CN111638439A - Communication module testing method, device, computer equipment and storage medium - Google Patents
Communication module testing method, device, computer equipment and storage medium Download PDFInfo
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Abstract
The application relates to a communication module testing method, a communication module testing device, computer equipment and a storage medium. The method comprises the following steps: controlling the output level of the test bottom plate through the serial port, and triggering the level of an SIM card hot plug detection pin of a communication module connected with the test bottom plate to change when the output level changes so that the serial port generates SIM card information according to the changed level of the SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of an SIM card; and matching the hot plug state of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result. By adopting the method, the hot plug state of the SIM card can be simulated, the SIM card is prevented from being manually inserted and pulled out, the time and energy of testers are saved, the cost is reduced, the test efficiency is improved, in addition, the jitter can not be generated in the test process, and the stability of a module device is ensured.
Description
Technical Field
The present application relates to the field of computer technologies, and in particular, to a method and an apparatus for testing a communication module, a computer device, and a storage medium.
Background
With the development of computer networking and microcomputer hierarchical distributed application systems, the function of communication becomes more and more important. In order to ensure the stability of the communication function, the communication module is usually subjected to a stress test in the development and test stage. Most communication modules of the current intelligent mobile terminals support the hot plug function of the SIM card, so that the communication modules need to be subjected to pressure test of the hot plug of the SIM card.
At present, a SIM card hot plug pressure test method of a communication module is used for testing by manually inserting and pulling out an SIM card, however, the SIM card hot plug pressure test needs to be repeatedly tested for many times, occupies a large amount of time and energy of testers, is high in labor cost and low in efficiency, and easily generates jitter in the inserting and pulling-out processes of the SIM card, so that a module device is short-circuited.
Disclosure of Invention
In view of the above, it is desirable to provide a communication module testing method, apparatus, computer device and storage medium capable of reducing cost and improving testing efficiency.
A communication module testing method, the method comprising:
controlling the output level of a test bottom plate through a serial port, and triggering the level of an SIM card hot plug detection pin of a communication module connected with the test bottom plate to change when the output level changes so as to enable the serial port to generate SIM card information according to the changed level of the SIM card hot plug detection pin;
receiving the SIM card information, wherein the SIM card information comprises a hot plug state of an SIM card;
and matching the hot plug state of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result.
In one embodiment, the reporting time point carried by the SIM card information, the matching the hot plug status of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result includes:
acquiring a change time point of the output level;
calculating the reporting time point and the changing time point to obtain response time;
when the response time is smaller than a preset time interval, matching the hot plug state of the SIM card with the output level;
and when the matching is successful, obtaining the test result as that the test is passed.
In one embodiment, after the obtaining of the test result as a test passing when the matching is successful, the method further includes:
counting the change times of the output level, and taking the change times of the output level as the test times of the communication module;
and when the test times are smaller than a preset threshold value, returning to the step of controlling the output level of the test bottom plate through the serial port until the test times are equal to the preset threshold value.
In one embodiment, when the number of tests is smaller than a preset threshold, the step of controlling the output level of the test board through the serial port is returned until the number of tests is equal to the preset threshold, and the method further includes:
counting the number of times that the test result is passed;
and calculating the test passing rate of the communication module according to the test result as the number of test passing and the test number.
In one embodiment, before the controlling the output level of the test backplane through the serial port, the method further includes:
acquiring a preset period and a preset frequency;
the output level of the test bottom plate controlled by the serial port comprises:
and changing the output level according to the preset frequency in the preset period through the serial port.
In one embodiment, the reporting time point carried by the SIM card information, the matching the hot plug status of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result includes:
storing the SIM card information received in the preset period to obtain an SIM card information set;
reading the current change time point of the current output level in the preset period according to the time sequence;
searching a current reporting time point matched with the current change time point in the SIM information set according to a preset time interval;
acquiring the hot plug state of the current SIM card corresponding to the current reporting time point, and matching the hot plug state of the current SIM card with the current output level;
and when the matching is successful, obtaining the current test result of the communication module in the preset period as the test passing.
In one embodiment, after the obtaining of the current test result of the communication module in the preset period is passing when the matching is successful, the method further includes:
counting the number of times that the test result in the preset period passes the test;
calculating according to the preset period and the preset frequency to obtain the testing times in the preset period;
and calculating to obtain the test passing rate of the communication module in the preset period according to the test result as the number of test passing and the number of test times in the preset period.
