CN111786852A - Test method and related equipment - Google Patents
Test method and related equipment Download PDFInfo
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- CN111786852A CN111786852A CN202010616634.5A CN202010616634A CN111786852A CN 111786852 A CN111786852 A CN 111786852A CN 202010616634 A CN202010616634 A CN 202010616634A CN 111786852 A CN111786852 A CN 111786852A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
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Abstract
The embodiment of the invention discloses a test method and related equipment, wherein after a tested terminal is powered on, the assignment of a test mode zone bit in the tested terminal is obtained; when the assignment is matched with the preset test mode mark, controlling the tested terminal to enter a test mode corresponding to the preset test mode mark; after the tested terminal is powered on, the tested terminal can quickly enter a preset test mode without the need of various operations of testers, and the terminal test efficiency can be effectively improved.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a testing method and related equipment.
Background
The modern mobile communication product or wireless communication module needs to perform various functional tests before shipment, different functional tests are performed by different stations, such as downloading, calibrating, number writing, Man-Machine-Interface (MMI) tests (for example, testing an earphone, a screen, a key, Camera and the like), and the like, and the functional tests of the different stations all need a computer to send corresponding commands to a tested terminal (such as a mobile phone and the like) through a USB or a serial port to enter a required test mode.
Disclosure of Invention
The embodiment of the invention provides a testing method and related equipment, which can improve the testing efficiency of a terminal.
In a first aspect, an embodiment of the present invention provides a testing method, applied to a tested terminal of a terminal testing system, including:
after the tested terminal is electrified, obtaining the assignment of a test mode flag bit in the tested terminal;
and when the assignment is matched with a preset test mode mark, controlling the tested terminal to enter a test mode corresponding to the preset test mode mark.
Optionally, the system further includes a master control terminal, and the method further includes:
receiving a first query instruction of the master control terminal, wherein the first query instruction is used for querying whether the tested terminal enters a test mode;
responding to the first query instruction to send a first response message to the master control terminal, wherein the first response message indicates that the tested terminal enters a test mode;
receiving a second query instruction of the master control terminal, wherein the second query instruction is used for querying a current test mode of the terminal to be tested;
responding to the second query instruction to send test mode information corresponding to the preset test mode mark to the main control terminal;
receiving a test instruction sent by the main control terminal according to the test mode information;
and executing the test operation corresponding to the test instruction.
Optionally, the method further comprises:
receiving a configuration instruction sent by the main control terminal, wherein the configuration instruction comprises a preconfigured test mode mark;
and responding to the configuration instruction, and modifying the assignment of the test mode zone bit into the preconfigured test mode mark.
Optionally, when the assignment matches a preset test mode flag,
setting the position of the test mode mark as a normal starting mode mark, and controlling the tested terminal to enter a test mode corresponding to the preset test mode mark;
alternatively, the first and second electrodes may be,
and controlling the tested terminal to enter a test mode corresponding to the preset test mode mark, and marking the test mode mark as a normal starting mode mark.
Optionally, the method further comprises:
and when the assignment is not matched with a preset test mode mark or the assignment is null, the tested terminal responds to the first query instruction and sends a second response message to the main control terminal, wherein the second response message indicates that the tested terminal does not enter the test mode.
In a second aspect, an embodiment of the present invention provides a testing apparatus, which is applied to a terminal to be tested of a terminal testing system, where the testing apparatus includes:
the obtaining module is used for obtaining the assignment of the test mode zone bit in the tested terminal after the tested terminal is electrified;
and the control module is used for controlling the tested terminal to enter a test mode corresponding to the preset test mode mark when the assignment is matched with the preset test mode mark.
Optionally, the system further includes a master control terminal, and the apparatus further includes:
the receiving module is used for receiving a first query instruction of the master control terminal, wherein the first query instruction is used for querying whether the tested terminal enters a test mode or not;
a sending module, configured to send a first response message to the master control terminal in response to the first query instruction, where the first response message indicates that the terminal under test has entered a test mode;
the receiving module is further configured to receive a second query instruction of the master control terminal, where the second query instruction is used to query a current test mode of the terminal to be tested;
the sending module is further configured to send test mode information corresponding to the preset test mode flag to the master control terminal in response to the second query instruction;
the receiving module is further configured to receive a test instruction sent by the main control terminal according to the test mode information;
and the execution module is used for executing the test operation corresponding to the test instruction.
