CN112578197B - Automatic testing system and method for secondary circuit of transformer substation - Google Patents
Automatic testing system and method for secondary circuit of transformer substation Download PDFInfo
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- CN112578197B CN112578197B CN202011242044.7A CN202011242044A CN112578197B CN 112578197 B CN112578197 B CN 112578197B CN 202011242044 A CN202011242044 A CN 202011242044A CN 112578197 B CN112578197 B CN 112578197B
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- 238000004891 communication Methods 0.000 claims description 4
- 238000010998 test method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 abstract description 7
- 230000007547 defect Effects 0.000 abstract description 4
- 238000011835 investigation Methods 0.000 abstract description 3
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/55—Testing for incorrect line connections
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
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Abstract
The invention discloses an automatic testing system for a secondary circuit of a transformer substation, which comprises a main control device and a distributed tester. The invention also discloses an automatic testing method for the secondary circuit of the transformer substation, which realizes the automatic testing of the secondary circuit of the transformer substation, ensures that the testing process of the secondary circuit of the transformer substation is controllable and considerable, solves the problems of inconsistent diagram, difficult testing and defect investigation and the like of the wiring of the secondary circuit of the transformer substation, and improves the testing efficiency and accuracy of the secondary circuit of the transformer substation.
Description
Technical Field
The invention relates to the technical field of intelligent substation testing, in particular to an automatic testing system for a secondary circuit of a substation, and also relates to an automatic testing method for the secondary circuit of the substation.
Technical Field
The safety and reliability of the secondary circuit in the transformer substation are significant for the normal operation of the transformer substation. The existing secondary circuit test of the transformer substation is mostly realized by two persons through a universal meter, the circuit is difficult to check when the circuit is problematic, the test efficiency is low, and the automation degree and the visualization degree of the test process are not high. Therefore, in order to improve the testing efficiency and the automation degree of the secondary circuit of the transformer substation, the automatic testing system and the method for the secondary circuit of the transformer substation are researched, and the method has important significance for safe and reliable operation of the transformer substation.
Disclosure of Invention
The invention aims at overcoming the defects in the prior art, and provides an automatic testing system and an automatic testing method for a secondary circuit of a transformer substation. The method and the device realize automatic testing of the secondary circuit of the transformer substation, enable the testing process of the secondary circuit of the transformer substation to be controllable and considerable, solve the problems of inconsistent diagram, difficult testing and defect investigation and the like of wiring of the secondary circuit of the transformer substation, and improve the testing efficiency and accuracy of the secondary circuit of the transformer substation.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
the automatic testing system for the secondary circuit of the transformer substation comprises a main control device, a test signal connector and a terminal strip, wherein the main control device is used for analyzing a CAD drawing to generate a secondary circuit model of the transformer substation, generating a total station circuit connection network topological graph according to the generated secondary circuit model of the transformer substation, and the secondary circuit model of the transformer substation comprises the screen cabinet numbers of all the screen cabinets, the terminal numbers of the terminal strip, the terminal numbers of the screen cabinets at two ends corresponding to the secondary circuit, the type of the secondary circuit and the corresponding relation between the test signal connector numbers and the terminal numbers of the terminal strip;
the system is also used for designating a central screen cabinet, finding out a non-central screen cabinet connected with the central screen cabinet through a secondary circuit to form a local test network, finding out terminal numbers of all connecting terminal rows of the central screen cabinet and the non-central screen cabinet according to a transformer substation secondary circuit model and the selected local test network, and issuing corresponding relations among the screen cabinet numbers of the screen cabinets, the terminal numbers of the terminal rows, the terminal numbers of the screen cabinets at two ends corresponding to the secondary circuit, the secondary circuit type, the test signal connector numbers and the terminal numbers of the terminal rows to a distributed tester at the central screen cabinet side and a distributed tester at the non-central screen cabinet side to be tested through a wireless network;
the switching device is also used for sending a switching command to the distributed tester at the side of the central screen cabinet;
the switching device is also used for sending a switching command to the distributed tester at the side of the non-central screen cabinet;
the system is also used for sending test commands to the distributed testers at the side of the central screen cabinet and the side of the non-central screen cabinet;
and the system is also used for displaying the secondary loop state information fed back by the distributed tester at the side of the non-central screen cabinet.
