CN112506781A - Test monitoring method, test monitoring device, electronic device, storage medium, and program product - Google Patents

Test monitoring method, test monitoring device, electronic device, storage medium, and program product Download PDF

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CN112506781A
CN112506781A CN202011435649.8A CN202011435649A CN112506781A CN 112506781 A CN112506781 A CN 112506781A CN 202011435649 A CN202011435649 A CN 202011435649A CN 112506781 A CN112506781 A CN 112506781A
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parameter information
test
record
application program
target
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CN112506781B (en
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禹龙晨
李平凉
李泽锋
李清意
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Industrial and Commercial Bank of China Ltd ICBC
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Industrial and Commercial Bank of China Ltd ICBC
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management

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  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
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  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)
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Abstract

The present disclosure provides a test monitoring method, apparatus, electronic device, storage medium, and program product, which can be applied to the financial field or other fields. The method comprises the following steps: under the condition that the test behavior is monitored, obtaining a test record corresponding to the test behavior, wherein the test record comprises a first parameter set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is used for compiling an application program and is to be tested, and the test time set comprises test time corresponding to the first parameter information; acquiring a submission record after the application program is written, wherein the submission record comprises a second parameter information set and a submission time set, and the second parameter information set comprises M pieces of second parameter information; determining target second parameter information in the second parameter information set according to the submission record and the test record, wherein the target second parameter information comprises parameter information tested locally; and determining a test monitoring result aiming at the application program according to the target second parameter information.

Description

Test monitoring method, test monitoring device, electronic device, storage medium, and program product
Technical Field
The disclosed embodiments relate to the field of computer technologies, and in particular, to a test monitoring method, an apparatus, an electronic device, a storage medium, and a program product.
Background
Before the application program is on-line, the application program is usually required to be tested to ensure that the application program can normally run, the testing work is usually completed by cooperation of developers and testers, wherein the developers are required to test the written application program before submitting the written application program, so that the occurrence of low-level errors is reduced as much as possible, the robustness of the application program is enhanced, and the testing efficiency is improved.
With the continuous development of business requirements, the iteration speed of the application program is also increased. Under the above circumstances, if the business requirement is urgent and needs to be completed as soon as possible by the developer, the developer may submit the written application program directly without performing the test before submission, which may cause a large number of low-level errors in the test environment, and greatly affect the robustness and the test efficiency of the application program. In order to solve the above problems, a manual monitoring method is generally adopted in the related art.
In implementing the disclosed concept, the inventors found that there are at least the following problems in the related art: the adoption of the related technology easily causes resource waste and has poor monitoring effect.
Disclosure of Invention
In view of this, the embodiments of the present disclosure provide a test monitoring method, apparatus, electronic device, storage medium, and program product.
One aspect of the embodiments of the present disclosure provides a test monitoring method, including: under the condition that a test behavior is monitored, obtaining a test record corresponding to the test behavior, wherein the test record comprises a first parameter information set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is used for compiling an application program and is to be tested, the test time set comprises test time corresponding to the first parameter information, and N is a positive integer; acquiring a submission record after the application program is written, wherein the submission record comprises a second parameter information set and a submission time set, the second parameter information set comprises M pieces of second parameter information, the second parameter information is parameter information actually used for writing the application program, and the submission time set comprises submission time corresponding to the second parameter information, wherein M is a positive integer greater than or equal to N; determining target second parameter information in the second parameter information set according to the submission record and the test record, wherein the target second parameter information includes parameters tested locally; and determining a test monitoring result aiming at the application program according to the target second parameter information.
According to an embodiment of the present disclosure, the determining target second parameter information in the second parameter information set according to the submission record and the test record includes: determining, for each second parameter information in the second parameter information set, whether there is first parameter information in the test record that is consistent with the second parameter information; determining whether a commit time corresponding to the second parameter information is later than a test time corresponding to the first parameter information, in a case where it is determined that the first parameter information identical to the second parameter information exists in the test record; and determining the second parameter information as target second parameter information when it is determined that the submission time corresponding to the second parameter information is later than the test time corresponding to the first parameter information.
According to an embodiment of the present disclosure, the first parameter information includes a first method name and a first parameter list, where the first method name is a method name of a method used when writing an application and tested; the second parameter information comprises a second method name and a second parameter list, and the second method name is a method name for writing and completing a method actually used by the application program; after determining whether there is first parameter information in the test record that is consistent with the second parameter information for each second parameter information in the second parameter information set, the method further includes: when it is determined that the first method name matching the second method name and the first parameter list matching the second parameter list exist in the test record, it is determined that the first parameter information matching the second parameter information exists in the test record.
According to an embodiment of the present disclosure, the obtaining a test record corresponding to the test behavior when the test behavior is monitored includes: setting a target monitoring program in a local environment where an application program is located; calling the target monitoring program to monitor the test behavior; and acquiring a test record corresponding to the test behavior under the condition of monitoring the test behavior.
According to an embodiment of the present disclosure, the obtaining a test record corresponding to the test behavior when the test behavior is monitored includes: setting a target monitoring program in a distributed version control system warehouse; calling the target monitoring program from the distributed version control system warehouse to monitor the test behavior through a starting instruction; and acquiring a test record corresponding to the test behavior under the condition of monitoring the test behavior.
According to an embodiment of the present disclosure, the obtaining of the submission record after the writing of the application program is completed includes: and acquiring a submission record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
According to an embodiment of the present disclosure, the obtaining, by the instruction of the distributed version control system, the submission record after the writing of the application program is completed from the distributed version control system warehouse includes: and under the condition that the timing task instruction is triggered, acquiring a submission record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
According to an embodiment of the present disclosure, the determining a test monitoring result for the application program according to the target second parameter information includes: determining that the application program segment associated with the target second parameter information is locally tested; and determining that the application program segment associated with the non-target second parameter information is not locally tested, wherein the non-target second parameter information is second parameter information in the second parameter information set except for the target second parameter information.
