CN111552599A - Distributed process processing system, semiconductor aging test method and system and distributed system - Google Patents
Distributed process processing system, semiconductor aging test method and system and distributed system Download PDFInfo
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Abstract
The invention discloses a distributed process processing system, a semiconductor aging test method and system and a distributed system, wherein the distributed process processing system comprises: the first-level node management module is used for managing first-level nodes and storing corresponding relations between the first-level nodes and second-level nodes, wherein the management logic board is used as the first-level nodes, the test logic board is used as the second-level nodes, and each second-level node comprises a plurality of test units; and the plurality of secondary node management modules are used for managing the corresponding secondary nodes and the test processes corresponding to the secondary nodes and storing the corresponding relation between the secondary nodes and the test processes, wherein each test process corresponds to one test unit and is used for running the test case of the test unit.
Description
Technical Field
The invention relates to the field of semiconductor memory testing, in particular to a distributed process processing system, a semiconductor aging testing method and system and a distributed system.
Background
Semiconductor memory (semi-conductor memory) is an important component in modern digital systems, especially computer systems, and as the integration of semiconductor memory is higher and higher, the size of semiconductor device grains is smaller and smaller, and the failure rate of semiconductor devices is increased. Reliability and stability of semiconductor memory devices require test verification in various different test equipment. The semiconductor memory burn-in test apparatus is an apparatus for testing semiconductor memory devices at different extreme temperatures and for a long time.
In the development and design of the existing semiconductor memory aging test equipment, a test system usually adopts a single-process management mode, so that the problem of operation stability exists.
Disclosure of Invention
The invention provides a distributed process processing system, a semiconductor aging test method and system and a distributed system, which are used for solving or at least partially solving the problem of instability in the prior art.
In order to solve the above technical problem, a first aspect of the present invention provides a distributed process processing system, which is applied to a semiconductor memory aging test system, where the semiconductor memory aging test system includes a management logic board and a test logic board, and the distributed process processing system includes:
the first-level node management module is used for managing first-level nodes and storing corresponding relations between the first-level nodes and second-level nodes, wherein the management logic board is used as the first-level nodes, the test logic board is used as the second-level nodes, and each second-level node comprises a plurality of test units;
and the plurality of second-level node management modules are used for managing the corresponding second-level nodes and the test processes corresponding to the second-level nodes and storing the corresponding relation between the second-level nodes and the test processes, wherein each test process corresponds to one test unit and is used for running the test case of the test unit.
Based on the same inventive concept, a second aspect of the present invention provides a distributed process processing method, including:
the management logic board is used as a primary node, the test logic board is used as a secondary node, the primary node is managed through a primary node management module, and the corresponding relation between the primary node and the secondary node is stored, wherein each secondary node comprises a plurality of test units;
managing corresponding secondary nodes and test processes corresponding to the secondary nodes through a secondary node management module, and storing corresponding relations between the secondary nodes and the test processes;
and allocating a test process for each test unit, and operating the test example of the test unit according to the corresponding relation between the primary node and the secondary node and the corresponding relation between the secondary node and the test process.
Based on the same inventive concept, a third aspect of the present invention provides a testing method for a distributed process processing system according to the first aspect, including:
creating a primary node management process through a primary node management module, and creating a secondary node management process through a secondary node management module;
the primary node management process sends a starting command to the secondary node management process so that the secondary node management process starts a corresponding test process based on the starting command and returns a starting completion message, wherein each test process corresponds to one test unit;
and the primary node management process sends a test command to the secondary node management process based on the starting completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit to obtain test result data.
In one embodiment, the sending, by the primary node management process, a start command to the secondary node management process, so that the secondary node management process starts a corresponding test process based on the start command, and returns a start completion message includes:
the method comprises the steps that a primary node management process sends a starting command to a secondary node management process, wherein the starting command carries an identifier of a unit to be tested;
the secondary node management process starts the test processes corresponding to the units to be tested in sequence based on the identification of the units to be tested, and sends a start completion message to the secondary node management process after the start of one test process is completed;
and the secondary node management process collects all startup completion messages and sends the startup completion messages to the primary node management process.
