CN111341165A - Learning self-testing system - Google Patents
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Abstract
A learning self-test system, comprising: the system comprises a test question database, a login port, a guide unit, a storage unit, a question pushing unit, a correcting unit, an adjusting unit and a scoring unit; the test question database is used for storing test question texts; the login port is used for realizing login and data interaction of a user on the learning self-test system; the guiding unit is used for outputting a difficulty guiding interface when detecting that a user accesses the login port; the pushing unit is used for regularly reading the storage unit, extracting test question texts from the test question database and pushing the test question texts to the login port; the correction unit is used for judging whether the answer fed back by the user to the test question text is correct or incorrect; the adjusting unit is used for correspondingly adjusting the difficulty value p in the storage unit according to the judgment result; and the scoring unit is used for outputting the test score according to the user response. The scheme can realize the targeted detection of students, and the learning level test result of the students can be acquired efficiently.
Description
Technical Field
The invention belongs to the technical field of data processing, and particularly relates to a learning self-testing system.
Background
With the advancement of technology, networked learning approaches are beginning to emerge. Self-detection is an important ring indispensable for network learning. The self-test system of the existing online learning system has the following problems: the selection pertinence of test questions is poor, students with different levels can obtain the test questions through a large number of tests, the self-testing efficiency is low, and the time spent in the self-testing link is long. Therefore, how to design a new learning self-test system to overcome the above problems is a direction that needs to be studied by those skilled in the art.
Disclosure of Invention
The invention provides a learning self-testing system which can realize the targeted detection of students and can acquire the learning level test results of the students more efficiently.
The technical scheme is as follows:
a learning self-test system, comprising: the system comprises a test question database, a login port, a guide unit, a storage unit, a question pushing unit, a correcting unit, an adjusting unit and a scoring unit; the test question database is used for storing test question texts; a difficulty label P is arranged on the test question text; the login port is used for realizing login and data interaction of a user on the learning self-test system; the guiding unit is used for outputting a difficulty guiding interface when detecting that a user accesses a login port, receiving a difficulty value P selected by the user and outputting the difficulty value P to the storage unit, wherein the difficulty value P corresponds to the difficulty label P; the storage unit is used for storing a difficulty value p; the pushing unit is used for regularly reading the storage unit, extracting a test question text with a difficulty label p1 corresponding to the difficulty value p from the test question database and pushing the test question text to the login port; the correction unit is pre-stored with answer texts corresponding to the test question texts and used for reading login ports, carrying out correct and wrong judgment on answers fed back by the user to the test question texts and outputting judgment correct judgment t or wrong judgment f; the adjusting unit is used for reading the correcting unit and correspondingly adjusting the difficulty value p in the storage unit according to the judgment result; the scoring unit is used for reading the correcting unit and the storage unit, and outputting a test score according to the judgment result of the test question text corresponding to each difficulty value p by the user response.
Preferably, in the learning self-test system: the difficulty label p1 has a value in the range of 1 to 9.
More preferably, in the learning self-test system, the adjusting unit operates based on a prestored logic formula as follows: when the correction unit has not output the error judgment f and currently outputs the correct judgment t, the correction unit is based on the formula: "p 1= p0+2, and p1= 9" adjusted difficulty value p; when the correction unit has not output the correct decision t and currently outputs the incorrect decision f, based on the formula: "p 1= p0-2, and p1= 1" adjusting the difficulty value p; when the correction unit has output an erroneous determination f and currently outputs a correct determination t, based on the formula: "p 1= p0+ 1" adjusted difficulty value p; when the correction unit has output the correct decision t and currently outputs the incorrect decision f, based on the formula: adjusting the difficulty value p by 'p 1-p 0-1'; the p0 is the current difficulty value p, and the p1 is the adjusted difficulty value p.
More preferably, in the learning self-test system: the scoring unit is used for working according to the following prestored logic process: s1: if the correction unit outputs an error judgment f currently and the current difficulty value p =1, outputting a test score x =1 and resetting the storage unit; s2: if the correction judgment t is output by the correction unit currently and the current difficulty value p =1, outputting a test score x =9 and resetting the storage unit; s3: if the correction unit currently outputs the error judgment f and has output the error judgment f and the correct judgment t, outputting a test score x = p0-1 and resetting the storage unit; s4: if the correction unit currently outputs the correct decision t and has already output the erroneous decision f and the correct decision t, the test score x = p0 is output and the memory unit is reset.
Compared with the prior art, the technical scheme of the invention achieves the following technical effects:
under the condition that the number of the test questions in the question bank is the same, the learning level of the students on the knowledge points can be quickly detected through fewer test questions. Specifically, compared with the prior art, the invention realizes the following technical breakthroughs: (1) the method realizes the simultaneous test of a plurality of secondary knowledge points and simplifies the flow of the test of a plurality of knowledge points. (2) A plurality of test entries are set according to different test question difficulties, and a user can select a difficulty port matched with the actual situation of the user to enter a test before entering a test link, so that the number of the test questions is greatly reduced. (3) And the stage skipping test is realized, the test difficulty is prevented from being increased step by step, and the evaluation path is optimized.
