CN112003762A - Method and device for testing high reliability of storage device - Google Patents
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Abstract
The invention provides a method and a device for testing high reliability of storage equipment, wherein the method comprises the following steps: building a storage environment and a network topology of a host, and verifying whether the IOPS in the storage environment is stable and the host output IO is normal; responding to the stability of the IOPS in the storage environment and the normal output IO of the host, and acquiring specific parameters of the storage environment and the host; drawing a first performance curve graph based on the obtained specific parameters; removing the connection of part of controllers in the storage environment, and acquiring the specific parameters of the storage environment and the host again; drawing a second performance curve graph based on the obtained specific parameters again, and comparing the second performance curve graph with the first performance curve graph; in response to the second performance graph being consistent with the fluctuations of the first performance graph, the storage device is determined to have high reliability. By using the scheme of the invention, the high availability of multi-control storage can be verified, the continuity of host IO (input/output) service when the storage is abnormal can be verified, and the market competitiveness and the commercial value of a product can be improved.
Description
Technical Field
The field relates to the field of computers, and more particularly to a method and apparatus for high reliability testing of memory devices.
Background
Storage devices are increasingly important in new infrastructure growth trends. In the daily actual production process, unpredictable situations can be encountered, such as: network failures, power outages, equipment aging, operational failures, etc., which if mishandled can result in unpredictable disasters. For storage, it is difficult to ensure that the service continuity is not affected even if some of the exceptions occur in the multiple controllers, and it is troublesome to acquire the state of each controller, the state of a key component, the state of an IO (input/output), and the like in the test process.
Disclosure of Invention
In view of this, an object of the embodiments of the present invention is to provide a method and a device for testing high reliability of a storage device, by using the method of the present invention, high availability of multi-control storage can be verified, continuity of IO service of a host when storage is abnormal can be verified, continuity of IO service after abnormal repair of multi-control storage can be verified, and competitiveness and commercial value of a product in the market can be improved.
In view of the above object, an aspect of the embodiments of the present invention provides a method for testing high reliability of a memory device, including the following steps:
establishing a storage environment and a network topology of a host, and verifying whether IOPS (no second read-write times) in the storage environment is stable and whether host output IO is normal;
responding to the stability of the IOPS in the storage environment and the normal output IO of the host, and acquiring specific parameters of the storage environment and the host;
drawing a first performance curve graph based on the obtained specific parameters;
removing the connection of part of controllers in the storage environment, and acquiring the specific parameters of the storage environment and the host again;
drawing a second performance curve graph based on the obtained specific parameters again, and comparing the second performance curve graph with the first performance curve graph;
in response to the second performance graph being consistent with the fluctuations of the first performance graph, the storage device is determined to have high reliability.
According to an embodiment of the present invention, further comprising:
observing whether the host output IO condition is abnormal or not;
and responding to the condition that the host output IO is 0 within 3 to 5 seconds and then the output IO is recovered to be normal, and judging that the storage equipment has high reliability.
According to an embodiment of the present invention, further comprising:
reconnecting the removed portion of the controller to the storage environment and reacquiring the specific parameters of the storage environment and the host;
drawing a third performance graph based on the retrieved specific parameters and comparing the third performance graph with the first performance graph;
and in response to the third performance graph being consistent with the fluctuations of the first performance graph, determining that the storage device has high reliability.
According to one embodiment of the invention, the storage environment is a multi-control storage cluster comprising 4 controllers.
According to one embodiment of the invention, the specific parameters include IOPS, MBPS (megabits per second), and delay values.
According to an embodiment of the present invention, in response to the IOPS in the storage environment being stable and the host outputting IO being normal, acquiring specific parameters of the storage environment and the host includes:
establishing network links with the host and the storage environment based on the configured host IP, the user name and the password, the storage environment node IP and the cluster user name and the password;
the IOPS, MBPS and delay values of the volume are periodically acquired from the host and stored in a designated file, and the IOPS, MBPS and delay values of the volume, FC port and LUN are periodically acquired from the storage environment and stored in the designated file.
According to an embodiment of the present invention, drawing the first performance graph based on the obtained specific parameter includes:
reading data stored in a designated file, and inputting the data into an echart tool according to a json data format;
the echart tool plots a first performance graph based on the input IOPS, MBPS, and delay values.