In one embodiment, the second-level node management process sequentially starts a test process corresponding to the units to be tested based on the identifiers of the units to be tested, and includes:
and the secondary node management process constructs a shared memory area of the test process corresponding to the unit to be tested so as to start the test process corresponding to the unit to be tested, wherein the target test process is connected with the corresponding shared memory area.
In one embodiment, the sending, by the primary node management process, the test command to the secondary node management process based on the start completion message, and forwarding, by the secondary node management process, the test command to the corresponding test process, so that the test process tests the corresponding test unit, includes:
the primary node management process sends a test command to the secondary node management process based on the starting completion message, wherein the test command corresponds to the unit to be tested;
the secondary node management process writes the test command into a shared memory communication area corresponding to the unit to be tested, wherein the shared memory communication area is constructed by the secondary node management process when the test process is started;
and acquiring a test command in the shared memory communication area through the test process, executing the test command, enabling the unit to be tested to run a test flow corresponding to the test command, and acquiring test result data of the unit to be tested.
In one embodiment, the start command is used to start one or more test procedures.
In one embodiment, when the unit to be tested is single, the primary node management process sends a test command to the secondary node management process based on the start completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit, including:
the primary node management process sends a test command to a secondary node management process corresponding to the unit to be tested based on the starting completion message;
and the secondary node management process forwards the test command to the test process corresponding to the unit to be tested, and tests the unit to be tested.
In one embodiment, when there are a plurality of units to be tested, the first-level node management process sends a test command to the second-level node management process based on the start completion message, and forwards the test command to the corresponding test process through the second-level node management process, so that the test process tests the corresponding test unit, including:
the primary node management process sends a test command to the secondary node management process corresponding to each unit to be tested based on the starting completion message;
and the secondary node management process forwards the test command to the test process corresponding to each unit to be tested, and performs parallel test on the plurality of units to be tested.
Based on the same inventive concept, a fourth aspect of the present invention provides a semiconductor memory burn-in test system, comprising:
the management logic board is provided with a primary node management module;
the test logic board is provided with a secondary node management module;
the process creation module is used for creating a primary node management process through the primary node management module and creating a secondary node management process through the secondary node management module;
the starting command sending module is used for sending a starting command to the secondary node management process by the primary node management process so as to enable the secondary node management process to start a corresponding test process based on the starting command and return a starting completion message, wherein each test process corresponds to one test unit;
and the test command sending module is used for sending a test command to the secondary node management process by the primary node management process based on the starting completion message and forwarding the test command to the corresponding test process through the secondary node management process so that the test process tests the corresponding test unit to obtain test result data.
Based on the same inventive concept, a fifth aspect of the present invention provides a distributed system, which includes the distributed process processing system of the first aspect and the semiconductor memory aging test system of the fourth aspect.
One or more technical solutions in the embodiments of the present application have at least one or more of the following technical effects:
the invention provides a distributed process processing system, which is characterized in that a primary node management module is arranged for managing primary nodes and storing the corresponding relation between the primary nodes and secondary nodes, a plurality of secondary node management modules are arranged for managing corresponding secondary nodes and test processes corresponding to the secondary nodes and storing the corresponding relation between the secondary nodes and the test processes, wherein each test process corresponds to a test unit and is used for running a test example of the test unit. Compared with the mode of managing all test units by a single process in the prior art, the method adopts a two-stage management architecture to manage the test units of the semiconductor memory aging test system, and tests one test unit and one test process respectively during testing, so that the method is a distributed management system, the stability of the system can be greatly improved, and the processing capacity and the processing speed of the system on test data can be improved by adopting a two-stage management strategy.
Furthermore, a semiconductor aging test method is provided based on the distributed process processing system, corresponding management processes are respectively established through the primary node management module and the secondary node management module, then the corresponding test units are tested, each test unit can be accurately controlled, and different test processes of each test unit are controlled.
