CN111829971A - Method for reducing measurement error of wide spectrum transmittance - Google Patents
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Abstract
The invention relates to the technical field of spectral measurement, and discloses a method for reducing measurement errors of wide-spectrum transmittance, in particular to a method for improving a measurement signal and reducing the measurement errors of the transmittance of a sample by enhancing the spectral intensity of the full wavelength of incident light during sample detection. The invention starts from the definition of light transmittance, integrates the detection principle of a spectrometer, the working principle of a light-emitting component and the like, does not need to adjust the optical path, and can be used for solid and liquid samples without being limited by the state. By enhancing the spectral intensity of the full wavelength of the incident light, a higher sample transmission signal can be obtained, so that the signal to noise ratio of the spectrometer is remarkably improved, and the measurement error of the sample transmittance is reduced. The method is not limited by the form and the spectrum detection range of the sample, is simple to operate, and can be widely applied to the wide spectrum detection of various sample types.
Description
Technical Field
The invention relates to the technical field of spectral measurement, in particular to a method for reducing measurement errors of wide-spectrum transmittance.
Background
In the spectrum analysis method, a typical spectrometer mainly comprises an optical platform and a detection system, and comprises the following main parts:
1. entrance slit: forming an object point of a spectrometer imaging system under the irradiation of incident light;
2. a collimating element: the optical fiber emitted from the slit is changed into parallel light, and the collimation element can be a separate transmission and reflection mirror or be directly integrated on a dispersion element, such as a concave grating in a concave grating spectrometer;
3. a dispersive element: the optical signal is dispersed spatially according to wavelength by using a grating, which is called a plurality of light beams;
4. a focusing element: focusing the dispersed light beam to form a series of images of the incident slit on a focal plane, wherein each image point corresponds to a specific wavelength;
5. a detector array: placed in the focal plane for measuring the light intensity of each wavelength image point, which may be a CCD array or other kind of light detector array.
Based on this, we briefly describe the application principle in combination with the structure of the conventional spectrometer, the spectrometer uses a light source capable of generating multiple wavelengths, the light signal enters the optical platform of the spectrometer through an optical fiber interface via an entrance slit, is collimated by a collimating element (such as a curved mirror), then is irradiated into a sample to be measured, then is dispersed by a dispersive element (such as a planar grating), and is focused by a focusing element (such as a grating), finally, the image of the spectrum is projected onto a linear detector array, each image point corresponds to a specific wavelength, the detector measures the light intensity of each wavelength image point, and after modulation and amplification by a subsequent data processing system, the spectral energy R of the reference sample and the spectral energy of the sample to be measured are respectively measured, and then the transmittance T is obtained by calculation.
The reference optical path is typically solvent or air free of any solute components, as compared to the detection optical path containing the sample. The detection condition is usually that the reference light path is measured to obtain the transmission signal R after the light source passes through the reference sample, and then the test light path containing the sample to be detected is measured to obtain the sample transmission signal S. That is, the data processing system of the spectrometer compares the sample transmission signal S with the reference transmission signal R, and calculates the transmittance T by the formula of T ═ S/R × 100%.
In addition, in the spectrum analysis method, random noise error RMS which is difficult to overcome exists in the spectrometer, and the RMS is always mixed in the light energy signal measured by the spectrometer. RMS in spectrometers includes signal noise, readout noise, and thermal noise, among others. For example, signal noise refers to random noise of a signal; the readout noise refers to noise generated at the time of charge transfer, which occurs during each charge transfer, and thus is related to the speed of reading, the faster the reading speed, the higher the readout noise; thermal noise refers to noise caused by temperature, and the lower the temperature, the lower the thermal noise. It follows that as the reading speed of spectrometers grows faster and faster, and as the amount of heat generated by high speed operation increases accordingly, RMS is not only more difficult to overcome, but also tends to increase.
Therefore, in the actual detection process, random noise errors exist in the spectrometer, so that the spectrometer cannot accurately measure the actual light energy signals corresponding to the incident light after passing through the sample to be detected, only signal data with random noise errors can be obtained, the noise signals in the process influence the measurement accuracy of the spectrometer to a great extent, and the detection effect of the high-precision spectrometer is limited.
Disclosure of Invention
In order to overcome the adverse effect of random noise errors on the measurement accuracy, the invention provides a method for reducing the measurement errors of the wide-spectrum transmittance.
