CN112394363B - Multi-line scanning distance measuring system - Google Patents
Multi-line scanning distance measuring system Download PDFInfo
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- CN112394363B CN112394363B CN202011133524.XA CN202011133524A CN112394363B CN 112394363 B CN112394363 B CN 112394363B CN 202011133524 A CN202011133524 A CN 202011133524A CN 112394363 B CN112394363 B CN 112394363B
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- 238000005070 sampling Methods 0.000 claims abstract description 52
- 238000012545 processing Methods 0.000 claims abstract description 18
- 238000005259 measurement Methods 0.000 claims description 27
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- 238000000034 method Methods 0.000 claims description 18
- 230000008569 process Effects 0.000 claims description 17
- 230000004913 activation Effects 0.000 claims description 2
- 238000007493 shaping process Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 6
- 238000003384 imaging method Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
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- 238000012938 design process Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000002366 time-of-flight method Methods 0.000 description 2
- 108091027981 Response element Proteins 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
- G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/483—Details of pulse systems
- G01S7/484—Transmitters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/483—Details of pulse systems
- G01S7/486—Receivers
- G01S7/4861—Circuits for detection, sampling, integration or read-out
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/483—Details of pulse systems
- G01S7/486—Receivers
- G01S7/4865—Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Networks & Wireless Communication (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Electromagnetism (AREA)
- Optical Radar Systems And Details Thereof (AREA)
Abstract
The invention discloses a multi-line scanning distance measuring system, which comprises: an emitter including a column light source composed of a plurality of light sources for emitting a pulse light beam toward a target; the collector comprises a plurality of sampling areas, each sampling area comprises a pixel array formed by a plurality of pixels and a plurality of control circuits, and the control circuits are connected to the pixels in a one-to-one correspondence manner so as to independently control the working modes of the pixels; a plurality of sampling regions are associated with the column light sources, and only a subset of pixels within a sampling region are activated for collecting reflected pulsed light beams; the rotating assembly is used for controlling the emitter and the collector to synchronously rotate so as to complete 360-degree scanning of the target and form a plurality of scanning lines in the field of view of the target; and the processing circuit is connected with the emitter and the collector, is used for synchronizing trigger signals of the emitter and the collector, processing photon signals of the pixel acquisition light beams and calculating the distance information of the target based on the flight time of the pulse light beams from the emission to the received by the collector.
Description
Technical Field
The invention relates to the technical field of distance measurement, in particular to a multi-line scanning distance measurement system.
Background
Distance measurement of a target using the time-of-flight principle (TOF, timeofFlight) to obtain a depth image containing a depth value of the target has been widely used in consumer electronics, unmanned driving, AR/VR, etc. Distance measurement systems based on the time-of-flight principle typically include an emitter and a collector, with the emitter emitting a pulsed light beam to illuminate the field of view of the target and the collector collecting a reflected light beam, calculating the time required for the light beam to travel from emission to receipt of the reflection to calculate the distance of the object.
At present, the laser radar based on the time-of-flight method is mainly divided into a mechanical type and a non-mechanical type, and the mechanical type realizes the distance measurement of 360-degree large view fields by rotating a base. The mechanical laser radar can be a single-line laser radar and a multi-line laser radar, wherein the single-line laser radar is provided with only one emitter and collector, and the scanning range is limited, so that the multi-line laser radar is provided, but the multi-line laser radar needs to be strictly aligned when the system is assembled and adjusted, so that the current multi-line laser radar is difficult in design process, high in manufacturing cost and difficult in mass production.
Disclosure of Invention
The invention mainly aims to provide a multi-line scanning distance measuring system which aims to solve the technical problems that the multi-line laser radar in the prior art needs to be aligned strictly when the system is assembled and adjusted, so that the existing multi-line laser radar is difficult in design process, high in manufacturing cost and difficult to produce in mass.
