CN111044882A - Fool-proof automatic testing device for 220V load and voltage - Google Patents
Fool-proof automatic testing device for 220V load and voltage Download PDFInfo
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- CN111044882A CN111044882A CN201911384917.5A CN201911384917A CN111044882A CN 111044882 A CN111044882 A CN 111044882A CN 201911384917 A CN201911384917 A CN 201911384917A CN 111044882 A CN111044882 A CN 111044882A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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Abstract
The invention relates to a fool-proof automatic testing device for 220V load and voltage, which comprises: a voltage test circuit, the voltage test circuit comprising: the device comprises a first singlechip IC1, a voltage acquisition circuit, a first dial switch circuit, a tool switch output end circuit and a first trigger signal circuit; the voltage acquisition circuit is connected with the first single-chip microcomputer IC1, and the first dial switch circuit is connected with the first single-chip microcomputer IC1 and used for selecting a voltage test channel and selecting two pins to be short-circuited; the tool switch output end circuit and the first trigger signal circuit are respectively connected with the first single chip microcomputer IC 1; the load test circuit comprises a second singlechip IC2, a second dial switch circuit and a load test isolation circuit; the display panel circuit is connected with the load test circuit, and the power supply circuit supplies power to the voltage test circuit and the load test circuit respectively. The invention has the beneficial effects that: effectively prevent production defective products and flow out, ensure production quality.
Description
Technical Field
The invention particularly relates to a fool-proof automatic testing device for 220V load and voltage.
Background
The production circuit needs to be tested to ensure the quality of the production circuit.
The conventional measurement method has the following defects.
1. It is necessary to observe a plurality of load lamps, and usually each load lamp is lighted for no more than 1 second, and there is a possibility of overlooking in a time period of a large test quantity.
2. The data of the voltmeter needs to be observed by human eyes, and the data are easy to overlook or judge wrongly.
The quality reliability is low because the method depends too much on human eye observation and judgment, and defective products are easy to flow to the next process and even the hands of customers.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a fool-proof automatic testing device for 220V load and voltage, which can effectively prevent production defective products from flowing out and ensure the production quality.
The invention describes a fool-proof automatic testing device for 220V load and voltage, 1. the fool-proof automatic testing device for 220V load and voltage comprises the following components.
The voltage test circuit is used for detecting whether the voltage of the product circuit meets the standard or not; the voltage test circuit includes: the first singlechip IC1, voltage acquisition circuit, first dial switch circuit, connect frock switch output circuit and first trigger signal circuit.
The voltage acquisition circuit is connected with the first singlechip IC1 and is used for collecting voltage information and outputting the voltage information to the voltage test circuit; the first dial switch circuit is connected with the first singlechip IC1 and is used for selecting a voltage test channel and selecting two pins to be short-circuited; the tool switch output end circuit and the first trigger signal circuit are respectively connected with the first single chip microcomputer IC 1; the first singlechip IC1 is connected with an OK1 lamp.
The load test circuit is used for detecting whether the load capacity of the product circuit meets the standard or not; the load test circuit comprises a second singlechip IC2, a second dial switch circuit and a load test isolation circuit; the second dial switch circuit is connected with the second singlechip IC2 and is used for selecting a load test channel; the load test isolation circuit is connected with the second single-chip microcomputer IC2 and used for performing test isolation and protecting the second single-chip microcomputer IC 2.
And the display panel circuit is connected with the load test circuit and displays the result output by the load test circuit.
And the power supply circuit supplies power to the voltage test circuit and the load test circuit respectively.
Specifically, the voltage test circuit is connected with an IC1 single chip microcomputer reset circuit, the IC1 single chip microcomputer reset circuit comprises a first key switch RET1, a first reset connector BCP, a third resistor R3 and a first capacitor C1, one ends of the first key switch RET1, the third resistor R3 and the first capacitor C1 are connected to form a common end, and the common end is connected with a pin 6 of the first reset connector BCP.
