CN111983330A - Van Atta array-based dielectric constant measurement system and method - Google Patents
Van Atta array-based dielectric constant measurement system and method Download PDFInfo
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Abstract
The application relates to a dielectric constant measuring system and method based on a Van Atta array. The system includes a measurement antenna array, a Van Atta array, and a dielectric constant calculation device. The measuring antenna array is arranged in a far-field area of the Van Atta array and is used for transmitting a measuring signal and receiving a reflected signal of the measuring signal after the measuring signal is acted by an object to be measured and reflected by the Van Atta array. The Van Atta array and the measuring antenna array are arranged oppositely, the caliber is larger than the diameter of an object to be measured, the working frequency and the polarization mode are set according to the measuring signal, and the backtracking directional diagram covers the measuring antenna array. The dielectric constant calculation device calculates the dielectric constant of the object to be measured according to the received reflected signal. The system automatically reflects the measuring signal acted by the object to be measured back to the measuring antenna array by utilizing the electromagnetic wave backtracking function of the Van Atta array, can ensure the energy and the signal-to-noise ratio of the reflected signal received by the measuring antenna array, and improves the measuring precision and the stability thereof.
Description
Technical Field
The application relates to the technical field of dielectric constant measurement, in particular to a system and a method for measuring dielectric constant based on a Van Atta array.
Background
The complex dielectric constant is an important electromagnetic parameter of a substance, embodies the capacity of the substance to store and consume electromagnetic energy, and is one of the inherent characteristics of the substance. Different substances, different substance states or different substance components can be reflected in the complex dielectric constant, and the related information of the substances, including the shape, the internal structure, the composition, the property change and the like, is generally obtained by measuring the complex dielectric constant in scientific research and engineering application.
Generally, when a complex permittivity measurement is performed on an object to be measured, the structure of the object to be measured cannot be damaged, and therefore, the object to be measured is generally measured by using an antenna array. Specifically, as shown in fig. 1, a measurement signal is transmitted through a transmitting antenna (array), the measurement signal acted on the object to be measured is received by a receiving antenna (array), and the complex dielectric constant of the object to be measured is solved through an algorithm according to the signal received by the receiving antenna (array). Due to the difference of materials and structures of the objects to be measured, the action modes of the objects to be measured on the measurement signals are different; when the dielectric constant of the object to be measured is solved by using the inverse scattering problem, the signal energy and the signal-to-noise ratio directly influence the calculation accuracy. Therefore, how to select the optimal receiving antenna (array) setting mode for different objects to be measured to improve the signal energy and the signal-to-noise ratio, and further improve the accuracy of the dielectric constant measurement result is an important problem faced by the current dielectric constant measurement system.
Disclosure of Invention
In view of the above, there is a need to provide a system and a method for measuring dielectric constant based on Van Atta array, which can improve and stabilize the measurement result of dielectric constant.
A dielectric constant measuring system based on a Van Atta array comprises a measuring antenna array, a VanAtta array and dielectric constant calculating equipment.
The measurement antenna array is arranged in a far field area of the VanAtta array and used for transmitting a measurement signal by using a preset frequency and polarization mode, receiving a reflection signal of the measurement signal after the measurement signal is acted by an object to be measured and reflected by the VanAtta array, and sending the reflection signal to dielectric constant calculation equipment.
The VanAtta array and the measuring antenna array are arranged oppositely, the aperture of the VanAtta array is larger than the diameter of an object to be measured, the working frequency and the polarization mode of the VanAtta array are set according to a measuring signal, and a backtracking directional diagram of the Van Atta array covers the measuring antenna array.
The dielectric constant calculation equipment is connected with the measurement antenna array, receives a reflection signal of a measurement signal sent by the measurement antenna array, and calculates the dielectric constant of the object to be measured according to the reflection signal.
One embodiment of the method further comprises a measuring antenna array switch array used for controlling the time of transmitting the measuring signal of the antenna in the measuring antenna array.
In one embodiment, the dielectric constant calculation device comprises a vector network analyzer and a dielectric constant calculation unit, wherein the dielectric constant calculation unit is pre-loaded with dielectric constant calculation software based on an inverse scattering algorithm, and the dielectric constant calculation software calculates the dielectric constant of the object to be measured according to the output of the vector network analyzer.
In one embodiment, the array elements of the VanAtta array adopt a low-profile structure.