A communication module testing apparatus, the apparatus comprising:
the output level control module is used for controlling the output level of the test bottom plate through a serial port, and when the output level is changed, the output level control module triggers the level of an SIM card hot plug detection pin of a communication module connected with the test bottom plate to be changed so that the serial port generates SIM card information according to the changed level of the SIM card hot plug detection pin;
the SIM card information receiving module is used for receiving the SIM card information, and the SIM card information comprises a hot plug state of an SIM card;
and the SIM card information detection module is used for matching the hot plug state of the SIM card with the output level and obtaining the test result of the communication module according to the matching result.
A computer device comprising a memory storing a computer program and a processor implementing the steps of the method described above when executing the computer program.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the above-mentioned method.
According to the communication module testing method, the communication module testing device, the computer equipment and the storage medium, the output level of the testing bottom plate is controlled through the serial port, when the output level changes, the level of the SIM card hot plug detection pin of the communication module connected with the testing bottom plate is triggered to change, so that the serial port generates SIM card information according to the changed level of the SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of an SIM card; the hot plug state of the SIM card is matched with the output level, the test result of the communication module is obtained according to the matching result, the hot plug state of the SIM card is simulated by triggering the change of the level of the hot plug detection pin of the SIM card, the SIM card is prevented from being manually inserted and pulled out, the time and the energy of testers are saved, the cost is reduced, the test efficiency is improved, in addition, the jitter cannot be generated in the test process, and the stability of a module device is ensured.
Drawings
FIG. 1 is a diagram of an exemplary implementation of a method for testing a communication module;
FIG. 2 is a flow diagram illustrating a method for testing a communication module according to one embodiment;
FIG. 3 is a flowchart illustrating a method for detecting SIM card information according to an embodiment;
FIG. 4 is a schematic flow chart illustrating a method for detecting SIM card information within a predetermined period according to an embodiment;
FIG. 5 is a flow chart illustrating a method for testing a communication module according to another embodiment;
FIG. 6 is a block diagram showing the structure of a communication module testing apparatus according to an embodiment;
FIG. 7 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
The communication module testing method provided by the application can be applied to the application environment shown in fig. 1. The Terminal 102 is connected to the test board 104 through a serial port, and a DTR (Data Terminal Ready) pin of the test board 104 is connected to a SIM _ DET (SIM _ Detector, SIM card hot plug detection) pin of the communication module.
The terminal 102 communicates with the server 104 via a network. The terminal 102 may be, but is not limited to, various personal computers, notebook computers and tablet computers, and the test board 104 may be, but is not limited to, various circuit boards.
Specifically, the terminal 102 controls the output level of the test backplane 104 through the serial port, and when the output level changes, the level of the SIM card hot plug detection pin of the communication module 106 connected to the test backplane 104 is triggered to change. And the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin. The terminal 102 receives SIM card information sent from the serial port, where the SIM card information includes a hot plug status of the SIM card. The terminal 102 matches the hot plug state of the SIM card with the output level, and obtains the test result of the communication module according to the matching result.
In one embodiment, as shown in fig. 2, a method for testing a communication module is provided, which is described by taking the method as an example for being applied to the terminal in fig. 1, and includes the following steps:
step 202, controlling the output level of the test base plate through the serial port, and when the output level changes, triggering the level of the SIM card hot plug detection pin of the communication module connected with the test base plate to change so that the serial port generates the SIM card information according to the changed level of the SIM card hot plug detection pin.
The testing bottom plate is connected with the communication module when the communication module is tested, is used as a medium between the terminal and the communication module, is used for controlling the communication module by the terminal, and can be a mobile phone circuit board. The communication module is used for providing a wireless communication function, and when the SIM card is correctly inserted into the communication module, wireless communication can be carried out. The communication module comprises a SIM _ DET pin for detecting the insertion and extraction of the SIM card.
Specifically, the terminal is connected to the test backplane through a serial port, such as a UART (Universal asynchronous receiver/Transmitter) serial port. After the connection is successful, the terminal can control the output level of the test backplane, for example, the output level of the DTR pin of the test backplane through the serial port. The DTR pin of the test bottom board is connected with the SIM _ DET pin of the communication module, and the power-on or power-off of the SIM _ DET pin can be controlled by controlling the output level of the DTR pin, so that the terminal can control the SIM _ DET pin.