Optionally, the apparatus further comprises:
the receiving module is further configured to receive a configuration instruction sent by the main control terminal, where the configuration instruction includes a preconfigured test mode flag;
and the modification module is used for responding to the configuration instruction and modifying the assignment of the test mode zone bit into the preconfigured test mode mark.
In a third aspect, an embodiment of the present invention provides a terminal to be tested, including: a processor and a memory;
the processor is connected to the memory, wherein the memory is configured to store program codes, and the processor is configured to call the program codes to execute the test method according to the first aspect.
In a fourth aspect, embodiments of the present invention provide a computer storage medium storing a computer program comprising program instructions that, when executed by a processor, perform a test method according to the first aspect.
In the embodiment of the invention, after the tested terminal is electrified, the assignment of the test mode flag bit in the tested terminal is obtained; when the assignment is matched with the preset test mode mark, controlling the tested terminal to enter a test mode corresponding to the preset test mode mark; after the tested terminal is powered on, the tested terminal can quickly enter a preset test mode without the need of various operations of testers, and the terminal test efficiency can be effectively improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a test system according to an embodiment of the present invention;
FIG. 2 is a flow chart of a testing method according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a test system according to an embodiment of the present invention;
FIG. 4 is a flow chart of a testing method according to an embodiment of the present invention;
FIG. 5 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention;
fig. 6 is a schematic structural diagram of a terminal under test according to an embodiment of the present invention.
Detailed Description
The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
It should be understood that the terms "first," "second," and the like in the description and claims of this application and in the drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.
Reference in the specification to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the invention. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by the person skilled in the art that the described embodiments of the invention can be combined with other embodiments.
In the prior art, when stations with different test functions test a terminal to be tested, a computer is required to send corresponding commands to the terminal to be tested (such as a mobile phone and the like) through a USB or a serial port to enter a required test mode, and particularly, when the whole machine tests an MMI, the test is started only by manually starting up the machine and then inputting a long string of secret codes, so that a large amount of time consumed by non-test is wasted, and the test efficiency of the terminal is very low. Therefore, the testing method can quickly enter the preset testing mode when the testing starts, the time required for entering the testing mode is saved, the testing time cost is reduced, and the testing efficiency of the terminal is effectively improved.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present invention; the test system in the present application includes a main control terminal 101 and a terminal under test 102, and in some embodiments, the system may further include an auxiliary test terminal 103.
The main control terminal 101 is used as a main control center of the test system, and is configured to control a test process, and receive and process data of the terminal under test 102 or the auxiliary test terminal 103 to obtain a test result. Specifically, the main control terminal 101 may employ a computer, a notebook computer, or the like.
The terminal 102 to be tested refers to a terminal or a module, such as a mobile phone, a smart watch, a sports bracelet, a smart speaker, or a communication module with an antenna. The antenna may include a radio frequency antenna or a WCN (wireless connectivity Network) antenna, such as a GPS antenna, a WiFi antenna, a bluetooth antenna, an NFC antenna, a ZigBee antenna, and the like.
The auxiliary test terminal 103 may be a test machine, or may be a test terminal composed of a plurality of test modules. The function of the system is to receive and process the signal of the tested terminal 102 to obtain a test index, and send the test index to the main control terminal 101; or transmitting a signal to the terminal under test 102 to assist in completing the antenna performance test of the terminal under test 102; or may have both functions of receiving and processing signals, as well as transmitting signals. The auxiliary test terminal 103 may include a wireless integrated tester or the like; the wireless integrated tester is used for testing the main performance indexes of various radio equipment. The device consists of a signal generator, a voltmeter, an electronic oscilloscope and the like.
Fig. 2 is a schematic flow chart of a testing method according to an embodiment of the present invention; the test method is applied to the tested terminal in the test system and comprises the following steps:
201. after the tested terminal is powered on, obtaining the assignment of the test mode zone bit in the tested terminal;
specifically, after a tested terminal is powered on, assignment of a test mode flag bit in the tested terminal is obtained; the assignment is preset, and can be preset after the terminal to be tested is initialized, or preset after the terminal to be tested completes any test, so that after the terminal is electrified again, the assignment of the flag bit of the test mode is read, and the terminal to be tested can be rapidly controlled to enter the preset test mode.
202. And when the assignment is matched with the preset test mode mark, controlling the tested terminal to enter a test mode corresponding to the preset test mode mark.