The purpose of the invention is realized by the following scheme:
a method for reducing measurement errors of wide-spectrum transmittance comprises the steps of enhancing the spectral intensity of the full wavelength of incident light, improving the measurement signal and reducing the measurement errors of a sample when the sample is detected.
The method of the invention only needs to adjust the incident light intensity, so the method can be used for detecting various sample types and can be widely applied to various fields, such as color measurement, chemical composition detection or electromagnetic radiation analysis and the like.
Specifically, the following are mentioned: the measurement error of the sample represents the measurement error of the sample under any wavelength, and the measurement error is the measurement error delta T of the sample transmittance under the wavelengthλ。
The method for reducing the measurement error of the wide-spectrum transmittance firstly enhances the spectral intensity of n times of the total wavelength of incident light and then according to the transmittance formula of a sample to be measured: t isλ＝Sλ’/RλCalculating the transmittance at any wavelength by n multiplied by 100%;
wherein SλThe spectral intensity of a sample to be measured is measured under any wavelength after the spectral intensity of incident light is enhanced; rλThe spectral intensity of the obtained reference sample is measured at any wavelength before the sample is detected.
As a further preferred embodiment of the invention, the reference agent transmits a signal RλMeasured from incident light without enhancement treatment.
Specifically, the following are mentioned: the spectral intensity of the invention is the spectral intensity of the detector after background dark noise is deducted.
As an optimization scheme of the invention, the transmittance value measured by the sample is Tλ＝Tλ'/n; where n is the enhancement factor of the incident light intensity (n is a positive number), Tλ' represents the measured transmittance of the sample at any wavelength after increasing the intensity of the incident light.
As a further optimization scheme of the invention, the enhancement multiple n of the incident light intensity can be obtained by controlling the actual luminous intensity of the light source.
As a further optimization scheme of the invention, the number of the luminous pulses of the incident light source is controlled, so that the pulse ratio of the measurement sample to the measurement reference is n, and the incident light intensity is enhanced by n times.
As a further optimization scheme of the invention, the incident light intensity is enhanced by n times by loading the light chopper at the light source so that the ratio of the light intensity passing through the measurement sample to the light intensity passing through the measurement reference is n.
While the spectral intensity of the incident light with n times of the total wavelength is enhanced by operation, it should be noted that the enhanced intensity signal cannot exceed the measurement range of the detector, and the detector saturation occurs when the intensity signal exceeds the upper limit of the detection of the detector, so that the enhancement effect is lost, and the instrument itself is adversely affected.
The implementation principle of the method of the invention is briefly described here:
taking spectroscopic analysis as an example, the optical system of the spectrometer mainly includes a light source, an entrance slit, a collimating element (e.g. a collimating mirror), a sample cell, a dispersive element (e.g. a grating or a prism), a focusing optical system and a detector. The spectrometer adopts a light source capable of generating a plurality of wavelengths, the light source sequentially passes through an incident slit and a collimating element to enable incident light to be converted into parallel light, the parallel light is irradiated into a sample cell to be detected, light energy transmitted out after being absorbed passes through a dispersion element and a focusing optical system to enable the light energy to form a series of images of the incident slit, each image point corresponds to a specific wavelength, finally, the light intensity of each wavelength image point is measured through a detector, and after modulation and amplification through a subsequent data processing system, the transmittance T of a sample (solution, optical filter and the like) to be detected under the condition of any wavelength is calculatedλAnd absorbance A.
Transmittance T of sample to be measured under any wavelengthλObtained by the following formula:
Tλ＝S/R×100％；
wherein R is the spectral intensity of the reference sample obtained by measuring the light source at any wavelength after passing through the reference sample before the sample is detected, namely RλR is substituted for R in the following; the intensity distribution has subtracted the dark current at the corresponding wavelength (i.e., the spectral intensity after background dark noise subtraction); s is the signal intensity distribution of the full spectrum measured by the spectrum after the light source passes through the sample to be measured under any wavelength, namely Sλ(ii) a S is substituted for the following; the intensity distribution has subtracted the dark current at the corresponding wavelength.
As mentioned in the background art, noise signals exist in the light energy signal S measured by the spectrum after the incident light passes through the sample to be measured, and in the existing noise signal test, the RMS (root mean square operation, peak-to-peak operation) of the noise of the sample is generally adopted for noise calculation, so that the RMS can be understood as a random noise error.