In order to solve the technical problems, the invention adopts the following technical scheme:
a multi-line scanning distance measurement system comprising: an emitter including a column light source composed of a plurality of light sources for emitting a pulse light beam toward a target object; the collector comprises a plurality of sampling areas, the number of which is the same as that of the light sources, each sampling area comprises a pixel array formed by a plurality of pixels and a plurality of control circuits, and the control circuits are connected to the pixels in a one-to-one correspondence manner so as to independently control the working modes of the pixels; the plurality of sampling regions are associated with the column light source and only a subset of pixels within the sampling regions are activated for collecting the reflected pulsed light beam; the rotating assembly is connected with the emitter and the collector and is used for controlling the emitter and the collector to synchronously rotate so as to finish 360-degree scanning of the target object to form a plurality of scanning lines in a target field of view; and the processing circuit is connected with the emitter and the collector, is used for synchronizing trigger signals of the emitter and the collector, processing photon signals of the pixel collecting light beams and calculating distance information of the target object based on flight time from the emission of the pulse light beams to the receiving of the pulse light beams by the collector.
Preferably, the column light source includes a plurality of the light sources arranged at intervals in a vertical direction.
Preferably, the transmitter further comprises a transmitting optical component for receiving and shaping the pulsed light beam emitted by the light source, and directing the shaped light beam towards the target object.
Preferably, the collector comprises a receiving optical assembly, the receiving optical assembly and the transmitting optical assembly being configured to comprise the same telecentric lens.
Preferably, the collector further comprises a plurality of readout circuits connected in one-to-one correspondence with the plurality of sampling regions for recording the time of flight of photons from emission to collection and outputting photon time signals, and constructing a histogram using the photon time signals.
Preferably, the readout circuit includes a TDC circuit and a histogram memory, and all pixels in the sampling region share the TDC circuit; or the readout circuit comprises a TDC circuit array and a histogram memory, wherein the number of the TDC circuits in the TDC circuit array is the same as the number of the pixels in the sampling area, and each pixel is connected with the TDC circuit in a one-to-one correspondence manner.
Preferably, the size of the sampling area is determined according to the offset caused by the system tolerance.
Preferably, the position of the pixel in the activated state in the sampling area is determined by means of a pre-calibration.
Preferably, the subset of pixels is configured as one sensing region, the sensing region comprising at least two of the pixels.
Preferably, the emitter and the collector are attached to the rotating assembly, which controls the emitter and the collector to synchronously rotate around the same rotation axis in the horizontal direction.
The invention has the beneficial effects that: through designing the sampling area, the light source and the pixels do not need to be strictly aligned one by one in the adjustment process, only the imaging position of the reflected light beam needs to be determined in the calibration process, and only a subset of the pixels in the sampling area is activated to collect the reflected light beam and generate photon signals when the distance measurement is carried out, so that the use difficulty of a ranging system can be greatly reduced, the ranging precision is improved, and the problem of the ranging precision reduction caused by difficult alignment is avoided. In addition, a subset of the pixels in an activated state in the sampling area is determined as a sensing area in a pre-calibration mode, for example, a room with smaller ambient light can be selected for calibration, the control circuit controls all the pixels in the sampling area to be activated, and the pixels with the strongest signal strength are traversed to determine the subset of the pixels to be activated as the subset of the pixels to be activated for collecting the reflected light beams in the ranging process, and the other pixels are in a closed state, so that the ranging precision can be improved.
Drawings
FIG. 1 is a system block diagram of a multi-line scanning distance measurement system in accordance with one embodiment of the present invention;
FIG. 2 is a system block diagram of a multi-line scanning distance measurement system in accordance with another embodiment of the present invention;
fig. 3 is a functional block diagram of a collector in accordance with an embodiment of the present invention.
Detailed Description
In order to make the technical problems, technical schemes and beneficial effects to be solved by the embodiments of the present invention more clear, the present invention is further described in detail below with reference to the accompanying drawings and the embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
It should be noted that the terms "first," "second," and "second" are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying a number of technical features being indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the embodiments of the present invention, the meaning of "plurality" is two or more, unless explicitly defined otherwise.