Further, when the terminal changes the output level of the DTR pin of the test backplane, the level of the SIM _ DET pin on the communication module changes, either from power-up to power-down or from power-down to power-up. And the serial port generates the SIM card information according to the changed level of the SIM _ DET pin.
Step 204, receiving SIM card information, where the SIM card information includes a hot plug status of the SIM card.
The SIM card information is information detected by the SIM _ DET pin of the communication module, and includes a hot plug state of the SIM card, that is, an inserted state and an extracted state of the SIM card.
Specifically, after the serial port generates the SIM card information, the SIM card information is reported to the terminal in the form of AT instruction. For example, "+ SIM: Inserted" indicates a SIM card Inserted state, and "+ SIM: Removed" indicates a SIM card extracted state. And the terminal receives the SIM card information and learns the hot plug state of the SIM card detected by the SIM _ DET pin of the communication module.
And step 206, matching the hot plug state of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result.
The hot plug state of the SIM card comprises an SIM card inserting state and an SIM card extracting state. The output levels include a high level and a low level.
Specifically, the terminal matches the hot plug state of the SIM card with the output level. The output level corresponding to the inserted state of the SIM card is high level, and the output level corresponding to the pulled state of the SIM card is low level. When the hot plug state of the SIM card is successfully matched with the output level, obtaining a test result as test passing; and when the hot plug state of the SIM card is failed to be matched with the output level, obtaining a test result as that the test fails.
In one embodiment, the high level of the output level is 1.8V.
In the communication module testing method, the output level of the testing bottom plate is controlled through the serial port, and when the output level is changed, the level of an SIM card hot plug detection pin of a communication module connected with the testing bottom plate is triggered to be changed, so that the serial port generates SIM card information according to the changed level of the SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of an SIM card; the hot plug state of the SIM card is matched with the output level, the test result of the communication module is obtained according to the matching result, the hot plug state of the SIM card is simulated by triggering the change of the level of the hot plug detection pin of the SIM card, the SIM card is prevented from being manually inserted and pulled out, the time and the energy of testers are saved, the cost is reduced, the test efficiency is improved, in addition, the jitter cannot be generated in the test process, and the stability of a module device is ensured.
In an embodiment, the reporting time point is carried by the SIM card information, as shown in fig. 3, step 206 includes:
step 302, acquiring a change time point of an output level;
step 304, calculating the reporting time point and the changing time point to obtain response time;
step 306, when the response time is less than the preset time interval, matching the hot plug state of the SIM card with the output level;
and 308, when the matching is successful, obtaining a test result as that the test is passed.
And the reporting time point is the corresponding time point when the serial port reports the SIM card information to the terminal. The change time point is a corresponding time point when the terminal changes the output level. The response time is the time interval between the reporting time point and the change time point.
Specifically, after receiving the SIM card information reported by the serial port, the terminal may obtain the hot plug status of the SIM card and report the time point. The terminal acquires a change time point of the output level, and calculates a time interval between the reporting time point and the change time point to obtain a response time. When the response time is less than or equal to the preset time interval, the communication module can normally perform data transmission with the terminal, and the terminal matches the hot plug state of the SIM card with the output level. When the output level is high level and the hot plug state of the SIM card is the inserting state of the SIM card, or when the output level is low level and the hot plug state of the SIM card is the pulling state of the SIM card, the hot plug state of the SIM card is successfully matched with the output level, and the test result of the communication module is obtained and is passed. Otherwise, the obtained test result is that the test is failed.
Further, when the response time is greater than the preset time interval, it indicates that the communication module cannot normally perform data transmission with the terminal, and the obtained test result is that the test fails.
In this embodiment, by setting the preset time interval, when the response time is greater than the preset time interval, the test result directly obtained from the communication module is that the test fails, and when the response time is less than or equal to the preset time interval, the hot plug state of the SIM card is matched with the output level, so that the validity of the test can be ensured, and the accuracy of the test can be improved.