As can be seen from the above, the light energy signal S measured by the spectrometer after the incident light passes through the sample to be measured is actually S1+ RMS; wherein S1The corresponding actual light energy signals (the spectrum intensity after background dark noise is deducted) after the incident light passes through the sample to be detected are obtained;
the true transmittance of the sample is T1＝S1R × 100%; because the spectrometer has random noise error RMS, the spectrometer cannot accurately measure the actual light energy signal S corresponding to the incident light after the incident light passes through the sample to be measured1Only the signal S with RMS error can be obtained, so the transmittance T of the sample to be measured at any wavelength measured by the spectrometerλComprises the following steps:
Tλ＝S/R＝(S1+RMS)/R×100％＝(S1/R+RMS/R)×100％(a)
(it is specifically noted that there is also a noise signal in R in formula (a) here, but since the luminous flux signal is relatively strong when used as a reference sample, the noise signal is negligible compared to the noise signal of S).
Then, the error of the measured transmittance of the spectrometer with respect to the true transmittance can be derived:
△Tλ＝Tλ-T1＝RMS/R；(b)
△Tλthe measurement error of the transmittance of the sample to be measured at the wavelength is shown.
The method is characterized in that when a sample is measured, the full-wavelength spectral intensity of incident light of the sample to be measured is increased to n times, and the actual light energy signal corresponding to the incident light passing through the sample to be measured is nxS1At this time, the signal S' measured by the spectrometer is n × S1+ RMS; corresponding transmittance Tλ’＝(n×S1+ RMS)/R, the transmittance of the incident light is increased n times by increasing the full-wavelength spectral intensity of the incident light n times, and thus the transmittance T can be increased byλ' shrinkN times less to obtain the transmittance T of the sample to be measurednWherein, Tn＝Tλ'/n, i.e. Tn＝(n×S1+RMS)/R/n＝(S1/R+RMS/R/n)×100％。
That is, the transmittance T measured by the spectrometer is increased by n times the full wavelength spectral intensity of the incident lightnThe error with respect to the true transmittance is: delta Tλ’＝Tn-T1＝RMS/R/n；(c)
Formula (c) the present invention reduces the transmittance error to 1/n of the original transmittance error, relative to formula (b).
It can be known from the formula (c), the design key point of the method lies in that only the light source intensity of the sample to be detected is enhanced to reduce the influence of noise, so as to obtain a more accurate transmittance value, therefore, the method only increases the intensity of the corresponding light source when detecting the transmittance of the sample to be detected, and the enhanced light intensity should not exceed the detection range of the detector; therefore, when detecting the reference sample, the light source does not need to be amplified.
Furthermore, the invention is especially suitable for detecting the sample to be detected with lower transmittance, because the error caused by the RMS of the sample with lower transmittance is higher, and the measurement is greatly influenced.
For example, according to formula (b): delta Tλ＝Tλ-T1RMS/R; at a certain wavelength, if the RMS is 10, the signal of the reference sample is usually relatively high, e.g. 5000, and the spectrometer measurement can calculate the absolute error Δ T of the measurementλWhen 10/5000 is 0.2%, the relative error of the sample with respect to the actual transmittance of 1% is 20% when 0.2/1.
By adopting the method provided by the invention, the incident light intensity signal of the sample is improved by 10 times, and the absolute error delta T of the measurement can be calculated by the measurement of the spectrometer according to the formula (c)λWhen 10/5000/10 is 0.02%, the relative error of 1% with respect to the actual transmittance becomes 0.02/1-2%, the measurement error of the transmittance is greatly reduced, and the detection accuracy is improved.
As a further optimization scheme of the invention, the full spectrum of the incident light refers to any wavelength range within 200-; for absolute measurement of the emission spectrum, the spectrometer can be configured to have a wavelength range from 200-.
As a further optimization of the present invention, the light source includes, but is not limited to, xenon lamp, deuterium lamp, and tungsten halogen lamp.
According to the method, the transmittance measurement error of the sample can be obviously reduced, and for the liquid sample, as the transmittance and the absorbance of the sample have the relationship of A ═ log (T), the absorbance detection accuracy of the sample can be greatly improved on the premise of reducing the transmittance error of the sample, so that the measurement accuracy of the concentration of the liquid sample is improved. Similarly, for a solid sample, according to the definition of the light transmittance, the measurement error of the transmittance of the sample can be directly reduced, and the detection accuracy is improved. Therefore, the method is not limited by the detection form of the sample.