Furthermore, each test unit in the aging test method is independent, and can support the test of a single test unit, the test of a plurality of test units, and the test of a plurality of chips simultaneously, so that the use reusability of the system can be increased.
Further, the software modules in the test system: the primary node management module and the secondary node management module can be abstracted and independent, so that the complexity of the system is reduced, the independence of the software modules can be kept, the updating iteration speed of the test system is increased, and the research and development cost is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a block diagram of a distributed process processing system according to the present invention;
FIG. 2 is a schematic diagram of a distributed process processing system according to the present invention;
FIG. 3 is a flow chart of a distributed process processing method provided by the present invention;
FIG. 4 is a flow chart of a semiconductor memory burn-in test method according to the present invention;
FIG. 5 is a flowchart illustrating the process of starting a test and the start of a test according to an embodiment of the present invention;
FIG. 6 is a flow chart of a partial test cell test in accordance with an embodiment of the present invention;
FIG. 7 is a diagram illustrating an initialization state of the system according to an embodiment of the present invention;
FIG. 8 is a diagram illustrating a single test process initiation process according to an embodiment of the present invention;
FIG. 9 is a diagram illustrating a single test process according to an embodiment of the present invention;
FIG. 10 is a diagram illustrating a process of testing multiple test processes simultaneously according to an embodiment of the present invention;
fig. 11 is a hardware module structure diagram of the test system provided in the present invention.
Detailed Description
In the prior art, related technologies related to a process management system and a process management method applied to a distributed system are mainly studied, and the related technologies mainly relate to management and scheduling of the process management system. The method is not aimed at the development and implementation of a semiconductor test system, and can not well solve a plurality of problems faced by the existing aging equipment. The invention introduces the distributed processing idea into the field of semiconductor aging test, and develops and designs a test system of aging test equipment.
The distributed process processing system comprises a primary node management module and a secondary node management module, wherein the primary node management module is used for managing primary nodes and storing corresponding relations between the primary nodes and the secondary nodes, the secondary node management module is used for managing corresponding secondary nodes and test processes corresponding to the secondary nodes and storing corresponding relations between the secondary nodes and the test processes, and therefore management of test units by adopting a two-stage architecture can be achieved, on one hand, stability of the system can be improved, and on the other hand, processing capacity and processing speed of test data can be improved.
Abbreviations and full names of related terms referred to in the present invention are as follows: ATE (Automatic Test Equipment), IC (Integrated Circuits), TDBI (Test Dual Burn-In), Burn-In.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example one
The embodiment provides a distributed process processing system, which is applied to a semiconductor memory aging test system, where the semiconductor memory aging test system includes a management logic board and a test logic board, and referring to fig. 1, the distributed process processing system includes:
the first-level node management module is used for managing first-level nodes and storing corresponding relations between the first-level nodes and second-level nodes, wherein the management logic board is used as the first-level nodes, the test logic board is used as the second-level nodes, and each second-level node comprises a plurality of test units;
and the plurality of second-level node management modules are used for managing the corresponding second-level nodes and the test processes corresponding to the second-level nodes and storing the corresponding relation between the second-level nodes and the test processes, wherein each test process corresponds to one test unit and is used for running the test case of the test unit.
Specifically, a two-level management architecture is adopted, the first-level node management module is used for managing the first-level nodes and storing the corresponding relation between the first-level nodes and the second-level nodes, and the first-level nodes and the second-level nodes can be associated through the corresponding relation and positioned from the first-level nodes to the second-level nodes.
The second-level node management module is used for managing second-level nodes and corresponding test processes, each second-level node comprises a plurality of test units, and the corresponding test processes can be positioned through the second-level nodes by the stored corresponding relationship between the second-level nodes and the test processes.
The test processes are in one-to-one correspondence with the test units, one test process corresponds to one test unit, so that the test units are independent and do not influence each other, and the operation of other test units is not influenced when one test unit fails in testing, so that the stability of the system can be improved.
Fig. 1 shows a schematic structural diagram of a distributed process processing system, in which test software is a program for creating a test process, each chip under test represents a test unit, and the chips under test are independent of each other.