Specifically, different preset test mode flags correspond to different test modes, for example, 0x01 corresponds to a GSM calmode (i.e., GSM calibration mode), 0x02 corresponds to a GSM Final test mode (i.e., GSM Final test mode), and so on. The specific form of the preset test mode flag is not limited. And when the assignment is matched with the preset test mode mark, controlling the tested terminal to enter a test mode corresponding to the preset test mode mark.
Therefore, by utilizing the test mode zone bit, when the tested terminal is controlled to enter a desired test mode, the tested terminal can be controlled to quickly enter the test mode corresponding to the assignment of the zone bit by reading the assignment of the test mode zone bit, the time required for entering the test mode is effectively saved, the test efficiency is improved, and the test time cost is reduced. In the actual test process, each test station position can flexibly configure the test mode which needs to be entered by the next test station position.
In a possible embodiment, the system further includes a master control terminal, and after the terminal under test enters the test mode corresponding to the preset test mode flag, the method further includes:
s1, receiving a first query instruction of the master control terminal, wherein the first query instruction is used for querying whether the tested terminal enters a test mode;
specifically, the master control terminal and the tested terminal can be in wired or wireless connection, the wired connection mode comprises connection modes such as a USB (universal serial bus) or a serial port, and the wireless connection mode comprises connection modes such as Bluetooth connection and WiFi connection. After the communication connection is established between the main control terminal and the terminal to be tested, the main control terminal needs to acquire the current state of the terminal to be tested before the main control terminal starts to test the terminal to be tested. The command format of the first query instruction may be unlimited, such as "7E 000000000800 FE XX 7E".
S2, responding to the first query instruction, and sending a first response message to the main control terminal, wherein the first response message indicates that the tested terminal enters the test mode;
specifically, after the terminal under test has entered the test mode by using the method of fig. 2, the terminal under test sends a first response message to the main control terminal in response to the first query instruction, where the first response message indicates that the terminal under test has entered the test mode. The format of the first response message may be, for example, "7E 000000000800 FE FF 7E" without limitation.
S3, receiving a second query instruction of the master control terminal, wherein the second query instruction is used for querying the current test mode of the tested terminal;
specifically, after receiving the first response message, the main control terminal continues to send a second query instruction to the terminal to be tested, where the second query instruction is used to query the current test mode of the terminal to be tested. The command format of the second query instruction may not be limited, for example, "AT + GETTESTMODE? ".
S4, responding to the second query instruction, and sending test mode information corresponding to the preset test mode mark to the main control terminal;
specifically, the tested terminal responds to the second query instruction and sends test mode information corresponding to the preset test mode mark to the main control terminal, wherein the test mode information includes, for example, a GSM cal mode or a GSM Final test mode. The instruction format of the reply instruction of the terminal under test in response to the second query instruction may be unlimited, for example "+ GETTESTMODMODE: XXX" (XXX is specific test mode information, such as GSM cal mode).
S5, receiving a test instruction sent by the main control terminal according to the test mode information;
specifically, the main control terminal sends a test instruction corresponding to the test mode information to the terminal to be tested according to the received test mode information, where the test instruction may be more than one instruction.
And S6, executing the test operation corresponding to the test instruction.
Specifically, the terminal under test responds to the test instruction, executes the test operation corresponding to the test instruction, where the test operation may be to transmit or receive a signal, and the terminal under test receives and processes the signal to generate a test result and transmits the test result to the main control terminal. Or the signal may be transmitted by the terminal to be tested, and the auxiliary test terminal 103 in fig. 1 receives and processes the signal to obtain a test result, and then transmits the test result to the main control terminal. Steps S5 and S6 may be executed in a loop multiple times to complete all test operations in the test mode.
In summary, after the terminal under test enters the preset test mode by using the method of fig. 2, the main control terminal interacts with the terminal under test to obtain the test mode, so as to enter the test flow of the test mode, thereby completing the test on the terminal under test.
In one possible embodiment, the method further comprises:
s7, receiving a configuration instruction sent by the main control terminal, wherein the configuration instruction comprises a preconfigured test mode mark;
specifically, the main control terminal sends a configuration instruction to the terminal to be tested in the process of testing the terminal to be tested in the corresponding test mode according to the test mode information or after the test is finished, wherein the configuration instruction comprises a preconfigured test mode mark for preconfiguring the test mode to be entered when the terminal is started next time.