In one embodiment, after step 308, the method further comprises: counting the change times of the output level, and taking the change times of the output level as the test times of the communication module; and when the test times are less than the preset threshold value, returning to the step of controlling the output level of the test bottom plate through the serial port until the test times are equal to the preset threshold value.
Wherein the preset threshold is a preset threshold of the number of tests. Because only one test is relied on, and the test result obtained by one test is not accurate as the final test result of the communication module, the communication module needs to be tested for many times.
Specifically, the terminal counts the number of times of change of the output level, and takes the number of times of change of the output level as the number of times of testing of the communication module. And when the test times are less than the preset threshold value, the terminal continuously changes the output level of the test bottom plate through the serial port, and tests the communication module to obtain the test result of each time until the test times are equal to the preset threshold value.
In one embodiment, the method further comprises: counting the test result as the number of times of passing the test; and calculating to obtain the test passing rate of the communication module according to the test result as the number of times of passing the test and the number of times of testing.
Specifically, after the number of tests is equal to the preset threshold, the terminal counts the number of times that the test result is passed. And the terminal calculates the test result as the ratio of the number of times of passing the test to the number of times of testing to obtain the test passing rate of the communication module, and the test passing rate is used as the final test result of the communication module.
In this embodiment, the preset threshold, that is, the preset test time threshold, is set to test the communication module for multiple times, and the test passing rate is calculated according to the test result of the multiple tests, so that the accuracy of the test result can be ensured.
In one embodiment, prior to step 202, the method further comprises: and acquiring a preset period and a preset frequency. Step 202 comprises: and changing the output level according to the preset frequency in a preset period through the serial port.
Specifically, the terminal obtains a preset period and a preset frequency, and changes the output level according to the preset frequency in the preset period through the serial port. For example, if the preset period is 5 hours and the preset frequency is 1 minute, the terminal changes the output level every minute for 5 hours.
In one embodiment, when the SIM card information sent by the serial port is not received within the preset time interval, the terminal continues to change the output level according to the preset frequency.
In one embodiment, as shown in FIG. 4, step 206 comprises:
step 402, storing the SIM card information received in a preset period to obtain an SIM card information set;
step 404, reading a current change time point of the current output level in a preset period according to the time sequence;
step 408, acquiring the hot plug state of the current SIM card corresponding to the current reporting time point, and matching the hot plug state of the current SIM card with the current output level;
and step 410, when the matching is successful, obtaining the current test result of the communication module in the preset period as the test passing.
Specifically, the terminal stores the received SIM card information in a preset period to obtain an SIM card information set. And reading the current change time point of the current output level by the terminal in a preset period according to the time sequence. And the terminal searches the current reporting time point matched with the current change time point in the SIM information set according to the preset time interval. The matching conditions of the current change time point and the current reporting time point are as follows: (1) the current reporting time point is after the current change time point; (2) the time interval between the current reporting time point and the current changing time point is less than or equal to the preset time interval. In particular, the preset time interval is smaller than the inverse of the preset frequency. Thus, the current change time point has at most one matching current reporting time point.
In one embodiment, after the terminal completes the test of the preset period, the terminal reads and outputs the current change time point one by one according to the time sequence to perform matching calculation, so as to obtain each test result.
In an embodiment, the terminal may also read the current change time point for performing the matching calculation every time a test is completed within a preset period, so as to obtain the current test result.
Further, after the terminal finds the current reporting time point matched with the current changing time point, the hot plug state of the current SIM card corresponding to the current reporting time point is obtained, and the hot plug state of the current SIM card is matched with the current output level. And when the matching is successful, the terminal obtains the current test result of the communication module in the preset period as the test passing.
In one embodiment, when the terminal fails to find the current reporting time point matching the current change time point, the current test result is obtained as a test failure.
In one embodiment, after step 410, the method further comprises: counting the number of times that the test result in a preset period passes the test; calculating according to a preset period and a preset frequency to obtain the number of testing times in the preset period; and calculating to obtain the test passing rate of the communication module in the preset period according to the test result which is the number of times of passing the test and the number of times of testing in the preset period.
Specifically, the terminal counts the number of times that the test result in the preset period passes the test. And the terminal calculates the product of the preset period and the preset frequency to obtain the test times in the preset period, and then calculates the test result as the ratio of the test passing times to the test times in the preset period to obtain the test passing rate of the communication module in the preset period.