Another aspect of the embodiments of the present disclosure provides a test monitoring apparatus, including: a first obtaining module, configured to obtain a test record corresponding to a test behavior when the test behavior is monitored, where the test record includes a first parameter information set and a test time set, where the first parameter information set includes N pieces of first parameter information, the first parameter information is parameter information used when an application program is written and is to be tested, the test time set includes test time corresponding to the first parameter information, and N is a positive integer; a second obtaining module, configured to obtain a commit record after the application program is written, where the commit record includes a second parameter information set and a commit time set, where the second parameter information set includes M second parameter information, the second parameter information is parameter information actually used when the application program is written, and the commit time set includes commit time corresponding to the second parameter information, where M is a positive integer greater than or equal to N; a first determining module, configured to determine, according to the submission record and the test record, target second parameter information in the second parameter information set, where the target second parameter information includes parameter information that is tested locally; and the second determining module is used for determining a test monitoring result aiming at the application program according to the target second parameter information.
Another aspect of an embodiment of the present disclosure provides an electronic device including: one or more processors; a memory for storing one or more programs, wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method as described above.
Another aspect of embodiments of the present disclosure provides a computer-readable storage medium having stored thereon executable instructions that, when executed by a processor, cause the processor to implement a method as described above.
Another aspect of the embodiments of the present disclosure provides a computer program comprising a computer program for implementing the method as described above when executed by a processor.
According to the embodiment of the disclosure, by acquiring the test record corresponding to the test behavior under the condition that the test behavior is monitored, wherein the test record comprises a first parameter information set and a test time set, the first parameter information is the parameter information used and tested when the application program is written, the test time set comprises the test time corresponding to the first parameter information, acquiring the submission record after the application program is written, the submission record comprises a second parameter information set and a submission time set, the second parameter information is the parameter information actually used when the application program is written, the submission time set comprises the submission time corresponding to the second parameter information, and determining target second parameter information in the second parameter information set according to the submission record and the test record, wherein the target second parameter information comprises parameter information tested locally, and determining a test monitoring result aiming at the application program according to the target second parameter information. Because the test record corresponding to the test behavior is obtained, the submitted record after the application program is written is obtained, the parameter information which is tested in a centralized mode in the second parameter information is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are wasted easily and the monitoring effect is poor due to the adoption of the related technology are at least partially solved, the test efficiency is improved, and the robustness of the application program is guaranteed to the greatest extent.
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The above and other objects, features and advantages of the present disclosure will become more apparent from the following description of embodiments of the present disclosure with reference to the accompanying drawings, in which:
FIG. 1 schematically illustrates an exemplary system architecture to which a test monitoring method may be applied, according to an embodiment of the present disclosure;
FIG. 2 schematically illustrates a flow chart of a test monitoring method according to an embodiment of the present disclosure;
FIG. 3 schematically illustrates a flow chart of another test monitoring method according to an embodiment of the present disclosure;
FIG. 4 schematically illustrates a flow chart of yet another test monitoring method according to an embodiment of the present disclosure;
FIG. 5 schematically illustrates a block diagram of a test monitoring device according to an embodiment of the present disclosure; and
FIG. 6 schematically shows a block diagram of an electronic device suitable for implementing a test monitoring method according to an embodiment of the present disclosure.
Detailed Description
Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. It should be understood that the description is illustrative only and is not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present disclosure.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. The terms "comprises," "comprising," and the like, as used herein, specify the presence of stated features, steps, operations, and/or components, but do not preclude the presence or addition of one or more other features, steps, operations, or components.
All terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art unless otherwise defined. It is noted that the terms used herein should be interpreted as having a meaning that is consistent with the context of this specification and should not be interpreted in an idealized or overly formal sense.
Where a convention analogous to "at least one of A, B and C, etc." is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., "a system having at least one of A, B and C" would include but not be limited to systems that have a alone, B alone, C alone, a and B together, a and C together, B and C together, and/or A, B, C together, etc.). Where a convention analogous to "A, B or at least one of C, etc." is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., "a system having at least one of A, B or C" would include but not be limited to systems that have a alone, B alone, C alone, a and B together, a and C together, B and C together, and/or A, B, C together, etc.).
The embodiment of the disclosure provides a test monitoring method, a test monitoring device and electronic equipment capable of applying the method, the test monitoring device and the electronic equipment can be applied to the financial field, and can also be applied to any field except the financial field, and the application fields of the test monitoring method, the test monitoring device and the electronic equipment are not limited. The method includes a test record acquisition process, a submitted record acquisition process, and a comparison process of the submitted record and the test record. In the test record obtaining process, under the condition that the test behavior is monitored, obtaining a test record corresponding to the test behavior, wherein the test record comprises a first parameter information set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is used for writing an application program and is to be tested, the test time set comprises test time corresponding to the first parameter information, and N is a positive integer. In the process of acquiring the submitted records, the submitted records after the application program is written are acquired, the submitted records comprise a second parameter information set and a submitted time set, the second parameter information set comprises M pieces of second parameter information, the second parameter information is parameter information actually used by the application program after the application program is written, the submitted time set comprises submitted time corresponding to the second parameter information, and M is a positive integer greater than or equal to N. And in the comparison process of the submitted record and the test record, determining target second parameter information in the second parameter information set according to the submitted record and the test record, wherein the target second parameter information comprises the parameter information which is tested locally.
In implementing the disclosed concept, the inventors found that because JVM (Java Virtual Machine) -Sandbox can provide a solution to AOP (Aspect Oriented Programming) without restarting and intruding into the target JVM application, the disclosed embodiments provide a test monitoring scheme based on JVM-Sandbox.
Fig. 1 schematically illustrates an exemplary system architecture 100 to which a test monitoring method may be applied, according to an embodiment of the present disclosure. It should be noted that fig. 1 is only an example of a system architecture to which the embodiments of the present disclosure may be applied to help those skilled in the art understand the technical content of the present disclosure, and does not mean that the embodiments of the present disclosure may not be applied to other devices, systems, environments or scenarios.
As shown in fig. 1, the system architecture 100 according to this embodiment may include terminal devices 101, 102, 103, a network 104 and a server 105. The network 104 serves as a medium for providing communication links between the terminal devices 101, 102, 103 and the server 105. Network 104 may include various connection types, such as wired and/or wireless communication links, and so forth.
