CN111064533B - Time delay measurement system, time delay measurement method, electronic device, and storage medium - Google Patents
Time delay measurement system, time delay measurement method, electronic device, and storage medium Download PDFInfo
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Abstract
The embodiment of the invention relates to the field of communication, and discloses a time delay measuring system, a time delay measuring method, electronic equipment and a storage medium. The invention comprises the following steps: the device comprises a signal generating device and an oscilloscope, wherein the signal generating device is connected with a time delay device to be tested and the oscilloscope; the signal generating device is used for generating a first reference signal according to the received first pulse width data and transmitting the first reference signal to the oscilloscope and the time delay device to be tested; the device to be tested delays the first reference signal according to the set delay amount to be tested, generates a first delay signal and transmits the first delay signal to the oscilloscope; and if the time delay difference value between the first time delay signal and the first reference signal is equal to the time delay amount to be measured, aligning the end time of the first reference signal displayed in the oscilloscope with the start time of the first time delay signal. According to the embodiment, the time delay to be measured of the time delay device to be measured can be accurately measured, and the time delay measurement cost is reduced.
Description
Technical Field
The embodiments of the present invention relate to the field of communications, and in particular, to a delay measurement system, a delay measurement method, an electronic device, and a storage medium.
Background
The principle of satellite and ground ranging is as follows: the distance between the satellite and the ground is calculated by measuring the transmission time delay of the electromagnetic waves between the satellite and the ground. The distance measurement principle is applied to the fields of national defense/communication and the like such as manned space, lunar exploration, satellite communication and the like, aiming at engineering application scenes with ultra-long distance (more than 30 kilometers), in order to realize verification of key indexes such as precision distance measurement/speed measurement and communication real-time performance, a large amount of high-precision time delay simulation is needed, the reliability of verification of the key indexes is determined by the time delay simulation, and therefore the time delay needs to be measured, and the accuracy of the time delay is ensured. The channel simulator can generate controllable time delay for electromagnetic wave signals, so that the distance measuring equipment can conveniently perform semi-physical simulation test in a laboratory, and the time delay function and the index verification can be completed in advance.
The inventor finds that at least the following problems exist in the prior art: at present, high-precision time delay measuring equipment is needed for measuring the time delay of a channel simulator, but the high-precision time delay measuring equipment is very expensive; the cheap time delay measuring equipment has low measuring precision, can only realize the measurement of millisecond level, and has very poor measuring accuracy of microsecond level.
Disclosure of Invention
An object of embodiments of the present invention is to provide a time delay measurement system, a time delay measurement method, an electronic device, and a storage medium, so that a time delay to be measured of a time delay device to be measured can be accurately measured, and a cost of time delay measurement is reduced.
To solve the above technical problem, an embodiment of the present invention provides a delay measurement system, including: the device comprises a signal generating device and an oscilloscope, wherein the signal generating device is connected with a time delay device to be tested and the oscilloscope; the signal generating device is used for generating a first reference signal according to the received first pulse width data and transmitting the first reference signal to the oscilloscope and the time delay device to be tested, wherein the first pulse width data is set as a time delay amount generated by the time delay device to be tested, the period of the first reference signal is N times of the first pulse width data, and N is an integer greater than 1; the device to be tested delays the first reference signal according to the set delay amount to be tested, generates a first delay signal and transmits the first delay signal to the oscilloscope; the oscilloscope is used for simultaneously displaying the received first reference signal and the first time delay signal, wherein if the time delay difference value between the first time delay signal and the first reference signal is equal to the first pulse width data, the end time of the first reference signal displayed in the oscilloscope is aligned with the start time of the first time delay signal.
