CN111505562A - Test system for metering performance self-monitoring capability of electric energy meter - Google Patents
Test system for metering performance self-monitoring capability of electric energy meter Download PDFInfo
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- CN111505562A CN111505562A CN202010357375.9A CN202010357375A CN111505562A CN 111505562 A CN111505562 A CN 111505562A CN 202010357375 A CN202010357375 A CN 202010357375A CN 111505562 A CN111505562 A CN 111505562A
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Abstract
The invention discloses a test system for the metering performance self-monitoring capability of an electric energy meter, which comprises the following components: the device comprises a power supply device and a metering fault simulation injection device; the metering fault simulation injection device is arranged between the power supply device and a sampling signal input end of a metering chip of the tested electric energy meter and comprises a sampling simulation circuit, a fault simulation circuit and a switching device. Switching the sampling signal input ends of the metering chip of the power supply device and the measured electric energy meter into a sampling simulation circuit through a switching device, so that the sampling reference is determined by the metering chip; switching the sampling signal input ends of the power supply device and the metering chip into a fault simulation circuit through a switching device to realize fault injection to the metering chip; the self-monitoring capability of the metering performance of the tested electric energy meter can be verified by detecting whether the metering chip can report the fault information of the sampling circuit or not, so that the purpose of testing the self-monitoring capability of the metering performance of the electric energy meter before delivery is achieved, and the delivery reliability of the electric energy meter is ensured.
Description
Technical Field
The invention relates to the technical field of electric energy metering, in particular to a test system for the metering performance self-monitoring capability of an electric energy meter.
Background
An electric energy meter is an instrument for measuring electric energy, and is also called an electric meter, a fire meter and a kilowatt-hour meter. In order to ensure the reliability of the measurement result, a technical worker provides an electric energy meter which can realize the functions of self-monitoring and fault diagnosis of a metering circuit on the self-electric energy metering performance and the self-error, such as an IR46 intelligent electric meter, can detect the fault information of the circuit where the electric energy meter is located and the fault of the self-metering circuit, store the fault diagnosis data as an event record and automatically report the fault diagnosis data to a master station data acquisition system; the master station data acquisition system collects fault diagnosis data of the electric energy meters through the data concentrator, evaluates and detects the metering performance quality of the electric energy meters in real time according to the metering performance of each electric energy meter, reports the electric energy meters with metering faults to the electric power bureau in time, enables the staff of the electric power bureau to quickly locate the fault electric energy meters, and replaces or maintains faults on line the fault electric energy meters in time, greatly reduces the operation and maintenance cost of the electric power bureau, and reduces the loss caused by false alarm of the fault electric energy meters.
The electric energy meter with metering performance self-monitoring capability represented by the IR46 intelligent electric meter is detected and diagnosed by a built-in circuit of a metering chip, and a scheme for detecting and evaluating the self-monitoring and fault self-diagnosis functions of the metering performance of the novel electric energy meter does not exist at present.
How to test the metering performance self-monitoring capability of the novel electric energy meter and ensure the delivery reliability of equipment is a technical problem to be solved by technical personnel in the field.
Disclosure of Invention
The invention aims to provide a test system for the metering performance self-monitoring capability of an electric energy meter, which is used for testing the metering performance self-monitoring capability of the electric energy meter and ensuring the delivery reliability of the electric energy meter.
In order to solve the above technical problem, the present invention provides a system for testing the metering performance self-monitoring capability of an electric energy meter, comprising: the device comprises a power supply device and a metering fault simulation injection device;
the metering fault simulation injection device is arranged between the power supply device and a sampling signal input end of a metering chip of the tested electric energy meter, and comprises a sampling simulation circuit, a fault simulation circuit and a switching device for switching the sampling simulation circuit and the fault simulation circuit.
Optionally, the sampling simulation circuit specifically includes a current sampling simulation circuit and a voltage sampling simulation circuit;
correspondingly, the fault simulation circuit specifically comprises a current fault simulation circuit and a voltage fault simulation circuit;
the power supply device specifically comprises a current source device and a voltage source device;
the switching device specifically comprises a first switching device for switching the current sampling simulation circuit and the current fault simulation circuit between the current source device and the current channel sampling signal end of the metering chip, and a second switching device for switching the voltage sampling simulation circuit and the voltage fault simulation circuit between the voltage source device and the voltage signal input end of the metering chip.
Optionally, the current sampling simulation circuit specifically includes: the circuit comprises a first shunt, a first resistor, a second resistor, a first sampling resistor, a second sampling resistor, a first capacitor and a second capacitor;
wherein, the first end of first resistance with current source device's positive pole is connected, the second end of first resistance with the first end of first shunt and the first end of first sampling resistance is connected, the second end of first shunt with the first end of second resistance and the first end of second sampling resistance is connected, the second end of second resistance with current source device's negative pole is connected, the second end of first sampling resistance with the first end of first electric capacity and the positive pole of measurement chip's current channel sampling signal end is connected, the second end of second sampling resistance with the first end of second electric capacity and the negative pole of measurement chip's current channel sampling signal end is connected, the second end of first electric capacity with the second end of second electric capacity all grounds.