And S8, responding to the configuration instruction, and modifying the assignment of the test mode zone bit into a pre-configured test mode mark.
Specifically, the terminal to be tested responds to the configuration instruction, and modifies the assignment of the flag bit of the test mode into a preconfigured test mode flag, for example, the test mode entered by using the method of fig. 2 is a GSM calibration mode, during a test process of the GSM calibration mode or after a test of the GSM calibration mode is completed, the main control terminal sends the configuration instruction to the terminal to be tested, where the configuration instruction includes 0x02, and then the terminal to be tested sets the flag bit of the test mode to 0x02, and the mode entered by the terminal to be tested when the terminal is turned on next time is a GSM final test mode.
The test mode to be entered after the next tested terminal is started is preset in the test process of the current station or after the test is completed, and the process is circulated until all test items are completed by the tested terminal.
In a possible embodiment, step 202 specifically includes:
2021. when the assignment is matched with the preset test mode mark, the position of the test mode mark is a normal starting mode mark, and the tested terminal is controlled to enter a test mode corresponding to the preset test mode mark;
specifically, when the assignment is matched with a preset test mode mark, the position of the test mode mark is a normal starting mode mark, and then the tested terminal is controlled to enter a test mode corresponding to the preset test mode mark; the Normal boot mode flag may be zero or other flag, and the mode information corresponding to the Normal boot mode is Normal boot mode.
Alternatively, the first and second electrodes may be,
2022. and when the assignment is matched with the preset test mode mark, controlling the tested terminal to enter a test mode corresponding to the preset test mode mark, and setting the test mode mark position as a normal starting mode mark.
Specifically, when the assignment matches the preset test mode flag, the terminal under test may also be controlled to enter the test mode corresponding to the preset test mode flag, and then the test mode flag is set as the normal power-on mode flag.
By using the method, when the tested terminal is matched with the preset test mode mark, the tested terminal is controlled to be in the normal starting mode mark before or after entering the test mode corresponding to the preset test mode mark, so that the test flexibility of the tested terminal can be enhanced. In a possible embodiment, after the test flow of the current station is finished, the test mode flag bit (at this time, the flag bit is a normal boot mode flag) can be kept unchanged, and then the terminal to be tested enters a normal boot mode after the terminal to be tested is booted next time, so that the independence among the test stations can be effectively guaranteed; the method can also effectively avoid that after the current station position is finished, a tester forgets to configure the test mode to be entered by next starting, so that the tested terminal still stays in the last test mode after the next starting, and invalid test time is increased. The marking position is actively marked as a normal starting mode, when a tester forgets to configure the next test mode, the test mode can be configured by sending a configuration instruction after the tested terminal is normally started, or the test interaction is carried out by sending a test instruction after the tested terminal is started through a traditional test mode, so that the test operation is completed. In a possible embodiment, after the current station position is finished, the main control terminal sends a configuration instruction to configure a test mode to be entered by the terminal to be tested when the terminal is started next time, and the test mode flag bit is modified from a normal start mode flag to a test mode flag specified by the configuration instruction, so that the test mode configuration is flexible.
In a possible embodiment, after the terminal under test enters the preset test mode by using the method of fig. 2, and after the terminal under test interacts with the main control terminal to complete the corresponding test, the assignment of the flag bit of the test mode may not be modified, and the flag bit of the test mode is kept unchanged, so that the terminal under test still enters the original preset test mode after being started next time, and the relevance between the test station locations can be effectively ensured. Until the main control terminal sends a configuration instruction to modify the assignment of the test mode zone bit.
In one possible embodiment, the method further comprises:
and when the assignment is not matched with the preset test mode mark or the assignment is null, the tested terminal responds to the first query instruction and sends a second response message to the main control terminal, wherein the second response message indicates that the tested terminal does not enter the test mode.
Specifically, when the assignment is not matched with the preset test mode flag or the assignment is null, and the terminal to be tested receives the first query instruction, the terminal to be tested may respond to the first query instruction and send a second response message to the master control terminal, where the second response message indicates that the terminal to be tested does not enter the test mode. The format of the second response message is not particularly limited. The condition that the assignment does not match the preset test pattern flag includes assigning a normal pattern flag or assigning other flags, such as a reserved pattern flag (more than 1, such as any one or more of the reserved pattern flags between 0x17 and 0 xFF), where the reserved pattern flag is an undefined test pattern, and at this time, the pattern information of the reserved pattern may be reserved; the preset test mode mark is set for enhancing the test expansibility of the tested terminal, and a test mode can be added according to the test requirement. After the main control terminal receives the second response message,
in one possible embodiment, the method further comprises:
and when the assignment is not matched with the preset test mode mark or the assignment is null and the tested terminal does not receive the first query instruction, the main control terminal can perform test interaction by sending a test instruction to the tested terminal in a traditional test mode so as to complete the test operation of the tested terminal.