As shown in fig. 2, an operation diagram of a distributed process processing system is shown, M _ S1 represents a process created by a primary node management module in an operation process, and is called a primary node management process, similarly, M _ S2 represents a secondary node management process, a TestProcess is a test process created by test software in an actual operation process, and each TestProcess corresponds to one chip under test.
Example two
Based on the same inventive concept, the present embodiment provides a distributed process processing method, please refer to fig. 3, the method includes:
s1: the management logic board is used as a primary node, the test logic board is used as a secondary node, the primary node is managed through a primary node management module, and the corresponding relation between the primary node and the secondary node is stored, wherein each secondary node comprises a plurality of test units;
s2: managing corresponding secondary nodes and test processes corresponding to the secondary nodes through a secondary node management module, and storing corresponding relations between the secondary nodes and the test processes;
s3: and allocating a test process for each test unit, and operating the test example of the test unit according to the corresponding relation between the primary node and the secondary node and the corresponding relation between the secondary node and the test process.
Since the system introduced in the second embodiment of the present invention is a method implemented based on the distributed process processing system in the first embodiment of the present invention, a person skilled in the art can understand a specific implementation manner of the method based on the system introduced in the first embodiment of the present invention, and thus details are not described here. All methods implemented by the distributed process processing system in the first embodiment of the present invention belong to the scope of the present invention.
EXAMPLE III
Based on the same inventive concept, the present embodiment provides a method for testing a distributed process processing system based on the embodiment, please refer to fig. 4, the method includes:
s1: creating a primary node management process through a primary node management module, and creating a secondary node management process through a secondary node management module;
s2: the primary node management process sends a starting command to the secondary node management process so that the secondary node management process starts a corresponding test process based on the starting command and returns a starting completion message, wherein each test process corresponds to one test unit;
s3: and the primary node management process sends a test command to the secondary node management process based on the starting completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit to obtain test result data.
Specifically, S1 is an initialization step, and the first-level node management module creates a first-level node management process, the second-level node management module creates a second-level node management process, and the first-level node management module and the second-level node management module interact with each other.
S2 is a step of starting a test procedure, and starts a corresponding test procedure by sending a start command to the secondary node management procedure through the primary node management procedure.
S3 is a specific testing step, where after receiving a start completion message returned by the test process, the primary node management process sends a test command to the secondary node management process based on the start completion message to perform a test on the test unit.
In one embodiment, the sending, by the primary node management process, a start command to the secondary node management process, so that the secondary node management process starts a corresponding test process based on the start command, and returns a start completion message includes:
the method comprises the steps that a primary node management process sends a starting command to a secondary node management process, wherein the starting command carries an identifier of a unit to be tested;
the secondary node management process starts the test processes corresponding to the units to be tested in sequence based on the identification of the units to be tested, and sends a start completion message to the secondary node management process after the start of one test process is completed;
and the secondary node management process collects all startup completion messages and sends the startup completion messages to the primary node management process.
In a specific implementation process, the primary node management module knows which test units need to be tested in advance, that is, which units to be tested are, so that the identifiers of the units to be tested are sent to the primary node management process, and then the primary node management process sends a start command to the secondary node management processes corresponding to the units to be tested. The identifier of the unit to be tested carried in the start command is information that can uniquely identify the test unit under the secondary management node module, such as a serial number, an identification code, and the like.
And after the node management process receives the starting command, starting a test process corresponding to the unit to be tested according to the identification of the unit to be tested.
And when the secondary node management process finishes collecting all the starting completion messages, informing the primary node management process that the starting process is finished.
The number of units to be tested is one or more,
for example, when the number of the units to be tested is one, the primary node management process sends a start command to the secondary node management process of the unit to be tested, and the secondary node management process starts a target test process according to the unit to be tested identifier in the start command, so as to test the unit to be tested.
When the number of the units to be tested is multiple, if the units to be tested belong to the same secondary node management module, the starting command is only needed to be sent to the process created by the secondary node management module, and then the multiple target test processes are started through the secondary node management process and are respectively used for testing the units to be tested.