Optionally, the current fault simulation circuit specifically includes: the second shunt, the third resistor and the fourth resistor;
the first end of the second shunt is connected with the anode of the current source device, and the second end of the second shunt is connected with the cathode of the current source device; the third resistor is connected in parallel to two ends of the first sampling resistor; the fourth resistor is connected in parallel to two ends of the second sampling resistor;
correspondingly, the first switching device specifically includes: the first switch, the second switch, the third switch, the fourth switch, the fifth switch, the sixth switch, the seventh switch, the eighth switch and the ninth switch;
a first end of the first switch is connected with a positive electrode of the current source device, and a second end of the first switch is connected with a negative electrode of the current source device; the second switch is arranged between the anode of the current source device and the first end of the second shunt; the third switch is connected in series on a branch where the first resistor, the second resistor and the first shunt are located; the fourth switch is connected between the first end of the first shunt and the first end of the first sampling resistor in series; the fifth switch is connected in series with the branch where the third resistor is located; the sixth switch is connected in parallel to two ends of the first sampling resistor; the seventh switch is connected in series between the second end of the first shunt and the first end of the second sampling resistor; the eighth switch is connected in series with the branch where the fourth resistor is located; the ninth switch is connected in parallel to two ends of the second sampling resistor.
Optionally, the voltage sampling simulation circuit specifically includes: a first voltage dividing resistor and a second voltage dividing resistor;
the first end of the first voltage-dividing resistor is connected with the first output end of the voltage source device, the second end of the first voltage-dividing resistor is connected with the first end of the second voltage-dividing resistor and the first voltage channel sampling signal end of the metering chip, and the second end of the second voltage-dividing resistor is connected with the second output end of the voltage source device and the second voltage channel sampling signal end of the metering chip.
Optionally, the voltage fault simulation circuit specifically includes: a fifth resistor and a sixth resistor;
the fifth resistor is connected in parallel to two ends of the first voltage dividing resistor, and the sixth resistor is connected in parallel to two ends of the second voltage dividing resistor;
correspondingly, the second switching device specifically includes: a tenth switch, an eleventh switch, a twelfth switch, a thirteenth switch, a fourteenth switch, and a fifteenth switch;
wherein the tenth switch is connected in series between the first output terminal of the voltage source device and the first terminal of the first voltage dividing resistor; the eleventh switch is connected in series between the second terminal of the second voltage-dividing resistor and the second output terminal of the voltage source device; the twelfth switch is connected in parallel to two ends of the first voltage dividing resistor; the thirteenth switch is connected in series with the branch where the fifth resistor is located; the fourteenth switch is connected in parallel to two ends of the second voltage-dividing resistor; and the fifteenth switch is connected in series with the branch where the sixth resistor is located.
Optionally, the method further includes: the first indicator light is connected in series with the current sampling simulation circuit, the second indicator light is connected in series with the current fault simulation circuit, the third indicator light is connected in series with the voltage sampling simulation circuit, and the fourth indicator light is connected in series with the voltage fault simulation circuit.
Optionally, the switching device is specifically a relay.
Optionally, the system further comprises an upper computer connected to the control end of the switching device and the signal output end of the metering chip, and configured to control switching of the switching device and receive self-diagnosis information uploaded by the metering chip.
Optionally, the upper computer is further configured to compare the self-diagnosis information with corresponding control information for the switching device, and determine a measurement performance self-monitoring capability test result of the measured electric energy meter according to a comparison result.
The invention provides a test system for the metering performance self-monitoring capability of an electric energy meter, which comprises: the device comprises a power supply device and a metering fault simulation injection device; the metering fault simulation injection device is arranged between the power supply device and a sampling signal input end of a metering chip of the tested electric energy meter, and comprises a sampling simulation circuit, a fault simulation circuit and a switching device for switching the sampling simulation circuit and the fault simulation circuit. Switching the sampling signal input ends of the power supply device and the metering chip of the tested electric energy meter into a sampling simulation circuit through a switching device, so that the metering chip of the tested electric energy meter determines a sampling reference; switching the sampling signal input ends of the power supply device and the metering chip of the tested electric energy meter into a fault simulation circuit through a switching device to realize fault injection to the metering chip of the tested electric energy meter; the self-monitoring capability of the metering performance of the tested electric energy meter can be verified by detecting whether the metering chip of the tested electric energy meter can report the fault information of the sampling circuit, so that the purpose of testing the self-monitoring capability of the metering performance of the electric energy meter before delivery is achieved, and the delivery reliability of the electric energy meter is ensured.