In one embodiment, the measurement antenna array includes a probe for receiving the reflected signal.
A method for measuring a dielectric constant based on a Van Atta array, which uses the system described in any one of the above embodiments to measure a dielectric constant of an object to be measured placed in a far-field region of the Van attata array, the method comprising:
the measuring antenna array is used to transmit the measuring signal at a predetermined frequency, polarization pattern and duration.
And receiving a reflected signal of the measuring signal sent by the measuring antenna array by using dielectric constant calculating equipment, and calculating the dielectric constant of the object to be measured according to the reflected signal.
In one embodiment, before the step of transmitting the measurement signal with the measurement antenna array at a preset frequency, polarization mode and duration, the method further includes:
and calibrating the system by using the standard calibration object to obtain the calibration coefficient value of the transmitting and receiving antenna pair of the measuring antenna array.
A device for measuring the dielectric constant based on the Van Atta array, which uses the system described in any one of the above embodiments to measure the dielectric constant of an object to be measured placed in the far field region of the Van attata array, said device comprising:
and the measuring signal transmitting module is used for transmitting the measuring signal by using the measuring antenna array in a preset frequency, a preset polarization mode and a preset duration.
And the dielectric constant calculation module is used for receiving the reflected signal of the measurement signal sent by the measurement antenna array by using dielectric constant calculation equipment and calculating the dielectric constant of the object to be measured according to the reflected signal.
A computer device comprising a memory and a processor, the memory storing a computer program which, when the system described in any one of the above embodiments is used to measure the dielectric constant of an object placed in the far field region of the VanAtta array, the processor when executing the computer program performs the steps of:
the measuring antenna array is used to transmit the measuring signal at a predetermined frequency, polarization pattern and duration.
And receiving a reflected signal of the measuring signal sent by the measuring antenna array by using dielectric constant calculating equipment, and calculating the dielectric constant of the object to be measured according to the reflected signal.
A computer-readable storage medium having stored thereon a computer program which, when measuring a dielectric constant of an object to be measured placed in a far field region of a VanAtta array using the system described in any one of the above embodiments, implements, when executed by a processor, the steps of:
the measuring antenna array is used to transmit the measuring signal at a predetermined frequency, polarization pattern and duration.
And receiving a reflected signal of the measuring signal sent by the measuring antenna array by using dielectric constant calculating equipment, and calculating the dielectric constant of the object to be measured according to the reflected signal.
The Van Atta array parameter is set according to the size of the object to be measured and the measurement antenna array parameter, the object to be measured is placed in the far field of the Van Atta array and is positioned between the measurement antenna array and the Van Atta array which are oppositely arranged, the backtracking function of the Van Atta array on electromagnetic waves is utilized, the measurement signal acted by the object to be measured is automatically reflected to the position of the measurement antenna array, and for the objects to be measured with different structures and materials, the energy and the signal-to-noise ratio of the reflection signal received by the measurement antenna array can be ensured, so that the measurement precision of the system is higher and more stable.
Drawings
FIG. 1 illustrates a prior art dielectric constant measurement method;
FIG. 2 is a schematic diagram of the composition of a Van Atta array-based dielectric constant measurement system in one embodiment;
FIG. 3 is a schematic diagram of an array element arrangement of a Van Atta array in one embodiment;
FIG. 4 is a schematic flow chart of a dielectric constant measurement method based on Van Atta array in another embodiment;
FIG. 5 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In one embodiment, as shown in FIG. 2, a Van Atta array based dielectric constant measurement system is provided, comprising a measurement antenna array, a VanAtta array, and a dielectric constant calculation device.
The measurement antenna array is arranged in a far field area of the VanAtta array and used for transmitting a measurement signal by using a preset frequency and polarization mode, receiving a reflection signal of the measurement signal after the measurement signal is acted by an object to be measured and reflected by the VanAtta array, and sending the reflection signal to dielectric constant calculation equipment.
The VanAtta array and the measuring antenna array are arranged oppositely, the aperture of the VanAtta array is larger than the diameter of an object to be measured, the working frequency and the polarization mode of the VanAtta array are set according to a measuring signal, and a backtracking directional diagram of the Van Atta array covers the measuring antenna array.
The dielectric constant calculation equipment is connected with the measurement antenna array, receives a reflection signal of a measurement signal sent by the measurement antenna array, and calculates the dielectric constant of the object to be measured according to the reflection signal.