The user may use the terminal devices 101, 102, 103 to interact with the server 105 via the network 104 to receive or send messages or the like. The terminal devices 101, 102, 103 may have installed thereon various communication client applications, such as a shopping-like application, a web browser application, a search-like application, an instant messaging tool, a mailbox client, and/or social platform software, etc. (by way of example only).
The terminal devices 101, 102, 103 may be various electronic devices having a display screen and supporting web browsing, including but not limited to smart phones, tablet computers, laptop portable computers, desktop computers, and the like.
The server 105 may be a server providing various services, such as a background management server (for example only) providing support for websites browsed by users using the terminal devices 101, 102, 103. The background management server may analyze and perform other processing on the received data such as the user request, and feed back a processing result (e.g., a webpage, information, or data obtained or generated according to the user request) to the terminal device.
It should be noted that the test monitoring method provided by the embodiment of the present disclosure may be generally executed by the server 105. Accordingly, the test monitoring apparatus provided by the embodiments of the present disclosure may be generally disposed in the server 105. The test monitoring method provided by the embodiments of the present disclosure may also be performed by a server or a server cluster that is different from the server 105 and is capable of communicating with the terminal devices 101, 102, 103 and/or the server 105. Accordingly, the test monitoring apparatus provided in the embodiments of the present disclosure may also be disposed in a server or a server cluster different from the server 105 and capable of communicating with the terminal devices 101, 102, 103 and/or the server 105. Alternatively, the test monitoring method provided by the embodiment of the present disclosure may also be executed by the terminal device 101, 102, or 103, or may also be executed by another terminal device different from the terminal device 101, 102, or 103. Accordingly, the test monitoring apparatus provided in the embodiments of the present disclosure may also be disposed in the terminal device 101, 102, or 103, or in another terminal device different from the terminal device 101, 102, or 103.
It should be understood that the number of terminal devices, networks, and servers in fig. 1 is merely illustrative. There may be any number of terminal devices, networks, and servers, as desired for implementation.
FIG. 2 schematically shows a flow diagram of a test monitoring method according to an embodiment of the disclosure.
As shown in fig. 2, the method includes operations S210 to S240.
In operation S210, under the condition that the test behavior is monitored, a test record corresponding to the test behavior is obtained, where the test record includes a first parameter information set and a test time set, where the first parameter information set includes N pieces of first parameter information, the first parameter information is parameter information used when the application program is written and is to be tested, the test time set includes test time corresponding to the first parameter information, and N is a positive integer.
In an embodiment of the present disclosure, a test behavior may refer to a behavior of a developer testing parameter information used to write an application. The test behavior may be monitored based on the target listener, and a test record corresponding to the test behavior may be obtained if the test behavior is monitored. The test record may include parameter information used when the application program is written and to be tested, and a test time corresponding to the parameter information. The parameter information used and tested when the application program is written may be referred to as first parameter information, and the test time is the time when the first parameter information used when the application program is written is tested. The number of the first parameter information may be N, and correspondingly, the number of the test time is also N, the first parameter information set may include N first parameter information, and the test time set may include N test times.
According to an embodiment of the present disclosure, the parameter information used when writing the application program may include a method and a parameter list, and accordingly, the first parameter information may include first method information and a first parameter list. The parameter information used when the application program is written can be tested in a unit test mode or a service access mode.
In operation S220, a commit record after the application program is written is obtained, where the commit record includes a second parameter information set and a commit time set, where the second parameter information set includes M second parameter information, the second parameter information is parameter information actually used by the application program that is written, and the commit time set includes commit time corresponding to the second parameter information, where M is a positive integer greater than or equal to N.
In the embodiment of the present disclosure, after the application program is written, the parameter information actually used by the written application program and the submission time corresponding to the parameter information may be submitted to form a submission record. The parameter information actually used by the written application program may be referred to as second parameter information, and the submission time is time for submitting the second parameter information actually used by the written application program. The number of the second parameter information may be M, correspondingly, the number of the commit times is also M, the second parameter information set may include M second parameter information, and the commit time set may include M commit times.
According to an embodiment of the present disclosure, N is a positive integer. M may be a positive integer greater than or equal to N.
In operation S230, target second parameter information in the second parameter information set is determined according to the submission record and the test record, wherein the target second parameter information includes parameter information that is tested locally.
In the embodiment of the disclosure, since the parameter information actually used by the written application program is submitted, but the parameter information actually used by the written application program is not necessarily tested, that is, the second parameter information is submitted, but the second parameter information is not necessarily tested, and in order to avoid the occurrence of low-level errors of the application program as much as possible, the robustness of the application program needs to be enhanced, so that if the second parameter information is tested, the test record corresponding to the second parameter information can be obtained, that is, the parameter information exists in both the submission record and the test record, that is, the consistent first parameter information and the consistent second parameter information exist, and the submission time corresponding to the second parameter information is later than the test time corresponding to the first parameter information.
Based on the above, it may be determined whether each of the second parameter information in the second parameter information sets is tested according to the submission record and the test record. The parameter information that is locally tested may be referred to as target second parameter information, that is, the target second parameter information may be understood as parameter information that is locally tested. The number of the target second parameter information may include T, and T may be a positive integer less than or equal to N.
According to the embodiment of the disclosure, if it is determined that the first parameter information consistent with the second parameter information exists in the test record, but the submission time corresponding to the second parameter information is earlier than the test time corresponding to the first parameter information, the second parameter information is considered not to be tested locally.
In operation S240, a test monitoring result for the application program is determined according to the target second parameter information.
In an embodiment of the present disclosure, the test monitoring result may include that the application segment is locally tested and that the application segment is not locally tested. If the parameter information corresponding to the application program segment is locally tested, the local test of the application program segment can be determined. Since the target second parameter information may be understood as parameter information that is locally tested, it may be determined that the application segment associated with the target second parameter information is locally tested. Correspondingly, the application program segments corresponding to other second parameter information in the second parameter information set except the target second parameter information are not tested locally.