Fig. 1 is a system block diagram of a multi-line scanning distance measurement system according to an embodiment of the present invention, the distance measurement system 10 including a transmitter 11, a collector 12, a rotating assembly 13, and a processing circuit 14. Wherein the emitter 11 is adapted to emit a pulsed light beam towards the target area, which pulsed light beam is emitted into the target area space to illuminate a target object in the space, while the pulsed light beam reflected by the target is received by the collector 12. The rotation assembly 13 is used to control the emitter 11 and collector 12 to rotate in a horizontal direction about the rotation axis y synchronously to complete a 360 degree scan of the target field of view to form a plurality of scan lines in the target field of view. Wherein the emitter 11 and the collector 12 are attached to the rotating assembly 13, and may be disposed on the same substrate or on different substrates. The processing circuit 14 is connected to the transmitter 11 and the collector 12 for synchronizing trigger signals of the transmitter 11 and the collector 12 to calculate a time of flight required for the pulsed light beam to be received from the transmitter to the collector 12, thereby calculating distance information of the target.
Specifically, the distance D of the corresponding point on the target object can be calculated by the following formula (1):
D＝c·t/2(1)
wherein c is the speed of light and t is the time of flight.
With continued reference to fig. 1, the emitter 11 includes a driver 111, a light source 112, an emitting optical component 113, and the like. Wherein the driver 111 is adapted to control the light source 112 to emit pulsed light beams outwards at time intervals. The light source 112 may be a single light source or may be a one-dimensional light source array composed of a plurality of light sources. The light source may be a Light Emitting Diode (LED), a Laser Diode (LD), an Edge Emitting Laser (EEL), a Vertical Cavity Surface Emitting Laser (VCSEL), etc. In one embodiment, the light sources 112 are configured as one-dimensional column light sources arranged with a plurality of light sources at intervals along a vertical direction (the direction of the rotation axis y), each light source emitting a subset of pulses comprising n pulse light beams under the control of the driver 111, and as the rotation assembly 13 controls the emitter 11 to rotate 360 degrees in the horizontal direction about the rotation axis y, a plurality of scan lines are finally formed in the target field of view, and the number of light sources in the column light sources determines the resolution of the ranging system in the vertical direction. It will be appreciated that a portion of the processing circuitry 14 or sub-circuitry that exists independent of the processing circuitry 14 may also be utilized to control the light source 112 to emit a light beam.
The emission optical component 113 receives the light beam emitted from the light source 112 and projects the shaped light beam onto a target area. In one embodiment, the transmitting optical assembly 113 receives the pulsed light beam from the light source 112 and optically modulates the pulsed light beam, such as diffracting, refracting, reflecting, etc., and then transmits the modulated light beam, such as a focused light beam, a flood light beam, a structured light beam, etc., into space. The emission optics 113 may be one or more combinations of lenses, liquid crystal elements, diffractive optics, microlens arrays, metasurface (Metasurface) optics, masks, mirrors, MEMS mirrors, and the like.
With continued reference to FIG. 1, collector 12 includes a pixel array 122 and a receiving optical assembly 123, receiving optical assembly 123 for receiving at least a portion of the light beam reflected back from the target and directing it onto pixel array 122 to form an imaging spot. The pixel array 122 is disposed in association with the light source array 112, that is, each light source is in one-to-one correspondence with each pixel, and the light beam emitted by the light source is reflected back into the corresponding pixel after striking a point on the target object, and generally, in order to receive as many light signals in the reflected light beam as possible, the size of the single light spot is generally set to correspond to one sensing area including a plurality of pixels, for example, to correspond to 2×2=4 pixels, and then each light source is associated with each sensing area. Wherein the pixels may be single photon sensing devices such as APDs (avalanche photodiodes), SPADs (single photon avalanche diodes), sipms (silicon photomultipliers), etc., each pixel may be responsive to an incident single photon and output a photon signal indicative of the respective arrival time of the received photon at each pixel, with the collection of the weak optical signal and the calculation of the time of flight being accomplished using techniques such as time dependent single photon counting (TCSPC).
In one embodiment, the receiving optics 123 further includes an aperture disposed at the focal plane of the lens to limit ambient light interference and to adjust the light intensity of the reflected pulsed light beam to be uniformly distributed over the pixel, which may be SiPM, for example, that incorporates a larger number of single photon responsive elements, with a larger size. Furthermore, an internal reflection channel can be arranged between the small hole and the pixel, and the light beam passing through the small hole is emitted to the pixel after being reflected for multiple times by the internal reflection channel, so that a square light spot with the size approximately the same as that of the pixel can be formed, and all response elements are fully utilized.