When the units to be tested belong to different secondary node management modules, a starting command needs to be sent to the processes created by the multiple secondary node management modules, and then the target test process is started by adopting a similar method.
Referring to fig. 5, a flow chart of the test starting process and the test starting according to an embodiment of the invention is shown, which mainly shows two parts of the test starting process and the test starting,
(1) the M _ S1 (primary node management process) sends a starting command to the M _ S2 (secondary node management process) to which the unit to be tested belongs;
(2) after receiving the start command, the M _ S2 sequentially starts 9 test processes of the TestProgram software, wherein the test processes correspond to 9 units to be tested respectively, a start completion message is sent to the M _ S2 after the start of each test is completed, and the M _ S2 collects messages and sends the messages to the M _ S1 software;
(3) after all test processes are started, the M _ S1 sends a test starting command to the M _ S2;
(4) m _ S2 sends a start test command to the test process to which it belongs.
Referring to FIG. 6, a partial test cell test flow chart, where only test cells numbered 1, 4, and 9 are enabled, then test processes corresponding to these three test cells are enabled.
In one embodiment, the second-level node management process sequentially starts a test process corresponding to the units to be tested based on the identifiers of the units to be tested, and includes:
and the secondary node management process constructs a shared memory area of the test process corresponding to the unit to be tested so as to start the test process corresponding to the unit to be tested, wherein the target test process is connected with the corresponding shared memory area.
Specifically, the main difficulty in implementing distributed process processing in the test method is how to accurately manage the test process on the logic test board, and in order to accelerate the data communication efficiency between the secondary node management process and the test process and increase the data transmission speed, the present invention is implemented in a manner of sharing a memory.
Before starting the test process, initialization is required, that is, the corresponding primary node management process and secondary node management process are started. Specifically, as shown in FIG. 7, after M _ S1 and M _ S2 are activated, communication is established.
The following describes the process of starting a single test process, and refer to fig. 8:
(1) m _ S1 sends command 1 (test progress command to start test cell n);
(2) the M _ S2 receives the command 1 and establishes a shared memory communication area of the test process of the test unit n;
(3) m _ S2 starts a test procedure numbered n of the TestProgram (the test procedure and the test unit may correspond to each other one by one, and here, for convenience, the test unit and the test procedure are numbered the same);
(4) TestProcess (n) Process Start complete;
(5) TestProcess (n) connects the shared memory communication area;
(6) the TestProcess (n) is connected with the test unit to start the test unit;
in one embodiment, the sending, by the primary node management process, the test command to the secondary node management process based on the start completion message, and forwarding, by the secondary node management process, the test command to the corresponding test process, so that the test process tests the corresponding test unit, includes:
the primary node management process sends a test command to the secondary node management process based on the starting completion message, wherein the test command corresponds to the unit to be tested;
the secondary node management process writes the test command into a shared memory communication area corresponding to the unit to be tested;
and acquiring a test command in the shared memory communication area through the test process, executing the test command, enabling the unit to be tested to run a test flow corresponding to the test command, and acquiring test result data of the unit to be tested.
In one embodiment, when the unit to be tested is single, the first level node management process sends a test command to the second level node management process based on the start completion message, and forwards the test command to the corresponding test process through the second level node management process, so that the test process tests the corresponding test unit, including:
the primary node management process sends a test command to a secondary node management process corresponding to the unit to be tested based on the starting completion message;
and the secondary node management process forwards the test command to the test process corresponding to the unit to be tested, and tests the unit to be tested.
Specifically, a single test unit is tested during the test process corresponding to the initiation of a single test process.
In one embodiment, when there are a plurality of units to be tested, the first-level node management process sends a test command to the second-level node management process based on the start completion message, and forwards the test command to the corresponding test process through the second-level node management process, so that the test process tests the corresponding test unit, including:
the primary node management process sends a test command to the secondary node management process corresponding to each unit to be tested based on the starting completion message;
and the secondary node management process forwards the test command to the test process corresponding to each unit to be tested, and performs parallel test on the plurality of units to be tested.