The following description will be made by taking the tested terminal as a mobile phone as an example:
referring to fig. 3 and fig. 4, fig. 3 is a schematic structural diagram of a test system according to an embodiment of the present invention, and fig. 4 is a schematic flow chart of a test method according to an embodiment of the present invention; the main control terminal is a computer 301 as an example, the tested terminal is a mobile phone 303 as an example, the auxiliary test terminal is a wireless integrated tester 302 as an example, the wireless integrated tester 302 is connected with the computer 301 through a GPIB bus, and the wireless integrated tester 302 performs signal transmission and signal reception through a radio frequency cable or a coupling circuit board.
1. Firstly, at a download station, initializing each test mode, a corresponding number (i.e., a preset test mode flag) and a mode to be entered after starting up (i.e., assignment of a set mode flag) into a flag partition michrdata of a Flash (Flash) of the mobile phone 303 through a configuration file (or other manners), wherein information of the configuration file is as follows:
[Next Boot Mode]
；Enable:0:disable；1:enable
Enable＝1
SupportFeaturePhone＝0
next Mode 0x0# test Mode flag bit Next Mode
(ii) a 0x00normal boot mode # Normal boot mode
(ii) a 0x01GSM cal mode # GSM calibration mode
(ii) a 0x02GSM Final test mode # GSM Final test mode
(ii) a 0x03Wcdma cal mode # Wcdma calibration mode
(ii) a 0x04 Wcdmamonal testmode # Wcdma final test mode
(ii) a 0x05TDscdma cal mode # TDscdma calibration mode
(ii) a 0x06TDscdmaFinal test mode # TDscdma final test mode
(ii) a 0x07LTE TDD cal mode # LTE TDD calibration mode
(ii) a 0x08LTE TDDFinal test mode # LTE TDD final test mode
(ii) a 0x09LTE FDD cal mode # LTE FDD calibration mode
(ii) a 0x0ALTE FDDFinal test mode # LTE FDD final test mode
(ii) a 0x0BNR 5g sub6g cal mode # NR 5g sub6g calibration pattern
(ii) a 0x0CNR 5g sub6gFinal test mode # NR 5g sub6g final test pattern
；0x0DNR mmW
(ii) a 0x0ENR mmWFinal testmode # NR mmW final test mode
(ii) a 0x0FCDMA2K cal mode # CDMA2K calibration mode
(ii) a 0x10CDMA2KFinal test mode # CDMA2K final test mode
；0x11BBAT mode
；0x12native MMI mode(MMI for feature phone)
；0x13Apk MMI(apply for smartphone)
(ii) a 0x14NB-IOT calmode # NB-IOT calibration mode
(ii) a 0x15NB-IOT final test mode # NB-IOT final test pattern
(ii) a 0x16UPT # UPT mode
(ii) a 0x 17-0 xFF reserved # reservation mode
Wherein the numbers 0x01-0x16 correspond to different test patterns respectively. When a station is downloaded for testing, the mobile phone 303 is initialized by downloading a configuration file, and then a test mode flag bit "Next boot mode" is set, that is, "Next boot mode" is 0xXX "(XX represents different test mode numbers, which correspond to different test modes one by one), and then the mobile phone 303 is turned off and enters the Next test station.
2. When the mobile phone reaches the next test station, the uboot code reads the value of the 'nextboot mode' stored in the misdata partition after the mobile phone is started, and the mobile phone automatically enters the mode after reading the value of the corresponding mode.
If the value is not ' 0 ' or reserved ' and is a legal defined Next boot mode parameter, the uboot changes the parameter to ' 0 ' and stores the parameter in the iscdata partition, and the quick entry mode flow is carried out, so that the mobile phone enters a test mode corresponding to the value read by starting.