Typically, the readout circuit 121 further includes one or more of a signal amplifier, a time-to-digital converter (TDC), a digital-to-analog converter (ADC), and the like, which are connected to the pixel array 122. These circuits may be integrated with the pixels or may be part of the processing circuit 14. In one embodiment, readout circuit 121 includes a TDC circuit for recording the time of flight of photons from emission to acquisition and outputting a photon time signal, and a histogram memory to which multiple measurements are input to construct a histogram, using the photon time signal to access the histogram memory.
The processing circuit 14 synchronizes the trigger signals of the emitter 11 and the collector 12, processes the photon signals of the pixel collecting light beams, and calculates the distance information of the target object based on the flight time of the reflected light beams. In one embodiment, processing circuitry 14 processes the histogram using algorithms such as peak matching and filter detection to identify the time of flight of the reflected beam from transmit to receive. It will be appreciated that the processing circuitry 14 may be a separate dedicated circuit, such as a dedicated SOC chip, an FPGA chip, an ASIC chip, or the like, or may comprise a general purpose processing circuit.
In the ranging system, the arrangement of the pixel array is associated with the column light sources, that is, each light source corresponds to a pixel one by one, so that when the system is assembled, each light source needs to be aligned with a corresponding sensing area strictly, that is, a light spot is incident to the central position of the sensing area, so that the difficulty of the assembly process is increased, and in addition, the ranging precision is reduced due to light spot offset caused by temperature, oscillation and the like in the ranging process of the system, so that the service life of the ranging system is influenced.
Fig. 2 is a system block diagram of a multi-line scanning distance measurement system in accordance with an embodiment of the present invention, the distance measurement system 20 including a transmitter 21, a collector 22, a rotating assembly 13, and a processing circuit 14. Wherein the emitter 21 comprises a first column of light sources of a plurality of light sources arranged at intervals in a vertical direction for emitting pulsed light beams towards a target object, preferably the light sources are VCSEL light sources; the collector 22 includes a plurality of sampling areas, each including a pixel array composed of a plurality of pixels and a plurality of control circuits, each associated with a pixel and independently controlling an operation mode (activation or deactivation of the pixel) of the corresponding pixel; sampling regions are associated with the column light sources, each sampling region being associated with a respective light source, and only a subset of the pixels within the sampling region being activated for collecting the reflected pulsed light beam and generating a photon signal; the rotating assembly 13 is used for controlling the emitter 21 and the collector 22 to rotate in the horizontal direction, and the function of the rotating assembly is the same as that of the ranging system of the previous embodiment; the processing circuit 14 is connected to the transmitter 21 and the collector 22, and is used for calculating the distance information of the target, and the specific calculation process is the same as that of the ranging system in the foregoing embodiment, which is not described herein again.
The number of light sources of the emitter 21 determines the scanning resolution. In one embodiment, the emitter 21 further includes a second row of light sources composed of a plurality of light sources, and the second row of light sources are staggered with respect to the first row of light sources in a vertical direction. Still further, the system may further include a third column light source, a fourth column light source, and the like, where all column light sources are staggered in a vertical direction to ensure that scanning lines formed by light beams emitted by all light sources in a target field of view do not coincide.
As shown in fig. 3, which is a schematic diagram of the collector of the distance measurement system shown in fig. 2, it should be noted that, the collector 22 includes a plurality of sampling areas, and fig. 3 only schematically illustrates one sampling area 221 and its readout circuit 313 in the collector 22, where the sampling area 221 includes a pixel array including a plurality of pixels 311 and a plurality of control circuits 312 as many as the pixels 311, and each control circuit 312 is associated with each pixel 311 and is used for independently controlling an operation mode of a corresponding pixel connected thereto, that is, controlling the pixel to be in an activated or deactivated state. A readout circuit 313 is associated with the sampling region 221 for processing the photon signals output by the sampling region, the readout circuit 313 including a TDC circuit 314 and a histogram memory 315. The readout circuit 313 may include a TDC circuit and a histogram memory, with all pixels in the sampling region 221 sharing a TDC circuit. In another embodiment, the readout circuit 313 may include a TDC circuit array and a histogram memory, where the number of TDC circuits is the same as the number of pixels in the sampling area 221, each pixel is connected to the TDC circuit in a one-to-one correspondence, each TDC circuit receives photon signals from the pixel and outputs photon time signals, and all photon time signals are distributed in the same histogram memory.