It is specifically further that the voltage acquisition circuit includes first voltage acquisition circuit and second voltage acquisition circuit, and first voltage acquisition circuit includes that first collection connects C0N1 and resistance group, and first collection connects C0N1 and resistance group to be connected, and second voltage acquisition circuit includes that second collection connects C0N2 and resistance group, and second collection connects C0N2 and resistance group to be connected.
Specifically, the load test circuit is further connected to a load reset circuit, the load reset circuit includes a second key switch RET2, a second reset terminal ISCP2, a ninth resistor R9 and a fifth capacitor C5, one end of the second key switch RET2, one end of the ninth resistor R9 and one end of the fifth capacitor C5 are connected to a common terminal, and the common terminal is connected to pin 6 of the second reset ISCP 2.
Specifically, further, the first dial switch circuit comprises a first dial switch BM1, a second dial switch BM2 and a third dial switch BM3, the first dial switch BM1, the second dial switch BM2 and the third dial switch BM3 are respectively connected with the first single chip microcomputer IC1, and the trigger signal circuit comprises a trigger joint CF and a trigger resistor group.
Specifically, the tooling switch output end circuit comprises a first electric coupler IC3, a second electric coupler IC4, a first coupler connector FZ5, a first triode Q1, a first resistor R1, a second resistor R2 and a third die capacitor E3, wherein a pin 2 of the first coupler connector FZ5 is connected with a pin 1 of the first electric coupler IC3 through the first resistor R1, a pin 1 of the first coupler connector FZ5 is connected with a pin 2 of the second electric coupler IC4, a pin 2 of the first electric coupler IC3 is connected with a pin 1 of the second electric coupler IC4, a pin 4 of the first electric coupler IC3 is connected with a pin 4 of the second electric coupler IC4, a pin 3 of the second electric coupler IC4 is connected with a base of the first triode Q1, and the third die capacitor E3 is respectively connected with a base of the first triode Q5 and an emitter, and a pin 2 of the first electric coupler IC3 are connected with a pin 585734 of the second resistor R57324.
Specifically, the second toggle switch circuit includes a fourth toggle switch BM4 and a fifth toggle switch BM5, and the fourth toggle switch BM4 and the fifth toggle switch BM5 are respectively connected to the load test circuit.
Specifically, the DISPLAY panel circuit further comprises a signal connector DISPLAY, a fourth resistor R4, a fifth resistor R5, an OK1 lamp, an NG lamp, a triode Q2, a buzzer BUZ and a sixth resistor R6, wherein the fourth resistor R4 is connected with the OK1 lamp, one end of the fourth resistor R4 is connected with a pin 1 of the signal connector DISPLAY, the fifth resistor R5 is connected with the NG lamp, one end of the fifth resistor R5 is connected with a pin 2 of the signal connector DISPLAY, a pin 3 of the signal connector DISPLAY is connected with a collector of the triode Q2, a collector of a diode Q2 is connected with the buzzer BUZ, and the sixth resistor R6 is connected with a base of the triode Q2.
Specifically, the POWER supply circuit comprises a voltage stabilizing integrator IC7, a POWER supply connector POWER, a seventh resistor R7, an eighth resistor R8, a light emitting diode D1, a fourth capacitor C4 and a second patch capacitor E2, wherein a pin 1 of the POWER supply connector POWER is connected with the seventh resistor R7, a pin 1 of the seventh resistor R7 is connected with the voltage stabilizing integrator IC7, the eighth resistor R8 is connected with the light emitting diode D1 in series, one end of the eighth resistor R8 is connected with a pin 3 of the voltage stabilizing integrator IC7, and the pin 3 of the voltage stabilizing integrator IC7 is further connected with the fourth capacitor C4 and the second patch capacitor E2.