The method for reducing the measurement error of the broad-spectrum transmittance provided by the invention is not limited by the form of the sample, is simple and convenient to operate, can improve the detection accuracy, and has good application prospects in the fields of biological and chemical analysis, such as biological gene and protein analysis based on a spectrum method, food, water quality, environment detection and the like.
Further, the transmittance T is measured and the absorbance a is calculated by the method, and the absorbance value is obtained according to a ═ -log (T), and the target substance is qualitatively, quantitatively and accurately measured.
Compared with the prior art, the method has the following advantages and beneficial effects:
the invention provides a method for improving sample detection precision by using a spectral analysis method, which combines light transmittance definition, a detection principle of a comprehensive spectrometer, a working principle of a light-emitting component and the like, and has the following advantages:
(1) according to the invention, by enhancing the spectral intensity of incident light, the measurement error of the sample transmittance T is greatly reduced, and a higher sample reagent transmission signal is obtained, so that the signal-to-noise ratio of a spectrometer is obviously improved, and the detection accuracy of a sample is improved;
(2) the method of the invention does not need to adjust the optical path, thus being not limited by the limited method or equipment for changing the optical path; the purpose of improving the detection accuracy of the sample is easy to achieve, and the operation is simple and convenient;
(3) for the liquid sample, the method does not need to dilute the liquid sample to be detected in advance, and the low-concentration or high-concentration sample to be detected can be directly detected on a machine.
(4) The method is also suitable for solid samples, is not limited by the concentration of the sample, the volume of the sample and the form of the sample, and can be widely applied to detection of various sample types (such as liquid samples, optical filters and the like).
Drawings
FIG. 1 is a schematic diagram of the working principle of embodiment 1 of the present invention;
FIG. 2 is a schematic diagram of the working principle of embodiment 2 of the present invention;
FIG. 3 is a graph showing transmittance (1) and absorbance curve (2) of the sample to be measured in example 1 without the enhancement of the incident light intensity;
FIG. 4 is a graph showing transmittance (1) and absorbance curve (2) of the sample treated with the enhanced incident light intensity in example 1;
FIG. 5 is a graph (1) comparing transmittance and an absorbance curve (2) comparing measured samples before and after enhancement treatment in example 1 at a local 200-240nm interval.
Detailed Description
The following further describes the embodiments of the present invention. It should be noted that the description of the embodiments is provided to help understanding of the present invention, but the present invention is not limited thereto. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
The test methods used in the following experimental examples are all conventional methods unless otherwise specified; the materials, reagents and the like used are, unless otherwise specified, commercially available reagents and materials.
Example 1
Taking a liquid sample as an example, a method for reducing measurement errors of a wide-spectrum transmittance is used for enhancing the full-wavelength spectrum intensity of incident light corresponding to a sample to be measured by changing the pulse frequency of a light source in the process of detecting the transmittance and the absorbance of the liquid sample.
Step S1, the reference cell of this embodiment is a solvent without any solute component, the position of the sample cell is switched to the reference cell before the measurement of the test optical path including the sample, the reference optical path is measured first, the full-spectrum signal intensity distribution measured by the spectrum after the incident light without enhancement processing passes through the reference sample is obtained, and then the transmittance curve (as shown in (1) in fig. 3) and the absorbance curve (as shown in (2) in fig. 3) of the unprocessed sample to be measured are obtained by calculation through the signal processing system and the optical characteristic calculation unit;
step S2, switching the reference cell back to the sample cell, and amplifying the light source pulse frequency of the sample to be detected by 10 times on the basis of the reference light source;
step S3, the transmitted light signal obtained in step S2 passes through a dispersion element and a focusing optical system, and finally the light intensity of each wavelength image point is measured by a detector, where the transmitted light energy signal S 'measured by the detector is 10 times enhanced, and then the signal S' measured by the spectrometer is 10 × S1+RMS(S1The actual light energy signal corresponding to the incident light after passing through the sample cell, RMS is the random noise error of the spectrometer);
step S4, calculating the transmittance T after amplification under any wavelength by using a signal processing systemλ’，Tλ’＝S’/R＝(10×S1+RMS)/R；
Step S5 of calculating transmittance T by optical characteristics calculating meansλ' scaling down to obtain T according to the enhancement multiple of incident light10(representing signal strength after 10-fold increase at any wavelength), T10＝Tλ'/10, again according to T10The absorbance A was converted to obtain a transmittance curve (shown as (1) in FIG. 4) and an absorbance curve (shown as (2) in FIG. 4) of the treated test sample.