Specifically, in response to starting a plurality of test processes, a plurality of test units are tested in parallel during the test process. And the primary node management process sends a test command to the secondary node management process corresponding to each unit to be tested respectively based on the starting completion message, and the units to be tested and the secondary node management process are in a many-to-one relationship.
In one embodiment, after the obtaining the test result of the unit under test, the method further comprises:
and the test process writes the test result data into the corresponding shared memory communication area.
Specifically, the operation process of the test process is described by taking a single test process as an example, please refer to fig. 9:
(1) m _ S1 sends the command "test command 2";
(2) the M _ S2 receives a test command 2, and writes the content of the test command into the shared memory communication area so as to update the information in the shared memory communication area;
(3) testprocess (n) obtains a 'test command 2' in the shared memory communication area (n);
(4) testprocess (n) executes "test command 2", and the test unit runs the test flow;
(5) TestProcess (n) obtains a test RESULT "RESULT _ B" of "test cell n".
(6) TestProcess (n) writes the test result into the shared memory communication area (n).
In one embodiment, after the test process writes the test result data into the corresponding shared memory communication area, the method further includes:
the secondary node management process acquires test result data from the shared memory communication area corresponding to the test process;
the secondary node management process carries out primary processing on the test result data to obtain first result data, wherein the first result data comprises the test progress;
and the secondary node management process sends the first result data to the corresponding primary node management process, and performs classification statistics on the first result data through the primary node management process to obtain second result data.
Specifically, after the test process writes the test result into the shared memory communication area, the secondary node management process reads the test result data from the shared memory communication area, performs preliminary processing on the test result data, and sends the test result data to the primary node management process. The specific implementation process is as follows:
(7) m _ S2 obtains a test RESULT "RESULT _ B", RESULT _ B test RESULT data (test pass/fail, test interrupt, test log, etc.) and a test flow or progress (test start, test end, test tentative, test termination, etc.) from the shared memory communication area (n);
(8) m _ S2 performs preliminary processing on the test RESULT "RESULT _ B" to obtain first RESULT data "RESULT _ B1", wherein RESULT _ B1 includes the flow or progress of the test, such as start of the test, end of the test, tentative test, termination of the test, and the like
(9) M _ S1 receives "RESULT _ B1" and performs comprehensive processing to obtain second RESULT data. The second result data may include the number of test units that pass/fail the test, the number of test interrupts, the test log after the modification process, and the like.
When a plurality of test units need to be tested, the specific flow is similar to that of a single test unit, but different test processes and shared memory communication areas corresponding to the test processes are respectively constructed, so that different test units are not affected by each other, as shown in fig. 10.
Through distributed process management, the test method and the test system provided by the invention can realize the following purposes:
(1) and (3) extreme environment operation stability: the aging equipment where the test system is located needs to stably operate for a long time in different extreme environments such as high and low temperatures;
(2) large number of chips test requirements: the test chip processes, and tests numerous memories at one time, and the number of the memories is up to hundreds;
(3) testing the differentiated processing capacity of the system: the performance of each tested unit in the aging test system is inconsistent, so that the difference between the running speed and the running result of the chip is large, and the test units need to be processed independently;
(4) processing a large amount of data: the aging test system has numerous and huge test data and has higher requirements on data processing performance;
(5) equipment is rapidly upgraded: because the memory chip is updated and updated more quickly, the test system can support quick upgrade and reconstruction, and the development expenditure is reduced;
(6) multiple type of chip test requirements: the reusability of the system is increased, and the use value of the equipment is improved.
Since the method introduced in the third embodiment of the present invention is a method implemented based on the distributed process processing system in the first embodiment of the present invention, a person skilled in the art can understand a specific implementation manner of the method based on the test method implemented by the system introduced in the first embodiment of the present invention, and thus details are not described herein again. The method implemented by the distributed process processing system in the first embodiment of the present invention belongs to the protection scope of the present invention.