Specifically, the load test isolation circuit comprises a third electric coupler IC5, a fourth electric coupler IC6, a tenth resistor R10, an eleventh resistor R11, a third triode Q3, a first patch capacitor E1 and a second coupler joint FZ6, wherein the third electric coupler IC5 and the fourth electric coupler IC6 are distributed in parallel, a pin 2 of the third electric coupler IC5 is connected with a pin 1 of the fourth electric coupler IC5, a pin 1 of the third electric coupler IC5 is connected with a pin 1 of the second coupler joint FZ6 through the tenth resistor R10, a pin 4 of the fourth electric coupler IC6 is connected with a pin 4 of the third electric coupler IC5, a pin 2 of the fourth electric coupler IC6 is connected with a base of the third triode Q3, and the first patch capacitor E1 is respectively connected with a base and an emitter of the third triode Q3.
The invention has the beneficial effects that: this structure passes through voltage test circuit 1, load test circuit 2, display panel circuit 3 and power supply circuit 4 combined use, implements and carries out effective test to the product circuit, effectively prevents to produce the defective products and flows, ensures the production quality.
Drawings
FIG. 1 is a voltage test circuit diagram of the present invention.
Fig. 2 is a reset circuit diagram of the IC1 single chip microcomputer of the present invention.
Fig. 3 is a first voltage acquisition circuit diagram of the present invention.
Fig. 4 is a second voltage acquisition circuit diagram of the present invention.
Fig. 5 is a circuit diagram of a first toggle actuator of the present invention.
Fig. 6 is a circuit diagram of the output terminal of the tool switch of the present invention.
Fig. 7 is a circuit diagram of the trigger signal of the present invention.
Fig. 8 is a load test isolation circuit diagram of the present invention.
Fig. 9 is a circuit diagram of a second dip switch of the present invention.
Fig. 10 is a load reset circuit diagram of the present invention.
Fig. 11 is a circuit diagram of a load test of the present invention.
Fig. 12 is a circuit diagram of a display panel of the present invention.
Fig. 13 is a power supply circuit diagram of the present invention.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
As shown in fig. 1 to 13, the present invention describes a fool-proof automatic testing device for 220V load and voltage, 1. the fool-proof automatic testing device for 220V load and voltage, which comprises the following components.
The voltage test circuit 1 is used for detecting whether the voltage of the product circuit meets the standard or not; the voltage test circuit 1 includes: the first singlechip IC1, the voltage acquisition circuit, the first dial switch circuit 104, the tooling switch output end circuit 105 and the first trigger signal circuit 106.
The voltage acquisition circuit is connected with the first singlechip IC1 and is used for collecting voltage information and outputting the voltage information to the voltage test circuit 1; the first dial switch circuit 104 is connected with the first singlechip IC1 and is used for selecting a voltage test channel and selecting two pins to be short-circuited; the tool switch output end circuit 105 and the first trigger signal circuit 106 are connected with the first single chip microcomputer IC1 respectively; the first singlechip IC1 is connected with an OK1 lamp.
The load test circuit 2 is used for detecting whether the load capacity of the product circuit meets the standard or not; the load test circuit 2 comprises a second singlechip IC2, a second dial switch circuit 202 and a load test isolation circuit 201; the second dial switch circuit 202 is connected with the second singlechip IC2 and is used for selecting a load test channel; the load test isolation circuit 201 is connected with the second singlechip IC2, and is used for performing test isolation and protecting the second singlechip IC 2.
The display panel circuit 3 is connected with the load test circuit 2, and displays the result output by the load test circuit 2;
the power supply circuit 4 and the power supply circuit 4 respectively supply power to the voltage test circuit 1 and the load test circuit 2.
This structure passes through voltage test circuit 1, load test circuit 2, display panel circuit 3 and power supply circuit 4 combined use, implements and carries out effective test to the product circuit, effectively prevents to produce the defective products and flows, ensures the production quality.