The automatic testing system for the secondary circuit of the transformer substation further comprises a distributed tester, wherein the distributed tester comprises a distributed tester at the side of a central screen cabinet,
the distributed tester at the side of the central screen cabinet is used for controlling the fixed end of the switching unit to be connected with the transmitting switching end according to the switching command;
and the main control device is also used for receiving a test command of the main control device, and transmitting pulse signals to the outside through the switching unit, the corresponding test signal connector and the terminals of the terminal bars of the corresponding central screen cabinet in sequence, wherein the pulse signals are transmitted to the corresponding terminals of the terminal bars of the non-central screen cabinet at the opposite end through the corresponding secondary loop cables.
The distributed test meter described above also includes a non-center screen cabinet side distributed test meter,
the distributed tester at the side of the non-central screen cabinet is used for controlling the fixed end of the switching unit to be connected with the receiving switching end according to the switching command;
and is also used for receiving the test command of the main control device, and sequentially transmitting the received pulse signals to the receiving channels of the distributed tester at the side of the non-central screen cabinet through the connected test signal connectors and the switching units by sequentially passing through the terminals corresponding to the terminal rows of the non-central screen cabinet,
the system is also used for analyzing the pulse signals to obtain secondary circuit state information, wherein the secondary circuit state information comprises a secondary circuit, a secondary circuit state corresponding to the secondary circuit, the numbers of terminals of terminal rows of two screen cabinets associated with the secondary circuit and the sending direction of the pulse signals on the secondary circuit.
The utility model provides an automatic test system of secondary circuit of transformer substation, still include two position relay, two position relay includes a plurality of switching units, the stiff end of every switching unit of two position relay is through the terminal fixed contact of test signal connector with the terminal row respectively, wherein every test signal connector all has fixed unique number, two switching ends that the stiff end of switching unit corresponds are emission switching end and receiving switching end respectively, the emission switching end of switching unit is connected with the emission passageway of distributed tester, the receiving switching end of switching unit is connected with the receiving passageway of distributed tester.
The determination of the secondary circuit state as described above is performed by:
the type of secondary loop is the case of a switching value signal loop:
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the corresponding terminal at the central screen cabinet side, and the rising edge time of the pulse signal from the 10% pulse signal amplitude to the 90% pulse signal amplitude is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the corresponding terminal at the central screen cabinet side, and the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as a secondary circuit abnormality;
if the distributed tester at the side of the non-central screen cabinet monitors that all terminals of the non-central screen cabinet do not receive pulse signals, the secondary circuit state is represented as secondary circuit disconnection;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives the pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is the secondary circuit misconnection,
the type of secondary loop is the case of an analog signal loop:
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, and the distributed testers at the non-central screen cabinet side monitor that the rising edge time from 10% of pulse signal amplitude to 90% of pulse signal amplitude of the pulse signals is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, the distributed testers at the non-central screen cabinet side monitor that the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as secondary circuit abnormality or secondary circuit open circuit;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is indicated to be the secondary circuit misconnection.
The automatic testing method for the secondary circuit of the transformer substation comprises the following steps:
step 1: the main control device analyzes the CAD drawing to generate a transformer substation secondary circuit model;
step 2: the main control device selects a central cabinet according to the generated secondary circuit model of the transformer substation, wherein the secondary circuit model of the transformer substation comprises cabinet numbers of all the cabinets, terminal numbers of terminal rows, terminal numbers of two end cabinets corresponding to secondary circuits, secondary circuit types and the corresponding relation between test signal connector numbers and terminal numbers of the terminal rows, the central cabinet and non-central cabinets associated with the secondary circuits form a local test network,
step 3: the main control device obtains the terminal numbers of all the connecting terminal rows of the central screen cabinet and the non-central screen cabinet, and transmits the corresponding relation between the screen cabinet numbers of the screen cabinets, the terminal numbers of the terminal rows, the terminal numbers of the screen cabinets at two ends corresponding to the secondary circuit, the secondary circuit type and the test signal connector numbers and the terminal numbers of the terminal rows to the distributed testers at the side of the central screen cabinet and the distributed testers at the side of the non-central screen cabinet to be tested through a wireless network,
the terminal of the central screen cabinet is connected with the distributed tester at the side of the central screen cabinet through the corresponding test signal connector and the switching unit,
the terminals of the non-central screen cabinet are connected with the distributed tester at the side of the non-central screen cabinet through the corresponding test signal connectors and the switching units,
step 4: the main control device controls the distributed testers at the side of the central screen cabinet to emit pulse signals through the terminals of the terminal bars of the central screen cabinet, controls the distributed testers at the side of the non-central screen cabinet to receive the pulse signals through the terminals of the terminal bars of the non-central screen cabinet, analyzes the pulse signals by the corresponding distributed testers of the non-central screen cabinet to obtain secondary circuit state information, and feeds the secondary circuit state information back to the main control device through wireless communication, wherein the secondary circuit state information comprises a secondary circuit, a secondary circuit state corresponding to the secondary circuit, the numbers of the terminals of the terminal bars of the two screen cabinets related to the secondary circuit and the sending direction of the pulse signals on the secondary circuit,
step 5: selecting non-central screen cabinets which are not checked, repeating the steps 3-4 until traversing between the central screen cabinet and all non-central screen cabinets of the local test network to obtain secondary loop state information between the central screen cabinet and all non-central screen cabinets,
step 6: reselecting the central screen cabinet in the local test network, repeating the steps 3-5 until all the screen cabinets in the local test network are traversed as the central screen cabinet, after the local test network is tested,
step 7: and the main control device generates a test report according to the obtained state information of each secondary loop and displays the state information.