According to the technical scheme of the embodiment of the disclosure, under the condition that the test behavior is monitored, the test record corresponding to the test behavior is obtained, the test record comprises a first parameter information set and a test time set, the first parameter information is the parameter information used and tested when the application program is written, the test time set comprises the test time corresponding to the first parameter information, the submission record after the application program is written is obtained, the submission record comprises a second parameter information set and a submission time set, the second parameter information is the parameter information actually used when the application program is written, the submission time set comprises the submission time corresponding to the second parameter information, and determining target second parameter information in the second parameter information set according to the submission record and the test record, wherein the target second parameter information comprises parameter information tested locally, and determining a test monitoring result aiming at the application program according to the target second parameter information. Because the test record corresponding to the test behavior is obtained, the submitted record after the application program is written is obtained, the parameter information which is tested in a centralized mode in the second parameter information is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are wasted easily and the monitoring effect is poor due to the adoption of the related technology are at least partially solved, the test efficiency is improved, and the robustness of the application program is guaranteed to the greatest extent.
According to an embodiment of the present disclosure, determining the target second parameter information in the second parameter information set according to the submission record and the test record may include the following operations.
And determining whether the first parameter information consistent with the second parameter information exists in the test record or not aiming at each second parameter information in the second parameter information set. In a case where it is determined that the first parameter information that coincides with the second parameter information exists in the test record, it is determined whether the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information. In a case where it is determined that the submission time corresponding to the second parameter information is later than the test time corresponding to the first parameter information, the second parameter information is determined as target second parameter information.
In an embodiment of the present disclosure, it may be determined, for each second parameter information in the second parameter information set, whether first parameter information that is identical to the second parameter information exists in the test record, if it is determined that the first parameter information that is identical to the second parameter information exists in the test record, whether a commit time corresponding to the second parameter information is later than a test time corresponding to the first parameter information is determined, and if it is determined that the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information, the second parameter information may be determined as target second parameter information.
According to an embodiment of the present disclosure, if it is determined that the first parameter information identical to the second parameter information does not exist in the test record, or it is determined that the first parameter information identical to the second parameter information exists in the test record and the commit time corresponding to the second parameter information is earlier than the test time corresponding to the first parameter information, it may be determined that the second parameter information is not the target second parameter information.
According to an embodiment of the present disclosure, the first parameter information includes a first method name and a first parameter list, the first method name being a method name of a method used when writing the application program and being tested. The second parameter information includes a second method name and a second parameter list, and the second method name is a method name for writing a method actually used by the completed application program. After determining, for each second parameter information in the second parameter information set, whether there is first parameter information in the test record that is consistent with the second parameter information, the method may further include the following operations.
And determining that the first parameter information consistent with the second parameter information exists in the test record under the condition that the first method name consistent with the second method name exists in the test record and the first parameter list consistent with the second parameter list exists in the test record.
In an embodiment of the present disclosure, the first parameter information may include a first method name and a first parameter list, and the second parameter information may include a second method name and a second parameter list. Wherein the parameter list may include a parameter type, a parameter number and a parameter order. Accordingly, the first parameter list may include a first parameter category, a first parameter number, and a first parameter order. The second parameter list may include a second parameter type, a second parameter number, and a second parameter order. Among the M second method names, there is a target second method name, which may include a method name associated with a method that is tested locally.
For each second parameter information in the second parameter information set, if it is determined that the first method name consistent with the second method name exists in the test record and the first parameter list consistent with the second parameter list exists, it may be stated that the first parameter information consistent with the second parameter information exists in the test record.
Determining the test monitoring result for the application program according to the target second parameter information may include determining the test monitoring result for the application program according to the target second method name.
According to the embodiment of the disclosure, in the case that the test behavior is monitored, obtaining the test record corresponding to the test behavior may include the following operations.
And setting the target monitoring program in the local environment where the application program is positioned. And calling a target monitor to monitor the test behavior. And acquiring a test record corresponding to the test behavior under the condition that the test behavior is monitored.
In the embodiment of the present disclosure, monitoring of the test behavior may be implemented through a monitoring mechanism, that is, the target monitor is set in a local environment where the application program is located, and the test behavior is monitored by calling the target monitor, where the target monitor may be implemented based on JVM-Sandbox, that is, before parameter information is called, a monitoring function is added to obtain a test record.
According to the embodiment of the disclosure, as the JVM-Sandbox has the characteristics of no invasion, class isolation, pluggable, multi-tenant and high compatibility, a start parameter for starting a service can be configured in the local environment where an application program is located, without other additional operations or modification of the application program, and parameter information of the locally tested parameter can be acquired.
According to the embodiment of the disclosure, in the case that the test behavior is monitored, obtaining the test record corresponding to the test behavior may include the following operations.
And setting the target monitoring program in a distributed version control system warehouse. And calling a target monitoring program from a warehouse of the distributed version control system through a starting instruction to monitor the test behavior. And acquiring a test record corresponding to the test behavior under the condition that the test behavior is monitored.
In the embodiment of the present disclosure, in addition to setting the target monitor in the local environment where the application program is located, the target monitor may also be set in the distributed version control system repository. This is to achieve the relative path consistency of the acquisition test record and the commit record if the commit record is stored to the distributed version control system repository.
According to the embodiment of the disclosure, the target monitoring program is arranged in the distributed version control system warehouse where the application program is located, and the start instruction for starting the target monitoring program in the proxy stage is added in the start parameter during the local test, so that the parameter information of the local test and the test time corresponding to the parameter information can be acquired.
According to an embodiment of the present disclosure, obtaining a commit record after writing the completed application may include the following operations.
And acquiring a submission record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
In the embodiment of the disclosure, the submitted records after the application program is written can be stored in the distributed version control system warehouse, and the submitted records can be obtained from the distributed version control system warehouse through the distributed version control system instruction.
According to an embodiment of the present disclosure, obtaining a submission record after writing the application program from a distributed version control system repository through a distributed version control system instruction may include the following operations.
And under the condition that the timing task instruction is triggered, acquiring a submission record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
In embodiments of the present disclosure, a submission record written as an application may be obtained based on a timed task. The timing task can be triggered by a timing task instruction, and after the timing task is started, a submission record can be acquired from a distributed version control system warehouse through a distributed version control system instruction.
According to an embodiment of the present disclosure, determining a test monitoring result for the application program according to the target second parameter information may include the following operations.