As shown in fig. 2, the voltage testing circuit is connected to an IC1 single chip microcomputer reset circuit 101, the IC1 single chip microcomputer reset circuit 101 includes a first key switch RET1, a first reset connector BCP, a third resistor R3 and a first capacitor C1, one ends of the first key switch RET1, the third resistor R3 and the first capacitor C1 are connected to a common end, and the common end is connected to a pin 6 of the first reset connector BCP. When the IC1 single chip microcomputer reset circuit 101 presses the first key switch RET1, a reset instruction is input to the voltage test circuit 1, so that the first single chip microcomputer IC1 in the voltage test circuit 1 recovers the original set value.
As shown in fig. 3 and 4, the voltage acquisition circuit includes a first voltage acquisition circuit 102 and a second voltage acquisition circuit 103, the first voltage acquisition circuit 102 includes a first acquisition connector C0N1 and a resistor group, the first acquisition connector C0N1 is connected to the resistor group, the second voltage acquisition circuit 103 includes a second acquisition connector C0N2 and a resistor group, and the second acquisition connector C0N2 is connected to the resistor group; the first voltage acquisition circuit 102 and the second voltage acquisition circuit 103 respectively acquire voltage of a product circuit, and input voltage acquisition electric signals into the first single chip microcomputer IC1, and when the voltage electric signals reach an indication value, the first single chip microcomputer IC1 outputs electric signals to enable an OK1 lamp to be turned on, which indicates that the product circuit is normal.
As shown in fig. 8, the load test circuit 2 is further connected to a load reset circuit 203, the load reset circuit 203 includes a second key switch RET2, a second reset terminal ISCP2, a ninth resistor R9 and a fifth capacitor C5, and one end of the second key switch RET2, one end of the ninth resistor R9 and one end of the fifth capacitor C5 are connected to a common terminal, and the common terminal is connected to the pin 6 of the second reset terminal ISCP 2. When the second key switch RET2 is pressed, the second key switch RET2 outputs an electrical signal to the second single chip IC2, and the second single chip IC2 restores to the original setting value.
As shown in fig. 5, the first dial switch circuit 104 includes a first dial switch BM1, a second dial switch BM2 and a third dial switch BM3, the first dial switch BM1, the second dial switch BM2 and the third dial switch BM3 are respectively connected to a first single chip IC1, and the trigger signal circuit 106 includes a trigger connector CF and a trigger resistor set. The first dial switch circuit 104 is connected with the voltage test circuit 1, and when the first dial switch BM1 or the second dial switch BM2 or the third dial switch BM3 is toggled, the right side of the first dial switch BM1 or the second dial switch BM2 or the third dial switch BM3 is moved to be short-circuited with two corresponding pins.
As shown in fig. 6, the tooling switch output terminal circuit 105 includes a first electric coupler IC3, a second electric coupler IC4, a first coupler connector FZ5, a first transistor Q1, a first resistor R1, a second resistor R2, and a third die capacitor E3, a pin 2 of the first coupler connector FZ5 is connected to a pin 1 of the first electric coupler IC3 through the first resistor R1, a pin 1 of the first coupler connector FZ5 is connected to a pin 2 of the second electric coupler IC4, a pin 2 of the first electric coupler IC3 is connected to a pin 1 of the second electric coupler IC4, a pin 4 of the first electric coupler IC3 is connected to a pin 4 of the second electric coupler IC4, a pin 3 of the second electric coupler IC4 is connected to a base of the first transistor Q1, and the third die capacitor E3 is respectively connected to a base of the first emitter Q5 and a pin 4 of the first electric coupler IC4, and the pin 2 is connected to the second die capacitor E3. The first coupler terminal FZ5 inputs 220V ac, and the third patch capacitor E3 performs a filtering function, and the parameter of the third patch capacitor E3 is 100UF 16V.
As shown in fig. 9, the second toggle switch circuit 202 includes a fourth toggle switch BM4 and a fifth toggle switch BM5, and the fourth toggle switch BM4 and the fifth toggle switch BM5 are respectively connected to the load test circuit 2. When the four dial switch BM4 or the fifth dial switch BM5 is toggled, the right pins of the four dial switch BM4 and the fifth dial switch BM5 are short-circuited.