Drawings
In order to more clearly illustrate the embodiments or technical solutions of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a test system for an electric energy meter metering performance self-monitoring capability according to an embodiment of the present invention;
FIG. 2 is a circuit diagram of a current portion of a metering fault simulation injection device according to an embodiment of the present invention;
FIG. 3 is a circuit diagram of a voltage portion of a metering fault simulation injection apparatus according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of another testing system for an electric energy meter metering performance self-monitoring capability according to an embodiment of the present invention.
Detailed Description
The core of the invention is to provide a test system for the metering performance self-monitoring capability of the electric energy meter, which is used for realizing the test of the metering performance self-monitoring capability of the electric energy meter and ensuring the delivery reliability of the electric energy meter.
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a schematic structural diagram of a test system for an electric energy meter metering performance self-monitoring capability according to an embodiment of the present invention.
As shown in fig. 1, a system for testing a metering performance self-monitoring capability of an electric energy meter according to an embodiment of the present invention includes: a power supply device 101 and a metering fault simulation injection device 102;
the metering fault simulation injection device 102 is arranged between the power supply device 101 and a sampling signal input end of a metering chip of the tested electric energy meter, and the metering fault simulation injection device 102 comprises a sampling simulation circuit, a fault simulation circuit and a switching device for switching the sampling simulation circuit and the fault simulation circuit.
The self-monitoring capability of the metering performance of the electric energy meter to be tested is realized by a metering chip and a built-in detection circuit thereof, the self-monitoring principle is that after the electric energy meter is electrified, the metering chip controls the detection circuit to send a detection signal (usually a current signal) to a sampling circuit of the electric energy meter, a reference circuit parameter of the sampling circuit in normal operation is determined according to a feedback signal of the sampling circuit, then in the operation process of the electric energy meter, the metering chip sends the detection signal to the sampling circuit in the same mode at regular time, a real-time circuit parameter of the sampling circuit is calculated according to the feedback signal of the sampling circuit, and the real-time circuit parameter of the sampling circuit is compared with the reference circuit parameter, so that whether the sampling circuit of the current electric energy meter has a fault or not can.
To this end, a test object of the test system provided in the embodiment of the present invention is a metering chip with a built-in detection circuit, or a core board (including the metering chip and a single chip) where the metering chip is located, a sampling simulation circuit is provided for the metering chip to enable the metering chip to establish a sampling reference (i.e., the reference circuit parameter), then a sampling signal input end of the metering chip is switched to a fault simulation circuit, and information whether the sampling circuit fails or not can be monitored by the metering chip is checked according to an output fault detection result of the metering chip.
In specific implementation, the sampling simulation circuit and the fault simulation circuit provided by the embodiment of the invention can be two circuits which are independently arranged, wherein the sampling simulation circuit is built by imitating a sampling circuit of a tested electric energy meter; after the sampling simulation circuit is copied, replacing or adding partial circuits to obtain a fault simulation circuit; the input ends of the sampling simulation circuit and the fault simulation circuit are both connected with the power supply device 101, and the switching device is used for connecting one of the two circuits with the sampling signal input end of the metering chip of the tested electric energy meter. By the split arrangement mode, the sampling simulation circuit and the fault simulation circuit are maintained independently.
The sampling simulation circuit specifically comprises a current sampling simulation circuit and a voltage sampling simulation circuit;
correspondingly, the fault simulation circuit specifically comprises a current fault simulation circuit and a voltage fault simulation circuit;
the power supply device 101 specifically includes a current source device and a voltage source device;
the switching device specifically comprises a first switching device for switching the current sampling simulation circuit and the current fault simulation circuit between the current source device and the current channel sampling signal end of the metering chip, and a second switching device for switching the voltage sampling simulation circuit and the voltage fault simulation circuit between the voltage source device and the voltage signal input end of the metering chip.
By designing the current fault simulation circuit, faults such as short circuit, open circuit and impedance change of a current sampling circuit device can be simulated. In the current fault simulation circuit, the switching of different fault types can be achieved through the form of a switching circuit.
By designing the voltage fault simulation circuit, faults such as short circuit, open circuit and impedance change of a voltage sampling circuit device can be simulated. In the voltage fault simulation circuit, the switching of different fault types can be achieved through the form of a switch circuit.