The embodiment of the present invention further provides a method for measuring a time delay, which is applied to a signal generating apparatus in the time delay measuring system, and the method includes: receiving first pulse width data, wherein the first pulse width data is set as a time delay amount generated by a time delay device to be tested, the period of a first reference signal is N times of the first pulse width data, N is an integer greater than 1, and the frequency of the first reference signal is set as the working frequency of the time delay device to be tested; generating a first reference signal according to the first pulse width data, transmitting the first reference signal to the oscilloscope and the time delay device to be tested, displaying the first reference signal by the oscilloscope and delaying the first reference signal by the time delay device to be tested to generate a first time delay signal, and simultaneously displaying the first reference signal and the first time delay signal by the oscilloscope; and if the time delay difference value between the first time delay signal and the first reference signal is equal to the first pulse width data, aligning the end time of the first reference signal displayed in the oscilloscope with the start time of the first time delay signal.
An embodiment of the present invention also provides an electronic device, including: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to cause the at least one processor to perform the method of latency measurement as described above.
Embodiments of the present invention also provide a computer-readable storage medium storing a computer program, which when executed by a processor implements the method for time delay measurement described above.
Compared with the prior art, the embodiment of the invention has the advantages that the signal generating device is used for generating the first reference signal according to the received first pulse width data, the first pulse width data is the time delay amount generated by the time delay device to be detected, the period of the first reference signal is N times of the first pulse width data, the time delay device to be detected delays the first reference signal according to the time delay amount to be detected, the oscilloscope is used for simultaneously displaying the received first reference signal and the first time delay signal, the end time of the first reference signal displayed in the oscilloscope is aligned with the start time of the first time delay signal under the condition that the time delay difference value between the first time delay signal and the first reference signal is equal to the first pulse width data, and the oscilloscope only needs to display the end time of the first reference signal and the start time of the first time delay signal without displaying the waveforms of the first reference signal and the first time delay signal, after the oscilloscope is amplified to nanosecond level, the ending time of the first reference signal and the starting time of the first time delay signal can still be accurately displayed, and an accurate basis is provided for judging whether the time delay of the time delay device to be tested is accurate; the time delay function of the time delay device to be measured is accurately measured by the oscilloscope, and the cost of the time delay measurement is greatly reduced due to the low cost of the oscilloscope and the simple connection of the system; in addition, the first reference signal is the first pulse width data multiplied by N, so that the end time of the first reference signal can be aligned with the start time of the first time delay signal conveniently under the condition that the time delay to be measured is accurate.
In addition, the signal generating device is set to be in a burst mode for providing a burst pulse signal, and the operating frequency of the signal generating device is set to be the operating frequency of the time delay device to be tested. The first reference signal and the first time delay signal displayed by the oscilloscope are conveniently and visually checked because the burst pulse signal generates a signal with a specified period.
In addition, the time delay amount generated by the time delay device to be tested comprises: the time delay to be measured and the inherent time delay amount of the time delay device to be measured. Because the first pulse width data of the first reference signal is equal to the time delay amount generated by the time delay device to be measured, that is, the first pulse width data comprises the time delay amount to be measured and the inherent time delay amount of the time delay device to be measured, the accuracy of time delay measurement of the time delay device to be measured is further improved because the inherent time delay amount is considered.
In addition, the oscilloscope is set to the trigger mode of operation, and the trigger source is set to the rising edge of the first time delay signal. In the trigger operation mode, the trigger source is set to the rising edge of the first time delay signal, so that the oscilloscope can stably display the first reference signal and the first time delay signal.
In addition, the signal generating device includes: the power divider comprises a signal source unit and a first power divider; the output end of the signal source unit is used for connecting a first power divider, and the output end of the first power divider is used for respectively connecting a first channel of the oscilloscope and the input end of the time delay device to be tested; and the output end of the time delay device to be tested is used for connecting a second channel of the oscilloscope. Through the first power divider, two identical first reference signals can be obtained quickly and accurately.
In addition, the delay measurement system further includes: a second power divider; the input end of the second power divider is used for connecting a first reference clock of the signal source unit, and the output end of the second power divider is used for respectively connecting a second reference clock of the delay device to be tested and a third reference clock of the oscilloscope. Through the second power divider, the time synchronization of the signal source unit, the time delay device to be tested and the oscilloscope can be quickly realized.