The secondary loop state determination logic as described above is:
the type of secondary loop is the case of a switching value signal loop:
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the corresponding terminal at the central screen cabinet side, and the rising edge time of the pulse signal from the 10% pulse signal amplitude to the 90% pulse signal amplitude is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the corresponding terminal at the central screen cabinet side, and the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as a secondary circuit abnormality;
if the distributed tester at the side of the non-central screen cabinet monitors that all terminals of the non-central screen cabinet do not receive pulse signals, the secondary circuit state is represented as secondary circuit disconnection;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives the pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is the secondary circuit misconnection,
the type of secondary loop is the case of an analog signal loop:
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, and the distributed testers at the non-central screen cabinet side monitor that the rising edge time from 10% of pulse signal amplitude to 90% of pulse signal amplitude of the pulse signals is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, the distributed testers at the non-central screen cabinet side monitor that the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as secondary circuit abnormality or secondary circuit open circuit;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is indicated to be the secondary circuit misconnection.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention realizes the automatic test of the secondary circuit of the transformer substation,
2. the invention ensures that the testing process of the secondary circuit of the transformer substation is controllable and considerable, solves the problems of inconsistent graph, difficult testing and defect investigation and the like of the secondary circuit wiring of the transformer substation,
3. the invention improves the testing efficiency and accuracy of the secondary circuit of the transformer substation.
Drawings
FIG. 1 is a schematic diagram of the system components of the present invention;
FIG. 2 is a schematic diagram of the wiring of a dual position relay;
fig. 3 is a schematic diagram of a transmitted pulse signal and a received pulse signal.
In the figure: 1-terminal blocks; a 2-terminal; 3-a test signal connector; 4-double position relay; a 5-switching unit; 501-a fixed end; 502-transmitting switching end; 503-receiving a switching end; 6-receiving channels; 7-transmit channels.
Detailed Description
The present invention will be further described in detail below in conjunction with the following examples, for the purpose of facilitating understanding and practicing the present invention by those of ordinary skill in the art, it being understood that the examples described herein are for the purpose of illustration and explanation only and are not intended to limit the invention.
As shown in fig. 1, an automatic testing system for a secondary circuit of a transformer substation includes:
the main control device further comprises a test signal connector and a plurality of distributed testers, and wireless communication is adopted between the main control device and the distributed testers, so that control and data interaction are realized.
1. Main control device
The main control device is used for analyzing the CAD drawing to generate a substation secondary circuit model, generating a total station loop connection network topology diagram according to the generated substation secondary circuit model, wherein the substation secondary circuit model comprises the screen cabinet numbers of all the screen cabinets, the terminal numbers of the terminal rows, the terminal numbers of the screen cabinets at the two ends corresponding to the secondary circuit, the type of the secondary circuit, and the corresponding relation between the test signal connector numbers and the terminal numbers of the terminal rows;
the system is also used for designating a central screen cabinet, finding out a non-central screen cabinet connected with the central screen cabinet through a secondary circuit to form a local test network, finding out terminal numbers of all connecting terminal rows of the central screen cabinet and the non-central screen cabinet according to a transformer substation secondary circuit model and the selected local test network, and issuing corresponding relations among the screen cabinet numbers of the screen cabinets, the terminal numbers of the terminal rows, the terminal numbers of the screen cabinets at two ends corresponding to the secondary circuit, the secondary circuit type, the test signal connector numbers and the terminal numbers of the terminal rows to a distributed tester at the central screen cabinet side and a distributed tester at the non-central screen cabinet side to be tested through a wireless network;
the switching device is also used for sending a switching command to the distributed tester at the side of the central screen cabinet;
the switching device is also used for sending a switching command to the distributed tester at the side of the non-central screen cabinet;
the system is also used for sending test commands to the distributed testers at the side of the central screen cabinet and the side of the non-central screen cabinet;
and the system is also used for displaying the secondary loop state information fed back by the distributed tester at the side of the non-central screen cabinet.