Specifically, the measuring antenna array in the system comprises a transmitting antenna and a receiving antenna. The transmitting antenna is used for transmitting a measuring signal, and the receiving antenna is used for receiving a reflected signal after the action of an object to be measured and the reflection of the VanAtta array. The frequency of the measuring signal can be preset according to the test requirement, and theoretically can be any electromagnetic frequency band.
The indexes of the Van Atta array are set according to the frequency, the polarization mode and the measurement range of the measurement antenna array, the size of an object to be measured and the like. According to the working principle of the Van Atta array, the Van Atta array can be regarded as a transmitting antenna array, the working frequency lambda and the polarization mode of an array element of the Van Atta array are determined according to the frequency and the polarization mode of a measuring signal transmitted by the measuring antenna array, and the size of the array element can be equivalent to the half wavelength of the working frequency lambda under the general condition; the aperture D of the whole Van Atta array is generally larger than the diameter of the object to be measured, and the object to be measured can be positioned in a far field region (Freund's charge-discharge region) of the Van Atta array, namely the aperture D of the Van Atta array needs to meet the requirement
Wherein R is the distance between the Van Atta array and the object to be measured. The width of the Van Atta array backtracking directional diagram is determined according to the measurement antenna array, namely the antenna measurement range of the measurement antenna array needs to be covered, and the width of the backtracking directional diagram of the Van Atta array can be adjusted by adjusting the beam width of the array elements and setting the proper array element spacing.
In use, a dielectric constant measurement system based on a Van Atta array is typically placed in a microwave dark room. Because the actual test system differs from the numerical model, the system needs to be calibrated by using a standard calibration object before testing, and a calibration coefficient c is obtained:
wherein the content of the first and second substances,
is the field value calculated from the calculation model,
refers to the s-parameter between a pair of transmit/receive antennas. The standard calibration object refers to an object with an accurately known dielectric constant, so that the measurement data can be used as a basis for system calibration.
Calibrated electric field data
Can be based on measured electric field data
And the calibration coefficient c is obtained:
for each pair of transmit/receive antennas, due to the differences in their fabrication and installation, it is necessary to calculate the corresponding calibration coefficients for them, and then to form a calibration coefficient matrix:
wherein the content of the first and second substances,
and
are respectively the first
The antenna being a transmitting antenna, the
Field value sum calculated according to calculation model when the antenna is used as receiving antenna
And (4) parameters. And depending on the kind of calibration field, the calibration can be divided into two categories: incident field calibration and scattered field calibration, respectively for the incident field and scattered field.
When the measurement is carried out, an object to be measured is placed in a far field area of the VanAtta array, and a measurement antenna array is used for transmitting a measurement signal at preset frequency, a preset polarization mode and preset duration. The measuring antenna array receives a reflected signal acted by the object to be measured and reflected by the VanAtta array, and calculates the dielectric constant of the object to be measured according to the reflected signal. Specifically, the measured S-parameters are converted to field values using a calibration matrix. The emission mode of the measurement signal during measurement can be divided into two categories according to the realization form of the measurement antenna array: firstly, through a plurality of antenna arrays, a single antenna is adopted to transmit measurement signals in turn, and reflected signals received by all the antennas are tested; secondly, a single antenna receives the reflected signals at different positions for many times to form a virtual equivalent antenna receiving array. The measuring antenna array should be located in the far field region of the VanAtta array scattered field when receiving the reflected signal.
The dielectric constant calculation equipment calculates the dielectric constant of the object to be measured by using an inverse scattering algorithm, wherein the inverse scattering algorithm can be a BORN algorithm, a filtering backward propagation method, a BORN iteration method, a contrast source method and the like. In the calculation process, the Van Atta array can be regarded as a boundary condition with backtracking and phase delay functions.
The Van Atta array parameter is set according to the size of the object to be measured and the measurement antenna array parameter, the object to be measured is placed in the far field of the Van Atta array and is positioned between the measurement antenna array and the Van Atta array which are oppositely arranged, the backtracking function of the Van Atta array on electromagnetic waves is utilized, the measurement signal acted by the object to be measured is automatically reflected to the position of the measurement antenna array, for the objects to be measured with different structures and materials, the energy and the signal-to-noise ratio of the reflection signal received by the measurement antenna array can be ensured, and the measurement precision of the system is higher and more stable.