Drawings
One or more embodiments are illustrated by way of example in the accompanying drawings, which correspond to the figures in which like reference numerals refer to similar elements and which are not to scale unless otherwise specified.
Fig. 1 is a schematic structural diagram of a delay measurement system according to a first embodiment of the present invention;
FIG. 2 is a schematic waveform diagram of an oscilloscope display provided according to a first embodiment of the present invention;
fig. 3 is a schematic structural diagram of a delay measurement system according to a second embodiment of the present invention;
fig. 4 is a detailed flowchart of a method for measuring delay according to a third embodiment of the present invention;
fig. 5 is a detailed flowchart of a method for measuring delay according to a fourth embodiment of the present invention;
fig. 6 is a schematic structural diagram of an electronic device according to a third embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, embodiments of the present invention will be described in detail below with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that numerous technical details are set forth in order to provide a better understanding of the present application in various embodiments of the present invention. However, the technical solution claimed in the present application can be implemented without these technical details and various changes and modifications based on the following embodiments.
The following embodiments are divided for convenience of description, and should not constitute any limitation to the specific implementation manner of the present invention, and the embodiments may be mutually incorporated and referred to without contradiction.
At present, satellite ranging indexes are higher and higher, nanosecond ns-level precision requirements are provided for time delay indexes of a channel simulator, and after the high-precision design of the channel simulator is completed, the time delay function of the channel simulator needs to be measured and verified to ensure that the channel simulator generates accurate time delay indexes. The inventor finds that a vector network analyzer is generally used for measuring shorter time delay, but the measuring time delay range of the measuring mode is limited, the requirement of time delay test of hundreds of ms cannot be met, and the use cost of the vector network analyzer is high; and the measurement precision of the cheap time delay measurement equipment is low, and only millisecond-level measurement can be realized.
A first embodiment of the present invention relates to a delay measurement system. The specific structure of the delay measurement system 1 is shown in fig. 1, and includes: a signal generating device 10 and an oscilloscope 20. The signal generating device 10 is connected with the time delay device 30 to be tested and the oscilloscope 20, and the time delay device 30 to be tested is connected with the oscilloscope 20.
The signal generating device 10 is configured to generate a first reference signal according to the received first pulse width data, and transmit the first reference signal to the oscilloscope 20 and the delay device 30 to be tested, where the first pulse width data is set as a delay amount generated by the delay device 30 to be tested, a period of the first reference signal is N times that of the first pulse width data, and N is an integer greater than 1; the device to be tested delays the first reference signal according to the set delay amount to be tested, generates a first delay signal and transmits the first delay signal to the oscilloscope; the oscilloscope is used for simultaneously displaying the received first reference signal and the first time delay signal, wherein if the time delay difference value between the first time delay signal and the first reference signal is equal to the first pulse width data, the end time of the first reference signal displayed in the oscilloscope is aligned with the start time of the first time delay signal.
Specifically, the frequency range of the signal output of the signal generating device 10 satisfies the operating frequency range of the delay device 30 to be measured, the bandwidth range of the oscilloscope 20 satisfies the measuring range of the operating frequency of the delay device 30 to be measured, the oscilloscope 20 may be a dual-channel oscilloscope for displaying the waveforms of two channels at the same time, and the dual-channel oscilloscope has a trigger input mode. The delay device 30 to be measured may be a channel simulator having a delay function, and may delay a received signal by setting a delay amount. The signal generating device 10, the oscilloscope 20 and the delay device 30 to be tested can be connected through radio frequency cables.
After the signal generating device 10, the oscilloscope 20 and the delay device 30 to be measured are connected, and before the delay measuring system 1 measures the delay device 30 to be measured, the measurement system 10 to be measured may be debugged first to ensure the accuracy of the delay measuring system 1 before measurement.
Specifically, if the inherent delay amount of the delay device under test 30 is known, the inherent delay amount of the delay device under test can be calibrated first; if the inherent delay amount of the delay device to be tested is unknown, the inherent delay amount of the delay device to be tested can be determined based on the signal generating device 10 and the oscilloscope 20.