FIG. 5 (1) is an enlarged graph of the curve in the region of 200-240nm, comparing the transmittance curves of the samples before and after treatment, and FIG. 5 (2) is a comparison graph of the absorbance curves of the samples before and after treatment; it can be seen that: the transmittance and absorbance curves obtained by the method are smoother and smoother, and the influence of random noise errors is obviously reduced.
In this embodiment, in step S2, there are many ways to adjust the pulse frequency, and when the digital device is used to generate the optical pulse, by changing the input frequency, the optical pulse frequency will also change correspondingly; when the singlechip is used for generating the optical pulse, the comparison value of the register is modified to change the frequency of the optical pulse.
Example 2
Taking a liquid sample as an example, a method for reducing measurement errors of a wide-spectrum transmittance is characterized in that in the process of detecting the transmittance and the absorbance of the liquid sample, a light chopper is arranged to increase the full-wavelength spectrum intensity of incident light corresponding to a sample to be measured so as to reduce the measurement errors of the sample.
Step S1, the reference cell of this embodiment is a solvent without any solute component, the position of the sample cell is switched to the reference cell before the measurement of the test optical path including the sample, the reference optical path is measured first to obtain the signal intensity distribution of the full spectrum measured by the spectrum after the incident light without enhancement processing passes through the reference sample, and then the reference transmittance and absorbance curve are calculated by the signal processing system and the optical characteristic calculating unit;
step S2, switching the reference cell back to the sample cell, adjusting the intensity of the light source by using a light chopper, and amplifying the light source intensity of the sample to be measured by 10 times on the basis of the reference light source;
step S3, the transmitted light signal obtained in step S2 passes through a dispersion element and a focusing optical system, and finally the light intensity of each wavelength image point is measured by a detector, where the transmitted light energy signal S 'measured by the detector is 10 times enhanced, and then the signal S' measured by the spectrometer is 10 × S1+RMS(S1The actual light energy signal corresponding to the incident light after passing through the sample cell, RMS is the random noise error of the spectrometer);
step S4, calculating the transmittance T after amplification under any wavelength by using a signal processing systemλ’，Tλ’＝S’/R＝(10×S1+RMS)/R；
Step S5, adopting the optical characteristic calculating unit to reduce the transmittance T' according to the enhancement factor of the incident light to obtain T10(representing signal strength after 10-fold increase at any wavelength), T10＝Tλ'/10, again according to T10And converting the absorbance A to obtain the transmittance and absorbance curve of the sample.
In this embodiment, step S2, the light chopper, which is a high precision component capable of weak signal transformation, is understood to be a frequency-adjustable rotating blade, and the rotating blade is placed in the optical path, and as the blade rotates, light periodically passes through and is blocked, so that the optical signal is pulsed, and the modulation frequency depends on the rotating frequency of the blade. That is, the chopping operation is to interrupt the light beam or the infrared radiation beam at uniform time intervals, and the light radiation shot signal from the light source is modulated into an alternating signal by the motor, thereby modulating the intensity of the light beam to be measured.
In this embodiment, the light chopper adopts a rotating disk type mechanical shutter, and the light chopper is disposed at the light source position to amplify the intensity of the light beam of the light source to a certain extent, and then emit the modulated light beam to the collimating element through the incident slit, so that the detector detects a correspondingly amplified transmission light signal.
Of course, in other embodiments, other types of choppers can be selected, such as a variable-frequency rotating chopper and a fixed-frequency tuning fork chopper, so as to achieve the purpose of adjusting the intensity of the optical signal in different chopping modes.
Example 3
Taking an optical filter as an example, a method for reducing measurement errors of a wide-spectrum transmittance is provided, in the transmittance detection process of the optical filter, by arranging a light chopper, the full-wavelength spectrum intensity of incident light corresponding to a sample to be detected is increased, so that the measurement errors of the sample are reduced.