If the Next boot mode value is "0 or reserved" or the flag bit is empty, the software still goes through a normal work flow, for example, goes through a normal boot or a normal command to enter a certain test mode, which mode is specifically gone, and specifically, whether a first query instruction of the computer is received is determined, for details, see the description of the point (c) in the step 3 below.
3. First, in the first situation, the mobile phone 303 already enters the corresponding test mode, if the tester plugs in the USB cable to connect the computer 301 and the mobile phone 303 at this time, and the computer 301 sends the first query instruction to the mobile phone 303, the mobile phone 303 returns the first response message to the computer, for example:
PC->MS 7E 00 00 00 00 08 00 FE XX 7E
MS->PC 7E 00 00 00 00 08 00 FE FF 7E
after receiving the reply from the mobile phone 303, the computer 301 sends a second query instruction to query the current test mode of the mobile phone 303, for example, to query the current working mode of the mobile phone through an AT command, such as:
-->:AT+GETTESTMODE？
<--:+GETTESTMODE:XXX
<--:OK
the computer 301 directly enters the corresponding mode for testing after inquiring the corresponding mode. After the test is finished, the computer (configured in advance) modifies the assignment of the flag bit of the test mode, sets the test mode directly entered after the next station is started, and prepares for the next station to quickly enter the corresponding test mode. The next test station still operates according to the execution steps of the first point in the steps 2 and 3, and all test items of the mobile phone 303 can be completed by circulating the steps.
And secondly, in the second case, the Next boot mode value is 0 or reserved or the flag bit is empty, that is, the preset test mode mark is not matched, if at this time, a tester is plugged in a USB line to connect the computer 301 and the mobile phone 303, the computer 301 sends a first query instruction to the mobile phone 303, the mobile phone 303 returns a second response message to the computer 301, and the computer 301 tests the mobile phone 303 through a traditional test mode, that is, the test instruction is sent through interaction of a USB interface, so that the test is completed.
In the third case, the Next boot mode value is "0 or reserved" or the flag bit is empty, that is, the preset test mode flag is not matched, and if the computer 301 does not send the first query instruction to the mobile phone 303, the mobile phone 303 goes to the normal boot mode.
Referring to fig. 3 and 4, the mobile phone enters the preset test mode quickly by initializing and presetting the test mode flag bit, so that the test efficiency of the tested terminals such as the mobile phone is effectively improved.
Based on the description of the foregoing testing method embodiment, an embodiment of the present invention further discloses a testing apparatus, and referring to fig. 5, fig. 5 is a schematic structural diagram of the testing apparatus provided in the embodiment of the present invention, where the testing apparatus is applied to a tested terminal of a terminal testing system, and the testing apparatus includes:
an obtaining module 501, configured to obtain assignment of a test mode flag bit in a terminal to be tested after the terminal to be tested is powered on;
and the control module 502 is configured to control the tested terminal to enter a test mode corresponding to the preset test mode flag when the assignment matches the preset test mode flag.
In a possible embodiment, the system further includes a master control terminal, and the apparatus further includes:
the receiving module is used for receiving a first query instruction of the master control terminal, wherein the first query instruction is used for querying whether the tested terminal enters a test mode or not;
the sending module is used for responding to the first query instruction and sending a first response message to the main control terminal, wherein the first response message indicates that the tested terminal enters the test mode;
the receiving module is also used for receiving a second query instruction of the main control terminal, and the second query instruction is used for querying the current test mode of the tested terminal;
the sending module is also used for responding to the second query instruction and sending test mode information corresponding to the preset test mode mark to the main control terminal;
the receiving module is also used for receiving a test instruction sent by the main control terminal according to the test mode information;
and the execution module is used for executing the test operation corresponding to the test instruction.
In one possible embodiment, the apparatus further comprises:
the receiving module is also used for receiving a configuration instruction sent by the main control terminal after the test is finished, and the configuration instruction comprises a preconfigured test mode mark;
and the modification module is used for responding to the configuration instruction and modifying the assignment of the test mode zone bit into a pre-configured test mode mark.
In a possible embodiment, the control module is specifically configured to, when the assignment matches the preset test mode flag, set the test mode flag position as a normal boot mode flag, and control the terminal under test to enter a test mode corresponding to the preset test mode flag;
alternatively, the first and second electrodes may be,
and the control module is specifically used for controlling the tested terminal to enter a test mode corresponding to the preset test mode mark when the assignment is matched with the preset test mode mark, and setting the test mode mark position as a normal starting mode mark.