In this embodiment, by setting a preset period and a preset frequency, the communication module is tested for multiple times in the preset period, and the test passing rate is calculated according to the test results of the multiple tests, so that the accuracy of the test results can be ensured.
In one embodiment, as shown in fig. 5, another communication module testing method is provided, which is described by taking the example that the method is applied to the terminal in fig. 1, and includes the following steps:
step 502, acquiring a preset period and a preset frequency;
step 504, changing an output level according to a preset frequency in a preset period through a serial port;
step 506, when the output level changes, triggering the test bottom board to change the level of an SIM card hot plug detection pin of a communication module connected with the test bottom board, so that the serial port generates SIM card information according to the changed level of the SIM card hot plug detection pin;
step 508, receiving SIM card information, the SIM card information including hot plug status and reporting time point of the SIM card;
step 510, storing the SIM card information received in a preset period to obtain an SIM card information set;
step 512, reading a current change time point of the current output level in a preset period according to the time sequence;
step 514, according to the preset time interval, searching the current reporting time point matched with the current change time point in the SIM information set;
step 516, acquiring the hot plug state of the current SIM card corresponding to the current reporting time point, and matching the hot plug state of the current SIM card with the current output level;
518, when the matching is successful, obtaining the current test result of the communication module in the preset period as the test passing;
step 520, counting the number of times that the test result in the preset period passes the test;
step 522, calculating to obtain the test times in the preset period according to the preset period and the preset frequency;
step 524, calculating to obtain the test passing rate of the communication module in the preset period according to the test result as the number of test passes and the number of test passes in the preset period.
In the embodiment, the hot plug state of the SIM card is simulated by triggering the change of the level of the hot plug detection pin of the SIM card, so that the SIM card is prevented from being manually inserted and pulled out, the time and the energy of testers are saved, the cost is reduced, the test efficiency is improved, no jitter is generated in the test process, and the stability of a module device is ensured; and a preset period and a preset frequency are set, the communication module is tested for many times in the preset period, and the test passing rate is calculated according to the test results of the many times of tests, so that the accuracy of the test results is ensured.
It should be understood that although the various steps in the flow charts of fig. 2-5 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 2-5 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed in turn or alternately with other steps or at least some of the other steps.
In one embodiment, as shown in fig. 6, there is provided a communication module testing apparatus 600 comprising: an output level control module 601, a SIM card information receiving module 602, and a SIM card information detecting module 603, wherein:
the output level control module 601 is used for controlling the output level of the test base plate through the serial port, and when the output level changes, the level of an SIM card hot plug detection pin of a communication module connected with the test base plate is triggered to change, so that the serial port generates SIM card information according to the changed level of the SIM card hot plug detection pin;
a SIM card information receiving module 602, configured to receive SIM card information, where the SIM card information includes a hot plug status of a SIM card;
the SIM card information detecting module 603 is configured to match the hot plug status of the SIM card with the output level, and obtain a test result of the communication module according to the matching result.
In one embodiment, the SIM card information carries a reporting time point, and the SIM card information detecting module 603 is further configured to obtain a change time point of the output level; calculating the reporting time point and the changing time point to obtain response time; when the response time is less than the preset time interval, matching the hot plug state of the SIM card with the output level; and when the matching is successful, obtaining a test result as test passing.
In one embodiment, the communication module testing apparatus 600 further includes a test number counting module 604 for counting the number of times of changing the output level, and taking the number of times of changing the output level as the number of times of testing the communication module; and when the test times are less than the preset threshold value, returning to the step of controlling the output level of the test bottom plate through the serial port until the test times are equal to the preset threshold value.
In one embodiment, the communication module testing apparatus 600 further includes a test passing rate calculating module 605 for counting the number of times that the test result is passed; and calculating to obtain the test passing rate of the communication module according to the test result as the number of times of passing the test and the number of times of testing.
In one embodiment, the communication module testing apparatus 600 further includes an obtaining module 606 for obtaining the preset period and the preset frequency.
In one embodiment, the output level control module 601 is further configured to change the output level according to a preset frequency in a preset period through a serial port.