As shown in fig. 12, the DISPLAY panel circuit 3 includes a signal terminal DISPLAY, a fourth resistor R4, a fifth resistor R5, an OK1 lamp, an NG lamp, a transistor Q2, a buzzer BUZ, and a sixth resistor R6, the fourth resistor R4 is connected to the OK1 lamp, one end of the fourth resistor R4 is connected to pin 1 of the signal terminal DISPLAY, the fifth resistor R5 is connected to the NG lamp, one end of the fifth resistor R5 is connected to pin 2 of the signal terminal DISPLAY, pin 3 of the signal terminal DISPLAY is connected to a collector of the transistor Q2, a collector of the diode Q2 is connected to the buzzer BUZ, and the sixth resistor R6 is connected to a base of the transistor Q2. The display panel circuit 3 is used for displaying the using state of the circuit board 3 and displaying whether the product circuit board is in a normal using state.
The second single chip microcomputer IC2 controls the working states of the OK1 lamp, the NG lamp and the buzzer BUZ respectively, and displays the test state result, when the test result corresponds to one time with the second dial switch circuit 202 selection voltage and load test channel, the OK2 lamp is turned on, when the test result is inconsistent, the NG lamp flickers, and the buzzer BUZ sounds, so that a tester can test the OK2 lamp.
As shown in fig. 13, the POWER supply circuit 4 includes a voltage regulator IC7, a POWER connector POWER, a seventh resistor R7, an eighth resistor R8, a light emitting diode D1, a fourth capacitor C4, and a second patch capacitor E2, a pin 1 of the POWER connector POWER is connected to the seventh resistor R7, a pin 1 of the voltage regulator IC7 is connected to the seventh resistor R7, an eighth resistor R8 is connected in series to the light emitting diode D1, one end of the eighth resistor R8 is connected to a pin 3 of the voltage regulator IC7, and a pin 3 of the voltage regulator IC7 is further connected to a fourth capacitor C4 and a second patch capacitor E2. The regulator IC7 in the power circuit 4 performs a voltage regulation function and supplies sufficient voltage to the voltage test circuit 1 and the load test circuit 2.
As shown in fig. 8, the load test isolation circuit 201 includes a third electric coupler IC5, a fourth electric coupler IC6, a tenth resistor R10, an eleventh resistor R11, a third transistor Q3, a first patch capacitor E1, a second coupler junction FZ6, wherein the third electric coupler IC5 and the fourth electric coupler IC6 are distributed in parallel, a pin 2 of the third electric coupler IC5 is connected to a pin 1 of the fourth electric coupler IC5, a pin 1 of the third electric coupler IC5 is connected to the second coupler junction FZ6 through the tenth resistor R10, a pin 4 of the fourth electric coupler IC6 is connected to a pin 4 of the third electric coupler IC5, a pin 2 of the fourth electric coupler IC6 is connected to a base of the third transistor Q3, and the first patch capacitor E1 is connected to a base and an emitter of the third transistor Q3, respectively. The load test isolation circuit 201 is used for test isolation and protecting the second singlechip IC 2.
The product test board is powered on, a voltage measure channel is selected, namely the product test board is connected through the voltage test circuit 1, and test channels of the first dial switch circuit 104 and the second dial switch circuit 202 are selected; and whether the tool is started, namely whether the tool switch output end circuit 105 is in an open state, the switch is turned on, the AC1 pin of the first single-chip microcomputer IC1 and the BC3 pin of the second single-chip microcomputer IC2 are pulled low, so that a trigger signal is detected, voltage and 220V alternating current load measurement is started, voltage signals are collected on a product test board through a voltage acquisition circuit and are input into the first single-chip microcomputer IC1, the first single-chip microcomputer IC1 detects that the voltage value reaches a specified standard, the lamp is turned on through an OK1 lamp, and a result is output through a display panel. Respectively by a buzzer, an NG light or an OK1 light. After the test is completed, the next cycle is entered.