In one example, the signal generating apparatus 10 is set to burst mode for providing burst pulse signal, and the operating frequency of the signal generating apparatus 10 is set to the operating frequency of the delay apparatus 30 to be tested.
The signal generating device 10 is set to a burst mode for the oscilloscope to display the first reference signal and the first delayed signal. The working frequency of the signal generating device 10 is set to the working frequency of the time delay device to be measured, so that the interference in the measuring process can be reduced. The oscilloscope 20 may be set to the trigger mode of operation with the trigger source set to the rising edge of the first time delay signal.
The process of debugging is described in detail below:
the delay device under test 30 is set to 0 delay to measure the inherent delay amount of the delay device under test; the preset pulse width received by the signal generating device 10 generates a test signal, and transmits the test signal to the oscilloscope 20 and the delay device 30 to be tested, wherein the working frequency of the signal generating device 10 is equal to the working frequency of the delay device 30 to be tested, and the test signal with a preset period is generated, and the preset period can be 10000 us; since the delay device 30 to be tested has the inherent delay amount, the delay device 30 to be tested receives the test signal and then delays the test signal to obtain the delayed test signal. The oscilloscope 20 displays the test signal and the delay test signal at the same time, if the ending time of the test signal displayed by the oscilloscope 20 is aligned with the starting time of the delay test signal, the debugging is directly finished, if the ending time of the test signal displayed by the oscilloscope 20 is not aligned with the starting time of the delay test signal, the signal generating device 30 receives an adjusting instruction, and adjusts the pulse width of the test signal until the ending time of the test signal displayed on the oscilloscope 20 is aligned with the starting time of the delay test signal. And determining the inherent delay amount of the delay device to be tested based on the adjusted pulse width of the test signal, for example, subtracting the pulse width value before the adjustment from the value of the adjusted pulse width to obtain the inherent delay amount, wherein the pulse width value before the adjustment and the pulse width value after the adjustment can be provided by the signal generating device.
The debugging process is described below with a specific example, where the delay device to be tested takes a channel simulator as an example:
the delay of the channel simulator is set to 0; the signal generating means receives a set command, e.g. set to burst mode, with an operating frequency equal to the operating frequency of the channel simulator, and in order to facilitate determination of the inherent delay, the test signal may have a pulse width of 1us and a period of 10000 us. The oscilloscope 20 is set to an internally triggered mode of operation, the trigger source being designated as the rising edge of the delayed test signal. After the oscilloscope 20 is started, simultaneously displaying the test signal and the delay test signal, if the ending time of the displayed test signal is aligned with the starting time of the delay test signal, ending the debugging, and determining the inherent delay as 0; if the ending time of the displayed test signal is not aligned with the starting time of the delay test signal, the inherent delay of the channel simulator is not 0, the signal generating device receives an adjusting instruction, adjusts the pulse width of the test signal until the ending time of the test signal displayed on the oscilloscope is aligned with the starting time of the delay test signal, and takes the adjusted pulse width of the test signal as the inherent delay of the channel simulator.
In one example, the delay measurement system may be debugged to measure the delay device under test. The time delay amount generated by the time delay device to be tested comprises the following steps: the time delay to be measured and the inherent time delay amount of the time delay device to be measured.
For example, the inherent delay amount of the delay device 30 to be measured is Nus, the delay amount to be measured is Xus, and the first pulse width data is (X + N) us; the period of the first reference signal may be 3(X + N) us, and the frequency is the working frequency of the delay device to be measured; consistent with the debugging process, the oscilloscope 20 is set to a trigger mode of operation, the trigger source being the rising edge of the first delay signal. The oscilloscope 20 receives the first reference signal, and in addition, the first reference signal passes through the delay device 30 to be tested to generate a first delay signal, the delay device 30 to be tested should theoretically generate a delay of (X + N) us, if a delay difference value between the first delay signal and the first reference signal is equal to the first pulse width data, an end time of the first reference signal displayed in the oscilloscope is aligned with a start time of the first delay signal, a waveform after the alignment may be as shown in fig. 2, and it can be seen that after the alignment, the delay difference value between the first delay signal and the first reference signal is equal to (X + N) us; and if the time delay difference value between the first time delay signal and the first reference signal is not equal to the first pulse width data, the end time of the first reference signal displayed in the oscilloscope is not aligned with the start time of the first time delay signal.