The system for testing the metering performance self-monitoring capability of the electric energy meter provided by the embodiment of the invention comprises: the device comprises a power supply device and a metering fault simulation injection device; the metering fault simulation injection device is arranged between the power supply device and a sampling signal input end of a metering chip of the tested electric energy meter, and comprises a sampling simulation circuit, a fault simulation circuit and a switching device for switching the sampling simulation circuit and the fault simulation circuit. Switching the sampling signal input ends of the power supply device and the metering chip of the tested electric energy meter into a sampling simulation circuit through a switching device, so that the metering chip of the tested electric energy meter determines a sampling reference; switching the sampling signal input ends of the power supply device and the metering chip of the tested electric energy meter into a fault simulation circuit through a switching device to realize fault injection to the metering chip of the tested electric energy meter; the self-monitoring capability of the metering performance of the tested electric energy meter can be verified by detecting whether the metering chip of the tested electric energy meter can report the fault information of the sampling circuit, so that the purpose of testing the self-monitoring capability of the metering performance of the electric energy meter before delivery is achieved, and the delivery reliability of the electric energy meter is ensured.
Fig. 2 is a circuit diagram for measuring a current portion of a fault simulation injection device according to an embodiment of the present invention.
On the basis of the above embodiment, in the test system for the metering performance self-monitoring capability of the electric energy meter provided by the embodiment of the invention, the current fault simulation circuit and the first switching device are integrated in the current sampling simulation circuit, so that the volume of the test system is reduced, and the simulation of more fault types is facilitated.
Further, an embodiment of the present invention provides a current fault simulation circuit and a first switching device, which are capable of simulating a short-circuit fault, an open-circuit fault, and an impedance change fault of a current sampling circuit device. As shown in fig. 2, in the test system for self-monitoring capability of metering performance of an electric energy meter provided in the embodiment of the present invention, the current sampling simulation circuit specifically includes: the circuit comprises a first shunt R7, a first resistor R1, a second resistor R2, a first sampling resistor R8, a second sampling resistor R9, a first capacitor C1 and a second capacitor C2;
the first end of the first resistor R1 is connected to the positive electrode of the current source device, the second end of the first resistor R1 is connected to the first end of the first shunt R7 and the first end of the first sampling resistor R8, the second end of the first shunt R7 is connected to the first end of the second resistor R2 and the first end of the second sampling resistor R9, the second end of the second resistor R2 is connected to the negative electrode of the current source device, the second end of the first sampling resistor R8 is connected to the first end of the first capacitor C1 and the positive electrode of the current channel sampling signal end of the metering chip, the second end of the second sampling resistor R9 is connected to the first end of the second capacitor C2 and the negative electrode of the current channel sampling signal end of the metering chip, and the second ends of the first capacitor C1 and the second capacitor C2 are both grounded.
As shown in fig. 2, the current source device outputs a current I0, and a voltage drop Ui generated by the first shunt R7 is respectively connected in series with the first resistor R1 and the second resistor R2 of the anti-aliasing filter, and then is connected to the current sampling channel signal terminal of the metering chip.
The first resistor R1 and the second resistor R2 are used for simulating the impedance of the connecting terminal of the measured electric energy meter. The first capacitor C1 and the second capacitor C2 are respectively used for simulating a ground filter capacitor of a positive end signal and a ground filter capacitor of a negative end signal of a current channel sampling signal end of a metering chip of a measured electric energy meter. The current channel sampling circuit of the metering chip of the measured electric energy meter consists of a first shunt R7, a first resistor R1, a second resistor R2, a first sampling resistor R8, a second sampling resistor R9, a first capacitor C1 and a second capacitor C2.
The faults of the current channel sampling circuit of the metering chip are mainly the faults of short circuit, short circuit and impedance change of the first shunt R7, the first sampling resistor R8 and the second sampling resistor R9, so the current fault simulation circuit specifically may include: a second shunt R10, a third resistor R3 and a fourth resistor R4;
a first end of the second shunt R10 is connected with the anode of the current source device, and a second end of the second shunt R10 is connected with the cathode of the current source device; the third resistor R3 is connected in parallel with two ends of the first sampling resistor R8; the fourth resistor R4 is connected in parallel to the two ends of the second sampling resistor R9;
correspondingly, the first switching device specifically includes: a first switch K1, a second switch K2, a third switch K3, a fourth switch K4, a fifth switch K5, a sixth switch K6, a seventh switch K7, an eighth switch K8, and a ninth switch K9;
a first end of the first switch K1 is connected with the anode of the current source device, and a second end of the first switch K1 is connected with the cathode of the current source device; the second switch K2 is arranged between the anode of the current source device and the first end of the second shunt R10; the third switch K3 is connected in series on the branch where the first resistor R1, the second resistor R2 and the first shunt R7 are located; the fourth switch K4 is connected in series between the first end of the first shunt R7 and the first end of the first sampling resistor R8; the fifth switch K5 is connected in series with the branch of the third resistor R3; the sixth switch K6 is connected in parallel across the first sampling resistor R8; the seventh switch K7 is connected in series between the second end of the first shunt R7 and the first end of the second sampling resistor R9; the eighth switch K8 is connected in series with the branch of the fourth resistor R4; the ninth switch K9 is connected in parallel across the second sampling resistor R9.
