitting the control signal between the probe of the oscilloscope and the oscilloscope according to the second controller configuration signal, and acquire controller configuration information corresponding to the interface type according to the interface type. The second memory 72 is used to store a plurality of controller configuration information.
In this embodiment, the interface type includes an IIC interface and an SPI interface, and the corresponding controller configuration information includes IIC controller configuration information and SPI controller configuration information.
The second controller 71 configures itself as a controller having an IIC controller function/a controller having an SPI controller function through IIC controller configuration information/SPI controller configuration information. In the present embodiment, the second controller 71 is a programmable logic device (FPGA) capable of configuring its own controller mode by different configuration information. For example, the FPGA may be configured in IIC controller mode, or the FPGA may be configured in SPI controller mode.
When the interface type is an IIC interface, the third controller in the active probe is also an IIC controller, wherein the ICC controller in the active probe is a slave IIC controller, and the second controller in the oscilloscope is a master IIC controller; when the interface type is an SPI interface, the third controller in the active probe is also an SPI controller, wherein the SPI controller in the active probe is a slave SPI controller, and the second controller in the oscilloscope is a master SPI controller.
The control processing module 40 is, in this embodiment, a main processor in the oscilloscope, which is often implemented by a central processing unit CPU,
based on the foregoing embodiment, an oscilloscope capable of automatically identifying a probe is provided, and this embodiment further provides a probe identification method for an oscilloscope, please refer to fig. 6, where the probe identification method includes the following steps:
200, acquiring a partial pressure signal output by a probe of the oscilloscope by a partial pressure signal sampling module, and outputting the partial pressure signal to the partial pressure signal sampling module; the size of the voltage division signal is related to the resistance value of a voltage division resistor built in a probe of the oscilloscope.
In this embodiment, the workflow of the first controller module in step 300 is as follows:
At step 304, an interrupt signal is generated.
In one embodiment, the workflow of the control processing module in step 400 is as follows:
in step 401, the interrupt processing unit monitors an interrupt signal sent by the first controller module.
At step 403, the value of the interrupt register in the first controller module is read.
And 405, determining the attenuation proportion of the currently accessed probe according to the value of the interrupt register, and configuring the attenuation multiple of the measured signal in the oscilloscope channel according to the attenuation proportion.
And 406, displaying the attenuation proportion of the currently accessed probe in a display interface of the oscilloscope, and returning to the step 401.
And step 409, reading the information in the third memory through the IIC interface/SPI interface, configuring the probe and executing the step 405.
And step 410, outputting an error signal to prompt a user that the probe is short-circuited, and returning to the step 401.
The present invention has been described in terms of specific examples, which are provided to aid understanding of the invention and are not intended to be limiting. For a person skilled in the art to which the invention pertains, several simple deductions, modifications or substitutions may be made according to the idea of the invention.
Claims (7)
1. An oscilloscope, comprising:
the signal acquisition processing module is used for receiving signals transmitted by a probe accessed to the oscilloscope, and acquiring and processing the received signals to obtain first signal data;
the voltage division signal sampling module is used for acquiring a voltage division signal output by a probe of the oscilloscope and outputting the voltage division signal to the first controller module; the magnitude of the voltage division signal is related to the resistance value of a voltage division resistor built in a probe of the oscilloscope;
the first controller module is used for receiving the partial pressure signal, determining an interval identifier corresponding to the magnitude of the partial pressure signal, judging whether the interval identifier changes or not, and outputting an interrupt signal to the control processing module if the interval identifier changes; the interval mark is used for marking the attenuation proportion of a probe accessed by the oscilloscope;
the control processing module is used for receiving the first signal data, processing the first signal data into display image data, acquiring the interval identifier from the first controller module when an interrupt signal output by the first controller module is detected, and determining the attenuation proportion of a probe accessed to the oscilloscope according to the interval identifier;
further comprising:
the second controller module is used for receiving a second controller configuration signal output by the control processing module according to the interval identifier, determining an interface type for transmitting a control signal between a probe of the oscilloscope and the oscilloscope according to the second controller configuration signal, and acquiring controller configuration information corresponding to the interface type according to the interface type, wherein the controller configuration information corresponds to the controller modes one by one, and the controller configuration information is used for configuring the second controller module into the corresponding controller mode;
the second controller module includes:
the second controller is used for receiving a second controller configuration signal output by the control processing module according to the interval identifier, determining an interface type for transmitting a control signal between a probe of the oscilloscope and the oscilloscope according to the second controller configuration signal, and acquiring controller configuration information corresponding to the interface type according to the interface type;
a second memory for storing a plurality of said controller configuration information.