In an embodiment, the SIM card information detection module 603 is further configured to store the SIM card information received in a preset period, so as to obtain an SIM card information set; reading a current change time point of a current output level in a preset period according to the time sequence; according to a preset time interval, searching a current reporting time point matched with a current change time point in an SIM information set; acquiring the current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with the current output level; and when the matching is successful, obtaining the current test result of the communication module in the preset period as the test passing.
In one embodiment, the test passing rate calculation module 605 is further configured to count the number of times that the test result passes the test in a preset period; calculating according to a preset period and a preset frequency to obtain the number of testing times in the preset period; and calculating to obtain the test passing rate of the communication module in the preset period according to the test result which is the number of times of passing the test and the number of times of testing in the preset period.
For the specific definition of the communication module testing device, reference may be made to the above definition of the communication module testing method, which is not described herein again. Each module in the communication module testing apparatus may be wholly or partially implemented by software, hardware, or a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 7. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless communication can be realized through WIFI, an operator network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement a communication module testing method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the architecture shown in fig. 7 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory and a processor, the memory having a computer program stored therein, the processor implementing the following steps when executing the computer program: controlling the output level of the test bottom plate through the serial port, and triggering the level of an SIM card hot plug detection pin of a communication module connected with the test bottom plate to change when the output level changes so that the serial port generates SIM card information according to the changed level of the SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of an SIM card; and matching the hot plug state of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result.
In one embodiment, the processor, when executing the computer program, further performs the steps of: acquiring a change time point of an output level; calculating the reporting time point and the changing time point to obtain response time; when the response time is less than the preset time interval, matching the hot plug state of the SIM card with the output level; and when the matching is successful, obtaining a test result as test passing.
In one embodiment, the processor, when executing the computer program, further performs the steps of: counting the change times of the output level, and taking the change times of the output level as the test times of the communication module; and when the test times are less than the preset threshold value, returning to the step of controlling the output level of the test bottom plate through the serial port until the test times are equal to the preset threshold value.
In one embodiment, the processor, when executing the computer program, further performs the steps of: counting the test result as the number of times of passing the test; and calculating to obtain the test passing rate of the communication module according to the test result as the number of times of passing the test and the number of times of testing.
In one embodiment, the processor, when executing the computer program, further performs the steps of: acquiring a preset period and a preset frequency; and changing the output level according to the preset frequency in a preset period through the serial port.
In one embodiment, the processor, when executing the computer program, further performs the steps of: storing the SIM card information received in a preset period to obtain an SIM card information set; reading a current change time point of a current output level in a preset period according to the time sequence; according to a preset time interval, searching a current reporting time point matched with a current change time point in an SIM information set; acquiring the current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with the current output level; and when the matching is successful, obtaining the current test result of the communication module in the preset period as the test passing.
In one embodiment, the processor, when executing the computer program, further performs the steps of: counting the test result as the number of times of passing the test in a preset period; calculating according to a preset period and a preset frequency to obtain the number of testing times in the preset period; and calculating to obtain the test passing rate of the communication module in the preset period according to the test result which is the number of times of passing the test and the number of times of testing in the preset period.
In one embodiment, a computer-readable storage medium is provided, having a computer program stored thereon, which when executed by a processor, performs the steps of: controlling the output level of the test bottom plate through the serial port, and triggering the level of an SIM card hot plug detection pin of a communication module connected with the test bottom plate to change when the output level changes so that the serial port generates SIM card information according to the changed level of the SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of an SIM card; and matching the hot plug state of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result.
In one embodiment, the computer program when executed by the processor further performs the steps of: acquiring a change time point of an output level; calculating the reporting time point and the changing time point to obtain response time; when the response time is less than the preset time interval, matching the hot plug state of the SIM card with the output level; and when the matching is successful, obtaining a test result as test passing.
In one embodiment, the computer program when executed by the processor further performs the steps of: counting the change times of the output level, and taking the change times of the output level as the test times of the communication module; and when the test times are less than the preset threshold value, returning to the step of controlling the output level of the test bottom plate through the serial port until the test times are equal to the preset threshold value.
In one embodiment, the computer program when executed by the processor further performs the steps of: counting the test result as the number of times of passing the test; and calculating to obtain the test passing rate of the communication module according to the test result as the number of times of passing the test and the number of times of testing.
In one embodiment, the computer program when executed by the processor further performs the steps of: acquiring a preset period and a preset frequency; and changing the output level according to the preset frequency in a preset period through the serial port.