2. Distributed tester
The distributed testers include distributed testers on the side of the central screen cabinet and distributed testers on the side of the non-central screen cabinet.
Distributed tester on side of central screen cabinet
The distributed tester at the side of the central screen cabinet is used for sequentially controlling the fixed end of the switching unit to be connected with the transmitting switching end according to the switching command and the terminal sequence of the terminal row of the central screen cabinet;
and the main control device is also used for receiving a test command of the main control device, and transmitting pulse signals to the outside through the switching unit, the corresponding test signal connector and the terminals of the terminal bars of the corresponding central screen cabinet in sequence, wherein the pulse signals are transmitted to the corresponding terminals of the terminal bars of the non-central screen cabinet at the opposite end through the corresponding secondary loop cables.
Distributed tester on non-central screen cabinet side
The distributed tester at the side of the non-central screen cabinet is used for sequentially controlling the fixed end of the switching unit to be connected with the receiving switching end according to the switching command and the terminal sequence of the terminal strip of the non-central screen cabinet;
and the device is also used for receiving a test command of the main control device, and sequentially transmitting the received pulse signals to a receiving channel of the distributed tester at the side of the non-central screen cabinet through the connected test signal connector and the switching unit sequentially through terminals corresponding to the terminal rows of the non-central screen cabinet.
The system is also used for analyzing the pulse signals to obtain secondary circuit state information, wherein the secondary circuit state information comprises a secondary circuit, a secondary circuit state corresponding to the secondary circuit, the numbers of terminals of terminal rows of two screen cabinets associated with the secondary circuit and the sending direction of the pulse signals on the secondary circuit.
The determination of the secondary circuit state corresponding to the secondary circuit is performed by:
the type of secondary loop is the case of a switching value signal loop:
if the distributed testers at the non-central screen cabinet side monitor that the terminals at the non-central screen cabinet side receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, and the distributed testers at the non-central screen cabinet side monitor that the rising edge time from the 10% pulse signal amplitude to the 90% pulse signal amplitude of the pulse signals is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed testers at the non-central screen cabinet side monitor that the terminals at the non-central screen cabinet side receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, the distributed testers at the non-central screen cabinet side monitor that the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as the secondary circuit abnormality;
if the distributed tester at the non-central screen cabinet side monitors that all terminals at the non-central screen cabinet side do not receive pulse signals, the secondary circuit state is represented as secondary circuit disconnection;
if the distributed tester at the non-central screen cabinet side monitors that the terminal at the non-central screen cabinet side receives a pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is indicated to be the secondary circuit misconnection.
For a secondary circuit of an analog signal circuit, when the secondary circuit to be detected between the terminals of the screen cabinet is not broken, the secondary circuit can be equivalently connected with a pure resistor and an inductor in parallel, and the rising edge time of the pulse signal amplitude from 10% to 90% received by the signal receiving end is less than 5ns. When the connection line between the screen cabinets is broken, signals can pass through the alternating current transformer connected with the stars and the non-to-be-detected loop, the loop can be equivalent to an inductance series resistor, and the rising edge time of the pulse signals received by the signal receiving end is longer than 5ns.
The type of secondary loop is the case of an analog signal loop:
if the distributed testers at the non-central screen cabinet side monitor that the terminals at the non-central screen cabinet side receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, and the distributed testers at the non-central screen cabinet side monitor that the rising edge time from the 10% pulse signal amplitude to the 90% pulse signal amplitude of the pulse signals is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed testers at the non-central screen cabinet side monitor that the terminals at the non-central screen cabinet side receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, the distributed testers at the non-central screen cabinet side monitor that the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as secondary circuit abnormality or open circuit;
if the distributed tester at the non-central screen cabinet side monitors that the terminal at the non-central screen cabinet side receives a pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is indicated to be the secondary circuit misconnection.
4. Dual position relay
The dual-position relay comprises a plurality of switching units, and the fixed end of each switching unit of the dual-position relay is fixedly contacted with the terminal of the terminal strip through a test signal connector respectively, wherein each test signal connector is provided with a fixed unique number. The two switching ends corresponding to the fixed end of the switching unit are respectively a transmitting switching end and a receiving switching end. The transmitting and switching end of the switching unit is connected with the transmitting channel of the distributed tester. The receiving switching end of the switching unit is connected with the receiving channel of the distributed tester. The distributed tester realizes the switching of the transmission and the reception of the pulse signals through the switching unit. The switching unit is controlled to switch states by the distributed tester.