In one possible embodiment, the apparatus further comprises:
and the sending module is further used for sending a second response message to the main control terminal by the tested terminal in response to the first query instruction when the assignment is not matched with the preset test mode mark or when the assignment is null, wherein the second response message indicates that the tested terminal does not enter the test mode.
It should be noted that, for a specific implementation manner of the function of the testing apparatus, reference may be made to the description of the testing method, and details are not described here. Each unit or module in the testing apparatus may be respectively or completely combined into one or several other units or modules to form the testing apparatus, or some unit(s) or module(s) therein may be further split into multiple units or modules with smaller functions to form the testing apparatus, which may implement the same operation without affecting the implementation of the technical effect of the embodiments of the present invention. The above units or modules are divided based on logic functions, and in practical applications, the functions of one unit (or module) may also be implemented by a plurality of units (or modules), or the functions of a plurality of units (or modules) may be implemented by one unit (or module).
Based on the description of the method embodiment and the device embodiment, the embodiment of the invention also provides a tested terminal.
Fig. 6 is a schematic structural diagram of a terminal under test according to an embodiment of the present invention. As shown in fig. 6, the testing apparatus described above may be applied to the terminal under test 600, and the terminal under test 600 may include: the processor 601, the network interface 604 and the memory 605, in addition, the terminal 600 under test may further include: a user interface 603, and at least one communication bus 602. Wherein a communication bus 602 is used to enable the connection communication between these components. The user interface 603 may include a Display (Display) and a Keyboard (Keyboard), and the selectable user interface 603 may also include a standard wired interface and a standard wireless interface. The network interface 604 may optionally include a standard wired interface, a wireless interface (e.g., WI-FI interface). The memory 605 may be a high-speed RAM memory or a non-volatile memory (e.g., at least one disk memory). The memory 605 may optionally be at least one storage device located remotely from the processor 601. As shown in fig. 6, the memory 605, which is a type of computer storage medium, may include therein an operating system, a network communication module, a user interface module, and a device control application program.
In the terminal 600 shown in fig. 6, the network interface 604 may provide a network communication function; and the user interface 603 is primarily an interface for providing input to a user; and processor 601 may be used to invoke the device control application stored in memory 605 to implement:
after the tested terminal is powered on, obtaining the assignment of the test mode zone bit in the tested terminal;
and when the assignment is matched with the preset test mode mark, controlling the tested terminal to enter a test mode corresponding to the preset test mode mark.
In a possible embodiment, the test system of the terminal under test includes a master control terminal, and the processor 601 further performs the following steps:
receiving a first query instruction of a master control terminal, wherein the first query instruction is used for querying whether a tested terminal enters a test mode or not;
responding to the first query instruction and sending a first response message to the main control terminal, wherein the first response message indicates that the tested terminal enters a test mode;
receiving a second query instruction of the master control terminal, wherein the second query instruction is used for querying the current test mode of the tested terminal;
responding to the second query instruction to send test mode information corresponding to the preset test mode mark to the main control terminal;
receiving a test instruction sent by the main control terminal according to the test mode information;
and executing the test operation corresponding to the test instruction.
In one possible embodiment, processor 601 further performs the steps of:
receiving a configuration instruction sent by a main control terminal, wherein the configuration instruction comprises a preconfigured test mode mark;
and responding to the configuration instruction, and modifying the assignment of the test mode zone bit into a pre-configured test mode mark.
In one possible embodiment, processor 601 specifically performs:
when the assignment matches a preset test pattern flag,
setting the mark position of the test mode as a normal starting mode mark, and controlling the tested terminal to enter a test mode corresponding to a preset test mode mark;
alternatively, the first and second electrodes may be,
and controlling the tested terminal to enter a test mode corresponding to the preset test mode mark, and setting the test mode mark position as a normal starting mode mark.
In one possible embodiment, processor 601 further performs:
and when the assignment is not matched with the preset test mode mark or the assignment is null, the tested terminal responds to the first query instruction and sends a second response message to the main control terminal, wherein the second response message indicates that the tested terminal does not enter the test mode.
It should be understood that the terminal under test 600 described in the embodiments of the present invention can perform the foregoing test method, and can also perform the foregoing test apparatus, which is not described herein again. In addition, the beneficial effects of the same method are not described in detail.