It should be noted that the ending time of the first reference signal displayed in the oscilloscope 20 is not aligned with the starting time of the first delay signal, which indicates that the delay amount to be measured of the delay device 30 to be measured is inaccurate and needs to be calibrated, and the delay device 30 to be measured can receive the calibration instruction and adjust the generated delay amount to be measured until the ending time of the first reference signal displayed in the oscilloscope is aligned with the starting time of the first delay signal.
Compared with the prior art, the embodiment of the invention has the advantages that the signal generating device is used for generating the first reference signal according to the received first pulse width data, the first pulse width data is the time delay amount generated by the time delay device to be detected, the period of the first reference signal is N times of the first pulse width data, the time delay device to be detected delays the first reference signal according to the time delay amount to be detected, the oscilloscope is used for simultaneously displaying the received first reference signal and the first time delay signal, the end time of the first reference signal displayed in the oscilloscope is aligned with the start time of the first time delay signal under the condition that the time delay difference value between the first time delay signal and the first reference signal is equal to the first pulse width data, and the oscilloscope only needs to display the end time of the first reference signal and the start time of the first time delay signal without displaying the waveforms of the first reference signal and the first time delay signal, after the oscilloscope is amplified to nanosecond level, the ending time of the first reference signal and the starting time of the first time delay signal can still be accurately displayed, and an accurate basis is provided for judging whether the time delay of the time delay device to be tested is accurate; the time delay function of the time delay device to be measured is accurately measured by the oscilloscope, and the cost of the time delay measurement is greatly reduced due to the low cost of the oscilloscope and the simple connection of the system; in addition, the first reference signal is the first pulse width data multiplied by N, so that the end time of the first reference signal can be aligned with the start time of the first time delay signal conveniently under the condition that the time delay to be measured is accurate.
A second embodiment of the present invention relates to a delay measurement system. The second embodiment is a further improvement of the first embodiment, and the main improvements are as follows: in the second embodiment of the present invention, the signal generating apparatus 10 includes: a signal source unit 101 and a first power divider 102. The specific structure of the delay measurement system is shown in fig. 3:
the signal generating apparatus 10 includes: a signal source unit 101 and a first power divider 102; the output end of the signal source unit 101 is used for connecting the first power divider 102, and the output end of the first power divider 102 is used for respectively connecting the first channel of the oscilloscope 20 and the input end of the delay device 30 to be tested; the output end of the delay device 30 to be tested is used for connecting with the second channel of the oscilloscope 20.
The first reference signal generated by the signal source unit 101 can be divided into two by the first power divider 102, and the oscilloscope 20 displays through two channels, so that a user can observe a display image of the oscilloscope 20 conveniently.
In one example, the delay measurement system further comprises: a second power divider 40; an input end of the second power divider 40 is configured to be connected to the first reference clock of the signal source unit 101, and an output end of the second power divider 40 is configured to be connected to the second reference clock of the delay device 30 to be measured and the third reference clock of the oscilloscope 20, respectively.
Specifically, for the accuracy of measurement, clocks between the devices need to be synchronized, and in this embodiment, the clocks between the devices may be synchronized through a power divider, where the first reference clock, the second reference clock, and the third reference clock may all be 10MHz reference clocks.
In the time delay measurement system provided by this embodiment, the first power divider can accurately generate two identical first reference signals, so as to ensure measurement accuracy, and the second power divider is used to implement clock synchronization of each device, so as to further ensure measurement accuracy.