As in the embodiment shown in fig. 2, it is assumed that the column light source comprises two light sources 211, 212, since the sampling areas are associated with the column light source, the light sources are preferably the same number and one-to-one correspondence as the sampling areas, i.e. the collector comprises two sampling areas 221, 222. Based on the multi-line scanning distance measurement system as referred to in the prior art, assuming that 4 pixels are used as a sensing region for receiving the reflected light beam and a tightly aligned process design is required to be considered, the light beam emitted from the light source 211 needs to be incident into the sampling region 221 to form the imaging spot 225. In this embodiment, a plurality of pixels more than the sensing area are designed to form a sampling area 221 for receiving the light beam reflected by the target after being emitted by the light source 211, the size of the sampling area is determined according to the offset caused by the system tolerance, specifically, the size of the sampling area is determined by adding the offset to the side length of the sensing area, for example, as shown in fig. 2, the sensing area is 2×2mm, including 4 pixels, and the offset caused by the system tolerance is about 4mm, and then the size of the sampling area may be 10×10mm, including 100 pixels. It will be appreciated that the above data are only illustrative and are not meant to be a particular limitation of the invention.
By designing the sampling area, the system does not need to strictly align the light source and the sensing area one by one in the adjustment process, only the imaging position of the reflected light beam needs to be determined in the calibration process, and only a subset of pixels in the sampling area are activated to collect the reflected light beam and generate photon signals when the distance measurement is carried out. The subset of the pixels in the activated state in the sampling area is determined as the sensing area in a pre-calibration mode, for example, a room with smaller ambient light can be selected for calibration, the control circuit controls all the pixels in the sampling area to be activated, and the pixels with the strongest signal strength are traversed to determine the subset of the pixels to be activated as the subset of the pixels to be activated for collecting the reflected light beams in the ranging process, and the rest pixels are in the closed state. As shown in fig. 2, according to the pre-calibration result, the pixel position corresponding to the spot 224 formed by the reflected light beam entering the sampling area during the ranging process can be determined, and the position does not necessarily belong to the central position of the sampling area, and does not need to be strictly aligned with the light source 221, so that the difficulty in designing the system can be effectively reduced.
Furthermore, considering that the light spot emission offset is caused by temperature change, mechanical oscillation and other influencing factors of the device in the ranging process, in this embodiment, the incident position of the light spot can be tracked in real time in the ranging process. For example, in the ranging process, the sensing area position corresponding to the light spot is recalibrated at intervals, so that the ranging accuracy is improved. For example, after a period of time is separated, the reflected light beam is recalibrated to be incident to the sampling area to form a light spot 223, and then a pixel area corresponding to the light spot 223 is used as a sensing area, and the control circuit controls the pixels in the sensing area to activate and collect the reflected light beam.
Wherein an emitting optical component is further comprised in the emitter 21 and a receiving optical component is further comprised in the collector 22, preferably the emitting optical component and the receiving optical component are arranged to comprise the same telecentric lens. The light beam emitted by the VCSEL array light source can be projected at a large field angle after passing through the telecentric lens, and the light beam projected by each light source can be collimated. And the receiving optical assembly adopts the same telecentric lens to realize the conjugate relation between the center of the transmitter and the center of the receiver, thereby reducing the offset error of the light spot.
The foregoing is a further detailed description of the invention in connection with the preferred embodiments, and it is not intended that the invention be limited to the specific embodiments described. It will be apparent to those skilled in the art that several equivalent substitutions and obvious modifications can be made without departing from the spirit of the invention, and the same should be considered to be within the scope of the invention.