And determining that the application program segment associated with the target second parameter information is locally tested. And determining that the application program segment associated with the non-target second parameter information is not subjected to local test, wherein the non-target second parameter information is second parameter information in the second parameter information set except the target second parameter information.
In the embodiment of the present disclosure, since the target second parameter information may be understood as parameter information that is locally tested, if the second parameter information in the second parameter information set is the target second parameter information, it may be determined that the application segment associated with the target second parameter information is locally tested. If the second parameter information in the second set of parameter information is non-target second parameter information, it may be determined that the application segment associated with the non-target second parameter information is not tested locally. The non-target second parameter information may be understood as other second parameter information in the second parameter information set except the target second parameter information, that is, the non-target second parameter information is parameter information that is not tested locally.
FIG. 3 schematically illustrates a flow chart of another test monitoring method according to an embodiment of the disclosure.
As shown in fig. 3, the method includes operations S301 to S310.
In operation S301, a target listener is set in a local environment in which an application is located.
In operation S302, a target listener is invoked to listen for test behavior.
In operation S303, in case of listening to the test behavior, a test record corresponding to the test behavior is acquired.
In operation S304, a submission record after writing the application program is obtained from the distributed version control system repository through the distributed version control system instruction.
Determining, for each second parameter information in the second parameter information set, whether there is first parameter information in the test record that is consistent with the second parameter information in operation S305; if yes, perform operation S306; if not, operation S307 is performed.
In operation S306, determining whether a commit time corresponding to the second parameter information is later than a test time corresponding to the first parameter information; if yes, perform operation S309; if not, the process returns to operation S307.
In operation S307, it is determined that the second parameter information is non-target second parameter information.
In operation S308, it is determined that the application segment associated with the non-target second parameter information is not locally tested.
In operation S309, the second parameter information is determined to be the target second parameter information.
In operation S310, it is determined that the application segment associated with the target second parameter information is locally tested.
According to the technical scheme of the embodiment of the disclosure, a target monitoring program is set in a local environment of an application program, the target monitoring program is called to monitor a test behavior, a test record corresponding to the test behavior is obtained under the condition that the test behavior is monitored, the test record comprises a first parameter information set and a test time set, the first parameter information is parameter information used in writing the application program and is tested, the test time set comprises test time corresponding to the first parameter information, a submission record after the application program is written is obtained from a distributed version control system warehouse through a distributed version control system instruction, the submission record comprises a second parameter information set and a submission time set, the second parameter information is parameter information actually used by the written application program, and the submission time set comprises submission time corresponding to the second parameter information, and determining target second parameter information in the second parameter information set according to the submission record and the test record, wherein the target second parameter information comprises parameter information which is tested locally, determining that the application program segment associated with the target second parameter information is tested locally, and determining that the application program segment associated with the non-target second parameter information is not tested locally. Because the test record corresponding to the test behavior is obtained and the submitted record after the application program is compiled is obtained, the parameter information which is tested in a centralized manner and in the local is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are wasted easily and the monitoring effect is poor due to the adoption of related technologies are at least partially overcome, and the test efficiency is improved and the robustness of the application program is ensured as much as possible.
FIG. 4 schematically illustrates a flow chart of yet another test monitoring method according to an embodiment of the present disclosure.
As shown in fig. 4, the method includes operations S401 to S410.
In operation S401, a target listener is set in a distributed version control system repository.
In operation S402, a target listener is invoked from the distributed version control system repository through a start instruction to listen for test behavior.
In operation S403, in case of listening to the test behavior, a test record corresponding to the test behavior is acquired.
In operation S404, a commit record after the written application program is obtained from the distributed version control system repository through the distributed version control system instruction.
Determining, for each second parameter information in the second parameter information set, whether there is first parameter information in the test record that is consistent with the second parameter information in operation S405; if yes, go to operation S406; if not, operation S407 is performed.
In operation S406, determining whether a commit time corresponding to the second parameter information is later than a test time corresponding to the first parameter information; if yes, perform operation S409; if not, the process returns to operation S407.
In operation S407, it is determined that the second parameter information is non-target second parameter information.
In operation S408, it is determined that the application segment associated with the non-target second parameter information is not locally tested.
In operation S409, the second parameter information is determined to be the target second parameter information.
In operation S410, it is determined that the application segment associated with the target second parameter information is locally tested. According to the technical scheme of the embodiment of the disclosure, the target monitoring program is arranged in the distributed version control system warehouse, the target monitoring program is called from the distributed version control system warehouse through a starting instruction to monitor the test behavior, in the case of monitoring the test behavior, the test record corresponding to the test behavior is obtained, the test record comprises a first parameter information set and a test time set, the first parameter information is the parameter information used when the application program is written and tested, the test time set comprises the test time corresponding to the first parameter information, the submission record after the application program is written is obtained from the distributed version control system warehouse through the distributed version control system instruction, the submission record comprises a second parameter information set and the submission time set, the second parameter information is the parameter information actually used by the written application program, the submission time set comprises submission time corresponding to the second parameter information, target second parameter information in the second parameter information set is determined according to the submission record and the test record, the target second parameter information comprises parameter information tested locally, the application program segment associated with the target second parameter information is determined to be tested locally, and the application program segment associated with the non-target second parameter information is determined not to be tested locally. Because the test record corresponding to the test behavior is obtained and the submitted record after the application program is compiled is obtained, the parameter information which is tested in a centralized manner and in the local is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are wasted easily and the monitoring effect is poor due to the adoption of related technologies are at least partially overcome, and the test efficiency is improved and the robustness of the application program is ensured as much as possible.
FIG. 5 schematically illustrates a block diagram of a test monitoring device according to an embodiment of the present disclosure.
As shown in fig. 5, the test monitoring apparatus 500 may include a first obtaining module 510, a second obtaining module 520, a first determining module 530, and a second determining module 540.
The first acquisition module 510, the second acquisition module 520, the first determination module 530, and the second determination module 540 are communicatively coupled.