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The invention is described in further detail in the following description of embodiments with reference to the accompanying drawings:
FIG. 1 is a system framework diagram of embodiment 1;
FIG. 2 is a schematic flow chart of example 1;
the corresponding relation between each reference mark and the part name is as follows:
1. a database of test questions; 2. logging in a port; 3. a guide unit; 4. a storage unit; 5. a question pushing unit; 6. a correction unit; 7. an adjustment unit; 8. and (4) scoring units.
Detailed Description
In order to more clearly illustrate the technical solution of the present invention, the above description will be further described with reference to various embodiments.
As shown in fig. 1:
a learning self-test system, comprising: the test question system comprises a test question database 1, a login port 2, a guiding unit 3, a storage unit 4, a question pushing unit 5, a correcting unit 6, an adjusting unit 7 and a scoring unit 8.
Wherein, the test question database 1 is used for storing test question texts; a difficulty label p1 is arranged on the test question text; the login port 2 is used for realizing login and data interaction of a user on the learning self-test system; the guiding unit 3 is used for outputting a difficulty guiding interface when detecting that a user accesses the login port 2, receiving a difficulty value P selected by the user and outputting the difficulty value P to the logic unit 4, wherein the difficulty value P corresponds to the difficulty label P; the storage unit 4 is used for storing a difficulty value p; the pushing unit 5 is used for regularly reading the storage unit 4, extracting the test question text with the difficulty label p1 corresponding to the difficulty value p from the test question database 1 and pushing the test question text to the login port 2; the batching unit 6 is pre-stored with answer texts corresponding to the test question texts and used for reading the login port 2, performing correct and wrong judgment on answers fed back by the user to the test question texts and outputting a judgment correct judgment t or a judgment wrong judgment f; the adjusting unit 7 is used for reading the correcting unit 6 and correspondingly adjusting the difficulty value p in the storage unit 4 according to the judgment result; the scoring unit 8 is used for reading the correcting unit 6 and the storage unit 4, outputting a test score x according to the judgment result of the user's reply to the test question text corresponding to each difficulty value p, and resetting the storage unit 4 after outputting the test score x.
In this example: the difficulty label p1 has a value in the range of 1 to 9. The adjustment unit 7 works based on a pre-stored logic formula as follows: when the correction unit 6 has not output the erroneous determination f and currently outputs the correct determination t, it is based on the formula: "p 1= p0+2, and p1= 9" adjusted difficulty value p; when the correction unit 6 has not output the correct decision t and currently outputs the incorrect decision f, it is based on the formula: "p 1= p0-2, and p1= 1" adjusting the difficulty value p; when the correction unit 6 has output the erroneous determination f and currently outputs the correct determination t, it is based on the formula: "p 1= p0+ 1" adjusted difficulty value p; when the correction decision t has been output by the correction unit 6 and the erroneous decision f is currently output, based on the formula: adjusting the difficulty value p by 'p 1-p 0-1'; the p0 is the current difficulty value p, and the p1 is the adjusted difficulty value p. The scoring unit 8 is configured to operate according to a pre-stored logic process as follows: s1: if the correcting unit 6 outputs the error judgment f currently and the current difficulty value p =1, outputting the test score x =1 and resetting the storage unit 4; s2: if the correcting unit 6 outputs the correct judgment t currently and the current difficulty value p =1, outputting the test score x =9 and resetting the storage unit 4; s3: if the correction unit 6 currently outputs the error determination f and has already output the error determination f and the correct determination t, the test score x = p0-1 is output and the storage unit 4 is reset; s4: if the correction unit 6 currently outputs the correct decision t and has already output the erroneous decision f and the correct decision t, the test score x = p0 is output and the storage unit 4 is reset.
Example 1:
setting the degree of difficulty to 1-3 for the level of seedling, 4-6 for the level of weak, and 7-9 for the level of super school. The initial port of the test item is set as seedling A, Weak school B and super school C, and the test is started by the test items with the difficulty of 2, 5 and 8 respectively. If the first question answer is correct, pushing the test questions in higher level, and if the first question answers incorrectly, pushing the test questions in lower level. In order to simplify the topic pushing process, a stage jump test mode is used in the topic pushing process. And determining the scope of the second topic according to the positive answer condition of the first topic. The test question difficulty interval from the grade jump of the grade A of the seedling to the grade Weak school B, the test question interval from the grade jump of the grade Weak school B to the grade BaC, or the test question interval from the grade jump to the seedling A. And if the test questions in the N level are answered correctly, the test questions in the N level are pushed, and if the test questions in the N level are pushed by mistake, the test questions in the N level are pushed. And repeating the steps until the mastery level of the students changing the knowledge points is detected after continuously pushing the questions for 3 to 4 times.