In another aspect of the embodiments of the present invention, there is also provided a device for high reliability testing of a memory device, the device including:
the verification module is configured to build a storage environment and a network topology of the host, and verify whether the IOPS in the storage environment is stable and the host output IO is normal;
the first acquisition module is configured to respond to the fact that the IOPS in the storage environment is stable and the output IO of the host is normal, and acquire specific parameters of the storage environment and the host;
the drawing module is configured to draw a first performance curve graph based on the acquired specific parameters;
the second acquisition module is configured to remove the connection of part of the controllers in the storage environment and acquire the specific parameters of the storage environment and the host again;
the comparison module is configured to draw a second performance curve graph based on the re-acquired specific parameters and compare the second performance curve graph with the first performance curve graph;
and the judging module is configured to respond to the fluctuation of the second performance curve graph and the first performance curve graph and judge that the storage device has high reliability.
According to an embodiment of the present invention, the mobile terminal further includes a first determining module configured to:
observing whether the host output IO condition is abnormal or not;
and responding to the condition that the host output IO is 0 within 3 to 5 seconds and then the output IO is recovered to be normal, and judging that the storage equipment has high reliability.
According to an embodiment of the present invention, the apparatus further includes a second determining module configured to:
reconnecting the removed portion of the controller to the storage environment and reacquiring the specific parameters of the storage environment and the host;
drawing a third performance graph based on the retrieved specific parameters and comparing the third performance graph with the first performance graph;
and in response to the third performance graph being consistent with the fluctuations of the first performance graph, determining that the storage device has high reliability.
The invention has the following beneficial technical effects: according to the method for testing the high reliability of the storage device, provided by the embodiment of the invention, whether the IOPS in the storage environment is stable and the output IO of the host is normal is verified by building the network topology of the storage environment and the host; responding to the stability of the IOPS in the storage environment and the normal output IO of the host, and acquiring specific parameters of the storage environment and the host; drawing a first performance curve graph based on the obtained specific parameters; removing the connection of part of controllers in the storage environment, and acquiring the specific parameters of the storage environment and the host again; drawing a second performance curve graph based on the obtained specific parameters again, and comparing the second performance curve graph with the first performance curve graph; the technical scheme that the storage device is judged to have high reliability in response to the consistent fluctuation of the second performance curve graph and the first performance curve graph can verify the high availability of multi-control storage, verify the continuity of the IO service of the host when the storage is abnormal, verify the continuity of the IO service after the multi-control storage is abnormally repaired, and can improve the competitiveness and commercial value of products in the market.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other embodiments can be obtained by using the drawings without creative efforts.
FIG. 1 is a schematic flow chart diagram of a method for high reliability testing of a memory device according to one embodiment of the present invention;
FIG. 2 is a schematic diagram of a device for high reliability testing of a memory device according to an embodiment of the invention;
FIG. 3 is a network topology diagram of a storage environment and hosts according to one embodiment of the invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following embodiments of the present invention are described in further detail with reference to the accompanying drawings.
In view of the above objects, a first aspect of embodiments of the present invention proposes an embodiment of a method for high reliability testing of a memory device. Fig. 1 shows a schematic flow diagram of the method.
As shown in fig. 1, the method may include the steps of:
s1, building a network topology of a storage environment and a host, verifying whether the IOPS in the storage environment is stable and whether the host output IO is normal, and verifying whether the IOPS in the storage environment is stable and whether the host output IO is normal by a vdbech (storage device performance test tool) tool, wherein the storage environment can be a multi-control storage cluster which comprises a plurality of controllers for transmitting data to the storage device in parallel;
s2, responding to the fact that the IOPS in the storage environment is stable and the host computer output IO is normal, and obtaining specific parameters of the storage environment and the host computer;
s3, drawing a first performance curve graph based on the acquired specific parameters;
s4 removing the connection of partial controllers in the storage environment, and obtaining the specific parameters of the storage environment and the host again, only keeping one controller to transmit data to the storage device;
s5 plotting a second performance graph based on the re-acquired specific parameters and comparing the second performance graph with the first performance graph;
s6 judges that the storage device has high reliability in response to the second performance graph coinciding with the fluctuations of the first performance graph.
By the technical scheme, the high availability of multi-control storage can be verified, the continuity of the host IO service when the storage is abnormal can be verified, the continuity of the IO service after abnormal repair of the multi-control storage can be verified, and the market competitiveness and the commercial value of a product can be improved.