Preferably, the array elements of the Van Atta array are arranged as shown in fig. 3, a plurality of array elements 302 are uniformly arranged on a printed circuit board 303 in a central symmetric manner, and the central symmetric array elements 302 are connected two by two through feeding points 301 on the back of the printed circuit board 303 by using radio frequency cables.
One embodiment of the method further comprises a measuring antenna array switch array used for controlling the time of transmitting the measuring signal of the antenna in the measuring antenna array. Specifically, the antennas in the measurement antenna array can be independently controlled individually or in groups by the measurement antenna array switch array according to the system measurement requirements, so as to control the switch state of each (group) of antennas, adjust the transmission duration of the test signal, and adapt to different test requirements.
In one embodiment, the dielectric constant calculation device comprises a vector network analyzer and a dielectric constant calculation unit, wherein the dielectric constant calculation unit is pre-loaded with dielectric constant calculation software based on an inverse scattering algorithm, and the dielectric constant calculation software calculates the dielectric constant of the object to be measured according to the output of the vector network analyzer. Commercial instruments such as impedance analyzers or self-developed electromagnetic transceiver systems may also be used in place of the vector network analyzer.
In one embodiment, the antenna type of the measurement antenna array can be horn antenna, patch antenna, slot antenna, helical antenna, yagi-uda antenna and other common antennas and arrays thereof; preferably, wideband and non-frequency varying antennas such as bicone, cone, discone and bow-tie antennas and arrays thereof for dielectric constant measurements may be employed. The measuring antenna array also comprises probes for receiving the reflected signals, wherein the probes comprise a coaxial probe with an opening at a terminal, a non-uniform coaxial probe, an anisotropic probe and the like, so that the small and thin object to be measured can be measured.
In one embodiment, the array elements in the Van Atta array are low-profile structures or three-dimensional structures, such as broadband antenna forms like helical antennas, to implement backward reflection in a wider frequency band. Among them, the Van Atta array applied to probe measurement generally uses a low-profile form to match the characteristic of a small radiation field range of the probe.
A dielectric constant measuring method based on Van Atta array measures the dielectric constant of an object to be measured placed in a far field region of the Van Atta array by using the system in any one of the embodiments, and comprises the following steps:
step 402, using the measuring antenna array to transmit a measuring signal at a preset frequency, polarization mode and duration.
Step 404, using the dielectric constant calculation device to receive the reflected signal of the measurement signal sent by the measurement antenna array, and calculating the dielectric constant of the object to be measured according to the reflected signal.
In one embodiment, before the step of transmitting the measurement signal with the measurement antenna array at the preset frequency, polarization mode and duration, the method further comprises:
and calibrating the system by using the standard calibration object to obtain the calibration coefficient value of the transmitting and receiving antenna pair of the measuring antenna array.
It should be understood that, although the steps in the flowchart of fig. 4 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a portion of the steps in fig. 4 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.
A device for measuring the dielectric constant based on the Van Atta array, which uses the system described in any one of the above embodiments to measure the dielectric constant of an object to be measured placed in the far field region of the Van attata array, said device comprising:
and the measuring signal transmitting module is used for transmitting the measuring signal by using the measuring antenna array in a preset frequency, a preset polarization mode and a preset duration.
And the dielectric constant calculation module is used for receiving the reflected signal of the measurement signal sent by the measurement antenna array by using dielectric constant calculation equipment and calculating the dielectric constant of the object to be measured according to the reflected signal.
In one embodiment, the system calibration module is further included for calibrating the system using the standard calibration object to obtain calibration coefficient values of the transceiver antenna pair of the measurement antenna array.
For the specific definition of the method and the device for measuring the dielectric constant based on the Van Atta array, reference may be made to the above definition of a system for measuring the dielectric constant based on the Van Atta array, which is not described herein again. The modules in the Van Atta array-based permittivity measurement apparatus described above can be implemented in whole or in part by software, hardware, and combinations thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 5. The computer device includes a processor, a memory, a network interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a Van Atta array-based dielectric constant measurement method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the architecture shown in fig. 5 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
A computer device comprising a memory and a processor, the memory storing a computer program which, when the system described in any one of the above embodiments is used to measure the dielectric constant of an object placed in the far field region of the VanAtta array, the processor when executing the computer program performs the steps of:
the measuring antenna array is used to transmit the measuring signal at a predetermined frequency, polarization pattern and duration.