It should be noted that before fault injection of the current channel sampling circuit is performed on the metering chip, it is required to ensure that the metering chip is in a normal operating state, so that the metering chip determines a current sampling reference. When the metering chip is in a normal working state, the third switch K3, the fourth switch K4 and the seventh switch K7 are in an AND state, and the rest switches are in an OFF state.
When the metering chip is in a normal working state, when the first switch K1 is controlled to be closed and other switches are not changed, the current I0 is I3, the first shunt R7 is short-circuited, and at the moment, a fault mode that the shunt of the current sampling circuit of the tested ammeter is short-circuited is simulated.
When the metering chip is in a normal working state, when the second switch K2 is controlled to be closed and other switches are not changed, the current I0 is I1+ I2, and at the moment, a fault mode of impedance change of a shunt of the current sampling circuit is simulated.
When the metering chip is in a normal working state, when the third switch K3 is controlled to be switched off and other switches are not changed, the current I0 is 0, the branch where the first shunt R7 is located is disconnected, and at this time, a fault mode that the shunt of the current sampling circuit of the tested ammeter is disconnected is simulated.
When the metering chip is in a normal working state, when the fourth switch K4 is controlled to be switched off and other switches are not changed, a fault mode that the sampling anti-aliasing resistor (namely the first sampling resistor R8) at the positive electrode of the current channel sampling signal end of the measured electric energy meter is switched off is simulated.
When the metering chip is in a normal working state, when the fifth switch K5 is controlled to be closed and other switches are not changed, a fault mode of impedance change of a sampling anti-aliasing resistor (namely the first sampling resistor R8) at the positive electrode of the current channel sampling signal end of the measured electric energy meter is simulated.
When the metering chip is in a normal working state, when the sixth switch K6 is controlled to be closed and other switches are not changed, a fault mode that the sampling anti-aliasing resistor (namely the first sampling resistor R8) at the positive electrode of the current channel sampling signal end of the measured electric energy meter is short-circuited is simulated.
When the seventh switch K7 is controlled to be switched off and other switches are not changed from the normal working state of the metering chip, the fault mode that the sampling anti-aliasing resistor (namely the second sampling resistor R9) at the negative electrode of the current channel sampling signal end of the measured electric energy meter is switched off is simulated.
When the metering chip is in a normal working state, when the eighth switch K8 is controlled to be closed and other switches are not changed, a fault mode of impedance change of a sampling anti-aliasing resistor (namely, the second sampling resistor R9) at the negative electrode of a current channel sampling signal end of the measured electric energy meter is simulated.
When the metering chip is in a normal working state, when the ninth switch K9 is controlled to be closed and other switches are not changed, a fault mode that the sampling anti-aliasing resistor (namely the second sampling resistor R9) at the negative electrode of the current channel sampling signal end of the measured electric energy meter is short-circuited is simulated.
Each switch of the first switching device can adopt a magnetic latching relay with small impedance and capable of passing large current.
The resistance value of the second shunt R10 may be the same as or different from the resistance value of the first shunt R7, and a variable resistance shunt may also be used to test the detection accuracy of the measurement chip on the impedance change fault of the current channel sampling circuit shunt.
The resistance value of the third resistor R3 and the resistance value of the fourth resistor R4 may be the same as or different from the resistance value of the first sampling resistor R8 and the resistance value of the second sampling resistor R9, and a potentiometer may also be used to test the detection accuracy of the sampling anti-aliasing resistor impedance change fault of the current channel sampling circuit by the metering chip.
In addition, several fault modes can be simulated at the same time, and the comprehensive fault detection capability of the metering chip of the tested electric energy meter can be detected.
In addition to the arrangement of the current fault simulation circuit shown in fig. 2, in order to simulate the short circuit, and impedance change fault of the first shunt R7, the first sampling resistor R8, and the second sampling resistor R9, other designs may be adopted, for example, the third resistor R3 and the fifth switch K5 may be connected in parallel and then connected to the branch where the first sampling resistor R8 is located, the first sampling resistor R8 normally operates when the fifth switch K5 is closed, and the impedance change fault of the first sampling resistor R8 is simulated when the fifth switch K5 is opened. The resistors and switches for simulating faults at other positions can also be arranged in the same way.
Fig. 3 is a circuit diagram of a voltage portion of a metering fault simulation injection device according to an embodiment of the present invention.
On the basis of the embodiment, in the test system for the metering performance self-monitoring capability of the electric energy meter provided by the embodiment of the invention, the voltage fault simulation circuit and the second switching device are fused in the voltage sampling simulation circuit, so that the size of the test system is reduced, and the simulation of more fault types is facilitated.