The automatic testing method for the secondary circuit of the transformer substation comprises the following steps:
step 1: the main control device analyzes the CAD drawing to generate a transformer substation secondary circuit model;
step 2: the main control device generates a total station loop connection network topology diagram according to the generated secondary loop model of the transformer substation, wherein the secondary loop model of the transformer substation comprises a cabinet number of each cabinet, a terminal number of a terminal strip, terminal numbers of two end cabinets corresponding to the secondary loop, a secondary loop type, and a corresponding relation between a test signal connector number and a terminal number of the terminal strip. And the tester selects any one of the screen cabinets as a central screen cabinet in the total station loop connection network topological graph. The main control device searches out the non-central screen cabinet which has a connection relation with the central screen cabinet through the connection relation in the secondary circuit model of the transformer substation, thereby forming a local test network taking the central screen cabinet as a test center.
Step 3: the main control device finds terminal numbers of all the connecting terminal rows of the central screen cabinet and the non-central screen cabinet according to the transformer substation secondary circuit model and the selected local test network, and transmits the corresponding relation between the screen cabinet numbers of the screen cabinets of each screen cabinet, the terminal numbers of the terminal rows, the terminal numbers of the screen cabinets at two ends corresponding to the secondary circuit, the secondary circuit type, the test signal connector numbers and the terminal numbers of the terminal rows to the distributed testers at the side of the central screen cabinet and the distributed testers at the side of the non-central screen cabinet to be tested through the wireless network.
The distributed tester displays the corresponding relation between the serial numbers of the screen cabinet and the terminal of the terminal strip and the serial numbers of the test signal connector and the terminal of the terminal strip on the man-machine interface module.
And the testers find out the corresponding central screen cabinet and the non-central screen cabinet according to the screen cabinet numbers.
According to the corresponding relation between the test signal connector number and the terminal number of the terminal row of the central screen cabinet, the tester connects the terminal of the terminal row of the central screen cabinet with the fixed end of the corresponding switching unit in the two-position relay of the central screen cabinet side through the corresponding test signal connector, and the transmitting switching end and the receiving switching end of the switching unit in the two-position relay of the central screen cabinet side are respectively connected with the transmitting channel and the receiving channel corresponding to the cloth tester of the central screen cabinet side.
According to the corresponding relation between the test signal connector numbers and the terminal numbers of the terminal rows of the non-central screen cabinet, the tester connects the terminals of the terminal rows of the non-central screen cabinet with the fixed ends of the corresponding switching units in the two-position relay on the non-central screen cabinet side through the corresponding test signal connectors, and the transmitting switching ends and the receiving switching ends of the switching units in the two-position relay on the non-central screen cabinet side are respectively connected with the transmitting channels and the receiving channels corresponding to the cloth type tester on the non-central screen cabinet side.
At least two distributed testers are needed for testing, and the master control device can send the screen cabinet numbers of the central screen cabinet and one non-central screen cabinet, the terminal numbers of the terminal rows and the corresponding relation between the test signal connector numbers of the distributed testers and the terminal numbers of the terminal rows to the two distributed testers through a wireless network. If a plurality of distributed testers exist, the distributed testers can be issued at the same time and tested together.
Step 4: the tester clicks a start test button on the man-machine interface module of the master control device. The main control device controls the distributed testers at the side of the central screen cabinet to emit pulse signals through the terminals of the terminal rows of the central screen cabinet according to the secondary circuit model of the transformer substation and the selected central screen cabinet and the non-central screen cabinet, and controls the distributed testers at the side of the non-central screen cabinet to receive the pulse signals through the terminals of the terminal rows of the non-central screen cabinet.
Experimental process control as described above includes:
step 4.1, the main control device sends a switching command to the distributed testers at the side of the central screen cabinet in a wireless mode according to the secondary circuit model of the transformer substation and the selected testing range, and controls the distributed testers at the side of the central screen cabinet to sequentially control the fixed end of the switching unit to be connected with the transmitting switching end according to the terminal sequence of the terminal strip of the central screen cabinet;
step 4.2, the main control device sends a switching command to the distributed testers at the non-central screen cabinet side through a wireless line according to the secondary circuit model of the transformer substation and the selected testing range, and controls the distributed testers at the non-central screen cabinet side to sequentially control the fixed end of the switching unit to be connected with the receiving switching end according to the terminal sequence of the terminal strip of the non-central screen cabinet;
step 4.3, the main control device sends a test command to the distributed testers corresponding to the central screen cabinet and the non-central screen cabinet in a wireless mode,
the distributed tester at the side of the testing command control center screen cabinet sequentially sends pulse signals to the outside through the switching unit, the testing signal connector and the terminal of the terminal row of the center screen cabinet corresponding to the switching unit, and the pulse signals are transmitted to the terminal of the terminal row of the non-center screen cabinet corresponding to the terminal of the opposite end through the secondary loop cable corresponding to the terminal of the terminal row of the center screen cabinet.