2. The oscilloscope of claim 1, wherein the first controller module comprises:
the first controller is used for receiving the partial pressure signals, acquiring the magnitudes of a plurality of preset threshold partial pressure signals, and determining a partial pressure signal interval corresponding to the partial pressure signals according to the relationship between the magnitudes of the partial pressure signals and the magnitudes of the plurality of preset threshold partial pressure signals; when detecting that the partial pressure signal interval corresponding to the partial pressure signal changes, determining an interval identifier corresponding to the changed partial pressure signal interval, generating an interrupt signal and sending the interrupt signal to the control processing module; the interval marks correspond to the voltage division signal intervals one by one;
the first memory is used for storing a plurality of preset threshold voltage division signals.
3. The oscilloscope of claim 2, wherein the first controller comprises: an interrupt register;
the first controller is further configured to set a value of the interrupt register to an interval identifier corresponding to the changed divided voltage signal interval when the divided voltage signal interval corresponding to the divided voltage signal changes.
4. The oscilloscope of claim 1, wherein the control processing module is further configured to determine an attenuation ratio of a probe connected to the oscilloscope according to the interval identifier when the interval identifier obtained from the first controller module belongs to a first preset interval identifier set, configure the voltage division signal sampling module using the attenuation ratio, and display the attenuation ratio on a display interface of the oscilloscope;
the control processing module is further used for outputting a second controller configuration signal to the second controller module when the interval identifier acquired from the first controller module belongs to a second preset interval identifier set, determining the attenuation proportion of a probe accessed to the oscilloscope according to the interval identifier after the second controller module completes configuration, configuring the voltage division signal sampling module by using the attenuation proportion, and displaying the attenuation proportion on a display interface of the oscilloscope;
the control processing module is further configured to output an error signal when the interval identifier acquired from the first controller module belongs to a third preset interval identifier set.
5. The oscilloscope of claim 1, wherein the first controller module is further to:
and when the control processing module is detected to acquire the interval identifier from the first controller module, stopping outputting the interrupt signal.
6. A probe identification method of an oscilloscope is applied to the oscilloscope, and is characterized by comprising the following steps:
receiving a signal transmitted by a probe of an oscilloscope, and acquiring and processing the received signal to obtain first signal data;
acquiring a voltage division signal output by a probe of the oscilloscope; the magnitude of the voltage division signal is related to the resistance value of a voltage division resistor built in a probe of the oscilloscope;
determining an interval identifier corresponding to the magnitude of the partial pressure signal, judging whether the interval identifier changes, and if so, outputting an interrupt signal; the interval mark is used for marking the probe type and the attenuation proportion of a probe accessed by the oscilloscope;
processing the first signal data into display image data, acquiring the interval identification when an interrupt signal is detected, configuring the attenuation multiple when the signal is acquired according to the attenuation proportion corresponding to the interval identification, and determining the attenuation proportion of a probe accessed to the oscilloscope according to the interval identification;
generating a second controller configuration signal according to the type of the probe and outputting the second controller configuration signal;
receiving the second controller configuration signal, determining an interface type for transmitting a control signal between a probe of the oscilloscope and the oscilloscope according to the second controller configuration signal, and acquiring controller configuration information corresponding to the interface type from a second memory according to the interface type; the controller configuration information corresponds to the controller modes one by one, and the controller configuration information is used for configuring a second controller for realizing control signal transmission between the oscilloscope and the probe of the oscilloscope into the corresponding controller mode.
7. The method for identifying the probe of the oscilloscope according to claim 6, wherein said determining the interval identifier corresponding to the magnitude of the divided voltage signal, determining whether the interval identifier changes, and if so, outputting an interrupt signal comprises:
receiving the partial pressure signal, acquiring the magnitude of a plurality of preset threshold partial pressure signals from a first memory, and determining a partial pressure signal interval corresponding to the partial pressure signal according to the relationship between the magnitude of the partial pressure signal and the magnitude of the plurality of preset threshold partial pressure signals; when detecting that the partial pressure signal interval corresponding to the partial pressure signal changes, determining an interval identifier corresponding to the changed partial pressure signal interval, generating an interrupt signal and outputting the interrupt signal; the interval identification corresponds to the voltage division signal interval one by one.
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| CN115469125A (en) * | 2022-10-13 | 2022-12-13 | 普源精电科技股份有限公司 | Oscilloscope probe, probe detection method, device, oscilloscope, system and medium |
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