The present invention is not limited to the above preferred embodiments, but rather, any modification, equivalent replacement or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A fool-proof automatic testing device for 220V load and voltage comprises:
the voltage test circuit (1) is used for detecting whether the voltage of the product circuit meets the standard or not; the voltage test circuit (1) comprises: the device comprises a first singlechip IC1, a voltage acquisition circuit, a first dial switch circuit (104), a tool switch output end circuit (105) and a first trigger signal circuit (106); the first singlechip IC1 is connected with an OK1 lamp;
the voltage acquisition circuit is connected with the first singlechip IC1 and is used for collecting voltage information and outputting the voltage information to the voltage test circuit (1); the first dial switch circuit 104 is connected with the first singlechip IC1 and is used for selecting a voltage test channel and selecting two pins to be short-circuited; the tooling switch output end circuit (105) and the first trigger signal circuit (106) are respectively connected with the first single chip microcomputer IC 1;
the load test circuit (2) is used for detecting whether the load capacity of the product circuit meets the standard or not; the load test circuit 2 comprises a second singlechip IC2, a second dial switch circuit (202) and a load test isolation circuit (201); the second dial switch circuit (202) is connected with the second singlechip IC2 and is used for selecting a load test channel; the load test isolation circuit (201) is connected with the second singlechip IC2, is used for performing test isolation and plays a role in protecting the second singlechip IC 2;
the display panel circuit (3), the display panel circuit (3) is connected with the load test circuit (2), and displays the result output by the load test circuit (2);
and the power supply circuit (4) supplies power to the voltage test circuit (1) and the load test circuit (2) respectively.
2. The automatic fool-proof testing device for 220V load and voltage according to claim 1, wherein: the voltage testing circuit is connected with an IC1 single-chip microcomputer reset circuit (101), the IC1 single-chip microcomputer reset circuit (101) comprises a first key switch RET1, a first reset joint BCP, a third resistor R3 and a first capacitor C1, one ends of the first key switch RET1, the third resistor R3 and the first capacitor C1 are connected to form a common end, and the common end is connected with a pin 6 of the first reset joint BCP.
3. The automatic fool-proof testing device for 220V load and voltage according to claim 1, wherein: the voltage acquisition circuit comprises a first voltage acquisition circuit (102) and a second voltage acquisition circuit (103), wherein the first voltage acquisition circuit (102) comprises a first acquisition connector C0N1 and a resistor group, the first acquisition connector C0N1 is connected with the resistor group, the second voltage acquisition circuit 103 comprises a second acquisition connector C0N2 and the resistor group, and the second acquisition connector C0N2 is connected with the resistor group.
4. The automatic fool-proof testing device for 220V load and voltage according to claim 1, wherein: the load test circuit (2) is also connected with a load reset circuit (203), the load reset circuit (203) comprises a second key switch RET2, a second reset joint ISCP2, a ninth resistor R9 and a fifth capacitor C5, one ends of the second key switch RET2, the ninth resistor R9 and the fifth capacitor C5 are connected into a common end, and the common end is connected with the 6-pin position of the second reset joint ISCP 2.
5. The automatic fool-proof testing device for 220V load and voltage according to claim 1, wherein: the first dial switch circuit (104) comprises a first dial switch BM1, a second dial switch BM2 and a third dial switch BM3, the first dial switch BM1, the second dial switch BM2 and the third dial switch BM3 are respectively connected with a first single chip microcomputer IC1, and the trigger signal circuit (106) comprises a trigger joint CF and a trigger resistor group.