The terminal corresponding to the terminal row of the non-central screen cabinet transmits the received pulse signals to the receiving channels of the corresponding distributed testers of the non-central screen cabinet sequentially through the connected test signal connectors and the switching units.
The corresponding distributed testers of the non-central screen cabinet receive and analyze the pulse signals to obtain secondary loop state information, and the secondary loop state information is fed back to the main control device through wireless communication. The secondary circuit state information comprises a secondary circuit, a secondary circuit state corresponding to the secondary circuit, numbers of terminals of terminal rows of two screen cabinets related to the secondary circuit, and a pulse signal transmitting direction on the secondary circuit.
The pulse signal is a pulse test signal with the amplitude of 5V and the width of 20us, the distributed tester is fixed on the terminal block through the test signal connector and is connected with the secondary circuit cable to be tested, and the distributed tester at the two ends of the secondary circuit cable to be tested is reliably grounded and forms a signal loop through a detection circuit.
Step 5: and selecting non-central cabinets which are not checked, and repeating the steps 3-4 until traversing between the central cabinets and all non-central cabinets of the local test network to obtain secondary loop state information between the central cabinets and all non-central cabinets.
Step 6: and reselecting the central screen cabinet in the local test network, and repeating the steps 3-5 until all the screen cabinets in the local test network are traversed to serve as the central screen cabinet, and testing the local test network.
Step 7: and the main control device generates a test report according to the obtained state information of each secondary loop, and displays the state information of the secondary loop on a man-machine interface module of the main control device. Guiding the staff to eliminate the abnormality.
The secondary loop state determination logic as described above is:
for a secondary loop of the type switching signal loop, this can be equivalent to a pure resistor:
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, and the distributed testers at the non-central screen cabinet side monitor that the rising edge time of the pulse signals from 10% amplitude to 90% amplitude is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, the distributed testers at the non-central screen cabinet side monitor that the rising edge time from 10% amplitude to 90% amplitude of the pulse signals is more than or equal to 5ns, the secondary circuit state is represented as secondary circuit abnormality;
if the distributed tester at the side of the non-central screen cabinet monitors that all terminals of the non-central screen cabinet do not receive pulse signals, the secondary circuit state is represented as secondary circuit disconnection;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is indicated to be the secondary circuit misconnection.
For a secondary circuit of an analog signal circuit, when the secondary circuit to be detected between the terminals of the screen cabinet is not broken, the secondary circuit can be equivalently connected with a pure resistor and an inductor in parallel, and the rising edge time of the pulse signal amplitude from 10% to 90% received by the signal receiving end is less than 5ns. When the connection line between the screen cabinets is broken, signals can pass through the alternating current transformer connected with the stars and the non-to-be-detected loop, the loop can be equivalent to an inductance series resistor, and the rising edge time of the pulse signals received by the signal receiving end is longer than 5ns.
The decision logic for the secondary loop state of the type analog signal loop is:
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, and the distributed testers at the non-central screen cabinet side monitor that the rising edge time of the pulse signals from 10% amplitude to 90% amplitude is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, the distributed testers at the non-central screen cabinet side monitor that the rising edge time from 10% amplitude to 90% amplitude of the pulse signals is more than or equal to 5ns, the secondary circuit state is represented as secondary circuit abnormality or open circuit;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is indicated to be the secondary circuit misconnection.
The specific embodiments described herein are offered by way of example only. Various modifications or additions or substitutions to the described embodiments may be made by those skilled in the art without departing from the spirit of the invention or exceeding the scope of the invention as defined in the accompanying claims.