Example four
Based on the same inventive concept, the present embodiment provides a semiconductor memory burn-in test system, including:
the management logic board is provided with a primary node management module;
the test logic board is provided with a secondary node management module;
the process creation module is used for creating a primary node management process through the primary node management module and creating a secondary node management process through the secondary node management module;
the starting command sending module is used for sending a starting command to the secondary node management process by the primary node management process so as to enable the secondary node management process to start a corresponding test process based on the starting command and return a starting completion message, wherein each test process corresponds to one test unit;
and the test command sending module is used for sending a test command to the secondary node management process by the primary node management process based on the starting completion message and forwarding the test command to the corresponding test process through the secondary node management process so that the test process tests the corresponding test unit to obtain test result data.
Referring to fig. 11, a hardware module structure diagram of a test system provided by the present invention includes a management logic board and a test logic board.
The management logic board is responsible for managing the test logic boards, and one management logic board is connected with a plurality of test logic boards;
the test logic board is responsible for managing all test units on the test logic board, and one test logic board carries a plurality of test units;
the test unit is connected with the test chip and performs test interaction on the tested chip.
Because different test chips can be realized by replacing the test logic board, only test programs are interacted with the chips in the test logic board, and only test processes in the whole test system are related to hardware, the decoupling of a software module and a hardware module in the test system can be realized. Therefore, software modules in the test system can be abstracted and independent, so that the complexity of the system can be reduced, the independence of the software system is kept, the updating iteration speed of the test system is increased, and the research and development cost is reduced.
Since the system described in the fourth embodiment of the present invention is a system used for implementing the semiconductor memory aging test method in the third embodiment of the present invention, a person skilled in the art can understand the specific structure and the deformation of the system based on the method described in the first embodiment of the present invention, and thus the details are not described herein again. All systems adopted by the method of the first embodiment of the present invention are within the intended protection scope of the present invention.
EXAMPLE five
Based on the same inventive concept, the present embodiment provides a distributed system, which includes the distributed process processing system according to the first embodiment and the semiconductor memory burn-in test system according to the third embodiment.
Generally speaking, the distributed process processing system, the semiconductor aging test method and system, and the distributed system of the present invention allocate a test process for each test unit in the aging test system individually for testing, and manage the test units by using a 2-level management architecture, so as to realize the loose coupling design of software and hardware of the semiconductor aging test system, reduce the complexity of the system, enhance the stability and robustness of the system, and accelerate the update iteration speed of the system, and have the following advantages and beneficial technical effects:
1. distributed management is adopted, so that the stability and robustness of the system are ensured, and the capability of the system for resisting severe environment is improved;
2. the accurate test can be performed, each test unit can be accurately controlled, and different test processes of each test unit are controlled;
3. the requirement of simultaneously testing chips of various versions is supported, the reusability of the system is increased, and the use value of equipment is improved;
4. the decoupling design of the software and the hardware of the test system reduces the complexity of the system and accelerates the updating iteration speed of the system;
5. 2, a level-2 management strategy is adopted, so that the processing capacity and the processing speed of the system on the test data are improved;
6. by adopting the multi-process test program, for the method that all test units are tested by adopting a single process and the threads of all test units need to be managed by the single process in the prior art, the method adopts one test process to test one test unit and only needs to manage the threads of the single test unit by one test process, thereby avoiding the processing complexity of excessive threads, reducing the development difficulty of the test program and accelerating the development of the test program.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various modifications and variations can be made in the embodiments of the present invention without departing from the spirit or scope of the embodiments of the invention. Thus, if such modifications and variations of the embodiments of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to encompass such modifications and variations.
Claims (10)
1. A distributed process processing system is applied to a semiconductor memory aging test system, the semiconductor memory aging test system comprises a management logic board and a test logic board, and the distributed process processing system comprises:
the first-level node management module is used for managing first-level nodes and storing corresponding relations between the first-level nodes and second-level nodes, wherein the management logic board is used as the first-level nodes, the test logic board is used as the second-level nodes, and each second-level node comprises a plurality of test units;
and the plurality of second-level node management modules are used for managing the corresponding second-level nodes and the test processes corresponding to the second-level nodes and storing the corresponding relation between the second-level nodes and the test processes, wherein each test process corresponds to one test unit.