Further, here, it is to be noted that: an embodiment of the present invention further provides a computer storage medium, where the computer storage medium stores the aforementioned computer program executed by the testing apparatus, and the computer program includes program instructions, and when the processor executes the program instructions, the description of the testing method can be executed, so that details are not repeated herein. In addition, the beneficial effects of the same method are not described in detail. For technical details not disclosed in the embodiments of the computer storage medium to which the present invention relates, reference is made to the description of the method embodiments of the present invention.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by a computer program, which can be stored in a computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. The storage medium may be a magnetic disk, an optical disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), or the like.
The above disclosure is only for the purpose of illustrating the preferred embodiments of the present invention, and it is therefore to be understood that the invention is not limited by the scope of the appended claims.
Claims (10)
1. A test method is characterized in that the test method is applied to a tested terminal of a terminal test system and comprises the following steps:
after the tested terminal is electrified, obtaining the assignment of a test mode flag bit in the tested terminal;
and when the assignment is matched with a preset test mode mark, controlling the tested terminal to enter a test mode corresponding to the preset test mode mark.
2. The method of claim 1, wherein the system further comprises a master control terminal, and wherein the method further comprises:
receiving a first query instruction of the master control terminal, wherein the first query instruction is used for querying whether the tested terminal enters a test mode;
responding to the first query instruction to send a first response message to the master control terminal, wherein the first response message indicates that the tested terminal enters a test mode;
receiving a second query instruction of the master control terminal, wherein the second query instruction is used for querying a current test mode of the terminal to be tested;
responding to the second query instruction to send test mode information corresponding to the preset test mode mark to the main control terminal;
receiving a test instruction sent by the main control terminal according to the test mode information;
and executing the test operation corresponding to the test instruction.
3. The method of claim 2, further comprising:
receiving a configuration instruction sent by the main control terminal, wherein the configuration instruction comprises a preconfigured test mode mark;
and responding to the configuration instruction, and modifying the assignment of the test mode zone bit into the preconfigured test mode mark.
4. A method according to any of claims 1 to 3, wherein, when the assignment matches a preset test pattern flag,
setting the position of the test mode mark as a normal starting mode mark, and controlling the tested terminal to enter a test mode corresponding to the preset test mode mark;
alternatively, the first and second electrodes may be,
and controlling the tested terminal to enter a test mode corresponding to the preset test mode mark, and marking the test mode mark as a normal starting mode mark.
5. A method according to claim 2 or 3, characterized in that the method further comprises:
and when the assignment is not matched with a preset test mode mark or the assignment is null, the tested terminal responds to the first query instruction and sends a second response message to the main control terminal, wherein the second response message indicates that the tested terminal does not enter the test mode.
6. A testing device, applied to a terminal under test of a terminal testing system, the testing device comprising:
the obtaining module is used for obtaining the assignment of the test mode zone bit in the tested terminal after the tested terminal is electrified;
and the control module is used for controlling the tested terminal to enter a test mode corresponding to the preset test mode mark when the assignment is matched with the preset test mode mark.
7. The apparatus of claim 6, wherein the system further comprises a master control terminal, and wherein the apparatus further comprises:
the receiving module is used for receiving a first query instruction of the master control terminal, wherein the first query instruction is used for querying whether the tested terminal enters a test mode or not;
a sending module, configured to send a first response message to the master control terminal in response to the first query instruction, where the first response message indicates that the terminal under test has entered a test mode;
the receiving module is further configured to receive a second query instruction of the master control terminal, where the second query instruction is used to query a current test mode of the terminal to be tested;
the sending module is further configured to send test mode information corresponding to the preset test mode flag to the master control terminal in response to the second query instruction;
the receiving module is further configured to receive a test instruction sent by the main control terminal according to the test mode information;
and the execution module is used for executing the test operation corresponding to the test instruction.
8. The apparatus of claim 7, further comprising:
the receiving module is further configured to receive a configuration instruction sent by the main control terminal, where the configuration instruction includes a preconfigured test mode flag;
and the modification module is used for responding to the configuration instruction and modifying the assignment of the test mode zone bit into the preconfigured test mode mark.
9. A terminal under test, comprising: a processor and a memory;
the processor is connected to a memory, wherein the memory is configured to store program code and the processor is configured to call the program code to execute the test method according to any of claims 1-5.
10. A computer storage medium, characterized in that the computer storage medium stores a computer program comprising program instructions which, when executed by a processor, perform the test method according to any one of claims 1-5.
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