Claims (10)
1. A multi-line scanning distance measurement system, comprising:
an emitter including a column light source composed of a plurality of light sources for emitting a pulse light beam toward a target object;
the collector comprises a plurality of sampling areas, the number of which is the same as that of the light sources, each sampling area comprises a pixel array formed by a plurality of pixels and a plurality of control circuits, and the control circuits are connected to the pixels in a one-to-one correspondence manner so as to independently control the working modes of the pixels; the working mode comprises activation and closing, wherein all pixels are traversed to determine the pixel with the strongest signal intensity as a subset of the pixels to be activated for collecting reflected light beams in the ranging process, and other pixels are in a closing state; the plurality of sampling regions are associated with the column light source and only a subset of pixels within the sampling regions are activated for collecting the reflected pulsed light beam;
the rotating assembly is connected with the emitter and the collector and is used for controlling the emitter and the collector to synchronously rotate so as to finish 360-degree scanning of the target object to form a plurality of scanning lines in a target field of view;
and the processing circuit is connected with the emitter and the collector, is used for synchronizing trigger signals of the emitter and the collector, processing photon signals of the pixel collecting light beams and calculating distance information of the target object based on flight time from the emission of the pulse light beams to the receiving of the pulse light beams by the collector.
2. The multi-line scanning distance measurement system of claim 1 wherein said column light source comprises a plurality of said light sources spaced apart in a vertical direction.
3. The multi-line scanning distance measurement system according to claim 1 wherein said transmitter further comprises a transmitting optical assembly for receiving and shaping the pulsed light beam emitted by said light source and directing the shaped light beam toward said target object.
4. The multi-line scanning distance measurement system of claim 3 wherein said collector comprises a receiving optical assembly, said receiving optical assembly and said transmitting optical assembly being configured to include the same telecentric lens.
5. The multi-line scanning distance measurement system of claim 1 wherein said collector further comprises a plurality of readout circuits connected in one-to-one correspondence with said plurality of sampling regions for recording the time of flight of photons from the emission to the collection and outputting a photon time signal and constructing a histogram using the photon time signal.
6. The multi-line scanning distance measurement system of claim 5 wherein said readout circuitry comprises a TDC circuit and histogram memory, all pixels within said sampling region sharing one said TDC circuit;
or the readout circuit comprises a TDC circuit array and a histogram memory, wherein the number of the TDC circuits in the TDC circuit array is the same as the number of the pixels in the sampling area, and each pixel is connected with the TDC circuit in a one-to-one correspondence manner.
7. The multi-line scanning distance measurement system of claim 1 wherein the size of said sampling area is determined based on an offset caused by a system tolerance.
8. The multi-line scanning distance measurement system of claim 1 wherein the location of said pixels in an active state within said sampling region is determined by way of a pre-calibration.
9. The multi-line scanning distance measurement system of claim 1 wherein said subset of pixels is configured to be a sensing region, said sensing region comprising at least two of said pixels.
10. The multi-line scanning distance measurement system of claim 1 wherein said emitter and said collector are attached to said rotating assembly, said rotating assembly controlling said emitter and said collector to rotate synchronously in a horizontal direction about the same axis of rotation.
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| CN202011133524.XA CN112394363B (en) | 2020-10-21 | 2020-10-21 | Multi-line scanning distance measuring system |
| PCT/CN2020/138388 WO2022082985A1 (en) | 2020-10-21 | 2020-12-22 | Multiline scanning distance measuring system |
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| CN202011133524.XA CN112394363B (en) | 2020-10-21 | 2020-10-21 | Multi-line scanning distance measuring system |
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| CN112394363B true CN112394363B (en) | 2023-12-12 |
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| CN113900077A (en) * | 2021-09-30 | 2022-01-07 | 深圳市汇顶科技股份有限公司 | Laser radar transmitting device, laser radar device and electronic equipment |
| CN113759382A (en) * | 2021-10-19 | 2021-12-07 | 上海兰宝传感科技股份有限公司 | Distance measuring circuit and application thereof |
| CN114397663A (en) * | 2022-01-21 | 2022-04-26 | 上海灵昉科技有限公司 | Dtof's statistical histogram implementation device and laser radar ranging system |
| CN114114300B (en) * | 2022-01-25 | 2022-05-24 | 深圳市灵明光子科技有限公司 | Scattered point redistribution distance measuring device and laser detection system |
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