The first obtaining module 510 is configured to obtain a test record corresponding to a test behavior when the test behavior is monitored, where the test record includes a first parameter information set and a test time set, where the first parameter information set includes N pieces of first parameter information, the first parameter information is parameter information used when an application program is written and is to be tested, the test time set includes test time corresponding to the first parameter information, and N is a positive integer.
The second obtaining module 520 is configured to obtain a commit record after the application program is written, where the commit record includes a second parameter information set and a commit time set, where the second parameter information set includes M second parameter information, the second parameter information is parameter information actually used by the application program that is written, and the commit time set includes commit time corresponding to the second parameter information, where M is a positive integer greater than or equal to N.
A first determining module 530, configured to determine target second parameter information in the second parameter set according to the submission record and the test record, where the target second parameter information includes parameter information that is tested locally.
And a second determining module 540, configured to determine a test monitoring result for the application according to the target second parameter information.
According to the technical scheme of the embodiment of the disclosure, under the condition that the test behavior is monitored, the test record corresponding to the test behavior is obtained, the test record comprises a first parameter information set and a test time set, the first parameter information is the parameter information used and tested when the application program is written, the test time set comprises the test time corresponding to the first parameter information, the submission record after the application program is written is obtained, the submission record comprises a second parameter information set and a submission time set, the second parameter information is the parameter information actually used when the application program is written, the submission time set comprises the submission time corresponding to the second parameter information, and determining target second parameter information in the second parameter information set according to the submission record and the test record, wherein the target second parameter information comprises parameter information tested locally, and determining a test monitoring result aiming at the application program according to the target second parameter information. Because the test record corresponding to the test behavior is obtained and the submitted record after the application program is compiled is obtained, the parameter information which is tested in a centralized manner and in the local is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are wasted easily and the monitoring effect is poor due to the adoption of related technologies are at least partially overcome, and the test efficiency is improved and the robustness of the application program is ensured as much as possible.
According to an embodiment of the present disclosure, the first determination module 530 may include a first determination submodule, a second determination submodule, and a third determination submodule.
And the first determining submodule is used for determining whether the first parameter information consistent with the second parameter information exists in the test record or not aiming at each piece of second parameter information in the second parameter information sets.
And the second determining submodule is used for determining whether the submission time corresponding to the second parameter information is later than the test time corresponding to the first parameter information under the condition that the first parameter information consistent with the second parameter information exists in the test record.
And the third determining submodule is used for determining the second parameter information as the target second parameter information under the condition that the submission time corresponding to the second parameter information is determined to be later than the testing time corresponding to the first parameter information.
According to an embodiment of the present disclosure, the first parameter information includes a first method name and a first parameter list, the first method name being a method name of a method used when writing the application program and being tested. The second parameter information includes a second method name and a second parameter list, and the second method name is a method name for writing a method actually used by the completed application program.
After determining whether the first parameter information consistent with the second parameter information exists in the test record for each second parameter information in the second parameter information set, the method further includes:
and determining that the first parameter information consistent with the second parameter information exists in the test record under the condition that the first method name consistent with the second method name exists in the test record and the first parameter list consistent with the second parameter list exists in the test record.
According to an embodiment of the present disclosure, the first obtaining module 510 may include a first setting sub-module, a first calling sub-module, and a first obtaining sub-module.
And the first setting submodule is used for setting the target monitoring program in the local environment where the application program is located.
And the first calling submodule is used for calling the target monitoring program to monitor the test behavior.
And the first obtaining submodule is used for obtaining a test record corresponding to the test behavior under the condition that the test behavior is monitored.
According to an embodiment of the present disclosure, the first obtaining module 510 may further include a second setting sub-module, a second calling sub-module, and a second obtaining sub-module.
And the first setting submodule is used for setting the target monitoring program in a distributed version control system warehouse.
And the second calling submodule is used for calling the target monitoring program from the distributed version control system warehouse to monitor the test behavior through the starting instruction.
And the second obtaining submodule is used for obtaining the test record corresponding to the test behavior under the condition that the test behavior is monitored.
According to an embodiment of the present disclosure, the second obtaining module 520 may include a third obtaining sub-module.
And the third obtaining submodule is used for obtaining the submission record after the application program is written from the distributed version control system warehouse through the distributed version control system instruction.
According to an embodiment of the present disclosure, the third acquisition submodule may include an acquisition unit.
And the acquisition unit is used for acquiring the submission record after the application program is written from the distributed version control system warehouse through the distributed version control system instruction under the condition that the timing task instruction is triggered.
According to an embodiment of the present disclosure, the second determination module 540 may include a fourth determination submodule and a fifth determination submodule.
And the fourth determining submodule is used for determining that the application program segment associated with the target second parameter information is locally tested.
And the fifth determining submodule is used for determining that the application program segment associated with the non-target second parameter information is not subjected to local test, wherein the non-target second parameter information is the second parameter information in the second parameter information set except the target second parameter information.
Any number of modules, sub-modules, units, or at least part of the functionality of any number thereof according to embodiments of the present disclosure may be implemented in one module. Any one or more of the modules, sub-modules, units according to the embodiments of the present disclosure may be implemented by being split into a plurality of modules. Any one or more of the modules, sub-modules, units according to the embodiments of the present disclosure may be implemented at least partially as a hardware Circuit, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system on a chip, a system on a substrate, a system on a package, an Application Specific Integrated Circuit (ASIC), or may be implemented by any other reasonable manner of hardware or firmware for integrating or packaging a Circuit, or implemented by any one of three implementations of software, hardware, and firmware, or any suitable combination of any of them. Alternatively, one or more of the modules, sub-modules, units according to embodiments of the disclosure may be implemented at least partly as computer program modules, which, when executed, may perform corresponding functions.
For example, any plurality of the first obtaining module 510, the second obtaining module 520, the first determining module 530 and the second determining module 540 may be combined and implemented in one module/sub-module/unit, or any one of the modules/sub-modules/units may be split into a plurality of modules/sub-modules/units. Alternatively, at least part of the functionality of one or more of these modules/sub-modules/units may be combined with at least part of the functionality of other modules/sub-modules/units and implemented in one module/sub-module/unit. According to an embodiment of the present disclosure, at least one of the first obtaining module 510, the second obtaining module 520, the first determining module 530, and the second determining module 540 may be implemented at least in part as a hardware circuit, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system on a chip, a system on a substrate, a system on a package, an Application Specific Integrated Circuit (ASIC), or may be implemented by hardware or firmware in any other reasonable manner of integrating or packaging a circuit, or may be implemented by any one of three implementations of software, hardware, and firmware, or any suitable combination of any of them. Alternatively, at least one of the first obtaining module 510, the second obtaining module 520, the first determining module 530 and the second determining module 540 may be at least partially implemented as a computer program module, which when executed may perform a corresponding function.