In a preferred embodiment of the present invention, the method further comprises:
observing whether the host output IO condition is abnormal or not;
and responding to the condition that the host output IO is 0 within 3 to 5 seconds and then the output IO is recovered to be normal, and judging that the storage equipment has high reliability.
In a preferred embodiment of the present invention, the method further comprises:
reconnecting the removed portion of the controller to the storage environment and reacquiring the specific parameters of the storage environment and the host;
drawing a third performance graph based on the retrieved specific parameters and comparing the third performance graph with the first performance graph;
and in response to the third performance graph being consistent with the fluctuations of the first performance graph, determining that the storage device has high reliability.
In a preferred embodiment of the present invention, the storage environment is a multi-control storage cluster, which includes 4 controllers.
In a preferred embodiment of the invention, the specific parameters include IOPS, MBPS and delay values.
In a preferred embodiment of the present invention, in response to the IOPS in the storage environment being stable and the host outputting IO being normal, the obtaining the specific parameters of the storage environment and the host includes:
establishing network links with the host and the storage environment based on the configured host IP, the user name and the password, the storage environment node IP and the cluster user name and the password;
the IOPS, MBPS and delay values of the volume are periodically acquired from the host and stored in a designated file, and the IOPS, MBPS and delay values of the volume, FC port and LUN are periodically acquired from the storage environment and stored in the designated file.
In a preferred embodiment of the present invention, the plotting the first performance graph based on the obtained specific parameter includes:
reading data stored in a designated file, and inputting the data into an echart tool according to a json data format;
the echart tool plots a first performance graph based on the input IOPS, MBPS, and delay values.
Examples
The following is a specific embodiment of the method of the present invention:
1. building a storage environment (four-control storage cluster) and a network topology of a host, as shown in fig. 3, performing initialization operations such as creation of a storage physical volume, configuring a storage environment and a host service network as optical fiber links, configuring storage cluster control and access as a gigabit network, configuring a server and a client to access as the gigabit network, mapping the stored physical volume to the host, configuring multiple paths on the host, adopting a multibus strategy and a modification/etc/multipath.conf configuration file corresponding strategy for the multiple paths, building an operating environment of a vddbech tool, writing a vddbech test script, and configuring an IO model as read-write 5: 5, operating a vdbench test script, observing the IOPS (input/output) on a storage management interface to be normal and stable, and enabling the output IO read-write of a host side vdbench to be normal;
2. acquiring data such as the in-place state, FC port flow (IOPS, MBPS), cluster state, network state of each node, and vdbech IOPS and delay of each node:
step a: configuring a pressure host IP, a user name and a password and storing four node service IPs and cluster user names and passwords in a tool configuration file (conf.xml), analyzing the configuration file (stored in a data structure and stored in a memory in real time in the tool operation process) through a python language, and establishing network links with the host and a storage terminal;
step b: acquiring and observing the state of a multi-control cluster by multiple dimensions, acquiring volumes IOPS, MBPS and delay values for a host by regular (conf. xml configuration) after establishing network links with the host and storage, and storing the volumes in specified files (host-side IOPS, delay and MBPS data); for the storage, volume and FC IOPS, MBPS, and latency values are obtained periodically (as above), a CLI command interface provided externally by a storage software operating system is used (there is a difference between storage vendors), the IOPS, MBPS, and latency of FC and LUN are respectively captured, and the data is stored in a designated file (storage IOPS, latency, MBPS data); then reading the file content, converting the original data according to a json data input format specified by echart, uniformly submitting the file to echart after organization is finished, and dynamically presenting the continuity of the storage service in real time by echart;
if the IOPS of the storage node is 0 and the storage node is not in place according to the CLI of the storage software system, the tool alarms, the node is lighted with red light, and the node is lighted with green light when in place. The performance graph can be plotted by several dimensions:
dimension 1, obtaining a four-control cluster IOPS (input/output system) by taking 1s (configurable) as a period, and automatically drawing a performance curve chart;
dimension 2, obtaining each node IOPS by taking 3s (configurable) as a period, and automatically drawing a performance curve graph;
dimension 3, obtaining IOPS of each FC port by taking 3s (configurable) as a period, and automatically drawing a performance curve chart;
dimension 4, taking 3s (configurable) as a period to periodically capture the in-place state of each multi-control storage node, and lighting green light in the in-place state and lighting red light out of the in-place state;