Further, an embodiment of the present invention provides a voltage fault simulation circuit and a second switching device, which are capable of simulating a short-circuit fault, an open-circuit fault, and an impedance change fault of a voltage sampling circuit device. As shown in fig. 3, in the test system for self-monitoring capability of metering performance of an electric energy meter provided in the embodiment of the present invention, the voltage sampling simulation circuit specifically includes: a first divider resistor R11 and a second divider resistor R12;
the first end of the first voltage-dividing resistor R11 is connected to the first output end of the voltage source device, the second end of the first voltage-dividing resistor R11 is connected to the first end of the second voltage-dividing resistor R12 and the first voltage channel sampling signal end of the metering chip, and the second end of the second voltage-dividing resistor R12 is connected to the second output end of the voltage source device and the second voltage channel sampling signal end of the metering chip.
As shown in fig. 3, a 220VAC voltage source device is added between the live wire L and the neutral wire N, the first voltage-dividing resistor R11 and the second voltage-dividing resistor R12 are connected in series with the voltage source device to form a voltage-dividing network, the first voltage-dividing resistor R11 is an upper voltage-dividing resistor, the second voltage-dividing resistor R12 is a lower voltage-dividing resistor, the resistance value of the first voltage-dividing resistor R11 is much larger than that of the second voltage-dividing resistor R12, and the voltage input of the voltage source device is reduced to Uu and input to a voltage channel sampling signal end of a metering chip of the electrical energy meter to be measured.
Specifically, the first voltage-dividing resistor R11 and/or the second voltage-dividing resistor R12 may be formed by a plurality of resistors.
The faults of the voltage channel sampling circuit of the metering chip are mainly the faults of short circuit, short circuit and impedance change of the first divider resistor R11 and the second divider resistor R12, so the voltage fault simulation circuit specifically may include: a fifth resistor R5 and a sixth resistor R6;
the fifth resistor R5 is connected in parallel to two ends of the first voltage-dividing resistor R11, and the sixth resistor R6 is connected in parallel to two ends of the second voltage-dividing resistor R12;
correspondingly, the second switching device specifically includes: a tenth switch K10, an eleventh switch K11, a twelfth switch K12, a thirteenth switch K13, a fourteenth switch K14 and a fifteenth switch K15;
wherein the tenth switch K10 is connected in series between the first output terminal of the voltage source device and the first terminal of the first divider resistor R11; the eleventh switch K11 is connected in series between the second terminal of the second voltage-dividing resistor R12 and the second output terminal of the voltage source device; the twelfth switch K12 is connected in parallel to two ends of the first divider resistor R11; the thirteenth switch K13 is connected in series with the branch of the fifth resistor R5; the fourteenth switch K14 is connected in parallel to two ends of the second voltage-dividing resistor R12; the fifteenth switch K15 is connected in series to the branch of the sixth resistor R6.
It should be noted that before fault injection of the voltage channel sampling circuit is performed on the metering chip, it is required to ensure that the metering chip is in a normal operating state, so that the metering chip determines a voltage sampling reference. In the normal operation state of the metering chip, the tenth switch K10 and the eleventh switch K11 are in the closed state, and the other switches are in the open state.
When the tenth switch K10 is controlled to be switched off and other switches are not changed from the normal working state of the metering chip, the first voltage dividing resistor R11 is switched off, and at the moment, the fault mode that the voltage dividing resistor on the voltage sampling circuit of the measured electric energy meter is switched off is simulated.
When the metering chip is in a normal working state, the eleventh switch K11 is controlled to be switched off and other switches are not changed, the second voltage-dividing resistor R12 is switched off, and at the moment, a fault mode that the voltage-dividing resistor is switched off under the voltage sampling circuit of the measured electric energy meter is simulated.
When the metering chip is in a normal working state, when the twelfth switch K12 is controlled to be closed and other switches are not changed, the first voltage-dividing resistor R11 is short-circuited, and at the moment, a fault mode that the voltage-dividing resistor on a voltage sampling circuit of the measured electric energy meter is short-circuited is simulated.
When the metering chip is in a normal working state, when the thirteenth switch K13 is controlled to be closed and other switches are not changed, the fifth resistor R5 is conducted and connected in parallel with the first voltage dividing resistor R11, and at this time, a fault mode of impedance change of the voltage dividing resistor on a voltage sampling circuit of the measured energy meter is simulated.
When the metering chip is in a normal working state, when the fourteenth switch K14 is controlled to be closed and other switches are not changed, the second voltage-dividing resistor R12 is short-circuited, and at the moment, a fault mode that the voltage-dividing resistor is short-circuited under a voltage sampling circuit of the energy meter to be tested is simulated.
When the metering chip is in a normal working state, when the fifteenth switch K15 is controlled to be closed and other switches are not changed, the sixth resistor R6 is conducted and is connected in parallel with the second voltage-dividing resistor R12, and at the moment, a fault mode of impedance change of the voltage-dividing resistor under the voltage sampling circuit of the measured electricity meter is simulated.