It should be noted that the test monitoring apparatus portion in the embodiment of the present disclosure corresponds to the test monitoring method portion in the embodiment of the present disclosure, and the description of the test monitoring apparatus portion specifically refers to the test monitoring method portion, which is not described herein again.
Fig. 6 schematically shows a block diagram of an electronic device adapted to implement the above described method according to an embodiment of the present disclosure. The electronic device shown in fig. 6 is only an example, and should not bring any limitation to the functions and the scope of use of the embodiments of the present disclosure.
As shown in fig. 6, an electronic device 600 according to an embodiment of the present disclosure includes a processor 601, which can perform various appropriate actions and processes according to a program stored in a Read-Only Memory (ROM) 602 or a program loaded from a storage section 608 into a Random Access Memory (RAM) 603. Processor 601 may include, for example, a general purpose microprocessor (e.g., a CPU), an instruction set processor and/or associated chipset, and/or a special purpose microprocessor (e.g., an Application Specific Integrated Circuit (ASIC)), among others. The processor 601 may also include onboard memory for caching purposes. Processor 601 may include a single processing unit or multiple processing units for performing different actions of a method flow according to embodiments of the disclosure.
In the RAM 603, various programs and data necessary for the operation of the electronic apparatus 600 are stored. The processor 601, the ROM 602, and the RAM 603 are connected to each other via a bus 604. The processor 601 performs various operations of the method flows according to the embodiments of the present disclosure by executing programs in the ROM 602 and/or RAM 603. It is to be noted that the programs may also be stored in one or more memories other than the ROM 602 and RAM 603. The processor 601 may also perform various operations of the method flows according to embodiments of the present disclosure by executing programs stored in the one or more memories.
Electronic device 600 may also include input/output (I/O) interface 605, input/output (I/O) interface 605 also connected to bus 604, according to an embodiment of the disclosure. The electronic device 600 may also include one or more of the following components connected to the I/O interface 605: an input portion 606 including a keyboard, a mouse, and the like; an output portion 607 including a Cathode Ray Tube (CRT), a Liquid Crystal Display (LCD), and the like, a speaker, and the like; a storage section 608 including a hard disk and the like; and a communication section 609 including a network interface card such as a LAN card, a modem, or the like. The communication section 609 performs communication processing via a network such as the internet. The driver 610 is also connected to the I/O interface 605 as needed. A removable medium 611 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, or the like is mounted on the drive 610 as necessary, so that a computer program read out therefrom is mounted in the storage section 608 as necessary.
According to embodiments of the present disclosure, method flows according to embodiments of the present disclosure may be implemented as computer software programs. For example, embodiments of the present disclosure include a computer program product comprising a computer program embodied on a computer readable storage medium, the computer program containing program code for performing the method illustrated by the flow chart. In such an embodiment, the computer program may be downloaded and installed from a network through the communication section 609, and/or installed from the removable medium 611. The computer program, when executed by the processor 601, performs the above-described functions defined in the system of the embodiments of the present disclosure. The systems, devices, apparatuses, modules, units, etc. described above may be implemented by computer program modules according to embodiments of the present disclosure.
The present disclosure also provides a computer-readable storage medium, which may be contained in the apparatus/device/system described in the above embodiments; or may exist separately and not be assembled into the device/apparatus/system. The computer-readable storage medium carries one or more programs which, when executed, implement the method according to an embodiment of the disclosure.
According to an embodiment of the present disclosure, the computer-readable storage medium may be a non-volatile computer-readable storage medium. Examples may include, but are not limited to: a portable Computer diskette, a hard disk, a Random Access Memory (RAM), a Read-Only Memory (ROM), an erasable Programmable Read-Only Memory (EPROM) (erasable Programmable Read-Only Memory) or flash Memory), a portable compact Disc Read-Only Memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the preceding. In the present disclosure, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
For example, according to embodiments of the present disclosure, a computer-readable storage medium may include the ROM 602 and/or RAM 603 described above and/or one or more memories other than the ROM 602 and RAM 603.
According to the embodiment of the disclosure, because the test record corresponding to the test behavior is obtained and the submitted record after the application program is compiled is obtained, the second parameter information is determined to be the parameter information which is tested in a local mode based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are wasted easily and the monitoring effect is poor due to the adoption of the related technology are at least partially solved, and the test efficiency is improved and the robustness of the application program is ensured as much as possible.
Embodiments of the present disclosure also include a computer program product comprising a computer program containing program code for performing the method provided by the embodiments of the present disclosure, when the computer program product is run on an electronic device, the program code being adapted to cause the electronic device to carry out the test monitoring method provided by the embodiments of the present disclosure.
The computer program, when executed by the processor 601, performs the above-described functions defined in the system/apparatus of the embodiments of the present disclosure. The systems, apparatuses, modules, units, etc. described above may be implemented by computer program modules according to embodiments of the present disclosure.
In one embodiment, the computer program may be hosted on a tangible storage medium such as an optical storage device, a magnetic storage device, or the like. In another embodiment, the computer program may also be transmitted, distributed in the form of a signal on a network medium, downloaded and installed through the communication section 609, and/or installed from the removable medium 611. The computer program containing program code may be transmitted using any suitable network medium, including but not limited to: wireless, wired, etc., or any suitable combination of the foregoing.