dimension 5, obtaining IOPS, MBPS and time delay in the vdbech, drawing a performance and time delay curve graph, and waiting for the stability of the curve after drawing a multi-dimensional performance curve;
3. in the operating process of the vdbech, any three controllers in the four-control storage cluster are unplugged, only one effective IO link in the storage cluster is needed at the moment, the statistics is carried out on the IO curve change, the FC port curve change, the storage IOPS and the delay change of the controllers under the scene of 4 control bad and 3 control, various state changes stored under extreme conditions are presented, the curves can visually present the stored state, and if the curve fluctuation is large or the curve falls to zero completely and is not recovered, the continuity of the storage service cannot be guaranteed in the abnormal scene, and the reliability is low;
4. observing that a scene that IO of the host computer is 0 is generated in 3-5 seconds, immediately recovering the IO to be normal, verifying that 3 controllers in the four-control storage random abnormity are detected, the host computer service is not influenced, and observing that the IOPS attempts to be consistent with the scene of the host computer vdbench;
5. and (3) the unplugged controller is plugged back again, the four-control storage cluster is recovered to be normal, the vdbech IO service of the host end is continuous, the IOPS curve graphs of each controller node, the IOPS curve graphs of the whole cluster and the IOPS curve graphs of the FC ports are obtained and compared with the step 2, and the storage change before and after the fault can be clearly shown.
By the technical scheme, the high availability of multi-control storage can be verified, the continuity of the host IO service when the storage is abnormal can be verified, the continuity of the IO service after abnormal repair of the multi-control storage can be verified, and the market competitiveness and the commercial value of a product can be improved.
It should be noted that, as will be understood by those skilled in the art, all or part of the processes in the methods of the above embodiments may be implemented by instructing relevant hardware through a computer program, and the above programs may be stored in a computer-readable storage medium, and when executed, the programs may include the processes of the embodiments of the methods as described above. The storage medium may be a magnetic disk, an optical disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), or the like. The embodiments of the computer program may achieve the same or similar effects as any of the above-described method embodiments.
Furthermore, the method disclosed according to an embodiment of the present invention may also be implemented as a computer program executed by a CPU, and the computer program may be stored in a computer-readable storage medium. The computer program, when executed by the CPU, performs the above-described functions defined in the method disclosed in the embodiments of the present invention.
In view of the above object, according to a second aspect of the embodiments of the present invention, there is provided a device for testing high reliability of a memory device, as shown in fig. 2, the device 200 includes:
the verification module is configured to build a storage environment and a network topology of the host, and verify whether the IOPS in the storage environment is stable and the host output IO is normal;
the first acquisition module is configured to respond to the fact that the IOPS in the storage environment is stable and the output IO of the host is normal, and acquire specific parameters of the storage environment and the host;
the drawing module is configured to draw a first performance curve graph based on the acquired specific parameters;
the second acquisition module is configured to remove the connection of part of the controllers in the storage environment and acquire the specific parameters of the storage environment and the host again;
the comparison module is configured to draw a second performance curve graph based on the re-acquired specific parameters and compare the second performance curve graph with the first performance curve graph;
and the judging module is configured to respond to the fluctuation of the second performance curve graph and the first performance curve graph and judge that the storage device has high reliability.
In a preferred embodiment of the present invention, the apparatus further includes a first determining module, and the first determining module is configured to:
observing whether the host output IO condition is abnormal or not;
and responding to the condition that the host output IO is 0 within 3 to 5 seconds and then the output IO is recovered to be normal, and judging that the storage equipment has high reliability.
In a preferred embodiment of the present invention, the apparatus further includes a second determining module, and the second determining module is configured to:
reconnecting the removed portion of the controller to the storage environment and reacquiring the specific parameters of the storage environment and the host;
drawing a third performance graph based on the retrieved specific parameters and comparing the third performance graph with the first performance graph;
and in response to the third performance graph being consistent with the fluctuations of the first performance graph, determining that the storage device has high reliability.
It should be particularly noted that the embodiment of the system described above employs the embodiment of the method described above to specifically describe the working process of each module, and those skilled in the art can easily think that the modules are applied to other embodiments of the method described above.