Step S1, before measuring the test light path containing the sample, a reference filter is placed at the position of the sample cell, and the reference light path (air) is measured first, so as to obtain the full-spectrum signal intensity distribution measured by the spectrum after the incident light without enhancement passes through the air;
step S2, switching the reference cell into the optical filter to be measured, adjusting the intensity of the light source by using the chopper, and amplifying the light source intensity of the optical filter to be measured by 10 times on the basis of the reference light source;
step S3, the transmitted light signal obtained in step S2 passes through a dispersion element and a focusing optical system, and finally the light intensity of each wavelength image point is measured by a detector, where the light intensity measured by the detector is the transmitted light energy signal S 'with 10 times of the light intensity, and then the signal S' measured by the spectrometer is 10 × S1+RMS(S1The actual light energy signal corresponding to the incident light after passing through the sample cell, RMS is the random noise error of the spectrometer);
step S4, calculating the transmittance T after amplification under any wavelength by using a signal processing systemλ’，Tλ’＝S’/R＝(10×S1+RMS)/R；
Step S5, the transmittance T' is reduced proportionally according to the enhancement multiple of the incident light by adopting the optical characteristic calculating unit to obtain the transmittance T of the filter to be measured10(representing signal strength after 10-fold increase at any wavelength), T10＝Tλ’/10。
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the described embodiments. It will be apparent to those skilled in the art that various changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, and the scope of protection is still within the scope of the invention.
Claims (10)
1. A method of reducing wide spectrum transmittance measurement errors, comprising: when the sample is detected, the spectral intensity of the full wavelength of incident light is enhanced, the measurement signal is improved, and the measurement error of the sample is reduced.
2. The method of reducing errors in the measurement of broad spectral transmittance of claim 1, wherein: the measurement error of the sample is the measurement error of the sample under any wavelength, and represents the measurement error delta T of the sample transmittance under the wavelengthλ。
3. The method of reducing errors in the measurement of broad spectral transmittance of claim 2, wherein: firstly, enhancing the spectral intensity of n times of the total wavelength of incident light, and then according to a transmittance formula of a sample to be detected: t isλ＝Sλ’/RλCalculating the transmittance at any wavelength by n multiplied by 100%;
wherein SλThe spectral intensity of a sample to be measured is measured under any wavelength after the spectral intensity of incident light is enhanced; rλThe spectral intensity of the reference sample obtained is measured at any wavelength prior to sample detection.
4. A method of reducing errors in measurements of broad spectral transmittance according to claim 3, wherein: the spectral intensity of the incident light with the full wavelength of n times is enhanced by modulating the light intensity entering the sample to be detected or by controllably improving the luminous intensity of the light source.
5. The method of reducing errors in the measurement of broad spectral transmittance of claim 4, wherein: by adding the light chopper at the light source, the ratio of the spectral intensity of the sample to be measured to the spectral intensity of the reference sample is n, so that the spectral intensity of the incident light with the full wavelength is enhanced by n times.
6. The method of reducing errors in the measurement of broad spectral transmittance of claim 4, wherein: by controlling the number of the luminous pulses of the light source, the pulse ratio of the sample to be detected to the reference sample is n, so that the spectral intensity of the incident light with the full wavelength is enhanced by n times.
7. The method of reducing errors in the measurement of broad spectral transmittance of claim 1, wherein: the spectral range of the incident light is 200-400nm or 380-1700 nm.
8. The method of reducing errors in the measurement of broad spectral transmittance of claim 7, wherein: the light source includes, but is not limited to, xenon, deuterium, and tungsten halogen lamps.
9. A method of reducing errors in the measurement of broad spectral transmittance according to any one of claims 1 to 8, wherein: the spectral intensity is the spectral intensity of the detector after background dark noise is deducted.
10. Use of the method for reducing errors in measurements of broad spectral transmission in the field of biological and chemical analysis according to claim 1, characterized in that the method is used to measure the transmission T and to calculate the absorbance a, where a ═ log (T).
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|---|---|---|---|---|
| CN113295387A (en) * | 2021-05-25 | 2021-08-24 | 中国科学院合肥物质科学研究院 | System and method for testing optical parameters of multiband strip-shaped optical filter |
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| CN113695267A (en) * | 2021-08-30 | 2021-11-26 | 深圳市洲明科技股份有限公司 | Ink color sorting device and sorting method thereof |
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