6. The automatic fool-proof testing device for 220V load and voltage according to claim 1, wherein: the tooling switch output end circuit (105) comprises a first electric coupler IC3, a second electric coupler IC4, a first coupler connector FZ5, a first triode Q1, a first resistor R1, a second resistor R2 and a third chip capacitor E3, wherein a pin 2 of the first coupler connector FZ5 is connected with a pin 1 of the first electric coupler IC3 through the first resistor R1, a pin 1 of the first coupler connector FZ5 is connected with a pin 2 of the second electric coupler IC4, a pin 2 of the first electric coupler IC3 is connected with a pin 1 of the second electric coupler IC4, a pin 4 of the first electric coupler IC3 is connected with a pin 4 of the second electric coupler IC4, a pin 3 of the second electric coupler IC4 is connected with a base of the first triode Q1, and the third chip capacitor E3 is respectively connected with a base of the first triode Q5 and an emitter of the first triode Q3, and a pin 4 of the first electric coupler IC3 is connected with a pin 57324 of the second resistor R2.
7. The automatic fool-proof testing device for 220V load and voltage according to claim 1, wherein: the second dial switch circuit (202) comprises a fourth dial switch BM4 and a fifth dial switch BM5, and the fourth dial switch BM4 and the fifth dial switch BM5 are respectively connected with the load test circuit (2).
8. The automatic fool-proof testing device for 220V load and voltage according to claim 1, wherein: the DISPLAY panel circuit (3) comprises a signal connector DISPLAY, a fourth resistor R4, a fifth resistor R5, an OK1 lamp, an NG lamp, a triode Q2, a buzzer BUZ and a sixth resistor R6, wherein the fourth resistor R4 is connected with the OK1 lamp, one end of the fourth resistor R4 is connected with a pin 1 of the signal connector DISPLAY, the fifth resistor R5 is connected with the NG lamp, one end of the fifth resistor R5 is connected with a pin 2 of the signal connector DISPLAY, a pin 3 of the signal connector DISPLAY is connected with a collector of the triode Q2, a collector of a diode Q2 is connected with the buzzer BUZ, and the sixth resistor R6 is connected with a base of the triode Q2.
9. The automatic fool-proof testing device for 220V load and voltage according to claim 1, wherein: the POWER supply circuit (4) comprises a voltage stabilizing integrator IC7, a POWER supply connector POWER, a seventh resistor R7, an eighth resistor R8, a light emitting diode D1, a fourth capacitor C4 and a second patch capacitor E2, wherein a pin 1 of the POWER supply connector POWER is connected with the seventh resistor R7, a pin 1 of the seventh resistor R7 is connected with the voltage stabilizing integrator IC7, the eighth resistor R8 is connected with the light emitting diode D1 in series, one end of the eighth resistor R8 is connected with a pin 3 of the voltage stabilizing integrator IC7, and the pin 3 of the voltage stabilizing integrator IC7 is further connected with a fourth capacitor C4 and a second patch capacitor E2.
10. The automatic fool-proof testing device for 220V load and voltage according to claim 1, wherein: the load test isolation circuit (201) comprises a third electric coupler IC5, a fourth electric coupler IC6, a tenth resistor R10, an eleventh resistor R11, a third triode Q3, a first patch capacitor E1 and a second coupler connector FZ6, wherein the third electric coupler IC5 and the fourth electric coupler IC6 are distributed in parallel, a pin 2 of the third electric coupler IC5 is connected with a pin 1 of the fourth electric coupler IC5, a pin 1 of the third electric coupler IC5 is connected with a second coupler connector FZ6 through the tenth resistor R10, a pin 4 of the fourth electric coupler IC6 is connected with a pin 4 of the third electric coupler IC5, a pin 2 of the fourth electric coupler IC6 is connected with a base electrode of the third triode Q3, and a first patch capacitor E1 is respectively connected with a base electrode and an emitter electrode of the third triode Q3.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201911384917.5A CN111044882B (en) | 2019-12-28 | 2019-12-28 | Fool-proof automatic testing device for 220V load and voltage |
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| CN201911384917.5A CN111044882B (en) | 2019-12-28 | 2019-12-28 | Fool-proof automatic testing device for 220V load and voltage |
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| CN111044882B CN111044882B (en) | 2022-05-20 |
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