It should be noted that each module referred to in this embodiment is a logical module, and in practical applications, one logical unit may be one physical unit, may be a part of one physical unit, and may be implemented by a combination of multiple physical units. In addition, in order to highlight the innovative part of the present invention, elements that are not so closely related to solving the technical problems proposed by the present invention are not introduced in the present embodiment, but this does not indicate that other elements are not present in the present embodiment.
A third embodiment of the present invention relates to a method for measuring a time delay, which is applied to a signal generating device in a time delay measuring system in the first embodiment or the second embodiment, and a specific flow of the method for measuring a time delay is shown in fig. 4:
step 301: receiving first pulse width data, wherein the first pulse width data is set as a time delay amount generated by a time delay device to be tested, the period of a first reference signal is N times of the first pulse width data, N is an integer greater than 1, and the frequency of the first reference signal is set as the working frequency of the time delay device to be tested.
Specifically, the structure of the delay measurement system is as in the first embodiment or the second embodiment, and details of the structure of the delay measurement system are not repeated here. The first pulse width data may be obtained after being input by a user through an input component of the signal generating device, or may be obtained after being input by other third-party equipment, and may be specifically determined according to actual needs. The first pulse width data is set as the time delay amount generated by the time delay device to be tested, and the output frequency range of the signal generation device meets the working frequency range of the time delay device to be tested. The signal generating device may have a burst mode and be set to the burst mode, and the burst mode is used for providing a burst pulse signal for the oscilloscope to display the first reference signal and the first delay signal.
Step 302: generating a first reference signal according to the first pulse width data, transmitting the first reference signal to the oscilloscope and the time delay device to be tested, allowing the oscilloscope to display the first reference signal and allowing the time delay device to be tested to delay the first reference signal to generate a first time delay signal, and allowing the oscilloscope to simultaneously display the first reference signal and the first time delay signal;
specifically, the signal generating device generates a first reference signal according to the first pulse width data, and transmits the first reference signal to the oscilloscope for displaying by the oscilloscope; and simultaneously sending the first reference signal to a time delay device to be detected, delaying the first reference signal by the time delay device to be detected according to the time delay amount to be detected to obtain a first time delay signal, sending the first time delay signal to an oscilloscope by the time delay device to be detected, simultaneously displaying the first reference signal and the first time delay signal by the oscilloscope, and aligning the ending time of the first reference signal displayed in the oscilloscope with the starting time of the first time delay signal if the time delay difference value between the first time delay signal and the first reference signal is equal to the time delay amount to be detected.
It should be understood that this embodiment is an example of a method corresponding to the signal generating apparatus in the first embodiment, and the present embodiment can be implemented in cooperation with the first embodiment. The related technical details mentioned in the first embodiment are still valid in this embodiment, and are not described herein again in order to reduce repetition. Accordingly, the related-art details mentioned in the present embodiment can also be applied to the first embodiment.
A fourth embodiment of the present invention relates to a method for measuring a time delay. The fourth embodiment is a further improvement of the third embodiment, and the main improvements are as follows: in the fourth embodiment of the present invention, before receiving the first pulse width data, the pulse width of the test signal is debugged so that the end time of the test signal displayed on the oscilloscope is aligned with the start time of the delayed test signal when the delay amount to be measured is 0. The specific flow of the method for measuring the time delay is shown in fig. 5.
Step 401: the test signal is generated according to the preset pulse width that is set.
The preset pulse width can be set according to actual needs, and can be 1us, for example. The preset pulse width can be input by a user or other equipment, and the signal generating device receives the preset pulse width and generates a test signal according to the preset pulse width.
Step 402: and transmitting the test signal to the oscilloscope and the time delay device to be tested for the oscilloscope to display the test signal, and delaying the test signal by the time delay device to be tested according to the time delay to be tested to generate a time delay test signal and transmitting the time delay test signal to the oscilloscope, wherein the time delay amount to be tested is 0.
Specifically, the time delay generated by the time delay device includes the set time delay to be measured and the inherent time delay of the time delay device to be measured. The time delay amount to be tested of the time delay device to be tested is set to be 0, the signal generating device transmits a signal to be tested to the oscilloscope and the time delay device to be tested, the test signal passes through the time delay device to be tested to generate a time delay test signal, the time delay test signal is obtained after the time delay device to be tested performs inherent time delay amount, and the oscilloscope simultaneously displays the test signal and the time delay test signal.