As shown in the above table: three second-level knowledge points are set under the first-level knowledge points for reading the literary languages, a user enters from a port A of a learning seedling, the system firstly pushes second-level difficulty test questions of translation of the second-level knowledge points, a student answers the second-level difficulty test questions pushed by a port B in the study in a later system skip stage mode, the student answers the second-level difficulty test questions pushed by a port C in the schooler in a later system skip stage mode, 8 and 9-level difficulty test questions corresponding to a port C in the scholar super, and the actual knowledge mastering level of the user at the second-level knowledge points is obtained. Similarly, the similar reasoning completes the question deduction of the second-level knowledge point 'real words' and 'information screening', and the evaluation result is positioned. The actual knowledge point mastering levels of the user 'translation', 'real word' and 'information screening' are all 9 levels.
Claims (4)
1. A learning self-test system, comprising: the system comprises a test question database (1), a login port (2), a guide unit (3), a storage unit (4), a question pushing unit (5), a correcting unit (6), an adjusting unit (7) and a scoring unit (8);
the test question database (1) is used for storing test question texts; a difficulty label P is arranged on the test question text;
the login port (2) is used for realizing login and data interaction of a user on the learning self-testing system;
the guiding unit (3) is used for outputting a difficulty guiding interface when detecting that a user accesses the login port (2), receiving a difficulty value P selected by the user and outputting the difficulty value P to the storage unit (4), wherein the difficulty value P corresponds to the difficulty label P;
the storage unit (4) is used for storing a difficulty value p;
the pushing unit (5) is used for reading the storage unit (4) at regular time, extracting the test question text with the difficulty label p1 corresponding to the difficulty value p from the test question database (1) and pushing the test question text to the login port (2);
the correction unit (6) is pre-stored with answer texts corresponding to the test question texts and used for reading the login port (2), carrying out correct and wrong judgment on answers fed back by the user to the test question texts and outputting judgment correct judgment t or wrong judgment f;
the adjusting unit (7) is used for reading the correcting unit (6) and correspondingly adjusting the difficulty value p in the storage unit (4) according to the judgment result;
the scoring unit (8) is used for reading the correcting unit (6) and the storage unit (4), outputting a test score x according to the judgment result of the user answering the test question text corresponding to each difficulty value p and resetting the storage unit (4) after outputting the test score x.
2. The learning self-test system of claim 1, wherein: the difficulty label p1 has a value in the range of 1 to 9.
3. Learning self-test system according to claim 2, characterized in that the adjustment unit (7) works based on a pre-stored logic formula:
when the correction unit (6) has not output the error judgment f and currently outputs the correct judgment t, the correction unit is based on the formula: "p 1= p0+2, and p1= 9" adjusted difficulty value p; when the correction unit (6) has not output the correct decision t and currently outputs the incorrect decision f, the method is based on the formula: "p 1= p0-2, and p1= 1" adjusting the difficulty value p; when the correction unit (6) has output an erroneous determination f and currently outputs a correct determination t, the correction is based on the formula: "p 1= p0+ 1" adjusted difficulty value p; when the correction unit (6) has output the correct decision t and currently outputs the incorrect decision f, based on the formula: adjusting the difficulty value p by 'p 1-p 0-1'; the p0 is the current difficulty value p, and the p1 is the adjusted difficulty value p.
4. The learning self-test system of claim 3, wherein: the scoring unit (8) is configured to operate according to a pre-stored logic process:
s1: if the correcting unit (6) outputs an error judgment f currently and the current difficulty value p =1, outputting a test score x =1 and resetting the storage unit (4);
s2: if the correction judgment t is currently output by the correcting unit (6) and the current difficulty value p =1, outputting a test score x =9 and resetting the storage unit (4);
s3: if the correction unit (6) currently outputs an error decision f and has already output an error decision f and a correct decision t, then a test score x = p0-1 is output and the storage unit (4) is reset;
s4: if the correction unit (6) currently outputs the correct decision t and has already output the erroneous decision f and the correct decision t, a test score x = p0 is output and the memory unit (4) is reset.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106652620A (en) * | 2016-12-29 | 2017-05-10 | 广东小天才科技有限公司 | Terminal assessment method and device |
| CN109559264A (en) * | 2018-11-27 | 2019-04-02 | 深圳市关运通科技有限公司 | A kind of method of examination and device based on test item bank |
| CN110147428A (en) * | 2019-04-11 | 2019-08-20 | 北京任学教育科技有限公司 | Update method, device, equipment and the storage medium of knowledge point master degree |
| CN110211441A (en) * | 2019-05-31 | 2019-09-06 | 上海乂学教育科技有限公司 | Automatic label item difficulty marks automatically, method for pushing and system |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106652620A (en) * | 2016-12-29 | 2017-05-10 | 广东小天才科技有限公司 | Terminal assessment method and device |
| CN109559264A (en) * | 2018-11-27 | 2019-04-02 | 深圳市关运通科技有限公司 | A kind of method of examination and device based on test item bank |
| CN110147428A (en) * | 2019-04-11 | 2019-08-20 | 北京任学教育科技有限公司 | Update method, device, equipment and the storage medium of knowledge point master degree |
| CN110211441A (en) * | 2019-05-31 | 2019-09-06 | 上海乂学教育科技有限公司 | Automatic label item difficulty marks automatically, method for pushing and system |
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Application publication date: 20200626 |