And each switch of the second switching device can adopt a magnetic latching relay with small impedance and capable of passing large current.
The resistance value of the fifth resistor R5 may be the same as or different from the resistance value of the first divider resistor R11, and a potentiometer may also be used to test the detection accuracy of the measurement chip on the impedance change fault of the divider resistor on the voltage channel sampling circuit.
Similarly, the resistance of the sixth resistor R6 may be the same as or different from the resistance of the second voltage-dividing resistor R12, and a potentiometer may also be used to test the detection accuracy of the measurement chip on the impedance change fault of the voltage-dividing resistor under the voltage channel sampling circuit.
In addition, several fault modes can be simulated at the same time, and the comprehensive fault detection capability of the metering chip of the tested electric energy meter can be detected.
In addition to the arrangement of the voltage fault simulation circuit shown in fig. 3, in order to simulate the short circuit, and the fault of the impedance change of the first voltage-dividing resistor R11 and the second voltage-dividing resistor R12, other designs may be adopted, for example, the fifth resistor R5 and the thirteenth switch K13 may be connected in parallel and then connected to the branch where the first voltage-dividing resistor R11 is located, the thirteenth switch K13 is closed, the first voltage-dividing resistor R11 normally operates, and the thirteenth switch K13 is opened, and the fault of the impedance change of the first voltage-dividing resistor R11 is simulated. The resistors and switches for simulating faults at other positions can also be arranged in the same way.
On the basis of the above embodiment, in the embodiment of the present invention, in order to indicate the current simulated operation mode and facilitate a tester to check the fault injection condition, the test system for the metering performance self-monitoring capability of the electric energy meter provided in the embodiment of the present invention may further include: the first indicator light is connected in series with the current sampling simulation circuit, the second indicator light is connected in series with the current fault simulation circuit, the third indicator light is connected in series with the voltage sampling simulation circuit, and the fourth indicator light is connected in series with the voltage fault simulation circuit.
In specific implementation, according to the specific design scheme of the current sampling simulation circuit, the current fault simulation circuit, the voltage sampling simulation circuit and the voltage fault simulation circuit, indicator lamps are added to each branch. In design, a low resistance indicator lamp should be selected to minimize the impact on other components of the circuit.
Fig. 4 is a schematic structural diagram of another testing system for an electric energy meter metering performance self-monitoring capability according to an embodiment of the present invention.
In each embodiment of the invention, the switching device can be built by adopting a relay. On this basis, the system for testing the metering performance self-monitoring capability of the electric energy meter provided by the embodiment of the invention may further include an upper computer 401 connected to the control end of the switching device and the signal output end of the metering chip, and configured to control the switching of the switching device and receive self-diagnosis information uploaded by the metering chip.
In specific implementation, a control signal is sent to a relay of the switching device through the upper computer 401, so that a sampling simulation circuit or a fault simulation circuit is connected between a metering chip of the measured electric energy meter and the power supply device 101 to simulate the normal operation state or the fault state of the measured electric energy meter. Further referring to the metering fault simulation injection device 102 corresponding to fig. 2 and fig. 3, a control signal can be sent to the relays in the first switching device and the second switching device through the upper computer 401, so as to simulate the normal operation state and different fault modes of the measured electric energy meter.
A control script for the switching device may be programmed in advance so that the upper computer 401 controls the switching device to complete switching from a normal operation state to various failure modes. And the upper computer 401 can compare the self-diagnosis information with the corresponding control information of the switching device by writing an analysis script, and determine the measurement performance self-monitoring capability test result of the tested electric energy meter according to the comparison result.
If various failure modes listed in the above embodiments are simulated, the feedback signal of the metering chip of the measured electric energy meter is recorded for each failure mode, the detection accuracy and the detection time of the feedback signal are analyzed, and finally the feedback signal can be converted into a chart form for outputting so as to be conveniently viewed by a tester.
The test system for the metering performance self-monitoring capability of the electric energy meter provided by the invention is described in detail above. The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Claims (10)
1. A test system for the metering performance self-monitoring capability of an electric energy meter is characterized by comprising: the device comprises a power supply device and a metering fault simulation injection device;
the metering fault simulation injection device is arranged between the power supply device and a sampling signal input end of a metering chip of the tested electric energy meter, and comprises a sampling simulation circuit, a fault simulation circuit and a switching device for switching the sampling simulation circuit and the fault simulation circuit.