In accordance with embodiments of the present disclosure, program code for executing computer programs provided by embodiments of the present disclosure may be written in any combination of one or more programming languages, and in particular, these computer programs may be implemented using high level procedural and/or object oriented programming languages, and/or assembly/machine languages. The programming language includes, but is not limited to, programming languages such as Java, C + +, python, the "C" language, or the like. The program code may execute entirely on the user computing device, partly on the user device, partly on a remote computing device, or entirely on the remote computing device or server. In situations involving remote computing devices, the remote computing devices may be connected to the user computing device through any kind of Network, including a Local Area Network (LAN) or Wide Area Network (WAN), or may be connected to external computing devices (e.g., through the internet using an internet service provider).
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams or flowchart illustration, and combinations of blocks in the block diagrams or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions. Those skilled in the art will appreciate that various combinations and/or combinations of features recited in the various embodiments and/or claims of the present disclosure can be made, even if such combinations or combinations are not expressly recited in the present disclosure. In particular, various combinations and/or combinations of the features recited in the various embodiments and/or claims of the present disclosure may be made without departing from the spirit or teaching of the present disclosure. All such combinations and/or associations are within the scope of the present disclosure.
The embodiments of the present disclosure have been described above. However, these examples are for illustrative purposes only and are not intended to limit the scope of the present disclosure. Although the embodiments are described separately above, this does not mean that the measures in the embodiments cannot be used in advantageous combination. The scope of the disclosure is defined by the appended claims and equivalents thereof. Various alternatives and modifications can be devised by those skilled in the art without departing from the scope of the present disclosure, and such alternatives and modifications are intended to be within the scope of the present disclosure.

Claims (12)

1. A test monitoring method, comprising:
under the condition that a test behavior is monitored, obtaining a test record corresponding to the test behavior, wherein the test record comprises a first parameter information set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is used for compiling an application program and is to be tested, the test time set comprises test time corresponding to the first parameter information, and N is a positive integer;
acquiring a submission record after the application program is written, wherein the submission record comprises a second parameter information set and a submission time set, the second parameter information set comprises M pieces of second parameter information, the second parameter information is parameter information actually used for writing the application program, and the submission time set comprises submission time corresponding to the second parameter information, wherein M is a positive integer greater than or equal to N;
determining target second parameter information in the second parameter information set according to the submission record and the test record, wherein the target second parameter information comprises parameter information tested locally; and
and determining a test monitoring result aiming at the application program according to the target second parameter information.
2. The method of claim 1, wherein said determining target second parameter information in the second set of parameter information from the commit record and the test record comprises:
determining whether first parameter information consistent with the second parameter information exists in the test record or not aiming at each second parameter information in the second parameter information set;
determining whether the submission time corresponding to the second parameter information is later than the test time corresponding to the first parameter information under the condition that the first parameter information consistent with the second parameter information exists in the test record; and
determining the second parameter information as target second parameter information in a case where it is determined that the submission time corresponding to the second parameter information is later than the test time corresponding to the first parameter information.
3. The method of claim 2, wherein the first parameter information includes a first method name and a first parameter list, the first method name being a method name of a method used when writing an application and tested; the second parameter information comprises a second method name and a second parameter list, and the second method name is a method name for writing a method actually used by the application program;
after the determining, for each second parameter information in the second parameter information set, whether there is first parameter information in the test record that is consistent with the second parameter information, further comprising:
and determining that first parameter information consistent with the second parameter information exists in the test record when determining that the first method name consistent with the second method name exists in the test record and the first parameter list consistent with the second parameter list exists in the test record.
4. The method of claim 1, wherein the obtaining a test record corresponding to a test behavior in a case where the test behavior is monitored comprises:
setting a target monitoring program in a local environment where an application program is located;
calling the target monitor to monitor the test behavior; and
and acquiring a test record corresponding to the test behavior under the condition of monitoring the test behavior.
5. The method of claim 1, wherein the obtaining a test record corresponding to a test behavior in a case where the test behavior is monitored comprises:
setting a target monitoring program in a distributed version control system warehouse;
calling the target monitoring program from the distributed version control system warehouse to monitor the test behavior through a starting instruction; and
and acquiring a test record corresponding to the test behavior under the condition of monitoring the test behavior.
6. The method of claim 1, wherein the obtaining a commit record after the application program is written comprises:
and acquiring a submission record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
7. The method of claim 6, wherein the obtaining, by the distributed version control system instructions, the commit record from within the distributed version control system repository after the application program was written comprises:
and under the condition that the timing task instruction is triggered, acquiring a submission record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
8. The method of claim 1, wherein the determining a test monitoring result for the application program according to the target second parameter information comprises:
determining that the application program segment associated with the target second parameter information is locally tested; and
determining that the application program segment associated with the non-target second parameter information is not locally tested, wherein the non-target second parameter information is second parameter information in the second parameter information set except for the target second parameter information.
9. A test monitoring device comprising:
the device comprises a first acquisition module, a second acquisition module and a third acquisition module, wherein the first acquisition module is used for acquiring a test record corresponding to a test behavior under the condition that the test behavior is monitored, the test record comprises a first parameter set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is parameter information which is used for compiling an application program and is to be tested, the test time set comprises test time corresponding to the first parameter information, and N is a positive integer;
a second obtaining module, configured to obtain a commit record after the application program is written, where the commit record includes a second parameter information set and a commit time set, where the second parameter information set includes M second parameter information, the second parameter information is parameter information actually used when the application program is written, and the commit time set includes commit time corresponding to the second parameter information, where M is a positive integer greater than or equal to N;
a first determining module, configured to determine, according to the submission record and the test record, target second parameter information in the second parameter information set, where the target second parameter information includes parameter information that is tested locally; and
and the second determining module is used for determining a test monitoring result aiming at the application program according to the target second parameter information.
10. An electronic device, comprising:
one or more processors;
a memory for storing one or more programs,
wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method of any of claims 1-8.
11. A computer readable storage medium having stored thereon executable instructions which, when executed by a processor, cause the processor to carry out the method of any one of claims 1 to 8.
12. A computer program product comprising a computer program which, when executed by a processor, is adapted to carry out the method of any one of claims 1 to 8.
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CN113673876A (en) * 2021-08-23 2021-11-19 江西盛泰精密光学有限公司 Baking process monitoring system based on machine vision
CN113673876B (en) * 2021-08-23 2024-01-26 江西盛泰精密光学有限公司 Baking process monitoring system based on machine vision

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