In one embodiment, the computer program when executed by the processor further performs the steps of: storing the SIM card information received in a preset period to obtain an SIM card information set; reading a current change time point of a current output level in a preset period according to the time sequence; according to a preset time interval, searching a current reporting time point matched with a current change time point in an SIM information set; acquiring the current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with the current output level; and when the matching is successful, obtaining the current test result of the communication module in the preset period as the test passing.
In one embodiment, the computer program when executed by the processor further performs the steps of: counting the test result as the number of times of passing the test in a preset period; calculating according to a preset period and a preset frequency to obtain the number of testing times in the preset period; and calculating to obtain the test passing rate of the communication module in the preset period according to the test result which is the number of times of passing the test and the number of times of testing in the preset period.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database or other medium used in the embodiments provided herein can include at least one of non-volatile and volatile memory. Non-volatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical storage, or the like. Volatile Memory can include Random Access Memory (RAM) or external cache Memory. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A method for testing a communication module, the method comprising:
controlling the output level of a test bottom plate through a serial port, and triggering the level of an SIM card hot plug detection pin of a communication module connected with the test bottom plate to change when the output level changes so as to enable the serial port to generate SIM card information according to the changed level of the SIM card hot plug detection pin;
receiving the SIM card information, wherein the SIM card information comprises a hot plug state of an SIM card;
and matching the hot plug state of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result.
2. The method of claim 1, wherein the SIM card information carries a reporting time point, the matching the hot plug status of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result comprises:
acquiring a change time point of the output level;
calculating the reporting time point and the changing time point to obtain response time;
when the response time is smaller than a preset time interval, matching the hot plug state of the SIM card with the output level;
and when the matching is successful, obtaining the test result as that the test is passed.
3. The method of claim 2, wherein after said obtaining said test result as a test pass when said matching is successful, said method further comprises:
counting the change times of the output level, and taking the change times of the output level as the test times of the communication module;
and when the test times are smaller than a preset threshold value, returning to the step of controlling the output level of the test bottom plate through the serial port until the test times are equal to the preset threshold value.
4. The method according to claim 3, wherein when the number of tests is less than a preset threshold, returning to the step of controlling the output level of the test backplane through the serial port until the number of tests is equal to the preset threshold, the method further comprises:
counting the number of times that the test result is passed;
and calculating the test passing rate of the communication module according to the test result as the number of test passing and the test number.
5. The method of claim 1, wherein prior to said controlling the output level of the test backplane via the serial port, the method further comprises:
acquiring a preset period and a preset frequency;
the output level of the test bottom plate controlled by the serial port comprises:
and changing the output level according to the preset frequency in the preset period through the serial port.
6. The method of claim 5, wherein the reporting time point is carried by SIM card information, the matching the hot-plug status of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result comprises:
storing the SIM card information received in the preset period to obtain an SIM card information set;
reading the current change time point of the current output level in the preset period according to the time sequence;
searching a current reporting time point matched with the current change time point in the SIM information set according to a preset time interval;
acquiring the hot plug state of the current SIM card corresponding to the current reporting time point, and matching the hot plug state of the current SIM card with the current output level;
and when the matching is successful, obtaining the current test result of the communication module in the preset period as the test passing.
7. The method according to claim 6, wherein after the current test result of the communication module in a preset period is passed when the matching is successful, the method further comprises:
counting the number of times that the test result in the preset period passes the test;
calculating according to the preset period and the preset frequency to obtain the testing times in the preset period;
and calculating to obtain the test passing rate of the communication module in the preset period according to the test result as the number of test passing and the number of test times in the preset period.
8. A communication module testing apparatus, the apparatus comprising:
the output level control module is used for controlling the output level of the test bottom plate through a serial port, and when the output level is changed, the output level control module triggers the level of an SIM card hot plug detection pin of a communication module connected with the test bottom plate to be changed so that the serial port generates SIM card information according to the changed level of the SIM card hot plug detection pin;
the SIM card information receiving module is used for receiving the SIM card information, and the SIM card information comprises a hot plug state of an SIM card;
and the SIM card information detection module is used for matching the hot plug state of the SIM card with the output level and obtaining the test result of the communication module according to the matching result.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 7.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 7.
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