2. The test system according to claim 1, wherein the sampling simulation circuit comprises in particular a current sampling simulation circuit and a voltage sampling simulation circuit;
correspondingly, the fault simulation circuit specifically comprises a current fault simulation circuit and a voltage fault simulation circuit;
the power supply device specifically comprises a current source device and a voltage source device;
the switching device specifically comprises a first switching device for switching the current sampling simulation circuit and the current fault simulation circuit between the current source device and the current channel sampling signal end of the metering chip, and a second switching device for switching the voltage sampling simulation circuit and the voltage fault simulation circuit between the voltage source device and the voltage signal input end of the metering chip.
3. The test system of claim 2, wherein the current sampling simulation circuit specifically comprises: the circuit comprises a first shunt, a first resistor, a second resistor, a first sampling resistor, a second sampling resistor, a first capacitor and a second capacitor;
wherein, the first end of first resistance with current source device's positive pole is connected, the second end of first resistance with the first end of first shunt and the first end of first sampling resistance is connected, the second end of first shunt with the first end of second resistance and the first end of second sampling resistance is connected, the second end of second resistance with current source device's negative pole is connected, the second end of first sampling resistance with the first end of first electric capacity and the positive pole of measurement chip's current channel sampling signal end is connected, the second end of second sampling resistance with the first end of second electric capacity and the negative pole of measurement chip's current channel sampling signal end is connected, the second end of first electric capacity with the second end of second electric capacity all grounds.
4. The test system of claim 3, wherein the current fault simulation circuit specifically comprises: the second shunt, the third resistor and the fourth resistor;
the first end of the second shunt is connected with the anode of the current source device, and the second end of the second shunt is connected with the cathode of the current source device; the third resistor is connected in parallel to two ends of the first sampling resistor; the fourth resistor is connected in parallel to two ends of the second sampling resistor;
correspondingly, the first switching device specifically includes: the first switch, the second switch, the third switch, the fourth switch, the fifth switch, the sixth switch, the seventh switch, the eighth switch and the ninth switch;
a first end of the first switch is connected with a positive electrode of the current source device, and a second end of the first switch is connected with a negative electrode of the current source device; the second switch is arranged between the anode of the current source device and the first end of the second shunt; the third switch is connected in series on a branch where the first resistor, the second resistor and the first shunt are located; the fourth switch is connected between the first end of the first shunt and the first end of the first sampling resistor in series; the fifth switch is connected in series with the branch where the third resistor is located; the sixth switch is connected in parallel to two ends of the first sampling resistor; the seventh switch is connected in series between the second end of the first shunt and the first end of the second sampling resistor; the eighth switch is connected in series with the branch where the fourth resistor is located; the ninth switch is connected in parallel to two ends of the second sampling resistor.
5. The test system of claim 2, wherein the voltage sampling simulation circuit specifically comprises: a first voltage dividing resistor and a second voltage dividing resistor;
the first end of the first voltage-dividing resistor is connected with the first output end of the voltage source device, the second end of the first voltage-dividing resistor is connected with the first end of the second voltage-dividing resistor and the first voltage channel sampling signal end of the metering chip, and the second end of the second voltage-dividing resistor is connected with the second output end of the voltage source device and the second voltage channel sampling signal end of the metering chip.
6. The test system of claim 5, wherein the voltage fault simulation circuit specifically comprises: a fifth resistor and a sixth resistor;
the fifth resistor is connected in parallel to two ends of the first voltage dividing resistor, and the sixth resistor is connected in parallel to two ends of the second voltage dividing resistor;
correspondingly, the second switching device specifically includes: a tenth switch, an eleventh switch, a twelfth switch, a thirteenth switch, a fourteenth switch, and a fifteenth switch;
wherein the tenth switch is connected in series between the first output terminal of the voltage source device and the first terminal of the first voltage dividing resistor; the eleventh switch is connected in series between the second terminal of the second voltage-dividing resistor and the second output terminal of the voltage source device; the twelfth switch is connected in parallel to two ends of the first voltage dividing resistor; the thirteenth switch is connected in series with the branch where the fifth resistor is located; the fourteenth switch is connected in parallel to two ends of the second voltage-dividing resistor; and the fifteenth switch is connected in series with the branch where the sixth resistor is located.
7. The test system of claim 2, further comprising: the first indicator light is connected in series with the current sampling simulation circuit, the second indicator light is connected in series with the current fault simulation circuit, the third indicator light is connected in series with the voltage sampling simulation circuit, and the fourth indicator light is connected in series with the voltage fault simulation circuit.
8. Test system according to any of claims 1 to 7, characterized in that the switching device is embodied as a relay.
9. The test system according to claim 8, further comprising an upper computer connected to the control terminal of the switching device and the signal output terminal of the metering chip, for controlling the switching of the switching device and receiving self-diagnostic information uploaded by the metering chip.
10. The test system of claim 9, wherein the upper computer is further configured to compare the self-diagnosis information with corresponding control information for the switching device, and determine a measurement performance self-monitoring capability test result of the electrical energy meter to be tested according to the comparison result.
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