Step 403: and receiving an adjusting instruction, and adjusting the pulse width of the test signal so as to align the end time of the test signal displayed on the oscilloscope with the start time of the delay test signal, wherein the adjusted pulse width of the test signal is used for determining the inherent delay amount of the delay device to be tested.
Specifically, if the ending time of the test signal displayed on the oscilloscope is not aligned with the starting time of the delay test signal, which indicates that the inherent delay amount is not 0, the user may input an adjustment instruction to the signal generation device, or send an adjustment instruction to another third-party device, to adjust the pulse width of the test signal, so that the ending time of the test signal displayed on the oscilloscope is aligned with the starting time of the delay test signal. The adjusted pulse width of the test signal may be used to determine an inherent delay amount of the delay device to be tested, for example, the inherent delay amount may be obtained by subtracting a value of the pulse width before the adjustment from a value of the pulse width after the adjustment, wherein the values of the pulse width before the adjustment and the pulse width after the adjustment may be provided by the signal generating device.
Step 404: first pulse width data is received.
Step 405: and generating a first reference signal according to the first pulse width data, and transmitting the first reference signal to the oscilloscope and the time delay device to be tested.
A fifth embodiment of the present invention relates to an electronic device, which has a specific structure as shown in fig. 6 and includes at least one processor 501; and a memory 502 communicatively coupled to the at least one processor 501; the memory 502 stores instructions executable by the at least one processor 501, and the instructions are executed by the at least one processor 501, so that the at least one processor 501 can execute the method for measuring latency in the third embodiment or the fourth embodiment.
The memory 502 and the processor 501 are connected by a bus, which may include any number of interconnected buses and bridges that link one or more of the various circuits of the processor 501 and the memory 502. The bus may also link various other circuits such as peripherals, voltage regulators, power management circuits, and the like, which are well known in the art, and therefore, will not be described any further herein. A bus interface provides an interface between the bus and the transceiver. The transceiver may be one element or a plurality of elements, such as a plurality of receivers and transmitters, providing a means for communicating with various other apparatus over a transmission medium. The data processed by the processor 501 is transmitted over a wireless medium through an antenna, which further receives the data and transmits the data to the processor 501.
The processor 501 is responsible for managing the bus and general processing and may also provide various functions including timing, peripheral interfaces, voltage regulation, power management, and other control functions. And the memory may be used to store data used by the processor in performing operations.
A sixth embodiment of the present invention relates to a computer-readable storage medium storing a computer program for executing the method for time delay measurement according to the third or fourth embodiment by a processor.
Those skilled in the art can understand that all or part of the steps in the method of the foregoing embodiments may be implemented by a program to instruct related hardware, where the program is stored in a storage medium and includes several instructions to enable a device (which may be a single chip, a chip, etc.) or a processor (processor) to execute all or part of the steps of the method described in the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific examples for carrying out the invention, and that various changes in form and details may be made therein without departing from the spirit and scope of the invention in practice.