And receiving a reflected signal of the measuring signal sent by the measuring antenna array by using dielectric constant calculating equipment, and calculating the dielectric constant of the object to be measured according to the reflected signal.
In one embodiment, the processor, when executing the computer program, further performs the following steps: and calibrating the system by using the standard calibration object to obtain the calibration coefficient value of the transmitting and receiving antenna pair of the measuring antenna array.
A computer-readable storage medium having stored thereon a computer program which, when measuring a dielectric constant of an object to be measured placed in a far field region of a VanAtta array using the system described in any one of the above embodiments, implements, when executed by a processor, the steps of:
the measuring antenna array is used to transmit the measuring signal at a predetermined frequency, polarization pattern and duration.
And receiving a reflected signal of the measuring signal sent by the measuring antenna array by using dielectric constant calculating equipment, and calculating the dielectric constant of the object to be measured according to the reflected signal.
In one embodiment, the computer program when executed by the processor further performs the steps of: and calibrating the system by using the standard calibration object to obtain the calibration coefficient value of the transmitting and receiving antenna pair of the measuring antenna array.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A dielectric constant measuring system based on Van Atta array is characterized in that the system comprises a measuring antenna array, a VanAtta array and dielectric constant calculating equipment,
the measurement antenna array is arranged in a far field area of the VanAtta array and used for transmitting a measurement signal by using a preset frequency and polarization mode, receiving a reflection signal of the measurement signal after the measurement signal is acted by an object to be measured and reflected by the VanAtta array, and sending the reflection signal to dielectric constant calculation equipment;
the VanAtta array is arranged opposite to the measuring antenna array, the aperture of the VanAtta array is larger than the diameter of the object to be measured, the working frequency and the polarization mode of the VanAtta array are set according to the measuring signal, and the backtracking directional diagram of the Van Atta array covers the measuring antenna array;
the dielectric constant calculation equipment is connected with the measurement antenna array, receives a reflection signal of the measurement signal sent by the measurement antenna array, and calculates the dielectric constant of the object to be measured according to the reflection signal.
2. The system of claim 1, further comprising a measurement antenna array switch array for controlling the time at which antennas in the measurement antenna array transmit the measurement signal.
3. The system according to claim 1, wherein the dielectric constant calculation apparatus comprises a vector network analyzer and a dielectric constant calculation unit preloaded with dielectric constant calculation software based on an inverse scattering algorithm, the dielectric constant calculation software calculating the dielectric constant of the object based on the output of the vector network analyzer.
4. The system according to any one of claims 1 to 3, wherein the array elements of the Van Atta array adopt a low-profile structure.
5. A system according to any one of claims 1 to 3, wherein the measurement antenna array comprises a probe for receiving the reflected signal.
6. A method for measuring dielectric constant based on Van Atta matrix, characterized in that the dielectric constant of an object to be measured placed in the far field region of the VanAtta matrix is measured using the system according to any one of claims 1 to 5, the method comprising:
transmitting a measurement signal by using the measurement antenna array in a preset frequency, a preset polarization mode and a preset duration;
and receiving a reflected signal of the measuring signal sent by the measuring antenna array by using the dielectric constant calculating equipment, and calculating the dielectric constant of the object to be measured according to the reflected signal.
7. The method of claim 6, wherein said step of using said measurement antenna array to transmit measurement signals at predetermined frequencies, polarizations and durations is preceded by the steps of:
and calibrating the system by using a standard calibration object to obtain calibration coefficient values of the transmitting and receiving antenna pairs of the measuring antenna array.
8. A device for measuring dielectric constant based on Van Atta matrix, characterized in that, the dielectric constant of an object to be measured placed in the far field region of the VanAtta matrix is measured using the system according to any one of claims 1 to 5, the device comprising:
the measuring signal transmitting module is used for transmitting a measuring signal by using the measuring antenna array in a preset frequency, a preset polarization mode and a preset duration;
and the dielectric constant calculation module is used for receiving a reflected signal of the measurement signal sent by the measurement antenna array by using the dielectric constant calculation equipment and calculating the dielectric constant of the object to be measured according to the reflected signal.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor realizes the steps of the method as claimed in claim 6 or 7 when executing the computer program.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method as claimed in claim 6 or 7.
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| TWI781770B (en) * | 2021-09-22 | 2022-10-21 | 川升股份有限公司 | System for measuring an electrical parameters |
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