Claims (5)
1. The automatic testing system for the secondary circuit of the transformer substation comprises a main control device and is characterized in that the main control device is used for analyzing a CAD drawing to generate a secondary circuit model of the transformer substation, generating a total station circuit connection network topological graph according to the generated secondary circuit model of the transformer substation, wherein the secondary circuit model of the transformer substation comprises a cabinet number of each cabinet, a terminal number of a terminal row, terminal numbers of two end cabinets corresponding to the secondary circuit, a secondary circuit type, and a corresponding relation between a test signal connector number and a terminal number of the terminal row;
the system is also used for designating a central screen cabinet, finding out a non-central screen cabinet connected with the central screen cabinet through a secondary circuit to form a local test network, finding out terminal numbers of all connecting terminal rows of the central screen cabinet and the non-central screen cabinet according to a transformer substation secondary circuit model and the selected local test network, and issuing corresponding relations among the screen cabinet numbers of the screen cabinets, the terminal numbers of the terminal rows, the terminal numbers of the screen cabinets at two ends corresponding to the secondary circuit, the secondary circuit type, the test signal connector numbers and the terminal numbers of the terminal rows to a distributed tester at the central screen cabinet side and a distributed tester at the non-central screen cabinet side to be tested through a wireless network;
the switching device is also used for sending a switching command to the distributed tester at the side of the central screen cabinet;
the switching device is also used for sending a switching command to the distributed tester at the side of the non-central screen cabinet;
the system is also used for sending test commands to the distributed testers at the side of the central screen cabinet and the side of the non-central screen cabinet;
the system is also used for displaying the secondary loop state information fed back by the distributed tester at the side of the non-central screen cabinet,
the system also comprises a distributed tester, wherein the distributed tester comprises a distributed tester at the side of the central screen cabinet,
the distributed tester at the side of the central screen cabinet is used for controlling the fixed end of the switching unit to be connected with the transmitting switching end according to the switching command;
and is also used for receiving the test command of the main control device, sending pulse signals to the outside sequentially through the switching unit, the corresponding test signal connector and the terminals of the terminal bars of the corresponding central screen cabinet, transmitting the pulse signals to the corresponding terminals of the terminal bars of the non-central screen cabinet at the opposite end through the corresponding secondary loop cable,
the distributed tester also comprises a distributed tester at the side of the non-central screen cabinet,
the distributed tester at the side of the non-central screen cabinet is used for controlling the fixed end of the switching unit to be connected with the receiving switching end according to the switching command;
and is also used for receiving the test command of the main control device, and sequentially transmitting the received pulse signals to the receiving channels of the distributed tester at the side of the non-central screen cabinet through the connected test signal connectors and the switching units by sequentially passing through the terminals corresponding to the terminal rows of the non-central screen cabinet,
the system is also used for analyzing the pulse signals to obtain secondary circuit state information, wherein the secondary circuit state information comprises a secondary circuit, a secondary circuit state corresponding to the secondary circuit, the numbers of terminals of terminal rows of two screen cabinets associated with the secondary circuit and the sending direction of the pulse signals on the secondary circuit.
2. The automatic testing system of the secondary circuit of the transformer substation according to claim 1, further comprising a dual-position relay, wherein the dual-position relay comprises a plurality of switching units, a fixed end of each switching unit of the dual-position relay is fixedly contacted with a terminal of the terminal strip through a testing signal connector, each testing signal connector is provided with a fixed unique number, two switching ends corresponding to the fixed end of the switching unit are respectively a transmitting switching end and a receiving switching end, the transmitting switching end of the switching unit is connected with a transmitting channel of the distributed tester, and the receiving switching end of the switching unit is connected with a receiving channel of the distributed tester.
3. The automatic testing system for secondary circuit of transformer substation according to claim 2, wherein the determination of the secondary circuit state is performed by:
the type of secondary loop is the case of a switching value signal loop:
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the corresponding terminal at the central screen cabinet side, and the rising edge time of the pulse signal from the 10% pulse signal amplitude to the 90% pulse signal amplitude is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the corresponding terminal at the central screen cabinet side, and the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as a secondary circuit abnormality;
if the distributed tester at the side of the non-central screen cabinet monitors that all terminals of the non-central screen cabinet do not receive pulse signals, the secondary circuit state is represented as secondary circuit disconnection;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives the pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is the secondary circuit misconnection,
the type of secondary loop is the case of an analog signal loop:
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, and the distributed testers at the non-central screen cabinet side monitor that the rising edge time from 10% of pulse signal amplitude to 90% of pulse signal amplitude of the pulse signals is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, the distributed testers at the non-central screen cabinet side monitor that the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as the secondary circuit abnormality;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is indicated to be the secondary circuit misconnection.