2. A distributed process processing method, comprising:
the management logic board is used as a primary node, the test logic board is used as a secondary node, the primary node is managed through a primary node management module, and the corresponding relation between the primary node and the secondary node is stored, wherein each secondary node comprises a plurality of test units;
managing corresponding secondary nodes and test processes corresponding to the secondary nodes through a secondary node management module, and storing corresponding relations between the secondary nodes and the test processes;
and allocating a test process for each test unit, and operating the test example of the test unit according to the corresponding relation between the primary node and the secondary node and the corresponding relation between the secondary node and the test process.
3. A method for testing a distributed process processing system according to claim 1, comprising:
creating a primary node management process through a primary node management module, and creating a secondary node management process through a secondary node management module;
the primary node management process sends a starting command to the secondary node management process so that the secondary node management process starts a corresponding test process based on the starting command and returns a starting completion message, wherein each test process corresponds to one test unit;
and the primary node management process sends a test command to the secondary node management process based on the starting completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit to obtain test result data.
4. The method of claim 3, wherein the primary node management process sending a start command to the secondary node management process to cause the secondary node management process to start a corresponding test process based on the start command and return a start completion message, comprising:
the method comprises the steps that a primary node management process sends a starting command to a secondary node management process, wherein the starting command carries an identifier of a unit to be tested;
the secondary node management process starts the test processes corresponding to the units to be tested in sequence based on the identification of the units to be tested, and sends a start completion message to the secondary node management process after the start of one test process is completed;
and the secondary node management process collects all startup completion messages and sends the startup completion messages to the primary node management process.
5. The method of claim 4, wherein the secondary node management process sequentially starts test processes corresponding to units to be tested based on the identities of the units to be tested, comprising:
and the secondary node management process constructs a shared memory area of the test process corresponding to the unit to be tested so as to start the test process corresponding to the unit to be tested, wherein the target test process is connected with the corresponding shared memory area.
6. The method of claim 3, wherein the primary node management process sends a test command to the secondary node management process based on the boot completion message and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit, comprising:
the primary node management process sends a test command to the secondary node management process based on the starting completion message, wherein the test command corresponds to the unit to be tested;
the secondary node management process writes the test command into a shared memory communication area corresponding to the unit to be tested, wherein the shared memory communication area is constructed by the secondary node management process when the test process is started;
and acquiring a test command in the shared memory communication area through the test process, executing the test command, enabling the unit to be tested to run a test flow corresponding to the test command, and acquiring test result data of the unit to be tested.
7. The method of claim 4,
the starting command is used for starting one or more preset test processes.
8. The method as claimed in claim 4, wherein when there are a plurality of units to be tested, the primary node management process sends a test command to the secondary node management process based on the start completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit, including:
the primary node management process sends a test command to the secondary node management process corresponding to each unit to be tested based on the starting completion message;
and the secondary node management process forwards the test command to the test process corresponding to each unit to be tested, and performs parallel test on the plurality of units to be tested.
9. A semiconductor memory burn-in test system, comprising:
the management logic board is provided with a primary node management module;
the test logic board is provided with a secondary node management module;
the process creation module is used for creating a primary node management process through the primary node management module and creating a secondary node management process through the secondary node management module;
the starting command sending module is used for sending a starting command to the secondary node management process by the primary node management process so as to enable the secondary node management process to start a corresponding test process based on the starting command and return a starting completion message, wherein each test process corresponds to one test unit;
and the test command sending module is used for sending a test command to the secondary node management process by the primary node management process based on the starting completion message and forwarding the test command to the corresponding test process through the secondary node management process so that the test process tests the corresponding test unit to obtain test result data.
10. A distributed system comprising the distributed process processing system of claim 1 and the semiconductor memory burn-in test system of claim 9.
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