Those of skill would further appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the disclosure herein may be implemented as electronic hardware, computer software, or combinations of both. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as software or hardware depends upon the particular application and design constraints imposed on the overall system. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the disclosed embodiments of the present invention.
The embodiments described above, particularly any "preferred" embodiments, are possible examples of implementations and are presented merely to clearly understand the principles of the invention. Many variations and modifications may be made to the above-described embodiments without departing from the spirit and principles of the technology described herein. All such modifications are intended to be included within the scope of this disclosure and protected by the following claims.
Claims (10)
1. A method for testing high reliability of a storage device is characterized by comprising the following steps:
building a storage environment and a network topology of a host, and verifying whether the IOPS in the storage environment is stable and whether the host output IO is normal;
responding to the fact that the IOPS in the storage environment is stable and the output IO of the host is normal, and obtaining specific parameters of the storage environment and the host;
drawing a first performance curve graph based on the obtained specific parameters;
removing the connection of part of controllers in the storage environment, and acquiring the specific parameters of the storage environment and the host again;
drawing a second performance graph based on the re-acquired specific parameters and comparing the second performance graph with the first performance graph;
and in response to the second performance graph being consistent with the fluctuations of the first performance graph, determining that the storage device has high reliability.
2. The method of claim 1, further comprising:
observing whether the host output IO condition is abnormal or not;
and responding to the condition that the host output IO is 0 within 3 to 5 seconds and then the output IO is recovered to be normal, and judging that the storage equipment has high reliability.
3. The method of claim 1, further comprising:
reconnecting the removed portion of the controller to the storage environment and reacquiring the storage environment and the host's specific parameters;
drawing a third performance graph based on the retrieved specific parameters and comparing the third performance graph with the first performance graph;
and in response to the third performance graph being consistent with the fluctuations of the first performance graph, determining that the storage device has high reliability.
4. The method of claim 1, wherein the storage environment is a multi-control storage cluster comprising 4 controllers.
5. The method of claim 1, wherein the specific parameters include IOPS, MBPS, and delay values.
6. The method of claim 1, wherein in response to the IOPS in the storage environment being stable and the host output IO being normal, obtaining specific parameters of the storage environment and the host comprises:
establishing network links with the host and the storage environment based on the configured host IP, the user name and the password, the storage environment node IP and the cluster user name and the password;
the IOPS, MBPS and delay values of the volume are periodically acquired from the host and stored in a designated file, and the IOPS, MBPS and delay values of the volume, FC port and LUN are periodically acquired from the storage environment and stored in the designated file.
7. The method of claim 6, wherein plotting the first performance graph based on the obtained specific parameters comprises:
reading data stored in the designated file, and inputting the data into an echart tool according to a json data format;
the echart tool plots a first performance graph based on the input IOPS, MBPS, and delay values.
8. An apparatus for high reliability testing of a memory device, the apparatus comprising:
the verification module is configured to build a storage environment and a network topology of a host, and verify whether the IOPS in the storage environment is stable and whether the host output IO is normal;
a first obtaining module configured to obtain specific parameters of the storage environment and the host in response to an IOPS stability in the storage environment and a normal IO output by the host;
a drawing module configured to draw a first performance graph based on the obtained specific parameter;
a second obtaining module configured to remove connections of a part of controllers in the storage environment and obtain specific parameters of the storage environment and the host again;
a comparison module configured to plot a second performance graph based on the re-acquired specific parameter and compare the second performance graph with the first performance graph;
a determination module configured to determine that the storage device has high reliability in response to the second performance graph being consistent with fluctuations in the first performance graph.
9. The apparatus of claim 8, further comprising a first determination module configured to:
observing whether the host output IO condition is abnormal or not;
and responding to the condition that the host output IO is 0 within 3 to 5 seconds and then the output IO is recovered to be normal, and judging that the storage equipment has high reliability.
10. The apparatus of claim 8, further comprising a second determination module configured to:
reconnecting the removed portion of the controller to the storage environment and reacquiring the storage environment and the host's specific parameters;
drawing a third performance graph based on the retrieved specific parameters and comparing the third performance graph with the first performance graph;
and in response to the third performance graph being consistent with the fluctuations of the first performance graph, determining that the storage device has high reliability.
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| CN115499291A (en) * | 2022-09-14 | 2022-12-20 | 平安壹钱包电子商务有限公司 | Method and device for processing service zero-drop alarm information and storage medium |
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