4. The automatic testing method for the secondary circuit of the transformer substation is characterized by comprising the following steps of:
step 1: the main control device analyzes the CAD drawing to generate a transformer substation secondary circuit model;
step 2: the main control device selects a central cabinet according to the generated secondary circuit model of the transformer substation, wherein the secondary circuit model of the transformer substation comprises cabinet numbers of all the cabinets, terminal numbers of terminal rows, terminal numbers of two end cabinets corresponding to secondary circuits, secondary circuit types and the corresponding relation between test signal connector numbers and terminal numbers of the terminal rows, the central cabinet and non-central cabinets associated with the secondary circuits form a local test network,
step 3: the main control device obtains the terminal numbers of all the connecting terminal rows of the central screen cabinet and the non-central screen cabinet, and transmits the corresponding relation between the screen cabinet numbers of the screen cabinets, the terminal numbers of the terminal rows, the terminal numbers of the screen cabinets at two ends corresponding to the secondary circuit, the secondary circuit type and the test signal connector numbers and the terminal numbers of the terminal rows to the distributed testers at the side of the central screen cabinet and the distributed testers at the side of the non-central screen cabinet to be tested through a wireless network,
the terminal of the central screen cabinet is connected with the distributed tester at the side of the central screen cabinet through the corresponding test signal connector and the switching unit,
the terminals of the non-central screen cabinet are connected with the distributed tester at the side of the non-central screen cabinet through the corresponding test signal connectors and the switching units,
step 4: the main control device controls the distributed testers at the side of the central screen cabinet to emit pulse signals through the terminals of the terminal bars of the central screen cabinet, controls the distributed testers at the side of the non-central screen cabinet to receive the pulse signals through the terminals of the terminal bars of the non-central screen cabinet, analyzes the pulse signals by the corresponding distributed testers of the non-central screen cabinet to obtain secondary circuit state information, and feeds the secondary circuit state information back to the main control device through wireless communication, wherein the secondary circuit state information comprises a secondary circuit, a secondary circuit state corresponding to the secondary circuit, the numbers of the terminals of the terminal bars of the two screen cabinets related to the secondary circuit and the sending direction of the pulse signals on the secondary circuit,
step 5: selecting non-central screen cabinets which are not checked, repeating the steps 3-4 until traversing between the central screen cabinet and all non-central screen cabinets of the local test network to obtain secondary loop state information between the central screen cabinet and all non-central screen cabinets,
step 6: reselecting the central screen cabinet in the local test network, repeating the steps 3-5 until all the screen cabinets in the local test network are traversed as the central screen cabinet, after the local test network is tested,
step 7: and the main control device generates a test report according to the obtained state information of each secondary loop and displays the state information.
5. The automatic test method of secondary circuit of transformer substation according to claim 4, wherein the secondary circuit state determining logic is as follows:
the type of secondary loop is the case of a switching value signal loop:
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the corresponding terminal at the central screen cabinet side, and the rising edge time of the pulse signal from the 10% pulse signal amplitude to the 90% pulse signal amplitude is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the corresponding terminal at the central screen cabinet side, and the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as a secondary circuit abnormality;
if the distributed tester at the side of the non-central screen cabinet monitors that all terminals of the non-central screen cabinet do not receive pulse signals, the secondary circuit state is represented as secondary circuit disconnection;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives the pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is the secondary circuit misconnection,
the type of secondary loop is the case of an analog signal loop:
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, and the distributed testers at the non-central screen cabinet side monitor that the rising edge time from 10% of pulse signal amplitude to 90% of pulse signal amplitude of the pulse signals is less than 5ns, the secondary circuit state is represented as the secondary circuit normal;
if the distributed testers at the non-central screen cabinet side monitor that the terminals of the non-central screen cabinet receive the pulse signals sent by the corresponding terminals at the central screen cabinet side, the distributed testers at the non-central screen cabinet side monitor that the rising edge time from the pulse signal amplitude of 10% to the pulse signal amplitude of 90% is more than or equal to 5ns, the secondary circuit state is represented as the secondary circuit abnormality;
if the distributed tester at the non-central screen cabinet side monitors that the terminal of the non-central screen cabinet receives a pulse signal sent by the terminal at the non-corresponding central screen cabinet side, the secondary circuit state is indicated to be the secondary circuit misconnection.
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| CN113533885A (en) * | 2021-07-13 | 2021-10-22 | 国网河北省电力有限公司电力科学研究院 | Transformer substation secondary circuit model inspection method and device and terminal equipment |
| CN115902705B (en) * | 2022-11-30 | 2024-04-09 | 国网山东省电力公司电力科学研究院 | Intelligent acquisition device, automatic detection system and method for secondary circuit of transformer substation |
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