Claims (9)
1. A delay measurement system, comprising: the device comprises a signal generating device and an oscilloscope, wherein the signal generating device is connected with a time delay device to be tested and the oscilloscope;
the signal generating device is used for generating a first reference signal according to the received first pulse width data and transmitting the first reference signal to the oscilloscope and the time delay device to be tested, wherein the first pulse width data is set as a time delay amount generated by the time delay device to be tested, the period of the first reference signal is N times of the first pulse width data, and N is an integer greater than 1;
the device for time delay to be measured delays the first reference signal according to the set time delay to be measured, generates a first time delay signal and transmits the first time delay signal to the oscilloscope;
the oscilloscope is configured to simultaneously display the received first reference signal and the first time delay signal, wherein if a time delay difference between the first time delay signal and the first reference signal is equal to the first pulse width data, an ending time of the first reference signal displayed in the oscilloscope is aligned with a starting time of the first time delay signal;
the time delay amount generated by the time delay device to be tested comprises the set time delay amount to be tested and the inherent time delay amount of the time delay device to be tested;
the system further comprises: a test module for testing the operation of the electronic device,
the test module is used for transmitting a test signal to the oscilloscope and the to-be-tested time delay device before receiving the first pulse width data, so that the oscilloscope displays the test signal, and the to-be-tested time delay device delays the test signal according to-be-tested time delay to generate a delay test signal and transmits the delay test signal to the oscilloscope, wherein the to-be-tested time delay amount is 0; and receiving an adjusting instruction, and adjusting the pulse width of the test signal so as to align the end time of the test signal displayed on the oscilloscope with the start time of the delay test signal, wherein the adjusted pulse width of the test signal is used for determining the inherent delay amount of the delay device to be tested.
2. The delay measurement system of claim 1, wherein the signal generating device is set to a burst mode for providing a burst pulse signal, and an operating frequency of the signal generating device is set to an operating frequency of the delay device under test.
3. The delay measurement system according to claim 1 or 2, wherein the delay amount generated by the delay device under test comprises: and the time delay to be measured and the inherent time delay of the time delay device to be measured.
4. The latency measurement system of claim 1 or 2, wherein the oscilloscope is set to a trigger mode of operation and the trigger source is set to a rising edge of the first latency signal.
5. The delay measurement system of claim 3, wherein the signal generating means comprises: the power divider comprises a signal source unit and a first power divider;
the output end of the signal source unit is used for connecting the first power divider, and the output end of the first power divider is used for respectively connecting a first channel of the oscilloscope and the input end of the delay device to be tested;
and the output end of the time delay device to be tested is used for connecting a second channel of the oscilloscope.
6. The latency measurement system of any one of claims 1 to 2, further comprising: a second power divider;
the input end of the second power divider is used for connecting a first reference clock of a signal source unit, and the output end of the second power divider is used for respectively connecting a second reference clock of the delay device to be tested and a third reference clock of the oscilloscope.
7. A method for measuring time delay, which is applied to a signal generating device in the time delay measuring system according to any one of claims 1 to 6, and comprises:
receiving first pulse width data, wherein the first pulse width data is set as a time delay amount generated by a time delay device to be tested, the period of a first reference signal is N times of the first pulse width data, N is an integer greater than 1, and the frequency of the first reference signal is set as the working frequency of the time delay device to be tested;
generating a first reference signal according to the first pulse width data, transmitting the first reference signal to the oscilloscope and the time delay device to be tested, displaying the first reference signal by the oscilloscope and delaying the first reference signal by the time delay device to be tested to generate a first time delay signal, and simultaneously displaying the first reference signal and the first time delay signal by the oscilloscope;
if the time delay difference value between the first time delay signal and the first reference signal is equal to the first pulse width data, the ending time of the first reference signal displayed in the oscilloscope is aligned with the starting time of the first time delay signal;
the time delay amount generated by the time delay device to be tested comprises the set time delay amount to be tested and the inherent time delay amount of the time delay device to be tested;
before the receiving the first pulse width data, the method for measuring time delay further includes:
generating a test signal according to the preset pulse width;
transmitting the test signal to the oscilloscope and the time delay device to be tested, allowing the oscilloscope to display the test signal, and allowing the time delay device to be tested to delay the test signal according to the time delay to be tested, generating a time delay test signal and transmitting the time delay test signal to the oscilloscope, wherein the time delay to be tested is 0;
and receiving an adjusting instruction, and adjusting the pulse width of the test signal so as to align the end time of the test signal displayed on the oscilloscope with the start time of the delay test signal, wherein the adjusted pulse width of the test signal is used for determining the inherent delay amount of the delay device to be tested.
8. An electronic device, comprising:
at least one processor; and the number of the first and second groups,
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of latency measurement of claim 7.
9. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the method of delay measurement of claim 7.
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